CN202339398U - Ageing module for VXI bus digital test system - Google Patents
Ageing module for VXI bus digital test system Download PDFInfo
- Publication number
- CN202339398U CN202339398U CN2011205232666U CN201120523266U CN202339398U CN 202339398 U CN202339398 U CN 202339398U CN 2011205232666 U CN2011205232666 U CN 2011205232666U CN 201120523266 U CN201120523266 U CN 201120523266U CN 202339398 U CN202339398 U CN 202339398U
- Authority
- CN
- China
- Prior art keywords
- test
- module
- ageing
- aging
- integrated circuit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Images
Abstract
The utility model discloses an ageing module for a VXI bus digital test system. The ageing module comprises a main controller, a configuration memorizer, a plurality of ageing test modules, a relay matrix and an ageing resistor, wherein the main controller is connected with not only an integrated circuit test instrument, but also the connection configuration memorizer, the relay matrix and the ageing test modules respectively; the configuration memorizer is connected with the main controller to store the configuration program for an ageing test; and the relay matrix is connected with not only the integrated circuit test instrument, but also the ageing resistor. The ageing module provided by the utility model can be matched with various VXI bus digital test systems to automatically finish the ageing test for related digital test systems, the configuration is flexible and the operation is convenient.
Description
Technical field
The utility model relates to a kind of aging of integrated circuit module, relates in particular to a kind of aging module that is used for the vxi bus digital detecting system, belongs to the ic test technique field.
Background technology
Vxi bus (VXI bus) is the abbreviation of VME bus Extensions for Instrumentation.It is after the IEEE488 bus, develops into the more needs of compact module formula structure for adapting to surveying instrument from desk-top and the frame structure of separation, and a kind of new bus standard of release.
The vxi bus system is a kind of computer-controlled function system, generally is made up of mainframe box, some devices, explorer and master controller.The basic logic unit of forming the vxi bus system is called " device ".In general, a device occupies a VXI module, allows also on a module, to realize that a plurality of devices or a device occupy the polylith module.When several VXI modules that are used for integrated circuit testing are built based on vxi bus, just formed the vxi bus digital detecting system.These VXI modules generally comprise PMU (precision measurement unit) module, channel module, power module, figure module etc.
In integrated circuit testing work; The digital detecting system that is used for integrated circuit survey production line generally all requires operation in 24 hours; And guarantee the stability and the degree of accuracy of certain hour build-in test, this has just proposed strict requirement to the operation stability and the operating accuracy of integrated circuit test system each module under situation about working long hours.On the other hand, some potential hidden danger and problem generally all will be passed through long operation and just can be come out in the integrated circuit test system.In the face of such problem, exploitation seems necessary once the aging module that cover is used for the integrated circuit test system burn-in test.
In the patent No. is in the Chinese invention patent of ZL 200710120719.9, discloses a kind of integrated circuit high temperature dynamic aging method of testing and proving installation.This method is welded on integrated circuit on the aging daughter board, and aging daughter board is carried out functional verification test and dynamic operation mode test; The aging daughter board that is welded with integrated circuit that test is passed through is plugged on the interface socket of universal burn-in plate, and the universal burn-in plate is inserted in the aging testing system, carries out burn-in test; According to testing standard, at different time point aging daughter board is carried out functional verification test and dynamic operation mode test, whether still can operate as normal with the proof integrated circuit.This invention is applicable to the universal test of multiple different encapsulating products, does not need to encapsulate according to difference the burn-in board of the product subscription specific of pattern again, thereby has reduced the setup time of test, has reduced test period, and has practiced thrift testing cost.
Summary of the invention
The utility model technical matters to be solved is to provide a kind of aging module that is used for the vxi bus digital detecting system.This device can be used for the burn-in test work of various vxi bus digital detecting systems.
For realizing above-mentioned purpose, the utility model adopts following technical scheme:
A kind of aging module that is used for the vxi bus digital detecting system is characterized in that:
Said aging module comprises master controller, config memory, a plurality of burn-in test module, relay matrix and age resistor; Wherein,
Said master controller connects integrated circuit tester on the one hand, connects said config memory, said relay matrix and each said burn-in test module on the other hand respectively;
Said config memory is connected with said master controller, is used to store the configurator of burn-in test;
Said relay matrix connects integrated circuit tester on the one hand, connects said age resistor on the other hand.
Wherein more excellently, also comprise the switching deck in the said aging module.
Wherein more excellently, also comprise jtag interface in the said aging module, said jtag interface connects said master controller.
Wherein more excellently, said master controller is made up of microcontroller and CPLD, and said microcontroller is used to control said config memory and tester resource, and said CPLD is used to provide the relay control bit of said relay matrix.
Wherein more excellently, said config memory is E
2PROM or FLASH.
The aging module that the utility model provided can cooperatively interact with various vxi bus digital detecting systems, accomplishes the burn-in test work of correlated digital test macro automatically, and flexible configuration is easy to operate.
Description of drawings
Below in conjunction with accompanying drawing and embodiment the utility model is done further to specify.
Fig. 1 is the whole principle schematic of the aging module that provides of the utility model;
Fig. 2 is in this aging module, the principle schematic of master controller;
Fig. 3 is in this aging module, the configuration schematic diagram of CPLD;
Fig. 4 is in this aging module, the synoptic diagram of relay matrix.
Embodiment
As shown in Figure 1, the aging module that is used for the vxi bus digital detecting system that the utility model provided is made up of master controller, config memory, a n burn-in test module (n is a natural number), relay matrix, age resistor and switching deck (not shown).Wherein, master controller connects integrated circuit tester on the one hand, therefrom obtains the resource of integrated circuit tester; Connect config memory, each burn-in test module and relay matrix on the other hand respectively, so that they are controlled.Config memory connects master controller, is used to store the configurator of burn-in test.When program run, config memory can provide the configurator that carries out burn-in test to master controller.The burn-in test module is used to call the integrated circuit tester resource that some can carry out burn-in test.These integrated circuit tester resources can be free, realizes through software control.Relay matrix connects integrated circuit tester on the one hand, connects age resistor on the other hand.Above-mentioned master controller can be realized by MCU (microcontroller) and CPLD.Config memory can be E
2PROM or FLASH (nonvolatile memory) etc.The switching deck is used to realize being connected of this aging module and integrated circuit tester etc., and its concrete realization is the routine techniques that those of ordinary skills can both grasp, and has not just given unnecessary details at this.
The aging module that the utility model provided is primarily aimed at the design of vxi bus digital detecting system; Therefore wherein each functional module all is based on the vxi bus driving; The control signal of master controller and relay matrix all derives from vxi bus, and the bottom layer driving of supporting burn-in test software is also write to vxi bus.
As shown in Figure 1, also be provided with jtag interface in this aging module.JTAG is a kind of international standard test protocol, with IEEE 1149.1 compatibilities.This jtag interface connects master controller, is used to accomplish the relevant configuration to master controller.Jtag interface also can be used for realizing ISP (In-System Programmable online programming), and tested device is programmed.
Fig. 2 is the principle schematic of master controller in this aging module.This master controller is made up of microcontroller and CPLD (CPLD), and wherein microcontroller is used to control config memory and tester resource; CPLD is used to provide the relay control bit of relay matrix, thereby realizes the control to relay matrix.Above-mentioned CPLD also can be substituted by FPGA (field programmable gate array).
Fig. 3 is the configuration schematic diagram of above-mentioned CPLD.This CPLD comprises first follower, code translator and second follower that connects through logic element, and wherein the output terminal of first follower connects the input end of code translator, and the output terminal of code translator connects the input end of second follower.
In an embodiment of this aging module, the resistance of employed age resistor is 1M Ω, the load of FVMI (pressurization flow measurement) and FIMV during mainly as burn-in test (adding the stream pressure measurement).
Configuration according to the vxi bus digital detecting system is different, and the integrated circuit tester resource that need call also is not quite similar.As shown in Figure 4, these integrated circuit tester resources comprise that the channel plate self diagnosis, PMU (precision measurement unit) of depth capacity is aging, and plate PMU is aging, and DPS (device voltage source) is aging, drive that comparative level is aging, program control load aging etc.They can be chosen with software mode, in the burn-in test process, also can change at any time.
The principle of work of this aging module is such: when carrying out burn-in test; Master controller is read aging configurator from config memory; Obtain the selection information of a plurality of burn-in test modules simultaneously; Call the resource of integrated circuit tester successively according to this selection information, and connect ohmic load through relay matrix and carry out FVMI (pressurization flow measurement), FIMV (adding the stream pressure measurement) or other corresponding operation., single job judges whether to occur wrong or lost efficacy after accomplishing, as normally then continuing circulation, like undesired then termination routine.
Above the aging module of vxi bus digital detecting system that the utility model provided has been carried out detailed explanation.As far as one of ordinary skill in the art, any conspicuous change of under the prerequisite that does not deviate from the utility model connotation, it being done all will constitute to the utility model infringement of patent right, with corresponding legal responsibilities.
Claims (5)
1. aging module that is used for the vxi bus digital detecting system is characterized in that:
Said aging module comprises master controller, config memory, a plurality of burn-in test module, relay matrix and age resistor; Wherein,
Said master controller connects integrated circuit tester on the one hand, connects said config memory, said relay matrix and each said burn-in test module on the other hand respectively;
Said config memory is connected with said master controller, is used to store the configurator of burn-in test;
Said relay matrix connects integrated circuit tester on the one hand, connects said age resistor on the other hand.
2. aging module as claimed in claim 1 is characterized in that:
Also comprise the switching deck in the said aging module.
3. aging module as claimed in claim 1 is characterized in that:
Also comprise jtag interface in the said aging module, said jtag interface connects said master controller.
4. aging module as claimed in claim 1 is characterized in that:
Said master controller is made up of microcontroller and CPLD, and said microcontroller is used to control said config memory and tester resource, and said CPLD is used to provide the relay control bit of said relay matrix.
5. aging module as claimed in claim 1 is characterized in that:
Said config memory is E
2PROM or FLASH.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2011205232666U CN202339398U (en) | 2011-12-14 | 2011-12-14 | Ageing module for VXI bus digital test system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2011205232666U CN202339398U (en) | 2011-12-14 | 2011-12-14 | Ageing module for VXI bus digital test system |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN202339398U true CN202339398U (en) | 2012-07-18 |
Family
ID=46488089
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2011205232666U Expired - Lifetime CN202339398U (en) | 2011-12-14 | 2011-12-14 | Ageing module for VXI bus digital test system |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN202339398U (en) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102866755A (en) * | 2012-08-27 | 2013-01-09 | 哈尔滨工业大学 | Power-on reset device for integrated test system |
| CN103983871A (en) * | 2014-05-16 | 2014-08-13 | 哈尔滨工程大学 | VXI module tester based on FPGA |
| CN107478933A (en) * | 2017-08-23 | 2017-12-15 | 北京电子工程总体研究所 | A kind of distributed test system based on CompactRIO and fiber optic network |
| CN112986805A (en) * | 2021-05-19 | 2021-06-18 | 湖南博匠信息科技有限公司 | Intelligent VPX board card testing method and system |
-
2011
- 2011-12-14 CN CN2011205232666U patent/CN202339398U/en not_active Expired - Lifetime
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102866755A (en) * | 2012-08-27 | 2013-01-09 | 哈尔滨工业大学 | Power-on reset device for integrated test system |
| CN103983871A (en) * | 2014-05-16 | 2014-08-13 | 哈尔滨工程大学 | VXI module tester based on FPGA |
| CN107478933A (en) * | 2017-08-23 | 2017-12-15 | 北京电子工程总体研究所 | A kind of distributed test system based on CompactRIO and fiber optic network |
| CN112986805A (en) * | 2021-05-19 | 2021-06-18 | 湖南博匠信息科技有限公司 | Intelligent VPX board card testing method and system |
| CN112986805B (en) * | 2021-05-19 | 2021-08-10 | 湖南博匠信息科技有限公司 | Intelligent VPX board card testing method and system |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN103837824B (en) | Digital integrated electronic circuit Auto-Test System | |
| US7552370B2 (en) | Application specific distributed test engine architecture system and method | |
| CN103698654B (en) | The open circuit short-circuit test device of chip pin and method of testing | |
| TWI250293B (en) | Method and apparatus for optimized parallel testing and access of electronic circuits | |
| CN204595599U (en) | Based on the automobile electronic controller general-utility test platform of CANoe | |
| US9495492B1 (en) | Implementing synchronous triggers for waveform capture in an FPGA prototyping system | |
| CN103186441B (en) | Switching circuit | |
| CN202339398U (en) | Ageing module for VXI bus digital test system | |
| CN201600928U (en) | Chip test system and automatic test vector generator ATPG | |
| CN107479918B (en) | Reconfigurable FPGA (field programmable Gate array) model for MCU (microprogrammed control Unit) burning | |
| CN202494750U (en) | Testing device of integrated circuit pin open short | |
| CN113227981B (en) | System, apparatus and method for controller architecture testing | |
| CN104637544A (en) | Test circuit and test method of memory | |
| JP4334463B2 (en) | Semiconductor integrated circuit test apparatus and method | |
| CN104515951A (en) | Board-level embedded test controller and board-level embedded test method | |
| CN113544650A (en) | Test access port architecture for facilitating multiple test modes | |
| CN110907798A (en) | Test verification board, test device and method for exchange chip of integrated SoC (System on chip) | |
| CN108648780B (en) | Memory test system, method and storage medium | |
| CN104111416A (en) | Test circuit used for intelligent power module and test method thereof | |
| CN202330684U (en) | Calibration module for VXI (VME (Virtual Machine Environment) Extensions for Instrumentation) bus digital testing system | |
| CN103713627A (en) | Function node test system | |
| CN115201529A (en) | Novel parallel semiconductor parameter testing system | |
| CN202929136U (en) | Fault diagnosis module for VXI bus digital test system | |
| US20130031276A1 (en) | Programmable Waveform Technology for Interfacing to Disparate Devices | |
| RU194203U1 (en) | FPGA-based NAND memory chip testing device |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CX01 | Expiry of patent term |
Granted publication date: 20120718 |
|
| CX01 | Expiry of patent term |