CN1748412A - 具有宽的动态范围的光图像接收器件 - Google Patents
具有宽的动态范围的光图像接收器件 Download PDFInfo
- Publication number
- CN1748412A CN1748412A CNA2004800037602A CN200480003760A CN1748412A CN 1748412 A CN1748412 A CN 1748412A CN A2004800037602 A CNA2004800037602 A CN A2004800037602A CN 200480003760 A CN200480003760 A CN 200480003760A CN 1748412 A CN1748412 A CN 1748412A
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- 230000003287 optical effect Effects 0.000 title abstract description 4
- 238000009792 diffusion process Methods 0.000 claims abstract description 41
- 239000003990 capacitor Substances 0.000 claims abstract description 20
- 230000005540 biological transmission Effects 0.000 claims description 22
- 239000004065 semiconductor Substances 0.000 claims description 5
- 230000035945 sensitivity Effects 0.000 abstract description 11
- 230000004913 activation Effects 0.000 abstract description 2
- 230000007423 decrease Effects 0.000 abstract 1
- 238000004519 manufacturing process Methods 0.000 abstract 1
- 238000000034 method Methods 0.000 abstract 1
- 230000000694 effects Effects 0.000 description 8
- 239000012535 impurity Substances 0.000 description 8
- 101000597193 Homo sapiens Telethonin Proteins 0.000 description 6
- 102100035155 Telethonin Human genes 0.000 description 6
- 238000007634 remodeling Methods 0.000 description 5
- 230000000903 blocking effect Effects 0.000 description 4
- 238000010586 diagram Methods 0.000 description 4
- 230000001427 coherent effect Effects 0.000 description 3
- 150000001875 compounds Chemical class 0.000 description 2
- 230000005684 electric field Effects 0.000 description 2
- 238000002347 injection Methods 0.000 description 2
- 239000007924 injection Substances 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000000295 complement effect Effects 0.000 description 1
- 230000006866 deterioration Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000002349 favourable effect Effects 0.000 description 1
- 230000005283 ground state Effects 0.000 description 1
- 230000002779 inactivation Effects 0.000 description 1
- 230000014759 maintenance of location Effects 0.000 description 1
- 229910044991 metal oxide Inorganic materials 0.000 description 1
- 150000004706 metal oxides Chemical class 0.000 description 1
- 238000005381 potential energy Methods 0.000 description 1
- 238000005070 sampling Methods 0.000 description 1
- 238000003860 storage Methods 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
Images
Classifications
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
- H04N25/65—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to reset noise, e.g. KTC noise related to CMOS structures by techniques other than CDS
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14643—Photodiode arrays; MOS imagers
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/50—Control of the SSIS exposure
- H04N25/57—Control of the dynamic range
- H04N25/59—Control of the dynamic range by controlling the amount of charge storable in the pixel, e.g. modification of the charge conversion ratio of the floating node capacitance
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
- H04N25/77—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N3/00—Scanning details of television systems; Combination thereof with generation of supply voltages
- H04N3/10—Scanning details of television systems; Combination thereof with generation of supply voltages by means not exclusively optical-mechanical
- H04N3/14—Scanning details of television systems; Combination thereof with generation of supply voltages by means not exclusively optical-mechanical by means of electrically scanned solid-state devices
- H04N3/15—Scanning details of television systems; Combination thereof with generation of supply voltages by means not exclusively optical-mechanical by means of electrically scanned solid-state devices for picture signal generation
- H04N3/155—Control of the image-sensor operation, e.g. image processing within the image-sensor
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- Engineering & Computer Science (AREA)
- Multimedia (AREA)
- Signal Processing (AREA)
- Physics & Mathematics (AREA)
- Power Engineering (AREA)
- General Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Electromagnetism (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Solid State Image Pick-Up Elements (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
Abstract
Description
Claims (5)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR10-2003-0007743A KR100484278B1 (ko) | 2003-02-07 | 2003-02-07 | 넓은 동작 범위를 갖는 광 화상 수신용 디바이스 |
KR1020030007743 | 2003-02-07 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN1748412A true CN1748412A (zh) | 2006-03-15 |
CN100372370C CN100372370C (zh) | 2008-02-27 |
Family
ID=36167031
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CNB2004800037602A Expired - Lifetime CN100372370C (zh) | 2003-02-07 | 2004-02-07 | 具有宽的动态范围的光图像接收器件 |
Country Status (6)
Country | Link |
---|---|
US (1) | US7733400B2 (zh) |
EP (1) | EP1593260A1 (zh) |
JP (1) | JP4061326B2 (zh) |
KR (1) | KR100484278B1 (zh) |
CN (1) | CN100372370C (zh) |
WO (1) | WO2004071079A1 (zh) |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101534376A (zh) * | 2007-09-14 | 2009-09-16 | 豪威科技有限公司 | 用于改善的动态范围的具有多个读取电路路径的图像传感器设备和方法 |
CN101304468B (zh) * | 2006-07-20 | 2011-07-06 | 爱德瓦森斯技术(2004)有限公司 | 读像素和写像素的方法以及具有像素读和写能力的设备 |
CN102196201A (zh) * | 2011-06-23 | 2011-09-21 | 格科微电子(上海)有限公司 | 图像传感器的信号读出电路、模块及方法 |
CN105810765A (zh) * | 2016-03-21 | 2016-07-27 | 京东方科技集团股份有限公司 | Pin光电二极管、x射线探测像元、装置及其探测方法 |
CN105917468A (zh) * | 2014-01-14 | 2016-08-31 | 微软技术许可有限责任公司 | 光谱成像系统 |
Families Citing this family (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3996618B1 (ja) * | 2006-05-11 | 2007-10-24 | 総吉 廣津 | 半導体撮像素子 |
JP5157259B2 (ja) | 2007-05-29 | 2013-03-06 | ソニー株式会社 | 固体撮像素子及び撮像装置 |
US8077237B2 (en) | 2007-10-16 | 2011-12-13 | Aptina Imaging Corporation | Method and apparatus for controlling dual conversion gain signal in imaging devices |
WO2010074252A1 (ja) * | 2008-12-25 | 2010-07-01 | 国立大学法人静岡大学 | 半導体素子及び固体撮像装置 |
KR101363532B1 (ko) * | 2009-10-05 | 2014-02-14 | 고쿠리츠 다이가꾸 호우진 시즈오까 다이가꾸 | 반도체 소자 및 고체 촬상 장치 |
JP5422362B2 (ja) * | 2009-12-15 | 2014-02-19 | 株式会社東芝 | 固体撮像装置 |
GB201102478D0 (en) | 2011-02-11 | 2011-03-30 | Isdi Ltd | Radiation detector and method |
US9059065B2 (en) * | 2012-03-19 | 2015-06-16 | National Institute Of Advanced Industrial Science And Technology | Method of varying gain of amplifying photoelectric conversion device and variable gain photoelectric conversion device |
CN103779365B (zh) | 2012-10-19 | 2016-06-22 | 比亚迪股份有限公司 | 宽动态范围像素单元、其制造方法及其构成的图像传感器 |
GB2525625B (en) | 2014-04-29 | 2017-05-31 | Isdi Ltd | Device and method |
JP6840555B2 (ja) * | 2017-01-30 | 2021-03-10 | キヤノン株式会社 | 固体撮像装置及び撮像システム |
JP7249552B2 (ja) * | 2017-11-30 | 2023-03-31 | パナソニックIpマネジメント株式会社 | 撮像装置 |
CN112449133B (zh) * | 2019-08-29 | 2023-04-07 | 天津大学青岛海洋技术研究院 | 一种采用像素内参数调整技术的大动态范围像素结构 |
CN112563299B (zh) * | 2020-12-10 | 2023-03-24 | 成都微光集电科技有限公司 | Cmos图像传感器及其制备方法 |
Family Cites Families (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2735632B1 (fr) * | 1995-06-14 | 1997-07-11 | Commissariat Energie Atomique | Dispositif et procede de numerisation pour detecteurs photosensibles et procede de lecture d'une matrice de detecteurs photoniques |
US6008686A (en) * | 1997-06-24 | 1999-12-28 | Advantest Corp. | Power consumption control circuit for CMOS circuit |
US6008486A (en) | 1997-12-31 | 1999-12-28 | Gentex Corporation | Wide dynamic range optical sensor |
US6512544B1 (en) * | 1998-06-17 | 2003-01-28 | Foveon, Inc. | Storage pixel sensor and array with compression |
EP0967794B1 (en) * | 1998-06-26 | 2004-06-09 | Agilent Technologies, Inc. (a Delaware corporation) | Photodiode array |
US7015964B1 (en) | 1998-11-02 | 2006-03-21 | Canon Kabushiki Kaisha | Solid-state image pickup device and method of resetting the same |
JP3833027B2 (ja) | 1998-11-02 | 2006-10-11 | キヤノン株式会社 | 固体撮像装置及び画像入力装置 |
US6339248B1 (en) * | 1999-11-15 | 2002-01-15 | Omnivision Technologies, Inc. | Optimized floating P+ region photodiode for a CMOS image sensor |
US7009648B2 (en) * | 2000-02-22 | 2006-03-07 | Asulab S.A. | Method for operating a CMOS image sensor |
JP2001257943A (ja) | 2000-03-13 | 2001-09-21 | Victor Co Of Japan Ltd | 固体撮像装置の電子シャッター駆動方法および固体撮像装置 |
EP1265291A1 (fr) * | 2001-06-08 | 2002-12-11 | EM Microelectronic-Marin SA | Capteur d'image CMOS et procédé permettant d'opérer un capteur d'image CMOS avec une dynamique accrue |
US7443427B2 (en) * | 2002-08-23 | 2008-10-28 | Micron Technology, Inc. | Wide dynamic range linear-and-log active pixel |
US20040036784A1 (en) * | 2002-08-23 | 2004-02-26 | Bock Nikolai E. | High dynamic range pixel with gain and true shutter capability |
JP4117540B2 (ja) | 2002-10-17 | 2008-07-16 | ソニー株式会社 | 固体撮像素子の制御方法 |
-
2003
- 2003-02-07 KR KR10-2003-0007743A patent/KR100484278B1/ko not_active IP Right Cessation
-
2004
- 2004-02-07 CN CNB2004800037602A patent/CN100372370C/zh not_active Expired - Lifetime
- 2004-02-07 WO PCT/KR2004/000237 patent/WO2004071079A1/en active Application Filing
- 2004-02-07 JP JP2005518753A patent/JP4061326B2/ja not_active Expired - Lifetime
- 2004-02-07 US US10/544,774 patent/US7733400B2/en active Active
- 2004-02-07 EP EP04709153A patent/EP1593260A1/en not_active Withdrawn
Cited By (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101304468B (zh) * | 2006-07-20 | 2011-07-06 | 爱德瓦森斯技术(2004)有限公司 | 读像素和写像素的方法以及具有像素读和写能力的设备 |
CN101534376A (zh) * | 2007-09-14 | 2009-09-16 | 豪威科技有限公司 | 用于改善的动态范围的具有多个读取电路路径的图像传感器设备和方法 |
CN102196201A (zh) * | 2011-06-23 | 2011-09-21 | 格科微电子(上海)有限公司 | 图像传感器的信号读出电路、模块及方法 |
CN102196201B (zh) * | 2011-06-23 | 2013-11-27 | 格科微电子(上海)有限公司 | 图像传感器的信号读出电路、模块及方法 |
CN105917468A (zh) * | 2014-01-14 | 2016-08-31 | 微软技术许可有限责任公司 | 光谱成像系统 |
CN105917468B (zh) * | 2014-01-14 | 2019-09-17 | 微软技术许可有限责任公司 | 光谱成像系统 |
CN105810765A (zh) * | 2016-03-21 | 2016-07-27 | 京东方科技集团股份有限公司 | Pin光电二极管、x射线探测像元、装置及其探测方法 |
US9966492B1 (en) | 2016-03-21 | 2018-05-08 | Boe Technology Group Co., Ltd. | PIN photodiode, X-ray detecting pixel, X-ray detecting apparatus and detecting method thereof |
Also Published As
Publication number | Publication date |
---|---|
US7733400B2 (en) | 2010-06-08 |
KR100484278B1 (ko) | 2005-04-20 |
US20060181626A1 (en) | 2006-08-17 |
EP1593260A1 (en) | 2005-11-09 |
JP4061326B2 (ja) | 2008-03-19 |
WO2004071079A1 (en) | 2004-08-19 |
KR20040071841A (ko) | 2004-08-16 |
CN100372370C (zh) | 2008-02-27 |
JP2006514446A (ja) | 2006-04-27 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
ASS | Succession or assignment of patent right |
Owner name: (CORPORATION)SILICONFILE Free format text: FORMER OWNER: LI DAOYONG Effective date: 20060512 |
|
C41 | Transfer of patent application or patent right or utility model | ||
TA01 | Transfer of patent application right |
Effective date of registration: 20060512 Address after: Seoul, South Kerean Applicant after: Siliconfile Technologies Inc. Address before: Gyeonggi Do city of South Korea Applicant before: Li Daoyong |
|
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
C41 | Transfer of patent application or patent right or utility model | ||
TR01 | Transfer of patent right |
Effective date of registration: 20170223 Address after: Gyeonggi Do, South Korea Patentee after: Sk Hynix Inc. Address before: Seoul, South Kerean Patentee before: Siliconfile Technologies Inc. |
|
CX01 | Expiry of patent term | ||
CX01 | Expiry of patent term |
Granted publication date: 20080227 |