CN1507028A - 测试半导体装置及载具间接触之测试装置、系统及方法 - Google Patents
测试半导体装置及载具间接触之测试装置、系统及方法 Download PDFInfo
- Publication number
- CN1507028A CN1507028A CNA2003101195704A CN200310119570A CN1507028A CN 1507028 A CN1507028 A CN 1507028A CN A2003101195704 A CNA2003101195704 A CN A2003101195704A CN 200310119570 A CN200310119570 A CN 200310119570A CN 1507028 A CN1507028 A CN 1507028A
- Authority
- CN
- China
- Prior art keywords
- carrier
- semiconductor device
- contact
- testing apparatus
- test
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
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Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/02—Detection or location of defective auxiliary circuits, e.g. defective refresh counters
- G11C29/022—Detection or location of defective auxiliary circuits, e.g. defective refresh counters in I/O circuitry
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/66—Testing of connections, e.g. of plugs or non-disconnectable joints
- G01R31/68—Testing of releasable connections, e.g. of terminals mounted on a printed circuit board
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/02—Detection or location of defective auxiliary circuits, e.g. defective refresh counters
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2893—Handling, conveying or loading, e.g. belts, boats, vacuum fingers
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Abstract
Description
Claims (14)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE10256692.5 | 2002-12-04 | ||
DE10256692A DE10256692A1 (de) | 2002-12-04 | 2002-12-04 | Test-Gerät, Test-System und Test-Verfahren, insbesondere zum Testen der Kontaktierung zwischen einem Halbleiter-Bauelement und einem Carrier |
Publications (2)
Publication Number | Publication Date |
---|---|
CN1507028A true CN1507028A (zh) | 2004-06-23 |
CN100369225C CN100369225C (zh) | 2008-02-13 |
Family
ID=32335966
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CNB2003101195704A Expired - Fee Related CN100369225C (zh) | 2002-12-04 | 2003-12-04 | 测试半导体装置及载具间接触之测试装置、系统及方法 |
Country Status (3)
Country | Link |
---|---|
US (1) | US20040155646A1 (zh) |
CN (1) | CN100369225C (zh) |
DE (1) | DE10256692A1 (zh) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN106067438A (zh) * | 2015-04-23 | 2016-11-02 | 日月光半导体制造股份有限公司 | 载具以及将半导体元件附接到载具的方法与半导体方法 |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8485511B2 (en) | 2009-03-11 | 2013-07-16 | Centipede Systems, Inc. | Method and apparatus for holding microelectronic devices |
WO2011038297A1 (en) * | 2009-09-26 | 2011-03-31 | Centipede Systems, Inc. | Apparatus for holding microelectronic devices |
WO2011038295A1 (en) * | 2009-09-26 | 2011-03-31 | Centipede Systems, Inc. | Carrier for holding microelectronic devices |
US8683674B2 (en) | 2010-12-07 | 2014-04-01 | Centipede Systems, Inc. | Method for stacking microelectronic devices |
US9346151B2 (en) | 2010-12-07 | 2016-05-24 | Centipede Systems, Inc. | Precision carrier for microelectronic devices |
US11567118B2 (en) * | 2019-02-21 | 2023-01-31 | HKC Corporation Limited | Testing device of array substrates and testing method |
Family Cites Families (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3573617A (en) * | 1967-10-27 | 1971-04-06 | Aai Corp | Method and apparatus for testing packaged integrated circuits |
US4340860A (en) * | 1980-05-19 | 1982-07-20 | Trigon | Integrated circuit carrier package test probe |
JPS59225546A (ja) * | 1983-06-06 | 1984-12-18 | Nissan Motor Co Ltd | Icパツケ−ジの誤插入防止装置 |
US4864219A (en) * | 1987-03-19 | 1989-09-05 | Genrad, Inc. | Method and apparatus for verifying proper placement of integrated circuits on circuit boards |
US5247246A (en) * | 1987-04-17 | 1993-09-21 | Everett Charles Technologies, Inc. | Testing of integrated circuit devices on loaded printed circuit boards |
KR100261935B1 (ko) * | 1994-04-18 | 2000-07-15 | 더블유. 브리얀 퍼네이 | 전자다이 자동배치 방법 및 장치 |
WO1996009556A1 (fr) * | 1994-09-22 | 1996-03-28 | Advantest Corporation | Procede et appareil d'inspection automatique de dispositifs semiconducteurs |
JP2000214219A (ja) * | 1999-01-28 | 2000-08-04 | Ando Electric Co Ltd | テストバ―ンインボ―ドハンドラ |
US6323669B1 (en) * | 1999-02-02 | 2001-11-27 | Samsung Electronics Co., Ltd. | Apparatus and method for a contact test between an integrated circuit device an a socket |
JP4301661B2 (ja) * | 1999-11-12 | 2009-07-22 | 富士通マイクロエレクトロニクス株式会社 | ボールグリッドアレイ構造のデバイスに使用されるコンタクトフィルム及びデバイス実装構造体 |
US6472891B1 (en) * | 2000-08-10 | 2002-10-29 | Advanced Micro Devices, Inc. | Method and apparatus for testing semiconductor packages without damage |
TW504864B (en) * | 2000-09-19 | 2002-10-01 | Nanopierce Technologies Inc | Method for assembling components and antennae in radio frequency identification devices |
US6734683B2 (en) * | 2001-09-27 | 2004-05-11 | Intel Corporation | Method and apparatus for in-circuit testing of sockets |
-
2002
- 2002-12-04 DE DE10256692A patent/DE10256692A1/de not_active Ceased
-
2003
- 2003-12-03 US US10/725,938 patent/US20040155646A1/en not_active Abandoned
- 2003-12-04 CN CNB2003101195704A patent/CN100369225C/zh not_active Expired - Fee Related
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN106067438A (zh) * | 2015-04-23 | 2016-11-02 | 日月光半导体制造股份有限公司 | 载具以及将半导体元件附接到载具的方法与半导体方法 |
Also Published As
Publication number | Publication date |
---|---|
CN100369225C (zh) | 2008-02-13 |
DE10256692A1 (de) | 2004-06-24 |
US20040155646A1 (en) | 2004-08-12 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
C41 | Transfer of patent application or patent right or utility model | ||
C56 | Change in the name or address of the patentee | ||
CP01 | Change in the name or title of a patent holder |
Address after: Munich, Germany Patentee after: Infineon Technologies AG Address before: Munich, Germany Patentee before: INFINEON TECHNOLOGIES AG |
|
TR01 | Transfer of patent right |
Effective date of registration: 20120920 Address after: Munich, Germany Patentee after: QIMONDA AG Address before: Munich, Germany Patentee before: Infineon Technologies AG |
|
C41 | Transfer of patent application or patent right or utility model | ||
TR01 | Transfer of patent right |
Effective date of registration: 20151230 Address after: German Berg, Laura Ibiza Patentee after: Infineon Technologies AG Address before: Munich, Germany Patentee before: QIMONDA AG |
|
CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20080213 Termination date: 20151204 |
|
EXPY | Termination of patent right or utility model |