CN103240229B - Sorted storing device for IC (Integrated Circuit) test - Google Patents

Sorted storing device for IC (Integrated Circuit) test Download PDF

Info

Publication number
CN103240229B
CN103240229B CN201310155996.9A CN201310155996A CN103240229B CN 103240229 B CN103240229 B CN 103240229B CN 201310155996 A CN201310155996 A CN 201310155996A CN 103240229 B CN103240229 B CN 103240229B
Authority
CN
China
Prior art keywords
charging tray
unit
checked
district
storage
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN201310155996.9A
Other languages
Chinese (zh)
Other versions
CN103240229A (en
Inventor
朱玉萍
岑刚
焦建华
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Jiaxing Jingyan Intelligent Equipment Technology Co Ltd
Original Assignee
Jiaxing Jingyan Intelligent Equipment Technology Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Jiaxing Jingyan Intelligent Equipment Technology Co Ltd filed Critical Jiaxing Jingyan Intelligent Equipment Technology Co Ltd
Priority to CN201310155996.9A priority Critical patent/CN103240229B/en
Publication of CN103240229A publication Critical patent/CN103240229A/en
Application granted granted Critical
Publication of CN103240229B publication Critical patent/CN103240229B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Abstract

The invention relates to the technical field of packaging of integrated circuits, and discloses a sorted storing device for IC (Integrated Circuit) test. The device comprises an IC detection unit, an IC material plate unit, a first IC conveying unit, a rotary disc unit, a rotary operational unit and a second IC conveying unit, wherein the IC material plate unit comprises a storing position for the material plate to be detected and a storing position for the material plate to be placed. The rotary unit is arranged at the front end of the storing position for the material plate to be detected. The first IC conveying unit is located between the rotary disc unit and the storing position for the material plate to be detected. The rotary operational unit is located at one side of the rotary disc unit and comprises at least one rotary arm which circulates to be rotatably positioned above the rotary disc unit, the IC detection unit and the second conveying unit so as to sequentially absorb, detect and temporally store the IC. The second IC conveying unit respectively places the ICs after detection on different material plates to be placed according to the detection results. According to the device, high speed test and sorting of ICs can be realized.

Description

IC testing classification storage device
Technical field
The present invention relates to integrated circuit packing technical field, particularly a kind of IC testing classification storage device.
Background technology
IC integrated package will, through detecting, be pressed grade separation after superseded substandard products after producing, and detection of the prior art and assorting process are all that semi-automation completes.
Chinese patent " variable pitch type IC classifier " (application number: 200810129316.5) disclose a kind of slide rail type IC sorter, coordinate horizontal slide rail and IC suction nozzle by linear motor, realize and continuously IC being classified, IC suction nozzle can regulate by guiding mechanism, is applicable to the IC of different size.But this IC sorter architecture complexity, installation and debugging inconvenience.Use the mode of slide rail to be difficult to realize classification at a high speed, and its testing agency can not be integrated with sorting mechanism, operating efficiency is low.
Summary of the invention
To the object of the invention is in order solving the problems of the technologies described above, a kind of IC testing classification storage device to be provided, to realizing high speed test and the classification to IC.
The technical scheme that the present invention takes is:
A kind of IC testing classification storage device, comprise IC detecting unit, IC charging tray unit, it is characterized in that, also comprise an IC supply unit, turntable unit, rotary operation unit, the 2nd IC supply unit, described IC charging tray unit comprises that charging tray to be checked deposits position, treat that discharge plate deposits position, described turntable unit is arranged on described charging tray to be checked and deposits the front end of position, a described IC supply unit is deposited between position in described turntable unit and described charging tray to be checked, for the IC of charging tray to be checked is delivered to described turntable unit, described rotary operation unit is positioned at a side of described turntable unit, described rotary operation unit comprises at least one pivoted arm, the circulation of described pivoted arm can rotational positioning to described turntable unit top, described IC detecting unit top and described the 2nd IC supply unit top, realize successively and draw IC, detect IC and temporary IC, the IC that described the 2nd IC supply unit completes detection is positioned over respectively different treating on discharge plate according to its testing result.
Further, described charging tray unit also comprises the first charging tray district, the second charging tray district, charging tray input mechanism to be checked, empty tray conveyor structure, finished product charging tray output mechanism, described the first charging tray district is used for depositing charging tray to be checked, described the second charging tray district is used for depositing and treats discharge plate, described charging tray input mechanism to be checked is sent to described charging tray to be checked by described charging tray to be checked and deposits position, described in described empty tray conveyor structure is sent to the to be checked empty charging tray that takes IC, treat that discharge plate deposits position, described finished product charging tray output mechanism is by the finished product charging tray output in the second charging tray district.
Further, on the circumference of described turntable unit, uniform 8 to 16 IC storage tanks, can place 4 to 8 IC in each IC storage tank.
Further, described rotary operation unit comprises 4 to 8 pivoted arms, and each pivoted arm is provided with absorption parts, and the suction that described absorption parts once can be realized 4 to 8 IC is simultaneously put.
Further, the pivoted arm of described rotary operation unit also can be positioned a position that abandons waste product, below the described position that abandons waste product, is provided with ash can.
Further, described the 2nd IC supply unit comprises IC temporary storage mechanism and IC conveying mechanism, and described IC temporary storage mechanism is delivered to finished product charging tray by described IC conveying mechanism by finished product IC after the IC detecting is stored to some.
Further, described charging tray to be checked is deposited position for multiple, is all arranged at described the first charging tray district; Describedly treat that discharge plate deposits position for multiple, be all arranged at the second charging tray district.
Further, a described IC supply unit comprises absorption parts, and described absorption parts are drawn IC on charging tray to be checked to be positioned over described turntable unit by connecting gear, and the suction that described absorption parts once can be realized 4 to 8 IC is simultaneously put.
Further, described IC temporary storage mechanism comprises IC storage tank, motor and drive lead screw, and described motor drives described screw mandrel that described IC storage tank is moved to working area.
Further, a side of described IC storage tank arranges Compress Spring, and opposite side arranges cylinder, by described cylinder and Compress Spring, described IC storage tank is positioned, and in described cylinder side, a spacing adjusting micrometer is also set.
The invention has the beneficial effects as follows:
High speed test and classification at a high speed can be realized by servomotor in turntable unit and rotary operation unit;
By the structure of IC temporary storage mechanism, make this device realize different size IC detection and store classifiedly.
Brief description of the drawings
Accompanying drawing 1 is structural representation of the present invention;
Accompanying drawing 2 is perspective view of temporary storage mechanism;
Accompanying drawing 3 is perspective view of temporary platform.
Label in figure is respectively:
1.IC charging tray unit; 11. charging trays to be checked are deposited position;
12. treat that discharge plate deposits position; 13. charging trays to be checked;
14. treat discharge plate; 15. first charging tray districts;
16. second charging tray districts; 17. charging tray input mechanisms to be checked;
18. empty tray conveyor structures; 2. an IC supply unit;
21. draw parts; 3. turntable unit;
31.IC storage tank; 4. rotary operation unit;
41. pivoted arms; 42. draw parts;
5.IC detecting unit; 6. the 2nd IC supply unit;
61.IC temporary storage mechanism; 62.IC conveying mechanism;
63.IC storage tank; 64. motors;
65. drive lead screws; 66. Compress Springs;
67. cylinders; 68. spacing adjusting micrometers;
1A, 1B, 1C, 1D, 1E. charging tray region; 2A, 2B, 2C, 2D, 2E. charging tray region.
Detailed description of the invention
Below in conjunction with accompanying drawing, the detailed description of the invention of IC testing classification storage device of the present invention is elaborated.
Referring to accompanying drawing 1, IC testing classification storage device comprises IC charging tray unit 1, the one IC supply unit 2, turntable unit 3, rotary operation unit 4, IC detecting unit 5, the 2nd IC supply unit 6, IC charging tray unit 1 comprise charging tray to be checked deposit position 11, treat discharge plate deposit position 12, the first charging tray district 15, the second charging tray district 16, charging tray input mechanism 17 to be checked, empty tray conveyor structure 18, finished product charging tray output mechanism, the first charging tray district 15 is for depositing charging tray 13 to be checked, the second charging tray district 16 treats discharge plate 14 for depositing, charging tray input mechanism 17 to be checked is sent to charging tray to be checked by charging tray 13 to be checked and deposits position 11, empty tray conveyor structure 18 by the charging tray to be checked 13 that takes IC be sent to treat discharge plate deposit position 12, finished product charging tray output mechanism is by the finished product charging tray output in the second charging tray district.Charging tray to be checked is deposited position 11 and is treated that discharge plate deposits position 12 and can be made as multiplely, is arranged at respectively the first charging tray district 15 and the second charging tray district 16.Turntable unit 3 is arranged on charging tray to be checked deposits the front end of position 11, and uniform 8 to 16 IC storage tanks 31 on the circumference of turntable unit 3 can be placed 4 to 8 IC in each IC storage tank 31.The one IC supply unit 2 is deposited between position 11 in turntable unit 3 and charging tray to be checked, for the IC of charging tray 13 to be checked is delivered to turntable unit 3, the one IC supply unit 2 comprises draws parts 21, draw parts 21 and will after the absorption of IC on charging tray to be checked, be positioned over turntable unit 3 by connecting gear, draw parts 21 and once can realize the suction of 4 to 8 IC simultaneously and put.Rotary operation unit 4 is positioned at a side of turntable unit 3, rotary operation unit 4 comprises at least one pivoted arm 41, preferably pivoted arm number is 4 to 8, pivoted arm 41 can cycle rotation be positioned to the top of turntable unit 3, top and the 2nd IC supply unit 6 tops of IC detecting unit 5, the function that realize successively and draw IC, detects IC and temporary IC.In addition, the pivoted arm 41 of rotary operation unit 4 also can be positioned a position that abandons waste product, below abandoning the position of waste product, is provided with ash can (not shown).Each pivoted arm 41 of rotary operation unit 4 is provided with draws parts 42, draws parts 42 and once can realize the suction of 4 to 8 IC simultaneously and put.The IC that the 2nd IC supply unit 6 completes detection is positioned over respectively different treating on discharge plate 14 according to its testing result.The 2nd IC supply unit 6 comprises IC temporary storage mechanism 61 and IC conveying mechanism 62, and IC temporary storage mechanism 61 is delivered to finished product charging tray by IC conveying mechanism 62 by finished product IC after the IC detecting is stored to some.
Referring to accompanying drawing 2,3, IC temporary storage mechanism 61 comprises IC storage tank 63, motor 64 and drive lead screw 65, and motor 64 drives screw mandrel 65 that IC storage tank 63 is moved to working area.A side at IC storage tank 63 arranges Compress Spring 66, and opposite side arranges cylinder 67, by cylinder 67 and Compress Spring 66, IC storage tank 63 is positioned, and in a side of cylinder 67, a spacing adjusting micrometer 68 is also set.
Referring to accompanying drawing 1, below the course of work of equipment of the present invention is described in detail, first stack Dao1A district and stack filling the charging tray that does not detect IC, by charging tray input mechanism 17 to be checked, charging tray is transported to 2A district and positions.The connecting gears of the prior art such as the optional belt transmission of charging tray input mechanism 17 to be checked, an IC supply unit 2 is drawn IC and is transported on rotating disk 3 and deposits by drawing parts 21.Then draw IC by rotary operation unit 4, and rotate to IC detecting unit 5 and detect, after detection completes, position of rotation is deposited in the pallet of IC temporary storage mechanism 61 again, then carry by IC temporary storage mechanism 61 again, drawn the IC that is transported to 2C, 2D, tri-regions of 2E and goes to deposit different brackets by IC conveying mechanism by nozzle unit.
1A, 1B, 1C, 1D, 1E are the regions for stacking charging tray, can stack multiple charging trays, can saving personnel repeat to place charging tray.It comprises in 1A region, fill do not detect IC charging tray, the charging tray of 1B region hollow, deposits charging tray for detection of complete IC by 3 grades in 1C, 1D, 1E region.
When placing and do not detect after the charging tray of IC in 1A region, by charging tray input mechanism 17 to be checked, charging tray is transported to 2A district and positions, conveniently do not detect IC conveying mechanism and draw.After not detecting IC and having been drawn, by empty tray conveyor structure 18, blank panel is transported to 2B district and positions.After the charging tray in 2C, 2D, 2E district is filled the IC having detected again by conveying mechanism be transported to 1C, 1D, deposit in 1E district.Be transported to 2C, 2D, 2E district by the blank panel in empty tray conveyor structure 18Ba 2B district simultaneously.After not detection IC on the charging tray in Dang2A district has been drawn, carry empty charging tray Dao2B district to deposit by charging tray input mechanism 17 to be checked, after the charging tray in 2C, 2D, 2E district is filled IC again by charging tray input mechanism 17 to be checked empty charging tray conveyance to 2C, 2D, 2E district.Be sent to behind 2A district when filling the charging tray of IC, an IC supply unit 2 is drawn after IC and is transported in turntable unit 3 and deposits by nozzle unit 21.Wherein nozzle unit 21 is furnished with 4 suction nozzles, can draw 4 IC simultaneously.Turntable unit 3 drives cycle rotation by direct driving motor, is ceaselessly rotated conveying to not detecting IC.Rotary operation unit 4 is to carry and do not detect IC to behind certain position when turntable unit 3, and the absorption parts 42 on it are drawn and do not detected IC and carry out IC detection to detecting unit 5, draw IC be held down and detect after detecting unit 5 when rotary operation unit 4.After having detected, be transported on temporary storage mechanism 61 in absorption rotation.Temporary storage mechanism 61 is used for the conveying to the IC having detected at a high speed.Once can carry 8 IC.Carry the IC having detected to gettering site by temporary storage mechanism 61, the IC conveying mechanism 62 after having been detected by IC carries IC to store classifiedly to 2C, 2D, 2E district.
The utility model is mainly in order to realize IC high speed test, to store classifiedly, charging tray full automatic treatment, and mechanism is compacter, and speed IC that is faster and design surveys machine equipment.Charging tray input mechanism 17 to be checked is a lifting body, utilize SERVO CONTROL charging tray to be placed on a belt conveyor, carry charging tray to locate to charging tray district by belt conveyor, drawing IC by an IC supply unit again goes to deposit to rotating disk, after IC has been drawn, by empty tray conveyor structure 18, blank panel conveyance is deposited to blank panel district.
The lifting body utilization private of charging tray takes motor and drives screw mandrel to drive lifting pin jacking charging tray, and the cooperation of recycling cylinder gripping charging tray is placed into charging tray on charging tray belt conveyor.Belt conveyor utilizes cylinder to carry out clamping and positioning charging tray, then is gone to fix to location by the slide unit on stepper motor control belt, waits for that charging tray input mechanism 17 to be checked draws IC.Empty tray conveyor structure 18 has comprised and has moved left and right conveying mechanism, and cylinder gripping body utilizes gripping cylinder gripping blank panel to move to blank panel by translation mechanism and goes to place.With respect to existing IC test machine, so just save and manually removed to place charging tray, full automatic scheduling blank panel, has saved time of artificial shutdown emptying dish, has improved greatly production efficiency.
Temporary storage mechanism 61 after IC high speed test, it has comprised and has moved left and right conveying mechanism, IC placement platform has wherein configured 8 IC on IC placement platform and has placed position for temporary IC.Contrast the temporary storage mechanism in other IC testing agency, other temporary storage mechanism only has two IC storage areas, conveying that can only be again and again.And temporary storage mechanism 61 of the present invention is to have configured 8 GeIC districts, can, for keeping in depositing of twice IC, once deposit 4 IC.
Because the IC conveying mechanism 62 after IC has detected need to divide 3 grades to place the IC having detected, the needed like this time is just long, in order to be the production efficiency that improves IC checkout equipment, the course of conveying back and forth of the IC conveying mechanism 62 after being reduced IC and detected by temporary storage mechanism 61 twice temporary IC, allows it draw 8 IC simultaneously and deposits.With respect to temporary storage mechanism after the IC test first having, so just shorten the time of delivery once of the conveying mechanism after IC has detected, improve greatly production efficiency.Temporary storage mechanism described in the utility model, is applicable to IC high speed test, particularly needs the IC testing equipment that stores classifiedly, has solved the storage problem after IC high speed test, temporary storage mechanism after providing one to be better than existing IC to detect, and operating efficiency is higher.
Rotary operation unit 4 comprises the turning arm 41 of direct-drive motor control, and it has configured 4 turning arms 41, the parts of absorption up and down 42 of cylinder control.4 turning arms that rotary operation unit 4 configures, the gettering site on a corresponding rotating disk of arm, a corresponding IC detecting position of arm, a corresponding IC temporary storage mechanism of arm is placed position, and an arm free, can add other device, such as waste product abandons.In the time drawing IC, can put down detection simultaneously.So not only saved the time but also economized design space.
The above is only the preferred embodiment of the present invention; it should be pointed out that for those skilled in the art, under the premise without departing from the principles of the invention; can also make some improvements and modifications, these improvements and modifications also should be considered as protection scope of the present invention.

Claims (9)

1. an IC testing classification storage device, comprise IC detecting unit, IC charging tray unit, it is characterized in that, also comprise an IC supply unit, turntable unit, rotary operation unit, the 2nd IC supply unit, described IC charging tray unit comprises that charging tray to be checked deposits position, treat that discharge plate deposits position, described turntable unit is arranged on described charging tray to be checked and deposits the front end of position, a described IC supply unit is deposited between position in described turntable unit and described charging tray to be checked, for the IC of charging tray to be checked is delivered to described turntable unit, described rotary operation unit is positioned at a side of described turntable unit, described rotary operation unit comprises at least one pivoted arm, the circulation of described pivoted arm can rotational positioning to described turntable unit top, described IC detecting unit top and described the 2nd IC supply unit top, realize successively and draw IC, detect IC and temporary IC, the IC that described the 2nd IC supply unit completes detection is positioned over respectively different treating on discharge plate according to its testing result, described IC charging tray unit also comprises the first charging tray district, the second charging tray district, charging tray input mechanism to be checked, empty tray conveyor structure, finished product charging tray output mechanism, described the first charging tray district is used for depositing charging tray to be checked, described the second charging tray district is used for depositing and treats discharge plate, described charging tray input mechanism to be checked is sent to described charging tray to be checked by described charging tray to be checked and deposits position, described in being sent to the to be checked empty charging tray that takes IC, treats described empty tray conveyor structure that discharge plate deposits position, described finished product charging tray output mechanism is by the finished product charging tray output in the second charging tray district.
2. IC testing classification storage device according to claim 1, is characterized in that: uniform 8 to 16 IC storage tanks on the circumference of described turntable unit, in each IC storage tank, can place 4 to 8 IC.
3. IC testing classification storage device according to claim 1, is characterized in that: described rotary operation unit comprises 4 to 8 pivoted arms, and each pivoted arm is provided with absorption parts, and the suction that described absorption parts once can be realized 4 to 8 IC is simultaneously put.
4. IC testing classification storage device according to claim 1, is characterized in that: the pivoted arm of described rotary operation unit also can be positioned a position that abandons waste product, below the described position that abandons waste product, is provided with ash can.
5. according to the IC testing classification storage device described in any one in claim 1 to 4, it is characterized in that: described the 2nd IC supply unit comprises IC temporary storage mechanism and IC conveying mechanism, described IC temporary storage mechanism is delivered to finished product charging tray by described IC conveying mechanism by finished product IC after the IC detecting is stored to some.
6. according to the IC testing classification storage device described in any one in claim 1 to 4, it is characterized in that: described charging tray to be checked is deposited position for multiple, is all arranged at described the first charging tray district; Describedly treat that discharge plate deposits position for multiple, be all arranged at the second charging tray district.
7. according to the IC testing classification storage device described in any one in claim 1 to 4, it is characterized in that: a described IC supply unit comprises absorption parts, described absorption parts are drawn IC on charging tray to be checked to be positioned over described turntable unit by connecting gear, and the suction that described absorption parts once can be realized 4 to 8 IC is simultaneously put.
8. IC testing classification storage device according to claim 5, is characterized in that: described IC temporary storage mechanism comprises IC storage tank, motor and drive lead screw, described motor drives described screw mandrel that described IC storage tank is moved to working area.
9. IC testing classification storage device according to claim 8, it is characterized in that: a side of described IC storage tank arranges Compress Spring, opposite side arranges cylinder, by described cylinder and Compress Spring, described IC storage tank is positioned, in described cylinder side, a spacing adjusting micrometer is also set.
CN201310155996.9A 2013-04-28 2013-04-28 Sorted storing device for IC (Integrated Circuit) test Active CN103240229B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201310155996.9A CN103240229B (en) 2013-04-28 2013-04-28 Sorted storing device for IC (Integrated Circuit) test

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201310155996.9A CN103240229B (en) 2013-04-28 2013-04-28 Sorted storing device for IC (Integrated Circuit) test

Publications (2)

Publication Number Publication Date
CN103240229A CN103240229A (en) 2013-08-14
CN103240229B true CN103240229B (en) 2014-12-10

Family

ID=48920301

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201310155996.9A Active CN103240229B (en) 2013-04-28 2013-04-28 Sorted storing device for IC (Integrated Circuit) test

Country Status (1)

Country Link
CN (1) CN103240229B (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110293073A (en) * 2018-03-21 2019-10-01 英稳达科技股份有限公司 The intelligent classification system and method for solar battery sheet
CN108845559A (en) * 2018-05-18 2018-11-20 广州上龙智能科技有限公司 A kind of automatic breeding device

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN100577309C (en) * 2006-05-16 2010-01-06 致茂电子股份有限公司 Rotating-disk testing classifier
CN201331574Y (en) * 2008-12-29 2009-10-21 北京中科三环高技术股份有限公司 Device for detecting magnetic flux automatically
CN101850340B (en) * 2009-04-03 2014-01-22 鸿富锦精密工业(深圳)有限公司 Sorting device
CN101789525B (en) * 2009-10-31 2012-08-22 东莞市鸿宝锂电科技有限公司 Battery assembling and packaging device
CN102728562A (en) * 2011-04-13 2012-10-17 同方光电科技有限公司 Testing and sorting device for vertical light emitting diode
CN203281521U (en) * 2013-04-28 2013-11-13 嘉兴景焱智能装备技术有限公司 IC (integrated circuit) testing sorted storing device

Also Published As

Publication number Publication date
CN103240229A (en) 2013-08-14

Similar Documents

Publication Publication Date Title
CN102717416B (en) Production line for wooden tray bases
CN204150695U (en) Automatic circulating plate machine
CN203143685U (en) Automatic feeding device for lighter gas boxes
CN103240229B (en) Sorted storing device for IC (Integrated Circuit) test
CN105618934A (en) Laser processing equipment for full-automatic solar battery piece
CN203281521U (en) IC (integrated circuit) testing sorted storing device
CN205008256U (en) Automatic lens sorting machine
CN206318532U (en) A kind of file ordering collating unit in bulk
CN205995809U (en) A kind of the System of Sorting Components
CN203601614U (en) Automatic hub packing device
CN204938364U (en) A kind of Tray dish automatic loading/unloading feedway
CN208103189U (en) Voice coil motor automatic detection device
CN106628362A (en) Automatic box packing machine
CN109279083A (en) A kind of Full-automatic intelligent robot sabot boxing apparatus
CN203877492U (en) Glass substrate feeder
CN103129968A (en) Automatic feeding device of lighter steam boxes
CN106379753B (en) A kind of file ordering collating unit in bulk
CN107984206A (en) Intelligent electric meter general assembly line and apply its method of work
CN205574863U (en) Variable speed conveyor means
CN105572147A (en) Chip automatic detection method
CN210162795U (en) Truss pile up neatly cancellation conveyer
CN207174863U (en) Motor feed mechanism
CN105510805A (en) Chip automatic detection device
CN208326627U (en) Automatic charging device
CN207909905U (en) Solar cell auto plate separation equipment

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C14 Grant of patent or utility model
GR01 Patent grant