CN1448956A - Method for testing non-volatile memory - Google Patents
Method for testing non-volatile memory Download PDFInfo
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- CN1448956A CN1448956A CN 02108167 CN02108167A CN1448956A CN 1448956 A CN1448956 A CN 1448956A CN 02108167 CN02108167 CN 02108167 CN 02108167 A CN02108167 A CN 02108167A CN 1448956 A CN1448956 A CN 1448956A
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Abstract
The present invention is the test method of non-volatile memory. After the customer-designated program codes are written into at least one non-volatile memory, the write-enable pine of the non-volatile memory is cut down to avoid error write. In the test stage, the program codes in the non-volatile memory are read out and compared with the program codes picked up by the test stage controlling program. If the program codes are the same, the program codes picked up by the test stage are shown to be correct, or incorrect.
Description
Technical field
The present invention relates to a kind of method of testing of non-volatility memorizer, particularly a kind ofly test the method whether non-volatility memorizer writes the specified procedure code of client.
Background technology
In order to verify the correctness of non-volatility memorizer product (for example flash memory (FLASH) or can electricity remove programmable read only memory (EEPROM)), before product export, all can carry out a series of testing process.
Fig. 1 is the process flow diagram of known method of testing.In step 101, known testing process opens the beginning.In step 102, carry out opening circuit/short-circuit test (open/short test) of product pin (pin).If, then enter step 103 by (pass) this test; Otherwise enter step 106, this non-volatility memorizer is included into second cabinet (binning 2).In step 103, carry out the logic function test (function test) of this non-volatility memorizer.If, then enter step 104 by this test; Otherwise enter step 106, this non-volatility memorizer is included into the 3rd cabinet (binning 3).In step 104, the electricity that carries out non-volatility memorizer removes characteristic test (erase/program test), whether can be removed and write new data by electricity to judge the data in this non-volatility memorizer.If, then enter step 105 by this test; Otherwise, enter step 106, this non-volatility memorizer is included into the 4th cabinet (binning 4).In step 105, carry out procedure code test, the procedure code that writes this non-volatility memorizer is read and done a contrast with this write-in program sign indicating number, whether correct with the read-write motion of judging this non-volatility memorizer.If by this test, then enter step 106, this non-volatility memorizer be included into first cabinet (binning 1); Otherwise this non-volatility memorizer is included into the 5th cabinet (binning 5).Step 106 is that the storer of each end of test (EOT) is classified.In step 107, known testing process finishes.
In other words, the pin that known method of testing only detects non-volatility memorizer opens circuit/short circuit, logic function, electricity remove characteristic and read-write capability, but can't be further tests at whether writing the specified procedure code of client.For example when readwrite tests,, because its action only writes procedure code this non-volatility memorizer, read again then and compare, so still may obtain testing the conclusion of passing through if when the control program of tester table is grabbed the specified procedure code of wrong client.
Summary of the invention
Fundamental purpose of the present invention is providing a kind of method of testing of non-volatility memorizer, open circuit except carrying out traditional pin/short-circuit test, logic function test, electricity except that characteristic test and procedure code test, whether can further test this procedure code really specified for this client.
Whether another object of the present invention is providing a kind of method of testing of non-volatility memorizer, can detect the working environment whether this tester table control program grasp correct client's designated program sign indicating number and this tester table simultaneously and set correctly.
For reaching above-mentioned purpose, the present invention discloses a kind of method of testing of non-volatility memorizer, it is characterized in that in advance that the client is specified procedure code writes at least one non-volatility memorizer, and wipe out this non-volatility memorizer write activation (enable) pin with avoid the mistake write.After tester table restarts, read this non-volatility memorizer procedure code and and the procedure code that grasped of tester table control program compare.If the identical procedure code of then representing the tester table control program to be grasped is correct, on the contrary then incorrect.The present invention also has been verified as correct non-volatility memorizer and has tested after this tester table restarts at least one.If by test, it is correct to represent this tester table to set, otherwise then incorrect.
Method of testing disclosed by the invention, except the pin that can test non-volatility memorizer open circuit/short circuit, logic function, electricity except that characteristic and read-write capability, can test out also whether the procedure code that writes this non-volatility memorizer really is the specified procedure code of client simultaneously.
Specifically, the present invention discloses a kind of method of testing of non-volatility memorizer, and it comprises following step:
(a) make related sample of first type and the related sample of second type; The related sample of this first type is the non-volatility memorizer that writes client's designated program sign indicating number, and a specific pin is wiped out; The related sample of this second type is that empirical tests is correct non-volatility memorizer;
(b) after tester table restarts, carry out this specific pin out of circuit test of related sample of first type and the related sample of second type; Then enter step (c) if open circuit, otherwise enter step (d);
(c) read the related sample of this first type procedure code and and the procedure code that grasped of this tester table control program compare; If comparing result is identical, the procedure code of representing this tester table control program to be grasped is correct; Otherwise represent incorrect; And
(d) the related sample of this second type is tested; If, represent the setting of this tester table correct by test; Otherwise represent incorrect.
Described specific pin is meant and writes the activation pin.
Described step (d) comprises the following step:
(d1) carry out pin and open circuit/the sorrowful examination of short circuit, if not incorrect by the setting that then shows this tester table;
(d2) carry out functional test, if it is not by then showing the setting of this tester table, incorrect;
(d3) carry out electricity and remove characteristic test, if not incorrect by the setting that then shows this tester table; And
(d4) carry out the procedure code test, if not incorrect by the setting that then shows this tester table.
Describedly also comprising a step (e) afterwards in step (d), is to grasp correct client's designated program sign indicating number and tester table is set under the correct situation at this tester table control program, promptly carries out the test of bulk article.
The present invention also discloses a kind of method of testing of non-volatility memorizer, be applied to test the procedure code that writes this non-volatility memorizer and whether really be the specified procedure code of client, it is characterized in that in advance that the client is specified procedure code writes at least one non-volatility memorizer, and wipe out this non-volatility memorizer write the activation pin with avoid the mistake write; After tester table restarts, read this non-volatility memorizer procedure code and and the procedure code that grasped of tester table control program compare; If the identical procedure code of then representing the tester table control program to be grasped is correct, on the contrary then incorrect.
Described method also comprises oneself am verified as correct non-volatility memorizer and test after this tester table restarts at least; If by test, it is correct to represent this tester table to set, otherwise then incorrect.
Aforementioned and other purposes, advantage of the present invention and reach mode will be clearer according to the following detailed description conjunction with figs..
Description of drawings
Fig. 1 represents the method for testing of known non-volatility memorizer; And
Fig. 2 represents the method for testing of a preferred embodiment of the present invention.
Embodiment
Before carrying out flow process of the present invention, the Test Engineer can be in advance writes a plurality of non-volatility memorizers with the procedure code of client's appointment, and that wipes out this non-volatility memorizer writes activation (writeenable) pin (being called for short the EA pin in the present invention), to prevent mistake when the contrast of procedure code, occurring and cause because of human negligence writes procedure code (rewrite) again.Whether these a plurality of non-volatility memorizers promptly have the sample of grabbing wrong client's designated program sign indicating number as the control program that detects tester table, are called the related sample (correlation sample or golden sample) of first type again.In addition, the Test Engineer can keep a plurality of by as the non-volatility memorizer of the known testing process of Fig. 1 as the related sample of second type, and as restart the correctness that its working environment is tested in the back at next tester table.The present invention can be set in the related sample of this first and second type by after testing, and just carries out the testing process of bulk article.
Fig. 2 is an embodiment of testing process of the present invention.In step 201, the present invention is initial.In step 202, carry out EA pin out of circuit test, its purpose is to differentiate related sample of first type and the related sample of second type.If by this test (representing the EA pin not open circuit), then enter step 207, otherwise enter step 203.In step 203, carry out procedure code and detect, it is the procedure code of the related sample of first type is read and to be done a contrast with the procedure code that the board control program is grasped.If comparing result then enters step 204 by (OK, down together), show that the procedure code that this board control program is grasped is correct.If comparing result is (NO, down together) that does not pass through, then enter step 205, show that the procedure code that this board control program is grasped is wrong.
In step 207, carry out pin and open circuit/short-circuit test, because the related sample of first type comes out in that step 202 is screened, therefore only there is the related sample of second type to enter this step.If, then enter step 208 by this test; Otherwise enter step 211, the related sample of this second type is included into second cabinet.In step 208, carry out the logic function test of the related sample of this second type.If, then enter step 209 by this test; Otherwise enter step 211, the related sample of this second type is included into the 3rd cabinet.In step 209, the electricity that carries out the related sample of second type removes characteristic test, whether can be removed and write new data by electricity to judge the data in the related sample of this second type.If, then enter step 210 by this test; Otherwise enter step 211, the related sample of this second type is included into the 4th cabinet.In step 210, carry out procedure code test, the procedure code that writes the related sample of this second type is read and done a contrast with this write-in program sign indicating number, whether correct with the read-write motion of judging the related sample of this second type.If, then enter step 211, the related sample of this second type is included into first cabinet by this test; Otherwise the related sample of this second type is included into the 5th cabinet.Step 211 is that the related sample of second type of each end of test (EOT) is classified.In step 212, testing process finishes.Because the related sample of second type is that oneself is verified as correct non-volatility memorizer in advance, therefore if the related sample of this second type is included into second and third, in four and five cabinets, promptly represent the working environment of tester table mistake to occur, must just can carry out the test of volume production product through adjusting.
Even it should be noted that the EA pin of the related sample of first type wiped out also and can't be applied to known flow process.Because known flow process finds that in step 102 having pin to open circuit promptly is included into second cabinet, have no chance to carry out the procedure code contrast at all.In addition, at the test phase of bulk article, even there is the EA pin of a collection of volume production product to break because of human negligence, whole flow process will enter step 203 this moment, because this non-volatility memorizer does not write any procedure code as yet, be detected so procedure code comparing result certainty is wrong.In other words, method of the present invention is also applicable to the stage of producing in batches.
More than oneself exemplifies preferred embodiment of the present invention, but do not deviating under spirit of the present invention and the scope, still can do the change of any equivalence.Therefore, conspicuous change of any those skilled in the art or modification all should be included in the claim institute confining spectrum.
Claims (6)
1. the method for testing of a non-volatility memorizer is characterized in that, it comprises following step:
(a) make related sample of first type and the related sample of second type; The related sample of this first type is the non-volatility memorizer that writes client's designated program sign indicating number, and a specific pin is wiped out; The related sample of this second type is that empirical tests is correct non-volatility memorizer;
(b) after tester table restarts, carry out this specific pin out of circuit test of related sample of first type and the related sample of second type; Then enter step (c) if open circuit, otherwise enter step (d);
(c) read the related sample of this first type procedure code and and the procedure code that grasped of this tester table control program compare; If comparing result is identical, the procedure code of representing this tester table control program to be grasped is correct; Otherwise represent incorrect; And
(d) the related sample of this second type is tested; If, represent the setting of this tester table correct by test; Otherwise represent incorrect.
2. the method for testing of non-volatility memorizer as claimed in claim 1 is characterized in that described specific pin is meant to write the activation pin.
3. the method for testing of non-volatility memorizer as claimed in claim 1 is characterized in that described step (d) comprises the following step:
(d1) carry out pin and open circuit/the sorrowful examination of short circuit, if not incorrect by the setting that then shows this tester table;
(d2) carry out functional test, if it is not by then showing the setting of this tester table, incorrect;
(d3) carry out electricity and remove characteristic test, if not incorrect by the setting that then shows this tester table; And
(d4) carry out the procedure code test, if not incorrect by the setting that then shows this tester table.
4. the method for testing of non-volatility memorizer as claimed in claim 1, it is characterized in that describedly also comprising a step (e) afterwards in step (d), be to set under the correct situation, promptly carry out the test of bulk article at this tester table control program extracting correct client's designated program sign indicating number and tester table.
5. the method for testing of a non-volatility memorizer, be applied to test the procedure code that writes this non-volatility memorizer and whether really be the specified procedure code of client, it is characterized in that in advance that the client is specified procedure code writes at least one non-volatility memorizer, and wipe out this non-volatility memorizer write the activation pin with avoid the mistake write; After tester table restarts, read this non-volatility memorizer procedure code and and the procedure code that grasped of tester table control program compare; If the identical procedure code of then representing the tester table control program to be grasped is correct, on the contrary then incorrect.
6. the method for testing of non-volatility memorizer as claimed in claim 5 is characterized in that, also comprises oneself am verified as correct non-volatility memorizer and test after this tester table restarts at least; If by test, it is correct to represent this tester table to set, otherwise then incorrect.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNB021081670A CN100375197C (en) | 2002-03-28 | 2002-03-28 | Method for testing non-volatile memory |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNB021081670A CN100375197C (en) | 2002-03-28 | 2002-03-28 | Method for testing non-volatile memory |
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| Publication Number | Publication Date |
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| CN1448956A true CN1448956A (en) | 2003-10-15 |
| CN100375197C CN100375197C (en) | 2008-03-12 |
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| Application Number | Title | Priority Date | Filing Date |
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| CNB021081670A Expired - Fee Related CN100375197C (en) | 2002-03-28 | 2002-03-28 | Method for testing non-volatile memory |
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Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102005251A (en) * | 2009-08-26 | 2011-04-06 | 罗伯特·博世有限公司 | Method for testing a memory |
| CN1900731B (en) * | 2006-07-27 | 2011-08-10 | 华为技术有限公司 | Logic module detecting system and method |
| CN105469831A (en) * | 2015-11-24 | 2016-04-06 | 英业达科技有限公司 | Memory module test method |
| CN105702595A (en) * | 2014-11-27 | 2016-06-22 | 华邦电子股份有限公司 | Yield determination method of wafer and multivariate detection method of wafer acceptance test |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6324666B1 (en) * | 1998-04-20 | 2001-11-27 | Mitsubishi Denki Kabushiki Kaisha | Memory test device and method capable of achieving fast memory test without increasing chip pin number |
| CN1121042C (en) * | 1998-10-23 | 2003-09-10 | 联华电子股份有限公司 | Memory element testing circuit |
-
2002
- 2002-03-28 CN CNB021081670A patent/CN100375197C/en not_active Expired - Fee Related
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1900731B (en) * | 2006-07-27 | 2011-08-10 | 华为技术有限公司 | Logic module detecting system and method |
| CN102005251A (en) * | 2009-08-26 | 2011-04-06 | 罗伯特·博世有限公司 | Method for testing a memory |
| CN102005251B (en) * | 2009-08-26 | 2016-06-01 | 罗伯特·博世有限公司 | For the method checking memorizer |
| CN105702595A (en) * | 2014-11-27 | 2016-06-22 | 华邦电子股份有限公司 | Yield determination method of wafer and multivariate detection method of wafer acceptance test |
| CN105702595B (en) * | 2014-11-27 | 2019-05-07 | 华邦电子股份有限公司 | The yield judgment method of wafer and the changeable quantity measuring method of wafer conformity testing |
| CN105469831A (en) * | 2015-11-24 | 2016-04-06 | 英业达科技有限公司 | Memory module test method |
| CN105469831B (en) * | 2015-11-24 | 2019-01-18 | 英业达科技有限公司 | The test method of memory module |
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| Publication number | Publication date |
|---|---|
| CN100375197C (en) | 2008-03-12 |
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