CN203281521U - IC (integrated circuit) testing sorted storing device - Google Patents
IC (integrated circuit) testing sorted storing device Download PDFInfo
- Publication number
- CN203281521U CN203281521U CN2013202316160U CN201320231616U CN203281521U CN 203281521 U CN203281521 U CN 203281521U CN 2013202316160 U CN2013202316160 U CN 2013202316160U CN 201320231616 U CN201320231616 U CN 201320231616U CN 203281521 U CN203281521 U CN 203281521U
- Authority
- CN
- China
- Prior art keywords
- charging tray
- unit
- checked
- testing
- district
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn - After Issue
Links
Images
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The utility model relates to the technical field of IC (integrated circuit) split charging, and discloses an IC testing sorted storing device, which includes an IC testing unit, an IC material tray unit, a first IC conveying unit, a rotary tray unit, a rotary operation unit, and a second IC conveying unit, wherein the IC material tray unit includes a to-be-tested material tray storing position and a to-be-tested tray storing position; the rotary tray unit is arranged at the front end of the to-be-tested material tray storing position; the first IC conveying unit is positioned between the rotary tray unit and the to-be-tested tray storing position; the rotary operation unit is positioned on one side of the rotary tray unit, and includes one or more rotary arms; the rotary arms can be rotated and positioned above the rotary tray unit, the IC testing unit and the second IC conveying unit in a circulating manner, so that ICs can be sucked, detected and temporarily stored; the second IC conveying unit can be used for placing the detected ICs on different to-be-discharged material trays as per testing results. The IC testing sorted storing device can be used for IC high-speed testing and sorting.
Description
Technical field
The utility model relates to integrated circuit packing technical field, particularly a kind of IC testing classification storage device.
Background technology
Will press grade separation after superseded substandard products through detecting after the IC integrated package is produced, detection of the prior art and assorting process are all that semi-automation is completed.
Chinese patent " variable pitch type IC classifier " (application number: 200810129316.5) disclose a kind of slide rail type IC sorter, coordinate horizontal slide rail and IC suction nozzle by linear motor, realize continuously IC being classified, the IC suction nozzle can be regulated by guiding mechanism, is applicable to the IC of different size.But this IC sorter architecture is complicated, and installation and debugging are inconvenient.Use the mode of slide rail to be difficult to realize classification at a high speed, and its testing agency can not be integrated with sorting mechanism, operating efficiency is low.
The utility model content
The purpose of this utility model is in order to solve the problems of the technologies described above, and a kind of IC testing classification storage device is provided, to realizing high speed test and the classification to IC.
The technical scheme that the utility model is taked is:
a kind of IC testing classification storage device, comprise the IC detecting unit, IC charging tray unit, it is characterized in that, also comprise an IC supply unit, turntable unit, the rotary operation unit, the 2nd IC supply unit, described IC charging tray unit comprises that charging tray to be checked deposits position, treat that discharge plate deposits position, described turntable unit is arranged on described charging tray to be checked and deposits the front end of position, a described IC supply unit is deposited between position in described turntable unit and described charging tray to be checked, be used for the IC of charging tray to be checked is delivered to described turntable unit, described rotary operation unit is positioned at a side of described turntable unit, described rotary operation unit comprises at least one pivoted arm, the circulation of described pivoted arm can rotational positioning to described turntable unit top, described IC detecting unit top and described the 2nd IC supply unit top, realize successively drawing IC, detect IC and temporary IC, the IC that described the 2nd IC supply unit is completed detection is positioned over respectively different treating on discharge plate according to its testing result.
Further, described charging tray unit also comprises the first charging tray district, the second charging tray district, charging tray input mechanism to be checked, empty tray conveyor structure, finished product charging tray output mechanism, described the first charging tray district is used for depositing charging tray to be checked, described the second charging tray district is used for depositing treating discharge plate, described charging tray input mechanism to be checked is sent to described charging tray to be checked with described charging tray to be checked and deposits position, the to be checked empty charging tray that described empty tray conveyor structure will take IC is sent to describedly treats that discharge plate deposits position, and described finished product charging tray output mechanism is exported the finished product charging tray in the second charging tray district.
Further, on the circumference of described turntable unit, uniform 8 to 16 IC storage tanks, can place 4 to 8 IC in each IC storage tank.
Further, described rotary operation unit comprises 4 to 8 pivoted arms, and each pivoted arm is provided with the absorption parts, and described absorption parts can realize simultaneously that once the suction of 4 to 8 IC puts.
Further, the pivoted arm of described rotary operation unit also can be positioned a position that abandons waste product, is provided with ash can below the described position that abandons waste product.
Further, described the 2nd IC supply unit comprises IC temporary storage mechanism and IC conveying mechanism, and the IC that described IC temporary storage mechanism will detect is delivered to the finished product charging tray by described IC conveying mechanism with finished product IC after being stored to some.
Further, described charging tray to be checked is deposited position for a plurality of, all is arranged at described the first charging tray district; Describedly treat that discharge plate deposits position for a plurality of, all be arranged at the second charging tray district.
Further, a described IC supply unit comprises the absorption parts, and described absorption parts are drawn the IC on charging tray to be checked to be positioned over described turntable unit by connecting gear, and described absorption parts can realize that once the suction of 4 to 8 IC puts simultaneously.
Further, described IC temporary storage mechanism comprises IC storage tank, motor and drive lead screw, and described motor drives described screw mandrel described IC storage tank is moved to working area.
Further, a side of described IC storage tank arranges Compress Spring, and opposite side arranges cylinder, by described cylinder and Compress Spring, described IC storage tank is positioned, and in described cylinder side, a spacing adjusting micrometer also is set.
The beneficial effects of the utility model are:
High speed test and classification at a high speed can be realized by servomotor in turntable unit and rotary operation unit;
By the structure of IC temporary storage mechanism, make this device realize different size IC detection and store classifiedly.
Description of drawings
Accompanying drawing 1 is structural representation of the present utility model;
Accompanying drawing 2 is perspective view of temporary storage mechanism;
Accompanying drawing 3 is perspective view of temporary platform.
Label in figure is respectively:
1.IC charging tray unit; 11. charging tray to be checked is deposited position;
14. treat discharge plate; 15. the first charging tray district;
16. the second charging tray district; 17. charging tray input mechanism to be checked;
18. empty tray conveyor structure; 2. an IC supply unit;
21. absorption parts; 3. turntable unit;
31.IC storage tank; 4. rotary operation unit;
41. pivoted arm; 42. absorption parts;
5.IC detecting unit; 6. the 2nd IC supply unit;
61.IC temporary storage mechanism; 62.IC conveying mechanism;
63.IC storage tank; 64. motor;
65. drive lead screw; 66. Compress Spring;
67. cylinder; 68. spacing adjusting micrometer;
1A, 1B, 1C, 1D, 1E. charging tray zone; 2A, 2B, 2C, 2D, 2E. charging tray zone.
The specific embodiment
Elaborate below in conjunction with the specific embodiment of accompanying drawing to the utility model IC testing classification storage device.
referring to accompanying drawing 1, IC testing classification storage device comprises IC charging tray unit 1, the one IC supply unit 2, turntable unit 3, rotary operation unit 4, IC detecting unit 5, the 2nd IC supply unit 6, IC charging tray unit 1 comprise charging tray to be checked deposit the position 11, treat discharge plate deposit the position 12, the first charging tray district 15, the second charging tray district 16, charging tray input mechanism 17 to be checked, empty tray conveyor structure 18, finished product charging tray output mechanism, the first charging tray district 15 is used for depositing charging tray 13 to be checked, the second charging tray district 16 is used for depositing treating discharge plate 14, charging tray input mechanism 17 to be checked is sent to charging tray to be checked with charging tray 13 to be checked and deposits position 11, the charging tray to be checked 13 that empty tray conveyor structure 18 will take IC is sent to treats that discharge plate deposits position 12, finished product charging tray output mechanism is exported the finished product charging tray in the second charging tray district.Charging tray to be checked is deposited position 11 and is treated that discharge plate deposits position 12 and can be made as a plurality ofly, is arranged at respectively the first charging tray district 15 and the second charging tray district 16.Turntable unit 3 is arranged on charging tray to be checked and deposits the front end of position 11, and uniform 8 to 16 IC storage tanks 31 on the circumference of turntable unit 3 can be placed 4 to 8 IC in each IC storage tank 31.The one IC supply unit 2 is deposited between position 11 in turntable unit 3 and charging tray to be checked, be used for the IC of charging tray 13 to be checked is delivered to turntable unit 3, the one IC supply unit 2 comprises draws parts 21, draw after parts 21 are drawn the IC on charging tray to be checked by connecting gear and be positioned over turntable unit 3, draw parts 21 and can realize that once the suction of 4 to 8 IC puts simultaneously.Rotary operation unit 4 is positioned at a side of turntable unit 3, rotary operation unit 4 comprises at least one pivoted arm 41, preferred pivoted arm number is 4 to 8, pivoted arm 41 can cycle rotation be positioned to the top of turntable unit 3, top and the 2nd IC supply unit 6 tops of IC detecting unit 5, the function that realize successively drawing IC, detects IC and temporary IC.In addition, the pivoted arm 41 of rotary operation unit 4 also can be positioned a position that abandons waste product, is provided with the ash can (not shown) below abandoning the position of waste product.Each pivoted arm 41 of rotary operation unit 4 is provided with draws parts 42, draws parts 42 and can realize that once the suction of 4 to 8 IC puts simultaneously.The IC that the 2nd IC supply unit 6 is completed detection is positioned over respectively different treating on discharge plate 14 according to its testing result.The 2nd IC supply unit 6 comprises IC temporary storage mechanism 61 and IC conveying mechanism 62, and the IC that IC temporary storage mechanism 61 will detect is delivered to the finished product charging tray by IC conveying mechanism 62 with finished product IC after being stored to some.
Referring to accompanying drawing 2,3, IC temporary storage mechanism 61 comprises IC storage tank 63, motor 64 and drive lead screw 65, and motor 64 drives screw mandrel 65 IC storage tank 63 is moved to working area.A side at IC storage tank 63 arranges Compress Spring 66, and opposite side arranges cylinder 67, by cylinder 67 and 66 pairs of IC storage tanks 63 of Compress Spring, positions, and in a side of cylinder 67, a spacing adjusting micrometer 68 also is set.
Referring to accompanying drawing 1, below the course of work of equipment of the present utility model is described in detail, at first filling the charging tray that does not detect IC, stack the 1A district and stack, by charging tray input mechanism 17 to be checked, charging tray is transported to the 2A district and positions.The connecting gears of the prior art such as the optional belt transmission of charging tray input mechanism 17 to be checked, an IC supply unit 2 is drawn IC and is transported on rotating disk 3 and deposits by drawing parts 21.Then draw IC by rotary operation unit 4, and rotate to IC detecting unit 5 and detect, after detection is completed again position of rotation deposit in the pallet of IC temporary storage mechanism 61, then carry by IC temporary storage mechanism 61 again, by the IC conveying mechanism, by nozzle unit, draw and be transported to 2C, 2D, three zones of 2E and remove to deposit the IC of different brackets.
1A, 1B, 1C, 1D, 1E are be used to the zone that stacks charging tray, can stack a plurality of charging trays, can the saving personnel repeat to place charging tray.It comprises in the 1A zone fill do not detect IC charging tray, the charging tray of 1B zone hollow, deposit charging tray for detection of complete IC by 3 grades in 1C, 1D, 1E zone.
After placement in the 1A zone does not detect the charging tray of IC, by charging tray input mechanism 17 to be checked, charging tray is transported to the 2A district and positions, conveniently do not detect the IC conveying mechanism and draw.After not detecting IC and having been drawn, by empty tray conveyor structure 18, blank panel is transported to the 2B district and positions.After the charging tray in 2C, 2D, 2E district is filled the IC that has detected again by conveying mechanism be transported to 1C, 1D, deposit in the 1E district.Simultaneously by empty tray conveyor structure 18, the blank panel in 2B district is transported to 2C, 2D, 2E district.After the not detection IC on the charging tray in 2A district has been drawn, carry empty charging tray to deposit to 2B district by charging tray input mechanism 17 to be checked, after the charging tray in 2C, 2D, 2E district is filled IC again by the charging tray conveyances of charging tray input mechanism 17 handle skies to be checked to 2C, 2D, 2E district.After the charging tray of filling IC was sent to the 2A district, an IC supply unit 2 was drawn after IC to be transported in turntable unit 3 by nozzle unit 21 and is deposited.Wherein nozzle unit 21 is furnished with 4 suction nozzles, can draw simultaneously 4 IC.Turntable unit 3 drives cycle rotation by direct driving motor, ceaselessly to detecting IC, is not rotated conveying.Rotary operation unit 4 is to carry and do not detect IC behind certain position when turntable unit 3, and absorption parts 42 absorptions on it does not detect IC and carry out the IC detection to detecting unit 5, draw IC when rotary operation unit 4 and are held down and detect after detecting unit 5.Be transported on temporary storage mechanism 61 in the absorption rotation after having detected.Temporary storage mechanism 61 is used for the conveying to the IC that detected at a high speed.Once can carry 8 IC.Carry the IC that has detected to gettering site by temporary storage mechanism 61, by the IC conveying mechanism 62 that IC detects after completing, carry IC to store classifiedly to 2C, 2D, 2E district.
The utility model is mainly in order to realize the IC high speed test, to store classifiedly, the charging tray full automatic treatment, and mechanism is compacter, and speed is faster and IC design surveys machine equipment.Charging tray input mechanism 17 to be checked is a lifting body, utilize the SERVO CONTROL charging tray to be placed on a belt conveyor, carry charging tray to locate to the charging tray district by belt conveyor, drawing IC by an IC supply unit again goes to deposit to rotating disk, after IC has been drawn, by empty tray conveyor structure 18, the blank panel conveyance is deposited to the blank panel district.
The lifting body utilization private of charging tray takes motor and drives screw mandrel drive lifting pin jacking charging tray, and the cooperation of recycling cylinder gripping charging tray is placed into charging tray on the charging tray belt conveyor.Belt conveyor utilizes cylinder to carry out the clamping and positioning charging tray, then the slide unit of being controlled on belt by stepper motor goes to fix to locating, and waits for that charging tray input mechanism 17 to be checked draws IC.Empty tray conveyor structure 18 has comprised and has moved left and right conveying mechanism, and the cylinder gripping body utilizes gripping cylinder gripping blank panel to move to blank panel by translation mechanism and goes to place.With respect to existing IC test machine, so just saved and manually removed to place charging tray, full automatic scheduling blank panel, saved time of artificial shutdown emptying dish, improved greatly production efficiency.
Because the IC conveying mechanism 62 that IC detects after completing need to divide the IC that has detected 3 grades to place, the needed like this time is just long, in order to be the production efficiency that improves the IC checkout equipment, reduce IC by temporary storage mechanism 61 twice temporary IC and detect the course of conveying back and forth of the IC conveying mechanism 62 after completing, allow it draw simultaneously 8 IC and deposit.With respect to temporary storage mechanism after the IC test that first has, so just shortened the time of delivery once of the conveying mechanism after the IC detection is completed, improved greatly production efficiency.Temporary storage mechanism described in the utility model, be applicable to the IC high speed test, particularly needs the IC that stores classifiedly testing equipment, solved the storage problem after the IC high speed test, provide a kind of be better than existing IC and detect after temporary storage mechanism, operating efficiency is higher.
Rotary operation unit 4 comprises the turning arm 41 that direct-drive motor is controlled, and it has configured 4 turning arms 41, the parts of absorption up and down 42 that cylinder is controlled.Gettering site on 4 turning arms of rotary operation unit 4 configuration, corresponding rotating disk of arm, the corresponding IC detecting position of arm, the corresponding IC temporary storage mechanism of arm is placed position, and an arm free, can add other device, such as waste product abandons.When drawing IC, can put down simultaneously detection.So not only saved the time but also economized design space.
The above is only preferred embodiment of the present utility model; should be pointed out that for those skilled in the art, under the prerequisite that does not break away from the utility model principle; can also make some improvements and modifications, these improvements and modifications also should be considered as protection domain of the present utility model.
Claims (10)
1. IC testing classification storage device, comprise the IC detecting unit, IC charging tray unit, it is characterized in that, also comprise an IC supply unit, turntable unit, the rotary operation unit, the 2nd IC supply unit, described IC charging tray unit comprises that charging tray to be checked deposits position, treat that discharge plate deposits position, described turntable unit is arranged on described charging tray to be checked and deposits the front end of position, a described IC supply unit is deposited between position in described turntable unit and described charging tray to be checked, be used for the IC of charging tray to be checked is delivered to described turntable unit, described rotary operation unit is positioned at a side of described turntable unit, described rotary operation unit comprises at least one pivoted arm, the circulation of described pivoted arm can rotational positioning to described turntable unit top, described IC detecting unit top and described the 2nd IC supply unit top, realize successively drawing IC, detect IC and temporary IC, the IC that described the 2nd IC supply unit is completed detection is positioned over respectively different treating on discharge plate according to its testing result.
2. IC testing classification storage device according to claim 1, it is characterized in that: described charging tray unit also comprises the first charging tray district, the second charging tray district, charging tray input mechanism to be checked, the empty tray conveyor structure, finished product charging tray output mechanism, described the first charging tray district is used for depositing charging tray to be checked, described the second charging tray district is used for depositing treating discharge plate, described charging tray input mechanism to be checked is sent to described charging tray to be checked with described charging tray to be checked and deposits position, the to be checked empty charging tray that described empty tray conveyor structure will take IC is sent to describedly treats that discharge plate deposits position, described finished product charging tray output mechanism is exported the finished product charging tray in the second charging tray district.
3. IC testing classification storage device according to claim 1 is characterized in that: uniform 8 to 16 IC storage tanks on the circumference of described turntable unit, can place 4 to 8 IC in each IC storage tank.
4. IC testing classification storage device according to claim 1, it is characterized in that: described rotary operation unit comprises 4 to 8 pivoted arms, and each pivoted arm is provided with the absorption parts, described absorption parts can realize that once the suction of 4 to 8 IC puts simultaneously.
5. IC testing classification storage device according to claim 1, it is characterized in that: the pivoted arm of described rotary operation unit also can be positioned a position that abandons waste product, is provided with ash can below the described position that abandons waste product.
6. the described IC testing classification of any one storage device according to claim 1 to 5, it is characterized in that: described the 2nd IC supply unit comprises IC temporary storage mechanism and IC conveying mechanism, and the IC that described IC temporary storage mechanism will detect is delivered to the finished product charging tray by described IC conveying mechanism with finished product IC after being stored to some.
7. the described IC testing classification of any one storage device according to claim 1 to 5 is characterized in that: described charging tray to be checked is deposited position for a plurality of, all is arranged at described the first charging tray district; Describedly treat that discharge plate deposits position for a plurality of, all be arranged at the second charging tray district.
8. the described IC testing classification of any one storage device according to claim 1 to 5, it is characterized in that: a described IC supply unit comprises the absorption parts, described absorption parts are drawn the IC on charging tray to be checked to be positioned over described turntable unit by connecting gear, and described absorption parts can realize that once the suction of 4 to 8 IC puts simultaneously.
9. IC testing classification storage device according to claim 6, it is characterized in that: described IC temporary storage mechanism comprises IC storage tank, motor and drive lead screw, described motor drives described screw mandrel described IC storage tank is moved to working area.
10. IC testing classification storage device according to claim 9, it is characterized in that: a side of described IC storage tank arranges Compress Spring, opposite side arranges cylinder, by described cylinder and Compress Spring, described IC storage tank is positioned, in described cylinder side, a spacing adjusting micrometer also is set.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2013202316160U CN203281521U (en) | 2013-04-28 | 2013-04-28 | IC (integrated circuit) testing sorted storing device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2013202316160U CN203281521U (en) | 2013-04-28 | 2013-04-28 | IC (integrated circuit) testing sorted storing device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN203281521U true CN203281521U (en) | 2013-11-13 |
Family
ID=49537897
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2013202316160U Withdrawn - After Issue CN203281521U (en) | 2013-04-28 | 2013-04-28 | IC (integrated circuit) testing sorted storing device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN203281521U (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103240229A (en) * | 2013-04-28 | 2013-08-14 | 嘉兴景焱智能装备技术有限公司 | Sorted storing device for IC (Integrated Circuit) test |
| CN105301023A (en) * | 2015-11-04 | 2016-02-03 | 无锡日联科技股份有限公司 | IC material plate detection device based on X-ray detection |
-
2013
- 2013-04-28 CN CN2013202316160U patent/CN203281521U/en not_active Withdrawn - After Issue
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103240229A (en) * | 2013-04-28 | 2013-08-14 | 嘉兴景焱智能装备技术有限公司 | Sorted storing device for IC (Integrated Circuit) test |
| CN105301023A (en) * | 2015-11-04 | 2016-02-03 | 无锡日联科技股份有限公司 | IC material plate detection device based on X-ray detection |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN103240229B (en) | Sorted storing device for IC (Integrated Circuit) test | |
| CN205995809U (en) | A kind of the System of Sorting Components | |
| CN107521976B (en) | A kind of automatic charging device | |
| CN208103189U (en) | Voice coil motor automatic detection device | |
| CN204210837U (en) | A kind of test tube labeling conveyer | |
| CN206142376U (en) | Machine of number is examined in full -automatic transport of gloves | |
| CN203143685U (en) | Automatic feeding device for lighter gas boxes | |
| CN105217249B (en) | A kind of conveying device of medical accessory kludge | |
| CN105618934A (en) | Laser processing equipment for full-automatic solar battery piece | |
| CN206225390U (en) | Silicon chip sorts loading and unloading robot system | |
| CN203281521U (en) | IC (integrated circuit) testing sorted storing device | |
| CN107377411A (en) | A kind of wooden packing box sorting equipment | |
| CN208256485U (en) | A kind of electrolytic capacitor contains dipping machine | |
| CN206087504U (en) | Biological reagent strips cuts equipment for packing | |
| CN215844318U (en) | Automatic plasma sorting device that chooses of plasma bag | |
| CN205289031U (en) | Panel computer window glass slicer | |
| CN207494934U (en) | A kind of Full-automatic screw locking machine | |
| CN106540888B (en) | A kind of waste electric energy meter detects retracting device and its application method automatically | |
| CN110525864B (en) | Automatic unloading of going up of member and go up and put in storage device by sorting | |
| CN108453063B (en) | Automatic blanking system after OCV test matched component sorting of soft package lithium battery | |
| CN207174863U (en) | Motor feed mechanism | |
| CN207909905U (en) | Solar cell auto plate separation equipment | |
| CN206935829U (en) | A kind of IC chip testing, sorting equipment | |
| CN206639808U (en) | A kind of battery case induction system | |
| CN206466635U (en) | One kind weaving automatic workpiece loading device |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| AV01 | Patent right actively abandoned |
Granted publication date: 20131113 Effective date of abandoning: 20141210 |
|
| RGAV | Abandon patent right to avoid regrant |