CN1989417B - 开发半导体集成电路测试程序的方法和结构 - Google Patents
开发半导体集成电路测试程序的方法和结构 Download PDFInfo
- Publication number
- CN1989417B CN1989417B CN2005800163968A CN200580016396A CN1989417B CN 1989417 B CN1989417 B CN 1989417B CN 2005800163968 A CN2005800163968 A CN 2005800163968A CN 200580016396 A CN200580016396 A CN 200580016396A CN 1989417 B CN1989417 B CN 1989417B
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- Test And Diagnosis Of Digital Computers (AREA)
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Applications Claiming Priority (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US57357704P | 2004-05-22 | 2004-05-22 | |
US60/573,577 | 2004-05-22 | ||
US10/918,513 | 2004-08-13 | ||
US10/918,513 US7209851B2 (en) | 2003-02-14 | 2004-08-13 | Method and structure to develop a test program for semiconductor integrated circuits |
PCT/JP2005/009816 WO2005114241A2 (en) | 2004-05-22 | 2005-05-23 | Method and structure to develop a test program for semiconductor integrated circuits |
Publications (2)
Publication Number | Publication Date |
---|---|
CN1989417A CN1989417A (zh) | 2007-06-27 |
CN1989417B true CN1989417B (zh) | 2011-03-16 |
Family
ID=38131583
Family Applications (6)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN2005800163968A Expired - Fee Related CN1989417B (zh) | 2004-05-22 | 2005-05-23 | 开发半导体集成电路测试程序的方法和结构 |
CN2005800164369A Expired - Fee Related CN1997909B (zh) | 2004-05-22 | 2005-05-23 | 用于控制模块化测试系统中可互换部件的方法和系统 |
CN200580016215A Expired - Fee Related CN100585422C (zh) | 2004-05-22 | 2005-05-23 | 用于对模块化测试系统进行仿真的方法和系统 |
CN 200580015953 Pending CN1981202A (zh) | 2004-05-22 | 2005-05-23 | 模块化测试系统中的数据日志支持 |
CNB2005800164373A Expired - Fee Related CN100541218C (zh) | 2004-05-22 | 2005-05-23 | 开发用于半导体集成电路的测试程序的方法和结构 |
CN200580016355A Expired - Fee Related CN100580473C (zh) | 2004-05-22 | 2005-05-23 | 支持开放架构测试系统中的校准和诊断 |
Family Applications After (5)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN2005800164369A Expired - Fee Related CN1997909B (zh) | 2004-05-22 | 2005-05-23 | 用于控制模块化测试系统中可互换部件的方法和系统 |
CN200580016215A Expired - Fee Related CN100585422C (zh) | 2004-05-22 | 2005-05-23 | 用于对模块化测试系统进行仿真的方法和系统 |
CN 200580015953 Pending CN1981202A (zh) | 2004-05-22 | 2005-05-23 | 模块化测试系统中的数据日志支持 |
CNB2005800164373A Expired - Fee Related CN100541218C (zh) | 2004-05-22 | 2005-05-23 | 开发用于半导体集成电路的测试程序的方法和结构 |
CN200580016355A Expired - Fee Related CN100580473C (zh) | 2004-05-22 | 2005-05-23 | 支持开放架构测试系统中的校准和诊断 |
Country Status (4)
Country | Link |
---|---|
JP (1) | JP4332200B2 (de) |
CN (6) | CN1989417B (de) |
AT (3) | ATE451625T1 (de) |
DE (3) | DE602005018204D1 (de) |
Families Citing this family (36)
Publication number | Priority date | Publication date | Assignee | Title |
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US7925940B2 (en) * | 2007-10-17 | 2011-04-12 | Synopsys, Inc. | Enhancing speed of simulation of an IC design while testing scan circuitry |
US8094566B2 (en) * | 2009-12-24 | 2012-01-10 | Advantest Corporation | Test apparatus and test method |
CN102215140B (zh) * | 2010-04-02 | 2013-03-27 | 英业达股份有限公司 | 储存局域网络的检验装置 |
CN102378232A (zh) * | 2010-08-23 | 2012-03-14 | 财团法人资讯工业策进会 | 无线网络信号的测试系统及其测量方法 |
CN103109275B (zh) * | 2010-09-07 | 2016-02-03 | 爱德万测试公司 | 在半导体测试环境中使用虚拟仪器的系统、方法和设备 |
CN101980174B (zh) * | 2010-11-24 | 2012-07-04 | 中国人民解放军国防科学技术大学 | 一种自动测试计算机应用程序区间能耗的方法 |
JP2012167958A (ja) * | 2011-02-10 | 2012-09-06 | Nippon Syst Wear Kk | 試験情報表示装置、方法、プログラム、および該ソフトウェアを格納したコンピュータ可読媒体 |
CN102608517A (zh) * | 2012-02-16 | 2012-07-25 | 工业和信息化部电子第五研究所 | 一种创建集成电路测试程序包的快速方法 |
US9606183B2 (en) | 2012-10-20 | 2017-03-28 | Advantest Corporation | Pseudo tester-per-site functionality on natively tester-per-pin automatic test equipment for semiconductor test |
US10161993B2 (en) * | 2013-02-21 | 2018-12-25 | Advantest Corporation | Tester with acceleration on memory and acceleration for automatic pattern generation within a FPGA block |
JP6174898B2 (ja) * | 2013-04-30 | 2017-08-02 | ルネサスエレクトロニクス株式会社 | 半導体試験装置 |
TWI490689B (zh) * | 2013-05-17 | 2015-07-01 | 英業達股份有限公司 | 不間斷自動更新測試命令之系統及方法 |
CN104298590B (zh) * | 2013-07-16 | 2019-05-10 | 爱德万测试公司 | 用于按管脚apg的快速语义处理器 |
CN103413003B (zh) * | 2013-08-21 | 2016-07-06 | 浪潮(北京)电子信息产业有限公司 | 一种序列传输、接收装置及方法 |
KR102147172B1 (ko) * | 2014-04-09 | 2020-08-31 | 삼성전자주식회사 | 시스템 온 칩 및 그것의 검증 방법 |
US9672020B2 (en) | 2014-09-19 | 2017-06-06 | Microsoft Technology Licensing, Llc | Selectively loading precompiled header(s) and/or portion(s) thereof |
CN107003648B (zh) * | 2014-12-17 | 2019-06-11 | 西门子公司 | 自动化设备的功能模块的检验方法和工程规划系统 |
CN107454124B (zh) * | 2016-05-31 | 2020-11-03 | 创新先进技术有限公司 | 设备自动化方法及装置 |
CN106507098B (zh) * | 2016-10-09 | 2018-10-19 | 珠海市魅族科技有限公司 | 数据处理的方法和装置 |
CN106603074A (zh) * | 2016-11-03 | 2017-04-26 | 武汉新芯集成电路制造有限公司 | 一种dac电路并行测试系统及并行测试方法 |
CN107959981B (zh) * | 2017-10-30 | 2020-07-10 | 捷开通讯(深圳)有限公司 | 一种通信终端和通信测试方法 |
CN109324956B (zh) * | 2018-08-20 | 2021-11-05 | 深圳前海微众银行股份有限公司 | 系统测试方法、设备及计算机可读存储介质 |
CN109508290A (zh) * | 2018-10-25 | 2019-03-22 | 深圳点猫科技有限公司 | 一种基于教育系统的自动化测试方法及电子设备 |
CN109884923A (zh) * | 2019-02-21 | 2019-06-14 | 苏州天准科技股份有限公司 | 一种自动化设备控制模块化可配置系统 |
CN110954804B (zh) * | 2019-12-19 | 2021-11-02 | 上海御渡半导体科技有限公司 | 一种批量精确诊断cBit阵列故障的装置和方法 |
KR20230109626A (ko) * | 2020-12-03 | 2023-07-20 | 시놉시스, 인크. | 하드웨어 설계 컴파일 실패에 대한 자동 순차적 재시도 |
CN113051114A (zh) * | 2021-03-19 | 2021-06-29 | 无锡市软测认证有限公司 | 一种用于提高芯片测试效率的方法 |
CN113342649B (zh) * | 2021-05-31 | 2023-11-14 | 上海创景信息科技有限公司 | 基于真实目标机实现单元测试的方法、介质和设备 |
CN113238834B (zh) * | 2021-05-31 | 2023-08-08 | 北京世冠金洋科技发展有限公司 | 仿真模型文件的处理方法、装置及电子设备 |
KR102314419B1 (ko) * | 2021-07-27 | 2021-10-19 | (주) 에이블리 | 반도체 테스트 패턴 발생 장치 및 방법 |
CN113740077A (zh) * | 2021-09-13 | 2021-12-03 | 广州文远知行科技有限公司 | 车辆底盘测试方法、装置、设备及存储介质 |
CN114252758A (zh) * | 2021-12-03 | 2022-03-29 | 杭州至千哩科技有限公司 | Ate测试通道资源配置方法、装置、设备及存储介质 |
CN114646867B (zh) * | 2022-05-18 | 2022-10-28 | 南京宏泰半导体科技有限公司 | 一种集成电路并发测试装置及方法 |
CN115630594B (zh) * | 2022-12-19 | 2023-03-21 | 杭州加速科技有限公司 | 一种芯片设计仿真文件到Pattern文件的转换方法及其系统 |
CN116257037B (zh) * | 2023-05-15 | 2023-08-11 | 通达电磁能股份有限公司 | 控制器测试程序的生成方法、系统、电子设备及存储介质 |
CN116520754B (zh) * | 2023-06-27 | 2023-09-22 | 厦门芯泰达集成电路有限公司 | 基于预加载模式的dps模块控制方法、系统 |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CA1242486A (en) * | 1983-11-25 | 1988-09-27 | John J. Comfort | Automatic test equipment |
US6208439B1 (en) * | 1990-11-09 | 2001-03-27 | Litel Instruments | Generalized geometric transforms for computer generated holograms |
US6779140B2 (en) * | 2001-06-29 | 2004-08-17 | Agilent Technologies, Inc. | Algorithmically programmable memory tester with test sites operating in a slave mode |
CN100341110C (zh) * | 2002-04-11 | 2007-10-03 | 株式会社爱德万测试 | 避免asic/soc制造中原型保持的制造方法和设备 |
-
2005
- 2005-05-23 AT AT05743262T patent/ATE451625T1/de not_active IP Right Cessation
- 2005-05-23 CN CN2005800163968A patent/CN1989417B/zh not_active Expired - Fee Related
- 2005-05-23 CN CN2005800164369A patent/CN1997909B/zh not_active Expired - Fee Related
- 2005-05-23 DE DE602005018204T patent/DE602005018204D1/de active Active
- 2005-05-23 CN CN200580016215A patent/CN100585422C/zh not_active Expired - Fee Related
- 2005-05-23 AT AT05743357T patent/ATE438865T1/de not_active IP Right Cessation
- 2005-05-23 AT AT05743229T patent/ATE451624T1/de not_active IP Right Cessation
- 2005-05-23 CN CN 200580015953 patent/CN1981202A/zh active Pending
- 2005-05-23 DE DE602005018205T patent/DE602005018205D1/de active Active
- 2005-05-23 DE DE602005015848T patent/DE602005015848D1/de active Active
- 2005-05-23 CN CNB2005800164373A patent/CN100541218C/zh not_active Expired - Fee Related
- 2005-05-23 CN CN200580016355A patent/CN100580473C/zh not_active Expired - Fee Related
-
2008
- 2008-07-11 JP JP2008180843A patent/JP4332200B2/ja active Active
Also Published As
Publication number | Publication date |
---|---|
CN1981203A (zh) | 2007-06-13 |
CN1997909A (zh) | 2007-07-11 |
CN100541218C (zh) | 2009-09-16 |
DE602005018204D1 (de) | 2010-01-21 |
ATE451625T1 (de) | 2009-12-15 |
ATE438865T1 (de) | 2009-08-15 |
JP2009008683A (ja) | 2009-01-15 |
CN1981200A (zh) | 2007-06-13 |
ATE451624T1 (de) | 2009-12-15 |
CN100585422C (zh) | 2010-01-27 |
CN1989417A (zh) | 2007-06-27 |
CN1997908A (zh) | 2007-07-11 |
DE602005015848D1 (de) | 2009-09-17 |
DE602005018205D1 (de) | 2010-01-21 |
CN1981202A (zh) | 2007-06-13 |
JP4332200B2 (ja) | 2009-09-16 |
CN1997909B (zh) | 2010-11-10 |
CN100580473C (zh) | 2010-01-13 |
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Granted publication date: 20110316 Termination date: 20140523 |