CN201348646Y - Contact type function testing device - Google Patents

Contact type function testing device Download PDF

Info

Publication number
CN201348646Y
CN201348646Y CNU2009200041006U CN200920004100U CN201348646Y CN 201348646 Y CN201348646 Y CN 201348646Y CN U2009200041006 U CNU2009200041006 U CN U2009200041006U CN 200920004100 U CN200920004100 U CN 200920004100U CN 201348646 Y CN201348646 Y CN 201348646Y
Authority
CN
China
Prior art keywords
chip
probe
card extender
contact device
testing functions
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CNU2009200041006U
Other languages
Chinese (zh)
Inventor
冯是睿
陈中滨
吴文峰
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Jianhan Science & Technology Co Ltd
Cybertan Technology Inc
Original Assignee
Jianhan Science & Technology Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Jianhan Science & Technology Co Ltd filed Critical Jianhan Science & Technology Co Ltd
Priority to CNU2009200041006U priority Critical patent/CN201348646Y/en
Application granted granted Critical
Publication of CN201348646Y publication Critical patent/CN201348646Y/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Images

Landscapes

  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

The utility model discloses a contact type function testing device which comprises: an adapter plate including a first surface and a second surface; a chip containing region arranged on the first surface of the adapter plate for containing the chip; more than one through-hole arranged on the chip containing region of the adapter plate and passed through the adapter plate; more than one detecting probe arranged in the through-hole; and an electric conduction cloth arranged on a second surface of the adapter plate and electrical connected with the detecting probe. The detecting probe has a claw part and a neck part, the claw part contacts with the chip, a top part contacts with the electric conduction cloth. The contact type function testing device also comprises a containing space arranged on the second surface of the adapter plate for containing the electric conduction cloth, the through-hole extends from the chip containing region to the containing space, which can avoid condition that the detecting probe and the chip or the detecting probe and the circuit board can not contact stably in detecting.

Description

The contact device for testing functions
Technical field
The utility model relates to a kind of contact device for testing functions, and probe and conductive fabric that its chips mainly sees through on the card extender electrically connect circuit board, and appearance contacts built on the sand or high frequency loss in the measurement process to avoid.
Background technology
Flourish along with electronic industry, the chip of various different types or function is also constantly weeded out the old and bring forth the new.In the process of chip development, the deviser must be connected different chips with circuit on the corresponding circuit board, and carry out the functional test of chip, further chip newly developed is revised by the result who tests again at last, to finish the development process of chip.
As shown in Figure 1, be the diagrammatic cross-section of prior function proving installation.General in the process that chip 23 is tested, mainly be to see through device for testing functions 10 to carry out being connected between chip 23 and the circuit board 21, by this further chip 23 is carried out functional test.Device for testing functions 10 mainly includes a card extender 11, and is provided with a chip disposal area 15 in card extender 11, and the size of chip disposal area 15 and shape are all close with chip 23, chip 23 can be placed on 15 inside, chip disposal area by this.
Be provided with the individual perforation 17 of plural number (more than one) in the chip disposal area 15, and in each perforation 17 inner pogo pin 13 of placing.Its middle punch 17 runs through card extender 11, and therefore when pogo pin 13 was placed on perforation 17 inside, first end points 131 of pogo pin 13 will expose in chip disposal area 15, and its second end points 133 then can expose in card extender 11 outsides, shown in the 2nd figure.
When chip 23 was placed on 15 inside, chip disposal area, the pin 231 on the chip 23 will contact with first end points 131 of pogo pin 13.And when being placed on device for testing functions 10 on the circuit board 21, expose the pogo pin 13 of card extender 11 outsides will with the circuit contacts on the circuit board 21, chip 23 will see through pogo pin 13 connecting circuit plates 21 by this.
Pogo pin 13 inside are provided with spring thereby have flexible characteristic, for example first end points 131 of pogo pin 13 and second end points 133 are after the effect that is subjected to external force, the pogo pin of will withdrawing 13 inside, otherwise after external force disappeared, first end points 131 and second end points 133 will be exposed by pogo pin 13.Therefore work as chip 23 and put into chip disposal area 15, and after device for testing functions 10 is placed on circuit board 21, first end points 131 of pogo pin 13 and second end points 13 will be respectively with chip 23 and circuit board 21 on circuit contacts, by this finishing the electric connection between chip 23 and the circuit board 21, and can further test the function of chip 23.
Yet, understand elastic force difference, and cause first end points 131 of each pogo pin 13 and the elastic force of second end points 133 difference to occur because of its contained spring for each pogo pin 13.In other words, first end points 131 of each pogo pin 13 and second end points 133 will be different with the contact force of chip 23 and circuit board 21, make that pogo pin 13 occurs built on the sand or unsettled situation easily with contacting of chip 23 and/or circuit board 21 in the process that measures, and the test effect of high-frequency signals is impacted.
Summary of the invention
Fundamental purpose of the present utility model, be to provide a kind of contact device for testing functions, mainly be provided with the individual probe of plural number (more than one) in card extender, one end of probe is connected with chip, the other end then sees through the circuit on the conductive fabric connecting circuit plate, can avoid probe unsteady situation to occur contacting with chip and/or circuit board when measuring by this.
Secondary objective of the present utility model is to provide a kind of contact device for testing functions, and an end of its middle probe is a claw, and probe sees through claw and be connected with pin on the chip, can improve the pin connection stability of probe and chip by this.
Another purpose of the present utility model, be to provide a kind of contact device for testing functions, its middle probe sees through the circuit on the conductive fabric electric connection circuit board, because but conductive fabric has the characteristic of deformation, make the connection conductive fabric that probe can be stable when measuring, and help improving the stability that electrically connects between probe and the circuit board.
Another purpose of the present utility model, be to provide a kind of contact device for testing functions, wherein card extender is provided with at least one connecting hole, then be provided with corresponding fixed orifice on the circuit board, and can linkage unit pass fixed orifice on the connecting hole connecting circuit plate, by this to finish being connected between contact device for testing functions and the circuit board.
Another purpose of the present utility model, be to provide a kind of contact device for testing functions, wherein card extender is provided with at least one positioning unit, then is provided with corresponding positioning hole on the circuit board, and helps carrying out the location between contact device for testing functions and the circuit board.
Another purpose of the present utility model, be to provide a kind of contact device for testing functions, its chips disposal area is in order to ccontaining chip, and the side of this chip disposal area is provided with in the mode that tilts, chip can be guided to second opening of chip disposal area by this, and nature is connected with the probe of inside, chip disposal area.
Another purpose of the present utility model, be to provide a kind of contact device for testing functions, its middle probe is provided with in integrated mode and the flexible characteristic of tool not, each probe can be connected with chip with identical power in use, and also identical at the recession level that uses each probe of back for a long time.
For achieving the above object, the utility model is taked following design proposal:
A kind of contact device for testing functions, it includes: a card extender includes a first surface and a second surface; One chip disposal area is arranged at the first surface of this card extender, and in order to a ccontaining chip; More than one perforation is arranged in the chip disposal area of this card extender, and runs through this card extender; More than one probe is arranged at respectively in this perforation; And a conductive fabric, be arranged at the second surface of this card extender, and electrically connect this probe.
Described probe comprises a claw and a top, and the claw of this probe contacts with this chip, and the top of this probe then contacts with this conductive fabric.
Also include an accommodation space, be arranged at the second surface of card extender, and in order to ccontaining this conductive fabric, and described perforation extends to this accommodation space by the chip disposal area, wherein said probe includes a claw and a top, and claw is arranged at the chip disposal area, and the top then is arranged at accommodation space.
The utility model contact device for testing functions also includes at least one connecting hole, be arranged on the card extender, and this connecting hole extends to second surface by the first surface of card extender, and this connecting hole is in order to a ccontaining linkage unit.
The second surface of described card extender is arranged on the circuit board, and make conductive fabric contact with circuit board, wherein this circuit board includes at least one fixed orifice, and this card extender then includes at least one connecting hole, and a linkage unit is passed this connecting hole is connected with this fixed orifice; Also include at least one positioning unit, be arranged at the second surface of this card extender, and this circuit board is provided with at least one pilot hole.
The chip disposal area of the utility model contact device for testing functions also includes more than one side, and this side is provided with in the mode that tilts.
The probe of the utility model contact device for testing functions is provided with in integrated mode.
The utility model has the advantages that:
1, can effectively avoid probe unsteady situation when measuring, to occur contacting with chip and/or circuit board.
2, the stability that helps improving that probe is connected with the pin of chip, electrically connects between probe and the circuit board.
3, help carrying out location between contact device for testing functions and the circuit board.
Each probe can be connected with chip with identical power when 4, using, and also identical at the recession level that uses each probe of back for a long time.
Description of drawings
Fig. 1 is the diagrammatic cross-section of prior function proving installation.
The diagrammatic cross-section that Fig. 2 partly constructs for the prior function proving installation.
Fig. 3 A to Fig. 3 C: be respectively schematic perspective view, the sectional view of the utility model contact device for testing functions one preferred embodiment and the diagrammatic cross-section of partly constructing.
Fig. 4 is the schematic perspective view of the another embodiment of the utility model contact device for testing functions.
Fig. 5 is the schematic perspective view of the circuit board that can be connected with the utility model contact device for testing functions.
Embodiment
See also Fig. 3 A to Fig. 3 C, be respectively schematic perspective view, sectional view and the part tectonic profile synoptic diagram of the utility model contact device for testing functions one preferred embodiment.As shown in the figure, contact device for testing functions 30 includes a card extender 31, card extender 31 includes a first surface 311 and a second surface 313, wherein first surface 311 is provided with a chip disposal area 35, and in chip disposal area 35, be provided with the individual perforation 37 of plural number (more than one), and bore a hole and 37 run through this card extender 31, shown in Fig. 3 A and Fig. 3 B.
Be provided with relative probe 33 in each perforation 37, wherein each probe 33 includes a claw 331 and a top 333, when being provided with, can make the claw 331 of probe 33 be present in 35 inside, chip disposal area the second surface 313 insertion perforation 37 of probe 33 by card extender 31.The sectional area at the top 333 of probe 33 is slightly larger than perforation 37 sectional area in addition, therefore bores a hole 37 the time when probe 33 passes, and the top 333 of probe 33 will be exposed at the second surface 313 of card extender 31 outward, to finish the setting of probe 33, shown in Fig. 3 B and Fig. 3 C.
The second surface 313 of card extender 31 is provided with a conductive fabric 39, and make the top 333 of probe 33 contact with conductive fabric 39, generally speaking can be distributed with plural number (more than one) bar conductor wire in the conductive fabric 39, gold thread for example, the top 333 of the probe 33 that contacts with conductive fabric 39 can see through conductor wires in the conductive fabric 39 and electrically connect circuit on the circuit board 41 by this.
Chip disposal area 35 on the card extender 31 is in order to ccontaining chip 43, after chip 43 is put into chip disposal area 35, pin 431 on the chip 43 will contact with probe 33, the pin 431 of 331 pairs of chips 43 of claw that for example can probe 33 is fixed, and helps improving be connected between probe 33 and the chip 43 firm.The quantity of the perforation 37 of card extender 31 and probe 33 is identical with the quantity of the pin 431 of chip 43 in addition, and adjusts according to the quantity of the pin 431 of chip 43.
Chip 43 can transmit an acting force and give probe 33 after putting into chip disposal area 35, and via probe 33 acting force is sent to conductive fabric 39.Conductive fabric 39 can produce the deformation of part after bearing the external force effect, and makes top 333 being absorbed in the conductive fabric 39 a little of probe 33, by this probe 33 can with conductive fabric 39 firm being connected.By the use of probe 33 and conductive fabric 39, can effectively improve contact between the chip 43 and circuit board 41 when measuring firmly, the while can avoid causing the loss of high-frequency signals in the measurement process.
Mainly be that second surface 313 with card extender 31 is arranged on the circuit board 41 in the process that measures, and make circuit contacts on conductive fabric 39 and the circuit board 41.Can select to be provided with at least one connecting hole 32 on the card extender 31, and this connecting hole 32 extends to second surface 313 by the first surface 311 of card extender 31, then be provided with at least one fixed orifice 411 on the circuit board 41, and fixed orifice 411 the position that is provided with that the position corresponds to connecting hole 32 is set, by this can a linkage unit 34 pass connecting hole 32 and be fixed on the fixed orifice 411, to finish being connected between contact device for testing functions 30 and the circuit board 41.For example linkage unit 34 can be a screw, and fixed orifice 411 then is a screw, and screw is rotated to be fixed on the screw.In the utility model embodiment, mainly four connecting holes 32 are separately positioned on four corner location of card extender 31, and pass this four connecting holes 32 with four linkage units 34.
In addition, in order to reduce the difficulty of chip 43 and 35 contrapositions of chip disposal area, and make that chip 43 is taken advantage of a situation and enter in the chip disposal area 35, the mode that the side 355 of chip disposal area 35 can tilt is provided with, for example chip disposal area 35 includes one first opening 351 and one second opening 353, wherein first opening 351 is positioned on the first surface 311 of web joint 31, and make the opening 351 of winning greater than second opening 353, by this when chip 43 is put into chip disposal area 35, chip 43 will slip into second opening 353 along the side 355 of chip disposal area 35, pin 431 on the chip 43 can be connected with the claw 331 of probe 33 smoothly by this, shown in Fig. 3 B.
Mainly be to see through the expansion performance that pogo pin 13 itself is had in the conventional configurations, finish tight connection the between pogo pin 13 and chip 23 and/or the circuit board 21, but concerning each pogo pin 13, the size of the restoring force that it had is understood because of the difference of contained spring difference to some extent, and after through long the use, the decay situation of each pogo pin 13 elastic force also can be different, and then cause the instability when measuring and the loss of high-frequency signals easily.
By contrast, probe 33 described in the utility model is the members that structure is simple, and can select to make in integrated mode.After through long the use, the wearing and tearing of each probe 33 or the degree of decay can be very approaching, therefore each probe 33 all can continue each pin 431 of chip 43 is bestowed identical and stable connection power, and help improving degree of stability when measuring, and can reduce the loss of high-frequency signals when measuring.
See also Fig. 4, be the schematic perspective view of the another embodiment of the utility model contact device for testing functions.Please cooperate with reference to Fig. 3 A and Fig. 3 B, contact device for testing functions 50 includes a card extender 31, and is provided with an accommodation space 55 in the second surface 313 of card extender 31, and with these accommodation space 55 ccontaining conductive fabrics 39.Be provided with the individual perforation 37 of plural number (more than one) in the accommodation space 55, in other words, perforation 37 will extend to accommodation space 55 by chip disposal area 35.When probe 33 being put into perforation 37 inside, the claw 331 of probe 33 will exist in the chip disposal area 35, and the top 333 of probe 33 then can exist in the accommodation space 55, and can contact with conductive fabric 39.
Accommodation space 55 has close geometric configuration with conductive fabric 39, when conductive fabric 39 being put into accommodation space 55 inside, conductive fabric 39 will form a smooth plane with the second surface 313 of card extender 31, and helps contact device for testing functions 50 is connected with circuit board 61.The carrying out of contraposition step between contact device for testing functions 50 and the circuit board 61 for convenience in addition, also can be provided with at least one positioning unit 58 in the second surface 313 of card extender 31, then be provided with at least one corresponding positioning hole 613 on the circuit board 61, only need the positioning unit on the contact device for testing functions 50 58 is inserted the pilot hole 613 of circuit board 61 in use, just can finish the contraposition of circuit on contact device for testing functions 50 and the circuit board 61, as shown in Figure 5.
The above, it only is preferred embodiment of the present utility model, be not to be used for limiting the scope that the utility model is implemented, be that all equalizations of doing according to the described shape of the utility model claim, structure, feature change and modification, all should be included in the claim of the present utility model.

Claims (10)

1, a kind of contact device for testing functions is characterized in that including:
One card extender includes a first surface and a second surface;
One chip disposal area is arranged at the first surface of this card extender, and in order to a ccontaining chip;
More than one perforation is arranged in the chip disposal area of this card extender, and runs through this card extender;
More than one probe is arranged at respectively in this perforation; And
One conductive fabric is arranged at the second surface of this card extender, and electrically connects this probe.
2, contact device for testing functions according to claim 1 is characterized in that: wherein said probe comprises a claw and a top, and the claw of probe contacts with chip, and the top of probe then contacts with conductive fabric.
3, contact device for testing functions according to claim 1 is characterized in that: also includes an accommodation space, is arranged at the second surface of described card extender, and in order to ccontaining conductive fabric, and described perforation extends to this accommodation space by the chip disposal area.
4, contact device for testing functions according to claim 3 is characterized in that: wherein said probe includes a claw and a top, and claw is arranged at the chip disposal area, and the top is arranged at accommodation space.
5, contact device for testing functions according to claim 1, it is characterized in that: also include at least one connecting hole, be arranged on the described card extender, and this connecting hole extends to second surface by the first surface of card extender, this connecting hole is in order to a ccontaining linkage unit.
6, contact device for testing functions according to claim 1, it is characterized in that: the second surface of wherein said card extender is arranged on the circuit board, and makes conductive fabric contact with this circuit board.
7, contact device for testing functions according to claim 6, it is characterized in that: wherein said circuit board includes at least one fixed orifice, and card extender then includes at least one connecting hole, and a linkage unit is passed this connecting hole is connected with this fixed orifice.
8, contact device for testing functions according to claim 6 is characterized in that: also include at least one positioning unit, be arranged at the second surface of described card extender, and circuit board is provided with at least one pilot hole.
9, contact device for testing functions according to claim 1 is characterized in that: wherein said chip disposal area includes more than one side, and this side is provided with in the mode that tilts.
10, contact device for testing functions according to claim 1, it is characterized in that: wherein this probe is provided with in integrated mode.
CNU2009200041006U 2009-02-01 2009-02-01 Contact type function testing device Expired - Fee Related CN201348646Y (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CNU2009200041006U CN201348646Y (en) 2009-02-01 2009-02-01 Contact type function testing device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CNU2009200041006U CN201348646Y (en) 2009-02-01 2009-02-01 Contact type function testing device

Publications (1)

Publication Number Publication Date
CN201348646Y true CN201348646Y (en) 2009-11-18

Family

ID=41368114

Family Applications (1)

Application Number Title Priority Date Filing Date
CNU2009200041006U Expired - Fee Related CN201348646Y (en) 2009-02-01 2009-02-01 Contact type function testing device

Country Status (1)

Country Link
CN (1) CN201348646Y (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101871957B (en) * 2009-04-27 2012-07-25 中国钢铁股份有限公司 Electromagnetic test fixture
CN109425813A (en) * 2017-08-18 2019-03-05 中华精测科技股份有限公司 Detection device
WO2020098779A1 (en) * 2018-11-15 2020-05-22 宁波舜宇光电信息有限公司 Connection structure used for power testing of module and corresponding connecting member
CN111951879A (en) * 2019-05-16 2020-11-17 第一检测有限公司 Detection device

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101871957B (en) * 2009-04-27 2012-07-25 中国钢铁股份有限公司 Electromagnetic test fixture
CN109425813A (en) * 2017-08-18 2019-03-05 中华精测科技股份有限公司 Detection device
WO2020098779A1 (en) * 2018-11-15 2020-05-22 宁波舜宇光电信息有限公司 Connection structure used for power testing of module and corresponding connecting member
CN111190090A (en) * 2018-11-15 2020-05-22 宁波舜宇光电信息有限公司 Connecting structure for module power-on test and corresponding adapter
CN111190090B (en) * 2018-11-15 2022-06-10 宁波舜宇光电信息有限公司 Connecting structure for module power-on test and corresponding adapter
CN111951879A (en) * 2019-05-16 2020-11-17 第一检测有限公司 Detection device

Similar Documents

Publication Publication Date Title
CN103430031B (en) Apparatus for inspecting semiconductor device
CN2906633Y (en) Socket test module
CN201348646Y (en) Contact type function testing device
CN204044247U (en) A kind of flex circuit application resistance tester
CN101661078A (en) Circuit board and testing device thereof
CN205620509U (en) Difunctional circuit maintenance tester
TWI539165B (en) Probe, probe head and probe module
CN101437133A (en) Test switching device
CN105759086A (en) Mini-connector test probe module for circuit board
CN205427081U (en) VCXO crystal electrical performance test mechanism
CN102129004A (en) Method for testing open circuit on PCB
CN204203401U (en) A kind of male seat connector testing device
CN106918776A (en) A kind of instrument and equipment of Intelligent Measurement NanoSIM card Dynamic Signals
CN207965052U (en) A kind of arrangement for testing integrated circuit
CN102842803A (en) Test connector capable of quickly disassembling and assembling electric connection modules
CN112816746B (en) Probe card structure
CN107860949A (en) A kind of easily PXIe modular debuggings frock
CN210665818U (en) Switching device for semiconductor testing machine
CN108682632A (en) Semiconductor detection and its operating method
US20100330830A1 (en) Vertical probe intrface system
KR101348423B1 (en) Ejector device for test board of automatic test equipment
CN209044015U (en) A kind of high-precision quasi core piece design analytical equipment
CN220231812U (en) Test structure and circuit board testing arrangement convenient to extend
CN206020473U (en) A kind of attachment means for FPC electric performance tests
CN110514986A (en) A kind of high-voltage circuitbreaker testing standard interface and its test mode

Legal Events

Date Code Title Description
C14 Grant of patent or utility model
GR01 Patent grant
C17 Cessation of patent right
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20091118

Termination date: 20110201