CN212111673U - Device for testing circuit board function - Google Patents

Device for testing circuit board function Download PDF

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Publication number
CN212111673U
CN212111673U CN202020573954.2U CN202020573954U CN212111673U CN 212111673 U CN212111673 U CN 212111673U CN 202020573954 U CN202020573954 U CN 202020573954U CN 212111673 U CN212111673 U CN 212111673U
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China
Prior art keywords
panel
circuit board
test
supporting plate
carrier
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CN202020573954.2U
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Chinese (zh)
Inventor
潘福源
张云
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Shenzhen Yikete Electronic Technology Testing Co ltd
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Shenzhen Yikete Electronic Technology Testing Co ltd
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Priority to CN202020573954.2U priority Critical patent/CN212111673U/en
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Abstract

The utility model relates to a detect technical field, a device for circuit board functional test is disclosed, the power distribution box comprises a box body, a supporting plate, a pressing plate, the depression bar, support plate and test probe, the upper end of box is equipped with a panel, the vertical setting of backup pad is at the rear side of the upper end wall of panel, gliding setting is on the preceding end wall of backup pad from top to bottom of clamp plate, the depression bar is detachable respectively and sets up on the lower end wall of clamp plate, gliding setting is in the top of panel from top to bottom in the support plate, the concave constant head tank that is equipped with of up end of support plate, the concave a plurality of test holes that are equipped with in bottom of constant head tank, test probe inserts respectively and establishes on the panel, the upper end of test probe is do not about the activity wear to locate in the test hole, the lower tip of depression. The technical scheme of the utility model easy operation, convenient to use, measurement accuracy and efficient effectively reduce the defective rate of product, and the practicality is strong.

Description

Device for testing circuit board function
Technical Field
The utility model relates to a detect technical field, in particular to a device for circuit board functional test.
Background
As a pivot for signal transmission of carriers and circuits of various components, a circuit board becomes the most important and critical part of an electronic information product, the quality and reliability of the whole equipment are determined by the quality and reliability level of the circuit board, and the quality control of the circuit board and the performance reliability of the product are improved by performing functional test on the circuit board.
However, most of the existing circuit board function tests directly use a multimeter to test the voltage and current between two measurement points on the circuit board to judge whether the circuit board is qualified or not, and the test method has the defects of low test working efficiency and can cause the phenomenon of wiring error to cause other faults.
SUMMERY OF THE UTILITY MODEL
The utility model aims at providing a device for circuit board functional test aims at solving current circuit board and adopts the universal meter to detect, and efficiency and precision are lower to the technical problem of wiring mistake still can appear.
In order to achieve the above object, the present invention provides a device for testing circuit board functions, comprising a box, a supporting plate, a pressing rod, a supporting plate and a testing probe, wherein a tester is arranged in the box, the upper end of the box is provided with a panel, the supporting plate is vertically arranged at the rear side of the upper end wall of the panel, the pressing plate is arranged on the front end wall of the supporting plate in a vertically sliding manner, the pressing rod is detachably arranged on the lower end wall of the pressing plate respectively, the supporting plate is arranged above the panel in a vertically sliding manner, a positioning groove for accommodating a circuit board to be tested is concavely arranged on the upper end surface of the supporting plate, a plurality of testing holes are concavely arranged at the bottom of the positioning groove, the testing probe is respectively inserted on the panel, the upper end and the lower end of the testing probe respectively extend out of the panel, the testing holes are respectively arranged corresponding to the testing points of, the upper end of the test probe penetrates through the test hole and is movably arranged in the test hole up and down, the test probe is electrically connected with a detection point of the circuit board to be tested in an abutting mode, the lower end of the pressing rod can be respectively abutted against the upper end faces of the carrier plate and the circuit board to be tested, and the lower end of the test probe is electrically connected with the tester.
The panel comprises a panel, a top end surface of the panel is provided with a plurality of top corners, the panel is provided with a plurality of top end walls, the top end surfaces of the top end walls are respectively provided with a plurality of guide columns, the top end surfaces of the guide columns are respectively provided with a plurality of support springs, the guide columns are respectively vertically arranged on the lower end walls of the four top corners of the support plate, the lower end parts of the guide columns are respectively connected with the panel in a vertical sliding manner, the support springs are respectively vertically arranged on the.
Further, still include first spacing post, first spacing post respectively vertical setting is in on the lower end wall of four apex angles of support plate, the panel respectively concave be equipped with the spacing hole of first spacing post one-to-one, the lower tip of first spacing post is equipped with a spacing step respectively, first spacing post is gliding inserting respectively from top to bottom and is located spacing downthehole setting, just spacing step respectively with the last reason butt in spacing hole.
Furthermore, four vertex angles of the upper end surface of the panel are respectively concavely provided with a mounting groove matched with the support plate spring, and the lower end part of the support plate spring is respectively embedded in the mounting groove.
Further, the carrier plate spring is a cylindrical coil spring.
Furthermore, a plurality of positioning columns corresponding to the positioning holes on the circuit board to be tested are convexly arranged at the bottom of the positioning groove.
Further, still include slide bar, sliding sleeve, handle and connecting rod, the sliding sleeve sets up the top of the front end wall of backup pad, the slide bar can be from top to bottom gliding wears to locate the sliding sleeve sets up, the rotatable setting of handle is in the upper end of backup pad, the both ends of connecting rod respectively with the upper end of slide bar and the centre of handle rotate to be connected, the clamp plate with the lower tip fixed connection of slide bar, through rotating the handle drive the clamp plate is followed the front end wall of backup pad slides from top to bottom.
The sliding rails are vertically and parallelly arranged on two sides of the front end wall of the supporting plate respectively, the lower end portions of the sliding blocks are arranged along the sliding rails in a vertically sliding mode respectively, the rear end portions of the pressing plates are fixedly connected with the sliding blocks respectively, and the pressing plates are connected with the front end wall of the supporting plate in a vertically sliding mode through the sliding rails and the sliding blocks.
Further, still include the spacing post of second, the spacing post of second sets up respectively the both sides of the upper and lower tip of slide rail, just the slider can respectively with the spacing post butt of second sets up.
Furthermore, two ends of the upper end surface of the carrier plate are respectively provided with a concave groove communicated with the positioning groove in a concave manner.
Adopt the technical scheme of the utility model, following beneficial effect has: the technical proposal of the utility model is that a panel is arranged at the upper end of a box body, a support plate is vertically arranged at the rear side of the upper end wall of the panel, a press plate is arranged at the front end wall of the support plate in a vertical sliding way, a press rod is respectively arranged at the lower end wall of the press plate in a detachable way, a support plate is arranged above the panel in a vertical sliding way, a positioning groove for holding a circuit board to be tested is concavely arranged on the upper end surface of the support plate, a plurality of test holes are concavely arranged at the bottom of the positioning groove, test probes are respectively inserted on the panel, the upper ends and the lower ends of the test probes respectively extend out of the panel and are respectively arranged correspondingly to test points of the circuit board to be tested, the upper ends of the test probes are respectively arranged in the test holes in a vertical moving way and are electrically connected with the test points of the circuit board to be tested, the lower end parts of the test probes are respectively electrically connected with the tester; during specific testing, the circuit board is placed into the positioning groove of the carrier plate, so that the problem of wiring errors can be effectively avoided, the handle is rotated downwards, the pressure rod moves downwards to be abutted against the circuit board, the carrier plate is pushed to move downwards, the test point of the circuit board is abutted against and electrically connected with the test probe, the lower end part of the test probe is electrically connected with a test instrument respectively, and therefore functional detection of the circuit board is completed; the support plate spring plays a role in buffering protection, can effectively avoid rigid contact between the test probe and the circuit board, damages the problem of the circuit board, is simple to operate, convenient to use, short in test time, high in detection precision and efficiency, and strong in practicability, and effectively reduces the reject ratio of products.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings needed to be used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to the structures shown in the drawings without creative efforts.
Fig. 1 is a schematic overall structure diagram of an apparatus for testing circuit board functions according to an embodiment of the present invention;
fig. 2 is a schematic partial structural diagram of an apparatus for testing circuit board functions according to an embodiment of the present invention;
fig. 3 is a schematic diagram of a partially exploded structure of an apparatus for testing circuit board functions according to an embodiment of the present invention.
The objects, features and advantages of the present invention will be further described with reference to the accompanying drawings.
Detailed Description
The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative efforts belong to the protection scope of the present invention.
It should be noted that all the directional indicators (such as upper, lower, left, right, front and rear … …) in the embodiment of the present invention are only used to explain the relative position relationship between the components, the motion situation, etc. in a specific posture (as shown in the drawings), and if the specific posture is changed, the directional indicator is changed accordingly.
In addition, the technical solutions in the embodiments may be combined with each other, but it must be based on the realization of those skilled in the art, and when the technical solutions are contradictory or cannot be realized, the combination of the technical solutions should not be considered to exist, and is not within the protection scope of the present invention.
The utility model provides a device for circuit board functional test.
As shown in fig. 1 to 3, in an embodiment of the present invention, the apparatus for testing circuit board functions includes a box 101, a supporting plate 102, a pressing plate 103, a pressing rod 104, a supporting plate 105 and test probes 106, wherein a tester (not shown) is disposed in the box 101, a panel 1011 is disposed at an upper end of the box 101, the supporting plate 102 is vertically disposed at a rear side of an upper end wall of the panel 1011, the pressing plate 103 is slidably disposed on a front end wall of the supporting plate 102, the pressing rods 104 are detachably disposed on lower end walls of the pressing plate 103 respectively, the supporting plate 105 is slidably disposed above the panel 1011, a positioning groove 1051 for accommodating a circuit board to be tested is concavely disposed on the upper end surface of the supporting plate 105, a plurality of test holes 1052 are concavely disposed at a bottom of the positioning groove 1051, and the test probes 106 are respectively inserted on the panel, the upper end and the lower end of the test probe 106 respectively extend out of the panel 1011 for arrangement, the test holes 1052 are respectively arranged corresponding to the detection points of the circuit board to be tested, the upper end of the test probe 106 is respectively and vertically movably arranged in the test holes 1052 in a penetrating manner and is electrically connected with the detection points of the circuit board to be tested in an abutting manner, the lower end of the pressure lever 104 is respectively arranged in an abutting manner with the upper end surfaces of the carrier plate 105 and the circuit board to be tested, and the lower end of the test probe 106 is respectively and electrically connected with the tester.
Specifically, the carrier plate structure further comprises guide posts 107 and carrier plate springs 108, the guide posts 107 are respectively vertically arranged on the lower end walls of the four top corners of the carrier plate 105, the lower end portions of the guide posts 107 are respectively connected with the panel 1011 in a vertically sliding manner, the carrier plate springs 108 are respectively vertically arranged on the upper end surface of the panel 1011, and the upper ends of the carrier plate springs 108 are respectively abutted against the lower end walls of the carrier plate 105.
Specifically, the carrier plate further comprises a first limiting column 109, wherein the first limiting column 109 is vertically arranged on the lower end walls of the four top corners of the carrier plate 105, the panel 1011 is respectively concavely provided with limiting holes 1012 corresponding to the first limiting column 109 one by one, the lower end of the first limiting column 109 is respectively provided with a limiting step 1091, the first limiting column 109 is respectively inserted into the limiting holes 1012 in an up-and-down sliding manner, and the limiting steps 1091 are respectively abutted to the upper edges of the limiting holes 1012.
Specifically, four top corners of the upper end surface of the panel 1011 are respectively recessed with a mounting groove 1013 adapted to the carrier spring 108, and the lower end of the carrier spring 108 is respectively embedded in the mounting groove 1013, so as to fix the carrier spring 108 and prevent the carrier spring 108 from shifting.
Specifically, the carrier spring 108 is a cylindrical coil spring, which plays a role of buffering and protecting the circuit board, and avoids rigid contact between the circuit board and the test probe.
Specifically, the bottom of the positioning groove 1051 is convexly provided with a plurality of positioning columns 1053 corresponding to the positioning holes on the circuit board to be tested, so that the circuit board is effectively prevented from shifting in the testing process, and the testing precision is improved.
Specifically, still include slide bar 110, sliding sleeve 111, handle 112 and connecting rod 113, sliding sleeve 110 sets up the top of the front end wall of backup pad 102, slide bar 110 can be gliding about wearing to locate sliding sleeve 111 sets up, the setting that handle can 112 pivoted is in the upper end of backup pad 102, the both ends of connecting rod 113 respectively with the upper end of slide bar 110 and the centre of handle 112 rotate and are connected, clamp plate 103 with the lower tip fixed connection of slide bar 110, through rotating handle 112 drive clamp plate 103 follows the front end wall of backup pad 102 slides from top to bottom.
Specifically, the pressing device further comprises slide rails 114 and slide blocks 115, the slide rails 114 are respectively vertically arranged on two sides of the front end wall of the supporting plate 102 in parallel, the lower end portions of the slide blocks 115 are respectively arranged along the slide rails 114 in a vertically sliding manner, the rear end portions of the pressing plates 103 are respectively fixedly connected with the slide blocks 115, and the pressing plates 103 are connected with the front end wall of the supporting plate 102 in a vertically sliding manner through the slide rails 114 and the slide blocks 115.
Specifically, the sliding device further comprises a second limiting column 116, wherein the second limiting column 116 is respectively disposed on two sides of the upper end portion and the lower end portion of the sliding rail 114, and the sliding block 115 can be respectively abutted against the second limiting column 116.
Specifically, two ends of the upper end surface of the carrier 105 are respectively provided with a concave groove 1054 communicated with the positioning groove 1051 in a concave manner, so that the circuit board for test can be conveniently taken and placed.
Specifically, the utility model is provided with a panel at the upper end of the box body, a support plate is vertically arranged at the rear side of the upper end wall of the panel, a press plate is arranged on the front end wall of the support plate in a vertical sliding manner, press rods are respectively detachably arranged on the lower end wall of the press plate, a support plate is arranged above the panel in a vertical sliding manner, the upper end surface of the support plate is concavely provided with a positioning groove for accommodating a circuit board to be tested, the bottom of the positioning groove is concavely provided with a plurality of test holes, test probes are respectively inserted on the panel, the upper ends and the lower ends of the test probes respectively extend out of the panel and are respectively arranged correspondingly to the test points of the circuit board to be tested, the upper ends of the test probes are respectively arranged in the test holes in a vertical moving manner and are electrically connected with the test points of the circuit board to be tested, the lower ends of, the lower end parts of the test probes are respectively electrically connected with the tester; during specific testing, the circuit board is placed into the positioning groove of the carrier plate, so that the problem of wiring errors can be effectively avoided, the handle is rotated downwards, the pressure rod moves downwards to be abutted against the circuit board, the carrier plate is pushed to move downwards, the test point of the circuit board is abutted against and electrically connected with the test probe, the lower end part of the test probe is electrically connected with a test instrument respectively, and therefore functional detection of the circuit board is completed; the support plate spring plays a role in buffering protection, can effectively avoid rigid contact between the test probe and the circuit board, damages the problem of the circuit board, is simple to operate, convenient to use, short in test time, high in detection precision and efficiency, and strong in practicability, and effectively reduces the reject ratio of products.
The above only be the preferred embodiment of the utility model discloses a not consequently restriction the utility model discloses a patent range, all are in the utility model discloses a conceive, utilize the equivalent structure transform of what the content was done in the description and the attached drawing, or direct/indirect application all is included in other relevant technical field the utility model discloses a patent protection within range.

Claims (10)

1. A device for testing the function of a circuit board is characterized by comprising a box body, a supporting plate, a pressing rod, a supporting plate and test probes, wherein a tester is arranged in the box body, a panel is arranged at the upper end part of the box body, the supporting plate is vertically arranged at the rear side of the upper end wall of the panel, the pressing plate is arranged on the front end wall of the supporting plate in a vertically sliding manner, the pressing rod is respectively detachably arranged on the lower end wall of the pressing plate, the supporting plate is arranged above the panel in a vertically sliding manner, a positioning groove capable of accommodating the circuit board to be tested is concavely arranged on the upper end surface of the supporting plate, a plurality of test holes are concavely arranged at the bottom of the positioning groove, the test probes are respectively inserted on the panel, the upper ends and the lower ends of the test probes respectively extend out of the panel and are arranged, and the test holes are respectively arranged corresponding, the upper end of the test probe penetrates through the test hole and is movably arranged in the test hole up and down, the test probe is electrically connected with a detection point of the circuit board to be tested in an abutting mode, the lower end of the pressing rod can be respectively abutted against the upper end faces of the carrier plate and the circuit board to be tested, and the lower end of the test probe is electrically connected with the tester.
2. The apparatus of claim 1, further comprising guide pillars and carrier springs, wherein the guide pillars are vertically disposed on the lower end walls of the four corners of the carrier, the lower ends of the guide pillars are slidably connected to the panel, the carrier springs are vertically disposed on the upper end surface of the panel, and the upper ends of the carrier springs are abutted against the lower end walls of the carrier.
3. The device according to claim 2, further comprising first limiting posts vertically disposed on the lower end walls of the four corners of the carrier, wherein the panel is recessed with limiting holes corresponding to the first limiting posts one by one, the lower ends of the first limiting posts are respectively provided with a limiting step, the first limiting posts are respectively inserted into the limiting holes in an up-and-down sliding manner, and the limiting steps are respectively abutted against the upper edges of the limiting holes.
4. The device as claimed in claim 2, wherein four corners of the upper surface of the panel are respectively recessed with a mounting groove adapted to the carrier spring, and the lower end of the carrier spring is respectively embedded in the mounting groove.
5. The apparatus of claim 2, wherein the carrier spring is a cylindrical coil spring.
6. The apparatus as claimed in claim 1, wherein the positioning groove has a plurality of positioning posts protruding from a bottom thereof and corresponding to the positioning holes of the circuit board to be tested.
7. The device for testing the functions of the circuit board according to claim 1, further comprising a sliding rod, a sliding sleeve, a handle and a connecting rod, wherein the sliding sleeve is arranged above the front end wall of the supporting plate, the sliding rod can slide up and down and penetrate through the sliding sleeve, the handle is rotatably arranged at the upper end part of the supporting plate, two ends of the connecting rod are respectively connected with the upper end part of the sliding rod and the middle of the handle in a rotating manner, the pressing plate is fixedly connected with the lower end part of the sliding rod, and the pressing plate is driven to slide up and down along the front end wall of the supporting plate by rotating the handle.
8. The device for testing the functions of the circuit board as claimed in claim 7, further comprising slide rails and slide blocks, wherein the slide rails are respectively vertically and parallelly arranged on two sides of the front end wall of the supporting plate, the lower end portions of the slide blocks are respectively arranged along the slide rails in a vertically sliding manner, the rear end portions of the pressing plates are respectively fixedly connected with the slide blocks, and the pressing plates are respectively connected with the front end wall of the supporting plate in a vertically sliding manner through the slide rails and the slide blocks.
9. The device of claim 8, further comprising second limiting posts, wherein the second limiting posts are respectively disposed at two sides of the upper and lower ends of the slide rail, and the sliding block is respectively disposed in contact with the second limiting posts.
10. The apparatus as claimed in claim 1, wherein a groove communicating with the positioning groove is formed at each of two ends of the upper surface of the carrier.
CN202020573954.2U 2020-04-16 2020-04-16 Device for testing circuit board function Active CN212111673U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202020573954.2U CN212111673U (en) 2020-04-16 2020-04-16 Device for testing circuit board function

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202020573954.2U CN212111673U (en) 2020-04-16 2020-04-16 Device for testing circuit board function

Publications (1)

Publication Number Publication Date
CN212111673U true CN212111673U (en) 2020-12-08

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Application Number Title Priority Date Filing Date
CN202020573954.2U Active CN212111673U (en) 2020-04-16 2020-04-16 Device for testing circuit board function

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113049942A (en) * 2021-02-25 2021-06-29 深圳市磐锋精密技术有限公司 Keyboard thin film circuit board function test equipment and test method
WO2023092674A1 (en) * 2021-11-29 2023-06-01 歌尔股份有限公司 Testing device

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113049942A (en) * 2021-02-25 2021-06-29 深圳市磐锋精密技术有限公司 Keyboard thin film circuit board function test equipment and test method
CN113049942B (en) * 2021-02-25 2024-03-08 深圳市磐锋精密技术有限公司 Keyboard thin film circuit board function test equipment and test method
WO2023092674A1 (en) * 2021-11-29 2023-06-01 歌尔股份有限公司 Testing device

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