CN201319056Y - 用于测试线路板专用测试机的通用转接装置及通用治具 - Google Patents

用于测试线路板专用测试机的通用转接装置及通用治具 Download PDF

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Publication number
CN201319056Y
CN201319056Y CNU2008201794982U CN200820179498U CN201319056Y CN 201319056 Y CN201319056 Y CN 201319056Y CN U2008201794982 U CNU2008201794982 U CN U2008201794982U CN 200820179498 U CN200820179498 U CN 200820179498U CN 201319056 Y CN201319056 Y CN 201319056Y
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CN
China
Prior art keywords
conducting element
point assembly
net point
test
tool
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Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CNU2008201794982U
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English (en)
Chinese (zh)
Inventor
陈涛
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Individual
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Individual
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Publication date
Application filed by Individual filed Critical Individual
Priority to CNU2008201794982U priority Critical patent/CN201319056Y/zh
Priority to PCT/CN2009/070129 priority patent/WO2010034185A1/fr
Priority to CN200980000060.0A priority patent/CN101680912B/zh
Application granted granted Critical
Publication of CN201319056Y publication Critical patent/CN201319056Y/zh
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
    • G01R31/2808—Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07342—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being at an angle other than perpendicular to test object, e.g. probe card
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
    • G01R1/07371—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch using an intermediate card or back card with apertures through which the probes pass
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2805—Bare printed circuit boards

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Measuring Leads Or Probes (AREA)
CNU2008201794982U 2008-09-23 2008-12-01 用于测试线路板专用测试机的通用转接装置及通用治具 Expired - Fee Related CN201319056Y (zh)

Priority Applications (3)

Application Number Priority Date Filing Date Title
CNU2008201794982U CN201319056Y (zh) 2008-09-23 2008-12-01 用于测试线路板专用测试机的通用转接装置及通用治具
PCT/CN2009/070129 WO2010034185A1 (fr) 2008-09-23 2009-01-13 Dispositif général de transfert permettant de tester un dispositif de test de carte de circuits imprimés et dispositif associé
CN200980000060.0A CN101680912B (zh) 2008-09-23 2009-01-13 用于测试线路板专用测试机的通用转接装置及通用治具

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
CN200820212074 2008-09-23
CN200820212074.1 2008-09-23
CNU2008201794982U CN201319056Y (zh) 2008-09-23 2008-12-01 用于测试线路板专用测试机的通用转接装置及通用治具

Publications (1)

Publication Number Publication Date
CN201319056Y true CN201319056Y (zh) 2009-09-30

Family

ID=41197820

Family Applications (1)

Application Number Title Priority Date Filing Date
CNU2008201794982U Expired - Fee Related CN201319056Y (zh) 2008-09-23 2008-12-01 用于测试线路板专用测试机的通用转接装置及通用治具

Country Status (2)

Country Link
CN (1) CN201319056Y (fr)
WO (1) WO2010034185A1 (fr)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102419383A (zh) * 2011-12-29 2012-04-18 珠海拓优电子有限公司 低阻无弹簧治具及其制造方法
CN103091516A (zh) * 2011-11-07 2013-05-08 日本电产理德株式会社 基板检查夹具、夹具底座单元和基板检查装置
CN107229012A (zh) * 2017-06-13 2017-10-03 日月光封装测试(上海)有限公司 测试治具及其测试针孔的排布方法
CN110058148A (zh) * 2019-05-29 2019-07-26 深圳市凯码时代科技有限公司 转接电路板、转接夹具架构以及相应的电路转接方法

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104111358A (zh) * 2014-07-11 2014-10-22 浙江开化建科电子科技有限公司 一种pcb专用测试架
CN109313216A (zh) * 2016-06-10 2019-02-05 金亨益 橡胶插座及其制造方法
CN108008161A (zh) * 2017-10-26 2018-05-08 惠州市金百泽电路科技有限公司 金属化半孔光电产品电性能的快速检测方法
CN109672592A (zh) * 2019-02-18 2019-04-23 深圳市菲菱科思通信技术股份有限公司 路由器测试治具
CN111343050A (zh) * 2020-03-02 2020-06-26 瑞声科技(新加坡)有限公司 传输模组的测试装置
CN112014721B (zh) * 2020-09-01 2023-04-11 珠海景旺柔性电路有限公司 一种通用型lcr测试板及其制作方法
CN112269119B (zh) * 2020-10-25 2023-05-23 苏州方普智能装备有限公司 高密度测点转接测试治具及转接方法
CN113820585B (zh) * 2021-08-16 2024-03-08 胜宏科技（惠州）股份有限公司 一种多通道可监测出单PCS不良的Hipot测试机

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0843471A (ja) * 1994-07-27 1996-02-16 Corp Of Herumesu:Kk プリント基板検査方法並びにその装置
JPH09127176A (ja) * 1995-10-27 1997-05-16 Nec Corp プリント基板検査治具
CN2636252Y (zh) * 2003-06-20 2004-08-25 深圳市凯码软件技术有限公司 电路板测试机针盘连通转接装置
JP2005098799A (ja) * 2003-09-24 2005-04-14 Fuji Electric Holdings Co Ltd プリント回路板の検査装置
CN2677944Y (zh) * 2003-12-03 2005-02-09 陈嘉隆 检测电路板的治具
CN100394190C (zh) * 2003-12-03 2008-06-11 联能科技（深圳）有限公司 可变密度印刷电路板测试装置
CN2831127Y (zh) * 2005-03-15 2006-10-25 深圳麦逊电子有限公司 Pcb板测试机转换板校正辅助装置
CN201004081Y (zh) * 2007-01-18 2008-01-09 王云阶 电子及电路板检测装置

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103091516A (zh) * 2011-11-07 2013-05-08 日本电产理德株式会社 基板检查夹具、夹具底座单元和基板检查装置
CN102419383A (zh) * 2011-12-29 2012-04-18 珠海拓优电子有限公司 低阻无弹簧治具及其制造方法
CN107229012A (zh) * 2017-06-13 2017-10-03 日月光封装测试(上海)有限公司 测试治具及其测试针孔的排布方法
CN110058148A (zh) * 2019-05-29 2019-07-26 深圳市凯码时代科技有限公司 转接电路板、转接夹具架构以及相应的电路转接方法

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Publication number Publication date
WO2010034185A1 (fr) 2010-04-01

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C14 Grant of patent or utility model
GR01 Patent grant
C17 Cessation of patent right
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20090930

Termination date: 20111201