CN204593001U - A kind of LED lamp bar and LED lamp bar test macro - Google Patents

A kind of LED lamp bar and LED lamp bar test macro Download PDF

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CN204593001U
CN204593001U CN201520207660.7U CN201520207660U CN204593001U CN 204593001 U CN204593001 U CN 204593001U CN 201520207660 U CN201520207660 U CN 201520207660U CN 204593001 U CN204593001 U CN 204593001U
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led
lamp bar
led lamp
circuit
defective products
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孙平如
金中华
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Wuhu Jufei Photoelectric Technology Co ltd
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Shenzhen Jufei Optoelectronics Co Ltd
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Abstract

The utility model discloses a kind of LED lamp bar and LED lamp bar test macro.LED lamp bar of the present utility model comprises: lamp bar pedestal and LED circuit; Described LED circuit is arranged on described lamp bar pedestal, and described LED circuit is connected to form by multiple LED; The both sides of each described LED are respectively equipped with for testing the electrical test point of described LED; Apply LED lamp bar of the present utility model to carry out testing and can solve because current LED lamp bar method of testing can not test out the technical problem electrically causing accurately filtering out defective products LED lamp bar of single led lamp.

Description

A kind of LED lamp bar and LED lamp bar test macro
Technical field
The utility model relates to LED (Light-Emitting Diode) technical field, particularly relates to a kind of LED lamp bar and LED lamp bar test macro.
Background technology
Current backlight LED light bars is made up of PCB and LED lamp circuit; The designed lines major part of general LED lamp bar is the series connection of plurality of LEDs lamp or plurality of LEDs lamp series connection parallel connection (as straight-down negative lamp bar, day-light lamp bar) again.
LED lamp bar method of testing conventional is at present electrically simply testing whole lamp bar, particularly, two are arranged for testing the electrical test point of whole LED lamp bar (namely arranging respectively at the two ends of the LED lamp circuit of lamp bar for testing the test point of whole LED lamp circuit) in LED lamp bar, there is provided the small area analysis (0.01MA-0.1MA) of setting then to described LED lamp bar, the electrical of whole LED lamp circuit is detected afterwards by test point, such as, if the magnitude of voltage of LED lamp circuit is not in preset range, then think that this LED lamp bar is defective products, do not meet quality requirement.
But the method for testing of current LED lamp bar can only electrically simply testing whole lamp bar, and can not electrically testing single led lamp, accurately determine the electrical of single led lamp.If when in LED lamp bar, certain LED is compromised (PN junction of LED has damage or electric leakage), this LED lamp bar meets the requirement of quality for non-defective unit to utilize current method of testing likely can judge, defective products will be used as non-defective unit like this and be supplied to client, and can cause shorten the service life of whole LED lamp bar.
Such as, as shown in Figure 1, LED lamp bar 1 comprises the LED strip connection circuit be composed in series by 8 LED 2 and the test point TP1 being positioned at LED strip connection circuit two ends and TP2; Adopt current method of testing, when measuring current is 1 μ A, it is non-defective unit that the forward voltage VF setting single LED lamp 2 is greater than when 1.9V is less than 2.5V, i.e. 1.9V<VF (forward voltage) <2.5V, so LED lamp bar 1 is the voltage range of non-defective unit is 15.2-20V.If wherein there is the bad VF of a LED lamp 2 to be 0.80V, other 7 forward voltage be 2.1V, the total voltage of the lamp bar so adopting current method of testing to test out and VF be total=2.1*7+0.8=15.5V.Can find out that the total voltage of this lamp bar is in scope 15.2-20V from test result, will assert that this LED lamp bar is non-defective unit, therefore defective products can be judged to be that non-defective unit shipment is to client.
Again such as: as shown in Figure 2, LED lamp bar 1 comprises: a LED parallel circuit and the test point TP1 and the TP2 that are positioned at LED parallel circuit two ends, and the series circuit parallel connection that wherein LED parallel circuit is connected by two 4 LED lamp 2 is formed; Adopt current method of testing, when measuring current is 2 μ A, the forward voltage range that to set by single LEDs be non-defective unit is within the scope of 1.9V-2.5V be non-defective unit, and so whole LED lamp bar 1 is the order voltage range of non-defective unit is 7.6-10V.If wherein there is LEDs 2 lamp bad, this LED forward voltage VF is 0.80V, the forward voltage of other 7 LED lamp is 2.3V, if the series circuit VF=2.3*3+0.8=7.7V of bad LED so can be detected according to current method of testing, the total voltage of this LED strip connection circuit meets scope 7.6-10V, now will assert that this LED lamp bar is non-defective unit, therefore defective products can be judged to be that non-defective unit shipment is to client.
As can be seen here, due to current method of testing can not test out single led lamp electrically cause can not accurately filter out defective products LED lamp bar.
Utility model content
The main technical problems to be solved in the utility model is, a kind of LED lamp bar and LED lamp bar test macro are provided, can solve because current LED lamp bar method of testing can not test out the technical problem electrically causing accurately filtering out defective products LED lamp bar of single led lamp.
For solving the problems of the technologies described above, the utility model provides a kind of LED lamp bar, comprising: lamp bar pedestal and LED circuit; Described LED circuit is arranged on described lamp bar pedestal, and described LED circuit is connected to form by multiple LED; The both sides of each described LED are respectively equipped with for testing the electrical test point of described LED.
Further, described LED circuit is LED strip connection circuit; Described LED strip connection circuit is composed in series by multiple LED.
Further, described LED circuit is LED parallel circuit, and described LED parallel circuit joins circuit in parallel by multiple LED strip and forms, and described LED strip connection circuit is composed in series by multiple LED.
Further, described LED is side-emitting LED lamp or positive luminescence LED lamp.
Further, described LED lamp bar is backlight LED light bars.
Further, described lamp bar pedestal is pcb board.
Also for ease of and solve the problems of the technologies described above, the utility model additionally provides a kind of LED lamp bar test macro, comprising: lamp bar checkout equipment, multiple probe and the LED lamp bar as above described in any one; Described lamp bar checkout equipment be provided with multiple for output current to the current output terminal of described LED lamp bar; The number of described current output terminal is equal with the number of test point in described LED lamp bar, and the number of described probe is equal with the number of described current output terminal; A described current output terminal connects a described probe;
During test LED lamp bar, described probe connects with corresponding test point, described lamp bar checkout equipment obtains the magnitude of voltage of LED in described LED lamp bar to the mode of described LED lamp bar by the current output terminal output current that control is corresponding, and judges whether LED is defective products according to the magnitude of voltage of LED.
Further, described LED lamp bar test macro, also comprises: display device;
Described display device obtains magnitude of voltage and the defective products judged result of described LED from described lamp bar checkout equipment, then shows the magnitude of voltage of described LED, and according to defective products judged result mark non-defective unit and bad LED.
The beneficial effects of the utility model are:
The utility model provides a kind of LED lamp bar and LED lamp bar test macro, and LED lamp bar of the present utility model comprises: lamp bar pedestal and LED circuit; Described LED circuit is arranged on described lamp bar pedestal, and described LED circuit is connected to form by multiple LED; The both sides of each described LED are respectively equipped with for testing the electrical test point of described LED; The set-up mode of the LED lamp bar test point that the utility model provides, tester can be made to test out the electrical of single led lamp in LED lamp bar, by determining whether single led lamp is that defective products determines whether whole LED lamp bar is defective products, thus can accurately determine defective products LED lamp bar, very bad LED lamp bar is screened.
Accompanying drawing explanation
Fig. 1 is the structural representation of existing a kind of LED lamp bar;
Fig. 2 is the structural representation of existing another kind of LED lamp bar;
The structural representation of a kind of LED lamp bar that Fig. 3 provides for the utility model embodiment one;
The structural representation of a kind of LED lamp bar that Fig. 4 provides for the utility model embodiment one;
The structural representation of a kind of LED lamp bar test macro that Fig. 5 provides for the utility model embodiment two;
The structural representation of the another kind of LED lamp bar test macro that Fig. 6 provides for the utility model embodiment two.
Detailed description of the invention
By reference to the accompanying drawings the utility model is described in further detail below by detailed description of the invention.
Embodiment one:
Consider that current LED lamp bar method of testing can not accurately filter out defective products LED lamp bar, present embodiments provide a kind of LED lamp bar, lamp bar pedestal and LED circuit; Described LED circuit is arranged on described lamp bar pedestal, and described LED circuit is connected to form by multiple LED; Described LED circuit two ends are respectively equipped with for testing electrical test point, are provided with for testing electrical test point in described LED circuit between adjacent two described LED.
The present embodiment LED lamp bar is equipped with for testing electrical test point between LED circuit two ends and two adjacent LEDs lamp, when testing LED lamp bar, the electrical of single led lamp in LED lamp bar can be tested out by the test point in LED lamp bar for tester, then determine whether single led lamp is defective products, thus whether be that defective products determines whether whole LED lamp bar is defective products by single led lamp, accurately filter out defective products LED lamp bar, for TV backlight or illumination backlight provide high-quality LED lamp bar; The present embodiment LED can also filter out defective products LED lamp bar while can filtering out defective products LED lamp bar for tester in addition.
In the present embodiment, LED circuit can be LED strip connection circuit; Described LED strip connection circuit is composed in series by multiple LED.
As shown in Figure 3, LED lamp bar 3 comprises: for the LED strip connection circuit testing nine electrical test points (TP1-TP9) and be composed in series by 8 LED 4, wherein TP1 and TP9 is positioned at the two ends of LED strip connection circuit, TP2 is between first LED and second LED, TP2 is between second LED and the 3rd LED, by that analogy, TP8 is between the 7th LED and the 8th LED, and namely each LED both sides are respectively equipped with test point.
When testing LED lamp bar 3, two of checkout equipment probes are pressed in the test point on LED 4 both sides, electric current is provided to LED 4, and test out the forward voltage of this LED 4, then judge that the forward magnitude of voltage of this LED 4 is whether in preset range, if so, then judge that this LED 4 is as defective products, thus judge that whole LED lamp bar 3 is as defective products; Successively probe is pressed in the test point of each LED 4 two by aforesaid mode, tests the forward voltage of each LED 4, judge whether LED 4 is defective products, thus judge LED lamp bar 3 whether as defective products.
In the present embodiment, LED circuit can be various ways, to be LED circuit the be LED strip connection circuit of above-mentioned introduction, preferentially, in the present embodiment, LED circuit can also be LED parallel circuit, described LED parallel circuit joins circuit in parallel by multiple LED strip and forms, and described LED strip connection circuit is composed in series by multiple LED.
As shown in Figure 4, LED lamp bar 5 comprises: for testing eight electrical test points (TP1-TP8) and LED parallel circuit, and wherein LED parallel circuit is made up of two LED strip connection circuit in parallel, and LED strip connection circuit is in series by 4 LED 6; In LED circuit, the both sides of each LED 6 are equipped with test point in the diagram, and particularly, first LED both sides is respectively equipped with test point TP1 and TP2 ... the like the both sides of the 8th LED be respectively equipped with test point TP7 and TP8.
When testing LED lamp bar 5, two of checkout equipment probes are pressed in the test point on LED 6 both sides, electric current is provided to LED 6, and test out the forward voltage of this LED 6, then judge that the forward magnitude of voltage of this LED 6 is whether in preset range, if so, then judge that this LED 6 is as defective products, thus judge that whole LED lamp bar 5 is as defective products; Successively probe is pressed in the test point of each LED 6 two by aforesaid mode, tests the forward voltage of each LED 6, judge whether LED 6 is defective products, thus judge LED lamp bar 5 whether as defective products.
LED circuit in the present embodiment in LED lamp bar is not limited only to simple LED strip connection circuit and LED parallel circuit, and it can also be LED series and parallel circuit, the LED series and parallel circuit be such as made up of a LED strip connection circuit and a LED parallel circuit.
Preferentially, in the present embodiment, LED can be side-emitting LED lamp or positive luminescence LED lamp.
Preferentially, in the present embodiment, lamp bar pedestal can be pcb board.
Preferentially, in the present embodiment, LED lamp bar can be backlight LED light bars, and in the present embodiment, backlight LED light bars can be applied to liquid crystal display, LCD TV etc.
Embodiment two:
Present embodiments provide a kind of LED lamp bar test macro, comprising: lamp bar checkout equipment, multiple probe and the LED lamp bar as described in embodiment one; Wherein, described lamp bar checkout equipment be provided with multiple for output current to the current output terminal of described LED lamp bar; The number of described current output terminal is equal with the number of test point in described LED lamp bar, and the number of described probe is equal with the number of described current output terminal; A described current output terminal connects a described probe;
When testing described LED lamp bar, all described probes are connected one to one with all test points in LED lamp bar; Described lamp bar checkout equipment obtains the magnitude of voltage of LED in described LED lamp bar to the mode of described LED lamp bar by the current output terminal output current that control is corresponding, and judges whether LED is defective products according to the magnitude of voltage of LED.
Lower mask body introduces the present embodiment LED lamp bar test macro, and as shown in Figure 5, LED lamp bar test macro, comprising: have the LED lamp bar 7 of n LED 8, lamp bar checkout equipment 12, a n+1 probe 10 and tool 9, and probe 10 is arranged on described tool 9; Lamp bar checkout equipment 12 is provided with n+1 for output circuit to the current output terminal of LED lamp bar 7, wherein LED lamp bar comprises by n LED 8 LED strip connection circuit in series, wherein n LED from left to right called after LED1, LED2 ... LEDn, each LED 8 both sides are respectively equipped with for testing the electrical test point of LED, and LED lamp bar 7 test point total quantity is n+1;
Before testing, assuming that LED 8 corresponding forward voltage when microampere order (being generally 0.01MA ~ 0.1MA) electric current drives is VF, then setting checkout equipment output voltage is VF*N.Set a forward voltage minimum VFMIN and maximum VFMAX to single LEDs simultaneously; To backlight lamp bar for electrical testing time every step time range be 1Ms ~ 50Ms;
When testing LED lamp bar, n+1 current output terminal being connected one to one with n+1 probe 8, connecting current output terminal and probe 8 especially by wire 11, then probe 8 being connected one to one with the test point in LED 8;
Lamp bar checkout equipment 12 exports by the electric current of control current output terminal the magnitude of voltage obtaining single led lamp 8 in the present embodiment, then judge that the magnitude of voltage of LED 8 is whether in preset range, then judge that LED 8 is as defective products if not, if so, then judge that LED 8 is as non-defective unit; Introduce lamp bar checkout equipment in the present embodiment below obtain the magnitude of voltage of single led lamp 8 and judge that whether LED 8 is two kinds of concrete modes of defective products:
Mode one:
A) TP1 is V+ (positive potential), TP2 is V-(negative potential), when output microampere order determines electric current, the forward voltage detected is VF1 and is stored as the forward voltage of LED1, judging that VF1 is whether within the scope of VFMIN ~ VFMAX, if "Yes", is then non-defective unit, if "no", then it is defective products.
B) TP1 is V+ (positive potential), TP2 no-output (unsettled), TP3 is V-(negative potential), and when output microampere order determines electric current, the forward voltage detected is VF2 and stores, store the forward magnitude of voltage that (VF2-VF1) value is LED2, judging that (VF2-VF1) is whether within the scope of VFMIN ~ VFMAX, if "Yes", is then non-defective unit, if "no", then it is defective products.
…………
C) the rest may be inferred, last TP1 is V+ (positive potential), the equal no-output of TP2, TP3, TP4, TP5, TP6, TP7, TP8, TPn (unsettled), TPn+1 is V-(negative potential), when output microampere order determines electric current, the forward voltage detected is VFn and stores, and store the forward voltage that (VFn-VFn-1) value is LEDn, judge that (VFn-VFn-1) is whether within the scope of VFMIN. ~ VFMAX, if "Yes", being then non-defective unit, if "no", is then defective products.
Mode two:
A) TP1 is V+ (positive potential), TP2 is V-(negative potential), when output microampere order determines electric current, the forward voltage detected is VF1 and is stored as the forward voltage of LED1, judging that VF1 is whether within the scope of VFMIN ~ VFMAX, if "Yes", is then non-defective unit, if "no", then it is defective products.
B) TP2 is V+ (positive potential), TP3 is V-(negative potential), when output microampere order determines electric current, the forward voltage detected is VF2 and stores, and is stored as the forward magnitude of voltage of LED2, judges that VF2 is whether within the scope of VFMIN ~ VFMAX, if "Yes", being then non-defective unit, if "no", is then defective products.
…………
C) the rest may be inferred, last TPn is V+ (positive potential), TPn+1 is V-(negative potential), the equal no-output of TP1, TP2, TP3, TP4, TP5, TP6, TP7, TP8, TPn-1 (unsettled), when output microampere order determines electric current, the forward voltage detected is the forward voltage that VFn is stored as LEDn, judging that VFn is whether within the scope of VFMIN ~ VFMAX, if "Yes", is then non-defective unit, if "no", then it is defective products.
For tester can be facilitated to locate defective products, preferentially, the LED lamp bar test macro that the present embodiment provides, also comprises: display device;
Described display device obtains magnitude of voltage and the defective products judged result of described LED from described lamp bar checkout equipment, then shows the magnitude of voltage of described LED, and according to defective products judged result mark non-defective unit and bad LED.Preferentially, in the present embodiment, display device can be desktop computer, notebook computer etc.
Such as adopt after aforesaid way one and two detects the magnitude of voltage of each LED 8 in LED lamp bar 7 at lamp bar checkout equipment 12, by transferring LED1, the LED2 in memory ... forward voltage and the defective products judged result of LEDn send to display device, in the upper display of display device (such as liquid crystal display) survey the forward magnitude of voltage of the LED on lamp bar, and show the position (OK: show green NG: show redness) of non-defective unit and bad LED, if there is defective products, (acousto-optic) display of reporting to the police.
Above-mentioned mainly to test to the lamp bar comprising LED strip connection circuit the system introducing the present embodiment, but the system of the present embodiment can also be tested the lamp bar comprising LED parallel circuit or other form circuit equally.
Preferentially, when lamp bar comprises: during LED parallel circuit, aforesaid way one or two can be adopted to detect that the magnitude of voltage of each LED is in order to judge whether each LED is defective products to LED strip connection circuit each in LED parallel circuit.
Below to test to the LED lamp bar in series by 8 LED the test macro introducing the present embodiment:
As described in Figure 6, the test macro of the present embodiment comprises: 9 probes 16, LED lamp bar 13 and lamp bar checkout equipment 18 on display device (comprising the main frame 21 and display 22 that are connected by connection 20), tool 15, and lamp bar checkout equipment is connected by connection 19 with host computer 21; Wherein, LED lamp bar 3 comprises the LED strip connection circuit be made up of 8 LED 14; Lamp bar checkout equipment 18 has 9 current output terminal (not shown)s; During test, current output terminal is connected by wire 17 one to one with probe 16, and 9 probes 16 is pressed in the TP1 on LED13 lamp bar respectively, TP2, TP3, TP4, TP5, TP6, TP7, TP8, TP9 test point;
Before test, setting lamp bar checkout equipment 18 output voltage is 2.5V*8=20V, determines electric current and exports 0.01MA; Power in test process LED lamp bar 13 and export 0.01MA electric current, forward voltage minimum VFMIN and maximum VFMAX is set to every LED lamp 14, to LED lamp bar 13 for electrical testing time every step time be 10Ms ~ 50Ms, the LED of voltage tester value not within the scope of this be detected is defective products; After being connected with test point by probe, the present embodiment can adopt following two kinds of methods whether to test LED for defective products:
The test process of employing mode one is as follows:
TP1 is V+ (positive potential), TP2 is V-(negative potential), when output 0.01MA determines electric current, the forward voltage detected be VF1 and the forward voltage being stored as LED1 (according to order from left to right by 8 LED called afters LED1, LED2 ... LED2), judging that VF1 is whether within the scope of VFMIN ~ VFMAX, if "Yes", is then non-defective unit, if "no", then it is defective products.
TP1 is V+ (positive potential), TP2 no-output (unsettled), TP3 is V-(negative potential), and when output 0.01MA determines electric current, the forward voltage detected is VF2 and stores, store the forward magnitude of voltage that (VF2-VF1) value is LED2, judging that (VF2-VF1) is whether within the scope of VFMIN ~ VFMAX, if "Yes", is then non-defective unit, if "no", then it is defective products.
…………
The rest may be inferred, last TP1 is V+ (positive potential), the equal no-output of TP2, TP3, TP4, TP5, TP6, TP7, TP8 (unsettled), TP9 is V-(negative potential), when output 0.01MA determines electric current, the forward voltage detected is VF8 and stores, and store the forward voltage that (VF8-VF7) value is LED8, judge that (VF8-VF7) is whether within the scope of VFMIN ~ VFMAX, if "Yes", being then non-defective unit, if "no", is then defective products.
The test process of employing mode two is as follows:
TP1 is V+ (positive potential), TP2 is V-(negative potential), when output 0.01MA determines electric current, the forward voltage detected is VF1 and is stored as the forward voltage of LED1, judging that VF1 is whether within the scope of VFMIN ~ VFMAX, if "Yes", is then non-defective unit, if "no", then it is defective products.
TP1 no-output (unsettled), TP2 is V+ (positive potential), TP3 is V-(negative potential), and when output 0.01MA determines electric current, the forward voltage detected is VF2, be stored as the forward magnitude of voltage of LED2, judging that VF2 is whether within the scope of VFMIN ~ VFMAX, if "Yes", is then non-defective unit, if "no", then it is defective products.
…………
The rest may be inferred, the equal no-output of last TP1, TP2, TP3, TP4, TP5, TP6, TP7 (unsettled), TP8 be V+ (positive potential, TP9 is V-(negative potential), when output 0.01MA determines electric current, the forward voltage detected is VF8, is stored as the forward voltage of LED8, judges that VF8 is whether within the scope of VFMIN ~ VFMAX, if "Yes", being then non-defective unit, if "no", is then defective products.
After obtaining each LED 14 and whether being defective products, lamp bar checkout equipment 18 is by transferring the LED1 in memory, LED2, the forward voltage of LED8, liquid crystal display 22 shows the forward magnitude of voltage of the LED 14 in surveyed LED lamp bar 13, and show the position (OK: show green NG: show redness) of non-defective unit and bad LED 14, and if there is defective products, (acousto-optic) display of reporting to the police.
Finally, bad LED 14 position indicates by tester, indicates and isolation, prevent defective products from flowing out as defective products.
The LED lamp bar test macro that the present embodiment provides, can test out whether each LED in lamp bar is defective products, thus whether be that defective products judges whether LED lamp bar is defective products by LED, accurately can determine whether LED lamp bar to be measured is defective products, prevent defective products LED lamp bar to be used as defective products LED lamp bar to client, guarantee to provide high-quality backlight lamp bar to TV backlight or illumination backlight etc.
Above content is in conjunction with concrete embodiment further detailed description of the utility model, can not assert that concrete enforcement of the present utility model is confined to these explanations.For the utility model person of an ordinary skill in the technical field, without departing from the concept of the premise utility, some simple deduction or replace can also be made, all should be considered as belonging to protection domain of the present utility model.

Claims (8)

1. a LED lamp bar, is characterized in that, comprising: lamp bar pedestal and LED circuit; Described LED circuit is arranged on described lamp bar pedestal, and described LED circuit is connected to form by multiple LED; The both sides of each described LED are respectively equipped with for testing the electrical test point of described LED.
2. LED lamp bar as claimed in claim 1, is characterized in that, described LED circuit is LED strip connection circuit; Described LED strip connection circuit is composed in series by multiple LED.
3. LED lamp bar as claimed in claim 1, it is characterized in that, described LED circuit is LED parallel circuit, and described LED parallel circuit joins circuit in parallel by multiple LED strip and forms, and described LED strip connection circuit is composed in series by multiple LED.
4. the LED lamp bar as described in any one of claim 1-3, is characterized in that, described LED is side-emitting LED lamp or positive luminescence LED lamp.
5. the LED lamp bar as described in any one of claim 1-3, is characterized in that, described LED lamp bar is backlight LED light bars.
6. the LED lamp bar as described in any one of claim 1-3, is characterized in that, described lamp bar pedestal is pcb board.
7. a LED lamp bar test macro, is characterized in that, comprising: lamp bar checkout equipment, multiple probe and the LED lamp bar as described in any one of claim 1-6; Described lamp bar checkout equipment be provided with multiple for output current to the current output terminal of described LED lamp bar; The number of described current output terminal is equal with the number of test point in described LED lamp bar, and the number of described probe is equal with the number of described current output terminal; A described current output terminal connects a described probe;
During test LED lamp bar, described probe connects with corresponding test point, described lamp bar checkout equipment obtains the magnitude of voltage of LED in described LED lamp bar to the mode of described LED lamp bar by the current output terminal output current that control is corresponding, and judges whether LED is defective products according to the magnitude of voltage of LED.
8. LED lamp bar test macro as claimed in claim 7, is characterized in that, also comprise: display device;
Described display device obtains magnitude of voltage and the defective products judged result of described LED from described lamp bar checkout equipment, then shows the magnitude of voltage of described LED, and according to defective products judged result mark non-defective unit and bad LED.
CN201520207660.7U 2015-04-08 2015-04-08 A kind of LED lamp bar and LED lamp bar test macro Active CN204593001U (en)

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Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105676149A (en) * 2016-01-25 2016-06-15 系新电子技术(苏州)有限公司 LED light bar detector
CN105974292A (en) * 2016-06-20 2016-09-28 刘成 LED module electric leakage testing method
CN106168656A (en) * 2016-08-24 2016-11-30 山东蓝色电子科技有限公司 A kind of LED lamp bar universal burn-in experiment instrument
WO2018068407A1 (en) * 2016-10-13 2018-04-19 深圳Tcl数字技术有限公司 Light bar discharge testing method and device
CN110018385A (en) * 2019-05-07 2019-07-16 深圳市矽电半导体设备有限公司 It is a kind of it is quick judge multicomponent device electrical connection whether He Ge test method

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105676149A (en) * 2016-01-25 2016-06-15 系新电子技术(苏州)有限公司 LED light bar detector
CN105974292A (en) * 2016-06-20 2016-09-28 刘成 LED module electric leakage testing method
CN106168656A (en) * 2016-08-24 2016-11-30 山东蓝色电子科技有限公司 A kind of LED lamp bar universal burn-in experiment instrument
CN106168656B (en) * 2016-08-24 2019-03-22 山东蓝色电子科技有限公司 A kind of LED light bar universal burn-in experiment instrument
WO2018068407A1 (en) * 2016-10-13 2018-04-19 深圳Tcl数字技术有限公司 Light bar discharge testing method and device
CN110018385A (en) * 2019-05-07 2019-07-16 深圳市矽电半导体设备有限公司 It is a kind of it is quick judge multicomponent device electrical connection whether He Ge test method

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