CN111984479A - Method and system for carrying out startup and shutdown and restart tests on Android mainboard based on single chip microcomputer - Google Patents
Method and system for carrying out startup and shutdown and restart tests on Android mainboard based on single chip microcomputer Download PDFInfo
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- CN111984479A CN111984479A CN202010788536.XA CN202010788536A CN111984479A CN 111984479 A CN111984479 A CN 111984479A CN 202010788536 A CN202010788536 A CN 202010788536A CN 111984479 A CN111984479 A CN 111984479A
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- single chip
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- restart
- chip microcomputer
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2273—Test methods
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/26—Functional testing
- G06F11/263—Generation of test inputs, e.g. test vectors, patterns or sequences ; with adaptation of the tested hardware for testability with external testers
Abstract
A method for carrying out startup and shutdown and restart tests on an Android mainboard based on a single chip microcomputer is characterized by comprising the following steps: connecting an IO port of an Android mainboard (of a device to be tested) with an IO port of a single chip microcomputer; selecting test items, including a power-off test, a restart test, a sleep wakeup and a shutdown test; testing the selected test items; if the test result is abnormal, an alarm signal is sent out, and the site is reserved; and if the test result is normal, completing the test. The invention has the advantages that: the single chip IO is connected with the corresponding function IO of the main board and the power supply, and tests such as dormancy awakening, restarting, startup and shutdown, accidental power failure and the like are automatically carried out on the equipment through a single chip program. The single chip microcomputer is used for simulating user operation, testing equipment can be tested only by software, multiple pieces of equipment can be tested simultaneously, labor is saved greatly, and testing efficiency is improved.
Description
Technical Field
The invention relates to a method and a system for performing startup and shutdown and restart tests on an Android mainboard based on a single chip microcomputer, and belongs to the technical field of computer application.
Background
When an Android mainboard and an Android system are researched and developed, startup and shutdown, restart and dormancy awakening tests are indispensable test items in functionality and stability tests. The simple software cannot perform the power-on operation after shutdown and the power-off and power-on test, and in the current test method, the operation of power-off and the like is basically performed manually by a tester. This takes a lot of time for the tester and the stress test cannot be performed.
Disclosure of Invention
The invention provides a method and a system for carrying out startup and shutdown and restart tests on an Android mainboard based on a single chip microcomputer, and aims to solve the problems in the prior art.
The technical scheme of the invention is as follows: (1) respectively connecting a plurality of functional IO ports of an Android main board of a device to be tested with IO ports of a single chip microcomputer;
(2) selecting test items, including a power-off test, a restart test, a sleep wakeup and a shutdown test;
(3) testing the selected test items;
(4) if the test result is abnormal, an alarm signal is sent out, and the site is reserved; if the test result is normal, the test of the selected project is finished;
(5) and (5) repeating the steps (2) to (4) until all the test items are completed.
The functional IO port of the Android mainboard comprises: the POWER key is used for realizing shutdown and dormancy awakening, and the restart key is used for realizing restart; the shutdown test is realized by directly turning off the power supply.
The invention has the advantages that: the single chip IO is connected with the corresponding function IO of the main board and the power supply, and tests such as dormancy awakening, restarting, startup and shutdown, accidental power failure and the like are automatically carried out on the equipment through a single chip program. The single chip microcomputer is used for simulating user operation, testing equipment can be tested only by software, multiple pieces of equipment can be tested simultaneously, labor is saved greatly, and testing efficiency is improved.
Drawings
FIG. 1 is a block diagram of a system for connecting a plurality of Android mainboards to perform startup, shutdown and restart tests based on a single chip microcomputer;
FIG. 2 is a flowchart of a method for performing startup and shutdown and restart tests on an Android motherboard based on a single chip microcomputer;
FIG. 3 is a schematic diagram of a specific connection relationship between a single-chip microcomputer and a single Android motherboard.
Detailed Description
Referring to fig. 1-3, the POWER button on the Android motherboard to be tested and the IO of the restart button function (the "function IO" in fig. 3 refers to the IO of the restart button and the IO of the POWER button), the serial port and the relay are connected through the single chip IO. An IO port and a relay of the singlechip are combined into a switch to control the Android mainboard power supply. The relay is directly connected to a power input terminal of the Android mainboard. The single chip microcomputer carries out information transmission such as a test mode, a test state and the like with a tested device (Android mainboard) through a serial port, and simulates user operation to carry out operations of dormancy awakening, startup and shutdown, restarting and accidental power failure on the test device according to a preset value and communication information. The Android mainboard startup and shutdown key is effectively short-circuited to the ground, and the scheme is that the singlechip is used for controlling high and low levels of the corresponding key to simulate manual operation. And the device abnormality is detected through serial port communication, the abnormal device is early warned, and an abnormal site is reserved.
The specific test flow of the invention is shown in fig. 2, and comprises the following steps:
(1) respectively connecting a POWER key and a restart key of an Android main board of a tested device with an IO port of a single chip microcomputer, connecting a serial port and connecting a POWER supply part;
(2) selecting test items, including a power-off test, a restart test, a sleep wakeup and a shutdown test;
(3) testing the selected test items;
(4) if the test result is abnormal, an alarm signal is sent out, and the site is reserved; if the test result is normal, the test of the selected project is finished;
(5) and (5) repeating the steps (3) to (5) until all the test items are completed.
"device 1-device n" in fig. 1 is the Android motherboard under test; the conversion circuit is in the prior art and is used for converting the level of the IO of the singlechip IO and the IO of the tested Android mainboard into the mutually adaptive or same level.
In conventional testing, software operations cannot continue after the device is shut down. The invention introduces a single chip microcomputer system, simulates manual power on and power off and key operation, and is operated by the single chip microcomputer at the stage that the software of a tested mainboard (Android mainboard) cannot run.
Claims (2)
1. A method for carrying out startup and shutdown and restart tests on an Android mainboard based on a single chip microcomputer is characterized by comprising the following steps:
(1) respectively connecting a plurality of functional IO ports of an Android main board of a device to be tested with IO ports of a single chip microcomputer;
(2) selecting test items, including a power-off test, a restart test, a sleep wakeup and a shutdown test;
(3) testing the selected test items;
(4) if the test result is abnormal, an alarm signal is sent out, and the site is reserved; if the test result is normal, the test of the selected project is finished;
(5) and (5) repeating the steps (2) to (4) until all the test items are completed.
2. The method for performing on-off and restart tests on the Android motherboard based on the single chip microcomputer according to claim 1, wherein the functional IO port of the Android motherboard comprises: the POWER key is used for realizing shutdown and dormancy awakening, and the restart key is used for realizing restart; the shutdown test is realized by directly turning off the power supply.
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CN202010788536.XA CN111984479A (en) | 2020-08-07 | 2020-08-07 | Method and system for carrying out startup and shutdown and restart tests on Android mainboard based on single chip microcomputer |
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CN202010788536.XA CN111984479A (en) | 2020-08-07 | 2020-08-07 | Method and system for carrying out startup and shutdown and restart tests on Android mainboard based on single chip microcomputer |
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Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN113010360A (en) * | 2021-04-22 | 2021-06-22 | 读书郎教育科技有限公司 | Software and hardware combined aging test method for simulating real operation on/off |
CN113704039A (en) * | 2021-09-03 | 2021-11-26 | 北京同方信息安全技术股份有限公司 | Auxiliary test equipment, system and method for computer product test |
CN115167255A (en) * | 2022-09-05 | 2022-10-11 | 深圳市晶存科技有限公司 | Automatic dormancy awakening system, method, device and equipment |
CN117074915A (en) * | 2023-08-23 | 2023-11-17 | 扬州万方科技股份有限公司 | Board card soft and hard restarting test system and method based on characteristic keyword monitoring technology |
-
2020
- 2020-08-07 CN CN202010788536.XA patent/CN111984479A/en not_active Withdrawn
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN113010360A (en) * | 2021-04-22 | 2021-06-22 | 读书郎教育科技有限公司 | Software and hardware combined aging test method for simulating real operation on/off |
CN113704039A (en) * | 2021-09-03 | 2021-11-26 | 北京同方信息安全技术股份有限公司 | Auxiliary test equipment, system and method for computer product test |
CN115167255A (en) * | 2022-09-05 | 2022-10-11 | 深圳市晶存科技有限公司 | Automatic dormancy awakening system, method, device and equipment |
CN117074915A (en) * | 2023-08-23 | 2023-11-17 | 扬州万方科技股份有限公司 | Board card soft and hard restarting test system and method based on characteristic keyword monitoring technology |
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Application publication date: 20201124 |