CN207965052U - A kind of arrangement for testing integrated circuit - Google Patents
A kind of arrangement for testing integrated circuit Download PDFInfo
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- CN207965052U CN207965052U CN201820079113.9U CN201820079113U CN207965052U CN 207965052 U CN207965052 U CN 207965052U CN 201820079113 U CN201820079113 U CN 201820079113U CN 207965052 U CN207965052 U CN 207965052U
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- test
- probe
- arrangement
- integrated circuit
- connecting rod
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Abstract
The utility model discloses a kind of arrangement for testing integrated circuit,Its structure includes pedestal,Circuit test seat,Test probe,Probe connecting plate,Rotate head,Connecting rod,Lock,Supporting rod,Handle,Front top plate,Electric instrument,There are three test probe is set by screw and probe connecting plate through connection and level,Rotation head is installed vertically on probe connecting plate upper end and is connected with connecting rod,Lock set there are two and lower end by screw through at the top of connecting rod,Lock upper end is connected by screw with supporting rod,A kind of arrangement for testing integrated circuit of the utility model,Test probe is provided in structure,And circuit is tested by the test galvanic couple in device,Then expansion space strengthens soft or hard degree on the inside of device,And reduction hardness is carried out by body,When in use the impact of circuit is caused to damage to reduce device,To strengthen the practicability of device,Accelerate working efficiency.
Description
Technical field
The utility model is a kind of arrangement for testing integrated circuit, belongs to circuit testing technology field.
Background technology
Function test fixture be it is a kind of be used for testing some process in semi-finished product/finished product or production link, come with this
Judge whether measurand has reached the mechanical assist device of initial designs person's purpose, function test fixture is applied to simulation, number
Word, memory, RF and power circuit need corresponding function test fixture for each form.
Prior art discloses application No. is：A kind of arrangement for testing integrated circuit of CN201420058509.7, feature
It is that electric conductor includes upper pad, lower pad and via；Multiple holes are provided on printed circuit board, this some holes is not connected to each other,
The etched technique of printed circuit board eliminates the copper of surface part, only remains the copper for constituting upper pad and lower pad, upper pad
It is rounded with lower pad；Via is located at the center of upper pad and lower pad, and via is filled out by artistic faces such as heavy copper fillings
It is flat, pad and lower pad in connection, and run through printed circuit board；Electric conductor does not contact with each other each other, and in conductive body surface
Face is gold-plated, but the prior art pushes when probe is tested, is easy that circuit is made to damage, and device practicability is made to drop
It is low, influence work quality.
Utility model content
In view of the deficienciess of the prior art, the utility model aim is to provide a kind of arrangement for testing integrated circuit, with solution
It is certainly existing to push when probe is tested, be easy that circuit is made to damage, make the reduction of device practicability, influences work quality
The problem of.
To achieve the goals above, the utility model is to realize by the following technical solutions：A kind of integrated circuit survey
Trial assembly is set, and structure includes pedestal, circuit test seat, test probe, probe connecting plate, rotation head, connecting rod, lock, branch
Strut, handle, front top plate, electric instrument, the pedestal is rectangular parallelepiped structure and upper end is equipped with test bench, the test bench upper end
Equipped with test probe, the test probe by screw and probe connecting plate through connecting and there are three level sets, the rotation
Bull stick head is installed vertically on probe connecting plate upper end and is connected with connecting rod, it is described lock set there are two and lower end pass through
Screw is connected by screw with supporting rod through connecting rod top, the lock upper end, and the handle is set to supporting rod
Rear side, the front top plate are rectangular parallelepiped structure and are installed on the rear side of connecting rod, and the electricity instrument is installed vertically on pedestal
End, the test probe include footstalk, exchange pipe, barrier tube, aliform pipe, test nozzles, expansion space, test galvanic couple, body,
The test galvanic couple is set to body inside lower end and through aliform pipe, and the test nozzles upper end is connected with aliform pipe lower end
It connects, the barrier tube is set on the inside of body and is integrated, and the exchange pipe is set on the inside of barrier tube, the footstalk water
Flat set runs through connection there are two and with aliform pipe.
Further, the lock is connected by supporting rod with handle, and the supporting rod is set to the upper end of front top plate.
Further, the rotation head be cylindrical structure and with connecting rod on same center line.
Further, the front top plate is set on rear side of probe connecting plate, and the front top plate is installed on the upper end of pedestal.
Further, the body upper end is connected with probe connecting plate by screw.
Further, the connecting rod uses stainless steel, has hardness height, corrosion-resistant, and it is equivalent to be not susceptible to rusty stain
Fruit.
Further, the test probe uses flexible glue material, has hardness low, and flexibility is high, is not easy to cause circuit
Damage.
Advantageous effect
A kind of arrangement for testing integrated circuit of the utility model is provided with test probe in structure, and by device
Test galvanic couple circuit is tested, then expansion space strengthens soft or hard degree on the inside of device, and is carried out by body
Reduce hardness, when in use the impact of circuit is caused to damage to reduce device, to strengthen the practicability of device, be added
Fast working efficiency.
Description of the drawings
Upon reading the detailed description of non-limiting embodiments with reference to the following drawings, other spies of the utility model
Sign, objects and advantages will become more apparent upon：
Fig. 1 is a kind of structural schematic diagram of arrangement for testing integrated circuit of the utility model；
Fig. 2 is a kind of test probe cross-sectional view of arrangement for testing integrated circuit of the utility model.
In figure：Pedestal -1, circuit test seat -2, test probe -3, probe connecting plate -4, rotation head -5, connecting rod -6,
Lock -7, handle -9, front top plate -10, electric instrument -11, footstalk -301, exchanges pipe -302, barrier tube -303, wing at supporting rod -8
Shape pipe -304, test nozzles -305, expansion space -306, test galvanic couple -307, body -308.
Specific implementation mode
To make the technical means, creative features, achievement of purpose, and effectiveness of the utility model be easy to understand, below
In conjunction with specific implementation mode, the utility model is expanded on further.
It please refers to Fig.1, Fig. 2, the utility model provides a kind of arrangement for testing integrated circuit technical solution：Its structure includes bottom
Seat 1, circuit test seat 2, test probe 3, probe connecting plate 4, rotation head 5, connecting rod 6, lock 7, supporting rod 8, handle 9,
Front top plate 10, electric instrument 11, the pedestal 1 is rectangular parallelepiped structure and upper end is equipped with test bench 2, and 2 upper end of the test bench is set
Have a test probe 3, the test probe 3 by screw and probe connecting plate 4 through connecting and there are three level sets, the rotation
Bull stick head 5 is installed vertically on 4 upper end of probe connecting plate and is connected with connecting rod 6, it is described lock 7 set there are two and lower end
By screw through 6 top of connecting rod, 7 upper ends of the lock are connected by screw with supporting rod 8, and the handle 9 is set to
The rear side of supporting rod 8, the front top plate 10 are rectangular parallelepiped structure and are installed on the rear side of connecting rod 6, and the electricity instrument 11 is hung down
Straight to be installed on 1 upper end of pedestal, the test probe 3 includes footstalk 301, exchanges pipe 302, barrier tube 303, aliform pipe 304, tests
Nozzle 305, expansion space 306, test galvanic couple 307, body 308, the test galvanic couple 307 are set to 308 inside lower end of body simultaneously
And through aliform pipe 304,305 upper end of the test nozzles is connected with 304 lower end of aliform pipe, and the barrier tube 303 is set to
It on the inside of body 308 and is integrated, the exchange pipe 302 is set to 303 inside of barrier tube, and 301 level of the footstalk is set
There are two and with aliform pipes 304 through connection, and the lock 7 is connected by supporting rod 8 with handle 9, and the supporting rod 8 is set
In the upper end of front top plate 10, the rotation head 5 be cylindrical structure and with connecting rod 6 on same center line, before described
Top plate 10 is set to 4 rear side of probe connecting plate, and the front top plate 10 is installed on the upper end of pedestal 1,308 upper end of the body and probe
Connecting plate 4 is connected by screw, and the connecting rod 6 uses stainless steel, has hardness height, corrosion-resistant, is not susceptible to become rusty
Mark and other effects, the test probe 3 use flexible glue material, have hardness low, and flexibility is high, is not easy to damage circuit.
The contact that test galvanic couple 307 described in this patent is made of two different conductor materials, can generate in junction
Electromotive force, the temperature of the size and Orientation of this electromotive force and the property and two junctions of the two different conductor materials of the junction
Difference is related, and the electricity instrument 11 is electric parameter measurement, power quality monitoring and analysis, electrical equipment control provide solution
Power measurement and control device.
Circuit board to be tested is first put into 2 upper end of circuit test seat when being used, branch is then pushed by handle 9
Strut 8 makes connecting rod 6 be pushed with rotation head 5, so that the test probe 3 in device is touched circuit board, then by device
Body 308 and expansion space 306 reduce the buffering to circuit board, then tested by testing galvanic couple 307, pass through test
Data are carried out processing with aliform pipe 304 and are shown by electric instrument 11 by nozzle 305.
The utility model is solved when probe is tested, and is pushed, is easy that circuit is made to damage, makes device practicability
The problem of reducing, influencing work quality, the utility model is combined with each other by above-mentioned component, and test is provided in structure and is visited
Needle, and circuit is tested by the test galvanic couple in device, then expansion space strengthens soft or hard degree on the inside of device,
And reduction hardness is carried out by body, when in use the impact of circuit is caused to damage to reduce device, to reinforce
The practicability of device, accelerates working efficiency.
The advantages of basic principles and main features and the utility model of the utility model have been shown and described above, for
For those skilled in the art, it is clear that the present invention is not limited to the details of the above exemplary embodiments, and without departing substantially from this
In the case of the spirit or essential attributes of utility model, the utility model can be realized in other specific forms.Therefore, no matter
From the point of view of which point, the present embodiments are to be considered as illustrative and not restrictive, and the scope of the utility model is by institute
Attached claim rather than above description limit, it is intended that will fall within the meaning and scope of the equivalent requirements of the claims
All changes are embraced therein.Any reference numeral in claim should not be considered as to the involved right of limitation
It is required that.
In addition, it should be understood that although this specification is described in terms of embodiments, but not each embodiment is only wrapped
Containing an independent technical solution, this description of the specification is merely for the sake of clarity, and those skilled in the art should
It considers the specification as a whole, the technical solutions in the various embodiments may also be suitably combined, forms those skilled in the art
The other embodiment being appreciated that.
Claims (5)
1. a kind of arrangement for testing integrated circuit, it is characterised in that：Its structure includes pedestal (1), circuit test seat (2), test spy
Needle (3), probe connecting plate (4), rotation head (5), connecting rod (6), lock (7), supporting rod (8), handle (9), front top plate
(10), electric instrument (11), the pedestal (1) is rectangular parallelepiped structure and upper end is equipped with test bench (2), on the test bench (2)
End is equipped with test probe (3), and the test probe (3) runs through connection with probe connecting plate (4) by screw and level is equipped with
Three, the rotation head (5) is installed vertically on probe connecting plate (4) upper end and is connected with connecting rod (6), the lock
(7) by screw through connecting rod (6) top, lock (7) upper end passes through screw and support for there are two setting and lower end
Bar (8) is connected, and the handle (9) is set to the rear side of supporting rod (8), and the front top plate (10) is rectangular parallelepiped structure and installs
Rear side in connecting rod (6), the electricity instrument (11) are installed vertically on pedestal (1) upper end, and the test probe (3) includes footstalk
(301), pipe (302), barrier tube (303), aliform pipe (304), test nozzles (305), expansion space (306), test electricity are exchanged
Even (307), body (308), the test galvanic couple (307) is set on body (308) inside lower end and through aliform pipe
(304), test nozzles (305) upper end is connected with aliform pipe (304) lower end, and the barrier tube (303) is set to body
(308) it on the inside of and is integrated, the exchange pipe (302) is set on the inside of barrier tube (303), footstalk (301) water
Flat set runs through connection there are two and with aliform pipe (304).
2. a kind of arrangement for testing integrated circuit according to claim 1, it is characterised in that：The lock (7) passes through support
Bar (8) is connected with handle (9), and the supporting rod (8) is set to the upper end of front top plate (10).
3. a kind of arrangement for testing integrated circuit according to claim 1, it is characterised in that：The rotation head (5) is circle
Column structure and with connecting rod (6) on same center line.
4. a kind of arrangement for testing integrated circuit according to claim 1, it is characterised in that：The front top plate (10), which is set to, to be visited
On rear side of needle connecting plate (4), the front top plate (10) is installed on the upper end of pedestal (1).
5. a kind of arrangement for testing integrated circuit according to claim 1, it is characterised in that：Body (308) upper end with
Probe connecting plate (4) is connected by screw.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201820079113.9U CN207965052U (en) | 2018-01-17 | 2018-01-17 | A kind of arrangement for testing integrated circuit |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201820079113.9U CN207965052U (en) | 2018-01-17 | 2018-01-17 | A kind of arrangement for testing integrated circuit |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN207965052U true CN207965052U (en) | 2018-10-12 |
Family
ID=63733693
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201820079113.9U Active CN207965052U (en) | 2018-01-17 | 2018-01-17 | A kind of arrangement for testing integrated circuit |
Country Status (1)
| Country | Link |
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| CN (1) | CN207965052U (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110441031A (en) * | 2019-07-26 | 2019-11-12 | 武汉华星光电半导体显示技术有限公司 | Compression bonding apparatus |
| CN112345835A (en) * | 2020-11-03 | 2021-02-09 | 昆山联滔电子有限公司 | Detection device and detection positioning method |
-
2018
- 2018-01-17 CN CN201820079113.9U patent/CN207965052U/en active Active
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110441031A (en) * | 2019-07-26 | 2019-11-12 | 武汉华星光电半导体显示技术有限公司 | Compression bonding apparatus |
| CN112345835A (en) * | 2020-11-03 | 2021-02-09 | 昆山联滔电子有限公司 | Detection device and detection positioning method |
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