CN209842009U - Power panel testing device - Google Patents
Power panel testing device Download PDFInfo
- Publication number
- CN209842009U CN209842009U CN201920152790.3U CN201920152790U CN209842009U CN 209842009 U CN209842009 U CN 209842009U CN 201920152790 U CN201920152790 U CN 201920152790U CN 209842009 U CN209842009 U CN 209842009U
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- test
- testing
- electrically connected
- power strip
- connecting plate
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Abstract
The utility model discloses a power strip testing arrangement, including unable adjustment base, test component and test display module, test component sets up on the installing zone, test component is including the fixed tool of test, the driving piece, test connecting plate and a plurality of test thimble, the fixed tool of test sets up on unable adjustment base, the driving piece sets up on unable adjustment base, the test connecting plate sets up on the driving piece, and the test connecting plate is located the top of the fixed tool of test, the driving piece is used for promoting the test connecting plate and is close to or keeps away from the fixed tool of test, each test thimble sets up respectively on the fixed tool of test. The utility model can avoid damage or semi-damage of the built-in MOS tube of the backlight chip caused by the tool EOS by testing the thimble and the grounding clip; by adopting the FFC wire to replace the traditional connecting wire, the influence of parasitic inductance and interference on backlight current test can be reduced, and the test accuracy and the test efficiency are improved.
Description
Technical Field
The utility model relates to a power test field especially relates to a power strip testing arrangement.
Background
The liquid crystal television adopting the Local Dimming technology has higher contrast and more vivid picture, belongs to a high-end machine and is deeply loved by consumers. However, the technology puts higher requirements on the production process, tool design and performance test of the driving power panel.
If the traditional power supply product tooling design is adopted to realize the performance test of the Local Dimming product, the problem of failure of the backlight driving chip is often faced due to poor contact or parasitic inductance. If the chip is half-punctured and cannot be detected 100% in the manufacturing process, the defective rate will increase, and the customer complaint rate will increase. In the testing process, the MOS tube arranged in the backlight chip can be damaged under the following conditions:
1. when the wiring of the tool is disordered or long, mutual interference and parasitic inductance exist, so that the chip fails;
2. if the contact between the PCB test point and the tool thimble is poor in the test process, the chip can be damaged by the generated Electrical Overstress (EOS) when live-line operation is carried out, the top plate is repeatedly pressed down or the contact is poor;
3. when the PCB rises after the test is finished, other signal thimbles are not completely separated from the PCB test point, but the PCB GND and the tooling GND are separated, and the ground wire does not form a loop, so that the EOS cannot be discharged from the ground wire, and the EOS returns to the backlight chip.
SUMMERY OF THE UTILITY MODEL
The utility model aims at overcoming the weak point among the prior art, provide a power strip testing arrangement.
The purpose of the utility model is realized through the following technical scheme:
a power strip test apparatus, comprising:
the fixing base is provided with an installation area;
the testing component is arranged on the mounting area and comprises a testing fixed jig, a driving piece, a testing connecting plate and a plurality of testing ejector pins, the testing fixed jig is arranged on a fixed base, the driving piece is arranged on the fixed base, the testing connecting plate is arranged on the driving piece and is positioned above the testing fixed jig, the driving piece is used for pushing the testing connecting plate to be close to or far away from the testing fixed jig, and each testing ejector pin is respectively arranged on the testing fixed jig;
the test display assembly comprises a support frame and a display, the support frame is arranged on the fixed base, the display is arranged on the support frame, and the display is respectively electrically connected with the test connecting plate and the test thimble.
In one embodiment, the test fixture is provided with a fixing groove, and the fixing groove is used for fixing the power panel.
In one embodiment, the bottom of the fixing groove is provided with a plurality of through holes, the testing thimbles correspondingly penetrate through the through holes one by one, and the testing thimbles protrude out of the bottom of the fixing groove.
In one embodiment, the test assembly further comprises a grounding clip electrically connected to the test connection plate.
In one embodiment, a test circuit is disposed on the test connection board, the test circuit includes a sampling resistor, a test LED lamp, and a diode group, a first end of the sampling resistor is electrically connected to a first end of the test LED lamp, a second end of the sampling resistor is electrically connected to one end of the diode group, and a second end of the test LED lamp is electrically connected to the other end of the diode group.
In one embodiment, the diode group comprises a plurality of diode cells connected in parallel.
In one embodiment, the test connection board is electrically connected with the test LED lamp through an FFC wire.
In one embodiment, the driving member comprises a driver, a pushing rod and a pushing block, the driver is arranged on the supporting frame, one end of the pushing rod is electrically connected with the driver, the other end of the pushing rod is electrically connected with the pushing block, and the test connecting plate is arranged on the pushing block.
In one embodiment, the driving members are provided in two, with a space provided between the two driving members.
In one embodiment, the test display assembly further comprises a scanner electrically connected to the display.
The utility model discloses compare in prior art's advantage and beneficial effect as follows:
the utility model relates to a power panel testing device, which can avoid damage or semi-damage of a built-in MOS tube of a backlight chip caused by a tool EOS through a testing thimble and a grounding clip; by adopting the FFC wire to replace the traditional connecting wire, the influence of parasitic inductance and interference on backlight current test can be reduced, and the test accuracy and the test efficiency are improved; meanwhile, the power supply backlight integrated test is realized, the production efficiency is improved, the misjudgment rate is reduced, the poor detection capability is improved, and the illegal operation of staff is prevented; test data may also be saved for traceability.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings that are required to be used in the embodiments will be briefly described below, it should be understood that the following drawings only illustrate some embodiments of the present invention, and therefore should not be considered as limiting the scope, and for those skilled in the art, other related drawings can be obtained according to the drawings without inventive efforts.
Fig. 1 is a schematic structural diagram of a power board testing device according to an embodiment of the present invention;
fig. 2 is a circuit diagram of a test circuit on the test connection board shown in fig. 1.
Detailed Description
In order to facilitate understanding of the present invention, the present invention will be described more fully hereinafter with reference to the accompanying drawings. The preferred embodiments of the present invention are shown in the drawings. The invention may, however, be embodied in many different forms and should not be construed as limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete.
It will be understood that when an element is referred to as being "secured to" another element, it can be directly on the other element or intervening elements may also be present. When an element is referred to as being "connected" to another element, it can be directly connected to the other element or intervening elements may also be present. The terms "vertical," "horizontal," "left," "right," and the like as used herein are for illustrative purposes only and do not represent the only embodiments.
Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention belongs. The terminology used herein in the description of the invention is for the purpose of describing particular embodiments only and is not intended to be limiting of the invention. As used herein, the term "and/or" includes any and all combinations of one or more of the associated listed items.
It can be understood that, through examination, the existing tool mainly has the following five problems: 1. the LED backlight wiring is too long, and parasitic inductance exists; 2. the tool adopts manual test, and EOS pulse voltage can be generated when poor contact exists; 3. short circuit and voltage interference are easily caused by dense backlight thimbles and disordered wiring; 4. parasitic leakage inductance voltage peak can be generated when the FFC wire is pulled out in an electrified way; 5. EOS is easily generated by the hot-line tool.
Therefore, in order to avoid the above problems, in one embodiment, referring to fig. 1, a power board testing apparatus includes: the test device comprises a fixing base 100, a test component 200 and a test display component 300, wherein the fixing base 100 is used for fixing the whole device, the test component 200 is used for realizing the test, and the test display component 300 is used for realizing the scanning and displaying the test result.
Referring to fig. 1, the fixing base 100 is provided with an installation area.
Referring to fig. 1, the testing assembly 200 is disposed on the mounting area, the testing assembly 200 includes a testing fixing jig 210, a driving member 220, a testing connection plate 230 and a plurality of testing ejector pins 240, the testing fixing jig 210 is disposed on a fixing base 100, the driving member 220 is disposed on the fixing base 100, the testing connection plate 230 is disposed on the driving member 220, the testing connection plate 230 is located above the testing fixing jig 210, the driving member 220 is used for pushing the testing connection plate 230 to approach or leave the testing fixing jig 210, and the testing ejector pins 240 are disposed on the testing fixing jig 210 respectively. It should be noted that the test fixing jig 210 is used for fixing a power panel to be tested, the driving member 220 is used for pushing the test connecting plate 230 to press on the power panel, so as to realize the test of the power panel, and the test connecting plate 230 is used for electrically connecting the power panel to be tested, so as to test the performance and data of the power panel; the test thimble 240 is used for realizing a ground connection with the PCB of the power board.
Referring to fig. 1, the test display assembly 300 includes a supporting frame 310 and a display 320, the supporting frame 310 is disposed on the fixing base 100, the display 320 is disposed on the supporting frame 310, and the display 320 is electrically connected to the test connection board 230 and each of the test pins 240 respectively. The supporting frame 310 is used for fixing a display, and the driving member 220 is disposed on the supporting frame; the display 320 is also provided with a memory for displaying the test result and storing the test data for tracing.
Therefore, damage or semi-damage of the built-in MOS tube of the backlight chip caused by the tooling EOS can be avoided by testing the thimble and the grounding clamp; by adopting the FFC wire to replace the traditional connecting wire, the influence of parasitic inductance and interference on backlight current test can be reduced, and the test accuracy and the test efficiency are improved; meanwhile, the power supply backlight integrated test is realized, the production efficiency is improved, the misjudgment rate is reduced, the poor detection capability is improved, and the illegal operation of staff is prevented; test data may also be saved for traceability.
Referring to fig. 1, the test fixture 210 is provided with a fixing groove for fixing the power board. Furthermore, a plurality of through holes are formed in the bottom of the fixing groove, the testing thimbles penetrate through the through holes in a one-to-one correspondence mode, and the testing thimbles protrude out of the bottom of the fixing groove.
It should be noted that the testing thimble is higher than the bottom of the fixing groove, and the testing thimble is higher than other signal thimbles by 2mm, so that after the test is finished and the PCB board rises, other signal thimbles are separated from the PCB test point, but the tooling GND and the PCB GND still keep a connection state to form a loop, thereby basically realizing that the EOS can be discharged from the tooling GND.
It should be noted that, referring to fig. 1, the test assembly 200 further includes a grounding clip 250 electrically connected to the test connection board. The grounding clamps are arranged in two numbers, and the two grounding clamps are electrically connected with the test connecting plate respectively. The grounding clip is a ground wire with an alligator clip, one end of the grounding clip is connected with an LED-TVS tube ground, and the other end of the grounding clip is clipped on a radiating fin (GND) on the PCB. Therefore, the testing thimble is prevented from being communicated with the GND of the tool GND and the GND of the PCB when being in poor contact, and when the PCB leaves the tool, the LED-TVS tube is ensured to be in a working state, so that EOS can be further ensured to be normally released.
Please refer to fig. 2, a test circuit is disposed on the test connection board, and the test circuit includes a sampling resistor, a test LED lamp, and a diode group, wherein a first end of the sampling resistor is electrically connected to a first end of the test LED lamp, a second end of the sampling resistor is electrically connected to one end of the diode group, and a second end of the test LED lamp is electrically connected to the other end of the diode group. In this embodiment, the diode group includes a plurality of diode cells connected in parallel.
Therefore, each channel of the LED lamp panel is connected with a 10 omega/1W noninductive precise (+ -1%) sampling resistor in series, the backlight detection mode is changed from current to voltage, the LED loop wiring is shortened, and therefore the inductance is reduced. Meanwhile, 1 100V rectifier diode is connected in parallel between each channel of LED-and LED +, the type of the rectifier diode is SB5100, and as many channels as there are channels, as many diodes are connected in parallel to absorb EOS. When the voltage at LEDn-is higher than that of LED +, a discharge loop can be formed, thus fundamentally avoiding the generation of parasitic leakage inductance voltage spike.
It should be noted that the test connection board is electrically connected to the test LED lamp through an FFC wire. Therefore, the length of the LED connecting wire can be reduced by arranging the FFC wire, the LED connecting wire adopts the FFC wire, the wire is arranged in parallel, the wire is as short as possible, and the parasitic inductance is reduced.
It should be noted that the driving member 220 includes a driver 221, a pushing rod 222 and a pushing block 223, the driver is disposed on the supporting frame, one end of the pushing rod is electrically connected to the driver, the other end of the pushing rod is electrically connected to the pushing block, and the test connection board is disposed on the pushing block. In this embodiment, the driving members are provided in two, and a space is provided between the two driving members. It should be further noted that the test display assembly further includes a scanner, and the scanner is electrically connected to the display.
Therefore, automatic test is carried out by adopting ATE equipment, and the traditional test mode of manual identification is changed into computer identification, so that the bad judgment capability is improved. The voltage test precision of the data acquisition instrument is more than 3 bits (mV level), the test period is more than or equal to 100mS, and the sampling type is a voltage average value. And ensuring that the voltage value of each LED channel meets the specification range. By adopting the air pressure and scanning mode, the damage of an EOS (Ethernet over optical System) to a backlight driving component caused by knocking a tool during live-line operation, back-and-forth pressing of a gland or poor contact can be prevented when manual operation is performed by staff.
And hot melt adhesive is dripped between the dense thimbles at the bottom of the tool to protect the thimble, so as to prevent short circuit. The creepage distance between any LEDn and other LEDm is kept to be more than 0.5mm, and the creepage distance between the LED + and the LEDn is kept to be more than 1mm, so that voltage interference caused by too close distance is prevented.
The utility model discloses compare in prior art's advantage and beneficial effect as follows:
the utility model relates to a power panel testing device, which can avoid damage or semi-damage of a built-in MOS tube of a backlight chip caused by a tool EOS through a testing thimble and a grounding clip; by adopting the FFC wire to replace the traditional connecting wire, the influence of parasitic inductance and interference on backlight current test can be reduced, and the test accuracy and the test efficiency are improved; meanwhile, the power supply backlight integrated test is realized, the production efficiency is improved, the misjudgment rate is reduced, the poor detection capability is improved, and the illegal operation of staff is prevented; test data may also be saved for traceability.
The above-mentioned embodiments only represent some embodiments of the present invention, and the description thereof is more specific and detailed, but not to be construed as limiting the scope of the present invention. It should be noted that, for those skilled in the art, without departing from the spirit of the present invention, several variations and modifications can be made, which are within the scope of the present invention. Therefore, the protection scope of the present invention should be subject to the appended claims.
Claims (10)
1. A power strip testing device, comprising:
the fixing base is provided with an installation area;
the testing component is arranged on the mounting area and comprises a testing fixed jig, a driving piece, a testing connecting plate and a plurality of testing ejector pins, the testing fixed jig is arranged on a fixed base, the driving piece is arranged on the fixed base, the testing connecting plate is arranged on the driving piece and is positioned above the testing fixed jig, the driving piece is used for pushing the testing connecting plate to be close to or far away from the testing fixed jig, and each testing ejector pin is respectively arranged on the testing fixed jig;
the test display assembly comprises a support frame and a display, the support frame is arranged on the fixed base, the display is arranged on the support frame, and the display is respectively electrically connected with the test connecting plate and the test thimble.
2. The power strip testing device of claim 1, wherein the testing fixture has a fixing groove for fixing the power strip.
3. The power strip testing device of claim 2, wherein a plurality of through holes are formed in the bottom of the fixing groove, the testing pins penetrate through the through holes in a one-to-one correspondence manner, and the testing pins protrude from the bottom of the fixing groove.
4. The power strip testing device of claim 1, wherein the testing assembly further comprises a grounding clip electrically connected to the test connection plate.
5. The power panel testing device of claim 1, wherein the testing circuit is disposed on the testing connection board, and comprises a sampling resistor, a testing LED lamp, and a diode set, wherein a first end of the sampling resistor is electrically connected to a first end of the testing LED lamp, a second end of the sampling resistor is electrically connected to one end of the diode set, and a second end of the testing LED lamp is electrically connected to the other end of the diode set.
6. The power strip testing device of claim 5, wherein the diode bank comprises a plurality of diode cells connected in parallel.
7. The power strip testing device of claim 5, wherein the test connection board is electrically connected to the test LED lamp via an FFC wire.
8. The power strip testing device of claim 1, wherein the driving member comprises a driver, a pushing rod and a pushing block, the driver is disposed on the supporting frame, one end of the pushing rod is electrically connected to the driver, the other end of the pushing rod is electrically connected to the pushing block, and the testing connection board is disposed on the pushing block.
9. The power strip testing device of claim 8, wherein there are two of said driving members, and a space is provided between said two driving members.
10. The power strip testing device of claim 1, wherein the test display assembly further comprises a scanner, the scanner being electrically connected to the display.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201920152790.3U CN209842009U (en) | 2019-01-27 | 2019-01-27 | Power panel testing device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201920152790.3U CN209842009U (en) | 2019-01-27 | 2019-01-27 | Power panel testing device |
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| Publication Number | Publication Date |
|---|---|
| CN209842009U true CN209842009U (en) | 2019-12-24 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201920152790.3U Expired - Fee Related CN209842009U (en) | 2019-01-27 | 2019-01-27 | Power panel testing device |
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| Country | Link |
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| CN (1) | CN209842009U (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109814023A (en) * | 2019-01-27 | 2019-05-28 | 惠州三华工业有限公司 | Power supply board test device |
| CN111948514A (en) * | 2020-08-04 | 2020-11-17 | 深圳创维－Rgb电子有限公司 | Abutting jig and testing device |
-
2019
- 2019-01-27 CN CN201920152790.3U patent/CN209842009U/en not_active Expired - Fee Related
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109814023A (en) * | 2019-01-27 | 2019-05-28 | 惠州三华工业有限公司 | Power supply board test device |
| CN111948514A (en) * | 2020-08-04 | 2020-11-17 | 深圳创维－Rgb电子有限公司 | Abutting jig and testing device |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20191224 Termination date: 20220127 |