CN1958512A - 透光性稀土氧化物烧结体及其制造方法 - Google Patents
透光性稀土氧化物烧结体及其制造方法 Download PDFInfo
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- CN1958512A CN1958512A CNA2006101427974A CN200610142797A CN1958512A CN 1958512 A CN1958512 A CN 1958512A CN A2006101427974 A CNA2006101427974 A CN A2006101427974A CN 200610142797 A CN200610142797 A CN 200610142797A CN 1958512 A CN1958512 A CN 1958512A
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- Prior art keywords
- niobium
- tantalum
- sintered compact
- oxide
- light transmission
- Prior art date
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- 238000004519 manufacturing process Methods 0.000 title claims description 22
- 229910001404 rare earth metal oxide Inorganic materials 0.000 title claims description 6
- 239000010955 niobium Substances 0.000 claims abstract description 110
- 229910052758 niobium Inorganic materials 0.000 claims abstract description 108
- GUCVJGMIXFAOAE-UHFFFAOYSA-N niobium atom Chemical compound [Nb] GUCVJGMIXFAOAE-UHFFFAOYSA-N 0.000 claims abstract description 106
- 229910052715 tantalum Inorganic materials 0.000 claims abstract description 104
- GUVRBAGPIYLISA-UHFFFAOYSA-N tantalum atom Chemical compound [Ta] GUVRBAGPIYLISA-UHFFFAOYSA-N 0.000 claims abstract description 103
- SIWVEOZUMHYXCS-UHFFFAOYSA-N oxo(oxoyttriooxy)yttrium Chemical compound O=[Y]O[Y]=O SIWVEOZUMHYXCS-UHFFFAOYSA-N 0.000 claims abstract description 58
- 238000005245 sintering Methods 0.000 claims description 71
- 229910052751 metal Inorganic materials 0.000 claims description 65
- 239000002184 metal Substances 0.000 claims description 65
- OHSVLFRHMCKCQY-UHFFFAOYSA-N lutetium atom Chemical compound [Lu] OHSVLFRHMCKCQY-UHFFFAOYSA-N 0.000 claims description 62
- 230000005540 biological transmission Effects 0.000 claims description 60
- UZLYXNNZYFBAQO-UHFFFAOYSA-N oxygen(2-);ytterbium(3+) Chemical compound [O-2].[O-2].[O-2].[Yb+3].[Yb+3] UZLYXNNZYFBAQO-UHFFFAOYSA-N 0.000 claims description 55
- 229910003454 ytterbium oxide Inorganic materials 0.000 claims description 55
- 229940075624 ytterbium oxide Drugs 0.000 claims description 55
- 239000000843 powder Substances 0.000 claims description 49
- 238000000034 method Methods 0.000 claims description 40
- RUDFQVOCFDJEEF-UHFFFAOYSA-N yttrium(III) oxide Inorganic materials [O-2].[O-2].[O-2].[Y+3].[Y+3] RUDFQVOCFDJEEF-UHFFFAOYSA-N 0.000 claims description 33
- 150000002822 niobium compounds Chemical class 0.000 claims description 21
- 150000003482 tantalum compounds Chemical class 0.000 claims description 21
- 239000001257 hydrogen Substances 0.000 claims description 18
- 229910052739 hydrogen Inorganic materials 0.000 claims description 18
- 239000007789 gas Substances 0.000 claims description 16
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 claims description 15
- 239000000463 material Substances 0.000 claims description 13
- 238000000465 moulding Methods 0.000 claims description 11
- 238000005304 joining Methods 0.000 claims description 5
- 238000002156 mixing Methods 0.000 claims description 3
- 239000011261 inert gas Substances 0.000 claims 2
- 229910052782 aluminium Inorganic materials 0.000 abstract description 38
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 abstract description 36
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 abstract description 29
- 229910052710 silicon Inorganic materials 0.000 abstract description 29
- 239000010703 silicon Substances 0.000 abstract description 29
- 239000002994 raw material Substances 0.000 abstract description 18
- 238000002834 transmittance Methods 0.000 abstract description 14
- 238000010298 pulverizing process Methods 0.000 abstract 1
- 239000004411 aluminium Substances 0.000 description 24
- 239000000654 additive Substances 0.000 description 16
- 230000000996 additive effect Effects 0.000 description 16
- 239000013078 crystal Substances 0.000 description 14
- 239000011148 porous material Substances 0.000 description 9
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 description 8
- 239000001307 helium Substances 0.000 description 8
- 229910052734 helium Inorganic materials 0.000 description 8
- SWQJXJOGLNCZEY-UHFFFAOYSA-N helium atom Chemical compound [He] SWQJXJOGLNCZEY-UHFFFAOYSA-N 0.000 description 8
- 229920001296 polysiloxane Polymers 0.000 description 8
- 238000009792 diffusion process Methods 0.000 description 6
- 230000000694 effects Effects 0.000 description 6
- 238000005259 measurement Methods 0.000 description 6
- 230000007547 defect Effects 0.000 description 5
- 238000009616 inductively coupled plasma Methods 0.000 description 5
- 150000002500 ions Chemical class 0.000 description 5
- 229910052727 yttrium Inorganic materials 0.000 description 5
- VWQVUPCCIRVNHF-UHFFFAOYSA-N yttrium atom Chemical compound [Y] VWQVUPCCIRVNHF-UHFFFAOYSA-N 0.000 description 5
- 229910052765 Lutetium Inorganic materials 0.000 description 4
- 229910052769 Ytterbium Inorganic materials 0.000 description 4
- NIXOWILDQLNWCW-UHFFFAOYSA-N acrylic acid group Chemical group C(C=C)(=O)O NIXOWILDQLNWCW-UHFFFAOYSA-N 0.000 description 4
- 239000000853 adhesive Substances 0.000 description 4
- 230000001070 adhesive effect Effects 0.000 description 4
- 238000000227 grinding Methods 0.000 description 4
- 229910000484 niobium oxide Inorganic materials 0.000 description 4
- URLJKFSTXLNXLG-UHFFFAOYSA-N niobium(5+);oxygen(2-) Chemical class [O-2].[O-2].[O-2].[O-2].[O-2].[Nb+5].[Nb+5] URLJKFSTXLNXLG-UHFFFAOYSA-N 0.000 description 4
- 230000003287 optical effect Effects 0.000 description 4
- RVTZCBVAJQQJTK-UHFFFAOYSA-N oxygen(2-);zirconium(4+) Chemical compound [O-2].[O-2].[Zr+4] RVTZCBVAJQQJTK-UHFFFAOYSA-N 0.000 description 4
- 238000002798 spectrophotometry method Methods 0.000 description 4
- NAWDYIZEMPQZHO-UHFFFAOYSA-N ytterbium Chemical compound [Yb] NAWDYIZEMPQZHO-UHFFFAOYSA-N 0.000 description 4
- 229910001928 zirconium oxide Inorganic materials 0.000 description 4
- 230000015572 biosynthetic process Effects 0.000 description 3
- 230000000052 comparative effect Effects 0.000 description 3
- 230000003111 delayed effect Effects 0.000 description 3
- 238000000280 densification Methods 0.000 description 3
- 238000004993 emission spectroscopy Methods 0.000 description 3
- 150000002431 hydrogen Chemical class 0.000 description 3
- BPUBBGLMJRNUCC-UHFFFAOYSA-N oxygen(2-);tantalum(5+) Chemical compound [O-2].[O-2].[O-2].[O-2].[O-2].[Ta+5].[Ta+5] BPUBBGLMJRNUCC-UHFFFAOYSA-N 0.000 description 3
- 239000002245 particle Substances 0.000 description 3
- 230000000452 restraining effect Effects 0.000 description 3
- 229910001936 tantalum oxide Inorganic materials 0.000 description 3
- OYPRJOBELJOOCE-UHFFFAOYSA-N Calcium Chemical compound [Ca] OYPRJOBELJOOCE-UHFFFAOYSA-N 0.000 description 2
- 229910052791 calcium Inorganic materials 0.000 description 2
- 239000011575 calcium Substances 0.000 description 2
- BRPQOXSCLDDYGP-UHFFFAOYSA-N calcium oxide Chemical compound [O-2].[Ca+2] BRPQOXSCLDDYGP-UHFFFAOYSA-N 0.000 description 2
- ODINCKMPIJJUCX-UHFFFAOYSA-N calcium oxide Inorganic materials [Ca]=O ODINCKMPIJJUCX-UHFFFAOYSA-N 0.000 description 2
- 239000000292 calcium oxide Substances 0.000 description 2
- 230000006866 deterioration Effects 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 238000011156 evaluation Methods 0.000 description 2
- 239000003595 mist Substances 0.000 description 2
- 238000002360 preparation method Methods 0.000 description 2
- 239000011164 primary particle Substances 0.000 description 2
- 239000002002 slurry Substances 0.000 description 2
- 238000001149 thermolysis Methods 0.000 description 2
- 229910002651 NO3 Inorganic materials 0.000 description 1
- NHNBFGGVMKEFGY-UHFFFAOYSA-N Nitrate Chemical compound [O-][N+]([O-])=O NHNBFGGVMKEFGY-UHFFFAOYSA-N 0.000 description 1
- NYEODMYOBSNUDJ-UHFFFAOYSA-N S(O)(O)(=O)=O.[Lu] Chemical compound S(O)(O)(=O)=O.[Lu] NYEODMYOBSNUDJ-UHFFFAOYSA-N 0.000 description 1
- 206010040925 Skin striae Diseases 0.000 description 1
- MCMNRKCIXSYSNV-UHFFFAOYSA-N Zirconium dioxide Chemical compound O=[Zr]=O MCMNRKCIXSYSNV-UHFFFAOYSA-N 0.000 description 1
- 229910052784 alkaline earth metal Inorganic materials 0.000 description 1
- 150000001342 alkaline earth metals Chemical class 0.000 description 1
- 239000007864 aqueous solution Substances 0.000 description 1
- 238000004939 coking Methods 0.000 description 1
- 150000001875 compounds Chemical class 0.000 description 1
- 238000004320 controlled atmosphere Methods 0.000 description 1
- 230000007797 corrosion Effects 0.000 description 1
- 238000005260 corrosion Methods 0.000 description 1
- 230000007812 deficiency Effects 0.000 description 1
- 238000001704 evaporation Methods 0.000 description 1
- 230000008020 evaporation Effects 0.000 description 1
- 239000012535 impurity Substances 0.000 description 1
- QVVDHJQBGNVGEB-UHFFFAOYSA-K lutetium(3+);trihydroxide Chemical compound [OH-].[OH-].[OH-].[Lu+3] QVVDHJQBGNVGEB-UHFFFAOYSA-K 0.000 description 1
- YQAQUOLVUCJCHH-UHFFFAOYSA-N lutetium;oxalic acid Chemical compound [Lu].OC(=O)C(O)=O YQAQUOLVUCJCHH-UHFFFAOYSA-N 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 238000006386 neutralization reaction Methods 0.000 description 1
- OWYGZENDPUIOCD-UHFFFAOYSA-N niobium(5+) oxygen(2-) tantalum(5+) Chemical class [O-2].[Ta+5].[O-2].[Nb+5] OWYGZENDPUIOCD-UHFFFAOYSA-N 0.000 description 1
- VUWVDWMFBFJOCE-UHFFFAOYSA-N niobium(5+);oxygen(2-);tantalum(5+) Chemical compound [O-2].[O-2].[O-2].[O-2].[O-2].[Nb+5].[Ta+5] VUWVDWMFBFJOCE-UHFFFAOYSA-N 0.000 description 1
- FLJKBWKLGAYSFH-UHFFFAOYSA-H oxalate;ytterbium(3+) Chemical compound [Yb+3].[Yb+3].[O-]C(=O)C([O-])=O.[O-]C(=O)C([O-])=O.[O-]C(=O)C([O-])=O FLJKBWKLGAYSFH-UHFFFAOYSA-H 0.000 description 1
- IBSDADOZMZEYKD-UHFFFAOYSA-H oxalate;yttrium(3+) Chemical compound [Y+3].[Y+3].[O-]C(=O)C([O-])=O.[O-]C(=O)C([O-])=O.[O-]C(=O)C([O-])=O IBSDADOZMZEYKD-UHFFFAOYSA-H 0.000 description 1
- 230000003647 oxidation Effects 0.000 description 1
- 238000007254 oxidation reaction Methods 0.000 description 1
- 230000001737 promoting effect Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 230000000007 visual effect Effects 0.000 description 1
- SJHMKWQYVBZNLZ-UHFFFAOYSA-K ytterbium(3+);trihydroxide Chemical compound [OH-].[OH-].[OH-].[Yb+3] SJHMKWQYVBZNLZ-UHFFFAOYSA-K 0.000 description 1
- KUBYTSCYMRPPAG-UHFFFAOYSA-N ytterbium(3+);trinitrate Chemical compound [Yb+3].[O-][N+]([O-])=O.[O-][N+]([O-])=O.[O-][N+]([O-])=O KUBYTSCYMRPPAG-UHFFFAOYSA-N 0.000 description 1
- KVCOOBXEBNBTGL-UHFFFAOYSA-H ytterbium(3+);trisulfate Chemical compound [Yb+3].[Yb+3].[O-]S([O-])(=O)=O.[O-]S([O-])(=O)=O.[O-]S([O-])(=O)=O KVCOOBXEBNBTGL-UHFFFAOYSA-H 0.000 description 1
- 229910000347 yttrium sulfate Inorganic materials 0.000 description 1
- DEXZEPDUSNRVTN-UHFFFAOYSA-K yttrium(3+);trihydroxide Chemical compound [OH-].[OH-].[OH-].[Y+3] DEXZEPDUSNRVTN-UHFFFAOYSA-K 0.000 description 1
- BXJPTTGFESFXJU-UHFFFAOYSA-N yttrium(3+);trinitrate Chemical compound [Y+3].[O-][N+]([O-])=O.[O-][N+]([O-])=O.[O-][N+]([O-])=O BXJPTTGFESFXJU-UHFFFAOYSA-N 0.000 description 1
- RTAYJOCWVUTQHB-UHFFFAOYSA-H yttrium(3+);trisulfate Chemical compound [Y+3].[Y+3].[O-]S([O-])(=O)=O.[O-]S([O-])(=O)=O.[O-]S([O-])(=O)=O RTAYJOCWVUTQHB-UHFFFAOYSA-H 0.000 description 1
- 150000003755 zirconium compounds Chemical class 0.000 description 1
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Abstract
Description
实施方案 | |||||||||
编号 | 1-1 | 1-2 | 1-3 | 1-4 | 1-5 | 1-6 | 1-7 | 1-8 | |
添加剂 | 氧化钽 | ||||||||
添加剂的量(以金属计)(wt%) | 0.1 | 0.2 | 0.5 | 1.0 | 1.5 | 1.7 | 1.0 | 1.0 | |
烧结温度(℃) | 1800 | 1800 | 1800 | 1800 | 1800 | 1700 | 1700 | 1770 | |
烧结气氛 | 真空(小于1×10-4Pa) | 真空(小于1×10-4Pa) | 真空(小于1×10-4Pa) | 真空(小于1×10-4Pa) | 真空(小于1×10-4Pa) | 真空(小于1×10-4Pa) | 真空(小于1×10-4Pa) | 氢 | |
直线透过率(%) | 600nm | 63 | 81 | 82 | 82 | 80 | 71 | 62 | 81 |
评价 | g | e | e | e | e | g | g | e | |
钽浓度(wt%) | 0.1 | 0.2 | 0.4 | 0.9 | 1.3 | 1.3 | 0.9 | 0.8 | |
铌浓度(wt%) | - | - | - | - | - | - | - | - | |
铝浓度 | >1ppm | >1ppm | >1ppm | >1ppm | >1ppm | >1ppm | >1ppm | >1ppm | |
硅浓度 | 14ppm | 14ppm | 15ppm | 13ppm | 15ppm | 16ppm | 14ppm | 13ppm |
实施方案 | 对比例 | ||||||||||
编号 | 1-9 | 1-10 | 1-11 | 1-12 | 1-13 | 1-14 | 1-15 | 1-16 | 1-1 | 1-2 | |
添加剂 | 氧化铌 | 无 | |||||||||
添加剂的量(以金属计)(wt%) | 0.05 | 0.1 | 0.3 | 0.5 | 0.7 | 1.0 | 0.5 | 0.5 | - | - | |
烧结温度(℃) | 1800 | 1800 | 1800 | 1800 | 1800 | 1800 | 1700 | 1700 | 1900 | 1770 | |
烧结气氛 | 真空(小于1×10-4Pa) | 真空(小于1×10-4Pa) | 真空(小于1×10-4Pa) | 真空(小于1×10-4Pa) | 真空(小于1×10-4Pa) | 真空(小于1×10-4Pa) | 真空(小于1×10-4Pa) | 氢 | 真空(小于1×10-4Pa) | 真空(小于1×10-4Pa) | |
直线透过率(%) | 600nm | 63 | 80 | 82 | 82 | 80 | 62 | 64 | 81 | 46 | 31 |
评价 | g | e | e | e | e | g | g | e | b | b | |
钽浓度(wt%) | - | - | - | - | - | - | - | - | - | - | |
铌浓度(wt%) | 0.05 | 0.1 | 0.3 | 0.4 | 0.5 | 0.8 | 0.4 | 0.3 | - | - | |
铝浓度 | >1ppm | >1ppm | >1ppm | >1ppm | >1ppm | >1ppm | >1ppm | >1ppm | >1ppm | >1ppm | |
硅浓度 | 13ppm | 14ppm | 12ppm | 14ppm | 15ppm | 13ppm | 17ppm | 11ppm | 8ppm | 15ppm |
实施方案 | |||||||||
编号 | a | b | c | d | e | f | g | h | i |
添加剂 | 氧化钽 | ||||||||
氧化钇粉末的比表面积(m2/g) | 5.4 | 46 | 4.3 | ||||||
添加剂的量(以金属计)(wt%) | 0.3 | 1.5 | 0.3 | 1.5 | 1.0 | 1.0 | 0.3 | 1.5 | 1.5 |
最高烧结温度(℃) | 1950 | 1950 | 1750 | 1750 | 1800 | 1800 | 1900 | 1900 | 1900 |
保持最高烧结温度的小时数 | 3 | 32 | 10 | 66 | 40 | 48 | 5 | 36 | 5 |
烧结气氛 | 真空(小于10-4Pa) | 真空(小于10-4Pa) | 真空(小于10-4Pa) | 真空(小于10-4Pa) | 氢 | 氦 | 真空(小于10-4Pa) | 真空(小于10-4Pa) | 真空(小于10-4Pa) |
直线透过性 | e | e | g | g | e | g | e | e | e |
是否存在条纹 | 否 | 否 | 否 | 否 | 否 | 否 | 否 | 否 | 是 |
钽浓度(wt%) | 0.1 | 0.3 | 0.3 | 0.3 | 0.1 | 0.2 | 0.1 | 0.3 | 0.4 |
实施方案 | |||||||||
编号 | j | k | l | m | n | o | p | q | r |
添加剂 | 氧化铌 | ||||||||
氧化钇粉末的比表面积(m2/g) | 5.4 | 46 | 4.3 | ||||||
添加剂的量(以金属计)(wt%) | 0.1 | 1.0 | 0.1 | 1.0 | 0.5 | 0.5 | 0.1 | 1.0 | 1.0 |
最高烧结温度(℃) | 1950 | 1950 | 1750 | 1750 | 1800 | 1800 | 1900 | 1900 | 1900 |
保持最高烧结温度的小时数 | 3 | 30 | 5 | 48 | 40 | 41 | 5 | 32 | 24 |
烧结气氛 | 真空(小于10-4Pa) | 真空(小于10-4Pa) | 真空(小于10-4Pa) | 真空(小于10-4Pa) | 氢 | 氦 | 真空(小于10-4Pa) | 真空(小于10-4Pa) | 真空(小于10-4Pa) |
直线透过性 | e | e | g | g | e | g | e | e | e |
是否存在条纹 | 否 | 否 | 否 | 否 | 否 | 否 | 否 | 否 | 是 |
铌浓度(wt%) | 0.06 | 0.20 | 0.08 | 0.20 | 0.20 | 0.20 | 0.05 | 0.20 | 0.30 |
对比实施方案 | ||||||||
编号 | s | t | u | v | w | x | y | z |
添加剂 | 氧化钽 | 铌 | ||||||
氧化钇粉末的比表面积(m2/g) | 4.3 | 5.4 | 4.3 | 5.4 | ||||
添加剂的量(以金属计)(wt%) | 0.30 | 0.15 | 1.50 | 1.00 | 0.10 | 0.08 | 1.00 | 0.50 |
最高烧结温度(℃) | 1950 | 1950 | 2050 | 1650 | 1950 | 1750 | 2050 | 1650 |
保持最高烧结温度的小时数 | 3 | 2 | 1 | 30 | 3 | 3 | 1 | 30 |
烧结气氛 | 真空(小于10-4Pa) | 真空(小于10-4Pa) | 真空(小于10-4Pa) | 真空(小于10-4Pa) | 真空(小于10-4Pa) | 真空(小于10-4Pa) | 真空(小于10-4Pa) | 真空(小于10-4Pa) |
直线透过性 | b | b | b | b | b | b | b | b |
是否存在条纹 | - | - | - | - | - | - | - | - |
钽浓度(wt%) | 0.08 | 0.08 | 0.07 | 0.9 | - | - | - | - |
铌浓度(wt%) | - | - | - | - | 0.03 | 0.03 | 0.04 | 0.40 |
实施方案 | |||||||||
编号 | 2-1 | 2-2 | 2-3 | 2-4 | 2-5 | 2-6 | 2-7 | 2-8 | |
添加剂 | 氧化钽 | ||||||||
添加剂的量(以金属计)(wt%) | 0.1 | 0.2 | 0.4 | 0.6 | 0.6 | 0.8 | 0.9 | 0.6 | |
烧结温度(℃) | 1900 | 1900 | 1900 | 1900 | 1750 | 1900 | 1900 | 1800 | |
烧结气氛 | 真空(小于1×10-4Pa) | 真空(小于1×10-4Pa) | 真空(小于1×10-4Pa) | 真空(小于1×10-4Pa) | 真空(小于1×10-4Pa) | 真空(小于1×10-4Pa) | 真空(小于1×10-4Pa) | 氢 | |
直线透过率(%) | 600nm | 62 | 78 | 79 | 80 | 78 | 79 | 64 | 79 |
评价 | g | e | e | e | e | e | g | e | |
钽浓度 | 0.1wt% | 0.2wt% | 0.4wt% | 0.5wt% | 0.6wt% | 0.7wt% | 0.8wt% | 0.4wt% | |
铌浓度 | <10ppm | <10ppm | <10ppm | <10ppm | <10ppm | <10ppm | <10ppm | <10ppm | |
铝浓度 | <1ppm | <1ppm | <1ppm | <1ppm | <1ppm | <1ppm | <1ppm | <1ppm | |
硅浓度 | 13ppm | 14ppm | 13ppm | 13ppm | 16ppm | 14ppm | 14ppm | 12ppm |
实施方案 | |||||||||
编号 | 2-9 | 2-10 | 2-11 | 2-12 | 2-13 | 2-14 | 2-15 | 2-16 | |
添加剂 | 氧化铌 | ||||||||
添加剂的量(以金属计)(wt%) | 0.1 | 0.2 | 0.4 | 0.4 | 0.6 | 0.8 | 0.9 | 0.4 | |
烧结温度(℃) | 1900 | 1900 | 1900 | 1750 | 1900 | 1900 | 1900 | 1800 | |
烧结气氛 | 真空(小于1×10-4Pa) | 真空(小于1×10-4Pa) | 真空(小于1×10-4Pa) | 真空(小于1×10-4Pa) | 真空(小于1×10-4Pa) | 真空(小于1×10-4Pa) | 真空(小于1×10-4Pa) | 氢 | |
直线透过率(%) | 600nm | 64 | 78 | 80 | 78 | 79 | 78 | 61 | 78 |
评价 | g | e | e | e | e | e | g | e | |
钽浓度 | <10ppm | <10ppm | <10ppm | <10ppm | <10ppm | <10ppm | <10ppm | <10ppm | |
铌浓度 | 0.1wt% | 0.2wt% | 0.4wt% | 0.4wt% | 0.6wt% | 0.7wt% | 0.8wt% | 0.3wt% | |
铝浓度 | <1ppm | <1ppm | <1ppm | <1ppm | <1ppm | <1ppm | <1ppm | <1ppm | |
硅浓度 | 13ppm | 13ppm | 13ppm | 17ppm | 12ppm | 13ppm | 14ppm | 11ppm |
对比例 | |||||
编号 | 2-1 | 2-2 | 2-3 | 2-4 | |
添加剂 | 无 | 氧化钽 | 氧化铌 | ||
添加剂的量(以金属计)(wt%) | - | - | 0.6wt% | 0.4wt% | |
烧结温度(℃) | 1900 | 1800 | 1730 | 1730 | |
烧结气氛 | 真空(小于1×10-4Pa) | 氢 | 真空(小于1×10-4Pa) | 真空(小于1×10-4Pa) | |
直线透过率(%) | 600nm | 26 | 22 | 54 | 52 |
评价 | b | b | b | b | |
钽浓度 | <10ppm | <10ppm | 0.6wt% | <10ppm | |
铌浓度 | <10ppm | <10ppm | <10ppm | 0.4wt% | |
铝浓度 | <1ppm | <1ppm | <1ppm | <1ppm | |
硅浓度 | 13ppm | 12ppm | 16ppm | 15ppm |
实施方案 | ||||||||
编号 | 3-1 | 3-2 | 3-3 | 3-4 | 3-5 | 3-6 | 3-7 | |
Nb(铌)的量(以金属计)(wt%) | 0.007 | 0.200 | 0.500 | 0.750 | 0.200 | 0.200 | 0.200 | |
烧结温度(℃) | 1850 | 1850 | 1850 | 1850 | 1850 | 1750 | 1850 | |
烧结气氛 | 真空(小于1×10-4Pa) | 真空(小于1×10-4Pa) | 真空(小于1×10-4Pa) | 真空(小于1×10-4Pa) | 氢 | 真空(小于1×10-4Pa) | 真空(小于1×10-4Pa) | |
直线透过率(%) | 700nm | 65.6 | 81.0 | 80.5 | 70.3 | 80.0 | 77.2 | 71.2 |
评价 | g | e | e | g | e | g | g | |
铌浓度 | 0.007wt% | 0.190wt% | 0.480wt% | 0.720wt% | 0.180wt% | 0.190wt% | 0.200wt% | |
铝浓度 | <1ppm | <1ppm | <1ppm | <1ppm | <1ppm | <1ppm | <1ppm | |
硅浓度 | 16ppm | 17ppm | 15ppm | 18ppm | 14ppm | 17ppm | 40ppm |
对比例 | |||||
编号 | 3-1 | 3-2 | 3-3 | 3-4 | |
Nb的量(以金属计)(wt%) | 0.000 | 0.005 | 1.000 | 0.200 | |
烧结温度(℃) | 1900 | 1850 | 1850 | 1650 | |
烧结气氛 | 真空(小于1×10-4Pa) | 真空(小于1×10-4Pa) | 真空(小于1×10-4Pa) | 真空(小于1×10-4Pa) | |
直线透过率(%) | 700nm | 26.2 | 45.0 | 57.0 | 34.0 |
评价 | b | b | b | b | |
铌浓度 | <10ppm | 0.004wt% | 0.950wt% | 0.200wt% | |
铝浓度 | <1ppm | <1ppm | <1ppm | <1ppm | |
硅浓度 | 12ppm | 18ppm | 17ppm | 18ppm |
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US10622194B2 (en) | 2007-04-27 | 2020-04-14 | Applied Materials, Inc. | Bulk sintered solid solution ceramic which exhibits fracture toughness and halogen plasma resistance |
US10242888B2 (en) | 2007-04-27 | 2019-03-26 | Applied Materials, Inc. | Semiconductor processing apparatus with a ceramic-comprising surface which exhibits fracture toughness and halogen plasma resistance |
US8367227B2 (en) * | 2007-08-02 | 2013-02-05 | Applied Materials, Inc. | Plasma-resistant ceramics with controlled electrical resistivity |
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US4466930A (en) * | 1982-06-18 | 1984-08-21 | General Electric Company | Preparation of yttria-gadolinia ceramic scintillators by vacuum hot pressing |
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US6093347A (en) * | 1997-05-19 | 2000-07-25 | General Electric Company | Rare earth X-ray scintillator compositions |
US6268303B1 (en) * | 1998-07-06 | 2001-07-31 | Corning Incorporated | Tantalum containing glasses and glass ceramics |
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