CN104378167A - Testing method and system - Google Patents
Testing method and system Download PDFInfo
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- CN104378167A CN104378167A CN201310354118.XA CN201310354118A CN104378167A CN 104378167 A CN104378167 A CN 104378167A CN 201310354118 A CN201310354118 A CN 201310354118A CN 104378167 A CN104378167 A CN 104378167A
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B17/00—Monitoring; Testing
- H04B17/10—Monitoring; Testing of transmitters
- H04B17/15—Performance testing
- H04B17/16—Test equipment located at the transmitter
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B17/00—Monitoring; Testing
- H04B17/0082—Monitoring; Testing using service channels; using auxiliary channels
- H04B17/0085—Monitoring; Testing using service channels; using auxiliary channels using test signal generators
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Abstract
The invention discloses a testing method and system. The method includes the steps that M testing devices are connected with the input end of a testing access selection device, and N to-be-tested devices are connected with the output end of the testing access selection device, wherein M is larger than or equal to 1, and N is larger than or equal to 1; then the testing access selection device can select the corresponding testing devices from the M testing devices according to testing access control instructions so as to test the N to-be-tested devices, and in other words, the testing access selection device can be controlled according to the testing access control instructions to automatically select one or more testing devices to test the N to-be-tested devices. Thus, in the testing process, the N to-be-tested devices connected with the testing devices can be tested one or more times by conducting automatic switching through the testing access selection device according to the control instructions instead of manually switching the to-be-tested devices connected with the testing devices, and therefore the testing efficiency of the testing devices can be improved, and meanwhile the testing cost can be reduced.
Description
Technical field
The present invention relates to the communications field, be specifically related to a kind of method of testing and test macro.
Background technology
In the communications field, relate to various test, and in current field tests, often need to use various testing equipment device under test to test, the most frequently used is then test instrumentation.And current test instrumentation once can only connect a Devices to test, need after being completed to change Devices to test, changing Devices to test is all generally manually completed by tester.So just cause test instrumentation could must run when there being people, on one's own time, expensive test instrumentation is completely idle, causes the huge wasting of resources; Also reduce the efficiency of test simultaneously.In order to solve this problem, modal scheme arranges more tester, carries out double-shift work or duty of working in three shifts, thus improve Instrument use efficiency, but this scheme significantly can increase human cost.
Summary of the invention
The main technical problem to be solved in the present invention is, provides a kind of method of testing and test macro, solves the problem that testing efficiency is low, testing cost is high in current test process.
For solving the problems of the technologies described above, the invention provides a kind of test macro, comprising: test control device, test access choice device, a M testing apparatus and N number of test system, described M is more than or equal to 1, and described N is more than or equal to 1; A described M testing apparatus is connected with the input of described test access choice device, described N number of test system is connected with the output of described test access choice device, and the test access control command that described test access choice device is used for sending according to described test control device selects corresponding testing apparatus to test described N number of test system from a described M testing apparatus.
In an embodiment of the present invention, described test macro also comprises power path choice device, and the input of described power path choice device is connected with power supply, and output is connected with described N number of test system; Test system in current test access is connected with described power supply by the power path control command that described power path choice device is used for sending according to described test control device.
In an embodiment of the present invention, described test macro also comprises communication path choice device, and one end of described communication choice device is connected with described test control device, and the other end is connected with described N number of test system; Test system in current test access is connected with described test control device by the communication path control command that described communication path choice device is used for sending according to described test control device.
In an embodiment of the present invention, described test access choice device is selected corresponding testing apparatus to carry out test to described N number of test system according to the test access control command that described test control device sends to be from a described M testing apparatus: described test access choice device selects testing apparatus to test one by one described N number of test system according to described test access control command successively from a described M testing apparatus.
In an embodiment of the present invention, described test access control command comprises the first test access control command and the second test access control command; Described test access choice device is selected testing apparatus to carry out test one by one to described N number of test system according to described test access control command to comprise successively from a described M testing apparatus:
Described test access choice device selects a testing apparatus to test described N number of test system according to described first test access control command from testing apparatus; In test process, after the current testing apparatus carrying out testing often tests a test system, described test access choice device is selected one according to the second test access control command that described test control device sends and is connected with this testing apparatus from remaining test system; After the current testing apparatus carrying out testing is completed described N number of test system, described test access choice device reselects a testing apparatus according to the first test access control command that described test control device sends and tests described N number of test system, until a described M testing apparatus is all tested described N number of testing apparatus from remaining testing apparatus.
In an embodiment of the present invention, test result also for after being completed each test system, is sent to described test control device by described testing apparatus.
In an embodiment of the present invention, described test control device is also for On-board test strategy; Described testing apparatus, also for before testing the test system be attached thereto, obtains Test Strategy from described test control device, then tests the current test system be attached thereto according to this Test Strategy.
In order to solve the problem, the invention also discloses a kind of method of testing, comprising:
Be connected with the input of test access choice device by M testing apparatus, and be connected by the output of N number of test system with test access choice device, described M is more than or equal to 1, and described N is more than or equal to 1;
Described test access choice device selects corresponding testing apparatus to test described N number of test system according to test access control command from a described M testing apparatus.
In an embodiment of the present invention, described test access choice device is selected corresponding testing apparatus to carry out test to described N number of test system according to described test access control command to be from a described M testing apparatus: described test access choice device selects testing apparatus to test one by one described N number of test system according to described test access control command successively from a described M testing apparatus.
In an embodiment of the present invention, described test control device is also for after a described M testing apparatus is all completed one by one to described N number of test system, the all test results received are analyzed, determine the test system needing to retest according to analysis result, and transmission resurveys control command to described test access choice device;
Described test access choice device also selects testing apparatus to test one by one needing the test system retested for control command of resurveying described in basis successively from a described M testing apparatus.
In an embodiment of the present invention, described test access control command comprises the first test access control command and the second test access control command; Described test access choice device is selected testing apparatus to carry out test one by one to described N number of test system according to the test access control command that described test control device sends to comprise successively from a described M testing apparatus:
Described test access choice device selects a testing apparatus to test described N number of test system according to described first test access control command from testing apparatus; In test process, after the current testing apparatus carrying out testing often tests a test system, described test access choice device is selected one according to the second test access control command that described test control device sends and is connected with this testing apparatus from remaining test system; After the current testing apparatus carrying out testing is completed described N number of test system, described test access choice device reselects a testing apparatus according to the first test access control command that described test control device sends and tests described N number of test system, until a described M testing apparatus is all tested described N number of testing apparatus from remaining testing apparatus.
In an embodiment of the present invention, test result, after being completed each test system, is sent to described test control device by testing apparatus;
Described test control device is after a described M testing apparatus is all completed one by one to described N number of test system, the all test results received are analyzed, determine the test system needing to retest according to analysis result, and transmission resurveys control command to described test access choice device;
Described test access choice device according to described in control command of resurveying from a described M testing apparatus, select testing apparatus to test one by one needing the test system that retests successively.
The invention has the beneficial effects as follows:
Method of testing provided by the invention and system, be connected M testing apparatus with the input of test access choice device, and be connected by the output of N number of test system with test access choice device, and M is more than or equal to 1, N and is more than or equal to 1; Then test access choice device can select corresponding testing apparatus to test N number of test system according to test access control command from M testing apparatus, namely the test access choice device in the present invention can, under the control of test access control command, select one or more testing apparatus to test N number of test system automatically.Therefore, in test process, do not need the test system that manual switchover is connected with testing apparatus, but automatically switched according to control command by test access choice device, the test N number of test system be attached thereto all being carried out to one or many can be completed, therefore can improve the testing efficiency of testing apparatus, reduce testing cost simultaneously.
Accompanying drawing explanation
The test system structure schematic diagram one that Fig. 1 provides for an embodiment of the present invention;
The test system structure schematic diagram two that Fig. 2 provides for an embodiment of the present invention;
The test system structure schematic diagram three that Fig. 3 provides for an embodiment of the present invention;
The test system structure schematic diagram four that Fig. 4 provides for an embodiment of the present invention;
Fig. 5 is the structural representation of the integrated setting of each path choice device in this Fig. 4;
The method of testing schematic flow sheet that Fig. 6 provides for an embodiment of the present invention.
Embodiment
By reference to the accompanying drawings the present invention is described in further detail below by embodiment.
Shown in Figure 1, this figure is depicted as a kind of test macro that the present embodiment provides, test control device, test access choice device, a M testing apparatus and N number of test system, and the M in the present embodiment is more than or equal to 1, N and is more than or equal to 1; In the present embodiment, test control device also can be used as test control center, is mainly used in controlling the selection of each path, testing apparatus is to the test of test system and collect the various parameter informations of test system, the various test result of collecting testing apparatus feedback and the various Treatment Analysis etc. of carrying out based on test result.Test access choice device in the present embodiment by pure hardware implementing, also can be realized by software combined with hardware, and it can comprise a control unit, and this control unit is for receiving the control command of test control device transmission thus carrying out corresponding operation.Testing apparatus in the present embodiment can be various test instrumentation, and test system then can be the various Devices to tests of corresponding each middle test instrumentation.Below in conjunction with its concrete annexation of device each in system and control procedure, the present invention will be further described.
In the present embodiment, M testing apparatus is connected with the input of test access choice device, the output of N number of test system with test access choice device is connected, in the present embodiment, the input of test access choice device and the number of passages of output can carry out concrete setting according to factors such as concrete application scenarioss; And the concrete selected of M and N value also can carry out selected setting according to concrete application scenarios in the present embodiment, as long as the value of M is not more than the number of vias of the input of test access choice device, and the value of N is not more than the number of vias of the output of test access choice device; Test access choice device also with test control device, for receiving the test access control command that test control device sends, and from M testing apparatus, select corresponding testing apparatus to test to N number of test system according to this test access control command.Concrete, it can select one or more (being less than M) accordingly to test N number of testing apparatus according to control command from M test instruction, also from M testing apparatus, testing apparatus can be selected one by one, and selected testing apparatus is all tested to N number of testing apparatus.In the present embodiment, when a testing apparatus is tested N number of test system, according to actual conditions, can select to test one by one N number of test system, also can select to test multiple in N number of test system simultaneously.It should be noted that in the present embodiment, to the identification of individual testing apparatus, device under test, specifically by identifying for each device numbering, the identifying information (such as identification information) also by each device self identifies; And the mode obtaining the identifying information of each device can be manually inputted by tester, also can be that each device is reported automatically by corresponding communication link.
In the present embodiment, testing apparatus tests adopted Test Strategy according to actual conditions to each test system, install beforehand is on each testing apparatus or wherein one or more testing apparatuss, and then not preset testing apparatus then can obtain from having preset testing apparatus; Also can direct preset various Test Strategy on test control device, then the testing apparatus carrying out testing by test control device according to current and current by the test system of side, the Test Strategy of correspondence is sent to testing apparatus, also initiatively can ask for Test Strategy to test control device by the current testing apparatus carrying out testing; When being preset on test control device, testing apparatus, before testing the test system be attached thereto, need obtain corresponding Test Strategy to test control device.Only have when testing apparatus detects that its current stored Test Strategy mates with current detected Devices to test, can not need test control device obtains Test Strategy again, can directly test this Devices to test, and after being completed, test result is carried out upload data acquisition center corresponding to value; Test control device can be uploaded in the present embodiment, and can arrange after it does not test a test system, all test result is uploaded to test control device, after test control device receives this test result, current being completed can be learnt, control command need be sent, with switch test path to test access choice device.After all testing apparatuss are all completed all test system, namely test control device carries out follow-up process, analysis according to the test result collected.Certainly, also test result can be concentrated and send to corresponding treatment facility to carry out Treatment Analysis.
For a better understanding of the present invention, from M testing apparatus, select testing apparatus to test one by one N number of test system for test access choice device successively according to the test access control command that test control device sends below to be described, the test access control command that in the present embodiment, test control device sends comprises the first test access control command and the second test access control command; First test access control command is mainly used in selecting testing apparatus, and the second test access control command is then mainly used in selecting test system, concrete to select, test process is as follows:
Test access choice device first selects a testing apparatus to test N number of test system according to the first test access control command from testing apparatus; In the test process of this testing apparatus, after the current testing apparatus carrying out testing often tests a test system, test access choice device is selected one according to the second test access control command that test control device sends and is connected to test with this testing apparatus from remaining test system; After the current testing apparatus carrying out testing is completed N number of test system, test access choice device reselects a testing apparatus according to the first test access control command that test control device sends and tests N number of test system, until M testing apparatus is all tested N number of testing apparatus from remaining testing apparatus.Because each testing apparatus of M is all tested each test system of N, therefore each test system has M test result, carries out the test result that statistical analysis obtains also just more accurate according to M test result.
In order to better control test process, make the test result that obtains more accurate.In the present embodiment, the power supply of each test system also can be controlled by test control device.Shown in Figure 2, the test macro in the present embodiment also can comprise power path choice device, and the input of this power path choice device is connected with power supply, and output is connected with above-mentioned N number of test system; The power path control command that power path choice device sends for receiving test control device, and after receiving this instruction, test system in current test access is connected with described power supply, and the output voltage of this power supply and electric current the control unit of tested person control device or power path choice device self to control, and can adjust for different test system within the specific limits.
Shown in Figure 3, the test macro in the present embodiment also can comprise communication path choice device further, and one end of communication choice device is connected with test control device, and the other end is connected with above-mentioned N number of test system; Test system in current test access is connected with test control device by the communication path control command that communication path choice device is used for sending according to test control device; Test control device can obtain the information such as the various parameters of the test system communicated to connect with it based on this communication path, and sends the parameter of corresponding instruction to this test system by this communication path to test system and arrange, revise etc.
Shown in Figure 4, the test macro in the present embodiment also can comprise display unit further, and this display unit can be used for the content arranging needs display according to application scenarios needs, checks for tester or monitor staff, monitoring examination of being more convenient for.
In the present embodiment, connect by modes such as buses between each device included by test macro.And test access choice device, power path choice device and the communication path choice device accessible site in the present embodiment is arranged to an intelligent multichannel switch, controls each switch module by a control module together, shown in Figure 5; Also can be separated setting separately, in each device, correspondence arranges separately a control unit, to receive the instruction of test control device transmission and then to perform corresponding function to run corresponding program.It should be noted that, in the present embodiment, the input and output terminal of each device can be set to general connectivity port, dissimilar test cable can be connected as required, versatility is good, and the sequential that test control device sends test access control command, power path control command and communication path control command there is no strict restriction, can select to arrange according to concrete application scenarios; Such as, when the second test access control command sent according to test control device be testing apparatus switch a test system time, test control device can send to power path choice device and communication path choice device the correspondence that power path control command and communication path control command carry out power path and communication path respectively and switch.
For a better understanding of the present invention, below in conjunction with above-mentioned test macro, whole test process is described.First to test macro initialization, the output channel of all test system and test access choice device, power path choice device and communication path choice device is connected, all testing equipments are connected with test access choice device input, the input of power path choice device is connected with power supply, and power path choice device is connected with test control device, the input of communication path choice device is connected with test control device; Concrete connection connects by bus; Then tester's configuration software on test control device, comprises the Test Strategy that configuration is corresponding, and starts test; Test control device sends corresponding control command according to configuration and selects a test access, a communication path and a power path, corresponding testing apparatus, test system also just determine, and then testing apparatus starts to test the current test system be attached thereto; After a test system is completed, test data is sent to test control device and preserves by testing apparatus, test control device sends corresponding control command and selects next test access to test access choice device, power path choice device and communication path choice device, communication path and power path, and start to survey next test system; After all Devices to tests are all completed, test control device controls testing apparatus and switches, and is switched to next testing apparatus, until all testing apparatuss are all completed test system; Then test control device carries out analyzing and processing to all test results received, the test system needing to re-start test is determined according to analysis result, such as test result apparent error test system, have the test system etc. of problem, fault according to test result preliminary judgement, all can be judged to be that needs re-start measurement; Now test control device sends and resurveys control command to test access choice device; Test access choice device also for selecting testing apparatus to test one by one needing the test system retested successively from a described M testing apparatus according to the control command of resurveying received; Selecting to test the process passed through according to control command of resurveying can with above-mentioned test process; Such as, test control device can arrange to rearrange repetition measurement to the problematic test system of test result according to control strategy, and preserves the test result retested; The process of repetition measurement can adopt above-mentioned test process.
Be test instrumentation below with testing apparatus, test control device is control centre, test access choice device, power path choice device and communication path choice device gather together and be set to intelligent multichannel switch for example, 6 the present invention is described further by reference to the accompanying drawings, specific as follows:
Step 600: start;
Step 601: test macro software and hardware initialization, M test instrumentation will all be in the manner described above connected with intelligent multichannel switch by bus with N number of test system by hardware aspect, and control centre is connected by bus with intelligent multichannel switch, test instrumentation, software aspect, configuration testing script;
Step 602: intelligent multichannel switch is according to the instruction of control centre, automatically select to be connected with test instrumentation j that (j is more than or equal to 1 at input, be less than or equal to M), output is selected to be connected (i<N) with test system i automatically, under default situations, after initialization, j=1, i=1, also can select other to configure; Intelligent multichannel switch also can select corresponding communication path and power path simultaneously;
Step 603: test instrumentation j tests test system i, Test Strategy (or content) is by the Script controlling of control centre, and the power supply of test system is provided by supply access, and power supply size is adjustable, and communication is provided by communication channel;
Step 604: after the test of test instrumentation j to test system i completes, control centre preserves test data;
Step 605: control centre sends the second test access control command, and the output of intelligent multichannel switching device is automatically switched to next test system, programming i=i+1; Transmission communication path control command and power path control command carry out the carrying out of communication path and power path simultaneously;
Step 606: judge whether i is less than or equal to N, in this way, go to step 603, otherwise go to step 607;
Step 607: i=1 is set, j=j+1;
Step 608: judge whether j is less than or equal to M, in this way, device step 609; Otherwise, go to step 610;
Step 609: the input that control centre controls intelligent multichannel switching device is switched to test instrumentation j, then goes to step 603;
Step 610: test terminates.
Visible, test macro provided by the invention and testing apparatus, can under the prerequisite not increasing human cost, by coordinating control software design on existing various testing apparatus, the automation of testing equipment long-time continuous is tested, significantly improves the service efficiency of testing apparatus.Be particularly suitable for research and development test and debugging field, also may be used for large-scale batch testing simultaneously.
Above content is in conjunction with concrete execution mode further description made for the present invention, can not assert that specific embodiment of the invention is confined to these explanations.For general technical staff of the technical field of the invention, without departing from the inventive concept of the premise, some simple deduction or replace can also be made, all should be considered as belonging to protection scope of the present invention.
Claims (12)
1. a test macro, is characterized in that comprising: test control device, test access choice device, a M testing apparatus and N number of test system, and described M is more than or equal to 1, and described N is more than or equal to 1; A described M testing apparatus is connected with the input of described test access choice device, described N number of test system is connected with the output of described test access choice device, and the test access control command that described test access choice device is used for sending according to described test control device selects corresponding testing apparatus to test described N number of test system from a described M testing apparatus.
2. test macro as claimed in claim 1, it is characterized in that, described test macro also comprises power path choice device, and the input of described power path choice device is connected with power supply, and output is connected with described N number of test system; Test system in current test access is connected with described power supply by the power path control command that described power path choice device is used for sending according to described test control device.
3. test macro as claimed in claim 1, it is characterized in that, described test macro also comprises communication path choice device, and one end of described communication choice device is connected with described test control device, and the other end is connected with described N number of test system; Test system in current test access is connected with described test control device by the communication path control command that described communication path choice device is used for sending according to described test control device.
4. the test macro as described in any one of claim 1-3, it is characterized in that, described test access choice device is selected corresponding testing apparatus to carry out test to described N number of test system according to the test access control command that described test control device sends to be from a described M testing apparatus: described test access choice device selects testing apparatus to test one by one described N number of test system according to described test access control command successively from a described M testing apparatus.
5. test macro as claimed in claim 4, it is characterized in that, described test access control command comprises the first test access control command and the second test access control command; Described test access choice device is selected testing apparatus to carry out test one by one to described N number of test system according to described test access control command to comprise successively from a described M testing apparatus:
Described test access choice device selects a testing apparatus to test described N number of test system according to described first test access control command from testing apparatus; In test process, after the current testing apparatus carrying out testing often tests a test system, described test access choice device is selected one according to the second test access control command that described test control device sends and is connected with this testing apparatus from remaining test system; After the current testing apparatus carrying out testing is completed described N number of test system, described test access choice device reselects a testing apparatus according to the first test access control command that described test control device sends and tests described N number of test system, until a described M testing apparatus is all tested described N number of testing apparatus from remaining testing apparatus.
6. test macro as claimed in claim 4, it is characterized in that, test result also for after being completed each test system, is sent to described test control device by described testing apparatus.
7. test macro as claimed in claim 5, it is characterized in that, described test control device is also for On-board test strategy; Described testing apparatus, also for before testing the test system be attached thereto, obtains Test Strategy from described test control device, then tests the current test system be attached thereto according to this Test Strategy.
8. test macro as claimed in claim 6, it is characterized in that, described test control device is also for after a described M testing apparatus is all completed one by one to described N number of test system, the all test results received are analyzed, determine the test system needing to retest according to analysis result, and transmission resurveys control command to described test access choice device;
Described test access choice device also selects testing apparatus to test one by one needing the test system retested for control command of resurveying described in basis successively from a described M testing apparatus.
9. a method of testing, is characterized in that comprising:
Be connected with the input of test access choice device by M testing apparatus, and be connected by the output of N number of test system with test access choice device, described M is more than or equal to 1, and described N is more than or equal to 1;
Described test access choice device selects corresponding testing apparatus to test described N number of test system according to the test access control command that test control device sends from a described M testing apparatus.
10. method of testing as claimed in claim 9, it is characterized in that, described test access choice device is selected corresponding testing apparatus to carry out test to described N number of test system according to described test access control command to be from a described M testing apparatus: described test access choice device selects testing apparatus to test one by one described N number of test system according to described test access control command successively from a described M testing apparatus.
11. method of testings as claimed in claim 10, is characterized in that, described test access control command comprises the first test access control command and the second test access control command; Described test access choice device is selected testing apparatus to carry out test one by one to described N number of test system according to described test access control command to comprise successively from a described M testing apparatus:
Described test access choice device selects a testing apparatus to test described N number of test system according to described first test access control command from testing apparatus; In test process, after the current testing apparatus carrying out testing often tests a test system, described test access choice device is selected one according to the second test access control command that described test control device sends and is connected with this testing apparatus from remaining test system; After the current testing apparatus carrying out testing is completed described N number of test system, described test access choice device reselects a testing apparatus according to the first test access control command that described test control device sends and tests described N number of test system, until a described M testing apparatus is all tested described N number of testing apparatus from remaining testing apparatus.
12. method of testings as claimed in claim 10, it is characterized in that, described method also comprises:
Test result, after being completed each test system, is sent to described test control device by testing apparatus;
Described test control device is after a described M testing apparatus is all completed one by one to described N number of test system, the all test results received are analyzed, determine the test system needing to retest according to analysis result, and transmission resurveys control command to described test access choice device;
Described test access choice device according to described in control command of resurveying from a described M testing apparatus, select testing apparatus to test one by one needing the test system that retests successively.
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| CN201310354118.XA CN104378167A (en) | 2013-08-14 | 2013-08-14 | Testing method and system |
| PCT/CN2014/071113 WO2014134984A1 (en) | 2013-08-14 | 2014-01-22 | Test method and system |
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| CN201310354118.XA CN104378167A (en) | 2013-08-14 | 2013-08-14 | Testing method and system |
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