CN101680912B - Universal switching device of special testing machine for testing circuit board and universal fixture - Google Patents
Universal switching device of special testing machine for testing circuit board and universal fixture Download PDFInfo
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- CN101680912B CN101680912B CN200980000060.0A CN200980000060A CN101680912B CN 101680912 B CN101680912 B CN 101680912B CN 200980000060 A CN200980000060 A CN 200980000060A CN 101680912 B CN101680912 B CN 101680912B
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Abstract
The invention relates to a universal switching device of a special testing machine for testing a circuit board and a universal fixture. The universal switching device comprises an upper grid point assembly, a switching circuit board, a lower grid point assembly and a pedestal, wherein the upper grid point assembly is mounted on the back of a dial; the switching circuit board is positioned between the upper grid point assembly and lower grid point assembly; the pedestal is positioned under the lower grid point assembly and is fixed on the special testing machine; each test probe on the dial is electrically contacted with each corresponding socket point on the pedestal by a conducting element on the upper grid point assembly, a facade conducting point and a reverse-side conducting point on the switching circuit board and a conducting element on the lower grid point assembly; and each socket point on the pedestal is electrically connected with each test signal conductor respectively. Compared with the existing special testing machine provided with a compound testing device, the special testing machine of the invention does not need to produce wire coils such that the production time is greatly shortened; and compared with the universal testing machine, the special testing machine of the invention has low price.
Description
[technical field]
The present invention relates to the electric performance test device, relate in particular to the short circuit of testing printed circuit and proving installation that opens circuit and tool.
[background technology]
Wiring board manufacturer all will open circuit to the circuit on the wiring board and short-circuit test behind the wiring board that completes.Prior art comprises special tester, universal testing machine and flying probe tester to wiring board short circuit and the testing apparatus that opens circuit; Wherein the flying probe tester test speed is slow; Mainly be suitable for the testing engineering sample, the testing apparatus that is used to produce in batches the circuit plate then mainly is special tester and universal testing machine.
Special tester mainly is could test wiring board by the composite test device that electrically contacts with wiring board; Composite test device comprises dials and drum, and dials is the assembly that a plurality of test probes are housed, and each test probe is corresponding one by one with each test point on needing the measurement circuit plate; Drum is the assembly that a plurality of elastic partss are housed, and the tail end of each test probe all can contact with one of them elastic parts on the drum.The elasticity that elastic parts provides makes each test probe and wiring board to be tested that excellent contact arranged, and reduces each test probe stabbing wiring board simultaneously again.Because the Bobbin structure of composite test device is relatively complicated, its Production Time is also long, and each composite test device is to make to the wiring board of same model, can not be general.To the wiring board of different model, the dials of composite test device and drum all will be made again; Though the total expense of special tester is more cheap than universal testing machine; But by on it the composite test device wiring board to different model, its dials and drum all will be made again, have increased cost; And the Production Time of drum is long, and this has also brought inconvenience to the user.
And universal testing machine comprises universal test tool and general-purpose elastic parts base, and the universal test tool is exactly a packaged dials that a plurality of test probe assemblies are arranged, and each test probe on this dials is corresponding one by one with each test point on needing the measurement circuit plate; General-purpose elastic parts base is the net point assembly of a densely covered elastic parts, and the afterbody that guarantees each test probe on the dials can drop on the elastic parts of net point of this general-purpose elastic parts base.When the wiring board of test different model, only need to make one with each test point of different model wiring board one to one dials just can test this wiring board.But owing on the universal testing machine general-purpose elastic parts base is arranged; The quantity of the elastic parts on the base is very big; Each elastic parts all has an inner switching point correspondence of test machine simultaneously, and its resulting cost is confidential much more expensive than special test, and general producer is beyond affordability.
[summary of the invention]
The technical matters that the present invention will solve is to provide a kind of general switching device and general tool simple in structure, that cost is low, that be used for measurement circuit plate special tester.
The technical solution adopted for the present invention to solve the technical problems is: a kind of general switching device that is used for measurement circuit plate special tester is provided; On said special tester, be provided with the dials and the test signal conductor wire of a plurality of test probes, said test probe is corresponding with the test point of circuit board to be tested; Said general switching device comprises the last net point assembly that is provided with a plurality of first conducting elements, the following net point assembly that is provided with a plurality of second conducting elements, the conversion line plate on said between net point assembly and the following net point assembly and be located at the said base of net point assembly downside down;
The positive and negative two sides of said conversion line plate respectively is provided with a plurality of fronts conductiving point and reverse side conductiving point; The position of said front conductiving point is corresponding one by one with said position of going up the point that first conducting element that touches with test probe is arranged in the net point assembly, and said front conductiving point is in the corresponding one by one electrical connection of conversion line intralamellar part and reverse side conductiving point; Have a socket points that can be connected on the said base with the test signal conductor wire; Said second conducting element conducts electricity with the socket points on the said base and is connected;
Said upward net point assembly is installed in the back side of said dials; Each test probe on the said dials electrically contacts one by one with the test signal line with socket points on the base and is connected through said second conducting element of correspondence on first corresponding on the net point assembly conducting element, front conductiving point and reverse side conductiving point and the following net point assembly on the conversion line plate of going up
The quantity of second conducting element on the said down net point assembly equal said special tester number of test points N doubly, the integer of N＞1; Correspondingly, the N of said down net point assembly said second conducting element is one group, and each group is connected with a socket points on the base.
In general switching device of the present invention, said first conducting element and second conducting element are band spring conductive devices; Offer and insert first through hole and second through hole of said band spring conductive devices on said on net point assembly and the following grid assembly respectively; Perhaps
Said upward net point assembly and/or following grid assembly are elastic insulated plate; And the position at said first conducting element and second conducting element is mixed with electrically conductive particles, by said electrically conductive particles and elastic insulated harden to close form said first conducting element and second conducting element.
In general switching device of the present invention, said first conducting element of going up on the net point assembly is covered with in the said all test zones of net point assembly of going up;
Said first conducting element on said on the net point assembly spacing embark on journey, become column distribution equably; The said distribution density that goes up first conducting element on the net point assembly is 2 times, 4 times, 8 times or 10 double densities.
In general switching device of the present invention, the one side of said second conducting element is stretched out the said front of net point assembly down, forms good electrical contact with said reverse side conductiving point; And/or the said first conducting element afterbody of going up on the net point assembly stretches out the said reverse side of going up the net point assembly, and the front conductiving point corresponding with said conversion line plate has good electrical contact.
In general switching device of the present invention, be respectively equipped with corresponding registration holes on said dials, last net point assembly, conversion line plate, following net point assembly and the base.
In general switching device of the present invention, said each socket points is conducted electricity through the inner conducting wire of said base or external conductor wire and said second conducting element and is connected or conducts electricity contact; Said base stretches out, and said socket points is fixed on the outward extending position of this base.
The present invention also provides a kind of general tool that is used for measurement circuit plate special tester, and said general tool comprises the last tool and following tool that lays respectively at said wiring board both sides; The said tool of going up includes above-mentioned dials and general switching device with following tool.
In general tool of the present invention; The second conducting element quantity on the following net point assembly of the general switching device of said down tool is more than or equal to the number of test points of said special tester, and the second conducting element quantity on the following net point assembly of the said general switching device of going up tool is half the more than or equal to the number of test points of special tester.
In general tool of the present invention, the quantity of second conducting element on the following net point assembly of said down tool equal said special tester number of test points N doubly, the integer of N＞1; Correspondingly, the N of said down net point assembly said second conducting element is one group, and each group is connected with a socket points on the base;
The quantity of second conducting element on the said following net point assembly of going up tool equal said special tester number of test points half the N doubly, the integer of N＞1.
In general tool of the present invention; The second conducting element quantity sum on two following net point assemblies of said upward tool and following tool equals the number of test points of said special tester, and the said second conducting element quantity that goes up tool and following tool is by given proportional distribution.
Compare with prior art, the present invention is used for the general switching device of measurement circuit plate special tester and the beneficial effect of general tool is:
Because the general switching device of the present invention is contained in measurement circuit plate on the special tester; General-purpose elastic parts base has similar functions on this general switching device and the universal testing machine; And when having equipped the wiring board of special tester test different model of this general switching device; Only need to make and get final product with corresponding dials of wiring board to be tested and conversion line plate; The elastic parts that the conversion line plate is used each tester probe takes out; Reverse side point through wiring board and special test itself with the net point formed of test point be connected, thereby realized corresponding relation with the test point quantity of several thousand of the elastic parts of several ten thousand on general-purpose elastic base on the universal testing machine or hundreds of thousands quantity and test machines itself.The Production Time of conversion line plate is shorter than drum, and cost is low.Follow the special tester that prior art is equipped with composite test device to compare like this, behind this general switching device of use, do not need to make drum on the special tester again, its Production Time can shorten greatly; And compare with the prior art universal testing machine, used the special tester price of this general switching device to want considerably cheaper.
In addition; General tool of the present invention will descend the off line lattice point number of tool corresponding general switching device set with test machine always count the same or N times; The off line lattice point number of last tool corresponding general switching device set and test machine always count over half; Can guarantee that like this but so long as the counting less than the number of test points of whole tester table of test plate (panel) to be measured, this test plate (panel) to be measured just can cooperate this general switching device to use.In addition, can have the advantage of low preparation cost with descending net point and base to link together through the spring that has lead.
In addition; If following net point and base are not through having the spring connected mode of lead; The insulcrete of net point assembly also can be in rubber slab, in each is provided with the elastic conductive component position, to be mixed with metal particle by one to elastic conductive component on the following net point assembly with forming down, through the combination formation elastic conductive component of metal particle and rubber.Such mode can reduce the height of net point assembly down, also plays the effect of the height that reduces whole switching device simultaneously.
Perhaps; Conducting element on the following net point slightly stretches out the reverse side of net point down; A wiring board is arranged on the base, have on the wiring board and following net point on conducting element position conductiving point one to one, conductiving point conducts electricity with socket points through the inner circuit of wiring board and is connected.After will descending the assembling of net point and base, the conducting element on the following net point just can be connected with the socket points conduction.
[description of drawings]
Fig. 1 is that the general switching device that is used for measurement circuit plate special tester and the dials on the special tester of one embodiment of the invention is fitted together the cross-sectional schematic when testing the single face wiring board;
Fig. 2 is that the dials on general switching device of the present invention and the special tester is fitted together the axonometric projection decomposing schematic representation when testing the single face wiring board;
Fig. 3 is the cross-sectional schematic of general switching device and the dials on the special tester of an embodiment of general tool of the present invention when being fitted together testing two-sided wiring board;
Fig. 4 be on the general switching device of the present invention on the net point assembly 110 density of through hole 112 be that the master of 2 double densities looks synoptic diagram;
Fig. 5 be on the general switching device of the present invention on the net point assembly 110 density of through hole 112 be that the master of 4 double densities looks synoptic diagram;
Fig. 6 be on the general switching device of the present invention on the net point assembly 110 density of through hole 112 be that the master of 8 double densities looks synoptic diagram;
Fig. 7 be on the general switching device of the present invention on the net point assembly 110 density of through hole 112 be that the master of 10 double densities looks synoptic diagram;
Fig. 8 is the synoptic diagram that the following net point assembly of general switching device of the present invention adopts elastic insulated plate and electrically conductive particles.
[embodiment]
Below in conjunction with each accompanying drawing the present invention is done further explain.
Referring to Fig. 1 to Fig. 3, be a specific embodiment of the present invention's general switching device of being used for measurement circuit plate special tester.Special tester comprises the dials 200 and test signal conductor wire (the figure acceptance of the bid is drawn) that is provided with a plurality of test probes 210.Dials 200 is according to wiring board 400 to be tested or 400 ' making, and the dials 200 that the wiring board 400 or 400 of different model ' correspondence is different makes that the test probe 210 of dials 200 is corresponding with the test point of wiring board to be tested.Wiring board 400 to be tested or 400 ' number of test points less than the number of test points in the special tester.
A plurality of test probes 210 heads on the dials 200 withstand on each test point (figure acceptance of the bid draw) of wiring board 400 to be tested or 400 ' correspondence, and with wiring board 400 to be tested or 400 ' each test point electrically contact.Last net point assembly 110 be installed in dials 200 below, corresponding elasticity first conducting element 111 heads electrically contact on a plurality of test probes 210 afterbodys on the dials 200 and the last net point assembly 110.
Corresponding conductiving point 141 electrically contacts one by one and is connected on elasticity second conducting element 131 of each test probe 210 on the dials 200 through correspondence on the front conductiving point 121 on elasticity corresponding on the last net point assembly 110 first conducting element 111, the conversion line plate 120 and reverse side conductiving point 122 and the following net point assembly 130 and the base 140; Each conductiving point 141 on the base 140 is connected with 147 of socket points through its inner circuit, is electrically connected one by one with each test signal conductor wire through socket points 147.Just each test signal conductor wire of drawing on each test point of wiring board 400 to be tested and this special tester is electrically connected one by one through such connected mode, through special tester open circuit, test such as open circuit.Perhaps, following net point also can through conductor wire directly with base on socket points 147 conduct electricity and be connected, and omitted the conductiving point on the base.
Referring to Fig. 1 to Fig. 3, first through hole 112 is covered with all test zones of net point assembly on this 110 on the last net point assembly 110; The density of the drum net point of the density of this first through hole 112 and composite test device is the same.
Referring to Fig. 4; The density of this first through hole 112 can be 2 times; The centre distance L1 that is every row two adjacent first through holes 112 is 2.54 millimeters; The centre distance L2 of every row two adjacent first through holes 112 also is 2.54 millimeters, but the centre distance L3 of adjacent first through hole 112 of one first through hole of every row 112 and adjacent columns is 1.80 millimeters.
Referring to Fig. 5; The density of this first through hole 112 can be 4 times; The centre distance L1 that is every row two adjacent first through holes 112 is 1.27 millimeters; The centre distance L2 of every row two adjacent first through holes 112 is 1.27 millimeters, and the centre distance of adjacent first through hole 112 of one first through hole 112 of every row and adjacent columns also is 1.27 millimeters.
Referring to Fig. 6; The density of this first through hole 112 can be 8 times; The centre distance L1 that is every row two adjacent first through holes 112 is 1.27 millimeters; The centre distance L2 of every row two adjacent first through holes 112 also is 1.27 millimeters, but the centre distance L3 of adjacent first through hole 112 of one first through hole of every row 112 and adjacent columns is 0.90 millimeter.
Referring to Fig. 7; The density of this first through hole 112 can be 10 times; The centre distance L1 that is every row two adjacent first through holes 112 is 1.13 millimeters; The centre distance L2 of every row two adjacent first through holes 112 also is 1.13 millimeters, but the centre distance L3 of adjacent first through hole 112 of one first through hole of every row 112 and adjacent columns is 0.80 millimeter.
The density of this first through hole 112 can also be higher density.
Second through hole 132 on the following net point assembly 130 and the quantity of elasticity second conducting element 131 are decided according to the number of test points of special tester.Referring to Fig. 1 and Fig. 2; Promptly for the test of single face wiring board 400; Special tester only need be installed dials 200 and respectively one of general switching device 100, second through hole 132 on the following net point assembly 130 and the number of test points equivalent amount of elasticity second conducting element 131 with special tester.Number of test points like special tester is 10240 points, then descends second through hole 132 on the net point assembly 130 respectively to have 10240 with elasticity second conducting element 131.
Referring to Fig. 3, be a specific embodiment of general tool of the present invention, be used for two-sided or more than two-sided wiring board 400 ' test.This general tool comprise be positioned at double-sided wiring board 400 ' last tool and the following tool of both sides.Tool be should go up and dials recited above and general switching device included with following tool; Dials 200 and general switching device 100 each two promptly need be installed, and each is tested with a dials 200 and general switching device 100 simultaneously at the pro and con of this wiring board.
Second conducting element, 132 quantity on the following net point assembly 130 of the general switching device 100 of following tool are more than or equal to the number of test points of special tester, and the number of openings on the following net point assembly 130 of the general switching device 100 of last tool is half the more than or equal to the number of test points of special tester.Because the wiring board test generally is placed on following tool test with the more one side of counting to be tested; Be placed on top tool test to the few one side of pilot to be measured; The off line lattice point number that tool up and down so is set just can newspaper so long as the to be measured of test plate (panel) to be measured counted less than the number of test points of whole measuring try engine, just can on the test machine of the adaptive above-mentioned general switching device that descends net point, use.
Simultaneously; For making things convenient for the making of conversion line plate; Make down net point have more subsequent use point can select to be connected, can off line lattice point number be become the increase of multiple, promptly for the test of single face wiring board by the wiring of nearby principle with last net point; Special tester only need be installed dials 200 and respectively one of general switching device 100; Second through hole, 132 quantity on the following net point assembly 130 be special tester number of test points N doubly, N＞1 is put every N and to be made as one group; There is many places N to put short circuit together with the conductiving point 141 on the base 140 of elasticity second conducting element 131 equivalent amounts in following net point assembly 130 second through holes 132; N conductiving point 141 short circuit are electrically connected by a test signal conductor wire of given rule and special tester the back together on the base 140, when making conversion line plate 120, each reverse side conductiving point 122 of its reverse side only with following net point assembly 130 on set one a group N some position correspondence in putting; Number of test points like special tester is 10240 points; N=3 then descends second through hole 132 on the net point assembly 130 respectively to have 30720 with elasticity second conducting element 131, meanwhile; 30720 conductiving points 141 are arranged on the base 140; Have 10240 groups of points, 10240 places, 3 somes short circuit is arranged together, 10240 places, 3 somes short circuit on this base 140 is electrically connected with 10240 test signal conductor wires of special tester respectively together.The quantity of descending net point assembly 130 like this is N times of special tester number of test points; Just more selection can be arranged in the position of the conductiving point of conversion line plate 120 reverse side of making some special wiring boards to be tested like this, the difficulty that conversion line plate 120 is made can be little a lot.
Understandable; The quantity of second conducting element on two following net point assemblies of last tool and following tool can also be distributed as required; For example: upward second conducting element, the 131 quantity sums on two following net point assemblies 130 of tool and following tool equal the number of test points of special tester; And second conducting element, 131 quantity of last tool and following tool are pressed given proportional distribution, as distributing according to various ratios such as 7: 3 or 8: 2 or 6: 4.
Referring to Fig. 1 and Fig. 3; The down positive and negative two sides of net point assembly 130 is slightly stretched out at each elasticity second conducting element 131 two on the following net point assembly 130, makes down that corresponding conductiving point 141 has good electrical contact on corresponding with conversion line plate 120 respectively reverse side conductiving point 122 of each elasticity second conducting element 131 on the net point assembly 130 and the base 140.
Referring to Fig. 1 and Fig. 3; Each elasticity first conducting element 111 afterbody on the last net point assembly 110 slightly stretch out the reverse side of net point assembly 110, make each elasticity first conducting element 111 on the net point assembly 110 with conversion line plate 120 corresponding front conductiving points 121 good electrical contact arranged respectively.
Referring to Fig. 2, be respectively equipped with corresponding pilot hole 205,115,125,135,145 on dials 200, last net point assembly 110, conversion line plate 120, following net point assembly 130 and the base 140, conveniently they are installed together.
Referring to Fig. 2, base 140 stretches out, and the socket points 147 that is electrically connected with each test signal conductor wire is fixed on this base 140 outward extending positions 146.
Used elasticity first conducting element 111 of the present invention can be used the applicant and apply on Dec 16th, 2004; Chinese invention patent " the wiring board test is with the switching spring " technology in 02 month Granted publication on the 22nd in 2006 is made, and its patent No. is ZL200420103000.6.Elasticity second conducting element 131 can be the inner tailored version probe that spring is housed of spring or band.Also can use the elastic probe of other type.
Upward net point assembly of the present invention and/or following grid assembly can also adopt other a kind of embodiment.As shown in Figure 8; Last net point assembly is elastic insulated plate with following net point assembly; And the position that first conducting element 111 and second conducting element 131 are set at needs is mixed with electrically conductive particles, by electrically conductive particles and elastic insulated harden to close form first conducting element 111 and second conducting element 131.Can possess conduction and flexible speciality in the elastic insulated plate behind the admixture conductive fine powder.Such mode can reduce the height of net point assembly down, also plays the effect of the height that reduces whole switching device simultaneously.
In general; The number of test points of general switching device that is used for measurement circuit plate special tester about 10,000 or still less; Even and also can surpass 10,000 quantity on the very little area of the net point of the general-purpose elastic parts base of universal testing machine from far away, generally be a ten of thousands net point.How several ten thousand net points on drum or the general-purpose elastic parts base and the number of test points in the special tester being mapped one by one is exactly that an industry is badly in need of the problem that will solve.Because wiring board 400 to be tested or 400 ' number of test points be bound to less than the number of test points in the special tester; The present invention with wiring board 400 to be tested or 400 ' through dials 200, go up net point assembly 110, conversion line plate 120, down net point assembly 130 and base 140 just can realize with wiring board 400 to be tested or 400 ' number of test points take out and the number of test points of special tester is realized electrical connection one to one; And only need change corresponding dials 200 and conversion line plate 120 to the wiring board of different model, just can test the wiring board of different model at special tester.Because conversion line plate 120 circuits are simple, it is made and takes a short time, and price is also lower, so the user is again with can not be long worried with the drum spended time of making the prior art special tester for the universal testing machine of having cannot afford.
Above embodiment has only expressed preferred implementation of the present invention, and it describes comparatively concrete and detailed, but can not therefore be interpreted as the restriction to claim of the present invention; Should be pointed out that for the person of ordinary skill of the art under the prerequisite that does not break away from the present invention's design, can also make some distortion and improvement, these all belong to protection scope of the present invention; Therefore, all equivalents and modifications of being done with claim scope of the present invention all should belong to the covering scope of claim of the present invention.
Claims (8)
1. general switching device that is used for measurement circuit plate special tester is provided with the dials (200) and the test signal conductor wire of a plurality of test probes (210) on said special tester, said test probe (210) is corresponding with the test point of circuit board to be tested; It is characterized in that:
Said general switching device (100) comprises the last net point assembly (110), the following net point assembly (130) that is provided with a plurality of second conducting elements (131) that are provided with a plurality of first conducting elements (111), be positioned at said conversion line plate (120) between net point assembly (110) and the following net point assembly (130) and the base (140) that is located at said time net point assembly (130) downside gone up;
The positive and negative two sides of said conversion line plate (120) respectively is provided with a plurality of fronts conductiving points (121) and reverse side conductiving point (122); The position of said front conductiving point (121) with said go up have in the net point assembly (110) and the position of the point of first conducting element (111) that test probe (210) touches corresponding one by one, said front conductiving point (121) is in conversion line plate (120) inside and the corresponding one by one electrical connection of reverse side conductiving point (122); Have a socket points (147) that can be connected on the said base (140) with the test signal conductor wire; Said second conducting element (131) conducts electricity with the socket points on the said base (140) and is connected;
Said upward net point assembly (110) is installed in the back side of said dials (200); Each test probe (210) on the said dials (200) through said go up net point assembly (110) go up corresponding first conducting element (111), on the conversion line plate (120) front conductiving point (121) and reverse side conductiving point (122) and following net point assembly (130) upward second conducting element (131) of correspondence electrically contact one by one with the test signal line with socket points (147) on the base (140) and be connected;
The quantity of second conducting element (131) on the said down net point assembly (130) equal said special tester number of test points N doubly, wherein N is N>1 integer; Correspondingly, the N of said down net point assembly (130) said second conducting element (131) is one group, and each group is connected with a socket points (147) on the base (140).
2. the general switching device that is used for measurement circuit plate special tester according to claim 1 is characterized in that:
Said first conducting element (111) and second conducting element (131) are band spring conductive devices; Offer first through hole (112) and second through hole (132) that inserts said band spring conductive devices on said on net point assembly (110) and the following grid assembly (130) respectively; Perhaps
Said upward net point assembly and/or following grid assembly are elastic insulated plate; And the position at said first conducting element (111) and second conducting element (131) is mixed with electrically conductive particles, by said electrically conductive particles and elastic insulated harden to close form said first conducting element (111) and second conducting element (131).
3. the general switching device that is used for measurement circuit plate special tester according to claim 2 is characterized in that: said first conducting element of going up on the net point assembly (110) (111) is covered with in the said all test zones of net point assembly (110) of going up;
Said first conducting element (111) net point assembly (110) on said is gone up spacing and is embarked on journey, becomes column distribution equably; The said distribution density that goes up first conducting element (111) on the net point assembly (110) is 2 times, 4 times, 8 times or 10 double densities.
4. the general switching device that is used for measurement circuit plate special tester according to claim 1 is characterized in that:
The one side of said second conducting element (131) is stretched out the said front of net point assembly (130) down, forms good electrical contact with said reverse side conductiving point (122); And/or said first conducting element (111) afterbody of going up on the net point assembly (110) stretches out the said reverse side of going up net point assembly (110), and the front conductiving point (121) corresponding with said conversion line plate (120) has good electrical contact.
5. the general switching device that is used for measurement circuit plate special tester according to claim 1 is characterized in that: be respectively equipped with corresponding registration holes (205,115,125,135,145) on said dials (200), last net point assembly (110), conversion line plate (120), following net point assembly (130) and the base (140).
6. the general switching device that is used for measurement circuit plate special tester according to claim 1 is characterized in that: said each socket points (147) is conducted electricity through the inner conducting wire of said base (140) or external conductor wire and said second conducting element (131) and is connected or conducts electricity contact; Said base (140) stretches out, and said socket points (147) is fixed on the outward extending position of this base (140) (146).
7. general tool that is used for measurement circuit plate special tester is characterized in that: said general tool comprises the last tool and following tool that lays respectively at said wiring board both sides; The said tool of going up includes described dials of aforesaid right requirement and general switching device with following tool;
The quantity of second conducting element (131) on the said following net point assembly (130) of going up tool equal said special tester number of test points half the N doubly, wherein N is N>1 integer; And, the quantity of second conducting element on the following net point assembly of said down tool equal said special tester number of test points N doubly, wherein N is N>1 integer.
8. the general tool that is used for measurement circuit plate special tester according to claim 7 is characterized in that:
Second conducting element (132) quantity on the following net point assembly (130) of the general switching device (100) of said down tool is more than or equal to the number of test points of said special tester, and second conducting element (131) quantity on the following net point assembly (130) of the said general switching device (100) of going up tool is half the more than or equal to the number of test points of special tester.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN200980000060.0A CN101680912B (en) | 2008-09-23 | 2009-01-13 | Universal switching device of special testing machine for testing circuit board and universal fixture |
Applications Claiming Priority (6)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN200820212074 | 2008-09-23 | ||
| CN200820212074.1 | 2008-09-23 | ||
| CN200820179498.2 | 2008-12-01 | ||
| CNU2008201794982U CN201319056Y (en) | 2008-09-23 | 2008-12-01 | Universal switching device and universal fixture used for special testing machine for testing circuit board |
| CN200980000060.0A CN101680912B (en) | 2008-09-23 | 2009-01-13 | Universal switching device of special testing machine for testing circuit board and universal fixture |
| PCT/CN2009/070129 WO2010034185A1 (en) | 2008-09-23 | 2009-01-13 | A general transferring device for testing a special testing apparatus of a circuitry board and a general jig thereof |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN101680912A CN101680912A (en) | 2010-03-24 |
| CN101680912B true CN101680912B (en) | 2012-12-12 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN200980000060.0A Expired - Fee Related CN101680912B (en) | 2008-09-23 | 2009-01-13 | Universal switching device of special testing machine for testing circuit board and universal fixture |
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| CN (1) | CN101680912B (en) |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN102043111B (en) * | 2010-11-16 | 2013-03-13 | 陈涛 | Microneedle jig and combination jig |
| CN102621431A (en) * | 2012-04-11 | 2012-08-01 | 游森溢 | Mixed type testing device |
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| WO2018021216A1 (en) * | 2016-07-28 | 2018-02-01 | 日本電産リード株式会社 | Inspection jig, substrate inspection device, and method for manufacturing inspection jig |
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| CN1595184A (en) * | 2003-12-03 | 2005-03-16 | 联能科技（深圳）有限公司 | Testing device for density variable printed circuit board |
| CN2795865Y (en) * | 2005-04-27 | 2006-07-12 | 耀华电子股份有限公司 | Composite printed circuit board test device |
| CN1912632A (en) * | 2005-08-12 | 2007-02-14 | 吕坤茂 | Circuit board testing device |
| JP2007200728A (en) * | 2006-01-26 | 2007-08-09 | Matsushita Electric Works Ltd | Inter-substrate connector |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1595184A (en) * | 2003-12-03 | 2005-03-16 | 联能科技（深圳）有限公司 | Testing device for density variable printed circuit board |
| CN2795865Y (en) * | 2005-04-27 | 2006-07-12 | 耀华电子股份有限公司 | Composite printed circuit board test device |
| CN1912632A (en) * | 2005-08-12 | 2007-02-14 | 吕坤茂 | Circuit board testing device |
| JP2007200728A (en) * | 2006-01-26 | 2007-08-09 | Matsushita Electric Works Ltd | Inter-substrate connector |
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| CN101680912A (en) | 2010-03-24 |
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