CN1314973C - Single flash testing instrument of film solar battery assembly - Google Patents
Single flash testing instrument of film solar battery assembly Download PDFInfo
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- CN1314973C CN1314973C CNB2003101081031A CN200310108103A CN1314973C CN 1314973 C CN1314973 C CN 1314973C CN B2003101081031 A CNB2003101081031 A CN B2003101081031A CN 200310108103 A CN200310108103 A CN 200310108103A CN 1314973 C CN1314973 C CN 1314973C
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
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Abstract
The present invention relates to a single flash testing instrument for film solar battery components. A simulated light source is designed in a mode of the parallel connection of double pulse xenon lamps; after being connected in parallel, the simulated light source is connected to an output circuit of a main power source; either of the pulse xenon lamps is respectively connected with a corresponding high-current precombustion circuit; the high-current precombustion circuits are separated from the main power source by diodes; a loop coil is added to the output conducting wire of the main power source which is connected with the pulse xenon lamps; a capacitor which is connected in parallel with both ends of the pulse xenon lamps is connected in series with the loop coil; a gradually descending scanning mode is adopted for scanning a voltage by starting from the open circuit voltage of a component to be measured. The present invention can overcome the influence of capacitors of a hull cell on test results and can improve the luminescent spectrums of the pulse xenon lamps.
Description
Technical field:
The present invention relates to a kind of thin film solar battery module tester, relate in particular to a kind of single flash operation large area film solar module tester, can measure the volt-ampere characteristic of thin film solar cell, and and then obtain various unit for electrical property parameters, belong to the solar cell technical field of measurement and test.
Technical background:
The luminescent waveform of single flash operation pulsed solar module tester need have one section smooth quasi-continuous simulated light between light emission period; the general primary power with LC network discharging function that adopts of conventional single flash operation pulsed solar module tester comes to be the pulse xenon lamp power supply; but because LC network and pulse xenon lamp impedance matching are difficult to guarantee well; therefore luminescent waveform usually can occur putting and the too fast problem of light intensity decline, and is very unfavorable to the accurate test of solar cell.
The luminescent spectrum of pulsed solar module tester is general and standard solar cell spectral distribution gap is far away, the spectral distribution that the mode that the conventional solar cell component tester all adopts spectrum to correct is improved tester distributes to satisfy the standard solar spectrum, but the method that this spectrum is corrected is the standard spectrum that obtains tester on the basis of sacrificing the tester light source intensity to distribute, and carry out the specific spectrum of spectrum rectification needs and correct optical filter, optical filter generally is a multicoating, the life-span of multilayer film is generally all very short, manufacturing cost is than higher, the hot spot of solar module tester is generally very big, the optical filter bore that needs is very big, and this has all increased the technical difficulty and the commercial cost of tester.
The test of conventional crystalline silicon solar cell modules generally is to use pulsed solar cell tester or pulsed solar simulator, pulsed solar module tester is divided into repeatedly flash test and single flash operation test again, particularly the component tester of latter's single flash operation is because its test rate height, be suitable for measuring fast and measuring automatically, thereby has a technical advantage preferably, but, existing thin film solar cell (for example amorphous silicon film solar battery) but can not be measured by this kind pulsed component tester, it is main because the minority carrier life time of thin film solar cell is littler than the minority carrier life time of conventional crystal-silicon solar cell, the pulsed light pulsewidth is too little, the light activated minority carrier of pulse can disappear by surface recombination and bluk recombination very soon with the disappearance of excitation pulse light, can not fully come out carrier transport through connecting lead, measurement result is littler than the measurement result under the normal steady-state light like this, particularly the area of hull cell is big more, output current is big more, the difference of this measurement result is big more, from the angle of solar cell equivalent electrical circuit, the reason that causes this result is the influence of the equivalent capacity of thin film solar cell.Conventional pulsed solar module tester is not considered the capacity effect of thin film solar cell, thereby all can not be used for the test of thin film solar battery module.The LAPSS-II of correlation technique Spectrum LAB S. A..
When the LC of primary power network discharge loop during with the pulse xenon lamp impedance matching of being powered, the light that pulse xenon lamp sends is only near square wave, and the impedance matching condition is
The evolution of the inductance of this conditional request LC network and the ratio of electric capacity will equate with the impedance of pulse xenon lamp, because the characteristic impedance of tubulose xenon lamp is directly proportional with its die opening, do in the sun component tester of light source at use tubulose xenon lamp, inductance needs very big, but general inductance is difficult to do greatly, and inductance greatly just means that volume is big, and weight is big, this is to reducing the tester volume, and it is unfavorable to alleviate tester weight.
Summary of the invention:
The objective of the invention is to above-mentioned deficiency, a kind of Single flash testing instrument of film solar battery assembly is provided, overcome of the influence of the electric capacity of hull cell, stop the quick increase of discharge current, improve the pulse xenon lamp luminescent spectrum test result at prior art.
In order to realize such purpose, in the technical scheme of the present invention, on the output lead of the primary power that connects pulse xenon lamp, designed the winding coil, and at the electric capacity of the two ends of a pulse xenon lamp constant volume in parallel, this electric capacity is connected with the winding coil, the electric capacity calculating means:
(wherein C is an electric capacity, and L is the inductance of winding coil, R
0Characteristic impedance for xenon lamp.The inductance of winding coil and shunt capacitance can reduce the degree of putting on the one hand, can play the energy storage effect again on the other hand, reduce the speed that light intensity descends.Simultaneously, so just can improve the luminescent waveform of the simulator of tester.
The present invention adopts the plated film optical filter to carry out technology and cost burden that the spectrum rectification brings in order to solve the conventional solar cell tester, designed special big electric current pre-burning circuit, this circuit is with the output lead parallel connection of the quasi-continuous light generating power supply of pulse xenon lamp, be the pulse xenon lamp power supply simultaneously, the pre-burning circuit of big electric current makes the xenon lamp build-up of luminance, and quasi-continuous light generating power supply makes xenon lamp send extremely strong pulse square wave light.The pre-burning circuit of big electric current makes the inert gas in the xenon lamp pipe be the high-temperature plasma state, in case the terminal voltage greater than the pre-burning xenon lamp is added to the xenon lamp two ends, high pressure triggers simultaneously, will send high light, the concentration of high-temperature plasma state is high more, ion continuous spectrum compound and bremstrahlen is just strong more, and the atomic energy level transition is that the line spectrum of feature is just weak more, and overall spectrum just meets the standard A M1.5 of solar spectrum more like this.
The present invention is for the influence to test result of the capacity effect that overcomes tested thin film solar battery module in pulsed solar cell tester, designed a kind of scanning voltage applying method that successively decreases gradually, the scanning voltage that is applied on the tested solar cell begins to be decremented to zero gradually by certain step number from the open-circuit voltage that is higher than tested solar module, the output current that tested battery begins most in this process is zero, along with successively decreasing gradually of scanning voltage, the output current of MUT module under test increases gradually, reach maximal value-short-circuit current at last, like this, that just can avoid routine causes MUT module under test need reach the problem of short-circuit current at the very start from the zero scanning voltage applying method that progressively increases, thereby effectively solves the influence of the capacity effect of solar cell to test result.
The present invention is in order to reduce the needs of solar cell tester to the inductance value of inductance in the LC network discharge loop of primary power, the mode of two xenon lamps in parallel of design, primary power is two xenon lamp power supplies in parallel, thereby minimizing inductance L, suitably increase capacitor C, can reduce the volume and weight of the primary power of solar module tester.
For satisfying the slow requirement of response speed of thin film solar battery module test, to elongate the time of discharge as far as possible, and to guarantee that discharge current is constant in a period of time (for example 10ms), the present invention increases winding on the main traverse line of power supply output for this reason, this winding one encloses and coils, big electric current flows through winding, can in winding, form eddy current, eddy current can stop the increase of electric current, thereby help to allow discharge current in the regular hour, keep a steady state value, like this, the strength of discharge of xenon lamp and luminous intensity also can form a steady state value, thereby satisfy the requirement of hull cell test.
Description of drawings:
Fig. 1 is the output main traverse line and the pulse xenon lamp connection layout of pulse xenon lamp primary power of the present invention.
As shown in Figure 1, connect one on the output main traverse line of pulse xenon lamp primary power and recover ring coil, the two ends of pulse xenon lamp electric capacity in parallel.
Fig. 2 takes the structural representation of line ring coil last time as the leading factor.
Among Fig. 2,1 is hollow porcelain tube, and 2 are lead-in wire, and 3 is the winding coil.
Fig. 3 is a big electric current pre-burning circuit block diagram of the present invention.
Fig. 4 is the two xenon lamps and the primary power annexation synoptic diagram of parallel connection of the present invention.
Fig. 5 is the pulse square wave light of the present invention's simulator output after the primary power output lead increases winding.
Embodiment:
Below in conjunction with accompanying drawing technical scheme of the present invention is described in further detail.
The present invention has designed the winding coil on the output lead of the primary power that connects pulse xenon lamp, and at the electric capacity of the two ends of a pulse xenon lamp constant volume in parallel, as shown in Figure 1.Electric capacity connect with the electric capacity of pulse xenon lamp parallel connection with the winding coil
Wherein L is the inductance of winding coil, R
0Characteristic impedance for xenon lamp.
The structure of main traverse line ring coil last time as shown in Figure 2.Main traverse line winding coil 3 is 16mm
2Sub-thread red copper lead, one encloses on hollow porcelain tube 1, the diameter of hollow porcelain tube can calculate according to required induction reactance size, if the speed that the light intensity of pulse xenon lamp descends is big, just adopt large diameter porcelain tube, lead-in wire 2 reaches with pulse xenon lamp and is connected with the electric capacity of pulse xenon lamp parallel connection, and main traverse line winding coil and electric capacity will mate.
When the light wave shape that pulse xenon lamp is sent when the way that adopts main traverse line winding coil to add the electric capacity coupling is very square, can suitably increase or reduce the number of turns of main traverse line winding coil, to overcome the influence of coil resistance to impedance matching.
Big electric current pre-burning circuit of the present invention makes pulse xenon lamp be in degree of depth pre-igniting state before flash of light, is beneficial to the improvement of xenon lamp luminescent spectrum, according to the xenon lamp characteristics of luminescence, when the current density of xenon lamp to 1700A/cm
2The time, the luminescent spectrum of pulse xenon lamp is just almost consistent with solar spectrum, colour temperature just can reach 6000 degree of sunshine colour temperature, big electric current pre-burning circuit of the present invention makes xenon lamp be in degree of depth pre-igniting state for a long time, the plasma equitemperature is very high in the xenon lamp, and the characteristic impedance of xenon lamp is little more a lot of than the characteristic impedance of general pre-igniting state, and tube voltage drop is also little a lot, in the time of so just guaranteeing under smaller sparking voltage flashlamp discharge, current density just can reach 1700A/cm
2, the big electric current pre-burning circuit block diagram of the present invention's design as shown in Figure 3.
In the big electric current pre-burning circuit, the output of ac step-up transformer connects adding circuit through rectification circuit, the output that exchanges isolating transformer also is connected to adding circuit, the output of adding circuit is connected to the pulse xenon lamp discharge end through current-limiting circuit, the input end of high-voltage triggering circuit connects interchange isolating transformer and current-limiting circuit respectively, and output connects pulse xenon lamp.
220V exchanges and becomes the 900V high-voltage alternating by ac step-up transformer (step-up ratio 1: 4.5), be rectified into the 1500V direct current through rectification circuit, simultaneously 220V exchanges interchange after AC transformer (step-up ratio 1: 1) is isolated and 1500V direct current in the adding circuit addition, the voltage peak that comes out of adding circuit is 1900V like this, this combined-voltage is added on the pulse xenon lamp discharge end through current-limiting circuit, high-voltage triggering circuit is searched high voltage (crest voltage 1900V) from current-limiting circuit, from the voltage that AC transformer is come out, search peak phase, when external trigger produces trigger pulse, sequential circuit in the high-voltage triggering circuit boosts into high pressure more than the 30000V to crest voltage 1900V when the peak phase, remove the trigger pulse xenon lamp, adding circuit and current-limiting circuit make pulse xenon lamp be in degree of depth pre-igniting state.
The analog light source of solar module tester of the present invention is designed to the form of dipulse xenon lamp parallel connection, receive after the parallel connection on the outlet line of primary power, each pulse xenon lamp all links to each other with separately big electric current pre-burning circuit, big electric current pre-burning circuit is with separating with diode between the primary power, as shown in Figure 4: the negative pole of the pulse xenon lamp of two parallel connections is received the negative pole of two big electric current pre-burning circuit and the negative pole of primary power output jointly, the positive pole of two pulse xenon lamps links to each other, and receive the positive pole of big electric current pre-burning circuit separately respectively by a diode, link to each other with the positive pole of primary power by a diode simultaneously.
In the quasi-continuous simulator of single flash operation, measure solar cell, be easy to ignore the capacity effect of solar module, but this capacity effect but is influential to test result, the quasi-continuous simulated light burst length of single flash operation is short more, the influence of capacity effect is also just big more, the current-responsive speed that finally shows as solar cell is not high enough, thin film solar battery module particularly, short-circuit current is big, electric capacity is also big, the pulsewidth of current-responsive speed relative pulse light just seems very slow, just can not the testing film solar cell according to the method for testing of the solar cell tester of routine.
The present invention has designed a kind of scanning voltage applying method that successively decreases gradually in order to overcome the influence of capacity effect to test result, and its step is as follows:
At first, set a scanning voltage greater than tested solar module open-circuit voltage, be applied on the tested solar module, the electric current of tested solar module is output as zero or negative value, gradually reduce scanning voltage then, reduce to the open-circuit voltage of tested solar module when scanning voltage after, the output current of tested solar module begins to increase by zero, along with scanning voltage gradually reduces zero, the output current of tested solar module is increased to short-circuit current, like this, scanning voltage scans from the mode that the MUT module under test open-circuit voltage begins to successively decrease gradually, that just can avoid routine causes MUT module under test need reach the problem of short-circuit current at the very start from the zero scanning voltage applying method that progressively increases, thereby effectively solves the influence of the capacity effect of solar cell to test result.
Claims (4)
1, a kind of Single flash testing instrument of film solar battery assembly, comprise power-supply system, light path system and computer measurement and control system, it is characterized in that analog light source adopts dipulse xenon lamp parallel way, the negative pole of two pulse xenon lamps is received the negative pole of two big electric current pre-burning circuit and the negative pole of primary power output jointly, the positive pole of two pulse xenon lamps links to each other, and receive the positive pole of big electric current pre-burning circuit separately respectively by a diode, link to each other with the positive pole of primary power by a diode simultaneously, on the output lead of the primary power that connects pulse xenon lamp, increase the winding coil, an electric capacity in the parallel connection of pulse xenon lamp two ends is connected electric capacity with the winding coil
Wherein L is the inductance of winding coil, R
0Be the characteristic impedance of xenon lamp, the scanning voltage on the tested solar cell adopts the mode that applies that begins to successively decrease gradually from the MUT module under test open-circuit voltage.
2, Single flash testing instrument of film solar battery assembly as claimed in claim 1 is characterized in that described winding coil is 16mm
2Sub-thread red copper lead, one encloses on hollow porcelain tube, its lead-in wire is connected with pulse xenon lamp with the xenon lamp shunt capacitance.
3, Single flash testing instrument of film solar battery assembly as claimed in claim 1, it is characterized in that in the described big electric current pre-burning circuit, the output of ac step-up transformer connects adding circuit through rectification circuit, the output that exchanges isolating transformer also is connected to adding circuit, the output of adding circuit is connected to the pulse xenon lamp discharge end through current-limiting circuit, the input end of high-voltage triggering circuit connects interchange isolating transformer and current-limiting circuit respectively, search high voltage from current-limiting circuit, from the voltage that the interchange isolating transformer comes out, search peak phase, its output connects pulse xenon lamp, the crest voltage trigger pulse xenon lamp that boosts when the peak phase, adding circuit and current-limiting circuit make pulse xenon lamp be in degree of depth pre-igniting state by the sequential circuit in the high-voltage triggering circuit.
4, Single flash testing instrument of film solar battery assembly as claimed in claim 1, it is characterized in that described scanning voltage applies mode and is: at first set a scanning voltage greater than tested solar module open-circuit voltage, be applied on the tested solar module, the electric current of tested solar module is output as zero or negative value, gradually reduce scanning voltage then, reduce to the open-circuit voltage of tested solar module when scanning voltage after, the output current of tested solar module begins to increase by zero, along with scanning voltage gradually reduces zero, the output current of tested solar module is increased to short-circuit current, with the influence to test result of the capacity effect that solves solar cell.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNB2003101081031A CN1314973C (en) | 2003-10-23 | 2003-10-23 | Single flash testing instrument of film solar battery assembly |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNB2003101081031A CN1314973C (en) | 2003-10-23 | 2003-10-23 | Single flash testing instrument of film solar battery assembly |
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| Publication Number | Publication Date |
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| CN1538187A CN1538187A (en) | 2004-10-20 |
| CN1314973C true CN1314973C (en) | 2007-05-09 |
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| Application Number | Title | Priority Date | Filing Date |
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| CNB2003101081031A Expired - Fee Related CN1314973C (en) | 2003-10-23 | 2003-10-23 | Single flash testing instrument of film solar battery assembly |
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Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103576080A (en) * | 2013-11-15 | 2014-02-12 | 上海华岭集成电路技术股份有限公司 | Chip scanning voltage testing method |
| CN107015087B (en) * | 2017-05-17 | 2019-04-26 | 华中科技大学 | A kind of capacitive property detection method of photoelectric device |
| CN110361089A (en) * | 2019-06-13 | 2019-10-22 | 上海复瞻智能科技有限公司 | A kind of transient state photometric detection device of optical analog |
| CN113543399B (en) * | 2021-09-14 | 2022-04-29 | 中国工程物理研究院流体物理研究所 | Pulse xenon lamp light source for realizing square wave characteristic output, control method and test system |
| CN114076897B (en) * | 2021-11-10 | 2024-03-12 | 陕西众森电能科技有限公司 | Electrical performance testing method for solar cell and assembly |
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| CN1010257B (en) * | 1986-03-01 | 1990-10-31 | 西安交通大学 | Technical embodiment for a test equipment of solar cells using short pulse |
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| JP2001274438A (en) * | 2000-03-28 | 2001-10-05 | Honda Motor Co Ltd | Device and method for measuring characteristics of rear electrode solar cell |
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| CN1335514A (en) * | 2001-05-31 | 2002-02-13 | 上海交通大学 | Solar cell assembly testing instrument with pulse xenon lamp linear light source bench |
| JP2002270873A (en) * | 2001-03-13 | 2002-09-20 | Fuji Electric Corp Res & Dev Ltd | Method and apparatus for continuously and automatically measuring solar battery cell characteristics |
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2003
- 2003-10-23 CN CNB2003101081031A patent/CN1314973C/en not_active Expired - Fee Related
Patent Citations (6)
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| CN1010257B (en) * | 1986-03-01 | 1990-10-31 | 西安交通大学 | Technical embodiment for a test equipment of solar cells using short pulse |
| JP2001091567A (en) * | 1999-09-21 | 2001-04-06 | Mitsubishi Heavy Ind Ltd | Solar cell evaluating apparatus |
| JP2001274438A (en) * | 2000-03-28 | 2001-10-05 | Honda Motor Co Ltd | Device and method for measuring characteristics of rear electrode solar cell |
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Non-Patent Citations (1)
| Title |
|---|
| 太阳电池测试系统 樊昕昱等，中国第六届光伏会议论文集 2000 * |
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| CN1538187A (en) | 2004-10-20 |
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Assignee: Shanghai Hi-Show PV Science & Technology Co., Ltd. Assignor: Shanghai Jiao Tong University Contract fulfillment period: 2009.9.1 to 2014.8.31 contract change Contract record no.: 2009310000242 Denomination of invention: Single flash testing instrument of film solar battery assembly Granted publication date: 20070509 License type: General permission Record date: 2009.9.30 |
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Free format text: COMMON LICENSE; TIME LIMIT OF IMPLEMENTING CONTACT: 2009.9.1 TO 2014.8.31; CHANGE OF CONTRACT Name of requester: SHANGHAI HI-SHOW PHOTOVOLTAIC SCIENCE +TECHNOLOGY Effective date: 20090930 |
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