CN112363002A - Multi-element parallel test method for safety voltage-resistant instrument - Google Patents
Multi-element parallel test method for safety voltage-resistant instrument Download PDFInfo
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- CN112363002A CN112363002A CN202011337692.0A CN202011337692A CN112363002A CN 112363002 A CN112363002 A CN 112363002A CN 202011337692 A CN202011337692 A CN 202011337692A CN 112363002 A CN112363002 A CN 112363002A
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- 238000010998 test method Methods 0.000 title claims abstract description 15
- 238000012360 testing method Methods 0.000 claims abstract description 67
- 238000005259 measurement Methods 0.000 claims abstract description 8
- 238000000034 method Methods 0.000 description 5
- 238000010586 diagram Methods 0.000 description 2
- 238000012216 screening Methods 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000004364 calculation method Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
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Abstract
The invention relates to a multi-element parallel test method for a safety voltage-resistant instrument, which comprises the following steps: calculating the range of the current scanning element, and controlling a channel setting program to initialize a channel; positioning the current element position, setting a parallel test state, the number of parallel test elements and a scanning channel; initializing measurement, starting the test and obtaining a test result; and after the test is finished, initializing the pass state channel and the fail state channel. The multi-element parallel test method for the safety voltage-withstanding instrument can efficiently and quickly detect unqualified products in each step of complete test, the efficiency is greatly improved compared with that required by single sequential scanning, the unqualified products are screened out from the test by entering the current group when the group test is unqualified, and the efficiency of the high-efficiency and accurate test is exerted on an automatic test line.
Description
The technical field is as follows:
the invention relates to the field of instruments and meters and electronic measurement, in particular to a multi-element parallel test method for a safety voltage-resistant instrument.
Background art:
along with the rapid development of the electronic measurement industry, the efficiency of the pressure-resistant instrument is particularly important when in use. At present, the multi-channel scanning test and the parallel multi-channel test are more advantageous in the industry, however, the multi-channel scanning test is only performed one by one according to the number of test elements, and even the parallel multi-channel test can only test the maximum number of channels at one time, so that a more convenient and effective method is needed to improve the efficiency.
The invention content is as follows:
the invention aims to overcome the defects of the existing testing method and provide a method which can realize parallel testing, group-mode multi-element simultaneous testing and screening from mode scanning testing.
The multi-element parallel test method for the safety voltage-resistant instrument adopts an safety class voltage-resistant measuring instrument and an external expansion multi-channel scanning box, wherein the safety class voltage-resistant measuring instrument has the functions of alternating current, direct current, insulation resistance and the like. The extended multichannel scan cassette relay switches a multi-port output.
The invention is a testing mode realized by combining the two instruments.
The invention provides a multi-element parallel test method for a safety voltage-withstanding instrument, which comprises the following steps:
(1) connecting an ampere-standard voltage-resistant instrument with an external-expansion multi-channel scanning box;
(2) calculating the current scanning element range according to the number of channels of the scanning box, and controlling the channels to set a program initialization channel;
(3) positioning the current element position, setting a parallel test state, the number of parallel test elements and a scanning channel;
(4) initializing measurement, starting the test and obtaining a test result;
(5) and after the test is finished, initializing the pass state channel and the fail state channel.
Wherein, in the step (1), calculating the current scanning element range specifically includes: determining a test range according to a parallel test set value, and scanning from an initial element to an element range; in the step (2), the setting of the scanning channel specifically includes: clearing SCNBUF, determining the current starting channel value, initializing the scanning box, circularly scanning, writing the channel value of the corresponding position, and preparing the next element position.
The invention has the beneficial effects that: the multi-element parallel test method for the safety voltage-withstanding instrument can efficiently and quickly detect unqualified products, such as 32 elements, in each step of complete test, the time required by single sequential scanning in the conventional test method is the sum of 32 times of single required time, the calculation method and the test mode provided by the invention can divide the 32 elements into 4 groups, the combination lattices of the current test enter the next group, the parallel test is only required for 4 times when the combination lattices are all qualified, the efficiency is greatly improved compared with the efficiency required by single sequential scanning, the combination lattices enter the current group to screen the unqualified products from the test when the group test is unqualified, and the efficiency of the high-efficiency and accurate test is exerted on an automatic test line.
Description of the drawings:
FIG. 1 is a timing diagram of a multi-element parallel test method for a voltage regulator of the present invention.
The specific implementation mode is as follows:
the following detailed description of the preferred embodiments of the present invention, taken in conjunction with the accompanying drawings, will make the advantages and features of the invention more readily understood by those skilled in the art, and thus will more clearly and distinctly define the scope of the invention.
As shown in FIG. 1, which is a timing diagram of a multi-element parallel test method for a voltage regulator, the instrument can be tested in groups, each group has a maximum of 8 elements, and the group is tested in the group. The method comprises the following steps: grouping and testing. Group test: the combination of the group step and the test from the step, a complete group, the whole process of the test, in the figure, the meaning of each word is shown in the following table:
in the following, the box channels 16 are scanned, grouped by 8 elements for example, to realize groups: multi-element parallel measurements were taken from: and (5) scanning, testing and screening.
First, the current scan element range is calculated:
the method comprises the following steps: determining a test range according to a parallel test set value;
single element scanning: scanning from starting element to element range.
Second, the control channel setup program initializes the channels.
The scan channel configuration is set forth in the following table:
| scani | locating a current component position |
| num | Parallel test cycle variable, 1 denotes a single element test |
| multnum | Parallel measurement of components |
| scan_num | The number of channels corresponding to the component is used for generating component channel data |
| scan_data | Scanning channel data, SCNBUF |
| SCNBUF | Channel data BUF for storing channel setting values |
| CHn | Current test element starting channel position |
| SCn | Number of scanning box where current test element is located |
| SN | Number of empty bits of scanning boxArranging component channels |
Setting a channel:
test procedure (no channel control, only high pressure test flow control):
a) measurement initialization
b) Beginning test
c) Obtaining the test results
And (4) test completion treatment:
PASS status channel initialization is shown in the following table:
| a)ms_flag＝＝1？ | qualified status |
| Group test form of Y | |
| 1)scani+＝multnum | And measure qualified shift |
| 2)scani>Total number of elements | The test is ended. |
| Slave test State | |
| 1)scani++ | Shift from test pass |
| 2)scani％multnum＝＝0？ | From the end of the test |
| Y: | |
| 1)ms_flag＝＝1 | Grouped test mode |
| 2)mun＝multnum | Group element number initialization |
| b)scani>Total number of elements | The test is ended. |
FAIL status channel initialization is shown in the following table:
and (5) finishing the test.
The test results are shown in the following table:
the 2,4,8,16 channels are used to align the cassettes, preventing components from crossing both cassettes. The actual channel parameter 2 of the component is the number of data bits occupied by the component.
Finally, it should be noted that: although the present invention has been described in detail with reference to the foregoing embodiments, those skilled in the art will understand that: any person skilled in the art can modify or easily conceive the technical solutions described in the foregoing embodiments or equivalent substitutes for some technical features within the technical scope of the present disclosure; such modifications, changes or substitutions do not depart from the spirit and scope of the embodiments of the present invention, and they should be construed as being included therein. Therefore, the protection scope of the present invention shall be subject to the protection scope of the claims.
Claims (3)
1. A multi-element parallel test method for a safety voltage-resistant instrument is characterized by comprising the following steps:
(1) connecting an ampere-standard voltage-resistant instrument with an external-expansion multi-channel scanning box;
(2) calculating the range of the current scanning element, and controlling a channel setting program to initialize a channel;
(3) positioning the current element position, setting a parallel test state, the number of parallel test elements and a scanning channel;
(4) initializing measurement, starting the test and obtaining a test result;
(5) and after the test is finished, initializing the pass state channel and the fail state channel.
2. The multi-element parallel test method for the safety voltage instrument as claimed in claim 1, wherein in the step (1), the calculating of the current scan element range specifically comprises: and determining a test range according to the parallel test set value, and scanning from the initial element to the element range.
3. The multi-element parallel test method for the safety voltage-withstanding instrument according to claim 1, wherein in the step (2), the setting of the scanning channel specifically comprises: clearing SCNBUF, determining the current starting channel value, initializing the scanning box, circularly scanning, writing the channel value of the corresponding position, and preparing the next element position.
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| CN202011337692.0A CN112363002A (en) | 2020-11-25 | 2020-11-25 | Multi-element parallel test method for safety voltage-resistant instrument |
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| CN202011337692.0A CN112363002A (en) | 2020-11-25 | 2020-11-25 | Multi-element parallel test method for safety voltage-resistant instrument |
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| CN208621691U (en) * | 2017-12-04 | 2019-03-19 | 常州市致新精密电子有限公司 | A kind of power transformer multi-product test macro |
| CN109633417A (en) * | 2019-01-31 | 2019-04-16 | 上海华虹宏力半导体制造有限公司 | Multi-chip is the same as geodesic structure and method |
| CN110018385A (en) * | 2019-05-07 | 2019-07-16 | 深圳市矽电半导体设备有限公司 | It is a kind of it is quick judge multicomponent device electrical connection whether He Ge test method |
| CN110361601A (en) * | 2019-08-02 | 2019-10-22 | 深圳市全洲自动化设备有限公司 | A kind of LCD device pin Electrical Indexes method for rapidly testing |
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2020
- 2020-11-25 CN CN202011337692.0A patent/CN112363002A/en active Pending
Patent Citations (14)
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| US6256760B1 (en) * | 1998-11-13 | 2001-07-03 | Nortel Networks Limited | Automatic test equipment scan test enhancement |
| CN101109785A (en) * | 2007-08-24 | 2008-01-23 | 北京中星微电子有限公司 | Product multiplexed test board for integrated circuit high temperature dynamic aging |
| CN101930041A (en) * | 2010-09-03 | 2010-12-29 | 致茂电子(苏州)有限公司 | High-voltage multi-point testing equipment and method with main and auxiliary steps |
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| CN104459480A (en) * | 2013-09-22 | 2015-03-25 | 珠海格力电器股份有限公司 | Voltage-withstand performance testing method and system for multi-core power line |
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