CN1630811A - 中阶梯谱仪的波长校准组件和方法 - Google Patents
中阶梯谱仪的波长校准组件和方法 Download PDFInfo
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- CN1630811A CN1630811A CNA038035189A CN03803518A CN1630811A CN 1630811 A CN1630811 A CN 1630811A CN A038035189 A CNA038035189 A CN A038035189A CN 03803518 A CN03803518 A CN 03803518A CN 1630811 A CN1630811 A CN 1630811A
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- 238000000034 method Methods 0.000 title claims description 13
- 238000001228 spectrum Methods 0.000 claims abstract description 64
- 239000006185 dispersion Substances 0.000 claims abstract description 32
- 230000003595 spectral effect Effects 0.000 claims abstract description 23
- 238000001514 detection method Methods 0.000 claims abstract 2
- 238000005259 measurement Methods 0.000 claims description 12
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- 238000003384 imaging method Methods 0.000 description 11
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- YZCKVEUIGOORGS-OUBTZVSYSA-N Deuterium Chemical compound [2H] YZCKVEUIGOORGS-OUBTZVSYSA-N 0.000 description 1
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- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- 238000004611 spectroscopical analysis Methods 0.000 description 1
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Images
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/04—Slit arrangements slit adjustment
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
- G01J3/0229—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using masks, aperture plates, spatial light modulators or spatial filters, e.g. reflective filters
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/12—Generating the spectrum; Monochromators
- G01J3/14—Generating the spectrum; Monochromators using refracting elements, e.g. prisms
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/12—Generating the spectrum; Monochromators
- G01J3/18—Generating the spectrum; Monochromators using diffraction elements, e.g. grating
- G01J3/1809—Echelle gratings
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/12—Generating the spectrum; Monochromators
- G01J2003/1208—Prism and grating
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J2003/2866—Markers; Calibrating of scan
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/08—Beam switching arrangements
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Spectrometry And Color Measurement (AREA)
- Testing And Monitoring For Control Systems (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
Abstract
Description
Claims (14)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE10205142.9 | 2002-02-07 | ||
DE10205142A DE10205142B4 (de) | 2002-02-07 | 2002-02-07 | Anordnung und Verfahren zur Wellenlängenkalibration bei einem Echelle-Spektrometer |
Publications (2)
Publication Number | Publication Date |
---|---|
CN1630811A true CN1630811A (zh) | 2005-06-22 |
CN100573061C CN100573061C (zh) | 2009-12-23 |
Family
ID=27634798
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CNB038035189A Expired - Lifetime CN100573061C (zh) | 2002-02-07 | 2003-01-28 | 中阶梯谱仪的波长校准组件和方法 |
Country Status (8)
Country | Link |
---|---|
US (1) | US7215422B2 (zh) |
EP (1) | EP1472512B1 (zh) |
JP (1) | JP4534487B2 (zh) |
CN (1) | CN100573061C (zh) |
AT (1) | ATE412168T1 (zh) |
AU (1) | AU2003210190B2 (zh) |
DE (2) | DE10205142B4 (zh) |
WO (1) | WO2003067204A1 (zh) |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN100470216C (zh) * | 2007-10-30 | 2009-03-18 | 中国科学院西安光学精密机械研究所 | 不同类型光谱仪的对比方法 |
CN102155990A (zh) * | 2011-03-28 | 2011-08-17 | 中国科学院长春光学精密机械与物理研究所 | 一种中阶梯光栅光谱仪的装调方法 |
CN102226716A (zh) * | 2011-03-28 | 2011-10-26 | 中国科学院长春光学精密机械与物理研究所 | 一种中阶梯光栅光谱仪的光路结构 |
CN103868590A (zh) * | 2014-04-03 | 2014-06-18 | 哈尔滨工业大学 | 一种光谱范围可调节的连续宽带短波光源 |
CN104977273A (zh) * | 2014-04-04 | 2015-10-14 | 仕富梅集团公司 | 用于光源、探测器与分析器的附接与对准设备,以及模块分析系统 |
CN116625959A (zh) * | 2023-07-17 | 2023-08-22 | 北京卓立汉光仪器有限公司 | 光栅光谱仪的波长校准方法 |
Families Citing this family (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE10324934A1 (de) * | 2003-06-03 | 2004-12-23 | Carl Zeiss Jena Gmbh | Anordnung und ein Verfahren zur Erkennung von Schichten, die auf Oberflächen von Bauteilen angeordnet sind, und Bestimmung deren Eigenschaften |
US7684037B2 (en) * | 2007-02-27 | 2010-03-23 | Metrosol, Inc. | Spectrometer with collimated input light |
US7485869B2 (en) | 2007-02-27 | 2009-02-03 | Metrosol, Inc. | Prism spectrometer |
US7579601B2 (en) | 2007-02-27 | 2009-08-25 | Metrosol, Inc. | Spectrometer with moveable detector element |
DE102007028505A1 (de) * | 2007-06-18 | 2008-12-24 | Gesellschaft zur Förderung angewandter Optik, Optoelektronik, Quantenelektronik und Spektroskopie e.V. | Spektrometeranordnung |
WO2008156322A1 (en) * | 2007-06-19 | 2008-12-24 | Lg Chem, Ltd. | Polarizing plate and polarizing device comprising the same |
DE102008002355B4 (de) | 2008-06-11 | 2021-10-07 | Endress+Hauser Conducta Gmbh+Co. Kg | Verfahren und Anordnung zur automatischen Kalibrierung von Spektrometern |
DE102009003413B4 (de) * | 2009-01-30 | 2022-01-20 | Leibniz - Institut Für Analytische Wissenschaften - Isas - E.V. | Echelle-Spektrometeranordnung mit interner Vordispersion |
JP2011017567A (ja) * | 2009-07-08 | 2011-01-27 | Hitachi High-Technologies Corp | 分光光度計 |
JP5576649B2 (ja) * | 2009-12-21 | 2014-08-20 | オリンパス株式会社 | 分光器、及び、それを備えた光学装置 |
US8867920B2 (en) | 2012-07-24 | 2014-10-21 | International Business Machines Corporation | Optical de-multiplexing device |
CN102879091B (zh) * | 2012-08-28 | 2014-08-20 | 中国科学院长春光学精密机械与物理研究所 | 中阶梯光栅光谱仪、原子发射光谱仪及光谱测试方法 |
CN107037012B (zh) * | 2017-04-05 | 2019-10-25 | 华中科技大学 | 用于激光诱导击穿光谱采集的阶梯光谱仪动态校正方法 |
CN107101723B (zh) * | 2017-06-13 | 2018-05-01 | 钢研纳克检测技术股份有限公司 | 高分辨率中阶梯光栅光谱仪二维偏差谱图分析与校正方法 |
CN114965281B (zh) * | 2022-07-29 | 2022-12-06 | 中国科学院国家天文台 | 用于火星表面成分探测仪的波长修正方法和装置 |
Family Cites Families (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE1907417A1 (de) * | 1968-02-23 | 1969-09-18 | Perkin Elmer Corp | Monochromator |
US3748040A (en) * | 1971-11-01 | 1973-07-24 | Cary Instruments | High resolution or high bandwidth monochromator |
US4025196A (en) * | 1974-07-29 | 1977-05-24 | Varian Associates | Asymmetric double pass grating monochromator |
DE3113984C2 (de) * | 1981-04-07 | 1983-12-01 | Bodenseewerk Perkin-Elmer & Co GmbH, 7770 Überlingen | Doppelmonochromator |
DD210753A1 (de) * | 1982-10-01 | 1984-06-20 | Zeiss Jena Veb Carl | Anordnung zur auswahl von spektrenabschnitten aus einem gesamtspektrum |
JPS60207018A (ja) * | 1984-03-30 | 1985-10-18 | Shimadzu Corp | モノクロメ−タ |
CA1229897A (en) * | 1984-12-03 | 1987-12-01 | Gilbert M. Levy | Optics system for emission spectrometer |
JPH0261527A (ja) * | 1988-08-29 | 1990-03-01 | Anritsu Corp | ダブルグレーティング型分光装置 |
DE69021786T2 (de) * | 1989-06-16 | 1996-01-11 | Fisons Plc | Optisches System zur Spektralanalyse. |
DE3937599C2 (de) * | 1989-11-11 | 2002-01-24 | Perkin Elmer Bodenseewerk Zwei | Doppelmonochromator |
DE4118760A1 (de) * | 1991-06-06 | 1992-12-10 | Zentralinstitut Fuer Optik Und | Echelle-doppelmonochromator |
FR2681941B1 (fr) * | 1991-10-01 | 1994-07-29 | Dilor | Dispositif de spectrometrie dispersive a filtrage de bande spectrale. |
DE19532611C2 (de) * | 1994-12-26 | 2001-12-06 | Advantest Corp | Doppelwegmonochromator in Differenzdispersionsanordnung |
DE19545178B4 (de) * | 1995-12-04 | 2008-04-10 | Berthold Gmbh & Co. Kg | Spektrometervorrichtung |
JPH10281872A (ja) * | 1997-04-08 | 1998-10-23 | Yokogawa Electric Corp | フーリエ変換型分光器 |
DE19833356A1 (de) * | 1998-07-24 | 2000-01-27 | Wandel & Goltermann Management | Verfahren und Vorrichtung zum Ausfiltern einer bestimmten zu untersuchenden Wellenlänge aus einem Lichtstrahl |
-
2002
- 2002-02-07 DE DE10205142A patent/DE10205142B4/de not_active Expired - Lifetime
-
2003
- 2003-01-28 EP EP03737282A patent/EP1472512B1/de not_active Expired - Lifetime
- 2003-01-28 US US10/503,636 patent/US7215422B2/en not_active Expired - Lifetime
- 2003-01-28 AT AT03737282T patent/ATE412168T1/de active
- 2003-01-28 JP JP2003566507A patent/JP4534487B2/ja not_active Expired - Lifetime
- 2003-01-28 CN CNB038035189A patent/CN100573061C/zh not_active Expired - Lifetime
- 2003-01-28 DE DE50310671T patent/DE50310671D1/de not_active Expired - Lifetime
- 2003-01-28 WO PCT/EP2003/000832 patent/WO2003067204A1/de active Application Filing
- 2003-01-28 AU AU2003210190A patent/AU2003210190B2/en not_active Expired
Cited By (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN100470216C (zh) * | 2007-10-30 | 2009-03-18 | 中国科学院西安光学精密机械研究所 | 不同类型光谱仪的对比方法 |
CN102155990A (zh) * | 2011-03-28 | 2011-08-17 | 中国科学院长春光学精密机械与物理研究所 | 一种中阶梯光栅光谱仪的装调方法 |
CN102226716A (zh) * | 2011-03-28 | 2011-10-26 | 中国科学院长春光学精密机械与物理研究所 | 一种中阶梯光栅光谱仪的光路结构 |
CN103868590A (zh) * | 2014-04-03 | 2014-06-18 | 哈尔滨工业大学 | 一种光谱范围可调节的连续宽带短波光源 |
CN103868590B (zh) * | 2014-04-03 | 2016-01-27 | 哈尔滨工业大学 | 一种光谱范围可调节的连续宽带短波光源 |
CN104977273A (zh) * | 2014-04-04 | 2015-10-14 | 仕富梅集团公司 | 用于光源、探测器与分析器的附接与对准设备,以及模块分析系统 |
CN116625959A (zh) * | 2023-07-17 | 2023-08-22 | 北京卓立汉光仪器有限公司 | 光栅光谱仪的波长校准方法 |
CN116625959B (zh) * | 2023-07-17 | 2023-11-10 | 北京卓立汉光仪器有限公司 | 光栅光谱仪的波长校准方法 |
Also Published As
Publication number | Publication date |
---|---|
ATE412168T1 (de) | 2008-11-15 |
EP1472512A1 (de) | 2004-11-03 |
DE10205142A1 (de) | 2003-08-28 |
JP4534487B2 (ja) | 2010-09-01 |
AU2003210190A1 (en) | 2003-09-02 |
WO2003067204A1 (de) | 2003-08-14 |
US7215422B2 (en) | 2007-05-08 |
US20050157293A1 (en) | 2005-07-21 |
DE50310671D1 (de) | 2008-12-04 |
AU2003210190B2 (en) | 2008-06-26 |
JP2005517172A (ja) | 2005-06-09 |
CN100573061C (zh) | 2009-12-23 |
DE10205142B4 (de) | 2004-01-15 |
EP1472512B1 (de) | 2008-10-22 |
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Owner name: FOERDERUNG DER ANALYTISCHEN WI Free format text: FORMER OWNER: FOERDERUNG ANGEWANDTER OPTIK Effective date: 20100609 Free format text: FORMER OWNER: FOERDERUNG DER ANALYTISCHEN WI |
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Address after: Berlin Co-patentee after: LEIBNIZ - INSTITUT FuR ANALYTISCHE WISSENSCHAFTEN - ISAS - E.V. Patentee after: GES ZUR FOERDERUNG ANGEWANDTER OPTIK OPTOELEKTRONIK QUANTENELEKTRONIK & SPEKTROSKOPIE EV Address before: Berlin Co-patentee before: Gesellschaft Zur Foerderung Der Analytischen Wissenschaft E.V Patentee before: GES ZUR FOERDERUNG ANGEWANDTER OPTIK OPTOELEKTRONIK QUANTENELEKTRONIK & SPEKTROSKOPIE EV |
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Effective date of registration: 20100609 Address after: Borussia Dortmund Patentee after: LEIBNIZ - INSTITUT FuR ANALYTISCHE WISSENSCHAFTEN - ISAS - E.V. Address before: Berlin Co-patentee before: LEIBNIZ - INSTITUT FuR ANALYTISCHE WISSENSCHAFTEN - ISAS - E.V. Patentee before: GES ZUR FOERDERUNG ANGEWANDTER OPTIK OPTOELEKTRONIK QUANTENELEKTRONIK & SPEKTROSKOPIE EV |
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