CN110018385A - It is a kind of it is quick judge multicomponent device electrical connection whether He Ge test method - Google Patents
It is a kind of it is quick judge multicomponent device electrical connection whether He Ge test method Download PDFInfo
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- CN110018385A CN110018385A CN201910375817.XA CN201910375817A CN110018385A CN 110018385 A CN110018385 A CN 110018385A CN 201910375817 A CN201910375817 A CN 201910375817A CN 110018385 A CN110018385 A CN 110018385A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/66—Testing of connections, e.g. of plugs or non-disconnectable joints
- G01R31/67—Testing the correctness of wire connections in electric apparatus or circuits
Abstract
It is a kind of it is quick judge multicomponent device electrical connection whether He Ge test method, S1: N number of component is connected, and N is positive integer more than or equal to 2；S2: the series voltage for testing N number of component is V1；S3:N component normal voltage range (Vmin Vmax), and Vmin is less than Vmax；If V1 is less than Vmin, concatenated N number of component is unqualified；If V1 is greater than Vmax, concatenated N number of component is unqualified；If V1 is greater than or equal to Vmin, and V1 is less than or equal to Vmax, then concatenated N number of component is qualified；Whether the series voltage or parallel-current after capable of quickly detecting multiple components electrical connection of serial or parallel connection are qualified, improve testing efficiency of the multicomponent device after electrical connection.
Description
Technical field
The present invention relates to it is a kind of quickly judge multicomponent device be electrically connected whether He Ge test method.
Background technique
It is very low and unnecessary using conventional single component testing efficiency for the multicomponent device test of electrical connection,
Single component testing will have just been carried out before the electrical connection of multiple components；The multicomponent device of electrical connection is poor due to connection processing technology
It is different, so that the concatenated voltage of multiple components is not necessarily equal to the sum of single component voltage, the component electric current of multiple parallel connections
The sum of and the sum of not equal to single component electric current；This practical series voltage and the error of theoretical tandem voltage will affect greatly very much
The service life is applied in combination in concatenated multiple components；Mistake between the sum of the sum of described practical electric current in parallel and theoretical current
Difference will affect the service life of component in parallel.
Summary of the invention
To solve the problems, such as that multicomponent device electrical connection causes adverse effect to service life, the present invention proposes that one kind is quickly sentenced
Disconnected multicomponent device electrical connection whether He Ge test method.
The technical solution of the present invention is as follows: it is a kind of quickly judge multicomponent device be electrically connected whether He Ge test method,
S1: N number of component is connected, and N is the positive integer more than or equal to 2；
S2: the series voltage for testing N number of component is V1；
S3:N component normal voltage range (Vmin Vmax), and Vmin is less than Vmax；If V1 is less than Vmin, connect
N number of component it is unqualified；If V1 is greater than Vmax, concatenated N number of component is unqualified；If V1 is greater than or equal to
Vmin, and V1 is less than or equal to Vmax, then concatenated N number of component is qualified.
Further, if being greater than Vmax when V1 is less than Vmin or V1, further include,
S4: above-mentioned N number of component is divided into two groups by series sequence and is respectively as follows: N1 component and N2 component, i.e. N1+N2
=N；The N1 component series connection test voltage is V2, and N1 component normal voltage range is (Vmin1 Vmax2), if
V2 is less than Vmin1, then N1 concatenated components are unqualified；If V2 is greater than Vmax2, N1 concatenated components do not conform to
Lattice；If V2 is greater than or equal to Vmin1, and V2 is less than or equal to Vmax2, then N1 concatenated components are qualified；The N2
A component series connection test voltage is V3, and N2 component normal voltage range is (Vmin3 Vmax4), if V3 is less than
Vmin3, then N2 concatenated components are unqualified；If V3 is greater than Vmax4, N2 concatenated components are unqualified；If
V3 is greater than or equal to Vmin3, and V3 is less than or equal to Vmax4, then N2 concatenated components are qualified.
Further, concatenated N number of component is that electrical parameter requires consistent component, i.e., each component voltage range
It is required to be less than Vb for (Va Vb), Va；Then N*Va=Vmin, N*Vb=Vmax.
Further, the multicomponent device is multiple LED lamp beads；The N is more than or equal to 5, and N is less than or equal to 15.
Further, when concatenated N number of component is unqualified, N1 and when N2 qualified is needed concatenated N1 member device
Part and concatenated N2 component are used separately, and when can not decouple for concatenated N number of component, then determine concatenated N number of member
Device is unqualified.
It is a kind of it is quick judge multicomponent device electrical connection whether He Ge test method,
S1: M component is in parallel, and M is the positive integer more than or equal to 2；
S2: the parallel-current of M component of test is I1；
S3:M component normal current range (Imin Imax), and Imin is less than Imax；If I1 is less than Imin, in parallel
M component it is unqualified；If I1 is greater than Imax, M component in parallel is unqualified；If I1 is greater than or equal to
Imin, and I1 is less than or equal to Imax, then M component in parallel is qualified.
Further, S4: above-mentioned M component is divided into two groups and is respectively as follows: M1 component and M2 component, i.e. M1
+M2=M；The M1 component parallel connection test electric current is I2, and M1 component normal current range is (Imin1 Imax2), such as
Fruit I2 is less than Imin1, then M1 component in parallel is unqualified；If I2 is greater than Imax2, M1 component in parallel does not conform to
Lattice；If I2 is greater than or equal to Imin1, and I2 is less than or equal to Imax2, then M1 component in parallel is qualified；The M2
A component parallel connection test electric current is I3, and M2 component normal current range is (Imin3 Imax4), if I3 is less than
Imin3, then M2 component in parallel is unqualified；If I3 is greater than Imax4, M2 component in parallel is unqualified；If
I3 is greater than or equal to Imin3, and I3 is less than or equal to Imax4, then M2 component in parallel is qualified.
Further, M component in parallel is that electrical parameter requires consistent component, i.e., each component current range
It is required to be less than Ib for (Ia Ib), Ia；Then M*Ia=Imin, M*Ib=Imax.
Further, the multicomponent device is multiple LED lamp beads；The M is more than or equal to 5, and M is less than or equal to 15.
Further, it when M1 and M2 are qualified, needs M1 component in parallel and M2 component point in parallel
Use is opened, when can not decouple for M component in parallel, then determines that M component in parallel is unqualified.
The beneficial effects of the present invention are: the series connection after capable of quickly detecting multiple components electrical connection of serial or parallel connection
Whether voltage or parallel-current are qualified, improve testing efficiency of the multicomponent device after electrical connection.
Detailed description of the invention
Fig. 1 is multiple concatenated component schematic diagrames；
Fig. 2 is the component schematic diagram of multiple parallel connections.
Specific embodiment
For convenient for those skilled in the art understand that technical solution of the present invention, technical solution of the present invention is combined have below
Body embodiment is described in further detail.
Embodiment one
Is met by electrical parameter in single lamp bead and is wanted due to using the concatenated structure of multiple LED lamp beads for present automobile lamp
Under the premise of asking, the lamp bead after series connection may not be able to meet the requirement of setting, therefore need using special test side
Method quickly judges whether concatenated LED lamp bead is qualified.
As shown in Figure 1, it is a kind of quickly judge multicomponent device be electrically connected whether He Ge test method,
S1: N number of component is connected, and N is the positive integer more than or equal to 2；
S2: the series voltage for testing N number of component is V1；According to circuit basic knowledge it is found that the total voltage of series circuit is each
The sum of series connection component voltage, however due to needing to guarantee that each series connection component normal work needs to guarantee each series connection component tool
There is reasonable voltage, i.e., single component voltage is in (Vmin Vmax) range；
S3:N component normal voltage range (Vmin Vmax), and Vmin is less than Vmax；If V1 is less than Vmin, connect
N number of component it is unqualified, quickly judge whether N number of component whole qualified, if unqualified, selection will be entire concatenated
N number of component is abandoned；If V1 is greater than Vmax, concatenated N number of component is unqualified, quickly judges N number of concatenated first device
Part is unqualified, improves testing efficiency；If V1 is greater than or equal to Vmin, and V1 is less than or equal to Vmax, then concatenated N number of first device
Part is qualified；It will do it independent detection after producing due to single component, it is integrally full in conjunction with concatenated N number of component at this time
Afc voltage requirement, therefore judge that concatenated N number of component voltage parameter is qualified；
Judge whether multiple concatenated components meet electrical parameter requirement, quickly using the above method convenient for judging multiple components
Whether the finished product of assembled in series meets electrical parameter requirement；Meanwhile by comparing the deviation of V1 and Vmin and V1 and Vmax deviation
It can feed back and whether the concatenated production technology of N number of component be can satisfy into requirement out, improve N number of component so as to improve technique
The qualification rate for production technology of connecting.
As indicated with 1, it is described it is quick judge multicomponent device electrical connection whether He Ge test method, further include S4: by above-mentioned N
A component series sequence is divided into two groups and is respectively as follows: N1 component and N2 component, i.e. N1+N2=N；Described N1 first device
Part connects test voltage as V2, and N1 component normal voltage range is (Vmin1 Vmax2), if V2 is less than Vmin1, N1
A concatenated component is unqualified；If V2 is greater than Vmax2, N1 concatenated components are unqualified；If V2 is greater than or waits
In Vmin1, and V2 is less than or equal to Vmax2, then N1 concatenated components are qualified；The N2 component series connection test electricity
Pressure is V3, and N2 component normal voltage range is (Vmin3 Vmax4), if V3 is less than Vmin3, N2 concatenated first devices
Part is unqualified；If V3 is greater than Vmax4, N2 concatenated components are unqualified；If V3 is greater than or equal to Vmin3, and V3
Less than or equal to Vmax4, then N2 concatenated components are qualified；That is, when N number of concatenated component is unqualified, by into one
Step is grouped into N1 and N2, in fact it could happen that there are four types of situations, and N1 is unqualified and N2 is unqualified, then select to determine concatenated N number of first device
Part is unqualified；When N1 qualification, N2 is unqualified, and N2 is abandoned in selection, so that N1 is qualification；When N1 is unqualified and N2 is qualified, selection
It abandons N1 and retains N2；When N1 qualification and N2 is qualified, then needs further to verify；Further determine above-mentioned faulty N number of
Component of connecting is which part is unqualified, so that it is unqualified to be judged as less series connection component；When N1 and N2 are closed
When lattice, need for concatenated N1 component and concatenated N2 component to be used separately, it can not for concatenated N number of component
When partition, then determine that concatenated N number of component is unqualified；It, will be affiliated concatenated N number of when concatenated N number of component is unqualified
Component grouping test, reduces to the greatest extent and is determined as underproof component number；When N number of concatenated component is unqualified, and divide
The concatenated N1 component of group and concatenated N2 component are qualified, since the concatenated global voltage of the two is unsatisfactory for requiring,
Therefore determine unqualified；For the occasion that can be used separately concatenated N1 component and concatenated N2 component, need
Concatenated N1 component and concatenated N2 component are used separately；To guarantee that concatenated component meets use and wants
It asks；For the N number of concatenated component that can not be split, when voltage is determined as unqualified, directly it is determined as N number of concatenated member
Device is unqualified.
As shown in Figure 1, concatenated N number of component is that electrical parameter requires consistent component, i.e., each component voltage model
It encloses and is required to be less than Vb for (Va Vb), Va；Then Vmin is less than or equal to N*Va, and Vmax is more than or equal to N*Vb；Range of connecting is tired out
Product, for concatenated component, theoretical tandem voltage be it is multiple series connection components voltage and.
As shown in Figure 1, the multicomponent device is multiple LED lamp beads；For concatenated LED lamp bead, carry out before packaging
Single LED lamp bead test, due to may cause two adjacent LEDs lamp bead voltage change in cascade process, needs to survey after series connection
Whether amount series voltage meets requirement；The N is more than or equal to 5, and N is less than or equal to 15；The value of N is 50 as large as N very much, can
Whole voltage can be made to meet requirement since the illegitimate error between multiple adjacent components is accumulative, make final N
A concatenated component meets parameter request, but can not reach ideal requirement；It is too small for N value, it will cause weight
Repetition measurement examination wastes time, and testing efficiency is low, is unfavorable for quickly judging whether concatenated N number of component is qualified.
Embodiment two
As shown in Fig. 2, it is a kind of quickly judge multicomponent device be electrically connected whether He Ge test method,
S1: M component is in parallel, and M is the positive integer more than or equal to 2；
S2: the parallel-current of M component of test is I1；
S3:M component normal current range (Imin Imax), and Imin is less than Imax；If I1 is less than Imin, in parallel
M component it is unqualified；If I1 is greater than Imax, M component in parallel is unqualified；If I1 is greater than or equal to
Imin, and I1 is less than or equal to Imax, then M component in parallel is qualified；Before single component current parameters are qualified
It puts, quickly judges whether multiple component parameters in parallel meet the production requirement of product by the method, it is more to improve inspection
It is a parallel connection component whether He Ge efficiency.
As shown in Fig. 2, S4: above-mentioned M component being divided into two groups and is respectively as follows: M1 component and M2 component, i.e.,
M1+M2=M；The M1 component parallel connection test electric current is I2, and M1 component normal current range is (Imin1 Imax2),
If I2 is less than Imin1, M1 component in parallel is unqualified；If I2 is greater than Imax2, M1 component in parallel is not
It is qualified；If I2 is greater than or equal to Imin1, and I2 is less than or equal to Imax2, then M1 component in parallel is qualified；It is described
M2 component parallel connection test electric current is I3, and M2 component normal current range is (Imin3 Imax4), if I3 is less than
Imin3, then M2 component in parallel is unqualified；If I3 is greater than Imax4, M2 component in parallel is unqualified；If
I3 is greater than or equal to Imin3, and I3 is less than or equal to Imax4, then M2 component in parallel is qualified；Scheme implementer being capable of root
It selects according to needs when M component is determined as unqualified, M component is just divided into M1 and M2 and is tested.
As shown in Fig. 2, M component in parallel is that electrical parameter requires consistent component, i.e., each component electric current model
It encloses and is required to be less than Ib for (Ia Ib), Ia；Then M*Ia=Imin, M*Ib=Imax；This is the selection consistent component of current parameters
It is described in detail；The multicomponent device is multiple LED lamp beads；The M is more than or equal to 5, and M is less than or equal to 15, when M=100
When, since current variation value is accumulative after multiple single components parallel connections, it may cause the component current parameters of part in parallel not
Meet requirement, and M component current parameters in parallel are by meeting the component electric current of requirement or part in parallel
Parameter meets requirement, and M component in parallel cannot be met the requirements.
As shown in Fig. 2, needing when M1 and M2 are qualified by M1 component in parallel and M2 component point in parallel
Use is opened, when can not decouple for M component in parallel, then determines that M component in parallel is unqualified；Due to M parallel connection
Component overall current parameter it is unqualified, therefore cannot function as whole use；For the M component in parallel that can divide, lead to
It is excessively cut into less M1 and M2 re-test, for meeting the part of current parameters by using after segmentation.
The above are preferred embodiments of the present invention, is not intended to limit the scope of the invention.It should approve, this field skill
Art personnel made non-creative deformation and change after understanding technical solution of the present invention, should also belong to protection of the invention
The scope of disclosure and.
Claims (10)
1. it is a kind of quickly judge multicomponent device be electrically connected whether He Ge test method, it is characterised in that:
S1: N number of component is connected, and N is the positive integer more than or equal to 2；
S2: the series voltage for testing N number of component is V1；
S3:N component normal voltage range (Vmin Vmax), and Vmin is less than Vmax；If V1 is less than Vmin, connect
N number of component it is unqualified；If V1 is greater than Vmax, concatenated N number of component is unqualified；If V1 is greater than or equal to
Vmin, and V1 is less than or equal to Vmax, then concatenated N number of component is qualified.
2. it is according to claim 1 it is quick judge multicomponent device electrical connection whether He Ge test method, it is characterised in that:
If being greater than Vmax when V1 is less than Vmin or V1, further include,
S4: above-mentioned N number of component is divided into two groups by series sequence and is respectively as follows: N1 component and N2 component, i.e. N1+N2
=N；The N1 component series connection test voltage is V2, and N1 component normal voltage range is (Vmin1 Vmax2), if
V2 is less than Vmin1, then N1 concatenated components are unqualified；If V2 is greater than Vmax2, N1 concatenated components do not conform to
Lattice；If V2 is greater than or equal to Vmin1, and V2 is less than or equal to Vmax2, then N1 concatenated components are qualified；The N2
A component series connection test voltage is V3, and N2 component normal voltage range is (Vmin3 Vmax4), if V3 is less than
Vmin3, then N2 concatenated components are unqualified；If V3 is greater than Vmax4, N2 concatenated components are unqualified；If
V3 is greater than or equal to Vmin3, and V3 is less than or equal to Vmax4, then N2 concatenated components are qualified.
3. it is according to claim 1 it is quick judge multicomponent device electrical connection whether He Ge test method, it is characterised in that:
Concatenated N number of component is that electrical parameter requires consistent component, i.e., each component voltage range is required to as (Va
Vb), Va is less than Vb；Then N*Va=Vmin, N*Vb=Vmax.
4. it is according to claim 1 it is quick judge multicomponent device electrical connection whether He Ge test method, it is characterised in that:
The multicomponent device is multiple LED lamp beads；The N is more than or equal to 5, and N is less than or equal to 15.
5. it is according to claim 2 it is quick judge multicomponent device electrical connection whether He Ge test method, it is characterised in that:
When concatenated N number of component is unqualified, N1 and when N2 qualified is needed concatenated N1 component and concatenated N2
A component is used separately, and when can not decouple for concatenated N number of component, then determines that concatenated N number of component is unqualified.
6. it is a kind of quickly judge multicomponent device be electrically connected whether He Ge test method,
S1: M component is in parallel, and M is the positive integer more than or equal to 2；
S2: the parallel-current of M component of test is I1；
S3:M component normal current range (Imin Imax), and Imin is less than Imax；If I1 is less than Imin, in parallel
M component it is unqualified；If I1 is greater than Imax, M component in parallel is unqualified；If I1 is greater than or equal to
Imin, and I1 is less than or equal to Imax, then M component in parallel is qualified.
7. it is according to claim 6 it is quick judge multicomponent device electrical connection whether He Ge test method, it is characterised in that:
S4: above-mentioned M component is divided into two groups and is respectively as follows: M1 component and M2 component, i.e. M1+M2=M；The M1
A component parallel connection test electric current is I2, and M1 component normal current range is (Imin1 Imax2), if I2 is less than
Imin1, then M1 component in parallel is unqualified；If I2 is greater than Imax2, M1 component in parallel is unqualified；If
I2 is greater than or equal to Imin1, and I2 is less than or equal to Imax2, then M1 component in parallel is qualified；The M2 component
Test electric current in parallel is I3, and M2 component normal current range is (Imin3 Imax4), if I3 is less than Imin3, M2 is a
Component in parallel is unqualified；If I3 is greater than Imax4, M2 component in parallel is unqualified；If I3 is greater than or equal to
Imin3, and I3 is less than or equal to Imax4, then M2 component in parallel is qualified.
8. it is according to claim 6 it is quick judge multicomponent device electrical connection whether He Ge test method, it is characterised in that:
M component in parallel is that electrical parameter requires consistent component, i.e., each component current range is required to as (Ia
Ib), Ia is less than Ib；Then M*Ia=Imin, M*Ib=Imax.
9. it is according to claim 6 it is quick judge multicomponent device electrical connection whether He Ge test method, it is characterised in that:
The multicomponent device is multiple LED lamp beads；The M is more than or equal to 5, and M is less than or equal to 15.
10. it is according to claim 7 it is quick judge multicomponent device electrical connection whether He Ge test method, feature exists
In:
When M1 and M2 are qualified, need for M1 component in parallel and M2 component in parallel to be used separately, for simultaneously
When M component of connection can not decouple, then determine that M component in parallel is unqualified.
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112363002A (en) * | 2020-11-25 | 2021-02-12 | 常州同惠电子股份有限公司 | Multi-element parallel test method for safety voltage-resistant instrument |
| CN112595914A (en) * | 2020-12-10 | 2021-04-02 | 陕西新泓水艺环境科技有限公司 | Fault detection method and fault detection device for water treatment equipment |
Citations (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE3544048A1 (en) * | 1985-12-13 | 1987-06-19 | Standard Elektrik Lorenz Ag | Fault location in series-connected light barriers |
| KR20100099325A (en) * | 2008-02-19 | 2010-09-10 | 퀘리타우, 인크. | Electromigration tester for high capacity and high current |
| CN102033174A (en) * | 2010-09-30 | 2011-04-27 | 中国铁路通信信号上海工程集团有限公司 | Indicator as well as fault diagnosis system and method thereof |
| CN201903624U (en) * | 2010-12-20 | 2011-07-20 | 中国神华能源股份有限公司 | LED (light emitting diode) light source detection device |
| TW201316816A (en) * | 2011-10-03 | 2013-04-16 | 中原大學 | Appropriate LED arrangement and power need estemation in large-scale LED display and lighting apparatus and method thereof |
| CN203823699U (en) * | 2014-04-30 | 2014-09-10 | 贵派电器股份有限公司 | LED module with fault detecting function and LED flat plate lamp/crystal lamp |
| CN204593001U (en) * | 2015-04-08 | 2015-08-26 | 深圳市聚飞光电股份有限公司 | A kind of LED lamp bar and LED lamp bar test macro |
| CN105848329A (en) * | 2015-01-30 | 2016-08-10 | 英飞凌科技股份有限公司 | Automatic short led detection for light emitting diode (led) array load |
| CN207232353U (en) * | 2017-05-04 | 2018-04-13 | 深圳市科润光电股份有限公司 | A kind of LED charactrons detection device |
| CN109061526A (en) * | 2017-06-09 | 2018-12-21 | 英飞凌科技股份有限公司 | The detection of single short circuit LED in LED chain |
-
2019
- 2019-05-07 CN CN201910375817.XA patent/CN110018385A/en active Pending
Patent Citations (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE3544048A1 (en) * | 1985-12-13 | 1987-06-19 | Standard Elektrik Lorenz Ag | Fault location in series-connected light barriers |
| KR20100099325A (en) * | 2008-02-19 | 2010-09-10 | 퀘리타우, 인크. | Electromigration tester for high capacity and high current |
| CN102033174A (en) * | 2010-09-30 | 2011-04-27 | 中国铁路通信信号上海工程集团有限公司 | Indicator as well as fault diagnosis system and method thereof |
| CN201903624U (en) * | 2010-12-20 | 2011-07-20 | 中国神华能源股份有限公司 | LED (light emitting diode) light source detection device |
| TW201316816A (en) * | 2011-10-03 | 2013-04-16 | 中原大學 | Appropriate LED arrangement and power need estemation in large-scale LED display and lighting apparatus and method thereof |
| CN203823699U (en) * | 2014-04-30 | 2014-09-10 | 贵派电器股份有限公司 | LED module with fault detecting function and LED flat plate lamp/crystal lamp |
| CN105848329A (en) * | 2015-01-30 | 2016-08-10 | 英飞凌科技股份有限公司 | Automatic short led detection for light emitting diode (led) array load |
| CN204593001U (en) * | 2015-04-08 | 2015-08-26 | 深圳市聚飞光电股份有限公司 | A kind of LED lamp bar and LED lamp bar test macro |
| CN207232353U (en) * | 2017-05-04 | 2018-04-13 | 深圳市科润光电股份有限公司 | A kind of LED charactrons detection device |
| CN109061526A (en) * | 2017-06-09 | 2018-12-21 | 英飞凌科技股份有限公司 | The detection of single short circuit LED in LED chain |
Non-Patent Citations (4)
| Title |
|---|
| FONS JANSSEN: "用监控开关模式占空比的方法诊断LED", 《电子设计技术》 * |
| SHIH CHANG HSIA等: "Single chip design for detection and recovery of series LED open/short fault tolerance circuit", 《IET POWER ELECTRONICS》 * |
| 单承赣等: "《电子仪器及其故障诊断》", 31 December 1989 * |
| 左熹等: "一种基于PLC的LED交通信号灯自动检测系统", 《灯与照明》 * |
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| CN112363002A (en) * | 2020-11-25 | 2021-02-12 | 常州同惠电子股份有限公司 | Multi-element parallel test method for safety voltage-resistant instrument |
| CN112595914A (en) * | 2020-12-10 | 2021-04-02 | 陕西新泓水艺环境科技有限公司 | Fault detection method and fault detection device for water treatment equipment |
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