CN100394190C - Testing device for density variable printed circuit board - Google Patents
Testing device for density variable printed circuit board Download PDFInfo
- Publication number
- CN100394190C CN100394190C CNB200310112493XA CN200310112493A CN100394190C CN 100394190 C CN100394190 C CN 100394190C CN B200310112493X A CNB200310112493X A CN B200310112493XA CN 200310112493 A CN200310112493 A CN 200310112493A CN 100394190 C CN100394190 C CN 100394190C
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- China
- Prior art keywords
- density
- dials
- printed circuit
- circuit board
- sleeve pipe
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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Abstract
The present invention relates to a device for testing printed circuit boards with variable density, which is characterized in that the device comprises a base plate (1); a plurality of jacket tube holes (13) are formed on the base plate (1); jacket tubes (14) are arranged in the jacket tube holes (13); conversion terminals (15) are arranged in the jacket tube (14); the upper part of the base plate (1) is provided with a dial plate (3) which is provided with a plurality of jacket tube holes (8); the density of the jacket tube holes on the dial plate (3) is higher than the density of the jacket tube holes (13) on the base plate (1); jacket tubes (9) are arranged in the jacket tube holes (8); probes (10) are arranged in the jacket tubes (9). The dial plate (3) and the base plate (1) are connected by a connecting frame work (2). The lower ends of the probe jacket tubes (9) are selectively connected with the upper ends of the conversion terminal jacket tubes (14) by conducting wires (11) according to test requirements. The present invention realizes the increase of test density under the condition that test mechanisms are not changed.
Description
Technical field:
The present invention relates to a kind ofly cooperate the device that printed circuit board (PCB) is tested, particularly relate to a kind of proving installation that increases probe density with the printed circuit board test machine.
Background technology:
The proving installation that uses is that cannula array is housed on needle plate at present, and this cannula array is corresponding with the cannula array position of the machine of survey and density is identical.During test, earlier needle plate is placed on the cannula array of test machine, insert the upper port of test machine sleeve pipe, be connected with the test circuit of test machine with realization to pressing down the lower end that makes the needle plate sleeve pipe; Then printed circuit board (PCB) is placed the upper end of needle plate, the test point of printed circuit board (PCB) is contacted with probe on the needle plate, cooperate test machine that printed circuit board (PCB) is tested.Obviously, the probe array density of this device is consistent with the cannula array density of test machine, and is subjected to the restriction of test machine cannula array density, and its density is immutable, particularly can not increase.Along with printed circuit board (PCB) is arranged the increasing of plate density, this device is difficult to maybe can not test the printed circuit board (PCB) of high density row plate.
The content of invention:
The objective of the invention is to provide a kind of cooperation test machine that printed circuit board (PCB) is tested, and the variable proving installation that can increase density of its probe density.
For finishing the technical scheme that the present invention of foregoing invention purpose takes be: this apparatus features has been a chassis 1, have several collar aperture 13 on the chassis 1, sleeve pipe 14 is housed in the collar aperture 13, the conversion terminal 15 of in sleeve pipe 14, packing into, one dials 3 is arranged at 1 top on the chassis, has several collar aperture 8 on the dials 3, and its density is higher than the density of collar aperture 13 on the chassis 1, sleeve pipe 9 is housed in the collar aperture 8, probe 10 is housed in the sleeve pipe 9; By a connecting frame 2 the two is connected between dials 3 and the chassis 1, the lower end of probe sleeve pipe 9 need be carried out selectivity by lead 11 according to test with the upper end of conversion terminal sleeve pipe 14 and is connected.
Of the present invention another is characterized in that described conversion terminal 15 is a slender cylinder, has a groove 17 in its underpart, and a fin 16 arranged tapping on the outer rim of bottom.
Another characteristics of the present invention are also to be provided with a fender 7 in the upper end of described dials 3; have on the fender 7 with dials 3 on the position of probe 10 corresponding and identical with its density; and make the pin hole that probe 10 can be by wherein; fender 7 is via the night bolt 6 of its lower end, the spring eye 4 of dials 3 upper end correspondence positions, the spring 5 in the spring eye 4, and night bolt 6 inserts spring eye 4 and is connected with dials 3.
Another characteristics of the present invention are to drive plural pilot hole 12 on described chassis 1.
Advantage of the present invention and effect are: the present invention has realized having increased test density under the situation that does not change the test machine structure owing to taked the conversion terminal structure, and is above even the density of dials probe doubles.
Description of drawings:
Fig. 1 structural representation of the present invention
Fig. 2 is this bright conversion terminal structural representation
Embodiment:
As Fig. 1, this device fit printed circuit board survey machine uses, and this device is positioned on the test machine, the locating shaft of pilot hole 12 aligning test machines and to pressing down, then pilot hole 12 is placed on the locating shaft of test machine, and pilot hole has at least more than two, so just accurately locatees for this device.Simultaneously, just insert in the sleeve pipe on the test machine lower end of conversion terminal 15.The upper end solderless wrapped connection lead 11 of conversion terminal sleeve pipe 14, the other end of lead 11 is wire-wrapped in the lower end of probe sleeve pipe 9, and the connection of lead 11 is carried out selectivity according to the test needs and is connected.During test, printed-wiring board (PWB) is placed the upper end of fender 7, probe 10 is contacted with the test point of printed circuit board (PCB), thereby the electric property of printed circuit board (PCB) is tested.The density of sleeve pipe 8 on the dials 3 is because the not restriction of tested person mantle pipe density, can make the density (single density) identical with test machine density, also can make density higher 2 times than test machine density, 4 times or 6 times, realize and being connected of test machine by conversion terminal 15.So just, realized under the situation that does not change existing test machine structure, improving the density of dials, thereby solved the test of the printed circuit board (PCB) that high density is set type.The effect of fender 7 is to make probe 10 be difficult for being damaged.
As Fig. 2, the groove 17 of conversion terminal 15 lower ends makes lower end (insertion end) high resilience of conversion terminal 15, and the fin 16 on its outer rim can make it contact better with the sleeve pipe of test machine.
Claims (4)
1. variable density printed circuit board test fixture, it is characterized in that having a chassis (1), have several collar aperture (13) on the chassis (1), sleeve pipe (14) is housed in the collar aperture (13), the conversion terminal (15) of in sleeve pipe (14), packing into, one dials (3) is arranged at the top of (1) on the chassis, have several collar aperture (8) on the dials (3), its density is higher than the density that collar aperture (13) is gone up on chassis (1), and sleeve pipe (9) is housed in the collar aperture (8), and probe (10) is housed in the sleeve pipe (9); By a connecting frame (2) the two is connected between dials (3) and chassis (1), the lower end of probe sleeve pipe (9) need be carried out selectivity by lead (11) according to test with the upper end of conversion terminal sleeve pipe (14) and is connected.
2. a kind of variable density printed circuit board test fixture as claimed in claim 1 is characterized in that described conversion terminal (15) is a slender cylinder, has a groove (17) in its underpart, and a fin (16) is arranged tapping on the outer rim of bottom.
3. a kind of variable density printed circuit board test fixture as claimed in claim 1; it is characterized in that also being provided with a fender (7) in the upper end of described dials (3); have corresponding and identical on the fender (7) with its density with the position of the last probe (10) of dials (3); and make the pin hole that probe (10) can be by wherein; fender (7) is via the night bolt (6) of its lower end, the spring eye (4) of dials (3) upper end correspondence position, the spring (5) in the spring eye (4), and night bolt (6) inserts spring eye (4) and is connected with dials (3).
4. as claim 1 or 2 or 3 described a kind of variable density printed circuit board test fixtures, it is characterized in that on described chassis (1), opening the pilot hole (12) more than 2.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNB200310112493XA CN100394190C (en) | 2003-12-03 | 2003-12-03 | Testing device for density variable printed circuit board |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNB200310112493XA CN100394190C (en) | 2003-12-03 | 2003-12-03 | Testing device for density variable printed circuit board |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN1595184A CN1595184A (en) | 2005-03-16 |
| CN100394190C true CN100394190C (en) | 2008-06-11 |
Family
ID=34661385
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CNB200310112493XA Expired - Fee Related CN100394190C (en) | 2003-12-03 | 2003-12-03 | Testing device for density variable printed circuit board |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN100394190C (en) |
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101576571B (en) * | 2008-05-06 | 2013-04-10 | 深圳麦逊电子有限公司 | Density conversion method and density conversion device for PCB test machine |
| CN201319056Y (en) * | 2008-09-23 | 2009-09-30 | 陈涛 | Universal switching device and universal fixture used for special testing machine for testing circuit board |
| CN101680912B (en) * | 2008-09-23 | 2012-12-12 | 陈涛 | Universal switching device of special testing machine for testing circuit board and universal fixture |
| CN102435876B (en) * | 2011-09-14 | 2014-05-28 | 株洲南车时代电气股份有限公司 | Test device for connecting terminal |
| CN104111358A (en) * | 2014-07-11 | 2014-10-22 | 浙江开化建科电子科技有限公司 | Dedicated PCB test frame |
| DE102015113046A1 (en) * | 2015-08-07 | 2017-02-09 | Xcerra Corp. | Positioning device for a parallel tester for testing printed circuit boards and parallel testers for PCB testing |
| CN108761150B (en) * | 2018-04-23 | 2021-07-16 | 李树龙 | Needle-type insulating meter pen device and operation method |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN2261089Y (en) * | 1996-02-05 | 1997-08-27 | 鸿海精密工业股份有限公司 | Insertion-card combination device |
| CN2342372Y (en) * | 1998-07-27 | 1999-10-06 | 黄介崇 | New structure for probe casing |
| CN1384921A (en) * | 1999-10-26 | 2002-12-11 | Atg测试体系两合公司 | Test probe for device for testing printed circuit boards |
-
2003
- 2003-12-03 CN CNB200310112493XA patent/CN100394190C/en not_active Expired - Fee Related
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN2261089Y (en) * | 1996-02-05 | 1997-08-27 | 鸿海精密工业股份有限公司 | Insertion-card combination device |
| CN2342372Y (en) * | 1998-07-27 | 1999-10-06 | 黄介崇 | New structure for probe casing |
| CN1384921A (en) * | 1999-10-26 | 2002-12-11 | Atg测试体系两合公司 | Test probe for device for testing printed circuit boards |
Also Published As
| Publication number | Publication date |
|---|---|
| CN1595184A (en) | 2005-03-16 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20080611 Termination date: 20181203 |