CN110375961A - A kind of automatic test approach of optical module and the Auto-Test System of optical module - Google Patents
A kind of automatic test approach of optical module and the Auto-Test System of optical module Download PDFInfo
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- CN110375961A CN110375961A CN201910687755.6A CN201910687755A CN110375961A CN 110375961 A CN110375961 A CN 110375961A CN 201910687755 A CN201910687755 A CN 201910687755A CN 110375961 A CN110375961 A CN 110375961A
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- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
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Abstract
The invention discloses the Auto-Test Systems of a kind of automatic test approach of optical module and optical module, the automatic test approach includes: the test catalogue for obtaining tester and being triggered, test catalogue is parsed, the identification number of the test board to match with test catalogue is obtained；According to the identification number of test board, corresponding test board is obtained；The target detection item that tester is triggered is obtained, target detection item is parsed, the interface identifier number to match with target detection item is obtained；It is obtained according to interface identifier number and shows corresponding connections figure.The case where automatic test approach of the invention can choose corresponding test board, tester is avoided to take test board by mistake according to the demand of tester generation.Corresponding connections figure is obtained according to the corresponding interface identifier of target detection item, without taking considerable time the circuit design of research test board, the connection between equipment can be completed as early as possible with subtest personnel, improves testing efficiency.
Description
Technical field
The invention belongs to field of automatic testing, automatic test approach and automatic survey more particularly, to a kind of optical module
Test system.
Background technique
Continuous growth with the mankind to communication requirement, the continuous upgrading from text, voice, picture to video communicate number
It is in accelerated growth situation according to flow, and then has driven the rapid growth of high-speed optical module demand.Research and development as optical module are raw
Manufacturer is produced, efficiency is manufactured in only continuous improvement product quality, promotion, is just able to satisfy market competition and demand.
In the research and development field of optical module, since the optical module performance indexes of development phase also not up to produces system in batches
The demand made can only test sample block by manually controlling instrument, and frequent operation is uninteresting, be readily incorporated system mistake
Difference；Test result needs are paid close attention to and are recorded in real time, are influenced by human factor also more.Moreover, when unattended, at equipment
In idle state, device resource can not be efficiently used.Additionally, there are some test boards are more complicated, it is a variety of that test can be multiplexed
Test item, but it is directed to different test items, the line connection of test equipment and test board has differences, developer
It needs to expend the circuit design of time study test board, so that route connection mode matches with test item, otherwise holds
Easily there is wiring error, caused by test result is incorrect happens.
In consideration of it, overcoming defect present in the prior art is the art urgent problem to be solved.
Summary of the invention
Aiming at the above defects or improvement requirements of the prior art, the present invention provides a kind of automatic test approach of optical module
And the Auto-Test System of optical module, its object is to automatic test approach of the invention, can according to the demand of tester,
The case where choosing corresponding test board, tester is avoided to take test board by mistake generation.Meanwhile for the selected mesh of tester
Test item is marked, corresponding connections figure can be obtained according to the corresponding interface identifier of target detection item, tester is without consumption
The circuit design for taking plenty of time research test board, can complete as early as possible the connection between equipment with subtest personnel, to carry out
Test, improves testing efficiency, and the correctness of wiring can be improved, to improve the accuracy of test.
To achieve the above object, according to one aspect of the present invention, a kind of automatic test approach of optical module, institute are provided
The realization environment for stating automatic test approach includes host computer, at least one slave computer and at least a set of test equipment, the test
Equipment is connected with corresponding slave computer, and the slave computer is connect with the host computer, is stored with and is pre-configured in the host computer
Good test catalogue, the slave computer is for providing human-computer interaction interface；
The automatic test approach includes:
The test catalogue that tester is triggered is obtained, the test catalogue is parsed, is obtained and the test mesh
It uses videotape to record the identification number of matched test board；
According to the identification number of the test board, corresponding test board is obtained；
The target detection item that tester is triggered is obtained, the target detection item is parsed, is obtained and the mesh
The interface identifier number that mark test item matches, wherein the test catalogue includes at least one test item；
It is obtained according to the interface identifier number and shows corresponding connections figure, in order to which tester is according to the line
The test board, the test equipment and optical module to be tested are established connection, to be tested by road wiring diagram.
Preferably, the automatic test approach further include:
After the test board, the test equipment and optical module to be tested complete connection, obtains tester and triggered
Parameter configuration table, the parameter in the parameter configuration table is sent to the test board and the test equipment by selectivity；
The test equipment and test board work are triggered, to test the optical module to be tested, is obtained simultaneously
Show corresponding test result.
Preferably, described to obtain the test catalogue that is triggered of tester, the test catalogue is parsed, obtain and
After the identification number for the test board that the test catalogue matches further include:
Whether the test board for judging that the determining identification number with the test board matches is occupied；
If occupied with test board that the identification number of the test board matches, the waiting time is obtained and shown, receive
The selection instruction of tester；
If the selection instruction received is to receive waiting, the test catalogue is added to waiting list；
After the test board to match with the identification number of the test board is released and occupied, it will be surveyed according to the sequence of waiting list
Test plate (panel) distributes to corresponding slave computer.
Preferably, the automatic test approach further include:
Within a preset time period, when obtaining access times and the corresponding waiting of each test board of each test board
Between；
Access times are more than preset frequency threshold value if it exists and the waiting time is more than the test board of preset time threshold,
It is then reported, in order to increase the quantity of corresponding test board.
Preferably, the target detection item for obtaining tester and being triggered, parses the target detection item, obtains
To after the interface identifier number to match with the target detection item further include:
The target detection item is loaded onto queue to be tested, obtains and shows and match with the interface identifier number
It is associated with test item；
After receiving tester and selecting the triggering command for being associated with test item, the association test item is added to
In the item queue to be tested, to be sequentially completed to the target detection item and the test for being associated with test item.
Preferably, the automatic test approach further include:
The network insertion request that simultaneously response test personnel are triggered is received, eventually by the intelligence of slave computer and tester side
Connection is established at end；
The device number for obtaining the intelligent terminal of tester side, by the device number and the selected test item of tester
Establish association；
After the selected test item of tester completes test, test is sent to the intelligent terminal of tester side and is completed
Information.
Preferably, the slave computer is connect with mechanical arm, according to the identification number of the test board, obtains corresponding test board
Include:
According to the identification number of the test board, the position of the test board is determined；
Plan the motion profile of the mechanical arm, according to the position of test board to grab corresponding test board under corresponding
At the machine of position.
It is another aspect of this invention to provide that a kind of Auto-Test System of optical module is provided, the Auto-Test System
It is connect including host computer, at least one slave computer and at least a set of test equipment, the host computer with the slave computer, the survey
Examination equipment is connect with the slave computer；
Pre-configured test catalogue is stored in the host computer, the slave computer is for providing human-computer interaction circle
Face；
The host computer parses the test catalogue, obtains for obtaining the test catalogue that tester is triggered
To the identification number of the test board to match with the test catalogue；It is also used to obtain the target detection item that tester is triggered,
The target detection item is parsed, obtains the interface identifier number to match with the target detection item, wherein the test
Catalogue includes at least one test item；
The slave computer is used to receive the identification number for the test board that the host computer is fed back, and according to the test
The identification number of plate obtains corresponding test board；It is also used to receive the interface identifier number that the host computer is fed back, and foundation
The interface identifier number obtains and shows corresponding connections figure, will in order to which tester is according to the connections figure
The test board, the test equipment and optical module to be tested establish connection, to be tested.
Preferably, the test equipment includes Error Detector, spectrometer and oscillograph, is provided on the test board for coupling
Close the test position and photoswitch of optical module to be tested；
One end of the Error Detector, the spectrometer and the oscillograph is connect with the slave computer, wherein the route
The other end of the Error Detector, the spectrometer and the oscillograph and the connection relationship of the test board are shown in wiring diagram,
The test board, the test equipment and optical module to be tested are established connection, to be tested.
Preferably, the host computer is also used to for the target detection item being loaded onto queue to be tested, obtains and shows
Test item is associated with what the interface identifier number matched；The triggering of the association test item is selected to refer to receiving tester
After order, the association test item is added in the item queue to be tested, to be sequentially completed to the target detection item and institute
State the test of association test item.
In general, through the invention it is contemplated above technical scheme is compared with the prior art, have following beneficial to effect
Fruit: the present invention provides a kind of automatic test approach of optical module and the test macro of optical module, which includes: to obtain
The test catalogue for taking tester to be triggered parses test catalogue, obtains the test board to match with test catalogue
Identification number；According to the identification number of test board, corresponding test board is obtained；The target detection item that tester is triggered is obtained, it is right
Target detection item is parsed, and the interface identifier number to match with target detection item is obtained, wherein test catalogue includes at least one
A test item；It is obtained according to interface identifier number and shows corresponding connections figure, in order to which tester is according to connections
Figure, establishes connection for test board, test equipment and optical module to be tested, to be tested.Automatic test approach of the invention,
Can be according to the demand of tester, the case where choosing corresponding test board, tester is avoided to take test board by mistake generation.Together
When, for the selected target detection item of tester, can be obtained according to the corresponding interface identifier of target detection item corresponding
Connections figure, tester are not necessarily to take considerable time the circuit design of research test board, can be with subtest personnel as early as possible
The connection completed between equipment improves testing efficiency to be tested, and the correctness of wiring can be improved, to mention
The accuracy of height test.
Detailed description of the invention
In order to illustrate the technical solution of the embodiments of the present invention more clearly, will make below to required in the embodiment of the present invention
Attached drawing is briefly described.It should be evident that drawings described below is only some embodiments of the present invention, for
For those of ordinary skill in the art, without creative efforts, it can also be obtained according to these attached drawings other
Attached drawing.
Fig. 1 is a kind of structural schematic diagram of the Auto-Test System of optical module provided in an embodiment of the present invention；
Fig. 2 is a kind of flow diagram of the automatic test approach of optical module provided in an embodiment of the present invention；
Fig. 3 is the flow diagram of the automatic test approach of another optical module provided in an embodiment of the present invention；
Fig. 4 is the log-in interface schematic diagram of Auto-Test System provided in an embodiment of the present invention；
Fig. 5 is the test assignment interface schematic diagram of Auto-Test System provided in an embodiment of the present invention；
Fig. 6 is another test assignment interface schematic diagram provided in an embodiment of the present invention；
Fig. 7 is the connection schematic diagram of a kind of slave computer provided in an embodiment of the present invention, test equipment and test board；
Fig. 8 is a kind of configuration schematic diagram of test condition provided in an embodiment of the present invention；
Fig. 9 is a kind of configuration schematic diagram of test equipment provided in an embodiment of the present invention；
Figure 10 is a kind of schematic diagram of test result provided in an embodiment of the present invention.
Specific embodiment
In order to make the objectives, technical solutions, and advantages of the present invention clearer, with reference to the accompanying drawings and embodiments, right
The present invention is further elaborated.It should be appreciated that the specific embodiments described herein are merely illustrative of the present invention, and
It is not used in the restriction present invention.
In addition, as long as technical characteristic involved in the various embodiments of the present invention described below is each other not
Constituting conflict can be combined with each other.
Embodiment 1:
Refering to fig. 1, the present embodiment provides a kind of Auto-Test System, which includes host computer, at least one
A slave computer and at least a set of test equipment, the test equipment are connected with corresponding slave computer, the slave computer and it is described on
Position machine connects, and pre-configured test catalogue is stored in the host computer, the slave computer is for providing human-computer interaction circle.
Wherein, the host computer is server or the terminal with powerful data-handling capacity, and host computer is completed test and matched
It sets and is exported with data.In the present embodiment, it for convenience of the unified management of test data, avoids data analysis chaotic, can will survey
It tries data storage in the server, allows user that the data in host computer are read out and be analyzed by web page operation.On
Interaction between position machine and slave computer can be based on database realizing, consider to survey automation using buddhist deferent platform framework
Examination concentrates on the server page and is controlled, and the later period can also extend more management functions on platform.Abdicating road platform is
The open source that Apache+php+MySQL becomes one manages platform, and the storage of web data is carried out using MySQL database.Cause
This can pay the utmost attention to MySQL database in the present embodiment.
Wherein, host computer and slave computer be by cable network or wireless network connection, slave computer can for computer or its
His terminal, slave computer complete the connection with test equipment and test board, and slave computer may rely on Labview, provide visualization
The number at interface, slave computer is not specifically limited, and can be increased the extension that slave computer completes platform newly according to demand, be met a variety of productions
The automatic test of product is designed according to actual conditions.
Wherein, the test catalogue is matched previously according to the test condition and test request of the optical module of numerous types
It sets, in host computer, user when testing, can choose corresponding test catalogue for configured test catalogue deposit,
And configuration parameter according to the actual situation, to be tested.
Wherein, testing in catalogue includes at least one test item, for the optical module of different function, the test board that is applicable in
It has differences, therefore, the test item that every kind of test board can be done can be summarized, these test items are divided in the same test
Under catalogue, that is, there are mapping relations between test catalogue and test board.After having selected test catalogue, it is also assured that phase
The test board answered.
Wherein, test item include: high temperature performance test, high/low temperature RSSI, overload~sensitivity section every 1dB mistake
Code rate, if having blind spot, 1G MOD and APD LUT reading data, fitting verification, timing sequence test (especially surge), 10G are mono-
Cat/bis- cats burst sensitivity test, the mono- cat of 1G/bis- cats burst sensitivity test, the test of 10G dynamic range, 1G dynamic range are surveyed
Examination, 10G high temperature and/or room temperature down going channel cost, 1G low temperature down going channel cost, -40~+85 degree -31dBm 1G@PRBS7
Sensitivity loop test, RSSI trigger long-time on-hook test, -40 DEG C of low-temperature cool starting /+70 DEG C high temperature thermal startings, often
It is long to wrap under (370us+620us) burst timing when warm survey eventually, fix information verification and overload and sensitivity light input, APD high
Press, the waveform variation for adopting RSSI voltage before protecting, trigger etc., under practical application scene, can according to optical module characteristic with
And testing requirement increases test item, and configuration is specifically completed on host computer.
Wherein, when test item difference, the wiring of test board and test equipment and slave computer is had differences, in the present embodiment
In, for same test board, the corresponding connections figure of different test items is stored in host computer, to assist user to complete equipment
Between wiring.
Under practical application scene, upper computer software mainly includes: logging in, test item is chosen, module to be measured configuration, surveys
The parts such as strip part, standard criterion, test method, starting test and data export form, the data that each part generates, respectively
It is stored in database.The function of each component part is described below.It logs in: there is creation, replicate and transfer and deposited configuration
Function.After login, unique test configurations number are obtained, and to number that slave computer is transmitted.Test item is chosen: different type
Optical module product, test item is mostly identical, a small number of specific aims test, so establishing a test item in the database
Summary table obtains all test items automatically.Test condition configuration: configuring the environment of test, such as: temperature, voltage, rate or code
Type.In actual use, multiple test conditions be can configure, and adjust test condition executes sequence.Test specification configuration: configuration
The test specification of standard.Test method: according to the test item of selection, needing to configure corresponding parameter, is supplied to slave computer use,
Such as: the starting optical power point of sensitivity test.Starting test: whether check test project, test condition, test configurations match
It is good, if prepared, start local program；Otherwise, frame prompt is played.After test completion, the export of data is completed.
In the present embodiment, according to design requirement, the main tables of data of planning database is as follows:
(1) pl_task table, the table structure record the trip bar of the test assignment number of tester's configuration, optical module test
Part, whether the test content of long-time on-hook in need test, and having the test condition needed to configure when on-hook test.
(2) pl_config table, the table are the cores of entire test assignment, have recorded the corresponding test of each test assignment
, the test specification condition of test condition, test configurations and each test item.Test assignment id column are the tests of user configuration
Task, test condition ID are the sequence number under different test conditions, may be implemented to configure primary survey in tester using the column
In the case that trial is engaged in, the automatic test under different test conditions is completed, can also be tested according to the configuration of rate wavelength etc., example
Such as Compo PON multi tate module.Test specification condition records the maximum value and minimum value of selected test item index, is convenient for
Judge whether test data index is normal in test process.Test configurations item indicates the parameter needed to configure during the test,
For example, the optical power etc. for the reception light that need to be configured when test electric eye figure.
(3) pl_msg table, the table are verified for fix information and are designed, and taskID is configuration task number, and agreement is light
The I2C agreement that module is followed, for example, SFF-8472, INF-8077i etc., the mould of different agreement type can be compatible with by making system more
Block.
(4) pl_result table, the table record the test result of all test items and whether meet normality condition,
The taskID and ConfigID test datas pointed out when the fc-specific test FC in specific test configurations, different test-strips
Test result slitting record under part.
Since the test item and testing sequence of tester's configuration may be different, slave computer test program uses team
The form of column is allocated to as time taskID of test when according to host computer web page operation, is searched for all in pl_config table
Test-strips piece number and corresponding test item, each test condition is as a queue.Queue sequence are as follows: initial configuration -- test
Item 1 executes --- and test item 2 executes --- ... test item n is executed -- and data save, and different test conditions is followed according to multiple queues
Ring executes, to realize automatic test.
The Auto-Test System of foregoing description is a kind of realization environment of the automatic test approach of the optical module of the present embodiment.
Referring next to Fig. 2, illustrate the specific implementation of the automatic test approach of the present embodiment, automatic test approach includes following step
It is rapid:
Step 101: obtaining the test catalogue that is triggered of tester, the test catalogue is parsed, obtain and institute
State the identification number for the test board that test catalogue matches.
Wherein, test multiple test catalogues are shown when tester tests, on slave computer, tester is according to its survey
The corresponding test catalogue of examination demand selection.Preferably, each test catalogue can carry test summary info, wherein testing summary
Information includes the information such as type, core chips or the wave-length coverage of optical module that the test catalogue is applicable in, in order to user according to
Corresponding test catalogue is determined according to test summary info.
Wherein, each test board is correspondingly arranged on unique identification number, and the identification number of each test board is surveyed with corresponding
There are mapping relations between examination project.Under practical application scene, test catalogue, the survey can be set according to the function of test board
It is associated with the identification number of test board to try catalogue.
In the present embodiment, tester selects or inputs test catalogue by slave computer, and slave computer is by tester institute
The test catalogue of triggering is sent to host computer, to obtain the test catalogue that tester is triggered.Test to being triggered
Catalogue is parsed, and the identification number of the test board to match with the test catalogue is obtained, and selects corresponding test board with guidance.
Step 102: according to the identification number of the test board, obtaining corresponding test board.
In the alternative, the slave computer is connect with mechanical arm, automatically grabs test board by mechanical arm.Specifically
Ground, each test board, which is fixed, is placed on a place, is stored with test board location map in host computer, each to show
The position that test board is placed.Therefore, the position where test board can be determined according to the identification number of test board.On host computer also
It is stored with the location map of slave computer, when slave computer is interacted with host computer, host computer obtains the device number of slave computer, according to
Device number determines the position of slave computer, thus the motion profile of the position planning of the position and test board according to slave computer, to grab
It takes at corresponding test board to corresponding slave computer.
In another optional scheme, the slave computer is connect with mechanical arm, and image knowledge is provided on the mechanical arm
Other unit, the top of test board is arranged in the identification number of test board, after host computer has determined the identification number of test board, by test board
Identification number be sent to slave computer, slave computer drives manipulator motion, searches corresponding test board according to the identification number of test board
Position, to obtain corresponding test board.Concrete implementation process is referred to Hospitals at Present and the mode of medicine is taken to complete automatically.
Step 103: obtaining the target detection item that tester is triggered, the target detection item is parsed, is obtained
The interface identifier number to match with the target detection item, wherein the test catalogue includes at least one test item.
It include at least one test item under each test catalogue, for the different test item of same test board, wiring side
, often there is the problem of wiring error, leads in formula there may be difference, especially test functions more complex, more comprehensive test board
Cause test result inaccuracy or test unsuccessful.In order to solve foregoing problems, in the present embodiment, for same test board, no
With test item be corresponding with corresponding interface identifier number, by the available pre-stored connections figure of interface identifier number,
The wiring between equipment is completed with subtest personnel.
That is, it is stored with the circuit diagram of test board in the present embodiment, in host computer, each circuit diagram and corresponding test board
Identification number forms mapping relations, and for the same test board, the corresponding connections figure of different test items is stored in host computer,
The identification number of each connections figure and interface identifier number and test board forms mapping relations.
Step 104: being obtained according to the interface identifier number and show corresponding connections figure, in order to tester's root
According to the connections figure, the test board, the test equipment and optical module to be tested are established into connection, to be surveyed
Examination.
In actual use, the target detection item that tester is triggered is obtained, the target detection item is parsed,
Obtain the interface identifier number to match with the target detection item.It is obtained according to the interface identifier number and shows corresponding route
Wiring diagram, in order to which tester is according to the connections figure, by the test board, the test equipment and optical mode to be tested
Block establishes connection, to be tested.
The automatic test approach of the present embodiment can choose corresponding test board, avoid surveying according to the demand of tester
The case where examination personnel take test board by mistake generation.Meanwhile for the selected target detection item of tester, can be surveyed according to target
It tries the corresponding interface identifier of item and obtains corresponding connections figure, tester is not necessarily to take considerable time the electricity of research test board
Road design, the connection that can be completed as early as possible with subtest personnel between equipment improve testing efficiency to be tested, and
The correctness of wiring can be improved, to improve the accuracy of test.
Further, for the same test item, tester can configure different test parameters according to actual demand,
Wherein test parameter includes temperature, voltage, rate, wavelength and pattern, to more fully test optical module.Preferred
Embodiment in, test board is connect with slave computer, to carry out data transmission, for example, can pass through GPIB transmission line, USB transmission
Line or the connection of I2C transmission line.After the test board, the test equipment and optical module to be tested complete connection, test is obtained
Parameter in the parameter configuration table is sent to the test board and the survey by the parameter configuration table that personnel are triggered, selectivity
The parameter for belonging to test board is specifically sent to test board, the parameter for belonging to test equipment is sent to test and is set by examination equipment
It is standby.After completing parameter configuration, the test equipment and test board work are triggered, to carry out to the optical module to be tested
Test, obtains and shows corresponding test result.
Under practical application scene, the number of slave computer be it is multiple, in the case where test board resource is sufficient, can permit
Multiple testers complete test using different slave computers.But, under practical application scene, often there is the money of test board
Source is limited, leads to the occupied situation of test board, meanwhile, tester can not know the corresponding test board occupied time,
In the case that testing requirement is urgent, tester needs repeatedly to enter test cabinet, and whether exact p-value plate has released occupancy, pole
The earth consumes manpower.
In order to solve foregoing problems, a kind of preferred scheme is present embodiments provided, referring specifically to Fig. 3, in step 102
Later further include following steps:
Step 201: whether the test board for judging that the determining identification number with the test board matches is occupied.
In the present embodiment, it is stored with the state table of test board in host computer, each test board is marked by state table
Use state, when some test board is used, the corresponding state of test board is " in use ", when some test board is not used
When, the corresponding state of test board is " unused ".When the test board of the same identification number has multiple, can remember in state table
The quantity of " in use " and the quantity of " unused " are recorded, after obtaining the identification number of test board, is determined by traversal state list
The service condition of test board, so that whether the test board for judging that the determining identification number with the test board matches is occupied.
Step 202: if occupied with test board that the identification number of the test board matches, when obtaining and showing waiting
Between, receive the selection instruction of tester.
Wherein, for each test board, the test board recorded in state table also need using time, that is, the waiting time.
When the test board that the identification number with the test board matches is occupied, the waiting time is obtained and shown, receive and survey
The selection instruction of examination personnel, to determine whether to wait.
Step 203: if the selection instruction received is to receive waiting, the test catalogue being added to waiting list.
Under practical application scene, user can according to the waiting time it is adaptively selected whether wait, specifically, slave computer
On have an interface button whether waited, user is selected by triggering corresponding button.If the selection instruction received is to connect
It is waited, then the test catalogue is added to waiting list.
Step 204: after the test board to match with the identification number of the test board is released and occupied, according to waiting list
Test board is distributed to corresponding slave computer by sequence.
Wherein, there may be the waiting of multiple testers requests in waiting list, in the identification number with the test board
After the test board to match releases occupancy, test board is distributed into corresponding slave computer according to the sequence of waiting list.
Specifically, the device number of corresponding slave computer is stored in waiting list, the mode specifically distributed can be to test
After plate is put back into, the slave computer of triggering relevant device number grabs test board.
By scheme above-mentioned, tester will be seen that testing progress, determine whether to wait with selectivity, occupied
Test board complete use after, can automatically by test board distribute in wait the next pusher side, resource can be made full use of.
In a preferred embodiment, for scheme shown in Fig. 3, a kind of prioritization scheme is additionally provided, in the preset time
In section, wherein the preset period can be 3 months or 6 months, be arranged according to actual conditions, obtain each test board
Access times and each test board corresponding waiting time；Access times are more than preset frequency threshold value and waiting if it exists
Time is more than the test board of preset time threshold, then is reported, in order to increase the quantity of corresponding test board, to guarantee
The abundance of resource.Wherein, preset frequency threshold value and preset time threshold are according to depending on actual conditions, here, not doing specific
It limits.
Under practical application scene, after tester configures completion test item, optical module is surveyed by test macro
Examination, can generally leave test cabinet dduring test, after test completion, for convenient for notifying tester, in preferred embodiment
In, slave computer can establish connection with the intelligent terminal of tester side, with Intelligent Notification tester.Specifically, it receives simultaneously
The network insertion request that response test personnel are triggered, establishes connection for the intelligent terminal of slave computer and tester side,
In, connection can be established by local area network.The device number for obtaining the intelligent terminal of tester side, by the device number and test
The selected test item of personnel establishes association；After the selected test item of tester completes test, to tester side
Intelligent terminal sends the information that test is completed.
By foregoing manner, intelligent test can be realized with remote notification tester's testing progress.
Therewith analogously, for scheme shown in Fig. 3, waiting list is added in the corresponding test request of tester
Afterwards, the device number of the intelligent terminal of tester side is obtained, the intelligent terminal foundation of host computer and tester side is connected to the network,
After test board is released and occupied, it can send and notify to the intelligent terminal of tester side according to the sequence of waiting list, so as to
Test cabinet can be returned in time in tester, to be tested.The mode for establishing network connection is referred to foregoing description,
Here, repeating no more.
Under another concrete application scene, tester can will need the test item carried out to be added to queue to be tested
In, but, the test item of corresponding same route line graph can just be added to it is same it is to be tested in, when testing, survey
Examination personnel can not know which test item is corresponding same route line graph, carry out really generally by the mode manually compared
Recognize, but such mode efficiency is lower, and is easy error.In order to solve foregoing problems, in a preferred embodiment, in step
Further include following process after 103: the target detection item being loaded onto queue to be tested, obtains and shows and the interface
The association test item that identification number matches；After receiving tester and selecting the triggering command for being associated with test item, by institute
It states association test item to be added in the item queue to be tested, test is associated with described to the target detection item to be sequentially completed
The test of item.
In the present embodiment, after multiple and different test items can correspond to the same interface identifier, available interface identifier
Number corresponding association test item improves the accuracy of testing efficiency and test so that tester selects.
Embodiment 2:
Based on the automatic test approach of previous embodiment 1, the present embodiment combines a specific example to be explained.Such as figure
Shown in 4, the test platform of the next pusher side is opened, inputs web page address (host computer address), inputs user name and password, into matching
Interface is set, triggering enters configuration interface, as shown in Figure 5, wherein configuration interface includes test assignment selection area, item team to be tested
Column and parameter configuration area.
Wherein, test assignment selection area includes multiple test catalogues, and tester's triggering selection tests catalogue accordingly, on
Position machine obtains the test catalogue that tester is triggered, and parses, obtains and the test catalogue phase to the test catalogue
The identification number of matched test board；Slave computer obtains corresponding test board according to the identification number of the test board.
As shown in Figure 6, it is assumed that tester's triggering selection test catalogue 1 is then tested catalogue 1 and is unfolded, and catalogue 1 is tested
It down include multiple test items, tester has selected target detection item, then the target that host computer obtains that tester is triggered is surveyed
Item is tried, the target detection item is parsed, obtains the interface identifier number to match with the target detection item, wherein institute
Stating test catalogue includes at least one test item；It is obtained according to the interface identifier number and shows corresponding connections figure, with
Convenient for tester according to the connections figure, the test board, the test equipment and optical module to be tested are established and connected
It connects, to be tested.
Wherein, item queue to be tested is for showing test item added by tester, wherein parameter configuration area is for showing
Show the parameter configuration table that tester is triggered, the parameter in the parameter configuration table is sent to by the test board with selectivity
With the test equipment.
Under practical application scene, test equipment includes Error Detector, light power meter, spectrometer and oscillograph, shown in Fig. 7
Test board for, illustrate.In Fig. 7, the number of Error Detector is three, respectively Error Detector 1, Error Detector 2 and error code
Instrument 3 is provided with photoswitch 4 and photoswitch 5 on test board, OLT development board, 1G-ONU development board and 10G- is provided on test board
ONU development board, the test board correspond to multiple test items, under practical application scene, for different test items, the wiring of route
Mode has differences, and needs to show corresponding connections figure according to the selected test item of tester, specifically, can be with
The equipment by corresponding route and accordingly used highlights, to instruct tester to complete wiring.
For example, when the received pattern of transmitting eye figure, spectrum test and 10G for carrying out 10G configures, 10G transmitting path
Are as follows: optical module to be tested (is connect)-photoswitch 4- wavelength-division by Error Detector 1-OLT development board with the development board；10G receiving path
Are as follows: Error Detector 1-10G ONU development board-optical attenuator-photoswitch 5 (port O2)-photoswitch 4 (port O4)-OLT development board.
Wherein, the transmitting eye figure of 10G, spectrum test and the received pattern of 10G are configured to mutual associated test item.
For example, in the received pattern configuration of transmitting eye figure, spectrum test and 10G for carrying out 1G/2.5G, 1G/2.5G hair
Penetrate access are as follows: optical module to be tested (is connect)-photoswitch 4- wavelength-division by Error Detector 2-OLT development board with the development board；1G/2.5G
Receiving path are as follows: optical module to be tested (is connect)-optical attenuator-photoswitch by Error Detector 2-1G ONU development board with the development board
4 (port O3)-OLT development boards.
For example, when 10G emits and passes fine test, opened the light the corresponding function of 5 realizations by Error Detector 3 and light, wherein light is opened
The port O3 and the port O4 of pass 5 control respectively passes the fine preceding test with biography after fine, and the sensitivity of biography fibre is read by Error Detector 3, logical
The comparison for passing fine front and back sensitivity is crossed, channel cost is calculated.
Wherein, aforementioned only to schematically illustrate, when testing corresponding test item, the transmission path of signal is moved towards,
Specific connections figure can be shown in the form of interface image in actual use, in order to complete wiring.Wherein,
Some routes have been integrated on test board, when carrying out wiring, mainly completion host computer and test equipment, test equipment with
Test board, the connection between test board and optical module to be measured.
As shown in figure 8, being directed to the same test item, different test conditions can be configured, a plurality of test record is generated, with
It is tested respectively, more fully analyzes the performance of optical module.After starting test, the automatic survey for executing test ID number and corresponding to 66
Then trial business executes the test assignment that ID number is 67, and so on, the corresponding test assignment of each test condition.
For different test items, the configuration of test equipment is had differences, can be carried out according to interface as shown in Figure 9
Configuration, and configured parameter is sent to corresponding test equipment.After configuration, beginning testing button can be clicked,
Test equipment, test board and optical module to be tested work are driven, and shows test result, as shown in Figure 10.
Embodiment 3:
Description based on previous embodiment 1 and embodiment 2, the present embodiment provides a kind of Auto-Test System of optical module,
As shown in Figure 1, the Auto-Test System includes host computer, at least one slave computer and at least a set of test equipment, it is described on
Position machine is connect with the slave computer, and the test equipment is connect with the slave computer；It is stored with and is pre-configured in the host computer
Good test catalogue, the slave computer is for providing human-computer interaction interface.
In actual use, the host computer is for obtaining the test catalogue that tester is triggered, to the test mesh
Record is parsed, and the identification number of the test board to match with the test catalogue is obtained；It is also used to obtain tester to be triggered
Target detection item, the target detection item is parsed, the interface identifier number to match with the target detection item is obtained,
Wherein, the test catalogue includes at least one test item.
The slave computer is used to receive the identification number for the test board that the host computer is fed back, and according to the test
The identification number of plate obtains corresponding test board；It is also used to receive the interface identifier number that the host computer is fed back, and foundation
The interface identifier number obtains and shows corresponding connections figure, will in order to which tester is according to the connections figure
The test board, the test equipment and optical module to be tested establish connection, to be tested.
The host computer is also used to for the target detection item being loaded onto queue to be tested, obtains and shows and connects with described
The association test item that mouth identification number matches；It, will after receiving tester and selecting the triggering command for being associated with test item
The association test item is added in the item queue to be tested, is associated with survey with described to the target detection item to be sequentially completed
Try the test of item.
Specifically, the test equipment includes Error Detector, power meter, spectrometer and oscillograph, is arranged on the test board
There are the test position and photoswitch for coupling optical module to be tested；The Error Detector, the spectrometer and the oscillograph
One end is connect with the slave computer, wherein the Error Detector, the spectrometer and the oscillography are shown in the connections figure
The connection relationship of the other end of device and the test board builds the test board, the test equipment and optical module to be tested
Vertical connection, to be tested.
Wherein, the model of Error Detector can be MP1800A, MP2100B, ag81250 or Tbert, or self-control misses
Code instrument；The model of oscillograph can be Ag86100, the domestic oscillograph DCA4201 or mp2100 of DataExpert；The model of photoswitch can be with
For the great photoswitch that spreads out, exfo9160 or self-control photoswitch.The model of power meter can be EXFO1750, PM1600 or self-control power
Meter.
Auto-Test System about the present embodiment process and step performed when being tested automatically, are detailed in reality
Example 1 is applied, here, repeating no more.
It is worth noting that in information exchange, implementation procedure between module, unit in above-mentioned apparatus and system etc.
Hold, due to being based on same design with processing method embodiment of the invention, particular content be can be found in embodiment of the present invention method
Narration, details are not described herein again.
Those of ordinary skill in the art will appreciate that all or part of the steps in the various methods of embodiment is can to lead to
Program is crossed to instruct relevant hardware and complete, which can be stored in a computer readable storage medium, storage medium
It may include: read-only memory (Read Only Memory, be abbreviated as ROM), random access memory (Random Access
Memory is abbreviated as RAM), disk or CD etc..
As it will be easily appreciated by one skilled in the art that the foregoing is merely illustrative of the preferred embodiments of the present invention, not to
The limitation present invention, any modifications, equivalent substitutions and improvements made within the spirit and principles of the present invention should all include
Within protection scope of the present invention.
Claims (10)
1. a kind of automatic test approach of optical module, which is characterized in that the realization environment of the automatic test approach includes upper
Machine, at least one slave computer and at least a set of test equipment, the test equipment are connected with corresponding slave computer, the slave computer
It is connect with the host computer, pre-configured test catalogue is stored in the host computer, the slave computer is for providing people
Machine interactive interface；
The automatic test approach includes:
The test catalogue that tester is triggered is obtained, the test catalogue is parsed, is obtained and the test catalogue phase
The identification number of matched test board；
According to the identification number of the test board, corresponding test board is obtained；
The target detection item that tester is triggered is obtained, the target detection item is parsed, obtains surveying with the target
The interface identifier number that examination item matches, wherein the test catalogue includes at least one test item；
It is obtained according to the interface identifier number and shows corresponding connections figure, in order to which tester connects according to the route
The test board, the test equipment and optical module to be tested are established connection, to be tested by line chart.
2. automatic test approach according to claim 1, which is characterized in that the automatic test approach further include:
After the test board, the test equipment and optical module to be tested complete connection, the ginseng that tester is triggered is obtained
Parameter in the parameter configuration table is sent to the test board and the test equipment by number allocation list, selectivity；
The test equipment and test board work are triggered, to test the optical module to be tested, obtains and shows
Corresponding test result.
3. automatic test approach according to claim 1, which is characterized in that the test for obtaining tester and being triggered
Catalogue parses the test catalogue, obtains also wrapping after the identification number of the test board to match with the test catalogue
It includes:
Whether the test board for judging that the determining identification number with the test board matches is occupied；
If occupied with test board that the identification number of the test board matches, the waiting time is obtained and shown, receive test
The selection instruction of personnel；
If the selection instruction received is to receive waiting, the test catalogue is added to waiting list；
After the test board that matches with the identification number of the test board is released and occupied, according to the sequence of waiting list by test board
Distribute to corresponding slave computer.
4. automatic test approach according to claim 3, which is characterized in that the automatic test approach further include:
Within a preset time period, access times and each test board corresponding waiting time of each test board are obtained；
Access times are more than the test board for preset frequency threshold value and waiting time being more than preset time threshold if it exists, then into
Row reports, in order to increase the quantity of corresponding test board.
5. automatic test approach according to claim 1, which is characterized in that the target for obtaining tester and being triggered
Test item parses the target detection item, obtains going back after the interface identifier number to match with the target detection item
Include:
The target detection item is loaded onto queue to be tested, obtains and shows and be associated with what the interface identifier number matched
Test item；
After receiving tester and selecting the triggering command for being associated with test item, the association test item is added to described
In item queue to be tested, to be sequentially completed to the target detection item and the test for being associated with test item.
6. automatic test approach according to claim 1, which is characterized in that the automatic test approach further include:
The network insertion request that simultaneously response test personnel are triggered is received, slave computer and the intelligent terminal of tester side are built
Vertical connection；
The device number for obtaining the intelligent terminal of tester side establishes the device number and the selected test item of tester
Association；
After the selected test item of tester completes test, the letter that test is completed is sent to the intelligent terminal of tester side
Breath.
7. automatic test approach according to claim 1, which is characterized in that the slave computer is connect with mechanical arm, according to
The identification number of the test board, obtaining corresponding test board includes:
According to the identification number of the test board, the position of the test board is determined；
Plan the motion profile of the mechanical arm, according to the position of test board to grab corresponding test board to corresponding slave computer
Place.
8. a kind of Auto-Test System of optical module, which is characterized in that the Auto-Test System include host computer, at least one
Slave computer and at least a set of test equipment, the host computer are connect with the slave computer, the test equipment and the slave computer
Connection；
Pre-configured test catalogue is stored in the host computer, the slave computer is for providing human-computer interaction interface；
The host computer parses the test catalogue for obtaining the test catalogue that tester is triggered, obtain and
The identification number for the test board that the test catalogue matches；It is also used to obtain the target detection item that tester is triggered, to institute
It states target detection item to be parsed, obtains the interface identifier number to match with the target detection item, wherein the test catalogue
Including at least one test item；
The slave computer is used to receive the identification number for the test board that the host computer is fed back, and according to the test board
Identification number obtains corresponding test board；It is also used to receive the interface identifier number that the host computer is fed back, and according to described
Interface identifier number obtains and shows corresponding connections figure, will be described in order to which tester is according to the connections figure
Test board, the test equipment and optical module to be tested establish connection, to be tested.
9. Auto-Test System according to claim 8, which is characterized in that the test equipment includes Error Detector, spectrum
Instrument and oscillograph are provided with test position and photoswitch for coupling optical module to be tested on the test board；
One end of the Error Detector, the spectrometer and the oscillograph is connect with the slave computer, wherein the connections
The other end of the Error Detector, the spectrometer and the oscillograph and the connection relationship of the test board are shown in figure, it will
The test board, the test equipment and optical module to be tested establish connection, to be tested.
10. Auto-Test System according to claim 8, which is characterized in that the host computer is also used to the target
Test item is loaded onto queue to be tested, is obtained and is shown and is associated with test item with what the interface identifier number matched；It is receiving
After the triggering command for selecting the association test item to tester, the association test item is added to the item team to be tested
In column, to be sequentially completed to the target detection item and the test for being associated with test item.
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| CN112887019B (en) * | 2021-04-28 | 2021-07-30 | 武汉长光科技有限公司 | Method and device for testing optical receiver and computer storage medium |
| CN113420008A (en) * | 2021-05-12 | 2021-09-21 | 武汉联特科技股份有限公司 | LabVIEW-based parameter management method for different stations and processes of optical device |
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