CN104991214B - Digital integrated electronic circuit DC parameter standard reproducing method and standard set-up - Google Patents
Digital integrated electronic circuit DC parameter standard reproducing method and standard set-up Download PDFInfo
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- CN104991214B CN104991214B CN201510458064.0A CN201510458064A CN104991214B CN 104991214 B CN104991214 B CN 104991214B CN 201510458064 A CN201510458064 A CN 201510458064A CN 104991214 B CN104991214 B CN 104991214B
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Abstract
The invention discloses digital integrated electronic circuit DC parameter standard reproducing method, comprise the following steps：S1：Controller sets DC parameter standard value；S2：Instrument module group reappears DC parameter according to the application value of DC parameter standard value and device under test in test loop, and controller receives the DC parameter of reproduction, and compared with the DC parameter standard value, obtains error testing result；S3：If error testing result, which exceedes error as defined in controller, judges scope, controller is modified using dichotomy algorithm to the DC parameter in test loop, judge scope until error testing result is less than defined error, revised DC parameter is the DC parameter standard of reproduction.The present invention, the digital integrated electronic circuit DC parameter in the loop that controller tests device under test is compared with digital integrated electronic circuit DC parameter standard, so as to realize the calibration of digital integrated electronic circuit DC parameter.
Description
Technical field
The present invention relates to microelectronics field of measuring techniques, more particularly to a kind of digital integrated electronic circuit DC parameter standard reproduction
Method and standard set-up.
Background technology
The performance indications of integrated circuit parameter directly affects various military-civil systems, the technical indicator of equipment, at present this
The magnitude tracing approach of a little integrated circuit parameters mainly passes through " integrated circuit test system calibrating installation --- integrated circuit testing
The mode of system --- integrated circuit parameter " is carried out, and this mode solves the problems, such as the magnitude tracing of integrated circuit test system,
But it can not but ensure the reliability of the transmission of quantity value between " integrated circuit test system --- integrated circuit parameter ".Reason is
The difference of essence, the magnitude tracing of integrated circuit test system be present in the parameter and integrated circuit parameter of integrated circuit test system
It is the amount for the major parameter of single part (such as driver, comparator, precision measurement unit, power supply) in a static condition
Value is traced to the source, and the magnitude tracing of integrated circuit parameter is then the knot of the multiple part comprehensive functions of test system during actual test
Fruit, the integrated circuit parameter quantities that may there is a situation where to be tested by the test system of magnitude tracing are forbidden, Wu Fazhen
Just ensureing various military-civil systems, the performance indications of equipment.
At present, industry is typically carried out the quantity value comparison of test system by the way of gold vessel part, verified, it is common practice to
Choose certain specific parameter of gold vessel part to test in different test systems, test system performance test is carried out with this.It is such
Gold vessel part parameter quantities are single, the degree of accuracy is not high, can not be used for integrated circuit parameter and standard and come to integrated circuit test system
Calibrated.
The content of the invention
In view of this, it is necessary to which providing a kind of digital integrated electronic circuit DC parameter standard can be in minimum value to maximum
Between carry out electrodeless regulation, and digital integrated electronic circuit DC parameter standard reproducing method of the uncertainty of measurement better than 0.1% and
Standard set-up.
A kind of digital integrated electronic circuit DC parameter standard reproducing method, comprises the following steps：
S1：Controller 12 in digital integrated electronic circuit DC parameter standard set-up 1 sets digital integrated electronic circuit DC parameter
Standard value；
S2：Instrument module group 11 in digital integrated electronic circuit DC parameter standard set-up 1 is according to the digital integrated electronic circuit
DC parameter standard value and device under test 2 are applied to the voltage/current at the both ends of digital integrated electronic circuit DC parameter standard set-up 1
It is value added that reproduction numeral in the test loop formed is being sequentially connected in series by controller 12, instrument module group 11, device under test 2
Integrated circuit DC parameter, controller 12 receive the digital integrated electronic circuit direct current ginseng in the test loop of the reproduction of instrument module group 11
Number, and compared with the digital integrated electronic circuit DC parameter standard value, obtain error testing result；
S3：If the error testing result, which exceedes error as defined in controller 12, judges scope, controller 12 utilizes two points
Method algorithm is modified to the digital integrated electronic circuit DC parameter in test loop, until error testing result is less than defined miss
Difference judges scope, and revised digital integrated electronic circuit DC parameter is that digital integrated electronic circuit DC parameter standard set-up 1 reappears
Digital integrated electronic circuit DC parameter standard.
The invention provides a kind of digital integrated electronic circuit DC parameter standard set-up, including PXI instrument modules group 11, control
Device 12 and interface adapter 13；
The controller 11, interface adapter 13 electrically connect with the PXI instrument modules group 11 respectively；
The PXI instrument modules group 11, for the measuring principle according to digital integrated electronic circuit DC parameter, reproduction is multigroup can
Program numbers integrated circuit DC parameter standard；
The controller 12, for controlling the PXI instrument modules group 11 to reappear digital integrated electronic circuit DC parameter standard,
And data are stored, handled and shown；
The interface adapter 13, for according to reproduction digital integrated electronic circuit parameter and standard corresponding to different principles,
The data-signal of the PXI instrument modules group 11 of reception is transferred, isolated, distributed, to reappear different digital integrated electronic circuits
Parameter and standard is to device under test 2.
Digital integrated electronic circuit DC parameter standard reproducing method and standard set-up provided by the invention, it is possible to achieve set of digits
Into the electrodeless regulation of circuit direct parameter and standard, while there is function of tracing to the source, it is ensured that digital integrated electronic circuit DC parameter it is complete
Range calibration, blank of the China in technique is filled up；, can and excellent performance, integrated level are high, good portability, can trace to the source
Meets the needs of Contemporary Digital integrated circuit DC parameter field calibration well.
Brief description of the drawings
Fig. 1 is the flow signal for the digital integrated electronic circuit DC parameter standard reproducing method that embodiment of the present invention provides
Figure.
Fig. 2 is the structural representation for the digital integrated electronic circuit DC parameter standard set-up that embodiment of the present invention provides.
Fig. 3 is that DC parameter is answered in the digital integrated electronic circuit DC parameter standard reproducing method that embodiment of the present invention provides
Existing principle assumption diagram.
Fig. 4 is to reappear I in Fig. 3OL/IOH、IIL/IIH、IOS、IDDThe principle assumption diagram of parameter and standard.
Fig. 5 is to reappear V in Fig. 3IK、VOL/VOHThe principle assumption diagram of parameter and standard.
Fig. 6 is that V is realized in Fig. 3OLThe circuit theory diagrams that typical magnitude is traced to the source.
Main element symbol description
Following embodiment will combine above-mentioned accompanying drawing and further illustrate the present invention.
Embodiment
As shown in figure 1, a kind of digital integrated electronic circuit DC parameter standard reproducing method that embodiment of the present invention provides, bag
Include following steps：
S1：Controller 12 in digital integrated electronic circuit DC parameter standard set-up 1 sets digital integrated electronic circuit DC parameter
Standard value；
S2：Instrument module group 11 in digital integrated electronic circuit DC parameter standard set-up 1 is according to the digital integrated electronic circuit
DC parameter standard value and device under test 2 are applied to the voltage/current at the both ends of digital integrated electronic circuit DC parameter standard set-up 1
It is value added that reproduction numeral in the test loop formed is being sequentially connected in series by controller 12, instrument module group 11, device under test 2
Integrated circuit DC parameter, controller 12 receive the digital integrated electronic circuit direct current ginseng in the test loop of the reproduction of instrument module group 11
Number, and compared with the digital integrated electronic circuit DC parameter standard value, obtain error testing result；
S3：If the error testing result, which exceedes error as defined in controller 12, judges scope, controller 12 utilizes two points
Method algorithm is modified to the digital integrated electronic circuit DC parameter in test loop, until error testing result is less than defined miss
Difference judges scope, and revised digital integrated electronic circuit DC parameter is that digital integrated electronic circuit DC parameter standard set-up 1 reappears
Digital integrated electronic circuit DC parameter standard.
Specifically, in the present embodiment：Digital integrated electronic circuit DC parameter standard set-up 1, for reappearing multigroup programmable number
Word integrated circuit DC parameter standard and the digital integrated electronic circuit DC parameter in device under test 2 is calibrated；It is to be tested
2 preferably integrated circuit test system of device, for testing digital integrated electronic circuit DC parameter；Instrument module group 11 includes
Digital multimeter 111, programmable resistance 112, source measuring unit 113, according to digital integrated electronic circuit DC parameter measuring principle, number
Word multimeter 111, programmable resistance 112, the collective effect of source measuring unit 113 reappear different digital integrated electronic circuit DC parameters
Standard value, have the characteristics that good versatility, good portability, parameter can it is electrodeless regulation and the degree of accuracy it is high.Wherein, digital multimeter
111, for carrying out voltage resistance measurement；Programmable resistance 112, for setting any resistance value；Source measuring unit 113, is used for
Variable voltage value is set；Error as defined in controller 12 judges that scope is determined by the resolving power of the voltage measurement of digital multimeter 111,
Error judgment scope preferably 0.1%.
As shown in figure 3, the principle of the standard value of reproduction digital integrated electronic circuit DC parameter is：Digital integrated electronic circuit direct current is joined
In number standard set-up 1, controller 12 and PXI instrument modules group 11 is interconnected by PXI buses 6, in control PXI instrument modules group 11
Each module reappears digital integrated electronic circuit DC parameter standard, and carries out the storage, processing and display of data.Interface adapter 13 is real
The adaptive connection of existing device under test 2 and PXI instrument modules group 11, while passing through connection cables 5 and PXI instrument modules group 11
Connection, while being connected by test interface 7 with load plate 4.Interface adapter 13 is answered according to digital integrated electronic circuit parameter and standard
Existing different principle, the signal from PXI instrument modules group 11 is transferred, isolated, distributed, to reappear different parameter marks
Standard to test interface 7, calibrating installation 3 is used for straight to the digital integrated electronic circuit in digital integrated electronic circuit DC parameter standard set-up 1
Flow parameter and standard and carry out magnitude tracing.
Embodiment 1
Reappear digital integrated electronic circuit DC parameter standard, such as IOLDuring parameter, digital integrated electronic circuit DC parameter standard is answered
Existing method comprises the following steps that：
S1：An I is inputted in controller 12 in digital integrated electronic circuit DC parameter standard set-up 1OLParameter standard value, example
Such as 1mA, suitable programmable resistance values, such as 100 Ω are set according to the digital integrated electronic circuit DC parameter standard value, and pass through
Digital multimeter 111 is measured and recorded to programmable resistance 112；
S2：I is carried out in integrated circuit test systemOLDuring parameter testing, digital integrated electronic circuit DC parameter standard can be filled
Put the certain magnitude of voltage of 1 application, such as 0.4V, IOLParameter and standard receives and sets one to source measuring unit 113 after the pumping signal
Initial voltage value, such as 0V, a pressure drop can be now produced on programmable resistance 112, according to digital multimeter 111 read can
The voltage measuring value at the both ends of programming resistors 112 and the resistance value measured in advance calculate the current value in loop now；
S3：If the current value and IOLThe error of parameter standard value exceedes error as defined in controller 12 and judges scope, then
Controller 12 adjusts the voltage application value of source measuring unit 113 by dichotomy algorithm, so as to change the current value in loop, then
It is secondary that current value in loop is measured according to digital multimeter 111.Said process is repeated several times, until current value and I in loopOL
The difference of parameter standard value is less than defined error and judges scope, now, by the current value that is measured in revised loop i.e.
It is the I that digital integrated electronic circuit DC parameter standard set-up 1 reappearsOLParameter and standard, apply voltage from integrated circuit test system and open
Begin to IOLThe whole process that parameter and standard output settles out is no more than 1s.IOH、IIL/IIH、IOS、IDDParameter and standard design principle
With IOLParameter and standard is similar.
Current parameters standard value (IOH、IIL/IIH、IOS、IDD) set with the voltage application value of integrated circuit test system, resistance
Value, the relation table of source measuring unit initial value are put as shown in table 1, table 2：
Table 1
| Current parameters standard value | Voltage application value | Resistance arranges value | Source measuring unit initial value |
| The μ A of 100nA~1 | 10mV~15V | 1MΩ | 0V |
| The μ A of 1 μ A~10 | 10mV~15V | 100kΩ | 0V |
| 10 μ A~100mA | 10mV~15V | 10kΩ | 0V |
| 100 μ A~1mA | 10mV~15V | 1kΩ | 0V |
| 1mA~100mA | 10mV~15V | 100Ω | 0V |
Table 2
| Current parameters standard value | Voltage application value | Resistance arranges value | Source measuring unit initial value |
| The μ A of -100nA~-1 | 10mV~15V | 1MΩ | 10V |
| The μ A of -1 μ A~-10 | 10mV~15V | 100kΩ | 10V |
| - 10 μ A~-100mA | 10mV~15V | 10kΩ | 10V |
| - 100 μ A~-1mA | 10mV~15V | 1kΩ | 10V |
| - 1mA~-150mA | 10mV~15V | 100Ω | 10V |
As shown in figure 4, reproduction IOL/IOH、IIL/IIH、IOS、IDDDuring parameter and standard, instrument module group 11 includes digital versatile
Table 111, programmable resistance 112 and source measuring unit 113；Programmable resistance 112 successively with device under test 2, source measuring unit
113 are connected in series to form loop, and digital multimeter 111 is connected in parallel on the both ends of programmable resistance 112, the passage of device under test 2
Negative pole end is grounded, and the both ends of the both ends of load plate 4 respectively with the passage of device under test 2 are connected, the both ends of load plate 4 also respectively with
Both ends after programmable resistance 112, source measuring unit 113 are connected in series connect, wherein, 2 preferably integrated circuit of device under test
Test system.
Embodiment 2
Reappear digital integrated electronic circuit DC parameter standard, such as：VOLDuring parameter, digital integrated electronic circuit DC parameter standard is answered
Existing method comprises the following steps that：
S1：A V is inputted in controller 12 in digital integrated electronic circuit DC parameter standard set-up 1OLParameter standard value, example
Such as 0.1V, suitable programmable resistance values, such as 1k Ω are set according to the digital integrated electronic circuit DC parameter standard value, and pass through
Digital multimeter 111 is measured and recorded to the voltage at the both ends after programmable resistance 112, the series connection of source measuring unit 113
Come；
S2：V is carried out in integrated circuit test systemOLDuring parameter testing, digital integrated electronic circuit DC parameter standard can be filled
Put the certain current value of 1 application, such as 100 μ A, VOLParameter and standard receives and sets one to source measuring unit 113 after the pumping signal
Initial voltage value, such as 0V, a pressure drop can be now produced on programmable resistance 112, according to digital multimeter 111 read can
The voltage measuring value at the both ends after programming resistors 112, the series connection of source measuring unit 113；
S3：If the magnitude of voltage and VOLThe error of parameter standard value exceedes error as defined in controller 12 and judges scope, then
Controller 12 adjusts the voltage application value of source measuring unit 113 by dichotomy algorithm, changes the magnitude of voltage of test interface 7, then
The secondary magnitude of voltage that the both ends of test interface 7 are measured according to digital multimeter 111.Said process is repeated several times, until test interface 7
The magnitude of voltage and V at both endsOLThe difference of parameter standard value is less than defined error and judges scope, now, by revised test
The magnitude of voltage at the both ends of interface 7 is the V that digital integrated electronic circuit DC parameter standard set-up 1 reappearsOLParameter and standard, from integrated circuit
Test system applies voltage and started to VOLThe whole process that parameter and standard output settles out is no more than 1s.VIK、VOHParameter and standard
Design principle and VOLParameter and standard is similar.
Voltage parameter standard value (VIK、VOL/VOH) with the electric current application value of integrated circuit test system, resistance arranges value, source
The relation table of measuring unit initial value is as shown in table 3：
Table 3
| Voltage parameter standard value | Electric current application value | Resistance arranges value | Source measuring unit initial value |
| 10mV~15V | The μ A of 10 μ A~100 | 10kΩ | 0V |
| 10mV~15V | 100 μ A~1mA | 1kΩ | 0V |
| 10mV~15V | 1mA~100mA | 100Ω | 0V |
As shown in figure 5, reproduction VIK、VOL/VOHDuring parameter and standard, instrument module group 11 includes digital multimeter 111, can compiled
Journey resistance 112 and source measuring unit 113；Programmable resistance 112 is connected in series with device under test 2, source measuring unit 113 successively
Loop is formed, digital multimeter 111 is connected in parallel on the both ends after programmable resistance 112 is connected in series with source measuring unit 113, to be measured
2 passage negative pole end ground connection is put in trial assembly, and the both ends of the both ends of load plate 4 respectively with device under test 2 are connected, and the two of load plate 4
The both ends also respectively with digital multimeter 111 are held to be connected, wherein, 2 preferably integrated circuit test system of device under test, interface is fitted
Orchestration 13 is electrically connected by test interface 7 with load plate 4, for device under test 2 and digital integrated electronic circuit DC parameter standard
Physical connection between device 1.
Further, digital integrated electronic circuit DC parameter reproducing method is further comprising the steps of：Calibrating installation 3 is by set of digits
Into circuit direct parameter and standard magnitude tracing to higher voltage order one, current standard.
Specifically, in the present embodiment：3 preferred 3458A of calibrating installation, for entering to digital integrated electronic circuit DC parameter standard
Row auto-calibration, digital integrated electronic circuit DC parameter standard is traceable to higher voltage order one, current standard.
When carrying out magnitude tracing to digital integrated electronic circuit DC parameter, such as：VOLParameter, S4 steps are as follows：
3458A is connected on the spare interface of interface adapter 13, and controller 12 is operated in the pattern of tracing to the source, by controller
V is set in 12OLParameter measurement point exports corresponding direct current parameter standard value (general to choose three measurement points in full scale), 3458A
The DC parameter standard value is measured, and measurement result is stored into controller 12 according to specified format, finally can be according to above-mentioned
Measurement result carries out error correction to the DC parameter standard of digital integrated electronic circuit DC parameter standard set-up 1, so as to ensure number
The value reliability of word integrated circuit DC parameter standard.
As shown in fig. 6, when carrying out magnitude tracing to digital integrated electronic circuit DC parameter, it is more that instrument module group 11 includes numeral
With table 111, programmable resistance 112, source measuring unit 113, source measuring unit 113 includes the first source measuring unit 113a, second
Source measuring unit 113b；Programmable resistance 112 is connected company with the first source measuring unit 113a, the second source measuring unit 113b successively
Connect to form loop, the both ends of interface adapter 13 connect with the both ends of the first source measuring unit 113a, digital multimeter 111 respectively
Connect, the both ends of calibrating installation 3 are connected with the both ends of interface adapter 13, digital multimeter 111 be connected in parallel on programmable resistance 112 with
Second source measuring unit 113b be connected in series after both ends.Wherein, 2 preferably integrated circuit test system of device under test, calibration
3 preferred 3458A of device, interface adapter 13 are electrically connected by gpib interface 8 with calibrating installation 3, are communicated and handed over by gpib interface 8
Mutual carry out auto-calibration, digital integrated electronic circuit DC parameter standard directly can be traceable to higher voltage order one, electric current mark
It is accurate.
In the present embodiment：The digit of digital multimeter 111 is not less than six and half, the preferred NI companies of digital multimeter 111
PXI-4071；The scope of programmable resistance 112 at least 10 Ω~1M Ω, the 40- of the preferred pickering companies of programmable resistance 112
297-150；First source measuring unit 113, the precision of the second source measuring unit 113 are not less than 18bit, scope at least -10V~10V,
First source measuring unit 113a, the PXI-4143 of the second preferred NI companies of source measuring unit 113b.
The magnitude tracing of digital integrated electronic circuit DC parameter standard is the core of digital integrated electronic circuit DC parameter calibrating installation 1
The heart, the side of digital integrated electronic circuit DC parameter standard set-up 1 only after magnitude tracing can be applied to the school of device under test 2
It is accurate.
Further, digital integrated electronic circuit DC parameter standard includes output low level voltage (VOL), output high level electricity
Press (VOH), output low level current (IOL), output high level of current (IOH), input clamp voltage (VIK), input low level electric current
(IIL), input high level electric current (IIH), short circuit current (IOS), source current (IDD)。
Specifically, all digital integrated electronic circuit DC parameter standards can carry out between a minimum and a maximum value it is electrodeless
Regulation, and uncertainty of measurement is better than 0.1%.
As shown in Fig. 2 digital integrated electronic circuit DC parameter standard set-up provided by the invention, including PXI instrument module groups
11st, controller 12 and interface adapter 13；
Controller 11, interface adapter 13 electrically connect with PXI instrument modules group 11 respectively；
PXI instrument modules group 11, for the measuring principle according to digital integrated electronic circuit DC parameter, reappear multigroup programmable
Digital integrated electronic circuit DC parameter standard；
Controller 12, for controlling PXI instrument modules group 11 to reappear digital integrated electronic circuit DC parameter standard, and to data
Stored, handled and shown；
Interface adapter 13, for the different principles according to corresponding to reproduction digital integrated electronic circuit parameter and standard, docking
The data-signal of the PXI instrument modules group 11 of receipts is transferred, isolated, distributed, to reappear different digital integrated electronic circuit parameters
Standard is to device under test 2.
Specifically, PXI instrument modules group 11 includes digital multimeter 111, programmable resistance 112, source measuring unit 113,
It is common according to digital integrated electronic circuit DC parameter measuring principle, digital multimeter 111, programmable resistance 112, source measuring unit 113
Same-action reappears the typical magnitude of different digital integrated electronic circuit DC parameters, has good versatility, good portability, parameter can nothing
The features such as pole is adjusted and the degree of accuracy is high.Wherein, digital multimeter 111, for carrying out voltage resistance measurement；Programmable resistance 112,
For setting any resistance value；Source measuring unit 113, for setting variable voltage value.In the present embodiment：PXI(PCI
Extensions for Instrumentation), i.e., extended towards the PCI of instrument system.PXI instrument modules group 11 passes through company
Wiring cable 5 electrically connects with interface adapter 13；PXI instrument modules group 11 passes through PXI buses or gpib bus and the electricity of controller 12
Connection, PXI instrument modules group 11 are preferably electrically connected by PXI buses 6 with controller 12, GPIB, i.e. General-Purpose
Interface Bus, general purpose interface bus, it is the bus that a kind of equipment connects with computer.
Further, digital integrated electronic circuit DC parameter standard includes output low level voltage (VOL), output high level electricity
Press (VOH), output low level current (IOL), output high level of current (IOH), input clamp voltage (VIK), input low level electric current
(IIL), input high level electric current (IIH), short circuit current (IOS), source current (IDD)。
Specifically, all digital integrated electronic circuit DC parameter standards can carry out between a minimum and a maximum value it is electrodeless
Regulation, and uncertainty of measurement is better than 0.1%.
Further, PXI instrument modules group 11 includes digital multimeter 111, programmable resistance 112 and source measuring unit
113；Programmable resistance 112 is connected in series to form loop, digital multimeter with device under test 2, source measuring unit 113 successively
111 are connected in parallel on the both ends of programmable resistance 112, and the I of external equipment is introduced for realizingOL/IOH、IIL/IIH、IOS、IDDParameter mark
Accurate reproduction.
Specifically, in the present embodiment：The digit of digital multimeter 111 is not less than six and half, and 111 preferred NI of digital multimeter is public
The PXI-4071 of department；The scope of programmable resistance 112 at least 10 Ω~1M Ω, the preferred pickering companies of programmable resistance 112
40-297-150；The precision of source measuring unit 113 is not less than 18bit, scope at least -10V~10V, 113 preferred NI of source measuring unit
The PXI-4143 of company.
Further, PXI instrument modules group 11 includes digital multimeter 111, programmable resistance 112 and source measuring unit
113；Programmable resistance 112 is connected in series to form loop, digital multimeter with device under test 2, source measuring unit 113 successively
Both ends after 111 are connected in parallel on programmable resistance 112, source measuring unit 113 is connected in series, external equipment is introduced for realizing
VIK、VOL/VOHThe reproduction of parameter and standard.
Specifically, in the present embodiment：The digit of digital multimeter 111 is not less than six and half, and 111 preferred NI of digital multimeter is public
The PXI-4071 of department；The scope of programmable resistance 112 at least 10 Ω~1M Ω, the preferred pickering companies of programmable resistance 112
40-297-150；First source measuring unit 113, the precision of the second source measuring unit 113 not less than 18bit, scope at least -10V~
10V, the first source measuring unit 113a, the PXI-4143 of the second preferred NI companies of source measuring unit 113b.
In the present embodiment：PXI instrument modules group 11 includes digital multimeter 111, programmable resistance 112, source measuring unit
113, source measuring unit 113 includes the first source measuring unit 113a, the second source measuring unit 113b；Programmable resistance 112 is successively
Loop is connected in series to form with the first source measuring unit 113a, the second source measuring unit 113b, digital multimeter 111 is connected in parallel on can
The source measuring unit 113b of programming resistors 112 and second be connected in series after both ends, can use for the first source measuring unit 113a generations
The digital integrated electronic circuit DC parameter standard inside digital integrated electronic circuit DC parameter standard set-up 1 is realized for device under test 2
Reproduction process.
Preferably, the digit of digital multimeter 111 is not less than six and half, the PXI- of the preferred NI companies of digital multimeter 111
4071；The scope of programmable resistance 112 at least 10 Ω~1M Ω, the 40-297- of the preferred pickering companies of programmable resistance 112
150；First source measuring unit 113, the precision of the second source measuring unit 113 are not less than 18bit, scope at least -10V~10V, and first
Source measuring unit 113a, the PXI-4143 of the second preferred NI companies of source measuring unit 113b；
It is understood that for the person of ordinary skill of the art, it can be conceived with the technique according to the invention and done
Go out other various corresponding changes and deformation, and all these changes and deformation should all belong to the protection model of the claims in the present invention
Enclose.
Claims (7)
- A kind of 1. digital integrated electronic circuit DC parameter standard reproducing method, it is characterised in that：Comprise the following steps：S1：Controller (12) in digital integrated electronic circuit DC parameter standard set-up (1) sets digital integrated electronic circuit DC parameter Standard value；S2：PXI instrument modules group (11) in digital integrated electronic circuit DC parameter standard set-up (1) is according to digital integration electricity Road DC parameter standard value and device under test (2) to the voltage at digital integrated electronic circuit DC parameter standard set-up (1) both ends/ Electric current application value is being sequentially connected in series the survey formed by controller (12), PXI instrument modules group (11), device under test (2) Try to reappear digital integrated electronic circuit DC parameter in loop, the test that controller (12) receives PXI instrument modules group (11) reproduction is returned Digital integrated electronic circuit DC parameter in road, and compared with the digital integrated electronic circuit DC parameter standard value, missed Poor test result；S3：If the error testing result, which exceedes error as defined in controller (12), judges scope, controller (12) utilizes two points Method algorithm is modified to the digital integrated electronic circuit DC parameter in test loop, until error testing result is less than defined miss Difference judges scope, and revised digital integrated electronic circuit DC parameter is that digital integrated electronic circuit DC parameter standard set-up (1) is multiple Existing digital integrated electronic circuit DC parameter standard.
- 2. digital integrated electronic circuit DC parameter standard reproducing method according to claim 1, it is characterised in that：Also include with Lower step：S4：Digital integrated electronic circuit DC parameter typical magnitude is traceable to higher voltage order one/electric current mark by calibrating installation (3) It is accurate.
- 3. digital integrated electronic circuit DC parameter standard reproducing method according to claim 1 or 2, it is characterised in that：It is described Digital integrated electronic circuit DC parameter standard includes output low level voltage (VOL), output high level voltage (VOH), export low level Electric current (IOL), output high level of current (IOH), input clamp voltage (VIK), input low level electric current (IIL), input high level electricity Flow (IIH), short circuit current (IOS), source current (IDD)。
- A kind of 4. digital integrated electronic circuit DC parameter standard set-up, it is characterised in that：Including PXI instrument modules group (11), control Device (12) and interface adapter (13)；The controller (11), interface adapter (13) electrically connect with the PXI instrument modules group (11) respectively；The PXI instrument modules group (11), for the measuring principle according to digital integrated electronic circuit DC parameter, reproduction is multigroup to compile Journey digital integrated electronic circuit DC parameter standard；The controller (12), for controlling PXI instrument modules group (11) the reproduction digital integrated electronic circuit DC parameter standard, And data are stored, handled and shown；For utilizing dichotomy algorithm to the digital integrated electronic circuit direct current in test loop Parameter is modified, and judges scope until error testing result is less than defined error；The interface adapter (13), it is right for the different principles according to corresponding to reproduction digital integrated electronic circuit parameter and standard The data-signal of the PXI instrument modules group (11) of reception is transferred, isolated, distributed, to reappear different digital integrated electronic circuits Parameter and standard is to device under test (2).
- 5. digital integrated electronic circuit DC parameter standard set-up according to claim 4, it is characterised in that：The digital integration Circuit direct parameter and standard includes output low level voltage (VOL), output high level voltage (VOH), export low level current (IOL), output high level of current (IOH), input clamp voltage (VIK), input low level electric current (IIL), input high level electric current (IIH), short circuit current (IOS), source current (IDD)。
- 6. the digital integrated electronic circuit DC parameter standard set-up according to claim 4 or 5, it is characterised in that：The PXI instrument Device module group (11) includes digital multimeter (111), programmable resistance (112) and source measuring unit (113)；The programmable electricity Resistance (112) is connected in series to form loop with the device under test (2), the source measuring unit (113) successively, and the numeral is more The both ends of the programmable resistance (112) are connected in parallel on table (111).
- 7. the digital integrated electronic circuit DC parameter standard set-up according to claim 4 or 5, it is characterised in that：The PXI instrument Device module group (11) includes digital multimeter (111), programmable resistance (112) and source measuring unit (113)；The programmable electricity Resistance (112) is connected in series to form loop, the digital multimeter with the device under test (2), source measuring unit (113) successively (111) it is connected in parallel on the programmable resistance (112), the both ends after source measuring unit (113) is connected in series.
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| Application Number | Priority Date | Filing Date | Title |
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| CN201510458064.0A CN104991214B (en) | 2015-07-30 | 2015-07-30 | Digital integrated electronic circuit DC parameter standard reproducing method and standard set-up |
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| CN201510458064.0A CN104991214B (en) | 2015-07-30 | 2015-07-30 | Digital integrated electronic circuit DC parameter standard reproducing method and standard set-up |
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| Publication Number | Publication Date |
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| CN104991214A CN104991214A (en) | 2015-10-21 |
| CN104991214B true CN104991214B (en) | 2017-12-29 |
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| CN109375126A (en) * | 2018-09-30 | 2019-02-22 | 中国船舶重工集团公司第七0九研究所 | Integrated circuit test system self-checking device and method based on digital analog converter |
| CN109459717A (en) * | 2018-11-21 | 2019-03-12 | 西安航天计量测试研究所 | A kind of current parameters calibration system and method based on method of offset |
| CN112731256B (en) * | 2020-12-25 | 2023-03-03 | 北京航天测控技术有限公司 | Calibration system and method |
| CN113985243A (en) * | 2021-09-06 | 2022-01-28 | 中国船舶重工集团公司第七0九研究所 | High-precision operational amplifier test system calibration method and device |
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| CN101592717B (en) * | 2009-06-30 | 2011-09-07 | 深圳市科陆电子科技股份有限公司 | Method and system for automatically calibrating electrical instrument |
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