CN105510811A - Switch matrix test system based on bus transfer - Google Patents
Switch matrix test system based on bus transfer Download PDFInfo
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- CN105510811A CN105510811A CN201410552721.3A CN201410552721A CN105510811A CN 105510811 A CN105510811 A CN 105510811A CN 201410552721 A CN201410552721 A CN 201410552721A CN 105510811 A CN105510811 A CN 105510811A
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- switch matrix
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- control panel
- bus transfer
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Abstract
The invention discloses a switch matrix test system based on bus transfer. The switch matrix test system comprises a switch matrix and an automatic test device connected with the switch matrix through a measurement channel and an excitation channel. The automatic test device comprises a computer and a control panel connected with the computer. The control panel is in data connection with a data bus. The data bus is in signal connection with a unit under test. The switch matrix is further in control connection with the unit under test. Further included is a programmable power supply being in control connection with the automatic test device. The programmable power supply supplies power for the switch matrix. The invention can be mounted with a plurality of test modules, supports hot plug, has high universality and scalability, does not require the manufacture of a dedicated channel plate for each circuit board under test as compared with a traditional fixed test needle bed, thereby reducing the size and cost, and provides a new implementing means for a low-cost, portable, universal and multi-channel test solution.
Description
Technical field
The present invention relates to electronic circuit field, particularly, relate to a kind of switch matrix test macro based on bus transfer.
Background technology
ATE (automatic test equipment) is more and more extensive in application that is military and industrial circle, but in circuit unit especially circuit board testing, because unit under test kind is many, tested number of channels is large, and traditional switch matrix volume is large, switch speed is slow, electric property is poor.Modern testing equipment high speed, portable requirement can not be met.
Switch matrix mainly realizes the message exchange between ATE (automatic test equipment) and circuit-under-test unit, and function is as follows: the power supply that programmable power supply system exports adds on the pin that circuit-under-test unit requires by (1) automatically; (2) on pin signal converting to the circuit-under-test unit that ATE (automatic test equipment) signal source subsystem exports required; (3) signal converting exported by circuit-under-test unit is on the suitable Measurement channel of ATE (automatic test equipment); (4) for circuit-under-test unit provides necessary outward element, as load, adjustment knob, large volume device etc.Different its connector of circuit-under-test unit definition is different, and each contact pin may be defined as one of power supply, input signal, output signal, outward element terminal.And the circuit unit port number of modern electronic equipment is a lot, the switch matrix design of a large amount of signalling channels to ATE proposes stern challenge.
Summary of the invention
The technological deficiency of the autorun of a large amount of signalling channel can not be met to overcome prior art, the invention discloses a kind of switch matrix test macro based on bus transfer.
Switch matrix test macro based on bus transfer of the present invention, comprise switch matrix and with switch matrix by Measurement channel and encourage channel attached ATE (automatic test equipment), the control panel that described ATE (automatic test equipment) comprises computing machine and is connected with computing machine, described control panel and data bus data cube computation, described data bus is connected with unit under test signal, described switch matrix also with unit under test control linkage, also comprise the programmable power supply with ATE (automatic test equipment) control linkage, described programmable power supply is that switch matrix is powered.
Preferably, described Measurement channel and excitation passage are parallel independently hardware data line passage.
Preferably, described computing machine and control panel carry out exchanges data by USB interface.
Preferably, described data bus is I2C bus.
Preferably, described control panel is composed in series by I2C interface chip, bus device, CPLD and multiplexing devices.
Switch matrix test macro based on bus transfer of the present invention, effectively reduce system bulk, the switch matrix developed can mount multiple test module, and support hot plug, there is very strong Universal and scalability, compared with traditional fixed test needle-bar, without the need to making special channel plate for each circuit-under-test plate, reduce volume, reduce cost, for low cost, portability, universalization, multiple channel test scheme provide a kind of new realization rate.
Accompanying drawing explanation
Fig. 1 is a kind of embodiment schematic diagram of the present invention.
Embodiment
Below in conjunction with embodiment and accompanying drawing, to the detailed description further of the present invention's do, but embodiments of the present invention are not limited thereto.
Switch matrix test macro based on bus transfer of the present invention, comprise switch matrix and with switch matrix by Measurement channel and encourage channel attached ATE (automatic test equipment), the control panel that described ATE (automatic test equipment) comprises computing machine and is connected with computing machine, described control panel and data bus data cube computation, described data bus is connected with unit under test signal, described switch matrix also with unit under test control linkage, also comprise the programmable power supply with ATE (automatic test equipment) control linkage, described programmable power supply is that switch matrix is powered.
System chart as shown in Figure 1.Switch matrix takes needle-bar connected mode, can effectively connect multiple connector.By monolithic processor controlled multiplexer, signal can be added to required tested passage, system architecture diagram as shown in Figure l.System adopts the structure of upper and lower machine, and host computer is made up of computing machine and control software design, and slave computer is made up of usb bus interface and control panel, and USB module sends control data on control panel each test module by I2C bus.On control panel, each test module receives the serial code stream that bus is sent, and extracts address value after decoding, and respective channel chosen by the multiplexer in control module.I2C is a kind of Peripheral Interface of universal serial bus, it adopts method of synchronization serial received or the information of transmission, master-slave equipment works under same clock, I2C forms bi-directional serial bus by data line SDA and clock line SCL, because I2C only has a data lines, therefore information transmission and receive can only timesharing carry out.Each modular assembly is all connected in parallel in bus, and each module has unique address.Therefore system can increase or reduce Board Under Test quantity in allowed band, and in I2C bus, each node module supports hot plug, so take the program can effectively reduce test macro volume, uses easy to operate, can connect multiple unit under test simultaneously.
In native system, on control panel, each test module all carries out communication by I2C bus and Test Host, and each module's address is uniquely determined by I2C chip address on plate, and first main frame determines that plate choosing is carried out in each board address, after setting up communication with corresponding board, send serial control data SDA.At synchronization, I2C bus can only there is a module be in active state, utilize " maintenance " characteristic of multiplexer state, can to realize on test module and the switching of probe between test module.
As mentioned above, the present invention can be realized preferably.
Claims (5)
1. based on the switch matrix test macro of bus transfer, it is characterized in that, comprise switch matrix and with switch matrix by Measurement channel and encourage channel attached ATE (automatic test equipment), the control panel that described ATE (automatic test equipment) comprises computing machine and is connected with computing machine, described control panel and data bus data cube computation, described data bus is connected with unit under test signal, described switch matrix also with unit under test control linkage, also comprise the programmable power supply with ATE (automatic test equipment) control linkage, described programmable power supply is that switch matrix is powered.
2. the switch matrix test macro based on bus transfer according to claim 1, is characterized in that, described Measurement channel and excitation passage are parallel independently hardware data line passage.
3. the switch matrix test macro based on bus transfer according to claim 1, is characterized in that, described computing machine and control panel carry out exchanges data by USB interface.
4. the switch matrix test macro based on bus transfer according to claim 1, is characterized in that, described data bus is I2C bus.
5. the switch matrix test macro based on bus transfer according to claim 4, it is characterized in that, described control panel is composed in series by I2C interface chip, bus device, CPLD and multiplexing devices.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410552721.3A CN105510811A (en) | 2014-10-19 | 2014-10-19 | Switch matrix test system based on bus transfer |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410552721.3A CN105510811A (en) | 2014-10-19 | 2014-10-19 | Switch matrix test system based on bus transfer |
Publications (1)
| Publication Number | Publication Date |
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| CN105510811A true CN105510811A (en) | 2016-04-20 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN201410552721.3A Pending CN105510811A (en) | 2014-10-19 | 2014-10-19 | Switch matrix test system based on bus transfer |
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Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106128344A (en) * | 2016-08-17 | 2016-11-16 | 深圳晶华显示器材有限公司 | A kind of generic disk being applied to LCD product test |
| CN106301305A (en) * | 2016-08-17 | 2017-01-04 | 中国电子科技集团公司第四十研究所 | A kind of switching matrix drive circuit and method |
| CN106354045A (en) * | 2016-11-15 | 2017-01-25 | 中国电子科技集团公司第四十研究所 | Microwave electromechanical switch control system and automatic test system for microwave switch |
| CN108983082A (en) * | 2018-08-03 | 2018-12-11 | 德丰电创科技股份有限公司 | Matrix switch de-vice and system |
| CN111624429A (en) * | 2020-06-16 | 2020-09-04 | 苏州君和辰科技有限公司 | Universal electronic component testing device |
| CN111796138A (en) * | 2019-04-08 | 2020-10-20 | 宁德时代新能源科技股份有限公司 | Detection circuit and detection method |
| CN115982086A (en) * | 2023-02-14 | 2023-04-18 | 井芯微电子技术(天津)有限公司 | Chip prototype verification board |
| CN117849597A (en) * | 2024-03-08 | 2024-04-09 | 荣耀终端有限公司 | Circuit board testing device |
-
2014
- 2014-10-19 CN CN201410552721.3A patent/CN105510811A/en active Pending
Cited By (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106128344A (en) * | 2016-08-17 | 2016-11-16 | 深圳晶华显示器材有限公司 | A kind of generic disk being applied to LCD product test |
| CN106301305A (en) * | 2016-08-17 | 2017-01-04 | 中国电子科技集团公司第四十研究所 | A kind of switching matrix drive circuit and method |
| CN106301305B (en) * | 2016-08-17 | 2019-01-04 | 中国电子科技集团公司第四十一研究所 | A kind of switching matrix drive circuit and method |
| CN106354045A (en) * | 2016-11-15 | 2017-01-25 | 中国电子科技集团公司第四十研究所 | Microwave electromechanical switch control system and automatic test system for microwave switch |
| CN106354045B (en) * | 2016-11-15 | 2018-09-25 | 中国电子科技集团公司第四十一研究所 | Microwave electric mechanical switch control system and microwave switch Auto-Test System |
| CN108983082A (en) * | 2018-08-03 | 2018-12-11 | 德丰电创科技股份有限公司 | Matrix switch de-vice and system |
| CN111796138A (en) * | 2019-04-08 | 2020-10-20 | 宁德时代新能源科技股份有限公司 | Detection circuit and detection method |
| CN111796138B (en) * | 2019-04-08 | 2021-10-08 | 宁德时代新能源科技股份有限公司 | Detection circuit and detection method |
| CN111624429A (en) * | 2020-06-16 | 2020-09-04 | 苏州君和辰科技有限公司 | Universal electronic component testing device |
| CN115982086A (en) * | 2023-02-14 | 2023-04-18 | 井芯微电子技术(天津)有限公司 | Chip prototype verification board |
| CN117849597A (en) * | 2024-03-08 | 2024-04-09 | 荣耀终端有限公司 | Circuit board testing device |
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Application publication date: 20160420 |
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| WD01 | Invention patent application deemed withdrawn after publication |