CN1989417B - 开发半导体集成电路测试程序的方法和结构 - Google Patents

开发半导体集成电路测试程序的方法和结构 Download PDF

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Publication number
CN1989417B
CN1989417B CN2005800163968A CN200580016396A CN1989417B CN 1989417 B CN1989417 B CN 1989417B CN 2005800163968 A CN2005800163968 A CN 2005800163968A CN 200580016396 A CN200580016396 A CN 200580016396A CN 1989417 B CN1989417 B CN 1989417B
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pattern
test
file
module
name
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CN1989417A (zh
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哈森吉特·辛格
安康·普拉马尼克
马克·埃尔斯顿
田原善文
足立敏明
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Advantest Corp
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Advantest Corp
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  • Test And Diagnosis Of Digital Computers (AREA)
  • Debugging And Monitoring (AREA)
  • Management, Administration, Business Operations System, And Electronic Commerce (AREA)
CN2005800163968A 2004-05-22 2005-05-23 开发半导体集成电路测试程序的方法和结构 Expired - Fee Related CN1989417B (zh)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US57357704P 2004-05-22 2004-05-22
US60/573,577 2004-05-22
US10/918,513 2004-08-13
US10/918,513 US7209851B2 (en) 2003-02-14 2004-08-13 Method and structure to develop a test program for semiconductor integrated circuits
PCT/JP2005/009816 WO2005114241A2 (en) 2004-05-22 2005-05-23 Method and structure to develop a test program for semiconductor integrated circuits

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CN1989417A CN1989417A (zh) 2007-06-27
CN1989417B true CN1989417B (zh) 2011-03-16

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Application Number Title Priority Date Filing Date
CN2005800163968A Expired - Fee Related CN1989417B (zh) 2004-05-22 2005-05-23 开发半导体集成电路测试程序的方法和结构
CN2005800164369A Expired - Fee Related CN1997909B (zh) 2004-05-22 2005-05-23 用于控制模块化测试系统中可互换部件的方法和系统
CN200580016215A Expired - Fee Related CN100585422C (zh) 2004-05-22 2005-05-23 用于对模块化测试系统进行仿真的方法和系统
CN 200580015953 Pending CN1981202A (zh) 2004-05-22 2005-05-23 模块化测试系统中的数据日志支持
CNB2005800164373A Expired - Fee Related CN100541218C (zh) 2004-05-22 2005-05-23 开发用于半导体集成电路的测试程序的方法和结构
CN200580016355A Expired - Fee Related CN100580473C (zh) 2004-05-22 2005-05-23 支持开放架构测试系统中的校准和诊断

Family Applications After (5)

Application Number Title Priority Date Filing Date
CN2005800164369A Expired - Fee Related CN1997909B (zh) 2004-05-22 2005-05-23 用于控制模块化测试系统中可互换部件的方法和系统
CN200580016215A Expired - Fee Related CN100585422C (zh) 2004-05-22 2005-05-23 用于对模块化测试系统进行仿真的方法和系统
CN 200580015953 Pending CN1981202A (zh) 2004-05-22 2005-05-23 模块化测试系统中的数据日志支持
CNB2005800164373A Expired - Fee Related CN100541218C (zh) 2004-05-22 2005-05-23 开发用于半导体集成电路的测试程序的方法和结构
CN200580016355A Expired - Fee Related CN100580473C (zh) 2004-05-22 2005-05-23 支持开放架构测试系统中的校准和诊断

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JP (1) JP4332200B2 (de)
CN (6) CN1989417B (de)
AT (3) ATE451625T1 (de)
DE (3) DE602005018204D1 (de)

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CN102215140B (zh) * 2010-04-02 2013-03-27 英业达股份有限公司 储存局域网络的检验装置
CN102378232A (zh) * 2010-08-23 2012-03-14 财团法人资讯工业策进会 无线网络信号的测试系统及其测量方法
CN103109275B (zh) * 2010-09-07 2016-02-03 爱德万测试公司 在半导体测试环境中使用虚拟仪器的系统、方法和设备
CN101980174B (zh) * 2010-11-24 2012-07-04 中国人民解放军国防科学技术大学 一种自动测试计算机应用程序区间能耗的方法
JP2012167958A (ja) * 2011-02-10 2012-09-06 Nippon Syst Wear Kk 試験情報表示装置、方法、プログラム、および該ソフトウェアを格納したコンピュータ可読媒体
CN102608517A (zh) * 2012-02-16 2012-07-25 工业和信息化部电子第五研究所 一种创建集成电路测试程序包的快速方法
US9606183B2 (en) 2012-10-20 2017-03-28 Advantest Corporation Pseudo tester-per-site functionality on natively tester-per-pin automatic test equipment for semiconductor test
US10161993B2 (en) * 2013-02-21 2018-12-25 Advantest Corporation Tester with acceleration on memory and acceleration for automatic pattern generation within a FPGA block
JP6174898B2 (ja) * 2013-04-30 2017-08-02 ルネサスエレクトロニクス株式会社 半導体試験装置
TWI490689B (zh) * 2013-05-17 2015-07-01 英業達股份有限公司 不間斷自動更新測試命令之系統及方法
CN104298590B (zh) * 2013-07-16 2019-05-10 爱德万测试公司 用于按管脚apg的快速语义处理器
CN103413003B (zh) * 2013-08-21 2016-07-06 浪潮(北京)电子信息产业有限公司 一种序列传输、接收装置及方法
KR102147172B1 (ko) * 2014-04-09 2020-08-31 삼성전자주식회사 시스템 온 칩 및 그것의 검증 방법
US9672020B2 (en) 2014-09-19 2017-06-06 Microsoft Technology Licensing, Llc Selectively loading precompiled header(s) and/or portion(s) thereof
CN107003648B (zh) * 2014-12-17 2019-06-11 西门子公司 自动化设备的功能模块的检验方法和工程规划系统
CN107454124B (zh) * 2016-05-31 2020-11-03 创新先进技术有限公司 设备自动化方法及装置
CN106507098B (zh) * 2016-10-09 2018-10-19 珠海市魅族科技有限公司 数据处理的方法和装置
CN106603074A (zh) * 2016-11-03 2017-04-26 武汉新芯集成电路制造有限公司 一种dac电路并行测试系统及并行测试方法
CN107959981B (zh) * 2017-10-30 2020-07-10 捷开通讯(深圳)有限公司 一种通信终端和通信测试方法
CN109324956B (zh) * 2018-08-20 2021-11-05 深圳前海微众银行股份有限公司 系统测试方法、设备及计算机可读存储介质
CN109508290A (zh) * 2018-10-25 2019-03-22 深圳点猫科技有限公司 一种基于教育系统的自动化测试方法及电子设备
CN109884923A (zh) * 2019-02-21 2019-06-14 苏州天准科技股份有限公司 一种自动化设备控制模块化可配置系统
CN110954804B (zh) * 2019-12-19 2021-11-02 上海御渡半导体科技有限公司 一种批量精确诊断cBit阵列故障的装置和方法
KR20230109626A (ko) * 2020-12-03 2023-07-20 시놉시스, 인크. 하드웨어 설계 컴파일 실패에 대한 자동 순차적 재시도
CN113051114A (zh) * 2021-03-19 2021-06-29 无锡市软测认证有限公司 一种用于提高芯片测试效率的方法
CN113342649B (zh) * 2021-05-31 2023-11-14 上海创景信息科技有限公司 基于真实目标机实现单元测试的方法、介质和设备
CN113238834B (zh) * 2021-05-31 2023-08-08 北京世冠金洋科技发展有限公司 仿真模型文件的处理方法、装置及电子设备
KR102314419B1 (ko) * 2021-07-27 2021-10-19 (주) 에이블리 반도체 테스트 패턴 발생 장치 및 방법
CN113740077A (zh) * 2021-09-13 2021-12-03 广州文远知行科技有限公司 车辆底盘测试方法、装置、设备及存储介质
CN114252758A (zh) * 2021-12-03 2022-03-29 杭州至千哩科技有限公司 Ate测试通道资源配置方法、装置、设备及存储介质
CN114646867B (zh) * 2022-05-18 2022-10-28 南京宏泰半导体科技有限公司 一种集成电路并发测试装置及方法
CN115630594B (zh) * 2022-12-19 2023-03-21 杭州加速科技有限公司 一种芯片设计仿真文件到Pattern文件的转换方法及其系统
CN116257037B (zh) * 2023-05-15 2023-08-11 通达电磁能股份有限公司 控制器测试程序的生成方法、系统、电子设备及存储介质
CN116520754B (zh) * 2023-06-27 2023-09-22 厦门芯泰达集成电路有限公司 基于预加载模式的dps模块控制方法、系统

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US6208439B1 (en) * 1990-11-09 2001-03-27 Litel Instruments Generalized geometric transforms for computer generated holograms
US6779140B2 (en) * 2001-06-29 2004-08-17 Agilent Technologies, Inc. Algorithmically programmable memory tester with test sites operating in a slave mode
CN100341110C (zh) * 2002-04-11 2007-10-03 株式会社爱德万测试 避免asic/soc制造中原型保持的制造方法和设备

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Publication number Publication date
CN1981203A (zh) 2007-06-13
CN1997909A (zh) 2007-07-11
CN100541218C (zh) 2009-09-16
DE602005018204D1 (de) 2010-01-21
ATE451625T1 (de) 2009-12-15
ATE438865T1 (de) 2009-08-15
JP2009008683A (ja) 2009-01-15
CN1981200A (zh) 2007-06-13
ATE451624T1 (de) 2009-12-15
CN100585422C (zh) 2010-01-27
CN1989417A (zh) 2007-06-27
CN1997908A (zh) 2007-07-11
DE602005015848D1 (de) 2009-09-17
DE602005018205D1 (de) 2010-01-21
CN1981202A (zh) 2007-06-13
JP4332200B2 (ja) 2009-09-16
CN1997909B (zh) 2010-11-10
CN100580473C (zh) 2010-01-13

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