CN1380656A - 检测光盘坏损区的方法 - Google Patents
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Abstract
本发明涉及在可写光盘上记录数据时无错地检测坏损区的方法。此方法检测记录操作中产生的伺服错误信号的电平,根据检测到的电平检查伺服错误信号是否处于异常状态,检测周期性的颤动信号或记录操作中产生的伺服错误信号异常状态发生的周期性,若伺服错误信号处于异常状态,则根据检测到的周期性颤动信号的成功解码或者异常状态出现的周期性来确定记录区是否坏损。该方法确保了坏损区的准确检测,由此可消除不必要的降速,并保证即使在坏损区也能成功写入数据。
Description
发明领域
本发明涉及在可写光盘上记录数据时无错地检测光盘坏损区的方法。
背景技术
物理损伤,例如划痕等,会影响一些物理光轨(track)。特别是坏损区的中心区域会对数据记录造成最坏的影响。
如果在这样一个坏损区的中心区域进行高速数据写入,跟踪伺服控制可能会终止,从而记录操作会异常中断。在记录操作异常结束的情况下,无法从异常终止的记录位置重新开始数据记录,因此必须从头开始。然而,由于一次写型光盘(即CD-R)不能重写,因此光盘只好被丢弃。
为了解决这个问题,开发了不同的方法。这些方法的目的都是通过检测坏损区并在检测到的坏损区降低记录速度,从而即使在坏损区也能实现成功的数据记录。方法之一利用了跟踪错误(TE)信号的电平。
在这种利用TE信号电平的方法中,当数据以预定的记录速度记录在可写光盘上时,TE信号的电平是一直被监测的,若监测的电平比预设的极限电平高,则当前记录区被认为有缺陷。换句话说,若TE信号不稳定,则当前记录区被认为有缺陷,从而把当前记录速度降低到适当的速度。在速度降低后,继续进行记录操作。
但是,TE信号可能会由于外界的机械震动或干扰而瞬时不稳定,因此若只利用TE信号电平来确定坏损区,正常的记录区可能会被错认为有缺陷,这会导致不必要的写入速度降低。
发明内容
本发明的一个目的在于提供一种更准确地检测可写光盘坏损区的方法,以通过及时降低记录速度来保证在坏损区成功地进行数据写入。
根据本发明的准确检测光盘坏损区的方法检测在记录操作中产生的伺服错误信号的电平,根据检测到的电平检查伺服错误信号是否处于异常状态,检测周期性颤动信号或者记录操作中产生的伺服错误信号异常状态出现的周期性,若伺服错误信号处于异常状态,则根据检测出的周期性颤动信号的成功解码或异常情况出现的周期性,确定记录区是否坏损。
附图说明
结合附图可更深刻地理解本发明,附图说明本发明的优选实施例,并与说明书一起解释本发明的原理。附图中:
图1为一个光盘驱动器的方框图,其中内建了根据本发明的检测可写光盘坏损区的方法;
图2为本发明的坏损区检测方法的一个实施例的流程图;
图3显示的是调制进颤动光轨的颤动信号和编码为颤动信号的数据的示例;
图4显示的是跟踪错误信号的一个示例性异常状态;
图5是伺服回路的增益特性;
图6是本发明的坏损区检测方法另一个实施例的流程图;以及
图7显示的是跟踪和聚焦错误信号的另一个示例性异常状态。
优选实施例说明
为了充分了解本发明,以下参考附图对本发明的优选实施例进行说明。
图1为一个光盘驱动器的方框图,其中内建了根据本发明的检测可写光盘坏损区的方法
图1中的光盘驱动器包括一个数字记录信号处理器30a,其将输入数据转换成记录格式数据作为添加的附加数据,比如纠错码(ECC);信道比特解码器40,将记录格式数据转换为PWM(Pulse WidthModulation,脉宽调制)信号;写入驱动器41,根据PWM信号生成写入电流;光学拾取器20,将对应于写入电流的信号写到可写光盘10上,并从可写光盘10上再生写入的信号;R/F单元50,通过组合来自光盘10的再生信号生成伺服错误信号TE和FE(Focusing Error,聚焦错误)及二进制数据信号,并由螺旋光轨的纵向形状生成颤动信号;A/D转换器51,将来自R/F单元50的TE信号(和/或FE信号)数字化;数字再生信号处理器30b,利用与二进制信号同步的内部时钟,由二进制数据信号恢复原始数据;ATIP(Absolute Time In Pre-Groove,预刻槽绝对时间)解码器60,对生成的颤动信号进行解码以提取ATIP数据,并输出其状态信号;驱动单元71,驱动主轴电机11和进给电机(sled motor)21;伺服单元70,根据伺服错误信号控制驱动单元71和拾取器20的传动机构;FG计数器72,对与主轴电机11的转速成比例输出的FG脉冲进行计数;以及微计算机80,确定当前记录位置是否在坏损区,并根据确定的结果调节记录速度。
图2为本发明的坏损区检测方法的实施例的流程图。以下详细说明由图1的光盘驱动器进行的图2的过程。
可写光盘10放置在安装于光盘驱动器中的托盘(未示出)上后,若连接的外部主机向微计算机80请求数据记录(S10),则微计算机80通过伺服单元70和驱动单元71驱动主轴电机11以预定的高速旋转。当可写光盘10高速旋转时,微计算机80移动光学拾取器20到可写光盘10上的目标位置。在目标位置,记录操作如下进行(S11)。
输入数据被数字记录信号处理器30a编码,并添加奇偶校验以提高再生的可靠性。带奇偶校验的编码数据构成了ECC块。信道比特编码器40将包含在来自数字记录信号处理器30a的ECC块中的比特流转换为适于写在可写光盘10上的相应PWM信号。PWM信号被微计算机80施加到输出写入电流的写入驱动器41上,写入电流的幅值已被设为最佳值,该最佳值由OPC(最佳能量标定)操作进行检测。
光学拾取器20将强度与写入电流成比例的激光束入射到可写光盘10上,从而输入数据被写到可写光盘10的程序区。此时,正如微计算机80要求的写入方案所规定的,在写入驱动器41中写入脉冲的电平和/或持续时间得到控制。
当执行上述的记录操作时,A/D转换器51将从R/F单元50输出的TE信号(和/或FE信号)数字化,ATIP解码器60对来自R/F单元50的颤动信号进行解码。作为解码的结果,ATIP解码器60输出被编码为如图3所示的ATIP数据。除了ATIP数据,如果颤动信号被成功解码,ATIP解码器60会产生‘ATIP_OK’信号,如果ATIP同步数据被周期性地检测到,则产生‘ATIP_sync’信号。‘ATIP_OK’和‘ATIP_sync’信号被发送到伺服单元70及微计算机80,而AIP数据只发送到微计算机80。
同时,微计算机80根据数字化的数据持续地检查TE信号的电平(S12),以了解该电平是否超过了极限电平,比如600[mV]。若超过极限电平(S20),则微计算机80开始测量超电平状态的持续时间。
对于测量,当TE信号电平超过极限电平时,微计算机80首先记住计数器72的FG脉冲计数值NFG,然后持续检查计数值NFG比记录的值提高了多少。即微计算机80持续计算当前计数值与记录值的差异,并检查其是否达到门限时间,门限时间对应于给定的记录速度下的预定旋转角度。
假设给定的门限时间(旋转角度)对应于一个FG脉冲,即计数值的一个增量,则当超电平状态持续时,微计算机80检查由FG计数器72计取的当前值是否变成‘所记住的值+1’。如图4所示,若TE信号的电平超过极限电平的状态持续了门限时间(S30),则微计算机80根据与ATIP数据(此数据从ATIP解码器60输入)相关的信号来确定意味着不稳定记录状态的超电平状态(S40)。
如果有一段时间没收到成功解码的ATIP数据,或没收到ATIP_sync信号(S50),则微计算机80认定这个不稳定记录状态是由当前记录区的缺陷引起的,从而执行缓存器欠载防止(buffer underrunpreventing)功能,请求停止对外部主机的数据传输,并暂时中止数据记录。
随后,微计算机80通过伺服单元70和驱动单元71适当降低当前记录速度(S51),并将拾取器20移到记录中止点,并从这点重新开始记录操作(S52)。
若记录速度降低,TE信号则相应具有较低的频带。若TE信号的频率降低,则如图5的伺服回路增益特性所示,伺服增益提高。高增益伺服回路可以为记录条件的剧烈变化实现很好的跟踪。前面讲述的坏损区检测和记录控制操作持续直到记录结束(S32)。
若超电平状态持续时间比门限时间短,或者即使在超电平状态持续时间超过门限时间时,ATIP数据也能成功解码,则微计算机80认定当前记录区并无缺陷,因此继续记录操作而不降低记录速度(S31)。
图6是本发明的坏损区检测方法另一实施例的流程图。以下详细说明由图1中的光盘驱动器进行的图6中的过程。
类似于前面的实施例,微计算机80控制记录操作(S110,S111),持续地检测伺服错误信号(即记录过程中的TE和FE信号)的电平(S112),并检查TE和FE信号的电平是否超过极限电平(其可能对于TE和FE而不同地设定)(S120)。
若TE或FE信号超过极限电平,则微计算机80检查该超电平的发生是否为周期性的(S122)。对于这个检查,每次TE和/或FE信号超过极限电平,微计算机80记住FG计数器71的计数值(S121)。若记录值每次增加的步长是一致的,例如对应于可写光盘10旋转一周的常数12,则微计算机80认定超电平的发生是周期性的。若不一致(S130),则微计算机80认定超电平的发生不是由记录区的缺陷引起的,而是由机械震动等引起,因此其继续记录操作而不降低记录速度(s131)。
如图7所示,如果确定TE信号的电平每当可写光盘10旋转一周就周期性地超过极限电平,则微计算机80认定当前记录区有缺陷,并暂时中断记录操作。随后,微计算机80通过伺服单元70和驱动单元71适当降低当前记录速度(S140),并重新检测伺服错误信号(S141)以了解伺服错误信号是否恢复到正常范围(S150)。若伺服错误信号在正常范围保持一段时间,则微计算机80判定当前位置已避过坏损区,因此重新开始记录操作(S151)。
前面讲述的根据本发明的可无错地检测可写光盘坏损区的方法确保了对坏损区的准确检测,由此可消除不必要的降速,并保证即使在坏损区也能成功地写入数据。
本领域技术人员将认识到,在不脱离本发明的精神和范围的情况下,本发明可以有各种改进和变化。因此,本发明涵盖落入所附权利要求及其等同物范围内的各种改进和变化。
Claims (11)
1.一种检测可写光盘坏损区的方法,包括以下步骤:
(a)检测记录操作中产生的伺服错误信号的电平;
(b)根据检测的电平检查伺服错误信号是否异常;
(c)检测记录操作中产生的周期性信号;以及
(d)根据检查结果和检测到的周期性信号确定记录区是否坏损。
2.根据权利要求1所述的方法,其中所述的周期性信号代表伺服错误信号异常状态发生的周期性。
3.根据权利要求1所述的方法,其中所述的步骤(c)检测调制进可写光盘的颤动光轨的信号,并检查检测到的信号是否正常。
4.根据权利要求3所述的方法,其中所述的步骤(c)根据调制进颤动光轨的信号是否被成功检测来判断被检测信号的正常性。
5.根据权利要求1所述的方法,其中所述的伺服错误信号是跟踪错误和聚焦错误信号之一。
6.根据权利要求1所述的方法,还包括根据坏损与否的确定结果降低当前记录速度的步骤。
7.一种检测可写光盘坏损区的方法,包括以下步骤:
(a)检测伺服错误信号和调制进颤动光轨的信号,这两种信号是在沿颤动光轨记录数据的过程中产生的;
(b)检查被测伺服错误信号的异常状态是否持续,以及被调制信号是否被成功检测;以及
(c)根据检查结果,确定记录区是否坏损。
8.根据权利要求7所述的方法,其中所述的伺服错误信号是跟踪错误信号。
9.一种检测可写光盘坏损区的方法,包括以下步骤:
(a)检测记录操作中产生的伺服错误信号的电平;
(b)根据检测到的电平,检查伺服错误信号是否异常;
(c)如果伺服错误信号处于异常状态,确定伺服错误信号的异常状态是瞬时的还是会对多个物理光轨产生影响;以及
(d)根据所述步骤(c)的确定结果来确定记录区是否坏损。
10.根据权利要求9所述的方法,其中如果所述异常状态周期性出现,则所述步骤(c)确定该异常状态会对多个物理光轨产生影响。
11.根据权利要求10所述的方法,其中如果所述异常状态以对应于可写光盘旋转一周的周期出现,则所述步骤(c)确定该异常状态会对多个物理光轨产生影响。
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KR10-2001-0061542A KR100424487B1 (ko) | 2001-10-05 | 2001-10-05 | 불량디스크 판정에 따른 데이터 기록방법 |
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JP3967870B2 (ja) * | 2000-06-23 | 2007-08-29 | パイオニア株式会社 | 光ディスク駆動装置におけるサーボ制御装置 |
JP4101088B2 (ja) * | 2003-03-07 | 2008-06-11 | パイオニア株式会社 | 情報記録装置、情報読取装置、情報記録方法、情報読取方法およびコンピュータプログラム |
-
2002
- 2002-03-13 US US10/095,699 patent/US7092334B2/en not_active Expired - Fee Related
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CN1311465C (zh) | 2007-04-18 |
US20020163326A1 (en) | 2002-11-07 |
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