CN201319056Y - Universal switching device and universal fixture used for special testing machine for testing circuit board - Google Patents
Universal switching device and universal fixture used for special testing machine for testing circuit board Download PDFInfo
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- CN201319056Y CN201319056Y CNU2008201794982U CN200820179498U CN201319056Y CN 201319056 Y CN201319056 Y CN 201319056Y CN U2008201794982 U CNU2008201794982 U CN U2008201794982U CN 200820179498 U CN200820179498 U CN 200820179498U CN 201319056 Y CN201319056 Y CN 201319056Y
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
- G01R31/2808—Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07342—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being at an angle other than perpendicular to test object, e.g. probe card
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
- G01R1/07371—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch using an intermediate card or back card with apertures through which the probes pass
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2805—Bare printed circuit boards
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- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Measuring Leads Or Probes (AREA)
Abstract
The utility model relates to a universal switching device and a universal fixture used for a special testing machine for testing a circuit board. The universal switching device comprises an upper grid point assembly, a converting circuit board, a lower grid point assembly and a base. The upper grid point assembly is arranged at the reverse side of a dial, the converting circuit board is arranged between the upper grid point assembly and the lower grid point assembly, and the base which is located under the lower grid point assembly is fixed on the special testing machine; testing probes on the dial are connected with socket points on the base one by one in an electrical contact manner by an electric conduction element on the upper grid point assembly, an obverse-side electric conduction point and a reverse-side electric conduction point on the converting circuit board and the electric element on the lower grid point assembly, and the socket points on the base are electrically connected with testing signal conductor wires one by one. Compared with the special testing machine which is equipped with a composite testing device in the prior art, the special testing machine does not need to manufacture a wire coil any longer, so that the manufacturing time can be greatly shortened; compared with the universal testing machine, the price of the testing machine is low.
Description
[technical field]
The utility model relates to the electric performance test device, relates in particular to the short circuit of testing printed circuit and proving installation that opens circuit and tool.
[background technology]
Wiring board manufacturer all will open circuit to the circuit on the wiring board and short-circuit test behind the wiring board that completes.Prior art comprises special tester, universal testing machine and flying probe tester to wiring board short circuit and the testing apparatus that opens circuit, wherein the flying probe tester test speed is slow, mainly be suitable for the testing engineering sample, the testing apparatus that is used to produce in batches the circuit plate then mainly is special tester and universal testing machine.
Special tester mainly is could test wiring board by the composite test device that electrically contacts with wiring board; Composite test device comprises dials and drum, and dials is the assembly that a plurality of test probes are housed, and each test probe is corresponding one by one with each test point on needing the measurement circuit plate; Drum is the assembly that a plurality of elastic partss are housed, and the tail end of each test probe all can contact with one of them elastic parts on the drum.The elasticity that elastic parts provides makes each test probe and wiring board to be tested that excellent contact be arranged, and reduces each test probe stabbing wiring board simultaneously again.Because the Bobbin structure of composite test device is relatively complicated, its Production Time is also long, and each composite test device is to make at the wiring board of same model, can not be general.At the wiring board of different model, the dials of composite test device and drum all will be made again; Though the total expense of special tester is more cheap than universal testing machine, but by thereon the composite test device wiring board at different model, its dials and drum all will be made again, have increased cost, and the Production Time of drum is long, and this has also brought inconvenience to the user.
And universal testing machine comprises universal test tool and general-purpose elastic parts base, and the universal test tool is exactly a packaged dials that a plurality of test probe assemblies are arranged, and each test probe on this dials is corresponding one by one with each test point on needing the measurement circuit plate; General-purpose elastic parts base is the net point assembly of a densely covered elastic parts, and the afterbody that guarantees each test probe on the dials can drop on the elastic parts of net point of this general-purpose elastic parts base.When the wiring board of test different model, only need to make one with each test point of different model wiring board one to one dials just can test this wiring board.But owing on the universal testing machine general-purpose elastic parts base is arranged, the quantity of the elastic parts on the base is very big, each elastic parts all has a switching point correspondence of test machine inside simultaneously, and its resulting cost is confidential much more expensive than special test, and general producer is beyond affordability.
[utility model content]
The technical problems to be solved in the utility model is to provide a kind of general switching device and general tool simple in structure, that cost is low, that be used for measurement circuit plate special tester.
The technical scheme that its technical matters that solves the utility model adopts is: a kind of general switching device that is used for measurement circuit plate special tester is provided, be provided with the dials and the test signal conductor wire of a plurality of test probes on described special tester, described test probe is corresponding with the test point of circuit board to be tested; Described general switching device comprises the last net point assembly that is provided with a plurality of first conducting elements, the following net point assembly that is provided with a plurality of second conducting elements, the conversion line plate on described between net point assembly and the following net point assembly and be located at the described base of net point assembly downside down;
The positive and negative two sides of described conversion line plate respectively is provided with a plurality of fronts conductiving point and reverse side conductiving point, the position of described front conductiving point is corresponding one by one with described position of going up the point that first conducting element that touches with test probe is arranged in the net point assembly, and described front conductiving point is in the corresponding one by one electrical connection of conversion line intralamellar part and reverse side conductiving point; Have a socket points that can be connected on the described base with the test signal conductor wire; Described second conducting element conducts electricity with the socket points on the described base and is connected;
Described upward net point assembly is installed in the back side of described dials; Each test probe on the described dials electrically contacts one by one with the test signal line with socket points on the base and is connected by described second conducting element of correspondence on first corresponding on the net point assembly conducting element, front conductiving point on the conversion line plate and reverse side conductiving point and the following net point assembly of going up.
In general switching device of the present utility model, described first conducting element and second conducting element are band spring conductive devices; Offer and insert first through hole and second through hole of described band spring conductive devices on described on net point assembly and the following grid assembly respectively; Perhaps
Described upward net point assembly and/or following grid assembly are elastic insulated plate, and the position at described first conducting element and second conducting element is mixed with electrically conductive particles, by described electrically conductive particles and elastic insulated harden to close form described first conducting element and second conducting element.
In general switching device of the present utility model, described first conducting element of going up on the net point assembly is covered with in the described all test zones of net point assembly of going up;
Described first conducting element on described on the net point assembly spacing embark on journey, become column distribution equably; The described distribution density that goes up first conducting element on the net point assembly is 2 times, 4 times, 8 times or 10 double densities.
In general switching device of the present utility model, the one side of described second conducting element is stretched out the described front of net point assembly down, forms good electrical contact with described reverse side conductiving point; And/or the described first conducting element afterbody of going up on the net point assembly stretches out the described reverse side of going up the net point assembly, and the front conductiving point corresponding with described conversion line plate has good electrical contact.
In general switching device of the present utility model, be respectively equipped with corresponding registration holes on described dials, last net point assembly, conversion line plate, following net point assembly and the base.
In general switching device of the present utility model, conducting wire or external conductor wire and described second conducting element of described each socket points by described base inside conducts electricity and is connected or conducts electricity contact; Described base stretches out, and described socket points is fixed on the outward extending position of this base.
The utility model also provides a kind of general tool that is used for measurement circuit plate special tester, and described general tool comprises last tool and the following tool that lays respectively at described wiring board both sides; The described tool of going up includes above-mentioned dials and general switching device with following tool.
In general tool of the present utility model, the second conducting element quantity on the following net point assembly of the general switching device of described down tool is more than or equal to the number of test points of described special tester, and the second conducting element quantity on the following net point assembly of the described general switching device of going up tool is more than or equal to half of the number of test points of special tester.
In general tool of the present utility model, the quantity of second conducting element on the following net point assembly of described down tool equal described special tester number of test points N doubly, the integer of N＞1; Correspondingly, the N of described down net point assembly described second conducting element is one group, and each group is connected with a socket points on the base;
The quantity of second conducting element on the described following net point assembly of going up tool equal described special tester number of test points half N doubly, the integer of N＞1.
In general tool of the present utility model, the second conducting element quantity sum on two following net point assemblies of described upward tool and following tool equals the number of test points of described special tester, and the described second conducting element quantity of tool and following tool that goes up is by given proportional distribution.
Compare with prior art, the utility model is used for the general switching device of measurement circuit plate special tester and the beneficial effect of general tool is:
Because the general switching device of the utility model is contained in measurement circuit plate on the special tester, general-purpose elastic parts base has similar functions on this general switching device and the universal testing machine, and when having equipped the wiring board of special tester test different model of this general switching device, only need to make and get final product with corresponding dials of wiring board to be tested and conversion line plate, the elastic parts that the conversion line plate is used each tester probe takes out, reverse side point by wiring board and special test itself with the net point formed of test point be connected, thereby realized corresponding relation with the test point quantity of several thousand of the elastic parts of several ten thousand on general-purpose elastic base on the universal testing machine or hundreds of thousands quantity and test machines itself.The Production Time of conversion line plate is shorter than drum, and cost is low.Follow the special tester that prior art is equipped with composite test device to compare like this, behind this general switching device of use, do not need to make drum on the special tester again, its Production Time can shorten greatly; And compare with the prior art universal testing machine, used the special tester price of this general switching device to want considerably cheaper.
In addition, general tool of the present utility model will descend the off line lattice point number of the general switching device of tool correspondence set and test machine always count the same or N times, the off line lattice point number of the general switching device of last tool correspondence set and test machine always count over half, can guarantee that like this but so long as the counting less than the number of test points of whole tester table of test plate (panel) to be measured, this test plate (panel) to be measured just can cooperate this general switching device to use.In addition, can will descend net point and base to link together, have the cheap advantage of cost of manufacture by the spring that has lead.
In addition, if following net point and base are not by having the spring connected mode of lead, elastic conductive component on the following net point assembly and the composition insulcrete of net point assembly down also can be to be mixed with metal particle by one in rubber slab in each is provided with the elastic conductive component position, by the combination formation elastic conductive component of metal particle and rubber.Such mode can reduce the height of net point assembly down, also plays the effect of the height that reduces whole switching device simultaneously.
Perhaps, conducting element on the following net point slightly stretches out the reverse side of net point down, a wiring board is arranged on the base, have on the wiring board and following net point on conducting element position conductiving point one to one, conductiving point is connected with the socket points conduction by the circuit of wiring board inside.After will descending the assembling of net point and base, the conducting element on the following net point just can be connected with the socket points conduction.
[description of drawings]
Fig. 1 is the general switching device that is used for measurement circuit plate special tester of an embodiment of the utility model and the dials on the special tester cross-sectional schematic when being fitted together test single face wiring board;
Fig. 2 is that the dials on general switching device of the utility model and the special tester is fitted together the axonometric projection decomposing schematic representation when testing the single face wiring board;
Fig. 3 is the general switching device of an embodiment of general tool of the present utility model and the dials on the special tester cross-sectional schematic when being fitted together testing two-sided wiring board;
Fig. 4 be on the general switching device of the utility model on the net point assembly 110 density of through hole 112 be that the master of 2 double densities looks synoptic diagram;
Fig. 5 be on the general switching device of the utility model on the net point assembly 110 density of through hole 112 be that the master of 4 double densities looks synoptic diagram;
Fig. 6 be on the general switching device of the utility model on the net point assembly 110 density of through hole 112 be that the master of 8 double densities looks synoptic diagram;
Fig. 7 be on the general switching device of the utility model on the net point assembly 110 density of through hole 112 be that the master of 10 double densities looks synoptic diagram;
Fig. 8 is the synoptic diagram that the following net point assembly of general switching device of the present utility model adopts elastic insulated plate and electrically conductive particles.
[embodiment]
Below in conjunction with each accompanying drawing the utility model is described in further detail.
Referring to Fig. 1 to Fig. 3, be a specific embodiment of the utility model general switching device of being used for measurement circuit plate special tester.Special tester comprises dials 200 and the test signal conductor wire (the figure acceptance of the bid is drawn) that is provided with a plurality of test probes 210.Dials 200 is according to wiring board 400 to be tested or 400 ' making, and the dials 200 that the wiring board 400 or 400 of different model ' correspondence is different makes that the test probe 210 of dials 200 is corresponding with the test point of wiring board to be tested.Wiring board 400 to be tested or 400 ' number of test points less than the number of test points in the special tester.
A plurality of test probes 210 heads on the dials 200 withstand on each test point (figure acceptance of the bid draw) of wiring board 400 to be tested or 400 ' correspondence, and with wiring board 400 to be tested or 400 ' each test point electrically contact.Last net point assembly 110 be installed in dials 200 below, elasticity first conducting element 111 heads corresponding on a plurality of test probes 210 afterbodys on the dials 200 and the last net point assembly 110 electrically contact.
Corresponding conductiving point 141 electrically contacts one by one and is connected on elasticity second conducting element 131 of each test probe 210 on the dials 200 by correspondence on elasticity first conducting element 111 corresponding on the last net point assembly 110, front conductiving point 121 on the conversion line plate 120 and reverse side conductiving point 122 and the following net point assembly 130 and the base 140, each conductiving point 141 on the base 140 is connected with 147 of socket points by its inner circuit, is electrically connected one by one with each test signal conductor wire by socket points 147.Just each test signal conductor wire of drawing on each test point of wiring board 400 to be tested and this special tester is electrically connected one by one by such connected mode, by special tester open circuit, test such as open circuit.Perhaps, following net point also can socket points 147 conductions direct by conductor wire and on the base be connected, and has omitted the conductiving point on the base.
Referring to Fig. 1 to Fig. 3, first through hole 112 is covered with all test zones of net point assembly on this 110 on the last net point assembly 110; The density of the drum net point of the density of this first through hole 112 and composite test device is the same.
Referring to Fig. 4, the density of this first through hole 112 can be 2 times, the centre distance L1 that is every row two adjacent first through holes 112 is 2.54 millimeters, the centre distance L2 of every row two adjacent first through holes 112 also is 2.54 millimeters, but the centre distance L3 of adjacent first through hole 112 of one first through hole of every row 112 and adjacent column is 1.80 millimeters.
Referring to Fig. 5, the density of this first through hole 112 can be 4 times, the centre distance L1 that is every row two adjacent first through holes 112 is 1.27 millimeters, the centre distance L2 of every row two adjacent first through holes 112 is 1.27 millimeters, and the centre distance of adjacent first through hole 112 of one first through hole 112 of every row and adjacent column also is 1.27 millimeters.
Referring to Fig. 6, the density of this first through hole 112 can be 8 times, the centre distance L1 that is every row two adjacent first through holes 112 is 1.27 millimeters, the centre distance L2 of every row two adjacent first through holes 112 also is 1.27 millimeters, but the centre distance L3 of adjacent first through hole 112 of one first through hole of every row 112 and adjacent column is 0.90 millimeter.
Referring to Fig. 7, the density of this first through hole 112 can be 10 times, the centre distance L1 that is every row two adjacent first through holes 112 is 1.13 millimeters, the centre distance L2 of every row two adjacent first through holes 112 also is 1.13 millimeters, but the centre distance L3 of adjacent first through hole 112 of one first through hole of every row 112 and adjacent column is 0.80 millimeter.
The density of this first through hole 112 can also be higher density.
Second through hole 132 on the following net point assembly 130 and the quantity of elasticity second conducting element 131 are decided according to the number of test points of special tester.Referring to Fig. 1 and Fig. 2, promptly for the test of single face wiring board 400, special tester only need be installed dials 200 and general switching device 100 each, the number of test points equivalent amount of second through hole 132 on the following net point assembly 130 and elasticity second conducting element 131 and special tester.Number of test points as special tester is 10240 points, then descends second through hole 132 and elasticity second conducting element 131 on the net point assembly 130 respectively to have 10240.
Referring to Fig. 3, be a specific embodiment of general tool of the present utility model, be used for two-sided or more than two-sided wiring board 400 ' test.This general tool comprise be positioned at double-sided wiring board 400 ' the last tool of both sides and following tool.Tool be should go up and dials recited above and general switching device included with following tool; Promptly need to install dials 200 and general switching device 100 each two, each is tested simultaneously with a dials 200 and general switching device 100 at the pro and con of this wiring board.
Second conducting element, 132 quantity on the following net point assembly 130 of the general switching device 100 of following tool are more than or equal to the number of test points of special tester, and the number of openings on the following net point assembly 130 of the general switching device 100 of last tool is more than or equal to half of the number of test points of special tester.Because the wiring board test generally is placed on the more one side of counting to be tested following tool test, the few one side of pilot to be measured is placed on top tool test, the off line lattice point number that tool up and down so is set just can newspaper so long as the to be measured of test plate (panel) to be measured counted less than the number of test points of whole test machine, just can on the test machine of the adaptive above-mentioned general switching device that descends net point, use.
Simultaneously, for making things convenient for the making of conversion line plate, make down net point have more standby point can select to be connected by the wiring of nearby principle with last net point, off line lattice point number can be become the increase of multiple, promptly for the test of single face wiring board, special tester only need be installed dials 200 and general switching device 100 each, second through hole, 132 quantity on the following net point assembly 130 be special tester number of test points N doubly, N＞1, every N point is made as one group, there be many places N to put short circuit together with the conductiving point 141 on the base 140 of elasticity second conducting element 131 equivalent amounts in following net point assembly 130 second through holes 132, N the back together test signal conductor wire by given rule and special tester of conductiving point 141 short circuits is electrically connected on the base 140, when making conversion line plate 120, each reverse side conductiving point 122 of its reverse side only with following net point assembly 130 on set one a group N some position correspondence in putting; Number of test points as special tester is 10240 points, N=3, then descend second through hole 132 and elasticity second conducting element 131 on the net point assembly 130 respectively to have 30720, meanwhile, 30720 conductiving points 141 are arranged on the base 140, have 10240 groups of points, 10240 places, 3 somes short circuit is arranged together, 10240 places, 3 somes short circuit on this base 140 is electrically connected with 10240 test signal conductor wires of special tester respectively together.The quantity of descending net point assembly 130 like this is N times of special tester number of test points, just more selection can be arranged in the position of the conductiving point of conversion line plate 120 reverse side of making some special wiring boards to be tested like this, the difficulty that conversion line plate 120 is made can be little a lot.
Understandable, the quantity of second conducting element on two following net point assemblies of last tool and following tool can also be distributed as required, for example: upward second conducting element, the 131 quantity sums on two following net point assemblies 130 of tool and following tool equal the number of test points of special tester, and second conducting element, 131 quantity of last tool and following tool are pressed given proportional distribution, as distributing according to various ratios such as 7: 3 or 8: 2 or 6: 4.
Referring to Fig. 1 and Fig. 3, the down positive and negative two sides of net point assembly 130 is slightly stretched out at each elasticity second conducting element 131 two on the following net point assembly 130, makes down that corresponding conductiving point 141 has good electrical contact on corresponding with conversion line plate 120 respectively reverse side conductiving point 122 of each elasticity second conducting element 131 on the net point assembly 130 and the base 140.
Referring to Fig. 1 and Fig. 3, each elasticity first conducting element 111 afterbody on the last net point assembly 110 slightly stretch out the reverse side of net point assembly 110, make corresponding with the conversion line plate 120 respectively front conductiving point 121 of each elasticity first conducting element 111 on the net point assembly 110 that good electrical contact be arranged.
Referring to Fig. 2, be respectively equipped with corresponding pilot hole 205,115,125,135,145 on dials 200, last net point assembly 110, conversion line plate 120, following net point assembly 130 and the base 140, conveniently they are installed together.
Referring to Fig. 2, base 140 stretches out, and the socket points 147 that is electrically connected with each test signal conductor wire is fixed on this base 140 outward extending positions 146.
Used elasticity first conducting element 111 of the utility model can be used the applicant and apply on Dec 16th, 2004, in Chinese utility model patent " wiring board test switching spring " the technology manufacturing of 02 month 22 days Granted publications in 2006, its patent No. is ZL200420103000.6.Elasticity second conducting element 131 can be the inner tailored version probe that spring is housed of spring or band.
Upward net point assembly of the present utility model and/or following grid assembly can also adopt another embodiment.As shown in Figure 8, last net point assembly and following net point assembly are elastic insulated plate, and the position that first conducting element 111 and second conducting element 131 are set at needs is mixed with electrically conductive particles, by electrically conductive particles and elastic insulated harden to close form first conducting element 111 and second conducting element 131.Can possess conduction and flexible speciality in the elastic insulated plate behind the admixture conductive fine powder.Such mode can reduce the height of net point assembly down, also plays the effect of the height that reduces whole switching device simultaneously.
In general, the number of test points of general switching device that is used for measurement circuit plate special tester about 10,000 or still less, even and also can surpass 10,000 quantity on the very little area of the net point of the general-purpose elastic parts base of universal testing machine from far away, generally be a ten of thousands net point.How several ten thousand net points on drum or the general-purpose elastic parts base and the number of test points in the special tester are mapped one by one is exactly that an industry is badly in need of the problem that will solve.Because wiring board 400 to be tested or 400 ' number of test points be bound to less than the number of test points in the special tester, the utility model is with wiring board 400 to be tested or 400 ' by dials 200, last net point assembly 110, conversion line plate 120, following net point assembly 130 and base 140 just can realize with wiring board 400 to be tested or 400 ' number of test points take out and the number of test points of special tester is realized electrical connection one to one, and only need change corresponding dials 200 and conversion line plate 120 at the wiring board of different model, just can test the wiring board of different model at special tester.Because conversion line plate 120 circuits are simple, it is made and takes a short time, and price is also lower, so the user is again with can not be for having cannot afford universal testing machine and to make the drum spended time of prior art special tester long worried.
Above embodiment has only expressed preferred implementation of the present utility model, and it describes comparatively concrete and detailed, but can not therefore be interpreted as the restriction to the utility model claim; Should be pointed out that for the person of ordinary skill of the art under the prerequisite that does not break away from the utility model design, can also make some distortion and improvement, these all belong to protection domain of the present utility model; Therefore, all equivalents and modifications of being done with the utility model claim scope all should belong to the covering scope of the utility model claim.
Claims (10)
1. general switching device that is used for measurement circuit plate special tester, be provided with the dials (200) and the test signal conductor wire of a plurality of test probes (210) on described special tester, described test probe (210) is corresponding with the test point of circuit board to be tested; It is characterized in that:
Described general switching device (100) comprises the last net point assembly (110), the following net point assembly (130) that is provided with a plurality of second conducting elements (131) that are provided with a plurality of first conducting elements (111), is positioned at the described base (140) of going up the conversion line plate (120) between net point assembly (110) and the following net point assembly (130) and being located at described time net point assembly (130) downside;
The positive and negative two sides of described conversion line plate (120) respectively is provided with a plurality of fronts conductiving points (121) and reverse side conductiving point (122), the position of described front conductiving point (121) with described go up have in the net point assembly (110) and the position of the point of first conducting element (111) that test probe (210) touches corresponding one by one, described front conductiving point (121) is in conversion line plate (120) inside and the corresponding one by one electrical connection of reverse side conductiving point (122); Have a socket points (147) that can be connected on the described base (140) with the test signal conductor wire; Described second conducting element (131) conducts electricity with the socket points on the described base (140) and is connected;
Described upward net point assembly (110) is installed in the back side of described dials (200); Each test probe (210) on the described dials (200) by described go up net point assembly (110) go up corresponding first conducting element (111), front conductiving point (121) on the conversion line plate (120) and reverse side conductiving point (122) and following net point assembly (130) upward second conducting element (131) of correspondence electrically contact one by one with the test signal line with socket points (147) on the base (140) and be connected.
2. the general switching device that is used for measurement circuit plate special tester according to claim 1 is characterized in that:
Described first conducting element (111) and second conducting element (131) are band spring conductive devices; Offer and insert first through hole (112) and second through hole (132) of described band spring conductive devices on described on net point assembly (110) and the following grid assembly (130) respectively; Perhaps
Described upward net point assembly and/or following grid assembly are elastic insulated plate, and the position at described first conducting element (111) and second conducting element (131) is mixed with electrically conductive particles, by described electrically conductive particles and elastic insulated harden to close form described first conducting element (111) and second conducting element (131).
3. the general switching device that is used for measurement circuit plate special tester according to claim 2 is characterized in that: described first conducting element of going up on the net point assembly (110) (111) is covered with in the described all test zones of net point assembly (110) of going up;
Described first conducting element (111) net point assembly (110) on described is gone up spacing and is embarked on journey, becomes column distribution equably; The described distribution density that goes up first conducting element (111) on the net point assembly (110) is 2 times, 4 times, 8 times or 10 double densities.
4. the general switching device that is used for measurement circuit plate special tester according to claim 1, it is characterized in that: the one side of described second conducting element (131) is stretched out the described front of net point assembly (130) down, forms good electrical contact with described reverse side conductiving point (122); And/or described first conducting element (111) afterbody of going up on the net point assembly (110) stretches out the described reverse side of going up net point assembly (110), and the front conductiving point (121) corresponding with described conversion line plate (120) has good electrical contact.
5. the general switching device that is used for measurement circuit plate special tester according to claim 1 is characterized in that: be respectively equipped with corresponding registration holes (205,115,125,135,145) on described dials (200), last net point assembly (110), conversion line plate (120), following net point assembly (130) and the base (140).
6. the general switching device that is used for measurement circuit plate special tester according to claim 1 is characterized in that: described each socket points (147) is conducted electricity by the inner conducting wire of described base (140) or external conductor wire and described second conducting element (131) and is connected or conducts electricity contact; Described base (140) stretches out, and described socket points (147) is fixed on the outward extending position of this base (140) (146).
7. general tool that is used for measurement circuit plate special tester is characterized in that: described general tool comprises last tool and the following tool that lays respectively at described wiring board both sides; The described tool of going up includes described dials of aforesaid right requirement and general switching device with following tool.
8. the general tool that is used for measurement circuit plate special tester according to claim 7 is characterized in that:
Second conducting element (132) quantity on the following net point assembly (130) of the general switching device (100) of described down tool is more than or equal to the number of test points of described special tester, and second conducting element (131) quantity on the following net point assembly (130) of the described general switching device (100) of going up tool is more than or equal to half of the number of test points of special tester.
9. the general tool that is used for measurement circuit plate special tester according to claim 8, it is characterized in that: the quantity of second conducting element (131) on the following net point assembly (130) of described down tool equal described special tester number of test points N doubly, the integer of N＞1; Correspondingly, the N of described down net point assembly (130) described second conducting element (131) is one group, and each group is connected with a socket points (147) on the base (140);
The quantity of second conducting element (131) on the described following net point assembly (130) of going up tool equal described special tester number of test points half N doubly, the integer of N＞1.
10. the general tool that is used for measurement circuit plate special tester according to claim 7, it is characterized in that: second conducting element (131) the quantity sum on two following net point assemblies (130) of described upward tool and following tool equals the number of test points of described special tester, and described second conducting element (131) quantity of tool and following tool that goes up is by given proportional distribution.
Priority Applications (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNU2008201794982U CN201319056Y (en) | 2008-09-23 | 2008-12-01 | Universal switching device and universal fixture used for special testing machine for testing circuit board |
| CN200980000060.0A CN101680912B (en) | 2008-09-23 | 2009-01-13 | Universal switching device of special testing machine for testing circuit board and universal fixture |
| PCT/CN2009/070129 WO2010034185A1 (en) | 2008-09-23 | 2009-01-13 | A general transferring device for testing a special testing apparatus of a circuitry board and a general jig thereof |
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN200820212074 | 2008-09-23 | ||
| CN200820212074.1 | 2008-09-23 | ||
| CNU2008201794982U CN201319056Y (en) | 2008-09-23 | 2008-12-01 | Universal switching device and universal fixture used for special testing machine for testing circuit board |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN201319056Y true CN201319056Y (en) | 2009-09-30 |
Family
ID=41197820
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CNU2008201794982U Expired - Fee Related CN201319056Y (en) | 2008-09-23 | 2008-12-01 | Universal switching device and universal fixture used for special testing machine for testing circuit board |
Country Status (2)
| Country | Link |
|---|---|
| CN (1) | CN201319056Y (en) |
| WO (1) | WO2010034185A1 (en) |
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| CN102419383A (en) * | 2011-12-29 | 2012-04-18 | 珠海拓优电子有限公司 | Low-resistivity spring-free jig and manufacturing method thereof |
| CN103091516A (en) * | 2011-11-07 | 2013-05-08 | 日本电产理德株式会社 | Jig for substrate inspection, base units of jig and substrate inspection apparatus |
| CN107229012A (en) * | 2017-06-13 | 2017-10-03 | 日月光封装测试(上海)有限公司 | Measurement jig and its arrangement method for testing pin hole |
| CN110058148A (en) * | 2019-05-29 | 2019-07-26 | 深圳市凯码时代科技有限公司 | Switching circuit board, switching fixture framework and corresponding circuit switch method |
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| JPH0843471A (en) * | 1994-07-27 | 1996-02-16 | Corp Of Herumesu:Kk | Method and apparatus for inspection of printed-circuit board |
| JPH09127176A (en) * | 1995-10-27 | 1997-05-16 | Nec Corp | Printed board inspection jig |
| CN2636252Y (en) * | 2003-06-20 | 2004-08-25 | 深圳市凯码软件技术有限公司 | Needle disk connection adapter for circuit board tester |
| JP2005098799A (en) * | 2003-09-24 | 2005-04-14 | Fuji Electric Holdings Co Ltd | Inspection device of printed circuit board |
| CN2677944Y (en) * | 2003-12-03 | 2005-02-09 | 陈嘉隆 | Device for detecting circuit board |
| CN100394190C (en) * | 2003-12-03 | 2008-06-11 | 联能科技（深圳）有限公司 | Testing device for density variable printed circuit board |
| CN2831127Y (en) * | 2005-03-15 | 2006-10-25 | 深圳麦逊电子有限公司 | Converting board correcting aid of PCB board testing machine |
| CN201004081Y (en) * | 2007-01-18 | 2008-01-09 | 王云阶 | Electron and circuit plate detection device |
-
2008
- 2008-12-01 CN CNU2008201794982U patent/CN201319056Y/en not_active Expired - Fee Related
-
2009
- 2009-01-13 WO PCT/CN2009/070129 patent/WO2010034185A1/en active Application Filing
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103091516A (en) * | 2011-11-07 | 2013-05-08 | 日本电产理德株式会社 | Jig for substrate inspection, base units of jig and substrate inspection apparatus |
| CN102419383A (en) * | 2011-12-29 | 2012-04-18 | 珠海拓优电子有限公司 | Low-resistivity spring-free jig and manufacturing method thereof |
| CN107229012A (en) * | 2017-06-13 | 2017-10-03 | 日月光封装测试(上海)有限公司 | Measurement jig and its arrangement method for testing pin hole |
| CN110058148A (en) * | 2019-05-29 | 2019-07-26 | 深圳市凯码时代科技有限公司 | Switching circuit board, switching fixture framework and corresponding circuit switch method |
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|---|---|
| WO2010034185A1 (en) | 2010-04-01 |
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| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| C17 | Cessation of patent right | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20090930 Termination date: 20111201 |