WO2014134984A1 - Test method and system - Google Patents
Test method and system Download PDFInfo
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- WO2014134984A1 WO2014134984A1 PCT/CN2014/071113 CN2014071113W WO2014134984A1 WO 2014134984 A1 WO2014134984 A1 WO 2014134984A1 CN 2014071113 W CN2014071113 W CN 2014071113W WO 2014134984 A1 WO2014134984 A1 WO 2014134984A1
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B17/00—Monitoring; Testing
- H04B17/10—Monitoring; Testing of transmitters
- H04B17/15—Performance testing
- H04B17/16—Test equipment located at the transmitter
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B17/00—Monitoring; Testing
- H04B17/0082—Monitoring; Testing using service channels; using auxiliary channels
- H04B17/0085—Monitoring; Testing using service channels; using auxiliary channels using test signal generators
Definitions
- the present invention relates to the field of communications, and in particular, to a test method and a test system.
- various tests are involved, and in the current testing field, it is often necessary to use various test equipments to test the devices to be tested, and the most commonly used is test instruments.
- the current test instrument can only be connected to one device to be tested at a time. After the test is completed, the device to be tested needs to be replaced. The device to be tested is usually manually completed by the tester. This causes the test instrument to be run in the presence of someone. In the off-hours, the expensive test instrument is completely idle, resulting in a huge waste of resources; it also reduces the efficiency of the test.
- the main technical problem to be solved by the embodiments of the present invention is to provide a test method and a test system, which solve the problems of low test efficiency and high test cost in the current test process.
- an embodiment of the present invention provides a test system, including: a test control device, a test path selection device, M test devices, and N devices to be tested, wherein the M is greater than or equal to 1, and the N is greater than or equal to 1; the M test devices are connected to an input end of the test path selecting device, the N test devices are connected to an output end of the test path selecting device, and the test path selecting device is configured to The test path control command sent by the test control device selects a corresponding test device from the M test devices to test the N test devices.
- the test system further includes a power path selection device, wherein an input end of the power path selection device is connected to a power source, and an output end is connected to the N devices to be tested;
- the selecting means is configured to connect the device under test in the current test path to the power source according to the power path control command sent by the test control device.
- the test system further includes a communication path selecting device, one end of the communication selecting device is connected to the test control device, and the other end is connected to the N devices to be tested; Communication
- the path selecting means is configured to connect the device under test in the current test path to the test control device according to the communication path control command sent by the test control device.
- the test path selection device selects a corresponding test device from the M test devices according to a test path control command sent by the test control device to perform the N test devices.
- the test is: the test path selecting device sequentially selects the test device from the M test devices according to the test path control instruction, and tests the N test devices one by one.
- the test path control instruction includes a first test path control instruction and a second test path control instruction; the test path selection means sequentially sequentially from the M according to the test path control instruction Selecting the test device in the test device to test the N devices to be tested one by one includes: the test path selecting device selects one test device from the test device according to the first test path control instruction to the N devices to be tested Performing a test; during the test, the test device currently performing the test, after each test device is tested, the test path selection device is based on the second test path control command sent by the test control device from the remaining device under test Selecting one of the connection with the test device; after the test device currently performing the test tests the N devices to be tested, the test path selection device is based on the first test path control command sent by the test control device Re-selecting a test device in the test device to test the N devices under test, M to the test apparatus are of the N test apparatus were tested.
- the testing device is further configured to send the test result to the test control device after testing each device to be tested.
- the test control device is further configured to store a test strategy; the test device is further configured to acquire a test from the test control device before testing the device to be tested connected thereto The policy is then tested against the device under test to which it is currently connected according to the test strategy.
- a testing method including: connecting M test devices to an input end of a test path selecting device, and connecting N test devices to an output end of the test path selecting device.
- the M is greater than or equal to 1, and the N is greater than or equal to 1; the test path selection device selects a corresponding test device from the M test devices according to a test path control instruction to test the N devices to be tested.
- the test path selection device selects a corresponding test device from the M test devices according to the test path control instruction to test the N devices to be tested as: Measurement
- the test path selecting means sequentially selects the test device from the M test devices according to the test path control instruction to test the N test devices one by one.
- the test control device is further configured to analyze all the test results received after the M test devices test the N test devices one by one, according to The analysis result determines a device to be tested that needs to be retested, and sends a retest control command to the test path selection device; the test path selection device is further configured to sequentially sequentially from the M test devices according to the retest control command The test device is selected to test the devices to be tested that need to be retested one by one.
- the test path control instruction includes a first test path control instruction and a second test path control instruction; the test path selection device sequentially according to the test path control instruction sent by the test control device Selecting the test device from the M test devices to test the N test devices one by one includes: the test path selection device selects one test device from the test device according to the first test path control instruction N test devices are tested; during the test process, after the test device currently being tested, after each test device is tested, the test path selection device is left in accordance with the second test path control command sent by the test control device Selecting one of the devices to be tested is connected to the test device; after the test device currently performing the test tests the N devices to be tested, the test path selecting device is configured according to the first test path sent by the test control device Controlling instructions to reselect a test device from the remaining test devices to the N to The test device is tested until the N test devices have tested the N test devices.
- the testing device sends the test result to the test control device after testing each device to be tested; the test control device is in the M test devices After the N test devices are tested one by one, all the test results received are analyzed, the device to be tested that needs to be retested is determined according to the analysis result, and a retest control command is sent to the test path selecting device; The selecting device sequentially selects the testing device from the M testing devices according to the retesting control command, and tests the device to be tested that needs to be retested one by one.
- the beneficial effects of the embodiments of the present invention are:
- the testing method and system provided by the embodiments of the present invention connect the M test devices to the input end of the test path selecting device, and output the N test devices and the test path selecting device Connection, M is greater than or equal to 1, N is greater than or equal to 1; then the test path selection device can select from M test devices according to the test path control command
- the corresponding test device tests the N devices to be tested, that is, the test path selection device in the embodiment of the present invention can automatically select one or more test devices to test the N devices under test under the control of the test path control command. .
- FIG. 1 is a schematic structural diagram 1 of a test system according to an embodiment of the present invention
- FIG. 2 is a schematic structural diagram 2 of a test system according to an embodiment of the present invention
- FIG. 3 is a test system according to an embodiment of the present invention
- FIG. 4 is a schematic structural diagram of a test system according to an embodiment of the present invention
- FIG. 5 is a schematic structural diagram of an integrated arrangement of each path selection device in FIG. 4;
- FIG. 6 is a test diagram of an embodiment of the present invention.
- Method flow diagram DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS
- FIG. 1 the figure shows a test system, a test control device, a test path selection device, M test devices, and N devices to be tested.
- the M in this embodiment is greater than or equal to 1, N is greater than or equal to 1;
- the test control device can also be used as a test control center, mainly for controlling the selection of each path, testing the device to be tested, collecting various parameter information of the device to be tested, and collecting Various test results fed back by the test device, various processing analysis based on the test results, and the like.
- the test path selection device in this embodiment may be implemented by pure hardware, or may be implemented by software in combination with hardware, and may include a control unit for receiving a control command sent by the test control device to perform a corresponding operation.
- the test device in this embodiment may be various test instruments, and the device to be tested may be various devices to be tested corresponding to the respective test instruments.
- the M test devices are connected to the input end of the test path selection device, and the N test devices are connected to the output end of the test path selection device.
- the input end and the output of the test path selection device are tested.
- the number of channels in the end may be specifically set according to specific application scenarios and the like; and the specific selection of the M and N values in the embodiment may also be selected according to specific application scenarios, as long as the value of M is not greater than the test.
- the number of paths at the input end of the path selection device, and the value of N is not greater than the number of channels at the output of the test path selection device; the test path selection device and the test control device are configured to receive test path control commands sent by the test control device, And selecting the corresponding test device from the M test devices according to the test path control instruction to test the N test devices.
- the test device can be selected from the M test devices by selecting one or more (less than M) corresponding to the control command, or the test device can be selected one by one from the M test devices, and the selected device is selected.
- the test device tests all of the N test devices.
- the N devices to be tested when a test device tests N devices to be tested, according to actual conditions, the N devices to be tested may be tested one by one, or multiple of the N devices to be tested may be simultaneously tested.
- the identification of the test device and the device to be tested may be specifically identified by each device number, or may be identified by identification information (such as identification information) of each device; The identification information of the device may be manually input by the tester, or the devices may be automatically reported through the corresponding communication link.
- the test strategy used by the testing device to test each device to be tested may be preset on each test device or one or more of the test devices according to actual conditions, and then the test device is not preset.
- test control device It can be obtained from a preset test device; or various test strategies can be preset directly on the test control device, and then the test control device will respond according to the test device currently being tested and the device to be tested currently on the side.
- the test strategy is sent to the test device, and the test device currently being tested can actively request the test strategy from the test control device; when preset on the test control device, the test device is tested on the device to be tested connected thereto, The corresponding test strategy needs to be obtained on the test control device. Only when the test device detects that the currently stored test strategy matches the currently tested device under test, the test device may be re-acquired without testing the test device, and the device to be tested may be directly tested, and the test is completed.
- the test result is uploaded to the data collection center corresponding to the uploaded value; in this embodiment, the test control device can be uploaded to the test control device, and the test result can be uploaded to the test control device after the test device is not tested.
- the device can know that the current test is completed, and sends a control command to the test path selection device to switch the test path.
- the test control device performs subsequent processing and analysis based on the collected test results.
- the test results can also be sent to the corresponding processing device for processing analysis.
- the test path selection device sequentially selects the test device from the M test devices according to the test path control command sent by the test control device, and the N test devices are tested one by one as an example.
- the test path control instruction sent by the test control device in this embodiment includes a first test path control instruction and a second test path control instruction; the first test path control instruction is mainly used to select the test device, and the second test path control instruction is mainly
- the specific selection and testing process is as follows: The test path selection device first selects one test device from the test device according to the first test path control command to test the N devices to be tested; the test process in the test device Medium, the test device currently being tested After each test device is tested, the test path selection device selects one of the remaining devices under test to be connected to the test device for testing according to the second test path control command sent by the test control device; the test device currently performing the test After testing the N devices to be tested, the test path selecting device reselects one test device from
- each test device Since each of the M test devices tests the N devices to be tested, each test device has M test results, and the test results obtained by statistical analysis based on the M test results are more accurate. In order to better control the test process, the test results obtained are more accurate.
- the power supply of each device to be tested can also be controlled by the test control device. Referring to FIG.
- the test system in this embodiment may further include a power path selection device, wherein the input end of the power path selection device is connected to the power source, and the output end is connected to the N devices to be tested; Receiving a power path control command sent by the test control device, and after receiving the command, connecting the device under test in the current test path to the power source, and the output voltage and current of the power source are test control devices or The control unit of the power path selection device itself can be adjusted for different devices to be tested within a certain range.
- the test system in this embodiment may further include a communication path selecting device. One end of the communication selecting device is connected to the test control device, and the other end is connected to the N devices to be tested. The communication path selecting device is used.
- the test control device may acquire information such as various parameters of the device to be tested connected to the communication device based on the communication path, And sending, by the communication path, a corresponding instruction to the device under test to set, modify, and the like of the parameter of the device to be tested.
- the test system in this embodiment may further include a display device, where the display device may be configured to set content to be displayed according to an application scenario, for the tester or the monitoring personnel to view, and more convenient to monitor the test.
- the devices included in the test system can be connected by a bus or the like.
- the test path selecting device, the power path selecting device and the communication path selecting device in the embodiment can be integrated into an intelligent multi-way switch, and each switch module is controlled by a control module, as shown in FIG. 5; Separate settings are provided, and a control unit is separately provided in each device to receive the command sent by the test control device to execute the corresponding function by running the corresponding program.
- the input and output terminals of each device can be set as a universal connection port, and different types of test cables can be connected as needed, and the versatility is good, and the test control device sends the test path control command and the power supply.
- the timing of the path control command and the communication path control command is not strictly limited, and the setting may be selected according to a specific application scenario; for example, when the device under test is switched according to the second test path control command sent by the test control device, the test is performed.
- Control device The power path selection means and the communication path selecting means respectively transmit a power path control command and a communication path control command to perform switching of the power path and the communication path.
- test system is initialized, and all the devices to be tested are connected with the output paths of the test path selection device, the power path selection device, and the communication path selection device, and all the test devices are connected with the input of the test path selection device, and the power path is connected.
- the input end of the selection device is connected to the power source, and the power path selection device is connected to the test control device, and the input end of the communication path selection device is connected to the test control device; the specific connection can be connected through the bus; then the tester is on the test control device
- the configuration software includes configuring a corresponding test strategy and starting the test; the test control device sends a corresponding control command according to the configuration to select a test path, a communication path and a power path, and the corresponding test device and the device to be tested are also determined.
- the testing device starts to test the device to be tested that is currently connected thereto; when the device to be tested is tested, the testing device transmits the test data to the test control device for saving, and the test control device sends a corresponding control command to the test.
- the path selection device, the power path selection device, and the communication path selection device select the next test path, the communication path and the power path, and start measuring a device to be tested; when all the devices to be tested are tested, the test device controls the test device Switching, switching to the next test device, until all test devices are tested by the test device; then the test control device analyzes all the test results received, and determines the device to be tested that needs to be retested based on the analysis result.
- test control device sends the retest control command to the test path selection.
- the test path selection device is further configured to sequentially select a test device from the M test devices according to the received retest control command to test the devices to be tested that need to be retested one by one; and select the test according to the retest control command.
- the test control device may arrange for the device under test to have a problem with the test result to rearrange the retest according to the control strategy, and save the test result of the retest; the process of the retest may adopt the above test process.
- the test device as the test instrument
- the test control device as the control center
- the test path selection device, the power path selection device, and the communication path selection device are collectively set as an intelligent multiplexer as an example, and the embodiment of the present invention is made with reference to FIG.
- Step 600 Start;
- Step 601 Test system software and hardware initialization, hardware aspects, M test instruments and N devices to be tested are connected to the intelligent multi-way switch through the bus according to the above manner, and
- the control center is connected to the intelligent multi-way switch and the test instrument through the bus, and the software is configured to configure the test script;
- Step 602 The intelligent multi-way switch automatically selects and connects with the test instrument j at the input end according to the instruction of the control center (j is greater than or equal to 1, less than or equal to M), and the output terminal automatically selects to connect with the device to be tested i (i ⁇ N),
- the intelligent multi-way switch will also select the corresponding communication path and power path;
- Step 603 Test instrument j to test device i,
- the test strategy (or content) is controlled by the script of the control center, the power supply of the device to be tested is provided by the power supply
- Step 605 The control center issues a second test path control command to automatically switch the output of the intelligent multiplexer device to the next device to be tested, and the program sets 1 +1; simultaneously sends the communication path control command and the power path
- the control command performs the communication path and the power path;
- Step 606 Determine whether i is less than or equal to N, and if yes, go to step 603 Otherwise, go to step 607;
- Step 608 Determine whether j is less than or equal to M, if yes, device step 609; otherwise, go to step 610;
- Step 609 Control Center Control Intelligence
- the input of the multiplexer is switched to the test meter "', and then proceeds to step 603;
- Step 610 The test ends.
- test system and the test device provided by the embodiments of the present invention can continuously and automatically test the test equipment for a long time by using the control software on various existing test devices without increasing the labor cost.
- the efficiency of the test device It is especially suitable for R&D testing and debugging, and can also be used for large-scale batch testing.
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Abstract
Disclosed are a test method and system. The method comprises: M test devices are connected to the input terminal of a test channel selecting device, and N devices to be tested are connected to the output terminal of the test channel selecting device, wherein M is greater than or equal to 1, and N is greater than or equal to 1; and the test channel selecting device can select, according to a test channel control instruction, the corresponding test device from the M test devices to test the N devices to be tested. Under the control of a test channel control command, the test channel selecting device in the present invention can automatically select one or more test devices to test the N devices to be tested. During the process of a test, there is no need to manually switch the device to be tested which is connected to the test device. Automatically switch is performed according to the control command by the test channel selecting device, and one or more tests can be performed to the N devices to be tested which are connected to the test channel selecting device. Thus the testing efficiency of the test device can be increased and the test cost can be reduced in the present invention.
Description
一种测试方法及系统 技术领域 本发明涉及通信领域， 具体涉及一种测试方法及测试系统。 背景技术 在通信领域， 涉及各种测试， 而在目前的测试领域中， 经常需要使用各种测试设 备对待测设备进行测试， 而最常用的则是测试仪表。 而目前的测试仪表一次只能连接 一个待测设备， 测试完毕后需要更换待测设备， 更换待测设备一般都是由测试人员手 动完成。 这样就造成测试仪表必须在有人的情况下才能运行， 在非工作时间， 昂贵的 测试仪表完全闲置， 造成了巨大的资源浪费； 同时也降低了测试的效率。 为了解决该 问题， 最常见的方案是安排更多的测试人员， 实行两班倒或者三班倒工作制， 从而提 高仪表使用效率， 但这种方案会大幅增加人力成本。 发明内容 本发明实施例要解决的主要技术问题是， 提供一种测试方法及测试系统， 解决目 前测试过程中的测试效率低、 测试成本高的问题。 为解决上述技术问题， 本发明实施例提供一种测试系统,包括： 测试控制装置、 测 试通路选择装置、 M个测试装置以及 N个待测装置， 所述 M大于等于 1， 所述 N大 于等于 1 ; 所述 M个测试装置与所述测试通路选择装置的输入端连接， 所述 N个待测 装置与所述测试通路选择装置的输出端连接， 所述测试通路选择装置用于根据所述测 试控制装置发送的测试通路控制指令从所述 M 个测试装置中选择相应的测试装置对 所述 N个待测装置进行测试。 在本发明的一种实施例中， 所述测试系统还包括电源通路选择装置， 所述电源通 路选择装置的输入端与电源连接， 输出端与所述 N个待测装置连接； 所述电源通路选 择装置用于根据所述测试控制装置发送的电源通路控制指令将当前测试通路中的待测 装置与所述电源连接。 在本发明的一种实施例中， 所述测试系统还包括通信通路选择装置， 所述通信选 择装置的一端与所述测试控制装置连接， 另一端与所述 N个待测装置连接； 所述通信
通路选择装置用于根据所述测试控制装置发送的通信通路控制命令将当前测试通路中 的待测装置与所述测试控制装置连接。 在本发明的一种实施例中， 所述测试通路选择装置根据所述测试控制装置发送的 测试通路控制指令从所述 M个测试装置中选择相应的测试装置对所述 N个待测装置 进行测试为：所述测试通路选择装置根据所述测试通路控制指令依次从所述 M个测试 装置中选择测试装置对所述 N个待测装置逐个进行测试。 在本发明的一种实施例中， 所述测试通路控制指令包括第一测试通路控制指令和 第二测试通路控制指令； 所述测试通路选择装置根据所述测试通路控制指令依次从所 述 M个测试装置中选择测试装置对所述 N个待测装置逐个进行测试包括： 所述测试通路选择装置根据所述第一测试通路控制指令从测试装置中选择一个测 试装置对所述 N个待测装置进行测试； 在测试过程中， 当前进行测试的测试装置每测 试完一个待测装置后， 所述测试通路选择装置根据所述测试控制装置发送的第二测试 通路控制指令从剩下的待测装置中选择一个与该测试装置连接； 当前进行测试的测试 装置对所述 N个待测装置测试完毕后， 所述测试通路选择装置根据所述测试控制装置 发送的第一测试通路控制指令从剩下的测试装置中重新选择一个测试装置对所述 N个 待测装置进行测试， 直到所述 M个测试装置都对所述 N个测试装置进行了测试。 TECHNICAL FIELD The present invention relates to the field of communications, and in particular, to a test method and a test system. BACKGROUND OF THE INVENTION In the field of communications, various tests are involved, and in the current testing field, it is often necessary to use various test equipments to test the devices to be tested, and the most commonly used is test instruments. The current test instrument can only be connected to one device to be tested at a time. After the test is completed, the device to be tested needs to be replaced. The device to be tested is usually manually completed by the tester. This causes the test instrument to be run in the presence of someone. In the off-hours, the expensive test instrument is completely idle, resulting in a huge waste of resources; it also reduces the efficiency of the test. In order to solve this problem, the most common solution is to arrange more testers and implement two shifts or three shifts to improve the efficiency of meter use, but this kind of scheme will greatly increase labor costs. SUMMARY OF THE INVENTION The main technical problem to be solved by the embodiments of the present invention is to provide a test method and a test system, which solve the problems of low test efficiency and high test cost in the current test process. In order to solve the above technical problem, an embodiment of the present invention provides a test system, including: a test control device, a test path selection device, M test devices, and N devices to be tested, wherein the M is greater than or equal to 1, and the N is greater than or equal to 1; the M test devices are connected to an input end of the test path selecting device, the N test devices are connected to an output end of the test path selecting device, and the test path selecting device is configured to The test path control command sent by the test control device selects a corresponding test device from the M test devices to test the N test devices. In an embodiment of the present invention, the test system further includes a power path selection device, wherein an input end of the power path selection device is connected to a power source, and an output end is connected to the N devices to be tested; The selecting means is configured to connect the device under test in the current test path to the power source according to the power path control command sent by the test control device. In an embodiment of the present invention, the test system further includes a communication path selecting device, one end of the communication selecting device is connected to the test control device, and the other end is connected to the N devices to be tested; Communication The path selecting means is configured to connect the device under test in the current test path to the test control device according to the communication path control command sent by the test control device. In an embodiment of the present invention, the test path selection device selects a corresponding test device from the M test devices according to a test path control command sent by the test control device to perform the N test devices. The test is: the test path selecting device sequentially selects the test device from the M test devices according to the test path control instruction, and tests the N test devices one by one. In an embodiment of the present invention, the test path control instruction includes a first test path control instruction and a second test path control instruction; the test path selection means sequentially sequentially from the M according to the test path control instruction Selecting the test device in the test device to test the N devices to be tested one by one includes: the test path selecting device selects one test device from the test device according to the first test path control instruction to the N devices to be tested Performing a test; during the test, the test device currently performing the test, after each test device is tested, the test path selection device is based on the second test path control command sent by the test control device from the remaining device under test Selecting one of the connection with the test device; after the test device currently performing the test tests the N devices to be tested, the test path selection device is based on the first test path control command sent by the test control device Re-selecting a test device in the test device to test the N devices under test, M to the test apparatus are of the N test apparatus were tested.
在本发明的一种实施例中， 所述测试装置还用于在对每个待测装置测试完毕后， 将测试结果发送给所述测试控制装置。 在本发明的一种实施例中， 所述测试控制装置还用于存储测试策略； 所述测试装 置还用于在对与之连接的待测装置进行测试之前，从所述测试控制装置获取测试策略， 然后根据该测试策略对当前与之连接的待测装置进行测试。 为了解决上述问题， 本发明实施例还公开了 一种测试方法， 包括： 将 M个测试装置与测试通路选择装置的输入端连接， 并将 N个待测装置与测试 通路选择装置的输出端连接， 所述 M大于等于 1， 所述 N大于等于 1 ; 所述测试通路选择装置根据测试通路控制指令从所述 M 个测试装置中选择相应 的测试装置对所述 N个待测装置进行测试。 在本发明的一种实施例中， 所述测试通路选择装置根据所述测试通路控制指令从 所述 M个测试装置中选择相应的测试装置对所述 N个待测装置进行测试为： 所述测
试通路选择装置根据所述测试通路控制指令依次从所述 M 个测试装置中选择测试装 置对所述 N个待测装置逐个进行测试。 在本发明的一种实施例中，所述测试控制装置还用于在所述 M个测试装置都对所 述 N个待测装置逐个测试完毕后， 对接收到的所有测试结果进行分析， 根据分析结果 确定需要重新测试的待测装置， 并发送重测控制指令给所述测试通路选择装置； 所述测试通路选择装置还用于根据所述重测控制指令依次从所述 M 个测试装置 中选择测试装置对需要重新测试的待测装置逐个进行测试。 在本发明的一种实施例中， 所述测试通路控制指令包括第一测试通路控制指令和 第二测试通路控制指令； 所述测试通路选择装置根据所述测试控制装置发送的测试通 路控制指令依次从所述 M个测试装置中选择测试装置对所述 N个待测装置逐个进行 测试包括： 所述测试通路选择装置根据所述第一测试通路控制指令从测试装置中选择一个测 试装置对所述 N个待测装置进行测试； 在测试过程中， 当前进行测试的测试装置每测 试完一个待测装置后， 所述测试通路选择装置根据所述测试控制装置发送的第二测试 通路控制指令从剩下的待测装置中选择一个与该测试装置连接； 当前进行测试的测试 装置对所述 N个待测装置测试完毕后， 所述测试通路选择装置根据所述测试控制装置 发送的第一测试通路控制指令从剩下的测试装置中重新选择一个测试装置对所述 N个 待测装置进行测试， 直到所述 M个测试装置都对所述 N个测试装置进行了测试。 In an embodiment of the invention, the testing device is further configured to send the test result to the test control device after testing each device to be tested. In an embodiment of the invention, the test control device is further configured to store a test strategy; the test device is further configured to acquire a test from the test control device before testing the device to be tested connected thereto The policy is then tested against the device under test to which it is currently connected according to the test strategy. In order to solve the above problem, an embodiment of the present invention further discloses a testing method, including: connecting M test devices to an input end of a test path selecting device, and connecting N test devices to an output end of the test path selecting device. The M is greater than or equal to 1, and the N is greater than or equal to 1; the test path selection device selects a corresponding test device from the M test devices according to a test path control instruction to test the N devices to be tested. In an embodiment of the present invention, the test path selection device selects a corresponding test device from the M test devices according to the test path control instruction to test the N devices to be tested as: Measurement The test path selecting means sequentially selects the test device from the M test devices according to the test path control instruction to test the N test devices one by one. In an embodiment of the present invention, the test control device is further configured to analyze all the test results received after the M test devices test the N test devices one by one, according to The analysis result determines a device to be tested that needs to be retested, and sends a retest control command to the test path selection device; the test path selection device is further configured to sequentially sequentially from the M test devices according to the retest control command The test device is selected to test the devices to be tested that need to be retested one by one. In an embodiment of the invention, the test path control instruction includes a first test path control instruction and a second test path control instruction; the test path selection device sequentially according to the test path control instruction sent by the test control device Selecting the test device from the M test devices to test the N test devices one by one includes: the test path selection device selects one test device from the test device according to the first test path control instruction N test devices are tested; during the test process, after the test device currently being tested, after each test device is tested, the test path selection device is left in accordance with the second test path control command sent by the test control device Selecting one of the devices to be tested is connected to the test device; after the test device currently performing the test tests the N devices to be tested, the test path selecting device is configured according to the first test path sent by the test control device Controlling instructions to reselect a test device from the remaining test devices to the N to The test device is tested until the N test devices have tested the N test devices.
在本发明的一种实施例中， 测试装置在对每个待测装置测试完毕后， 将测试结果 发送给所述测试控制装置； 所述测试控制装置在所述 M个测试装置都对所述 N个待测装置逐个测试完毕后， 对接收到的所有测试结果进行分析， 根据分析结果确定需要重新测试的待测装置， 并 发送重测控制指令给所述测试通路选择装置； 所述测试通路选择装置根据所述重测控制指令依次从所述 M 个测试装置中选择 测试装置对需要重新测试的待测装置逐个进行测试。 本发明实施例的有益效果是： 本发明实施例提供的测试方法及系统，将 M个测试装置与测试通路选择装置的输 入端连接， 并将 N个待测装置与测试通路选择装置的输出端连接， M大于等于 1， N 大于等于 1 ; 然后测试通路选择装置可根据测试通路控制指令从 M个测试装置中选择
相应的测试装置对 N个待测装置进行测试， 即本发明实施例中的测试通路选择装置可 在测试通路控制命令的控制下， 自动选择一个或多个测试装置对 N个待测装置进行测 试。 因此， 在测试过程中， 不需要手动切换与测试装置连接的待测装置， 而是由测试 通路选择装置根据控制命令进行自动切换， 即可完成对与之连接的 N个待测装置都进 行一次或多次的测试， 因此可提高测试装置的测试效率， 同时降低测试成本。 附图说明 图 1为本发明一种实施例提供的测试系统结构示意图一； 图 2为本发明一种实施例提供的测试系统结构示意图二； 图 3为本发明一种实施例提供的测试系统结构示意图三； 图 4为本发明一种实施例提供的测试系统结构示意图四； 图 5为本图 4中各通路选择装置集成设置的结构示意图； 图 6为本发明一种实施例提供的测试方法流程示意图。 具体实施方式 下面通过具体实施方式结合附图对本发明实施例作进一步详细说明。 请参见图 1所示， 该图所示为本实施例提供的一种测试系统，测试控制装置、 测试 通路选择装置、 M个测试装置以及 N个待测装置， 本实施例中的 M大于等于 1， N 大于等于 1 ; 本实施例中， 测试控制装置也可作为测试控制中心， 主要用于控制各通 路的选择、 测试装置对待测装置的测试以及收集待测装置的各种参数信息、 收集测试 装置反馈的各种测试结果以及基于测试结果进行的各种处理分析等。 本实施例中的测 试通路选择装置可由纯硬件实现， 也可由软件结合硬件实现，其可包括一个控制单元， 该控制单元用于接收测试控制装置发送的控制指令从而进行对应的操作。 本实施例中 的测试装置可以为各种测试仪表，待测装置则可为对应各中测试仪表的各种待测设备。 下面结合系统中各装置其具体连接关系以及控制过程对本发明做进一步说明。 本实施例中， 将 M个测试装置与测试通路选择装置的输入端连接， 将 N个待测 装置与测试通路选择装置的输出端连接， 本实施例中， 测试通路选择装置的输入端和 输出端的通路数量可根据具体的应用场景等因素进行具体的设置；且本实施例中 M以 及 N值的具体选定也可根据具体的应用场景进行选定设置， 只要 M的值不大于测试
通路选择装置的输入端的通路数， 以及 N的值不大于测试通路选择装置的输出端的通 路数即可； 测试通路选择装置还与测试控制装置， 用于接收测试控制装置发送的测试 通路控制指令，并根据该测试通路控制指令从 M个测试装置中选择相应的测试装置对 N个待测装置进行测试。具体的， 其可根据控制指令从 M个测试指令中选择相应的一 个或多个 （小于 M) 对 N个测试装置进行测试， 也可从 M个测试装置中逐个选择测 试装置， 且所选择的测试装置对 N个测试装置都进行测试。 本实施例中， 一个测试装 置对 N个待测装置进行测试时，根据实际情况，可选择对 N个待测装置逐个进行测试， 也可选择对 N个待测装置中的多个同时进行测试。 值得注意的是,本实施例中,对个测 试装置、 待测试装置的识别， 具体可通过为各装置编号识别， 也可通过各装置自身的 识别信息 （例如标识信息） 进行识别； 而获取各装置的识别信息的方式可以是通过测 试人员手动输入， 也可以是各装置通过相应的通信链路自动上报。 在本实施例中， 测试装置对每个待测装置进行测试所采用的测试策略根据实际情 况， 可预置在每个测试装置或其中一个或多个测试装置上， 然后未预置的测试装置则 可从有预置的测试装置上获取； 也可直接在测试控制装置上预置各种测试策略， 然后 由测试控制装置根据当前进行测试的测试装置以及当前被侧的待测装置， 将对应的测 试策略发送给测试装置， 也可由当前进行测试的测试装置主动向测试控制装置索取测 试策略； 当预置在测试控制装置上时，测试装置在对与之连接的待测装置进行测试前， 需到测试控制装置上获取对应的测试策略。 只有当测试装置检测到其当前所存储的测 试策略与当前被检测的待测设备匹配时，可不需到测试控制装置上重新获取测试策略， 可直接对该待测设备进行测试， 且在测试完毕后， 将测试结果进行上传值对应的数据 采集中心； 本实施例中可上传至测试控制装置， 且可设置其没测试完一个待测装置后， 都将测试结果上传至测试控制装置， 测试控制装置接收到该测试结果后， 即可得知当 前的测试完毕， 需向测试通路选择装置发送控制命令， 以切换测试通路。 当所有的测 试装置对所有的待测装置都测试完毕后， 测试控制装置即根据收集到的测试结果进行 后续的处理、分析。 当然， 也可将测试结果集中发送给对应的处理设备进行处理分析。 为了更好的理解本发明实施例， 下面以测试通路选择装置根据测试控制装置发送 的测试通路控制指令从 M个测试装置中依次选择测试装置对 N个待测装置进行逐个 测试为例进行说明， 本实施例中测试控制装置发送的测试通路控制指令包括第一测试 通路控制指令和第二测试通路控制指令； 第一测试通路控制指令主要用于选择测试装 置， 而第二测试通路控制指令则主要用于选择待测装置， 具体选择、 测试过程如下： 测试通路选择装置先根据第一测试通路控制指令从测试装置中选择一个测试装置 对 N个待测装置进行测试； 在这个测试装置的测试过程中， 当前进行测试的测试装置
每测试完一个待测装置后， 测试通路选择装置根据测试控制装置发送的第二测试通路 控制指令从剩下的待测装置中选择一个与该测试装置连接以进行测试； 当前进行测试 的测试装置对 N个待测装置测试完毕后， 测试通路选择装置根据测试控制装置发送的 第一测试通路控制指令从剩下的测试装置中重新选择一个测试装置对 N个待测装置进 行测试， 直到 M个测试装置都对 N个测试装置进行了测试。 由于 M各测试装置都对 N各待测装置进行了测试， 因此每个待测装置都有 M个测试结果， 根据 M个测试结 果进行统计分析得到的测试结果也就更为精确。 为了更好的控制测试过程， 使得到的测试结果更为精确。 本实施例中， 每个待测 装置的供电电源也可由测试控制装置进行控制。 请参见图 2所示， 本实施例中的测试 系统还可包括电源通路选择装置， 该电源通路选择装置的输入端与电源连接， 输出端 与上述 N个待测装置连接； 电源通路选择装置用于接收测试控制装置发送的电源通路 控制指令， 并在接收到该指令后， 将当前测试通路中的待测装置与所述电源连接， 且 该电源的输出电压和电流是可受测试控制装置或电源通路选择装置自身的控制单元控 制， 可以在一定范围内针对不同的待测装置进行调整。 请参见图 3所示， 本实施例中的测试系统还可进一步包括通信通路选择装置， 通 信选择装置的一端与测试控制装置连接， 另一端与上述 N个待测装置连接； 通信通路 选择装置用于根据测试控制装置发送的通信通路控制命令将当前测试通路中的待测装 置与测试控制装置连接； 测试控制装置可以基于该通信通路获取与之通信连接的待测 装置的各种参数等信息， 以及通过该通信通路向待测装置发送相应的指令对该待测装 置的参数进行设置、 修改等等。 请参见图 4所示， 本实施例中的测试系统还可进一步包括显示装置， 该显示装置 可用于根据应用场景需要设置需要显示的内容， 以供测试人员或监控人员查看， 更便 于监测试。 本实施例中， 测试系统所包括的各装置之间可通过总线等方式连接。 且本实施例 中的测试通路选择装置、 电源通路选择装置以及通信通路选择装置可集成在一起设置 成一个智能多路开关， 通过一个控制模块控制各开关模块， 请参见图 5所示； 也可单 独分离设置， 每个装置中对应单独设置一个控制单元， 以接收测试控制装置发送的指 令进而以运行相应的程序执行相应的功能。 值得注意的是， 本实施例中， 各装置的输 入输出端子可设置为通用的连接端口， 可以根据需要连接不同类型的测试线缆， 通用 性好， 且测试控制装置发送测试通路控制命令、 电源通路控制命令以及通信通路控制 命令的时序并无严格限制， 可根据具体的应用场景选择设置； 例如， 当根据测试控制 装置发送的第二测试通路控制指令为测试装置切换一个待测装置时， 测试控制装置可
向电源通路选择装置以及通信通路选择装置分别发送电源通路控制命令以及通信通路 控制命令进行电源通路和通信通路的对应切换。 为了更好的理解本发明实施例， 下面结合上述测试系统， 对整个测试过程进行说 明。 首先对测试系统初始化， 将所有的待测装置和测试通路选择装置、 电源通路选择 装置以及通信通路选择装置的输出通路建立连接， 将所有的测试设备和测试通路选择 装置输入端连接， 将电源通路选择装置的输入端与电源连接， 并将电源通路选择装置 与测试控制装置连接， 将通信通路选择装置的输入端与测试控制装置连接； 具体连接 可通过总线连接； 然后测试人员在测试控制装置上配置软件， 包括配置对应的测试策 略， 并启动测试； 测试控制装置根据配置发送对应的控制指令选择一个测试通路， 一 个通信通路和一个电源通路， 相应的测试装置、 待测装置也就确定了， 然后测试装置 开始对当前与之连接的待测装置进行测试； 当一个待测装置测试完毕后， 测试装置将 测试数据传送到测试控制装置保存， 测试控制装置发送对应的控制命令给测试通路选 择装置、 电源通路选择装置以及通信通路选择装置选择下一个测试通路， 通信通路和 电源通路， 并开始测下一个待测装置； 当所有待测设备都测试完毕后， 测试控制装置 控制测试装置进行切换， 切换到下一个测试装置， 直到所有的测试装置都对待测装置 进行测试完毕； 然后测试控制装置对接收到的所有测试结果进行分析处理， 根据分析 结果确定需要重新进行测试的待测装置， 例如对于测试结果明显错误的待测装置、 根 据测试结果初步判定有问题、 故障的待测装置等， 都可判定为需要重新进行测量； 此 时测试控制装置发送重测控制指令给测试通路选择装置； 测试通路选择装置还用于根 据接收到的重测控制指令依次从所述 M 个测试装置中选择测试装置对需要重新测试 的待测装置逐个进行测试；根据重测控制指令选择测试通过的过程可同上述测试过程; 例如，测试控制装置可安排对测试结果有问题的待测装置根据控制策略重新安排复测， 并保存重新测试的测试结果； 复测的过程可采用上述测试过程。 下面以测试装置为测试仪表、 测试控制装置为控制中心、 测试通路选择装置、 电 源通路选择装置以及通信通路选择装置集合在一起设置为智能多路开关为例， 结合附 图 6对本发明实施例做进一步的说明， 具体如下： 步骤 600: 开始； 步骤 601 : 测试系统软硬件初始化， 硬件方面要将 M个测试仪表和 N个待测装置 都与按照上述方式通过总线与智能多路开关连接， 并将控制中心与智能多路开关、 测 试仪表通过总线连接， 软件方面， 配置测试脚本；
步骤 602: 智能多路开关根据控制中心的指令， 在输入端自动选择与测试仪表 j 连接 （j大于等于 1， 小于等于 M) ，输出端自动选择与待测装置 i连接 （i<N) ，默认情 况下， 初始化后, j=l,i=l， 也可以选择其他配置； 同时智能多路开关也会选择相应的通 信通路和电源通路； 步骤 603: 测试仪表 j对待测装置 i进行测试， 测试策略 （或内容） 由控制中心的 脚本控制， 待测装置的供电由供电通路提供， 电源大小可调， 通讯由通讯通路提供； 步骤 604: 测试仪表 j对待测装置 i的测试完成后， 控制中心保存测试数据； 步骤 605: 控制中心发出第二测试通路控制指令， 将智能多路开关装置的输出自 动切换到下一个待测装置， 程序设置1 +1； 同时发送通信通路控制指令和电源通路控 制指令进行通信通路和电源通路的进行； 步骤 606: 判断 i是否小于等于 N， 如是， 转至步骤 603， 否则转至步骤 607; 步骤 607: 设置 i=l, j=j+l; 步骤 608: 判断 j是否小于等于 M， 如是， 装置步骤 609; 否则， 转至步骤 610; 步骤 609: 控制中心控制智能多路开关装置的输入端切换到测试仪表」'， 然后转至 步骤 603; 步骤 610: 测试结束。 可见， 本发明实施例提供的测试系统及测试装置， 可以在不增加人力成本的前提 下， 通过在现有的各种测试装置上配合控制软件， 使测试设备长时间连续自动化进行 测试， 大幅提高测试装置的使用效率。 特别适合用于研发测试和调试领域， 同时也可 以用于大规模的批量测试。 In an embodiment of the present invention, the testing device sends the test result to the test control device after testing each device to be tested; the test control device is in the M test devices After the N test devices are tested one by one, all the test results received are analyzed, the device to be tested that needs to be retested is determined according to the analysis result, and a retest control command is sent to the test path selecting device; The selecting device sequentially selects the testing device from the M testing devices according to the retesting control command, and tests the device to be tested that needs to be retested one by one. The beneficial effects of the embodiments of the present invention are: The testing method and system provided by the embodiments of the present invention connect the M test devices to the input end of the test path selecting device, and output the N test devices and the test path selecting device Connection, M is greater than or equal to 1, N is greater than or equal to 1; then the test path selection device can select from M test devices according to the test path control command The corresponding test device tests the N devices to be tested, that is, the test path selection device in the embodiment of the present invention can automatically select one or more test devices to test the N devices under test under the control of the test path control command. . Therefore, during the test, it is not necessary to manually switch the device to be tested connected to the test device, but the test path selection device automatically switches according to the control command, and the N devices to be connected connected thereto can be completed once. Or multiple tests, thus improving the test efficiency of the test device while reducing the test cost. 1 is a schematic structural diagram 1 of a test system according to an embodiment of the present invention; FIG. 2 is a schematic structural diagram 2 of a test system according to an embodiment of the present invention; FIG. 3 is a test system according to an embodiment of the present invention; FIG. 4 is a schematic structural diagram of a test system according to an embodiment of the present invention; FIG. 5 is a schematic structural diagram of an integrated arrangement of each path selection device in FIG. 4; FIG. 6 is a test diagram of an embodiment of the present invention; Method flow diagram. DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS The embodiments of the present invention will be further described in detail below with reference to the accompanying drawings. Referring to FIG. 1 , the figure shows a test system, a test control device, a test path selection device, M test devices, and N devices to be tested. The M in this embodiment is greater than or equal to 1, N is greater than or equal to 1; In this embodiment, the test control device can also be used as a test control center, mainly for controlling the selection of each path, testing the device to be tested, collecting various parameter information of the device to be tested, and collecting Various test results fed back by the test device, various processing analysis based on the test results, and the like. The test path selection device in this embodiment may be implemented by pure hardware, or may be implemented by software in combination with hardware, and may include a control unit for receiving a control command sent by the test control device to perform a corresponding operation. The test device in this embodiment may be various test instruments, and the device to be tested may be various devices to be tested corresponding to the respective test instruments. The present invention will be further described below in conjunction with the specific connection relationships and control processes of the various devices in the system. In this embodiment, the M test devices are connected to the input end of the test path selection device, and the N test devices are connected to the output end of the test path selection device. In this embodiment, the input end and the output of the test path selection device are tested. The number of channels in the end may be specifically set according to specific application scenarios and the like; and the specific selection of the M and N values in the embodiment may also be selected according to specific application scenarios, as long as the value of M is not greater than the test. The number of paths at the input end of the path selection device, and the value of N is not greater than the number of channels at the output of the test path selection device; the test path selection device and the test control device are configured to receive test path control commands sent by the test control device, And selecting the corresponding test device from the M test devices according to the test path control instruction to test the N test devices. Specifically, the test device can be selected from the M test devices by selecting one or more (less than M) corresponding to the control command, or the test device can be selected one by one from the M test devices, and the selected device is selected. The test device tests all of the N test devices. In this embodiment, when a test device tests N devices to be tested, according to actual conditions, the N devices to be tested may be tested one by one, or multiple of the N devices to be tested may be simultaneously tested. . It should be noted that, in this embodiment, the identification of the test device and the device to be tested may be specifically identified by each device number, or may be identified by identification information (such as identification information) of each device; The identification information of the device may be manually input by the tester, or the devices may be automatically reported through the corresponding communication link. In this embodiment, the test strategy used by the testing device to test each device to be tested may be preset on each test device or one or more of the test devices according to actual conditions, and then the test device is not preset. It can be obtained from a preset test device; or various test strategies can be preset directly on the test control device, and then the test control device will respond according to the test device currently being tested and the device to be tested currently on the side. The test strategy is sent to the test device, and the test device currently being tested can actively request the test strategy from the test control device; when preset on the test control device, the test device is tested on the device to be tested connected thereto, The corresponding test strategy needs to be obtained on the test control device. Only when the test device detects that the currently stored test strategy matches the currently tested device under test, the test device may be re-acquired without testing the test device, and the device to be tested may be directly tested, and the test is completed. Afterwards, the test result is uploaded to the data collection center corresponding to the uploaded value; in this embodiment, the test control device can be uploaded to the test control device, and the test result can be uploaded to the test control device after the test device is not tested. After receiving the test result, the device can know that the current test is completed, and sends a control command to the test path selection device to switch the test path. After all the test devices have tested all the devices to be tested, the test control device performs subsequent processing and analysis based on the collected test results. Of course, the test results can also be sent to the corresponding processing device for processing analysis. In order to better understand the embodiment of the present invention, the test path selection device sequentially selects the test device from the M test devices according to the test path control command sent by the test control device, and the N test devices are tested one by one as an example. The test path control instruction sent by the test control device in this embodiment includes a first test path control instruction and a second test path control instruction; the first test path control instruction is mainly used to select the test device, and the second test path control instruction is mainly For selecting the device to be tested, the specific selection and testing process is as follows: The test path selection device first selects one test device from the test device according to the first test path control command to test the N devices to be tested; the test process in the test device Medium, the test device currently being tested After each test device is tested, the test path selection device selects one of the remaining devices under test to be connected to the test device for testing according to the second test path control command sent by the test control device; the test device currently performing the test After testing the N devices to be tested, the test path selecting device reselects one test device from the remaining test devices according to the first test path control command sent by the test control device, and tests the N devices to be tested until M N test devices were tested on the test set. Since each of the M test devices tests the N devices to be tested, each test device has M test results, and the test results obtained by statistical analysis based on the M test results are more accurate. In order to better control the test process, the test results obtained are more accurate. In this embodiment, the power supply of each device to be tested can also be controlled by the test control device. Referring to FIG. 2, the test system in this embodiment may further include a power path selection device, wherein the input end of the power path selection device is connected to the power source, and the output end is connected to the N devices to be tested; Receiving a power path control command sent by the test control device, and after receiving the command, connecting the device under test in the current test path to the power source, and the output voltage and current of the power source are test control devices or The control unit of the power path selection device itself can be adjusted for different devices to be tested within a certain range. Referring to FIG. 3, the test system in this embodiment may further include a communication path selecting device. One end of the communication selecting device is connected to the test control device, and the other end is connected to the N devices to be tested. The communication path selecting device is used. Connecting the device under test in the current test path to the test control device according to the communication path control command sent by the test control device; the test control device may acquire information such as various parameters of the device to be tested connected to the communication device based on the communication path, And sending, by the communication path, a corresponding instruction to the device under test to set, modify, and the like of the parameter of the device to be tested. As shown in FIG. 4, the test system in this embodiment may further include a display device, where the display device may be configured to set content to be displayed according to an application scenario, for the tester or the monitoring personnel to view, and more convenient to monitor the test. In this embodiment, the devices included in the test system can be connected by a bus or the like. The test path selecting device, the power path selecting device and the communication path selecting device in the embodiment can be integrated into an intelligent multi-way switch, and each switch module is controlled by a control module, as shown in FIG. 5; Separate settings are provided, and a control unit is separately provided in each device to receive the command sent by the test control device to execute the corresponding function by running the corresponding program. It should be noted that, in this embodiment, the input and output terminals of each device can be set as a universal connection port, and different types of test cables can be connected as needed, and the versatility is good, and the test control device sends the test path control command and the power supply. The timing of the path control command and the communication path control command is not strictly limited, and the setting may be selected according to a specific application scenario; for example, when the device under test is switched according to the second test path control command sent by the test control device, the test is performed. Control device The power path selection means and the communication path selecting means respectively transmit a power path control command and a communication path control command to perform switching of the power path and the communication path. In order to better understand the embodiments of the present invention, the entire test process will be described below in conjunction with the above test system. First, the test system is initialized, and all the devices to be tested are connected with the output paths of the test path selection device, the power path selection device, and the communication path selection device, and all the test devices are connected with the input of the test path selection device, and the power path is connected. The input end of the selection device is connected to the power source, and the power path selection device is connected to the test control device, and the input end of the communication path selection device is connected to the test control device; the specific connection can be connected through the bus; then the tester is on the test control device The configuration software includes configuring a corresponding test strategy and starting the test; the test control device sends a corresponding control command according to the configuration to select a test path, a communication path and a power path, and the corresponding test device and the device to be tested are also determined. Then, the testing device starts to test the device to be tested that is currently connected thereto; when the device to be tested is tested, the testing device transmits the test data to the test control device for saving, and the test control device sends a corresponding control command to the test. The path selection device, the power path selection device, and the communication path selection device select the next test path, the communication path and the power path, and start measuring a device to be tested; when all the devices to be tested are tested, the test device controls the test device Switching, switching to the next test device, until all test devices are tested by the test device; then the test control device analyzes all the test results received, and determines the device to be tested that needs to be retested based on the analysis result. For example, for the device under test whose test result is obviously wrong, the device to be tested based on the test result, the device under test, etc., it can be determined that the measurement needs to be re-measured; at this time, the test control device sends the retest control command to the test path selection. The test path selection device is further configured to sequentially select a test device from the M test devices according to the received retest control command to test the devices to be tested that need to be retested one by one; and select the test according to the retest control command. Process can For example, the test control device may arrange for the device under test to have a problem with the test result to rearrange the retest according to the control strategy, and save the test result of the retest; the process of the retest may adopt the above test process. In the following, taking the test device as the test instrument, the test control device as the control center, the test path selection device, the power path selection device, and the communication path selection device are collectively set as an intelligent multiplexer as an example, and the embodiment of the present invention is made with reference to FIG. For further explanation, the details are as follows: Step 600: Start; Step 601: Test system software and hardware initialization, hardware aspects, M test instruments and N devices to be tested are connected to the intelligent multi-way switch through the bus according to the above manner, and The control center is connected to the intelligent multi-way switch and the test instrument through the bus, and the software is configured to configure the test script; Step 602: The intelligent multi-way switch automatically selects and connects with the test instrument j at the input end according to the instruction of the control center (j is greater than or equal to 1, less than or equal to M), and the output terminal automatically selects to connect with the device to be tested i (i<N), By default, after initialization, j=l, i=l, other configurations can also be selected; at the same time, the intelligent multi-way switch will also select the corresponding communication path and power path; Step 603: Test instrument j to test device i, The test strategy (or content) is controlled by the script of the control center, the power supply of the device to be tested is provided by the power supply path, the power supply size is adjustable, and the communication is provided by the communication path; Step 604: After the test of the test device j is completed, the control is controlled. The center saves the test data; Step 605: The control center issues a second test path control command to automatically switch the output of the intelligent multiplexer device to the next device to be tested, and the program sets 1 +1; simultaneously sends the communication path control command and the power path The control command performs the communication path and the power path; Step 606: Determine whether i is less than or equal to N, and if yes, go to step 603 Otherwise, go to step 607; Step 607: Set i=l, j=j+l; Step 608: Determine whether j is less than or equal to M, if yes, device step 609; otherwise, go to step 610; Step 609: Control Center Control Intelligence The input of the multiplexer is switched to the test meter "', and then proceeds to step 603; Step 610: The test ends. It can be seen that the test system and the test device provided by the embodiments of the present invention can continuously and automatically test the test equipment for a long time by using the control software on various existing test devices without increasing the labor cost. The efficiency of the test device. It is especially suitable for R&D testing and debugging, and can also be used for large-scale batch testing.
以上内容是结合具体的实施方式对本发明所作的进一步详细说明， 不能认定本发 明的具体实施只局限于这些说明。 对于本发明所属技术领域的普通技术人员来说， 在 不脱离本发明构思的前提下， 还可以做出若干简单推演或替换， 都应当视为属于本发 明的保护范围。
工业实用性 本发明实施例提供的技术方案可以应用于通信领域， 在测试过程中， 不需要手动 切换与测试装置连接的待测装置， 而是由测试通路选择装置根据控制命令进行自动切 换， 即可完成对与之连接的 N个待测装置都进行一次或多次的测试， 因此可提高测试 装置的测试效率， 同时降低测试成本。
The above is a further detailed description of the present invention in connection with the specific embodiments, and the specific implementation of the invention is not limited to the description. It will be apparent to those skilled in the art that the present invention may be made without departing from the spirit and scope of the invention. Industrial Applicability The technical solution provided by the embodiments of the present invention can be applied to the field of communications. During the testing process, it is not necessary to manually switch the device to be tested connected to the testing device, but the test channel selecting device automatically switches according to the control command, that is, The test can be performed one or more times on the N devices to be tested, thereby improving the test efficiency of the test device and reducing the test cost.
Claims
1. 一种测试系统,包括： 测试控制装置、 测试通路选择装置、 M个测试装置以及 N 个待测装置， 所述 M大于等于 1， 所述 N大于等于 1 ; 所述 M个测试装置与所 述测试通路选择装置的输入端连接， 所述 N个待测装置与所述测试通路选择装 置的输出端连接， 所述测试通路选择装置用于根据所述测试控制装置发送的测 试通路控制指令从所述 M个测试装置中选择相应的测试装置对所述 N个待测 装置进行测试。 A test system comprising: a test control device, a test path selection device, M test devices, and N test devices, wherein the M is greater than or equal to 1, and the N is greater than or equal to 1; the M test devices and An input end of the test path selecting device is connected, the N devices to be tested are connected to an output end of the test path selecting device, and the test path selecting device is configured to execute a test path control command according to the test control device Selecting the corresponding test device from the M test devices to test the N devices under test.
2. 如权利要求 1所述的测试系统，其中，所述测试系统还包括电源通路选择装置， 所述电源通路选择装置的输入端与电源连接，输出端与所述 N个待测装置连接; 所述电源通路选择装置用于根据所述测试控制装置发送的电源通路控制指令将 当前测试通路中的待测装置与所述电源连接。 2. The test system according to claim 1, wherein the test system further comprises a power path selection device, wherein an input end of the power path selection device is connected to a power source, and an output terminal is connected to the N devices to be tested; The power path selection means is configured to connect the device under test in the current test path to the power source according to a power path control command sent by the test control device.
3. 如权利要求 1所述的测试系统，其中，所述测试系统还包括通信通路选择装置， 所述通信选择装置的一端与所述测试控制装置连接， 另一端与所述 N个待测装 置连接； 所述通信通路选择装置用于根据所述测试控制装置发送的通信通路控 制命令将当前测试通路中的待测装置与所述测试控制装置连接。 3. The test system according to claim 1, wherein the test system further comprises communication path selection means, one end of the communication selection means is connected to the test control means, and the other end is connected to the N devices to be tested. The communication path selecting means is configured to connect the device under test in the current test path to the test control device according to the communication path control command sent by the test control device.
4. 如权利要求 1-3任一项所述的测试系统， 其中， 所述测试通路选择装置根据所 述测试控制装置发送的测试通路控制指令从所述 M 个测试装置中选择相应的 测试装置对所述 N个待测装置进行测试为： 所述测试通路选择装置根据所述测 试通路控制指令依次从所述 M个测试装置中选择测试装置对所述 N个待测装 置逐个进行测试。 The test system according to any one of claims 1 to 3, wherein the test path selecting means selects a corresponding test device from the M test devices according to a test path control command sent by the test control device Testing the N devices to be tested is: the test path selecting device sequentially selects test devices from the M test devices according to the test path control instruction, and tests the N devices to be tested one by one.
5. 如权利要求 4所述的测试系统， 其中， 所述测试通路控制指令包括第一测试通 路控制指令和第二测试通路控制指令； 所述测试通路选择装置根据所述测试通 路控制指令依次从所述 M个测试装置中选择测试装置对所述 N个待测装置逐 个进行测试包括： 5. The test system according to claim 4, wherein the test path control instruction comprises a first test path control instruction and a second test path control instruction; the test path selection means sequentially according to the test path control instruction Selecting the test device from the M test devices to test the N devices to be tested one by one includes:
所述测试通路选择装置根据所述第一测试通路控制指令从测试装置中选择 一个测试装置对所述 N个待测装置进行测试； 在测试过程中， 当前进行测试的 测试装置每测试完一个待测装置后， 所述测试通路选择装置根据所述测试控制 装置发送的第二测试通路控制指令从剩下的待测装置中选择一个与该测试装置 连接； 当前进行测试的测试装置对所述 N个待测装置测试完毕后， 所述测试通
路选择装置根据所述测试控制装置发送的第一测试通路控制指令从剩下的测试 装置中重新选择一个测试装置对所述 N个待测装置进行测试， 直到所述 M个 测试装置都对所述 N个测试装置进行了测试。 The test path selecting device selects one test device from the test device according to the first test path control instruction to test the N devices to be tested; during the test, the test device currently being tested is tested for each test After the measuring device, the test path selecting device selects one of the remaining devices to be tested and connects with the testing device according to the second test path control command sent by the test control device; the test device currently performing testing on the N After the test device is tested, the test pass And selecting, by the first test path control instruction sent by the test control device, a test device from the remaining test devices to test the N devices to be tested until the M test devices are opposite The N test devices were tested.
6. 如权利要求 4所述的测试系统， 其中， 所述测试装置还用于在对每个待测装置 测试完毕后， 将测试结果发送给所述测试控制装置。 The test system according to claim 4, wherein the test device is further configured to send the test result to the test control device after testing each device to be tested.
7. 如权利要求 5所述的测试系统，其中，所述测试控制装置还用于存储测试策略; 所述测试装置还用于在对与之连接的待测装置进行测试之前， 从所述测试控制 装置获取测试策略，然后根据该测试策略对当前与之连接的待测装置进行测试。 7. The test system of claim 5, wherein the test control device is further configured to store a test strategy; the test device is further configured to perform the test from the test device connected thereto before testing The control device acquires the test strategy, and then tests the device to be tested currently connected thereto according to the test strategy.
8. 如权利要求 6所述的测试系统， 其中， 所述测试控制装置还用于在所述 M个测 试装置都对所述 N个待测装置逐个测试完毕后， 对接收到的所有测试结果进行 分析， 根据分析结果确定需要重新测试的待测装置， 并发送重测控制指令给所 述测试通路选择装置； The test system according to claim 6, wherein the test control device is further configured to: after the M test devices test the N test devices one by one, all the test results received Performing an analysis, determining a device to be tested that needs to be retested according to the analysis result, and transmitting a retest control command to the test path selection device;
所述测试通路选择装置还用于根据所述重测控制指令依次从所述 M个测 试装置中选择测试装置对需要重新测试的待测装置逐个进行测试。 The test path selection device is further configured to sequentially select a test device from the M test devices according to the retest control command to test the devices to be tested that need to be retested one by one.
9. 一种测试方法， 包括： 9. A test method that includes:
将 M个测试装置与测试通路选择装置的输入端连接， 并将 N个待测装置 与测试通路选择装置的输出端连接， 所述 M大于等于 1， 所述 N大于等于 1 ; 所述测试通路选择装置根据测试控制装置发送的测试通路控制指令从所述 M个测试装置中选择相应的测试装置对所述 N个待测装置进行测试。 Connecting the M test devices to the input end of the test path selecting device, and connecting the N devices to be tested to the output end of the test path selecting device, wherein the M is greater than or equal to 1, and the N is greater than or equal to 1; The selecting device selects the corresponding testing device from the M testing devices according to the test path control command sent by the test control device to test the N devices to be tested.
10. 如权利要求 9所述的测试方法， 其中， 所述测试通路选择装置根据所述测试通 路控制指令从所述 M个测试装置中选择相应的测试装置对所述 N个待测装置 进行测试为： 所述测试通路选择装置根据所述测试通路控制指令依次从所述 M 个测试装置中选择测试装置对所述 N个待测装置逐个进行测试。 10. The testing method according to claim 9, wherein the test path selecting means selects a corresponding testing device from the M test devices according to the test path control instruction to test the N devices to be tested. And: the test path selecting device sequentially selects the test device from the M test devices according to the test path control instruction, and tests the N test devices one by one.
11. 如权利要求 10所述的测试方法，其中，所述测试通路控制指令包括第一测试通 路控制指令和第二测试通路控制指令； 所述测试通路选择装置根据所述测试通 路控制指令依次从所述 M个测试装置中选择测试装置对所述 N个待测装置逐 个进行测试包括： 11. The test method according to claim 10, wherein the test path control instruction comprises a first test path control instruction and a second test path control instruction; the test path selection means sequentially according to the test path control instruction Selecting the test device from the M test devices to test the N devices to be tested one by one includes:
所述测试通路选择装置根据所述第一测试通路控制指令从测试装置中选择 一个测试装置对所述 N个待测装置进行测试； 在测试过程中， 当前进行测试的
测试装置每测试完一个待测装置后， 所述测试通路选择装置根据所述测试控制 装置发送的第二测试通路控制指令从剩下的待测装置中选择一个与该测试装置 连接； 当前进行测试的测试装置对所述 N个待测装置测试完毕后， 所述测试通 路选择装置根据所述测试控制装置发送的第一测试通路控制指令从剩下的测试 装置中重新选择一个测试装置对所述 N个待测装置进行测试， 直到所述 M个 测试装置都对所述 N个测试装置进行了测试。 The test path selection device selects one test device from the test device according to the first test path control instruction to test the N devices to be tested; during the test, the current test is performed. After each test device is tested, the test path selecting device selects one of the remaining devices to be tested according to the second test path control command sent by the test control device to connect with the test device; After the test device tests the N devices to be tested, the test path selecting device reselects a test device from the remaining test devices according to the first test path control command sent by the test control device. The N devices under test are tested until the M test devices have tested the N test devices.
12. 如权利要求 10所述的测试方法， 其中， 所述方法还包括： The test method according to claim 10, wherein the method further comprises:
测试装置在对每个待测装置测试完毕后， 将测试结果发送给所述测试控制 装置； After the test device finishes testing each device to be tested, the test device sends the test result to the test control device;
所述测试控制装置在所述 M个测试装置都对所述 N个待测装置逐个测试 完毕后， 对接收到的所有测试结果进行分析， 根据分析结果确定需要重新测试 的待测装置， 并发送重测控制指令给所述测试通路选择装置； After the M test devices have tested the N test devices one by one, the test control device analyzes all the test results received, determines the device to be tested that needs to be retested according to the analysis result, and sends the test device. Retesting the control command to the test path selection device;
所述测试通路选择装置根据所述重测控制指令依次从所述 M 个测试装置 中选择测试装置对需要重新测试的待测装置逐个进行测试。
The test path selecting means sequentially selects the test device from the M test devices according to the retest control command to test the devices to be tested that need to be retested one by one.
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104394040A (en) * | 2014-12-11 | 2015-03-04 | 深圳市彩煌通信技术有限公司 | Parallel separator test method and device based on network analyzer |
| CN104459566A (en) * | 2014-12-09 | 2015-03-25 | 西京学院 | Secondary electric power supply testing system and method |
Families Citing this family (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106154074A (en) * | 2015-04-09 | 2016-11-23 | 致茂电子(苏州)有限公司 | ATE and method |
| CN106405165A (en) * | 2015-08-03 | 2017-02-15 | 中兴通讯股份有限公司 | Test connection device and system and test automatic connection method |
| CN107168832A (en) * | 2017-04-26 | 2017-09-15 | 中控智慧科技股份有限公司 | The method of automatic detection, device |
| CN107241149B (en) * | 2017-05-27 | 2020-11-03 | 黄骅市交大思诺科技有限公司 | LEU test aging tool and LEU test aging method |
| CN108833201B (en) * | 2018-05-17 | 2020-09-04 | 黄骅市交大思诺科技有限公司 | Transponder aging test system |
| CN110568307A (en) * | 2019-09-12 | 2019-12-13 | 中国科学院微小卫星创新研究院 | Automatic testing device and method for satellite single-machine interface |
| CN111082880B (en) * | 2019-12-03 | 2022-04-19 | 武汉虹信科技发展有限责任公司 | Test system and test method |
| CN111157874A (en) * | 2019-12-27 | 2020-05-15 | 深圳Tcl新技术有限公司 | Batch mainboard test method, control terminal, test equipment and readable storage medium |
| CN112363002A (en) * | 2020-11-25 | 2021-02-12 | 常州同惠电子股份有限公司 | Multi-element parallel test method for safety voltage-resistant instrument |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101420634A (en) * | 2007-10-23 | 2009-04-29 | 华硕电脑股份有限公司 | Automatic test system and method for switching module and routing |
| JP2011130084A (en) * | 2009-12-16 | 2011-06-30 | Anritsu Corp | Mobile communication terminal testing device, and method of displaying test result |
| CN202495943U (en) * | 2012-03-31 | 2012-10-17 | 成都因纳伟盛科技股份有限公司 | Bluetooth chip rapid detection system |
| CN102946286A (en) * | 2012-10-26 | 2013-02-27 | 株洲南车时代电气股份有限公司 | Method, device and system for controlling detection of equipment |
Family Cites Families (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1399138A (en) * | 2001-07-20 | 2003-02-26 | 上海大唐移动通信设备有限公司 | RF automatic changing batch testing method |
| CN100367040C (en) * | 2004-08-18 | 2008-02-06 | 华为技术有限公司 | Testing method for radio-frequency product |
| CN2777858Y (en) * | 2005-04-14 | 2006-05-03 | 上海聚星仪器有限公司 | Parallel network analyzer |
| US20070072599A1 (en) * | 2005-09-27 | 2007-03-29 | Romine Christopher M | Device manufacturing using the device's embedded wireless technology |
| CN201699720U (en) * | 2010-07-23 | 2011-01-05 | 北京五龙电信技术公司 | Radio-frequency testing system of mobile communication terminal |
| CN202395782U (en) * | 2012-01-12 | 2012-08-22 | 成都天奥信息科技有限公司 | Automatic test system of radio station |
| CN202721612U (en) * | 2012-08-16 | 2013-02-06 | 石家庄金硕电子科技有限公司 | Intelligent frequency-conversion variable-voltage test power supply |
-
2013
- 2013-08-14 CN CN201310354118.XA patent/CN104378167A/en active Pending
-
2014
- 2014-01-22 WO PCT/CN2014/071113 patent/WO2014134984A1/en active Application Filing
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101420634A (en) * | 2007-10-23 | 2009-04-29 | 华硕电脑股份有限公司 | Automatic test system and method for switching module and routing |
| JP2011130084A (en) * | 2009-12-16 | 2011-06-30 | Anritsu Corp | Mobile communication terminal testing device, and method of displaying test result |
| CN202495943U (en) * | 2012-03-31 | 2012-10-17 | 成都因纳伟盛科技股份有限公司 | Bluetooth chip rapid detection system |
| CN102946286A (en) * | 2012-10-26 | 2013-02-27 | 株洲南车时代电气股份有限公司 | Method, device and system for controlling detection of equipment |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104459566A (en) * | 2014-12-09 | 2015-03-25 | 西京学院 | Secondary electric power supply testing system and method |
| CN104394040A (en) * | 2014-12-11 | 2015-03-04 | 深圳市彩煌通信技术有限公司 | Parallel separator test method and device based on network analyzer |
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| CN104378167A (en) | 2015-02-25 |
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