CN103869260B - A kind of power detecting system and method - Google Patents
A kind of power detecting system and method Download PDFInfo
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- CN103869260B CN103869260B CN201210537089.6A CN201210537089A CN103869260B CN 103869260 B CN103869260 B CN 103869260B CN 201210537089 A CN201210537089 A CN 201210537089A CN 103869260 B CN103869260 B CN 103869260B
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- 238000000034 method Methods 0.000 title claims description 10
- 238000012360 testing method Methods 0.000 claims abstract description 171
- 238000004891 communication Methods 0.000 claims abstract description 53
- 238000010998 test method Methods 0.000 claims abstract description 4
- 229910044991 metal oxide Inorganic materials 0.000 claims description 3
- 150000004706 metal oxides Chemical class 0.000 claims description 3
- 239000004065 semiconductor Substances 0.000 claims description 3
- 239000000945 filler Substances 0.000 abstract 2
- 238000004088 simulation Methods 0.000 abstract 1
- 238000010586 diagram Methods 0.000 description 7
- 238000012216 screening Methods 0.000 description 7
- 230000032683 aging Effects 0.000 description 3
- 238000009863 impact test Methods 0.000 description 3
- 238000005070 sampling Methods 0.000 description 2
- TVEXGJYMHHTVKP-UHFFFAOYSA-N 6-oxabicyclo[3.2.1]oct-3-en-7-one Chemical compound C1C2C(=O)OC1C=CC2 TVEXGJYMHHTVKP-UHFFFAOYSA-N 0.000 description 1
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Abstract
The invention discloses a kind of power detecting system, this system includes: high-low temperature test chamber, programmable power supply, program control load, channel control card and data acquisition unit, and described high-low temperature test chamber, described programmable power supply, described program control load, described channel control card, described data acquisition unit are all connected by communication interface with testing and control equipment.The present invention further simultaneously discloses a kind of power supply test method, use the present invention, can be under the extreme operating conditions of simulation, communication power supply is carried out batch filler test, improve the q&r of the communication power supply dispatched from the factory, also solve the problem that only just multiple stage communication power supply can be carried out filler test with single set programmable power supply and program control load simultaneously.
Description
Technical Field
The invention relates to the field of testing, in particular to a power supply testing system and method.
Background
The communication power supply is a heart of the communication system, is stable and reliable, is a key for ensuring the safe and reliable operation of the communication system, and once the communication power supply fails, the power supply of the communication power supply to the communication equipment is interrupted, the communication equipment cannot operate, and further, the communication circuit is interrupted, and the communication system is paralyzed, so that great economic and social benefit losses are caused.
At present, in order to ensure the quality of a communication power supply, a function test and an aging test are required to be performed on the communication power supply before the communication power supply is shipped. The function test of the communication power supply is generally only carried out at normal temperature; the aging test is also only to simulate a high temperature environment for testing. And screening the communication power supplies through a function test and an aging test, screening out unqualified communication power supplies, and ensuring the quality of the outgoing communication power supplies as much as possible. However, these test conditions do not reach the working limit condition of the communication power supply, and when the communication power supply is close to the working limit condition in practical application, a failure may still occur, which causes a quality problem. At present, communication power supply manufacturers generally need to connect a set of loads to each communication power supply to be tested when testing the communication power supplies, and the utilization rate of equipment resources is low.
Disclosure of Invention
In view of the above, the present invention provides a power supply testing system and method, which can perform a batch screening test on communication power supplies in a simulated extreme working environment, so as to improve the quality and reliability of communication power supplies shipped from factories and improve the utilization rate of device resources.
In order to achieve the purpose, the technical scheme of the invention is realized as follows:
the invention provides a power supply testing system which comprises a high-low temperature test box, a program-controlled power supply, a program-controlled load, a channel control card and a data acquisition unit, wherein the high-low temperature test box, the program-controlled power supply, the program-controlled load, the channel control card and the data acquisition unit are all connected with a testing control device through communication interfaces; wherein,
the high-low temperature test box is used for providing a temperature and humidity environment for the power supply to be tested according to set test parameters;
the program-controlled power supply is used for providing voltage for the power supply to be tested according to set test parameters;
the program-controlled load is used for providing a dynamic load for the tested power supply according to the set test parameters;
the channel control card is used for sequentially connecting the program-controlled load with the tested power supply one by one in a time-sharing manner;
and the data acquisition unit is used for acquiring the response of the tested power supply connected with the program-controlled load and uploading the acquired information to the test control equipment.
In the above solution, the system further includes: a tooling plate and an adapter plate,
the tooling plate is connected with the adapter plate through a cable, and the tooling plate is connected with the programmable power supply through a cable;
the adapter plate is connected with the program control load through a cable and is controlled by the channel control card;
the channel control card is specifically used for accessing the program-controlled load to a tested power supply connected with the adapter plate in a time-sharing manner through the adapter plate and the tooling plate.
In the above scheme, the test parameters are set by the test control device according to user input.
In the above scheme, the data collector is specifically configured to:
and collecting the response of the tested power supply connected with the program-controlled load from the adapter plate.
In the above solution, the system further includes a test control device, configured to: and comparing the acquisition information uploaded by the data acquisition unit with a set value, automatically judging whether the requirements are met, and automatically generating a test report.
The invention also provides a power supply testing method, which is applied to a power supply testing system and comprises the following steps:
the high-low temperature test box, the program-controlled power supply and the program-controlled load respectively provide a temperature and humidity environment, voltage and a dynamic load for the power supply to be tested according to set test parameters;
the channel control card is used for providing program-controlled loads of loads for the power supply to be tested and sequentially connecting the program-controlled loads with the power supply to be tested one by one in a time-sharing manner;
and the data acquisition unit acquires the response of the tested power supply connected with the program-controlled load and uploads the acquired information to the test control equipment.
In the above scheme, the channel control card connects the program control load time-sharing with the power supply to be tested one by one in proper order, and includes:
and the channel control card accesses the program control load to the corresponding tested power supply connected with the adapter plate in a time-sharing manner through the adapter plate and the tooling plate.
In the foregoing solution, before the testing, the method further includes: and setting test parameters according to user input.
In the above scheme, the collecting the response of the power supply to be tested connected to the program-controlled load is:
and the data acquisition unit acquires the response of the tested power supply connected with the program-controlled load from the adapter plate.
In the above scheme, after the collected information is uploaded to the test control device, the method further includes:
and the test control equipment compares the acquisition information uploaded by the data acquisition unit with a set value, automatically judges whether the requirements are met, and automatically generates a test report.
The test system and the test method provided by the invention can automatically screen the communication power supplies in batches under the condition of a simulated extreme working environment, detect unqualified communication power supplies to the maximum extent, and improve the quality and reliability of the communication power supplies which leave a factory. In the test system, a plurality of communication power supplies can be automatically screened and tested only by using a single set of program-controlled power supply and program-controlled load, so that the utilization rate of equipment resources is improved, and the equipment cost is saved.
Drawings
FIG. 1 is a schematic diagram of a power testing system according to the present invention;
FIG. 2 is a schematic diagram of a power testing method according to the present invention;
FIG. 3 is a schematic diagram of a batch screening test of communication power supplies according to the present invention;
FIG. 4 is a schematic diagram of a test implementation flow of batch screening communication power supplies according to an embodiment of the present invention;
fig. 5 is a schematic view of an operation interface of the test control apparatus according to the embodiment of the present invention.
Detailed Description
The present invention will be described in further detail with reference to the accompanying drawings and specific embodiments.
In the present invention, for convenience of description, the power supplies to be tested are all referred to as communication power supplies to be tested.
Fig. 1 is a schematic structural diagram of a power supply testing system of the present invention, as shown in fig. 1, the power supply testing system includes a high-low temperature testing box 1, a programmable power supply 2, a programmable load 3, a data collector 4, a channel control card 5 and a test control device 8, and the high-low temperature testing box 1, the programmable power supply 2, the programmable load 3, the data collector 4 and the channel control card 5 are all connected to the test control device 8 through communication interfaces; wherein,
the high-low temperature test box 1 is used for providing a temperature and humidity environment for the power supply 9 to be tested according to set test parameters;
the program-controlled power supply 2 is used for providing voltage for the power supply 9 to be tested according to set test parameters;
the program-controlled load 3 is used for providing a dynamic load according to a set test parameter by the tested power supply 9;
the channel control card 5 is used for sequentially connecting the program-controlled load 3 with the power supply 9 to be tested one by one;
and the data acquisition unit 4 is used for acquiring the response of a tested power supply 9 connected with the program-controlled load 3 and uploading the acquired information to the test control equipment 8.
Here, the high-low temperature test chamber 1 has a communication interface connected to the test control device 8, and the program in the test control device 8 controls the high-low temperature test chamber 1 to simulate a limited temperature and humidity environment; the programmable power supply 2 and the programmable load 3 are also connected with the test control device 8 through communication interfaces, and the programmable power supply 2 and the programmable load 3 can simulate a limited electrical stress environment through program control in the test control device 8.
Specifically, the power supply test system further comprises a tooling plate 6 and an adapter plate 7, wherein the tooling plate 6 is connected with the adapter plate 7 through a cable, and the tooling plate 6 is connected with the programmable power supply 2 through a cable, so that the programmable power supply 2 provides required voltage input for a tested power supply 9; the adapter plate 7 is connected with the program-controlled load 3 through a cable and is controlled by the channel control card 5; wherein,
the tooling plate 6 is used for connecting the tested power supplies 9 connected with the tooling plate 6 with the adapter plate 7 one by one, the connection is only physical connection with the adapter plate 7, and whether the adapter plate 7 is conducted or not is realized by the control of the channel control card 5;
the adapter plate 7 is used for sequentially conducting the corresponding tested power supplies 9 connected with the tooling plate 6 one by one according to the control of the channel control card 5;
the channel control card 5 is specifically used for accessing the program-controlled load 3 to the corresponding power supply 9 connected with the adapter board 7 in a time-sharing manner through the adapter board 7 and the tooling board 6.
When the number of the tested power supplies 9 is large, a plurality of tooling plates 6 can be arranged and respectively connected with the tested power supplies 9, and a plurality of adapter plates 7 can be arranged and respectively connected with the tooling plates 6.
Here, the load cables between the tooling board 6 and the adapter board 7 are connected in parallel by multiple tooling boards, and the channel control card 5 switches the program-controlled load 3 into the corresponding power supply 9 to be tested connected with the adapter board 7 in a time-sharing manner through the relay switching of the adapter board 7.
Specifically, when the power supply testing system is used for testing, the power supply 9 to be tested is placed in the high-low temperature test box 1, and the power supply 9 to be tested is connected with the tooling plate 6 through a cable.
Specifically, the test parameters are set by the test control device according to user input.
Specifically, the data collector 4 is specifically configured to:
the response of the measured power supply 9 connected to the programmable load 3 is collected from the adapter plate 7.
Here, the adapter board 7 has a sampling cable for inputting and outputting the measured value and is connected to the data collector 4. The response is the voltage, current equivalent value of the input and output of the power supply 9 to be tested.
Specifically, the test control device 8 is further configured to compare the acquisition information uploaded by the data acquisition device 4 with a set value, automatically determine whether the requirements are met, and automatically generate a test report.
Here, a plurality of power supplies 9 to be tested are placed in the high and low temperature test chamber 1, and input lines and output lines of the power supplies 9 to be tested are connected to power supply input lines and load lines on the tooling plate 6. The input lines on all the tooling plates 6 are connected with the programmable power supply 2; the load lines on all the tooling plates 6 are connected to the adapter plate 7, the adapter plate 7 is provided with a sampling cable for inputting and outputting measured values and is connected with the data acquisition device 4, and only one path of load is output on the adapter plate 7 and is connected with the program control load 3. The relay on the adapter plate 7 is controlled by the channel control card 5, so that the output of only one power supply to be tested can be connected with the program-controlled load 3 at any time. The channel control card 5 is connected with the test control device 8 through a communication interface, a program control module in the test control device 8 issues a channel switching instruction to the channel control card 5, the channel control card 5 is connected with the tooling plate 6 and the adapter plate 7, and the switching action of a relay or an MOS (metal oxide semiconductor) tube of the adapter plate 7 can be driven according to the instruction requirement, so that the program-controlled load 3 is switched to be connected with different tested power supplies 9.
Fig. 2 is a schematic flow chart of an implementation of the power testing method of the present invention, the testing method is applied to the power testing system shown in fig. 1, and as shown in fig. 2, the method includes the following steps:
step 201: setting test parameters;
specifically, according to user input, the test control equipment sets test parameters;
step 202: the power supply testing system prepares a testing environment according to the set testing parameters;
specifically, the high-low temperature test box, the program-controlled power supply and the program-controlled load respectively provide a temperature and humidity environment, voltage and a dynamic load for the tested power supply according to set test parameters;
step 203: the test is started and a test report is generated.
Specifically, before testing, a power supply to be tested is placed in a high-low temperature test chamber, and the power supply to be tested is connected with a tooling plate through a cable.
Specifically, the channel control card is used for providing program-controlled loads of loads for the power supply to be tested and sequentially connecting the program-controlled loads with the power supply to be tested one by one in a time-sharing manner;
and the data acquisition unit acquires the response of the tested power supply connected with the program-controlled load and uploads the acquired information to the test control equipment.
Specifically, the channel control card connects programme-controlled load timesharing and measured power in proper order one by one, includes:
and the channel control card accesses the program control load to the corresponding tested power supply connected with the adapter plate in a time-sharing manner through the adapter plate and the tooling plate.
Specifically, the collecting of the response of the power supply to be tested connected to the programmable load is:
and the data acquisition unit acquires the response of the tested power supply connected with the program-controlled load from the adapter plate.
Specifically, after the acquisition information is uploaded to the test control device, the test control device compares the acquisition information uploaded by the data acquisition device with a set value, automatically determines whether the requirements are met, and automatically generates a test report.
Fig. 3 is a schematic diagram of the power supply batch screening test of the present invention, and the power supply test system of the present invention uses automatic test software to complete the automatic test of the communication power supply, and the test principle is shown in fig. 3. The highest value and the lowest value of the environmental temperature in the high-low temperature test box, the highest value and the lowest value of the voltage (namely the input voltage) provided by the programmable power supply, the maximum value and the minimum value of the load provided by the programmable load and the cycle periods of all the items are independently controlled after setting, N communication power supplies to be tested are tested in turn, all combination conditions of all the limit conditions can be ensured to be traversed by each communication power supply through several cycles, and whether the communication power supplies to be tested can break down under the limit working condition is found through testing.
For example, when the ambient temperature is the highest value and the input voltage is the highest value, the N communication power supplies are tested one by one, and each communication power supply is subjected to a load impact test process in this environment. By analogy, under the condition that the environment temperature is the lowest value and the input voltage is the highest value, under the condition that the environment temperature is the highest value and the input voltage is the lowest value, and under the condition that the environment temperature is the lowest value and the input voltage is the lowest value, each communication power supply is subjected to a load impact test under the several environments, so that whether the tested communication power supply fails under the limit working condition can be found better through the test.
Fig. 4 is a schematic diagram of a test implementation flow of batch screening communication power supplies according to an embodiment of the present invention, as shown in fig. 4, including the following steps:
step 401: setting test parameters according to user input, and then entering step 402;
specifically, the test parameters include: the program-controlled power supply provides the highest value and the lowest value of input voltage for the power supply to be tested, the high-low temperature test box provides the highest value and the lowest value of temperature for the power supply to be tested, the program-controlled load provides the maximum value and the minimum value of dynamic load for the power supply to be tested, input voltage cycle time, environment temperature cycle time, load cycle time, total test time and the like, the test parameters are input by a user through an operation interface of the test control equipment, and the test control equipment sets according to the input of the user.
Here, the set test parameters may be manually modified or the test standard of the communication power supply under test may be imported according to the model of the communication power supply under test.
Step 402: starting a test start button, and then entering step 403;
specifically, a tester clicks a start test button through an operation interface of the test control device.
Step 403: the high-low temperature test box, the program-controlled power supply and the program-controlled load start to work according to set test parameters, namely a temperature environment, an input voltage and a dynamic load are respectively provided for the power supply to be tested;
here, the temperature environment, the input voltage, and the load condition are adjusted continuously according to the set test parameters, so that each tested communication power source traverses the combination of the various limit operating conditions as shown in fig. 3.
Step 404: controlling a relay in an Nth path (starting from N to 1) of the adapter plate to be switched on, carrying out load impact test on an Nth tested power supply, and then entering step 405;
here, the control unit is configured to control the relay in the nth adapter board to be turned on, that is, to connect the programmable load with the nth power supply to be tested.
Specifically, the channel control card connects different tested power supplies with the program-controlled load by controlling the relay switch action of the adapter plate, so as to realize the test of the communication power supplies one by one.
Step 405: recording test data and judging whether the tested power supply is qualified, if so, entering a step 406, otherwise, entering a step 407;
specifically, the data acquisition unit acquires the response of the power supply to be tested connected with the program-controlled load from the adapter plate and uploads the acquired information to the test control equipment.
Specifically, after the acquisition information is uploaded to the test control device, the test control device compares the acquisition information uploaded by the data acquisition unit with a set value, and automatically judges whether the tested power supply is qualified. Here, if the tested power supply is judged to be qualified in the test, the indicator light on the operation interface of the test control equipment can be driven to display green.
Specifically, the test results of all the tested power supplies can be displayed through indicator lights on the operation interface of the test control device, such as: the color of the indicator light can be set by a designer by indicating that the power supply to be measured works normally, yellow indicates that the power supply to be measured has faults and the fault occurrence frequency is less than three times, red indicates that the power supply to be measured has faults and the fault occurrence frequency is three times or more, and black indicates that the power supply to be measured is not placed.
Step 406: controlling the Nth path of relay to be disconnected, and then entering step 408;
step 407: alarming and outputting fault information, and then entering step 406;
specifically, the indicator light on the operation interface of the test control device displays the fault state of the tested power supply, so that a tester is reminded that the tested power supply has a fault, the fault information of the tested power supply is written into the fault information list, and the fault information list is displayed on the operation interface.
Step 408: judging whether the set total test time is reached, if so, entering a step 410, otherwise, entering a step 409;
step 409: assigning a new value to N, and then entering step 404;
here, the assigning N to a new value is: judging whether N is the maximum value, if not, adding 1 to N, otherwise, resetting N to 1; namely, the tested power supply is tested in a cycle mode from N to 1.
Step 410: and saving the test report and finishing the test.
Fig. 5 is a schematic view of an operation interface of the test control device according to the embodiment of the present invention, as shown in fig. 5, a parameter setting button, a test start button, a test stop button, and a report check button are provided on the operation interface, and a tester can operate the operation interface by clicking an input device such as a mouse; the position of the current tested power supply, various measured values of the tested power supply and temperature and humidity values of the current test environment can be seen from the middle left position of the operation interface, wherein the measured values comprise: the temperature and humidity sensor comprises an input voltage value, an input current value, a 1-path output voltage value, a 1-path output current value, a 2-path output voltage value, a 2-path output current value, a current environment temperature value and a current environment humidity value; the test results of all the tested power supplies can be represented by indicator lights, wherein the embodiment of the invention uses green to represent that the tested power supplies work normally, yellow to represent that the tested power supplies have faults and have the fault times less than three, red to represent that the tested power supplies have the faults and have the fault times more than three, and black to represent that the tested power supplies are not placed. Here, the color of the indicator lamp may be set by a designer at his or her discretion.
The specific information of all the tested power supplies with faults can be searched from a fault information table, and the date of the tested power supplies with faults, the time of the faults, the position of the tested power supplies, the temperature value and the humidity value of the current environment, the input voltage value, the input current value, the 1-path output voltage value, the 1-path output current value, the 2-path output voltage value, the 2-path output current value and the like can be displayed in the fault information table.
The above description is only for the preferred embodiment of the present invention, and is not intended to limit the scope of the present invention.
Claims (8)
1. A power supply test system is characterized in that the test system comprises a high-low temperature test box, a program-controlled power supply, a program-controlled load, a channel control card and a data acquisition unit, wherein the high-low temperature test box, the program-controlled power supply, the program-controlled load, the channel control card and the data acquisition unit are all connected with a test control device through communication interfaces; wherein,
the high-low temperature test box is used for providing a temperature and humidity environment for the power supply to be tested according to set test parameters;
the program-controlled power supply is used for providing voltage for the power supply to be tested according to set test parameters;
the program-controlled load is used for providing a dynamic load for the power supply to be tested according to the set test parameters;
the channel control card is used for sequentially connecting the program-controlled load with the tested power supply one by one in a time-sharing manner;
the data acquisition unit is used for acquiring the response of the tested power supply connected with the program-controlled load and uploading the acquired information to the test control equipment;
the system further comprises: a tooling plate and an adapter plate,
the tooling plate is connected with the adapter plate through a cable, and the tooling plate is connected with the programmable power supply through a cable;
the adapter plate is connected with the program control load through a cable and is controlled by the channel control card;
the channel control card is specifically used for driving a relay or an MOS (metal oxide semiconductor) tube of the adapter plate to switch on and off according to the instruction of the test control equipment through the adapter plate and the tooling plate, and the program-controlled load is switched into a corresponding tested power supply connected with the adapter plate in a time-sharing manner.
2. The power supply test system of claim 1, wherein the test parameters are set by the test control device based on user input.
3. The power supply testing system of claim 1, wherein the data collector is specifically configured to:
and collecting the response of the tested power supply connected with the program-controlled load from the adapter plate.
4. The power supply test system of claim 1, further comprising a test control device for: and comparing the acquisition information uploaded by the data acquisition unit with a set value, automatically judging whether the requirements are met, and automatically generating a test report.
5. A power supply test method is applied to a power supply test system, and is characterized in that the test method comprises the following steps:
the high-low temperature test box, the program-controlled power supply and the program-controlled load respectively provide a temperature and humidity environment, voltage and a dynamic load for the power supply to be tested according to set test parameters;
the channel control card is used for providing program-controlled loads of loads for the power supply to be tested and sequentially connecting the program-controlled loads with the power supply to be tested one by one in a time-sharing manner;
the data acquisition unit acquires the response of a tested power supply connected with the program-controlled load and uploads the acquired information to the test control equipment;
the channel control card connects programme-controlled load timesharing and measured power in proper order one by one, includes:
and the channel control card drives a relay or an MOS (metal oxide semiconductor) tube of the adapter plate to switch on and off according to the instruction of the test control equipment through the adapter plate and the tooling plate, and the program-controlled load is switched into a corresponding tested power supply connected with the adapter plate in a time-sharing manner.
6. The power supply testing method of claim 5, wherein prior to testing, the method further comprises: and setting test parameters according to user input.
7. The power supply testing method of claim 5, wherein the response to the power supply under test connected to the programmable load is collected as:
and the data acquisition unit acquires the response of the tested power supply connected with the program-controlled load from the adapter plate.
8. The power supply testing method according to claim 5, wherein after the uploading of the collected information to the testing control device, the method further comprises:
and the test control equipment compares the acquisition information uploaded by the data acquisition unit with a set value, automatically judges whether the requirements are met, and automatically generates a test report.
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| CN102435954A (en) * | 2011-10-24 | 2012-05-02 | 天津市中环电子计算机有限公司 | 17.5W alternating current power supply testing system |
| CN102540103A (en) * | 2010-12-09 | 2012-07-04 | 西安中科麦特电子技术设备有限公司 | Novel light emitting diode (LED) switching power supply test system |
| CN202421477U (en) * | 2011-12-14 | 2012-09-05 | 中国广东核电集团有限公司 | Device for detecting power supply reliability of nuclear power station |
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| CN101101324A (en) * | 2006-07-04 | 2008-01-09 | 上海创想电源设备有限公司 | Power supply apparatus test device containing coding load |
| CN102129044A (en) * | 2010-01-13 | 2011-07-20 | 鸿富锦精密工业（深圳）有限公司 | Power supply test system |
| CN101806869A (en) * | 2010-03-22 | 2010-08-18 | 株洲南车时代电气股份有限公司 | General-purpose automatic test system for locomotive switching power supply and method thereof |
| CN102540103A (en) * | 2010-12-09 | 2012-07-04 | 西安中科麦特电子技术设备有限公司 | Novel light emitting diode (LED) switching power supply test system |
| CN202033464U (en) * | 2011-02-22 | 2011-11-09 | 杭州可靠性仪器厂 | Energy feedback type power supply module test device |
| CN102230955A (en) * | 2011-06-24 | 2011-11-02 | 株洲南车时代电气股份有限公司 | Dynamic ageing monitoring system and method for switch mode power supply of locomotive |
| CN102435954A (en) * | 2011-10-24 | 2012-05-02 | 天津市中环电子计算机有限公司 | 17.5W alternating current power supply testing system |
| CN202421477U (en) * | 2011-12-14 | 2012-09-05 | 中国广东核电集团有限公司 | Device for detecting power supply reliability of nuclear power station |
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