CN112986805A - Intelligent VPX board card testing method and system - Google Patents
Intelligent VPX board card testing method and system Download PDFInfo
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- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
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- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
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Abstract
The invention discloses an intelligent VPX board card testing method and system, wherein the method comprises the following steps: starting a test item for the VPX board card; displaying the working state of the VPX board card through the indicating panel; shooting the indication panel through the monitoring camera to acquire a state image; analyzing the state image to generate test result information; according to the intelligent VPX board test method provided by the invention, the VPX board can be tested, meanwhile, the indication panel is shot in real time through the camera, and then the running state of the VPX board in the test process is known in real time through real-time analysis of the state image, so that the working state of the VPX board in the test process is not required to be monitored manually, the time and the labor are saved, the error negligence caused by manual monitoring can be avoided, and the accuracy of the test result is improved.
Description
Technical Field
The invention relates to the technical field of VPX board test, in particular to an intelligent VPX board test method and system.
Background
VPX is a new generation of high-speed serial bus standard developed by vta (VME International Trade Association ) organization on the basis of its VME bus in 2007. With the development of the VPX technology, the VPX board card is more and more widely applied; in practical application, the VPX board card has high working strength and a severe working environment, so that the VPX board card is required to have high reliability and stability. Thus, before the delivery of the VPX board, severe reliability and stability tests, such as high and low temperature tests, temperature cycling, continuous power-on, burn-in tests, etc., must be performed.
In the mainstream test scheme at present, the working state of the VPX board card in the test process is mainly monitored manually, and for some test scenes which are long in time consumption and have a large number of VPX board cards, the manual monitoring mode wastes time and labor, and the test result is inaccurate due to easy error negligence.
Disclosure of Invention
The invention mainly aims to provide an intelligent VPX board test method and system, and aims to solve the problems that in the existing VPX board test scheme, the time and labor are wasted, errors and negligence are easy to occur, and the test result is inaccurate due to the fact that the state of a VPX board is manually monitored.
The technical scheme provided by the invention is as follows:
the invention provides an intelligent VPX board test method which is applied to an intelligent VPX board test system; the intelligent VPX board card test system comprises a monitoring camera and an indication panel; the indication panel is used for being in communication connection with the VPX board; the monitoring camera is used for shooting the indication panel; the intelligent VPX board card testing method comprises the following steps:
starting a test item for the VPX board card;
displaying the working state of the VPX board card through the indicating panel;
shooting the indication panel through the monitoring camera to acquire a state image;
the status image is analyzed to generate test result information.
Preferably, the intelligent VPX board card test system further comprises a control host and a test room; the control host can adjust the indoor temperature of the test room; the monitoring camera is in communication connection with the control host; the VPX board card is arranged in the test room; the indication panel comprises an indication lamp; the indication panel is used for controlling the indication lamp to be turned on when the VPX board card is detected to be in normal operation, and controlling the indication lamp to be turned off when the VPX board card is detected to be in abnormal operation; the starting of the test items for the VPX board card comprises the following steps:
and (3) carrying out high-temperature test on the VPX board card: controlling the test room to maintain a preset high-temperature test interval, wherein the maintaining time is a first time;
the analyzing the status image to generate a test result, comprising:
analyzing the state image to judge whether the indicator light is always on within the first duration;
if so, generating first test information, wherein the first test information is used for expressing that the VPX board passes a high-temperature test;
if not, acquiring the time length of the normal operation of the VPX board card at the preset high temperature value based on the time when the indicator lamp is turned off and the starting time of the high-temperature test, marking the time length as a second time length, and generating second test information, wherein the second test information comprises the second time length.
Preferably, the starting of the test items for the VPX board card includes:
and (3) carrying out a temperature maintenance test on the VPX board card: controlling the test room to gradually increase the temperature from a first temperature value to a second temperature value, wherein the unit of temperature increase is 1 ℃ each time, and the time length of maintaining each temperature is a third time length;
the analyzing the status image to generate a test result, comprising:
judging whether the indicator light is always on in the process of gradually increasing the temperature of the first temperature value to the second temperature value;
if so, generating third test information, wherein the third test information is used for expressing that the VPX board passes the temperature maintenance test;
if not, acquiring each temperature value corresponding to the normal operation of the VPX board card, marking the temperature values as an appropriate temperature set, and generating fourth test information, wherein the fourth test information comprises the appropriate temperature set.
Preferably, the control host is in communication connection with the VPX board card; the starting of the test items for the VPX board card comprises the following steps:
acquiring a preset aging time and a preset aging temperature interval;
carrying out aging test on the VPX board card: controlling the test room to maintain the preset aging temperature interval, wherein the preset aging temperature interval is smaller than the preset high-temperature test interval, and the maintaining time is the preset aging time;
the analyzing the status image to generate a test result, comprising:
judging whether the indicator light is always on within the preset aging time;
if so, generating fifth test information, wherein the fifth test information is used for expressing that the VPX board passes the burn-in test;
if not, marking the time when the indicator lamp is turned off as the burn-in abnormal time, acquiring an operation log of the VPX board card, and generating sixth test information based on the content corresponding to the burn-in abnormal time in the operation log.
Preferably, the obtaining of the preset aging time and the preset aging temperature interval includes:
taking the highest temperature value in the suitable temperature set as the maximum value of the preset aging temperature interval;
acquiring the maximum number of VPX board cards which can be accommodated in the test room during aging test each time;
acquiring first standard time length, wherein the first standard time length is used for expressing the standard time length adopted in the aging test in the industry;
calculating and acquiring preset aging time
Wherein:
wherein the content of the first and second substances,
the value is greater than 0;
taking the value of the first standard time length to be more than 0;
the value is greater than 0 for the maximum number;
taking the value of the waiting number to be more than or equal to 0;
to preset the maximum duration, a constant is taken according to the actual situation, and
is greater than
。
Preferably, the aging test of the VPX board card includes:
controlling the test room to maintain the preset aging temperature interval so as to perform aging test;
judging whether the time length of the aging test reaches the first standard time length or not;
if yes, acquiring the current waiting number in real time;
and if the current waiting number is larger than or equal to the maximum number, stopping the aging test.
Preferably, the starting of the test items for the VPX board card includes:
acquiring a fourth time length;
and (3) carrying out continuous power on and power off test on the VPX board card: controlling the VPX board to be continuously powered on and powered off within the fourth time, wherein the power on and power off times are preset times;
the analyzing the status image to generate a test result, comprising:
judging whether the number of times that the indicator light is turned on within the fourth time period is equal to the preset number of times or not;
if so, generating seventh test information, wherein the seventh test information is used for expressing that the VPX board passes the continuous power on and power off test;
if not, acquiring the times of the VPX board lighting in the fourth time length, marking the times as normal on-off times, and generating eighth test information based on the normal on-off times.
Preferably, the generating the eighth test information based on the normal on-off times includes:
analyzing the state image to obtain the maximum value of the continuous lighting times of the indicator light within the fourth time length, and marking the maximum value as a maximum continuous value;
acquiring second standard time length, wherein the second standard time length is used for expressing the standard time length adopted when continuous power on and off test is carried out in the industry;
calculating the impact resistance value
：
Wherein the content of the first and second substances,
for the impact resistance value, the reference value is 1, and the larger the impact resistance value is, the stronger the impact resistance of the VPX board card is;
VPX board card for representing continuous power on and power off test of same batch
The number of the VPX board cards is one,
indicates the total number of the VPX boards which are subjected to continuous power-on and power-off tests in the same batch,
is shown as
The maximum continuous value of each VPX board,
is shown as
The normal on-off times of each VPX board card,
the number of times of the preset times is represented,
the fourth period of time is represented by the fourth period of time,
representing the second standard duration;
and generating the eighth test information, wherein the eighth test information comprises the impact resistance value.
Preferably, the intelligent VPX board card test system further comprises a current sensor used for being in communication connection with the control host; the current sensor is used for detecting the total current of the VPX board card; the generating of the second test information includes:
acquiring the total current in a time period from the moment when the indicator lamp is turned off to the moment when the high-temperature test is finished, and marking the total current as a current set to be analyzed;
judging whether the current set to be analyzed has current sudden drop or not;
if so, acquiring a current sudden drop amount;
obtaining rated current of each appointed element in the VPX board card;
analyzing and forming a pre-estimated fault element set based on the current sudden-drop quantity and the rated current;
and generating the second test information based on the predicted failure element set.
The invention also provides an intelligent VPX board test system which is applied to the intelligent VPX board test method; the intelligent VPX board card test system comprises a monitoring camera and an indication panel; the indication panel is used for being in communication connection with the VPX board; the monitoring camera is used for shooting the indication panel.
Through above-mentioned technical scheme, can realize following beneficial effect:
the intelligent VPX board test method provided by the invention can be used for testing the VPX board, simultaneously shooting the indication panel in real time through the camera, and then knowing the running state of the VPX board in the test process in real time through real-time analysis of the state image, so that the working state of the VPX board in the test process is not required to be monitored manually, and for some test scenes which are long in time consumption and large in VPX board number, the method provided by the invention is more time-saving and labor-saving, can avoid errors caused by manual monitoring, and improves the accuracy of test results.
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In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to the structures shown in the drawings without creative efforts.
Fig. 1 is a flowchart of a first embodiment of an intelligent VPX board test method according to the present invention.
Detailed Description
It should be understood that the specific embodiments described herein are merely illustrative of the invention and are not intended to limit the invention.
The invention provides an intelligent VPX board card testing method and system.
As shown in fig. 1, in a first embodiment of the intelligent VPX board test method provided by the present invention, this embodiment is applied to an intelligent VPX board test system; the intelligent VPX board card test system comprises a monitoring camera and an indication panel; the indication panels are used for being in communication connection with the VPX board cards, the number of the indication panels is consistent with that of the VPX board cards, and the indication panels are in one-to-one correspondence, namely, each indication panel is in communication connection with the corresponding VPX board card; the monitoring camera is used for shooting the indication panel; the embodiment comprises the following steps:
step S110: and starting a test item for the VPX board card.
Specifically, a test item is started on the VPX board through the intelligent VPX board test system.
Step S120: and displaying the working state of the VPX board card through the indicating panel.
Specifically, the indication panel can display the working state of the VPX board, that is, the indication panel displays that the working state of the VPX board is normal or abnormal.
Step S130: and shooting the indication panel through the monitoring camera to acquire a state image.
Specifically, the indication panel is shot through the monitoring camera to acquire a state image. The status image is an image indicating a panel.
Step S140: the status image is analyzed to generate test result information.
Specifically, the intelligent VPX board test method provided by the invention can be used for shooting the indication panel in real time through the camera while testing the VPX board, and then knowing the running state of the VPX board in the test process in real time through real-time analysis of the state image, so that the working state of the VPX board in the test process is not required to be monitored manually, and for some test scenes which are long in time consumption and large in number of VPX boards, the method provided by the invention is more time-saving and labor-saving, can avoid error negligence caused by manual monitoring, and improves the accuracy of the test result.
In a second embodiment of the intelligent VPX board test method provided by the invention, based on the first embodiment, the intelligent VPX board test system further comprises a control host and a test room; the control host can adjust the indoor temperature of the test room; the monitoring camera is in communication connection with the control host; the VPX board card is arranged in the test room; the indication panel comprises an indication lamp; the indication panel is used for controlling the indicator lamp to be turned on when the VPX board card is detected to be in normal operation, and controlling the indicator lamp to be turned off when the VPX board card is detected to be in abnormal operation, wherein the VPX board card is in normal operation, namely all elements of the VPX board card work normally, and the working current and the working voltage of the whole VPX board card are kept stable; step S110, including the steps of:
step S210: and (3) carrying out high-temperature test on the VPX board card: and controlling the test room to maintain a preset high-temperature test interval, wherein the maintaining time is a first time.
Specifically, the high-temperature test interval is a limit high-temperature tolerance value used for testing the VPX board, and is determined according to the actual application environment of the VPX board, in this embodiment, the temperature is preferably 70 ℃ to 90 ℃, and when the high-temperature test is specifically performed, a point value can be selected in the high-temperature test interval for performing the test, for example, 80 ℃; the first time period is preferably 5 hours.
Step S140, including the steps of:
step S220: and analyzing the state image to judge whether the indicator light is always on within the first time length.
Specifically, the control host analyzes the state image to determine whether the indicator light is always on within the first duration.
If yes, go to step S230: and generating first test information, wherein the first test information is used for expressing that the VPX board passes a high-temperature test.
Specifically, if the VPX board is always on, the VPX board passes the high-temperature test, and therefore first test information is generated by the control host, wherein the first test information is used for expressing that the VPX board passes the high-temperature test; the first test information further includes a high temperature test interval.
If not, go to step S240: and acquiring the normal running time of the VPX board card at a preset high temperature value based on the moment when the indicator lamp is turned off and the starting moment of the high-temperature test, marking the normal running time as second time, and generating second test information, wherein the second test information comprises the second time. The second test information can be displayed through the control host.
Specifically, if the VPX board is not always on, it is indicated that a situation of abnormal operation occurs during the high-temperature test of the VPX board, that is, an indicator lamp is turned off; therefore, the control host acquires the time length of the normal operation of the VPX board card at the preset high temperature value based on the time when the indicator lamp is turned off and the starting time of the high-temperature test, marks the time length as a second time length, and generates second test information, wherein the second test information comprises the second time length. The second time length here represents the time length that the VPX board can normally run when the VPX board is subjected to a high-temperature test, so that a worker can conveniently judge the high-temperature resistance of the VPX board.
In a third embodiment of the intelligent VPX board test method provided by the present invention, based on the second embodiment, step S110 includes the following steps:
step S310: and (3) carrying out a temperature maintenance test on the VPX board card: and controlling the test room to gradually increase the temperature from the first temperature value to the second temperature value, wherein the unit of temperature increase is 1 ℃ every time, and the time length of maintaining each temperature is a third time length.
Specifically, the temperature holding test is a temperature rise test, that is, the ambient temperature is gradually increased within a certain time to determine the stability of the VPX board in the process of gradually increasing the temperature.
The first temperature value is 20 ℃, and the second temperature value is 80 ℃; the third time period was 10 minutes.
Step S140, including the steps of:
step S320: and judging whether the indicator light is always on in the process of gradually increasing the temperature of the first temperature value to the second temperature value.
Specifically, the control host judges whether the indicator light is always on in the process of gradually increasing the temperature from the first temperature value to the second temperature value.
If yes, go to step S330: and generating third test information, wherein the third test information is used for expressing that the VPX board passes the temperature keeping test.
Specifically, if the VPX board is always on, the control host generates third test information, where the third test information is used to express that the VPX board passes a temperature maintenance test.
If not, go to step S340: and acquiring each corresponding temperature value when the VPX board card normally operates, marking the temperature values as an appropriate temperature set, and generating fourth test information, wherein the fourth test information comprises the appropriate temperature set.
Specifically, if the VPX board is not lighted all the time, it is described that the VPX board works abnormally in the process of performing the temperature maintenance test, and therefore, the control host obtains each temperature value corresponding to the VPX board when the VPX board normally operates (i.e., each temperature value corresponding to the lighted indicator lamp), and marks the temperature values as an appropriate temperature set, and generates fourth test information, where the fourth test information includes the appropriate temperature set, where the appropriate temperature set represents a temperature range in which the VPX board can normally work, and the appropriate temperature set can facilitate a worker to reasonably arrange an actual working environment of the VPX board.
In a fourth embodiment of the intelligent VPX board test method provided by the invention, based on the third embodiment, the control host is in communication connection with the VPX board; step S110, including the steps of:
step S410: and acquiring a preset aging time and a preset aging temperature interval.
Specifically, the control host acquires a preset aging time and a preset aging temperature interval input by a tester; the preset aging time is preferably 12 hours, and the preset aging temperature range is preferably 30-50 ℃.
Step S420: carrying out aging test on the VPX board card: and controlling the test room to maintain the preset aging temperature interval, wherein the preset aging temperature interval is smaller than the preset high-temperature test interval, and the maintaining time is the preset aging time.
Specifically, the burn-in test is a fatigue test of the VPX board in a relatively normal temperature range.
Step S140, including the steps of:
step S430: and judging whether the indicator light is always on within the preset aging time.
Specifically, the control host machine judges whether the indicator light is always on within the preset aging time.
If yes, go to step S440: and generating fifth test information, wherein the fifth test information is used for expressing that the VPX board passes the burn-in test.
Specifically, if the VPX board is always on, it indicates that the VPX board passes the burn-in test.
If not, go to step S450: and marking the moment when the indicator lamp is turned off as a burn-in abnormal moment, acquiring an operation log of the VPX board card, and generating sixth test information based on the content corresponding to the burn-in abnormal moment in the operation log.
Specifically, if the indication lamp is not always turned on, the indication lamp is over-extinguished within a preset burn-in duration, so that the control host marks the time when the indication lamp is extinguished as a burn-in abnormal time, obtains an operation log of the VPX board, and generates sixth test information based on the content corresponding to the burn-in abnormal time in the operation log; the working log records the running conditions of all elements of the VPX board at all times, and the sixth test information is used for expressing which elements of the VPX board are abnormal in working at the burn-in abnormal time so as to improve the product quality in a follow-up targeted manner.
In a fifth embodiment of the intelligent VPX board test method provided by the present invention, based on the fourth embodiment, step S410 includes the following steps:
step S510: and taking the highest temperature value in the suitable temperature set as the maximum value of the preset aging temperature interval.
Specifically, the highest temperature value suitable for temperature concentration is the maximum value corresponding to the VPX board card capable of working normally, so that the highest temperature value can be directly used as the maximum value of the preset aging temperature range.
Step S520: and acquiring the maximum number of the VPX board cards which can be contained in the test room during the burn-in test each time.
Specifically, the control host obtains the maximum number of VPX boards that can be accommodated in the test room during burn-in test each time, which is input by the tester, for example, 50 VPX boards.
Step S530: and acquiring the waiting number of the VPX boards waiting for the burn-in test.
Specifically, the control host obtains the waiting number of the VPX boards waiting for the burn-in test, for example, 20 boards.
Step S540: the method comprises the steps of obtaining a first standard time length, wherein the first standard time length is used for expressing the standard time length adopted when the aging test is carried out in the industry.
Specifically, the control host acquires a first standard time duration, wherein the first standard time duration is preferably 12 hours.
Step S550: calculating and acquiring preset aging time
Wherein:
wherein the content of the first and second substances,
the value is greater than 0;
taking the value of the first standard time length to be more than 0;
the value is greater than 0 for the maximum number;
taking the value of the waiting number to be more than or equal to 0;
to preset the maximum duration, a constant is taken according to the actual situation, and
is greater than
。
Specifically, the significance of the above formula is that when the waiting number is smaller than the maximum number, it indicates that the VPX board card waiting for the test is not enough for the next burn-in test, and therefore, the time length of the burn-in test can be properly prolonged, and the longer the burn-in test is, the better the product quality of the VPX board card can be tested, so that under the condition of considering the test efficiency, the product quality of the VPX board card can be directly tested
Is provided with
Is prepared by
Doubling, and then rounding; when the waiting number is larger than or equal to the maximum number, the VPX board card waiting for testing is enough to carry out the next burn-in test, the test time length does not need to be prolonged, and therefore the test time length is directly used
Is arranged as
(ii) a If the wait number is 0, it indicates that the VPX board card waiting for testing is 0, and at this time, the delay may be further extendedThe aging test duration is prolonged, and the aging test duration is directly measured
Set as a, in this embodiment, a takes 36 hours.
In a sixth embodiment of the intelligent VPX board test method provided by the present invention, based on the fifth embodiment, step S420 includes the following steps:
step S610: and controlling the test room to maintain the preset aging temperature interval so as to perform aging test.
Specifically, the control host controls the test room to maintain the preset aging temperature interval so as to perform aging test.
Step S620: and judging whether the processed time length of the aging test reaches the first standard time length.
Specifically, the control host judges whether the elapsed time of the burn-in test reaches the first standard time.
If yes, go to step S630: and acquiring the current waiting number in real time.
Specifically, if yes, it is indicated that the burn-in test of the batch reaches the first standard time length, and the control host acquires the current waiting number in real time. Because the waiting number is changed from moment to moment, a tester may increase the VPX board card for burn-in test at any time, and when the elapsed time of the burn-in test reaches the first standard time, the tester needs to obtain the current waiting number again.
Step S640: and if the current waiting number is larger than or equal to the maximum number, stopping the aging test.
Specifically, if the current waiting number is greater than the maximum number, it indicates that the number of the VPX boards performing the burn-in test of the next batch reaches the standard, so the burn-in test is stopped.
In a seventh embodiment of the intelligent VPX board test method provided by the present invention, based on the second to sixth embodiments, step S110 includes the following steps:
step S710: and acquiring a fourth time length.
Specifically, the control host acquires a fourth time length input from the outside, where the fourth time length is a time length for performing a continuous power on/off test, and is preferably 1 hour.
Step S720: and (3) carrying out continuous power on and power off test on the VPX board card: and controlling the VPX board to be continuously powered on and powered off within the fourth time, wherein the power on and power off times are preset times.
Specifically, the preset number of times is preferably 500, that is, the VPX board is controlled to be continuously powered on and off 500 times within 1 hour.
Step S140, including the steps of:
step S730: and judging whether the number of times of lighting the indicator lamp in the fourth time period is equal to the preset number of times.
Specifically, the control host judges whether the number of times that the indicator light is turned on within the fourth time period is equal to the preset number of times. That is, every time VPX is normally activated and operated, the fourth time period inner indicator should be activated 500 times.
If yes, go to step S740: and generating seventh test information, wherein the seventh test information is used for expressing that the VPX board passes the continuous power-on and power-off test.
Specifically, if yes, the continuous power-on and power-off test is passed.
If not, go to step S750: and acquiring the times of the VPX board lighting in the fourth time length, marking the times as normal on-off times, and generating eighth test information based on the normal on-off times.
Specifically, if not, it is stated that the situation that the VPX board is not normally started exists within the fourth duration, so the control host acquires the number of times that the VPX board is lit up within the fourth duration, and marks the number of times as a normal on-off number, generates eighth test information based on the normal on-off number, and the larger the number of times as the normal on-off number is, the better the quality of the VPX board is.
In an eighth embodiment of the intelligent VPX board test method provided by the present invention, based on the seventh embodiment, the step S750 of generating eighth test information based on the normal on-off times includes the following steps:
step S810: and analyzing the state image to obtain the maximum value of the continuous lighting times of the indicator light within the fourth time length, and marking the maximum value as the maximum continuous value.
Specifically, the control host analyzes the state image to obtain the maximum value of the number of times that the indicator light is continuously lighted within the fourth time period, and the maximum value is marked as the maximum continuous value. In the test process, because the power on and off are continuously carried out, if the VPX board card is normally started, the indicator lamp can be continuously lightened; the maximum continuous value here is the number of times the indicator light is continuously lit, i.e. represents the number of consecutive normal starts.
Step S820: and acquiring a second standard time length, wherein the second standard time length is used for expressing the standard time length adopted when continuous power on and power off test is carried out in the industry.
Specifically, the control host acquires the second standard time length, and in this embodiment, the second standard time length is preferably 1 hour.
Step S830: calculating the impact resistance value
：
Wherein the content of the first and second substances,
for the impact resistance value, the reference value is 1, and the larger the impact resistance value is, the stronger the impact resistance of the VPX board card is;
VPX board card for representing continuous power on and power off test of same batch
The number of the VPX board cards is one,
indicates the total number of the VPX boards which are subjected to continuous power-on and power-off tests in the same batch,
is shown as
The maximum continuous value of each VPX board,
is shown as
The normal on-off times of each VPX board card,
the number of times of the preset times is represented,
the fourth period of time is represented by the fourth period of time,
representing the second standard duration.
Specifically, the above formula means that if the maximum continuous value is larger, or the number of times of normal channels is larger, the impact resistance of the VPX board card is stronger, and otherwise, the impact resistance is weaker; and if the fourth time is shorter than the second standard time, the preset times (500 times) of continuous power on and power off are completed in a shorter time, and the impact resistance of the VPX board card is stronger, otherwise, the impact resistance of the VPX board card is weaker.
Step S840: and generating the eighth test information, wherein the eighth test information comprises the impact resistance value.
Specifically, through showing the impact resistance value, can be so that the tester knows the strong or weak of this VPX integrated circuit board's impact resistance.
In a ninth embodiment of the intelligent VPX board test method provided by the present invention, based on the second embodiment, the intelligent VPX board test system further includes a current sensor for communication connection with the control host; the current sensor is used for detecting the total current of the VPX board card; the generating of the second test information in step S250 includes the following steps:
step S910: and acquiring the total current in a time period from the moment when the indicator lamp is extinguished to the moment when the high-temperature test is finished, and marking the total current as a current set to be analyzed.
Specifically, the control host acquires the total current in a time period from the moment when the indicator lamp is turned off to the moment when the high-temperature test is finished, and marks the total current as a current set to be analyzed. Namely the corresponding total current when the VPX board works abnormally.
Step S920: and judging whether the current set to be analyzed has current sudden drop or not.
Specifically, the control host judges whether the current to be analyzed is concentrated and has a current dip.
If yes, go to step S930: and acquiring the current sudden drop amount.
Specifically, if a current dip occurs, it indicates that the reason for the abnormal operation of the VPX board may be that some elements of the VPX board are not normally powered on (i.e., there is no operating current), so that the current dip is caused, and the host is controlled to obtain the current dip.
Step S940: and obtaining the rated current of each specified element in the VPX board card.
Specifically, the specific components include a motherboard, a chip, a memory module, a power module and a heat dissipation module, and these components are the main power consuming components of the VPX board.
Step S950: and analyzing and forming a pre-estimated fault element set based on the current sudden-drop quantity and the rated current.
Specifically, based on the current sudden drop amount and the rated current of each designated element, a set of predicted faulty elements may be generated, that is, if the current sudden drop amount is equal to the rated current of one designated element or the sum of the rated currents of a plurality of designated elements, the designated elements are regarded as the set of predicted faulty elements, and the set may be 1 designated element or a plurality of designated elements.
Step S960: and generating the second test information based on the predicted failure element set.
Specifically, the control host generates the second test information based on the estimated failure element set. Through the second test information, a tester can clearly know which specified element has a current fault when the VPX board card is subjected to high-temperature test, so that the subsequent targeted improvement is facilitated.
The invention also provides an intelligent VPX board test system which is applied to the intelligent VPX board test method in any one of the above; the intelligent VPX board card test system comprises a monitoring camera and an indication panel; the indication panel is used for being in communication connection with the VPX board; the monitoring camera is used for shooting the indication panel.
The above-mentioned serial numbers of the embodiments of the present invention are merely for description and do not represent the merits of the embodiments.
Through the above description of the embodiments, those skilled in the art will clearly understand that the method of the above embodiments can be implemented by software plus a necessary general hardware platform, and certainly can also be implemented by hardware, but in many cases, the former is a better implementation manner. Based on such understanding, the technical solutions of the present invention may be embodied in the form of a software product, wherein the software product is stored in a storage medium (such as ROM/RAM, magnetic disk, optical disk), and includes instructions for enabling a terminal (such as a mobile phone, a computer, a server, an air conditioner, or a network device) to execute the method according to the embodiments of the present invention.
While the present invention has been described with reference to the embodiments shown in the drawings, the present invention is not limited to the embodiments, which are illustrative and not restrictive, and it will be apparent to those skilled in the art that various changes and modifications can be made therein without departing from the spirit and scope of the invention as defined in the appended claims.
Claims (10)
1. An intelligent VPX board test method is characterized by being applied to an intelligent VPX board test system; the intelligent VPX board card test system comprises a monitoring camera and an indication panel; the indication panel is used for being in communication connection with the VPX board; the monitoring camera is used for shooting the indication panel; the intelligent VPX board card testing method comprises the following steps:
starting a test item for the VPX board card;
displaying the working state of the VPX board card through the indicating panel;
shooting the indication panel through the monitoring camera to acquire a state image;
the status image is analyzed to generate test result information.
2. The intelligent VPX board test method of claim 1, wherein the intelligent VPX board test system further comprises a control host and a test room; the control host can adjust the indoor temperature of the test room; the monitoring camera is in communication connection with the control host; the VPX board card is arranged in the test room; the indication panel comprises an indication lamp; the indication panel is used for controlling the indication lamp to be turned on when the VPX board card is detected to be in normal operation, and controlling the indication lamp to be turned off when the VPX board card is detected to be in abnormal operation; the starting of the test items for the VPX board card comprises the following steps:
and (3) carrying out high-temperature test on the VPX board card: controlling the test room to maintain a preset high-temperature test interval, wherein the maintaining time is a first time;
the analyzing the status image to generate a test result, comprising:
analyzing the state image to judge whether the indicator light is always on within the first duration;
if so, generating first test information, wherein the first test information is used for expressing that the VPX board passes a high-temperature test;
if not, acquiring the time length of the normal operation of the VPX board card at the preset high temperature value based on the time when the indicator lamp is turned off and the starting time of the high-temperature test, marking the time length as a second time length, and generating second test information, wherein the second test information comprises the second time length.
3. The intelligent VPX board test method of claim 2, wherein the starting of test items for a VPX board comprises:
and (3) carrying out a temperature maintenance test on the VPX board card: controlling the test room to gradually increase the temperature from a first temperature value to a second temperature value, wherein the unit of temperature increase is 1 ℃ each time, and the time length of maintaining each temperature is a third time length;
the analyzing the status image to generate a test result, comprising:
judging whether the indicator light is always on in the process of gradually increasing the temperature of the first temperature value to the second temperature value;
if so, generating third test information, wherein the third test information is used for expressing that the VPX board passes the temperature maintenance test;
if not, acquiring each temperature value corresponding to the normal operation of the VPX board card, marking the temperature values as an appropriate temperature set, and generating fourth test information, wherein the fourth test information comprises the appropriate temperature set.
4. The intelligent VPX board test method of claim 3, wherein the control host is in communication connection with a VPX board; the starting of the test items for the VPX board card comprises the following steps:
acquiring a preset aging time and a preset aging temperature interval;
carrying out aging test on the VPX board card: controlling the test room to maintain the preset aging temperature interval, wherein the preset aging temperature interval is smaller than the preset high-temperature test interval, and the maintaining time is the preset aging time;
the analyzing the status image to generate a test result, comprising:
judging whether the indicator light is always on within the preset aging time;
if so, generating fifth test information, wherein the fifth test information is used for expressing that the VPX board passes the burn-in test;
if not, marking the time when the indicator lamp is turned off as the burn-in abnormal time, acquiring an operation log of the VPX board card, and generating sixth test information based on the content corresponding to the burn-in abnormal time in the operation log.
5. The intelligent VPX board test method of claim 4, wherein the obtaining of the preset burn-in time and the preset burn-in temperature interval comprises:
taking the highest temperature value in the suitable temperature set as the maximum value of the preset aging temperature interval;
acquiring the maximum number of VPX board cards which can be accommodated in the test room during aging test each time;
acquiring the waiting number of VPX board cards waiting for aging test;
acquiring first standard time length, wherein the first standard time length is used for expressing the standard time length adopted in the aging test in the industry;
calculating and acquiring preset aging time
Wherein:
wherein the content of the first and second substances,
the value is greater than 0;
taking the value of the first standard time length to be more than 0;
the value is greater than 0 for the maximum number;
taking the value of the waiting number to be more than or equal to 0;
to preset the maximum duration, a constant is taken according to the actual situation, and
is greater than
。
6. The intelligent VPX board test method of claim 5, wherein the burn-in test of the VPX board comprises:
controlling the test room to maintain the preset aging temperature interval so as to perform aging test;
judging whether the time length of the aging test reaches the first standard time length or not;
if yes, acquiring the current waiting number in real time;
and if the current waiting number is larger than or equal to the maximum number, stopping the aging test.
7. The intelligent VPX board test method of any one of claims 2 to 6, wherein the starting of test items for a VPX board comprises:
acquiring a fourth time length;
and (3) carrying out continuous power on and power off test on the VPX board card: controlling the VPX board to be continuously powered on and powered off within the fourth time, wherein the power on and power off times are preset times;
the analyzing the status image to generate a test result, comprising:
judging whether the number of times that the indicator light is turned on within the fourth time period is equal to the preset number of times or not;
if so, generating seventh test information, wherein the seventh test information is used for expressing that the VPX board passes the continuous power on and power off test;
if not, acquiring the times of the VPX board lighting in the fourth time length, marking the times as normal on-off times, and generating eighth test information based on the normal on-off times.
8. The intelligent VPX board test method of claim 7, wherein the generating eighth test information based on the normal on-off times comprises:
analyzing the state image to obtain the maximum value of the continuous lighting times of the indicator light within the fourth time length, and marking the maximum value as a maximum continuous value;
acquiring second standard time length, wherein the second standard time length is used for expressing the standard time length adopted when continuous power on and off test is carried out in the industry;
calculating the impact resistance value
：
Wherein the content of the first and second substances,
for the impact resistance value, the reference value is 1, and the larger the impact resistance value is, the stronger the impact resistance of the VPX board card is;
VPX board card for representing continuous power on and power off test of same batch
The number of the VPX board cards is one,
indicates the total number of the VPX boards which are subjected to continuous power-on and power-off tests in the same batch,
is shown as
The maximum continuous value of each VPX board,
is shown as
The normal on-off times of each VPX board card,
the number of times of the preset times is represented,
the fourth period of time is represented by the fourth period of time,
representing the second standard duration;
and generating the eighth test information, wherein the eighth test information comprises the impact resistance value.
9. The intelligent VPX board test method of claim 2, wherein the intelligent VPX board test system further comprises a current sensor for communicating with the control host; the current sensor is used for detecting the total current of the VPX board card; the generating of the second test information includes:
acquiring the total current in a time period from the moment when the indicator lamp is turned off to the moment when the high-temperature test is finished, and marking the total current as a current set to be analyzed;
judging whether the current set to be analyzed has current sudden drop or not;
if so, acquiring a current sudden drop amount;
obtaining rated current of each appointed element in the VPX board card;
analyzing and forming a pre-estimated fault element set based on the current sudden-drop quantity and the rated current;
and generating the second test information based on the predicted failure element set.
10. An intelligent VPX board test system is characterized in that the intelligent VPX board test method of any one of claims 1-9 is applied; the intelligent VPX board card test system comprises a monitoring camera and an indication panel; the indication panel is used for being in communication connection with the VPX board; the monitoring camera is used for shooting the indication panel.
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114578266A (en) * | 2022-03-18 | 2022-06-03 | 湖南宇诺辰电子科技有限公司 | Method and system for testing reliability of domestic mainboard |
| CN115753176A (en) * | 2023-01-09 | 2023-03-07 | 湖南博匠信息科技有限公司 | VPX equipment liquid cooling parameter testing method and system |
Citations (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7129732B1 (en) * | 2005-11-18 | 2006-10-31 | Endicott Interconnect Technologies, Inc. | Substrate test apparatus and method of testing substrates |
| CN202339398U (en) * | 2011-12-14 | 2012-07-18 | 北京自动测试技术研究所 | Ageing module for VXI bus digital test system |
| CN103235621A (en) * | 2013-04-28 | 2013-08-07 | 成都思晗科技有限公司 | Mist-preventing intelligent control system for cabinet |
| CN104215891A (en) * | 2013-05-31 | 2014-12-17 | 深圳市海洋王照明工程有限公司 | FPC (flexible printed circuit) failure abnormality testing method |
| CN106707133A (en) * | 2016-11-11 | 2017-05-24 | 宁波双林汽车部件股份有限公司 | Tunnel-type circuit board integration aging processing detection apparatus |
| CN106872882A (en) * | 2017-03-10 | 2017-06-20 | 四川鸿创电子科技有限公司 | A kind of board batch testing method suitable for thermocycling |
| CN107942226A (en) * | 2017-11-13 | 2018-04-20 | 广东德众堂生物科技有限公司 | A kind of wiring board aging test box |
| CN211554157U (en) * | 2019-09-02 | 2020-09-22 | 浙江鸿吉智能控制有限公司 | Load-carrying aging comprehensive tester |
| CN213122259U (en) * | 2020-05-20 | 2021-05-04 | 南京晨光集团有限责任公司 | Automatic recognition device for display result of digital instrument |
-
2021
- 2021-05-19 CN CN202110543338.1A patent/CN112986805B/en active Active
Patent Citations (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7129732B1 (en) * | 2005-11-18 | 2006-10-31 | Endicott Interconnect Technologies, Inc. | Substrate test apparatus and method of testing substrates |
| CN202339398U (en) * | 2011-12-14 | 2012-07-18 | 北京自动测试技术研究所 | Ageing module for VXI bus digital test system |
| CN103235621A (en) * | 2013-04-28 | 2013-08-07 | 成都思晗科技有限公司 | Mist-preventing intelligent control system for cabinet |
| CN104215891A (en) * | 2013-05-31 | 2014-12-17 | 深圳市海洋王照明工程有限公司 | FPC (flexible printed circuit) failure abnormality testing method |
| CN106707133A (en) * | 2016-11-11 | 2017-05-24 | 宁波双林汽车部件股份有限公司 | Tunnel-type circuit board integration aging processing detection apparatus |
| CN106872882A (en) * | 2017-03-10 | 2017-06-20 | 四川鸿创电子科技有限公司 | A kind of board batch testing method suitable for thermocycling |
| CN107942226A (en) * | 2017-11-13 | 2018-04-20 | 广东德众堂生物科技有限公司 | A kind of wiring board aging test box |
| CN211554157U (en) * | 2019-09-02 | 2020-09-22 | 浙江鸿吉智能控制有限公司 | Load-carrying aging comprehensive tester |
| CN213122259U (en) * | 2020-05-20 | 2021-05-04 | 南京晨光集团有限责任公司 | Automatic recognition device for display result of digital instrument |
Non-Patent Citations (2)
| Title |
|---|
| 杨平: "《微电子设备与器件封装加固技术》", 30 September 2005 * |
| 邹汝平: "《多用途导弹系统设计》", 30 November 2018 * |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114578266A (en) * | 2022-03-18 | 2022-06-03 | 湖南宇诺辰电子科技有限公司 | Method and system for testing reliability of domestic mainboard |
| CN114578266B (en) * | 2022-03-18 | 2022-08-16 | 湖南宇诺辰电子科技有限公司 | Method and system for testing reliability of domestic mainboard |
| CN115753176A (en) * | 2023-01-09 | 2023-03-07 | 湖南博匠信息科技有限公司 | VPX equipment liquid cooling parameter testing method and system |
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|---|---|
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