CN102854417B - Master test board and testing method thereof - Google Patents

Master test board and testing method thereof Download PDF

Info

Publication number
CN102854417B
CN102854417B CN201210296010.5A CN201210296010A CN102854417B CN 102854417 B CN102854417 B CN 102854417B CN 201210296010 A CN201210296010 A CN 201210296010A CN 102854417 B CN102854417 B CN 102854417B
Authority
CN
China
Prior art keywords
test
mobile device
parameter
card
signal generator
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN201210296010.5A
Other languages
Chinese (zh)
Other versions
CN102854417A (en
Inventor
詹永明
倪炜华
王莹
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Samsung Semiconductor China R&D Co Ltd
Samsung Electronics Co Ltd
Original Assignee
Samsung Semiconductor China R&D Co Ltd
Samsung Electronics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Samsung Semiconductor China R&D Co Ltd, Samsung Electronics Co Ltd filed Critical Samsung Semiconductor China R&D Co Ltd
Priority to CN201210296010.5A priority Critical patent/CN102854417B/en
Publication of CN102854417A publication Critical patent/CN102854417A/en
Application granted granted Critical
Publication of CN102854417B publication Critical patent/CN102854417B/en
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Landscapes

  • Mobile Radio Communication Systems (AREA)
  • Telephone Function (AREA)

Abstract

The invention provides a master test board and a testing method thereof. The master test board comprises a user setting module, and a signal generation module, wherein the user setting module is used for setting a testing project and corresponding testing parameters; and the signal generation module is used for outputting a corresponding level signal according to the parameters corresponding to the project set by the user setting module so as to test performances of a mobile device. The master test board can test each performance of the mobile device automatically; the master test board is strong in generality, low in cost; and through the master test board, the invested manpower and material resources for testing can be reduced, and the stability of products is increased.

Description

Master test board and method of testing thereof
Technical field
The application relates to a kind of master test board and method of testing, specifically, relates to a kind of master test board for testing mobile device and method of testing thereof.
Background technology
Current mobile device storer used is Nand Flash mostly, and user is more and more higher for the requirement of the stability of data, thus to the switching on and shutting down test of mobile device and sleep-awake test very important for the mobile terminal based on high level operating system.In addition, the external interface of mobile device is more and more (such as, card class (SD/SIM), cable (USB/HDMI) etc.) also, therefore also needs to test for the access of external interface and the impact of extracting for mobile device.The way of current most manufacturer is manual test, and such as manually plugging test etc. to the test of the switching on and shutting down of mobile device and connecting line is all method of testing by hand.In addition, some manufacturers use the specialized equipment of automatic on/off test of computer to realize for switching on and shutting down test, and this is all a kind of waste undoubtedly on man power and material.Meanwhile, manual test is used also to be difficult to realize the long-time test more than 24 hours.
Summary of the invention
The object of the present invention is to provide a kind of master test board.Described master test board can realize the test of the properties to mobile device automatically, highly versatile, and cost is low, can reduce the manpower and materials that test needs to drop into, and increase the stability of product.
In one aspect of the invention, provide a kind of master test board, comprising: user arranges module, test event and corresponding test parameter are set; Signal generator module, exports corresponding level signal to test the performance of mobile device according to the test parameter that user arranges the test event of module installation corresponding.
According to a further aspect in the invention, user arranges by user the test event that module installation tests mobile device, and arranges the parameter corresponding to test event.
According to a further aspect in the invention, when carrying out switching on and shutting down test to mobile device, the signal output port of signal generator module can be connected on the power key interface of mobile device.
According to a further aspect in the invention, the parameter of carrying out switching on and shutting down test to mobile device can comprise testing time, start used time, start duration, shutdown duration.
According to a further aspect in the invention, the parameter that signal generator module can arrange module installation according to user produces the level signal of the corresponding sequential of parameter had and arrange, and described level signal is outputted on the power key interface of mobile device.
According to a further aspect in the invention, when carrying out sleep-awake test to mobile device, the signal output port of signal generator module can be connected on the interface of sleep-awake key of mobile device.
According to a further aspect in the invention, the parameter of carrying out sleep-awake test can comprise testing time, wake used time, the duration of waking up, sleep time up.
According to a further aspect in the invention, the parameter that signal generator module can arrange module installation according to user produces the level signal with the sequential corresponding to the parameter arranged, and described level signal is outputted on the sleep awakening keyed jointing mouth of mobile device.
According to a further aspect in the invention, when the plug for connecting line or card carries out plug test to the impact of the various functions of mobile device, the signal output port of signal generator module can be connected to the test pin of connecting line or card.
According to a further aspect in the invention, the parameter of plug test can comprise high level lasting time, low duration, testing time.
According to a further aspect in the invention, the parameter that signal generator module can arrange module installation according to user produces the level signal with the sequential corresponding to the parameter arranged, and described level signal is outputted to the test pin of connecting line or card.
According to a further aspect in the invention, described connecting line can comprise at least one in USB line, HDMI/TVOUT line, earphone cord, and described card comprises at least one in SIM card, SD card.
According to a further aspect in the invention, described master test board also can comprise analog switch; When the plug for connecting line or card carries out plug test to the impact of the various functions of mobile device, between described analog switch being connected to signal generator module and connecting line or blocking, and the signal output port of signal generator module is connected to the control end of analog switch, thus export the level signal of the corresponding sequential of parameter had and arrange with the break-make of control simulation switch according to the parameter that user arranges module installation, thus realize plug test.Wherein, for the connecting line needing physical construction to realize to insert and extract or card, need to disconnect the connection between the test pin of line or card and mobile device when hardware design.
According to a further aspect in the invention, described master test board also comprises analog switch, and between described analog switch is connected to mobile device and connecting line or blocks, the signal output port of signal generator module is connected to the control end of analog switch.
According to a further aspect in the invention, when the plug for connecting line or card carries out plug test to the impact of mobile device, the test parameter output that described signal generator module arranges module installation according to user has the level signal of the sequential corresponding to the test parameter arranged with the break-make of control simulation switch, thus realizes plug test.
According to a further aspect in the invention, described master test board also comprises: display, the test event that display is arranged and corresponding test parameter.
According to a further aspect in the invention, signal generator module can adopt the S3C6410 chip of company limited of Samsung to realize, and signal output port can utilize the GPIO port of S3C6410 chip.
In another aspect of this invention, provide a kind of method of testing, described method of testing comprises: arrange module installation test event and corresponding test parameter by the user be included in master test board; Corresponding level signal is exported to test the performance of mobile device according to the parameter that user arranges the test event of module installation corresponding by being included in signal generator module in master test board.
According to a further aspect in the invention, module is set from user's reception to the selection of the test event that mobile device is tested and the test parameter corresponding to test event by user.
According to a further aspect in the invention, when carrying out switching on and shutting down test to mobile device, the signal output port of signal generator module is connected on the power key interface of mobile device.
According to a further aspect in the invention, the test parameter carrying out switching on and shutting down test to mobile device comprises testing time, start used time, start duration, shutdown duration.
According to a further aspect in the invention, the test parameter arranging module installation according to user by signal generator module produces the level signal with the sequential corresponding to the test parameter arranged, and described level signal is outputted on the power key interface of mobile device.
According to a further aspect in the invention, when carrying out sleep-awake test to mobile device, the signal output port of signal generator module is connected on the interface of sleep-awake key of mobile device.
According to a further aspect in the invention, the test parameter carrying out sleep-awake test comprises testing time, wakes used time, the duration of waking up, sleep time up.
According to a further aspect in the invention, the test parameter arranging module installation according to user by signal generator module produces the level signal with the sequential corresponding to the test parameter arranged, and described level signal is outputted on the sleep awakening keyed jointing mouth of mobile device.
According to a further aspect in the invention, when the plug for connecting line or card carries out plug test to the impact of the various functions of mobile device, the signal output port of signal generator module is connected to the connecting line of mobile device or the test pin of card.
According to a further aspect in the invention, the test parameter of plug test comprises high level lasting time, low duration, testing time.
According to a further aspect in the invention, the test parameter arranging module installation according to user by signal generator module produces the level signal with the sequential corresponding to the test parameter arranged, and described level signal is outputted to the test pin of connecting line or card.
According to a further aspect in the invention, described connecting line comprises at least one in USB line, HDMI/TVOUT line, earphone cord, and described card comprises at least one in SIM card, SD card.
According to a further aspect in the invention, described master test board also comprises analog switch, between described analog switch is connected to mobile device and connecting line or blocks, the signal output port of signal generator module is connected to the control end of analog switch, when the plug for connecting line or card carries out plug test to the impact of the various functions of mobile device, the test parameter output arranging module installation according to user by described signal generator module has the level signal of the sequential corresponding to the parameter arranged with the break-make of control simulation switch, thus realizes plug test.
According to a further aspect in the invention, the test event of selection comprise mobile device switching on and shutting down test, sleep awakening test and connecting line or card plug test at least one.
According to a further aspect in the invention, the test event of selection comprises the plug test of at least one connecting line and/or at least one card.
Automatically can realize the test of the properties to mobile device according to master test board of the present invention and method of testing thereof, highly versatile, cost is low, can reduce the manpower and materials that test needs to drop into, and increase the stability of product.According to master test board of the present invention and method of testing thereof, the test of multiple project can be carried out simultaneously.In addition, the support of the exploitation to mobile device can be increased according to master test board of the present invention and method of testing thereof, be convenient to the reproduction of the various problems run in developing.Such as, when there occurs such as switching on and shutting down, sleep-awake, the plug of various line/card in testing during generation systems problem, exploitation and manual method are difficult to reappear, and can utilize and carry out again according to master test board of the present invention and method of testing thereof.
Accompanying drawing explanation
By the description carried out below in conjunction with accompanying drawing, above and other object of the present invention and feature will become apparent, wherein:
Fig. 1 is the block diagram that master test board is according to an exemplary embodiment of the present invention shown;
Fig. 2 is the block diagram of the master test board illustrated according to another exemplary embodiment of the present invention;
Fig. 3 is the process flow diagram of the method for testing of the master test board illustrated according to Fig. 1 and Fig. 2.
Embodiment
Below, embodiments of the invention are described in detail with reference to accompanying drawing.
As shown in Figure 1, master test board comprises according to an exemplary embodiment of the present invention: user arranges module 110, signal generator module 120.Described user arranges module 110 can arrange test event and corresponding test parameter.Here, described test event comprise mobile device switching on and shutting down test, sleep awakening test and connecting line or card plug test at least one.Described signal generator module 120 can export corresponding level signal according to the test parameter corresponding to test event being arranged module 110 setting by user.
Here, realize user by various input media (such as, button, button, keyboard, mouse, touch-screen etc.) and module 110 is set.In one example, can utilize for selecting the knob of test event and the knob for inputting various parameter to arrange module 110 to realize user.Now, by knob being rotated to different angles to select different test events and to input the size of various parameter.In another example, by being shown over the display at the interface, family (such as, virtual instrument) of software simulating, and the selection of test event and the input of corresponding test parameter is realized by input media.
In addition, described signal generator module 120 can adopt various signal processing apparatus to realize.Signal generator module 120, in response to the test parameter corresponding to test event being arranged module 110 reception by user, produces corresponding level signal.Such as, the S3C6410 chip of company limited of Samsung can be adopted to realize signal generator module 120, and the output port of signal can utilize the GPIO port of this chip here.
In addition, master test board also can comprise display according to an exemplary embodiment of the present invention, for showing the test event of setting and corresponding test parameter.
Such as, suppose to carry out switching on and shutting down test to mobile device now, then the signal output port of signal generator module 120 is connected on the power key interface of mobile device.User arranges module 110 by user and selects to carry out switching on and shutting down test to mobile device, and can select to test corresponding parameter to switching on and shutting down, such as, described parameter can comprise testing time, start used time (such as, for performing the time of pressing power key of power-on operation, such as 2S), start duration (keep start used time), shutdown duration (keeping the time that shutdown is used) etc.Here, user arranges user the parameter arranged in module 110 and can be sent to signal generator module 120.The parameter that signal generator module 120 arranges module 110 setting according to user produces the level signal with high/low level with corresponding time sequence, and described level signal is outputted on the power key interface of mobile device.Here, should be appreciated that, power-off operation represents the operation of shutdown suddenly, its time used is negligible, and in start used time and shutdown duration, the level signal of output is low level signal, and in the start duration, the level signal of output is high level signal.Like this, just achieve and utilize the GPIO port of signal generator to control low and high level to realize the effect pressed and upspring of power key.
Be similar to according to the sleep-awake test class for mobile device and the switching on and shutting down of mobile device are tested.When carrying out sleep-awake test to mobile device, the signal output port of signal generator module 120 is connected on the interface of sleep-awake key of mobile device.User arranges module 110 by user and selects to carry out sleep-awake test to mobile device, and can select to test corresponding parameter to sleep-awake, such as, described parameter can comprise testing time, wake up the used time (such as, for performing the time of pressing sleep-awake key of wake operation, such as 2S), wake up the duration and (keep time of wake-up states of mobile device, also namely, can time of normal running mobile device), sleep time (keeping the time that the sleep state of mobile device is used) etc.Every time parameter that signal generator module 120 arranges module 110 setting according to user produces the level signal with corresponding time sequence, and described level signal is outputted on the sleep awakening keyed jointing mouth of mobile device, to achieve the automatic test to sleep-awake.Wherein, waking used time and sleep time up, the level signal that signal generation unit exports is low level signal; And waking up in the duration, the level signal of output is high level signal.Here, giving tacit consent to from wake-up states to dormant transformation is momentary operation, and the time used can ignore.
In addition, when user is for carrying out plug test to connecting line or card etc., the signal output port of signal generator module 120 is connected to the test pin of connecting line on mobile device or card, and arranges in module 110 user corresponding parameter is set, to realize the plug test of connecting line or card etc.Mobile device can according to the level of the test pin of connecting line or card, identifies connecting line or whether card is connected to mobile device.Such as, mobile device according to the level of the test pin in the draw-in groove of SD card, can identify SD card and whether is connected to mobile device.
Here, described parameter comprises high level lasting time, low duration, testing time etc.The parameter that signal generator module 120 arranges module 110 setting according to user produces the level signal with the sequential corresponding to the parameter arranged, and described level signal is outputted to the test pin of connecting line or the test pin of card, thus control linkage line or the connection between card and mobile device.Wherein, if the level signal that signal generator module 120 produces is high level, then described connecting line or card can be connected to mobile device, if the level signal that signal generator module 120 produces is low level, then described connecting line or card can not be connected to mobile device.Here, described connecting line comprises at least one in connecting line described below, such as various types of USB line, HDMI/TVOUT line, earphone cord etc., and blocks at least one comprised in SIM card, SD card etc.
According to another exemplary embodiment of the present invention, master test board also comprises analog switch 130 according to an exemplary embodiment of the present invention.Analog switch 130 is for being connected with the corresponding interface of mobile device connecting line or card.A link of analog switch 130 is connected to connecting line or card, and another link of analog switch 130 is connected to the corresponding interface of mobile device.The signal output port of signal generator module 120 is connected to the control end of analog switch 130, thus the break-make of control simulation switch 130 can be carried out according to the output signal of signal generator module 120, realize connecting line or the connection between card and the corresponding interface of mobile device or disconnection.Such as, analog switch 130 can be a relay or metal-oxide-semiconductor.
When carrying out plug test to connecting line (or card), the signal output port of signal generator module 120 is connected to the control end of analog switch 130, the parameter output arranging module installation according to user has the level signal of the sequential corresponding to the parameter arranged with the break-make of control simulation switch, thus passes through this analog switch control linkage line or the connection between card and mobile device and disconnection thus realize plugging to test.Wherein, if analog switch is connected, then described connecting line or card can be connected to mobile device, if analog switch disconnects, then described connecting line or card can not be connected to mobile device.Such realization on connecting line with or card plug on the test of the impact of the various functions of mobile device.Here, SD card, earphone etc. are needed to physical construction to realize the equipment inserting and extract, link in the mobile device side of analog switch 130 can connect the interface identical with the interface of connecting line or card, with the connection of the corresponding interface of this link and mobile device of realizing analog switch 130, thus by carrying out the break-make of control simulation switch 130 according to illustrated master test board to reach the object of inserting and extracting.Such as, in order to test the plug of SD card, need to connect an interface identical with the interface (that is, the golden finger of SD card) of SD card at the link of the mobile device side of analog switch 130, the SD card draw-in groove of this interface insertion mobile device to be realized the connection of analog switch 130 and mobile device.
Should be appreciated that, the test of at least two test events in the plug test of the switching on and shutting down test of mobile device, sleep awakening test and connecting line or card can be carried out simultaneously.Now, can there is multiple output channel in the signal output port of signal generator module 120, to export the level corresponding from the test parameter of different test event.In addition, when to test the plug of at least one connecting line and/or at least one card simultaneously, multiple analog switch 130 can be there is, or analog switch 130 is multi-way switch.
Fig. 3 shows the method for testing process flow diagram of master test board according to an exemplary embodiment of the present invention.In step S310, the user comprised by master test board arranges module reception to the setting of test event and corresponding test parameter.Wherein, user arranges by user the test event that module installation tests mobile device, and arranges the parameter corresponding to test event.
In step S320, export corresponding level signal by the signal generator module in master test board according to the test parameter that user arranges the test event of module installation corresponding.
Wherein, when carrying out switching on and shutting down test to mobile device, the signal output port of signal generator module is connected on the power key interface of mobile device.Wherein, the parameter of carrying out switching on and shutting down test to mobile device comprises testing time, start used time, start duration, shutdown duration.The parameter that signal generator module arranges module installation according to user produces the level signal with the sequential corresponding to the parameter arranged, and described level signal is outputted on the power key interface of mobile device.
Wherein, when carrying out sleep-awake test to mobile device, the signal output port of signal generator module is connected on the interface of sleep-awake key of mobile device.The parameter of carrying out sleep-awake test comprises testing time, wakes used time, the duration of waking up, sleep time up.The parameter that signal generator module arranges module installation according to user produces the level signal with the sequential corresponding to the parameter arranged, and described level signal is outputted on the sleep awakening keyed jointing mouth of mobile device.
Wherein, when the plug for connecting line or card carries out plug test to the impact of the various functions of mobile device, the signal output port of signal generator module is connected to the connecting line of mobile device or the test pin of card.The parameter of plug test comprises high level lasting time, low duration, testing time.The parameter that signal generator module arranges module installation according to user produces the level signal with the sequential corresponding to the parameter arranged, and described level signal is outputted to the connecting line of mobile device or the test pin of card.Wherein, described connecting line comprises at least one in USB line, HDMI/TVOUT line, earphone cord, and described card comprises at least one in SIM card, SD card.
In addition, when the plug for connecting line or card carries out plug test to the impact of the various functions of mobile device, at mobile device and connecting line or connecting analog switch between blocking, and the signal output port of signal generator module is connected to the control end of analog switch, thus export the level signal of the corresponding sequential of parameter had and arrange with the break-make of control simulation switch according to the parameter that user arranges module installation, thus realize plugging test by this analog switch control linkage line or the connection between card and mobile device and disconnection.Wherein, if analog switch is connected, then described connecting line or card can be connected to mobile device, if analog switch disconnects, then described connecting line or card can not be connected to mobile device.
The method of testing of master test board can be implemented as software according to an exemplary embodiment of the present invention, this software-controllable user arranges module and receives the selection of test event and test parameter thereof, and can control signal generator module and produce corresponding level signal according to test parameter.In addition, the method of testing of master test board directly can be performed by user according to an exemplary embodiment of the present invention, such as, user arrange module use multiple knob or button to realize time, module can be arranged by user operation user to select test event and to input corresponding test parameter, now, signal generator module in response to the test parameter corresponding to test event, can produce corresponding level signal.
Exemplary embodiment of the present invention can realize the test of the properties to mobile device automatically, highly versatile, and cost is low, can reduce the manpower and materials that test needs to drop into, and increase the stability of product.According to master test board of the present invention and method of testing thereof, the test of multiple project can be carried out simultaneously.In addition, the support of the exploitation to mobile device can be increased according to master test board of the present invention and method of testing thereof, be convenient to the reproduction of the various problems run in developing.Such as, when there occurs such as switching on and shutting down, sleep-awake, the plug of various line/card in testing during generation systems problem, exploitation and manual method are difficult to reappear, and can utilize and carry out again according to master test board of the present invention and method of testing thereof.

Claims (8)

1. a master test board, comprising:
User arranges module, arranges test event and corresponding test parameter;
Signal generator module, arranges the corresponding test parameter of the test event of module installation according to user, exports corresponding level signal to test the performance of mobile device,
Wherein, when the plug for connecting line or card carries out plug test to the impact of mobile device, the signal output port of signal generator module is connected to the connecting line of mobile device or the test pin of card,
Wherein, the test parameter of plug test comprises high level lasting time, low duration, testing time,
Wherein, the test parameter that signal generator module arranges module installation according to user produces the level signal with the sequential corresponding to the test parameter arranged, and via signal output port, described level signal is outputted to the test pin of connecting line or card.
2. master test board as claimed in claim 1, is characterized in that, user arranges module from user's reception to the setting of the test event that mobile device is tested and the test parameter corresponding to test event.
3. master test board as claimed in claim 1, is characterized in that, when carrying out switching on and shutting down test to mobile device, the signal output port of signal generator module is connected to the power key interface of mobile device,
Wherein, test parameter mobile device being carried out to switching on and shutting down test comprises testing time, start used time, start duration, shutdown duration,
Wherein, the test parameter that signal generator module arranges module installation according to user produces the level signal with the sequential corresponding to the test parameter arranged, and via signal output port, described level signal is outputted to the power key interface of mobile device.
4. master test board as claimed in claim 1, is characterized in that, when carrying out sleep-awake test to mobile device, the signal output port of signal generator module is connected to the interface of the sleep-awake key of mobile device,
Wherein, the test parameter carrying out sleep-awake test comprises testing time, wakes used time, the duration of waking up, sleep time up,
Wherein, the test parameter that signal generator module arranges module installation according to user produces the level signal with the sequential corresponding to the test parameter arranged, and via signal output port, described level signal is outputted to the sleep awakening keyed jointing mouth of mobile device.
5. master test board as claimed in claim 1, it is characterized in that, described connecting line comprises at least one in USB line, HDMI/TVOUT line, earphone cord, and described card comprises at least one in SIM card, SD card.
6. master test board as claimed in claim 1, it is characterized in that, described master test board also comprises analog switch, and between described analog switch is connected to mobile device and connecting line or blocks, the signal output port of signal generator module is connected to the control end of analog switch.
7. master test board as claimed in claim 6, it is characterized in that, when the plug for connecting line or card carries out plug test to the impact of mobile device, the test parameter output that described signal generator module arranges module installation according to user has the level signal of the sequential corresponding to the test parameter arranged with the break-make of control simulation switch, thus realize plug test
Wherein, the test parameter of plug test comprises high level lasting time, low duration, testing time.
8., for a method of testing for master test board according to claim 1, described method of testing comprises:
By the user be included in master test board, module reception is set to the selection of test event and corresponding test parameter;
Corresponding level signal is exported to test the performance of mobile device according to the test parameter corresponding to the test event selected by the signal generator module be included in master test board,
Wherein, when the plug for connecting line or card carries out plug test to the impact of the various functions of mobile device, the signal output port of signal generator module is connected to the connecting line of mobile device or the test pin of card,
Wherein, the test parameter of plug test comprises high level lasting time, low duration, testing time,
Wherein, the test parameter arranging module installation according to user by signal generator module produces the level signal with the sequential corresponding to the test parameter arranged, and described level signal is outputted to the test pin of connecting line or card.
CN201210296010.5A 2012-08-20 2012-08-20 Master test board and testing method thereof Expired - Fee Related CN102854417B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201210296010.5A CN102854417B (en) 2012-08-20 2012-08-20 Master test board and testing method thereof

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201210296010.5A CN102854417B (en) 2012-08-20 2012-08-20 Master test board and testing method thereof

Publications (2)

Publication Number Publication Date
CN102854417A CN102854417A (en) 2013-01-02
CN102854417B true CN102854417B (en) 2014-12-17

Family

ID=47401168

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201210296010.5A Expired - Fee Related CN102854417B (en) 2012-08-20 2012-08-20 Master test board and testing method thereof

Country Status (1)

Country Link
CN (1) CN102854417B (en)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104515951A (en) * 2014-11-27 2015-04-15 北京航天测控技术有限公司 Board-level embedded test controller and board-level embedded test method
WO2016183827A1 (en) * 2015-05-20 2016-11-24 韩性峰 Intelligent electronic development and test system
CN105530587A (en) * 2016-01-26 2016-04-27 上海斐讯数据通信技术有限公司 Test system and method for earphone insertion detection of mobile terminal
CN112305957A (en) * 2020-09-25 2021-02-02 惠州市德赛西威汽车电子股份有限公司 Multichannel signal control and monitoring facilities
CN115167255A (en) * 2022-09-05 2022-10-11 深圳市晶存科技有限公司 Automatic dormancy awakening system, method, device and equipment

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6418391B1 (en) * 1997-10-10 2002-07-09 Advantest Corporation Testing system for performing an operation of an application which controls testing equipment for testing a device under test and method for controlling the same
JP2002335320A (en) * 2001-05-10 2002-11-22 Masayoshi Hiruma System for automating test of mobile telephones
CN1983810A (en) * 2006-04-03 2007-06-20 华为技术有限公司 Method and device for repeated switching cell-phone
CN101382570A (en) * 2007-09-04 2009-03-11 青岛海信电器股份有限公司 Auto powering on/off apparatus and method
CN101865975A (en) * 2009-04-16 2010-10-20 鸿富锦精密工业(深圳)有限公司 Main board testing system and method
CN102387234A (en) * 2011-12-09 2012-03-21 深圳市卓讯达科技发展有限公司 Mobile phone automatic test device and method

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6418391B1 (en) * 1997-10-10 2002-07-09 Advantest Corporation Testing system for performing an operation of an application which controls testing equipment for testing a device under test and method for controlling the same
JP2002335320A (en) * 2001-05-10 2002-11-22 Masayoshi Hiruma System for automating test of mobile telephones
CN1983810A (en) * 2006-04-03 2007-06-20 华为技术有限公司 Method and device for repeated switching cell-phone
CN101382570A (en) * 2007-09-04 2009-03-11 青岛海信电器股份有限公司 Auto powering on/off apparatus and method
CN101865975A (en) * 2009-04-16 2010-10-20 鸿富锦精密工业(深圳)有限公司 Main board testing system and method
CN102387234A (en) * 2011-12-09 2012-03-21 深圳市卓讯达科技发展有限公司 Mobile phone automatic test device and method

Also Published As

Publication number Publication date
CN102854417A (en) 2013-01-02

Similar Documents

Publication Publication Date Title
US7987389B2 (en) System and method for testing sleep and wake functions of computer
CN102854417B (en) Master test board and testing method thereof
CN111239617B (en) Control method and device for charge and discharge test, storage medium and system
CN102520272B (en) Test system of power down protection function of smart card and method
CN102143266A (en) Method for extending universal serial bus (USB) interface of mobile terminal into serial communication interface
US20120110235A1 (en) Wire control device and electronic device using the same
US20130046502A1 (en) Motherboard test device
CN105487955A (en) Test jig and test method for universal serial bus type C port
CN104063348A (en) Device and method for realizing compatible USB (Universal Serial Bus) communication and audio communication
CN111984479A (en) Method and system for carrying out startup and shutdown and restart tests on Android mainboard based on single chip microcomputer
CN203465715U (en) Automatic startup and shutdown test system
CN103576816A (en) Startup and shutdown control circuit
CN102253690B (en) Computer integration device, system and method
CN107608923B (en) Test processing method and related product
CN203552220U (en) Touch device of multiplex touch display screen
CN203350408U (en) Digital circuit logic chip test instrument
CN112948186A (en) Detection device and detection method of interface signal
CN111124957B (en) USB channel switching device
CN102999382A (en) Electronic device and switching method thereof
CN102833513B (en) High definition player
CN204360371U (en) A kind of USBKey
CN101964038A (en) Computer device for preventing camera shooting function from being embezzled and camera power supply control method
CN100547576C (en) Quick card and noise isolation method thereof and the method that combines with non-host device function
CN105372468A (en) System and method for adjusting data decoding function in oscilloscope
CN104427438A (en) Audio play system, earphone used by the same, and automatic control method

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C14 Grant of patent or utility model
GR01 Patent grant
CF01 Termination of patent right due to non-payment of annual fee
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20141217

Termination date: 20210820