CN1797006A - Probe component of detecting device for plane display board detection - Google Patents

Probe component of detecting device for plane display board detection Download PDF

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Publication number
CN1797006A
CN1797006A CN 200510051114 CN200510051114A CN1797006A CN 1797006 A CN1797006 A CN 1797006A CN 200510051114 CN200510051114 CN 200510051114 CN 200510051114 A CN200510051114 A CN 200510051114A CN 1797006 A CN1797006 A CN 1797006A
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CN
China
Prior art keywords
probe
guide member
probe assembly
assembly according
fixed
Prior art date
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Granted
Application number
CN 200510051114
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Chinese (zh)
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CN100439924C (en
Inventor
金五范
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DE&T Co Ltd
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DE&T Co Ltd
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Publication of CN1797006A publication Critical patent/CN1797006A/en
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Publication of CN100439924C publication Critical patent/CN100439924C/en
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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Abstract

A needle assembly of a probe unit for examination of flat display panels in which a needle can be easily replaced is disclosed. The needle assembly, installed on a probe block, for transmitting an electric signal between a printed circuit board and pixel electrodes of a flat display panel for the purpose of examination of the flat display panel. The needle assembly includes a needle guide having slits that are opened downwardly and installed on the end of the probe block, and in which a plurality of needles is inserted and fixed, and needle cover blocks pivotally hinged to the probe block, and inserted into the needle guide to support the fixed needles at the lower side of the probe block. The needle cover blocks include needle cover holders pivotally hinged to the probe block, and needle covers pivotally hinged to the needle cover holders and contacting the lower sides of the needles and supporting the needles.

Description

The probe assembly that is used for the sniffer of detection plane display screen
Technical field
The present invention relates to a kind of probe assembly that is used for the sniffer of detection plane display screen, particularly a kind of probe assembly that is used for the sniffer of detection plane display screen, its middle probe can easily be changed.
Background technology
LCDs (LCD), plasma panel (PDP) etc. can be used as flat-faced screen.This flat-faced screen comprises: a plurality of connecting terminals, this connecting terminal are near the edge setting of flat-faced screen, and drive this flat-faced screen.This flat-faced screen applies electric signal by connecting terminal to the pixel of this flat-faced screen.Be similar to semi-conductor chip, before being installed to this flat-faced screen in the product, need detect to determine in this flat-faced screen, whether having underproof pixel this flat-faced screen.
Whether be used to detect and exist the pick-up unit of defective pixel to comprise: detecting device is equipped with the various devices that are used for the detection plane display screen therein; And sniffer, be used for detecting device is electrically connected with flat-faced screen.Especially, sniffer is directly connected to connecting terminal, so that this connecting terminal is applied electric signal, and detects the output of connecting terminal.
Korean Patent discloses and has disclosed a kind of common sniffer among the 1998-32242.Fig. 7 is the stereographic map of this common probe assembly, and Fig. 8 is the sectional view of the line A-A ' intercepting in Fig. 7.
Common probe assembly 100 comprises a plurality of probes 114, and each probe 114 includes body 130, first acupuncture 132 of extending forward from the front end of body 130 respectively, and second acupuncture 134 that extends back from the rear end of body 130.Probe 114 is arranged on the downside of piece 112, so that the Width of each body 130 is as vertical direction, and body 130 is relative in parallel with each other with the spacing of rule at the thickness direction of probe 114.
Common probe assembly 100 is assembled in the following order.Notch bar 118 is installed on the piece 112, each end of probe 114 is inserted into otch 140, simultaneously, second probe 134 penetrates in the hole 142 of guide member 120, guide bar 116 penetrates in the guide hole 136 of probe 114, and pilot pin 146 penetrates side cover 122 and piece 112, simultaneously, the end of guide rod 116 penetrates in the side cover 122, and side cover 122 is connected with piece 112 by screw 148.Like this, side cover 122 and piece 112 are supporting probe 114 and guide rod 116.
Therefore yet the downside of the probe in the common probe assembly exposes, and the probe in the common probe assembly is owing to contact with flat-faced screen or because exterior vibration and damaging easily, so often replacing of probe.In addition, in order to change probe, guide rod 116 must be unscrewed and side cover 122 could be removed from hole 136 after taking away at screw 148.This process just can be finished like this.In addition, because in a single day guide rod 116 shift out, the probe of arranging by guide rod 116 may turmoil, and the replacing of probe is also very inconvenient, and the operability of replacing also decreases.
Summary of the invention
Therefore, in view of the above problems and/or other problems and proposed the present invention, the object of the present invention is to provide a kind of probe assembly that is used for the detection plane display screen, easily to change the probe that is installed in the sniffer.
Another object of the present invention is to provide a kind of probe assembly that is used for the detection plane display screen, be used to avoid probe to contact and damage owing to vibrations or with flat-faced screen.
According to the present invention, above-mentioned and other purpose can by be installed to survey on the piece, be used between the pixel electrode of printed circuit board (PCB) and flat-faced screen, transmitting electric signal and realize with the probe assembly of the sniffer that is used for the detection plane display screen, this probe assembly comprises: the probe guide member, this probe guide member has a plurality of under shed and be installed to the otch of the end of surveying piece, and installs and be fixed with a plurality of probes in otch; And a pair of probe raggle block, it pivotally is hinged to surveys on the piece, and is inserted in the probe guide member, to support this fixing probe at the downside of surveying piece.
Preferably, this comprises the probe raggle block: a pair of probe cage, and it pivotally is hinged to surveys on the piece; And a pair of probe lid, its pivot knuckles is to the probe cage, and the downside of contact probe and supporting probe.
The probe guide member is fixed so that probe can be with respect to flat-faced screen with an angle tilt.
And this probe guide member comprises in the middle the groove that forms, thereby towards an end of the probe guide member of printed circuit board (PCB), and outstanding to present band shape towards the other end of the probe guide member of flat-faced screen.
Description of drawings
Objects and advantages of the present invention are will be more in to the detailed description of embodiment below in conjunction with accompanying drawing apparent and understand easily, wherein:
Fig. 1 is the side view of probe assembly according to a preferred embodiment of the invention;
Fig. 2 a is the stereographic map of probe assembly according to a preferred embodiment of the invention;
Fig. 2 b is the side view of probe assembly according to a preferred embodiment of the invention;
Fig. 3 is the partial enlarged drawing of probe assembly shown in Fig. 2 b;
Fig. 4 is mounted in the partial perspective view of the dark needle guide spare in according to a preferred embodiment of the invention the probe assembly;
The stereographic map that Fig. 5 a takes apart for according to a preferred embodiment of the invention probe assembly and probe raggle block;
Fig. 5 b is the side view of the probe raggle block shown in Fig. 5 a;
Fig. 6 shows the probe that is installed to probe assembly according to the preferred embodiment of the invention
Embodiment;
Fig. 7 is the stereographic map of common probe assembly; And
Fig. 8 is the sectional view of A-A ' the line intercepting in Fig. 7.
Embodiment
Be elaborated hereinafter with reference to the probe assembly of accompanying drawing to according to a preferred embodiment of the invention sniffer.To according to a preferred embodiment of the invention description will be that example is carried out with the probe assembly of sniffer, but the present invention is not limited thereto.
Fig. 1 is the side view of probe assembly according to a preferred embodiment of the invention.As shown in the figure, detecting head 2 is installed in to be surveyed in the framework 1, and probe assembly 10 is arranged by setting tool 3 and is fixed on the detecting head 2.
Fig. 2 a is the stereographic map of probe assembly according to a preferred embodiment of the invention; Fig. 2 b is the side view of probe assembly according to a preferred embodiment of the invention; And Fig. 3 is the partial enlarged drawing of the probe assembly shown in Fig. 2 b.Probe assembly 10 comprises according to the preferred embodiment of the invention: survey piece 11; Probe guide member 13, it is installed in the end of surveying piece 11 and is fixed with a plurality of probes 12; And a pair of probe raggle block 14, it is inserted in the probe guide member 13, and supports temporary fixed probe 12 safely.The dashed area of the detection piece 11 shown in Fig. 2 b and Fig. 3 represents to survey the partial cross section of piece 11.
Shown in Fig. 2 b, probe guide member 13 is installed in to be surveyed in the piece 11, thus probe 12 with respect to flat-faced screen with an angle tilt fix, thereby the end contact plane display screen of the probe 12 of the pixel electrode of contact plane display screen only.
Fig. 4 is the partial perspective view of probe assembly 10, wherein a plurality of probes 12 are fixed on the probe guide member 13 provisionally, and as shown in the figure, probe guide member 13 is installed in the end of surveying piece 11, and have a plurality of otch S that open downwards, thereby can in this otch, insert and fixing a plurality of probes 12.This probe guide member 13 has the groove that forms in the middle, thereby, and be formed with a plurality of otch S in this two outstanding end towards an end of the probe guide member 13 of printed circuit board (PCB) 15 and outstanding presenting band shape towards the other end of the probe guide member 13 of flat-faced screen.Like this, probe 12 is fixed on otch S provisionally, thereby only its two ends are inserted among the otch S of probe guide member 13.
On the other hand, surveying piece 11 comprises: guide member fixed part 13a is used for fixing probe guide member 13.Guide member fixed part 13a is connected to by the setting tool such as the bolt (not shown) and surveys on the piece 11, and can survey piece 11 dismountings from this, therefore, if desired, guide member fixed part 13a can separate from surveying piece 11, thereby probe guide member 13 is dismantled from surveying piece 11.
Probe raggle block 14 pivotally is hinged to be surveyed on the piece 11, and is provided with in the both sides of probe assembly 10.This comprises probe raggle block 14: a pair of probe cage 14a, and it pivotally is hinged on the specified point A that surveys piece 11, and a pair of probe lid 14b, and it pivotally is hinged on the specified point B of probe cage 14a, and contact and supporting probe 12.This probe cage 14a is fixed to by the first fixture A ' and surveys on the piece 11, and probe lid 14b is fixed on the probe cage 14a by the second fixture B ', thus probe cage piece 14 with survey piece 11 and integrally be connected, with support with center on a plurality of probes 12.
Fig. 2 a and 2b show probe raggle block 14 and are connected to and survey on the piece 11 and cover probe 12.On the contrary, Fig. 5 a and 5b show probe raggle block 14 owing to the dismounting of the first and second fixture A ' and B ' is dismantled.Like this, if desired, thereby probe raggle block 14 detachably can easily be changed probe 12.
Fig. 6 shows the probe 12 on the probe assembly 10 of being installed to according to a preferred embodiment of the invention.This probe 12 comprises: contact jaw is used for the pixel electrode of contact plane display screen; And link, be used to contact the connecting terminal that is connected on the printed circuit board (PCB).This link and contact jaw have projection outstanding from the probe guide member and that extend respectively.Like this, link and contact jaw accurately the solder joint (pad) of contact plane display screen and printed circuit board (PCB) be electrically connected realizing.
As mentioned above, according to the present invention, can make things convenient for and easily change probe in the probe assembly from be installed in sniffer.This probe lid is installed in the lower end of probe and damages to prevent that probe from contacting owing to vibrations or with flat-faced screen.
The above is the preferred embodiments of the present invention only, is not limited to the present invention, and for a person skilled in the art, the present invention can have various changes and variation.Within the spirit and principles in the present invention all, any modification of being done, be equal to replacement, improvement etc., all should be included within protection scope of the present invention.

Claims (9)

1. the probe assembly of a sniffer, described probe assembly are installed to be surveyed on the piece, is used for transmitting electric signal between the pixel electrode of printed circuit board (PCB) and flat-faced screen, and is used for the detection plane display screen, and described probe assembly comprises:
The probe guide member, it has a plurality of under shed and be installed in the otch of the end of described detection piece, and inserts and be fixed with a plurality of probes in described otch; And
A pair of probe raggle block, it pivotally is hinged on the described detection piece, and inserts described probe guide member to support described fixing probe at the downside of described detection piece.
2. probe assembly according to claim 1, wherein, described a pair of probe raggle block comprises:
A pair of probe cage, it pivotally is hinged on the described detection piece; And
A pair of probe lid, it pivotally is hinged on the described probe cage, and contacts the downside of described probe and support described probe.
3. probe assembly according to claim 2, wherein, described probe cage is fixed on the described detection piece by first fixture, and described probe lid is fixed on the described probe raggle block by second fixture.
4. probe assembly according to claim 1 and 2, wherein said probe guide member be fixed so that described probe with respect to described flat-faced screen with an angle tilt.
5. probe assembly according to claim 1 also comprises the guide member fixed part, is used for described probe guide member is fixed to described detection piece.
6. probe assembly according to claim 1 and 2, wherein, described probe guide member comprises in the middle the groove that forms, thereby makes towards an end of the described probe guide member of printed circuit board (PCB), and outstanding to present band shape towards the other end of the described probe guide member of described flat-faced screen.
7. probe assembly according to claim 1, wherein said probe comprises contact jaw, it is used to contact the pixel electrode of described flat-faced screen, and described contact jaw has projection outstanding from described probe guide member and that extend.
8. probe assembly according to claim 1, wherein, described probe comprises link, is used to contact the connecting terminal that is connected on the described printed circuit board (PCB); And described link has projection outstanding from described probe guide member and that extend.
9. a detecting device that is used for the detection plane display screen comprises probe assembly as claimed in claim 1 or 2.
CNB200510051114XA 2004-12-30 2005-02-28 Probe component of detecting device for plane display board detection Expired - Fee Related CN100439924C (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR20040116767 2004-12-30
KR1020040116767 2004-12-30

Publications (2)

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CN1797006A true CN1797006A (en) 2006-07-05
CN100439924C CN100439924C (en) 2008-12-03

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TW (1) TWI281026B (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN100568058C (en) * 2008-05-29 2009-12-09 福建华映显示科技有限公司 Be applicable to the optical measurement equipment and the method for measurement of display screen off-line total check
CN101261286B (en) * 2007-03-09 2011-05-11 海鸿科技股份有限公司 Probe device
CN102654656A (en) * 2011-04-21 2012-09-05 京东方科技集团股份有限公司 Detecting device and working method thereof

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000214184A (en) * 1999-01-26 2000-08-04 Micronics Japan Co Ltd Probe device
JP2001004662A (en) * 1999-06-22 2001-01-12 Micronics Japan Co Ltd Probe device
JP2002040050A (en) * 2000-07-25 2002-02-06 Oht Inc Probe device and probe unit
JP3457938B2 (en) * 2000-10-16 2003-10-20 株式会社双晶テック Method of replacing display board or circuit board in display board or circuit board inspection apparatus
KR100545189B1 (en) * 2001-11-01 2006-01-24 주식회사 유림하이테크산업 Probe card for testing LCD

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101261286B (en) * 2007-03-09 2011-05-11 海鸿科技股份有限公司 Probe device
CN100568058C (en) * 2008-05-29 2009-12-09 福建华映显示科技有限公司 Be applicable to the optical measurement equipment and the method for measurement of display screen off-line total check
CN102654656A (en) * 2011-04-21 2012-09-05 京东方科技集团股份有限公司 Detecting device and working method thereof
CN102654656B (en) * 2011-04-21 2015-01-07 京东方科技集团股份有限公司 Detecting device and working method thereof
US9136088B2 (en) 2011-04-21 2015-09-15 Boe Technology Group Co., Ltd. Detection apparatus and operating method

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Publication number Publication date
TW200624819A (en) 2006-07-16
TWI281026B (en) 2007-05-11
CN100439924C (en) 2008-12-03

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Granted publication date: 20081203