JP2010098209A - Broken light emitting element detection system - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To provide a broken light emitting element detection system which promptly discriminates which light emitting element is broken among a plurality of light emitting elements arranged on a light emitting element substrate and does not apply a load such as internal heat to a device with the light emitting element substrate. <P>SOLUTION: The broken light emitting element detection system is provided with a resistor part 10 formed by serially connecting m-pieces of resistors R which are the same number as the number of LED elements 110 serially connected to an i-column LED substrate 100i, and connected to the i-column LED substrate 100i by a substrate connection part 130 and a detector connection part 20. Then, when a prescribed voltage is applied from a power supply 120, since a prescribed current flows to each LED element 110 provided at the i-column LED substrate 100i by each resistor R, the broken LED element 110 is detected by checking the LED element 110 which does not emit light. <P>COPYRIGHT: (C)2010,JPO&INPIT

Description

  The present invention relates to a damaged light-emitting element detection system, and in particular, a light-emitting element substrate in which a plurality of light-emitting elements are arranged on a substrate and the respective light-emitting elements are connected in series to form each row, and the rows are connected in parallel. In contrast, the present invention relates to a damaged light emitting element detection system using a detector that detects a damaged light emitting element by applying a predetermined voltage.

  In recent years, a plurality of LED elements are connected in series, a plurality of the LED elements connected in series are arranged in parallel to form an LED substrate having a planar circuit, and each LED element arranged on the LED substrate emits light. Thus, digital televisions equipped with so-called LED backlights that function as backlights for monitors and the like have begun to spread. Conventionally, when any of the LED elements in the LED backlight is damaged by an overcurrent or the like, a method of detecting and replacing the damaged (non-light-emitting) LED element by passing a current for each LED element is known. Have been used more. However, in the above method, individual detection must be performed for each LED element. Therefore, if the number of LED elements provided in each column is about several hundred, it is appropriate to detect a broken LED element. Took time.

Therefore, on the substrate on which the LED elements are arranged in a planar manner as described above, the detection elements are connected to the respective rows, and any row of LEDs is damaged based on the output from the detection elements connected to the respective rows. A disconnection detection device having a mechanism for determining whether or not a device is operating is known (for example, see Patent Document 1). Further, an LED breakage detection apparatus having a detection mechanism similar to that of Patent Document 1 is known (see, for example, Patent Document 2).
JP-A-7-287024 JP 2008-64477 A

  However, in the inventions disclosed in Patent Documents 1 and 2, it is only possible to determine which column the damaged LED element belongs to, and it is not possible to determine which LED element is in that column. Further, in the present invention, the detection element is provided on the substrate on which the plurality of LED elements are arranged, and a mechanism for determining which row of the LED elements is broken is provided inside the disconnection detection device or the LED breakage detection device. Therefore, there is a problem that the substrate and the housing of the apparatus are enlarged, and a load such as internal heat generation is caused to the apparatus every time detection is performed.

  An object of the present invention is to quickly determine which light emitting element is damaged among a plurality of light emitting elements arranged on a light emitting element substrate, and to load a device including the light emitting element substrate such as internal heat generation. It is an object of the present invention to provide a damaged light emitting element detection system that does not reach the target.

In order to solve the above-mentioned problem, the invention described in claim 1
A plurality of light emitting elements are arranged on a substrate and each light emitting element is connected in series to form each row, and a first terminal is provided between both ends of each row and the light emitting devices arranged in each row, In the broken light emitting element detection system by a detector that detects a broken light emitting element by applying a predetermined voltage to the light emitting element substrates connected in parallel to each column,
The detector is
A resistance portion in which resistors equal to or more than the number of light emitting elements arranged in each row are connected in series;
A connection portion that connects a first terminal provided in each row of the light emitting element substrate and a second terminal provided between both ends of the resistor portion and each resistor;
A predetermined voltage is applied to the predetermined row of the light emitting element substrate in a state where the first terminal and the second terminal of the predetermined row of the light emitting element substrate are connected by the connecting portion. It is characterized by comprising.

  According to a second aspect of the present invention, in the damaged light-emitting element detection system according to the first aspect, the light-emitting element substrate includes a through hole connected to the first terminal, and the connection portion includes the second holes. A pin is connected to a terminal and inserted into the through hole, and the first terminal and the second terminal are connected by inserting the pin into the through hole.

  According to a third aspect of the present invention, in the damaged light emitting element detection system according to the first aspect, the light emitting element substrate has one end connected to the first terminal and the other end provided with a board connector terminal and the other end. Includes a first connector portion that is aggregated and wired for each column of the light emitting element substrate, and the connection portion includes one end connected to the second terminal and the other end including a detector connector terminal. A second connector portion that is wired with the ends being aggregated is provided, and the first terminal and the second terminal are connected by connecting the first connector portion and the second connector portion. And

The invention according to claim 4
A plurality of LED elements are arranged on a substrate, and each LED element is connected in series to form each row, and a first terminal is provided between both ends of each row and the LED devices arranged in each row, In a broken light emitting element detection system by a detector that detects a broken LED element by applying a predetermined voltage to the LED substrates connected in parallel to each row,
The detector is
A resistance portion in which resistors equal to or more than the number of LED elements arranged in each row are connected in series;
A connection portion for connecting a first terminal provided in each row of the LED substrate and a second terminal provided between both ends of the resistor portion and the respective resistors;
The connecting portion is configured to apply a predetermined voltage to the predetermined row of the LED substrate in a state where the first terminal and the second terminal of the predetermined row of the LED substrate are connected. ,
The LED substrate includes a through hole connected to the first terminal,
The connecting portion includes a pin connected to each second terminal and inserted into the through hole,
The first terminal and the second terminal are connected by inserting the pin into the through hole.

According to the damaged light emitting element detection system according to the present invention, the detector includes a resistance unit in which resistors equal to or more than the number of the light emitting elements 110 connected in series in a predetermined row of the light emitting element substrate are connected in series. The portion can be connected to a predetermined row of the light emitting element substrate.
Therefore, when a predetermined voltage is applied to a predetermined row of the light emitting element substrate, a predetermined current flows through each light emitting element due to each resistance of the resistance portion, so that the user visually checks the light emitting elements that are not emitting light. Thus, a damaged light emitting element can be detected among the light emitting elements provided in a predetermined row of the light emitting element substrate. Then, by executing the above detection for each column, it is possible to detect the damaged state of all the light emitting elements provided on the light emitting element substrate.
In addition, according to the damaged light emitting element detection system according to the present invention, the detector is not provided on the light emitting element substrate, but only connected to the light emitting element substrate through the connection portion. And a device including a light emitting element substrate is not enlarged, and a load such as internal heat generation is not caused to the substrate or the device every time detection is performed.
Therefore, the present invention can quickly determine which light emitting element is damaged among the plurality of light emitting elements arranged on the light emitting element substrate, and applies a load such as internal heat generation to the apparatus including the light emitting element substrate. It can be said that this is a damaged light-emitting element detection system that does not reach.

  Hereinafter, specific embodiments of the damaged light emitting element detection system according to the present invention will be described in detail with reference to the drawings. However, the scope of the invention is not limited to the illustrated examples.

  FIG. 1 is a schematic configuration diagram showing an LED (Light Emitting Diode) backlight 200 and an LED substrate 100 disposed therein, wherein (A) shows the LED backlight 200, and (B) shows the LED substrate 100. FIG. 2 is a schematic configuration diagram showing a damaged light emitting element detection system 1000 to which the present invention is applied.

As shown in FIGS. 1 and 2, the damaged light emitting element detection system 1000 according to the present invention includes, for example, an LED substrate (light emitting element substrate) 100 in the LED backlight 200 and LED elements 110 arranged on the LED substrate 100. And a detector 1 for detecting the presence or absence of breakage.
As shown in FIG. 1A, the LED backlight 200 is disposed on the back side of a liquid crystal panel such as a digital TV, for example, and the liquid crystal panel is divided into a matrix of n vertical x m horizontal. In order to correspond to each of the sub display areas, there are n vertical x m horizontal light sources L (n, m), and each of the light sources L (n, m) illuminates the corresponding sub display area, thereby liquid crystal. It functions as a panel backlight.

  Next, as shown in FIG. 1B, the LED substrate 100 provided inside the LED backlight 200 is an LED element 110 as a light emitting source arranged to correspond to each of the light sources L (n, m). And a power source 120 for applying a voltage to the LED element 110, a substrate connecting portion 130 for connecting to the detector 1, and the like.

The LED element 110 (light emitting element) is a light emitting diode element and has a property of emitting light in accordance with a flowing current.
The LED elements 110 are arranged in vertical n × horizontal m on the LED substrate 100 so as to correspond to the light source L (n, m), and m LED elements 110 provided in each row with respect to the power source 120. Are connected in series. Each column is connected to the power source 120 in parallel. Therefore, when a predetermined voltage is applied from the power source 120 and a predetermined current flows through the LED element 110, the LED element 110 emits light, and the light sources L (n, m) illuminate the corresponding sub display areas. ing.

The power source 120 is a voltage source that applies a predetermined voltage (voltage value V) to the LED element 110. The voltage value V is usually a value of about several volts.
The board terminal 140 (first terminal) is a terminal provided between both ends of each row and the LED elements 110 arranged in each row.

The substrate connection unit 130 includes a through hole 130a and is connected to the detector 1 via a detector connection unit 20 of the detector 1 described later.
The through hole 130a is a hole provided in the LED substrate 100, and one end thereof is connected to the substrate terminal 140, and is connected to the detector 1 by inserting a pin 20a of the detector connecting portion 20 described later. Is possible.

  As shown in FIG. 2, the detector 1 includes a resistance unit 10 and a detector connection unit 20, and connects to each row of the LED substrate 100 via the detector connection unit 20. Is performed (for example, in FIG. 2, an arbitrary integer is set to i (1 <i <n) and connected to the i-th row LED board 100i located in the i-th row of the LED board 100), and is applied from the power source 120. A damaged LED element 110 included in the i-row LED substrate 100i can be detected based on whether or not the current flows through the resistance portion 10 due to the voltage and the LED element 110 emits light.

As shown in FIG. 2, the resistance unit 10 is configured to include the same number of resistors R as the number m of the LED elements 110 of the i-row LED substrate 100i, and each resistor R has the same resistance value and is connected in series. It is connected. The resistance value of each resistor R is determined by the voltage (voltage value V) applied from the power source 120. Generally, it is known that when the current flowing through each LED element 110 is about 10 mA, the wire breaks (open breakdown). Therefore, the resistance value indicating this current value, that is, R = (V / m) / (10 * 10 ⁻³ ) [Ω] (usually about several tens of Ω to several hundreds of kiloΩ) is set. Has been.

  The detector terminal 30 (second terminal) is a terminal provided between both ends of the resistor 10 and each resistor R.

The detector connection unit 20 (connection unit) includes pins 20a and is connected to the i-row LED substrate 100i via the substrate connection portion 130 of the i-row LED substrate 100i.
The pin 20a is, for example, a conductive member formed in a substantially conical shape so that one end of the pin 20a is connected to the detector terminal 30 and the shape of the tip becomes narrower toward the tip. The pin 20a is connected to the through hole 130a. Is inserted into the i-line LED substrate 100i.

Next, the detection operation of the damaged LED element by the damaged light emitting element detection system 1000 will be described.
First, a predetermined row (for example, i row LED substrate 100i) of the LED substrate 100 that performs detection is determined.
Next, the pin 20a of the detector connecting portion 20 of the detector 1 is inserted into the through-hole 130a of the row, and the detector 1 and the i-row LED substrate 100i are connected.
Next, when a voltage having a voltage value V is applied from the power source 120 in this connected state, a predetermined current flows through each of the m LED elements 110 provided on the i-row LED substrate 100i by each resistor R. At this time, the user can visually check the LED elements 110 that are not emitting light, so that the damaged LED elements 110 can be detected among the LED elements 110 provided on the i-row LED substrate 100i.
Then, by executing the above detection for each column (that is, a total of n times), it is possible to detect the damaged state of all the LED elements 110 provided on the LED substrate 100.

"Modification 1"
A damaged light emitting element detection system 1000a shown in FIG. 3 is a modification of the damaged light emitting element detection system 1000 shown in FIG. 2, and is different from FIG. 2 in that a through hole 130a in the board connecting portion 130 of the i-row LED board 100i. In this case, a board connector 131a is provided, and a detector connector 21a is provided instead of the pin 20a of the detector 1.
Below, the difference is mainly demonstrated.

For example, as shown in FIG. 3, the board connector 131a (first connector part) includes a number of board connector terminals 131b whose one end is equal to the number of conductors connected to the board terminal 140, and aggregates the conductors. It is configured to be detachable from a later-described detector connector 21a.
The board connector terminal 131 b is, for example, a female connector terminal, and is connected to the other end of the conducting wire connected to the board terminal 140.

For example, as shown in FIG. 3, the detector connector 21 a (second connector portion) includes detector connector terminals 21 b whose one end is equal to the number of conductive wires connected to the detector terminal 30, and collects the conductive wires. In addition, it is configured to be detachable from the board connector 131a.
The detector connector terminal 21 b is, for example, a male connector terminal, and is connected to the other end of the conducting wire connected to the detector terminal 30.

  Therefore, according to the damaged light emitting element detection system 1000a of the modified example 1, by connecting the detector connector 21a to the board connector 131a, the detector 1 and the i-row LED board 100i can be easily connected. Detection can be performed.

As described above, according to the damaged light emitting element detection system of the present invention, the resistance unit 10 including m resistors R, which are the same number as the LED elements 110 connected in series in the i-row LED substrate 100i, is provided in series. The board connection part 130 and the detector connection part 20 can be connected to the i-row LED board 100i.
Therefore, when a predetermined voltage is applied from the power source 120, a predetermined current flows through each LED element 110 provided in the i-row LED substrate 100i by each resistor R. By visually confirming, the damaged LED element 110 can be detected among the LED elements 110 provided on the i-row LED substrate 100i. Then, by executing the above detection for each column, it is possible to detect the damage state of all the LED elements 110 provided on the LED substrate 100.
In addition, according to the damaged light emitting element detection system according to the present invention, the detector 1 is not provided inside the LED backlight 200 but is connected to the LED substrate 100 via the detector connection unit 20 and the substrate connection unit 130. Since it is only what is connected, the connection part LED substrate 100 and the LED backlight 200 are not enlarged, and a load such as internal heat generation is not caused to the LED backlight 200 each time detection is performed.
Therefore, the present invention can quickly determine which light emitting element is damaged among the plurality of light emitting elements arranged on the light emitting element substrate, and applies a load such as internal heat generation to the apparatus including the light emitting element substrate. It can be said that this is a damaged light-emitting element detection system that does not reach.

In addition, the board connecting portion 130 is provided with a through hole 130a, and the detector connecting portion 20 is provided with a pin 20a to be inserted into the through hole 130a.
That is, the detector 1 and the i-row LED substrate 100i can be easily connected by inserting the pin 20a into the through hole 130a.

Further, according to the broken light emitting element detection system 1000a of the first modification, the detector connector 21a is provided on the detector 1 side instead of the pin 20a, and the through hole 130a in the board connecting portion 130 is changed on the LED board 100 side. A board connector 131a is provided.
That is, by attaching / detaching the detector connector 21a and the board connector 131a, the detector 1 and the i-row LED board 100i can be more easily connected.
The damaged light emitting element detection system according to the present invention is not limited to the above-described embodiment.
For example, the number of resistors provided in the resistor unit 10 is the same as the number of LED elements provided in each row of the LED substrate, but may be more than that.
In addition, the resistor may be configured to be able to simultaneously measure a plurality of rows of LED elements.

It is a schematic block diagram which shows the LED backlight 200 which concerns on this invention, and the LED board | substrate 100 arrange | positioned in the inside, (A) has shown the LED backlight 200, (B) has shown the LED board 100. FIG. It is a schematic block diagram of the damage light emitting element detection system to which this invention is applied. It is a figure which shows the modification of the damaged light emitting element detection system in FIG.

Explanation of symbols

1 detector 10 resistor portion R resistor 20 detector connection portion (connection portion)
20a pin 30 detector terminal (second terminal)
100 LED substrate (light emitting device substrate)
100i i row LED board 110 LED element 120 power supply 130 board connection part 140 board terminal (first terminal)
130a Through hole 200 LED backlight 21a Detector connector (second connector part)
21b Detector connector terminal 131a Substrate connector (first connector part)
131b Substrate connector terminal 1000 Damaged light emitting element detection system 1000a Damaged light emitting element detection system

Claims (4)

A plurality of light emitting elements are arranged on a substrate and each light emitting element is connected in series to form each row, and a first terminal is provided between both ends of each row and the light emitting devices arranged in each row, In the broken light emitting element detection system by a detector that detects a broken light emitting element by applying a predetermined voltage to the light emitting element substrates connected in parallel to each column,
The detector is
A resistance portion in which resistors equal to or more than the number of light emitting elements arranged in each row are connected in series;
A connection portion that connects a first terminal provided in each row of the light emitting element substrate and a second terminal provided between both ends of the resistor portion and each resistor;
A predetermined voltage is applied to the predetermined row of the light emitting element substrate in a state where the first terminal and the second terminal of the predetermined row of the light emitting element substrate are connected by the connecting portion. A damaged light emitting element detection system characterized by comprising. The damaged light emitting element detection system according to claim 1,
The light emitting element substrate includes a through hole connected to the first terminal,
The connecting portion includes a pin connected to each second terminal and inserted into the through hole,
A damaged light emitting element detection system, wherein the first terminal and the second terminal are connected by inserting the pin into the through hole. The damaged light emitting element detection system according to claim 1,
The light emitting element substrate is
One end is connected to the first terminal, the other end is provided with a substrate connector terminal, and the other end is provided with a first connector portion wired for each row of the light emitting element substrate,
The connecting portion is
One end is connected to the second terminal, the other end is provided with a detector connector terminal, and the other end is provided with a second connector portion wired together.
The damaged light emitting element detection system, wherein the first terminal and the second terminal are connected by connecting the first connector part and the second connector part. A plurality of LED elements are arranged on a substrate, and each LED element is connected in series to form each row, and a first terminal is provided between both ends of each row and the LED devices arranged in each row, In a broken light emitting element detection system by a detector that detects a broken LED element by applying a predetermined voltage to the LED substrates connected in parallel to each row,
The detector is
A resistance portion in which resistors equal to or more than the number of LED elements arranged in each row are connected in series;
A connection portion for connecting a first terminal provided in each row of the LED substrate and a second terminal provided between both ends of the resistor portion and the respective resistors;
The connecting portion is configured to apply a predetermined voltage to the predetermined row of the LED substrate in a state where the first terminal and the second terminal of the predetermined row of the LED substrate are connected. ,
The LED substrate includes a through hole connected to the first terminal,
The connecting portion includes a pin connected to each second terminal and inserted into the through hole,
A damaged light emitting element detection system, wherein the first terminal and the second terminal are connected by inserting the pin into the through hole.

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