CN1335514A - Solar cell assembly testing instrument with pulse xenon lamp linear light source bench - Google Patents
Solar cell assembly testing instrument with pulse xenon lamp linear light source bench Download PDFInfo
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- CN1335514A CN1335514A CN 01113031 CN01113031A CN1335514A CN 1335514 A CN1335514 A CN 1335514A CN 01113031 CN01113031 CN 01113031 CN 01113031 A CN01113031 A CN 01113031A CN 1335514 A CN1335514 A CN 1335514A
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Abstract
The solar cell assembly testing instrument adopts pulse xenon lamp linear light source and paraboloid scattered reflection, filtering system and silk screen between the light source and the test plane, for required light homogeneity and spectrum. It has constant voltage electronic load for measurement, open circuit voltage testing circuit, and linear light sources controlled by the xenon lamp power circuit. The photocurrent of the tested assembly under constant voltage is latched, sampled and stored by the computerized measurement and control mechanism. Under inconsistent light pulse, the present invention can measure the electric performance of the tested assembly and obtain I-V curve accurately by means of spot-by-spot flash measurement and measured data fitting.
Description
The present invention relates to a kind of solar module tester, relate in particular to a kind of solar cell assembly testing instrument with pulse xenon lamp linear light source bench, can measure the volt-ampere characteristic of solar module, and and then obtain various unit for electrical property parameters, belong to the solar cell technical field of measurement and test.
Test equipment of solar cells generally is by solar simulator, complete or the support equipment that several sections such as electronic load and computer data processing system is formed, wherein solar simulator stable state arranged with two kinds of pulseds, the steady-state simulation device is used for the testing solar battery assembly, face homogeneity, stability, power consumption is big, key issues such as MUT module under test temperature rise, be difficult for solving, therefore, in the solar module tester, take the scheme of steady-state simulation device to phase out abroad, the substitute is the pulsed simulator, be loaded with multiple for the corresponding Electronic Negative of pulsed simulator, such as: bridge type, the field effect tubular type, the adjustable resistance load, these electronic loads respectively have characteristics, but all need light-pulse generator than long arc as the simulator light source, finish the collection of data and the drafting of curve in a pulse, if chopped pulse light source arc length, the requirement that has then improved the logarithmic mode change-over circuit.
Conventional pulsed simulator mostly adopts pointolite, shone on the tested surface after specific reflex reflector reflection and the filtering apparatus filtration, in order to obtain the certain homogeneity on the tested surface, want the reflex reflector of processing and fabricating complexity or increase light source with by the spacing of side, the spacing that has can reach ten meters more than, need occupy several rooms, like this, the power consumption of light source, the cost of entire equipment and use cost are quite high.Correlation technique has the SPI-SUN SIMULATOR 240A Photovoltaic Module Tester (http://www.spirecorp.com) of SPIRE company, and what this technology adopted is exactly pointolite, and the reflex reflector difficulty of processing is big, the light path debug difficulties.
The objective of the invention is to the above-mentioned deficiency at prior art, design provides a kind of solar cell assembly testing instrument with pulse xenon lamp linear light source bench, makes it compact conformation, floor area is little, can realize illumination uniformity, and the automatic round-off error of energy, repeatability and the accuracy measured guaranteed.
For realizing such purpose, in the technical scheme of the present invention, the long arc pulse simulator of employing light impulse length 5ms reduces the frequency response requirement to the components and parts of test circuit, adopt the adjustable pulse xenon lamp line source of Three Degree Of Freedom, parabolic diffuse reflection as reflex reflector, filter system and the used silk screen of raising homogeneity that spectrum is corrected also are housed, to meet the requirements of homogeneity and spectrum between light source and the tested surface.In order accurately to measure the open-circuit voltage of cell panel, also be provided with one and overlap independently open-circuit voltage test circuit, with computer sampling, calculating, measurement data is revised automatically.
The present invention adopts pulse xenon lamp to be because the spectrum and the daylight of xenon lamp are the most approaching in all electric light sources, in order to obtain the better inhomogeneity light in tested plane in short-range range of light.Line source is contained on the Three Degree Of Freedom tunable optical source(-)holder, is realizing 5% with interior homogeneity between light source and the tested surface under the prerequisite of the 1.5m left and right sides, and this structure is convenient to make less desk-top instrument, to using site requirements not high.
The present invention adopts and decides voltage electronic load (pure resistive) and use load as measuring, and its voltage is added in the both sides of tested solar cell, and is subjected to computer control.Decide the voltage electronic load and can overcome conventional load resistance and can not arrive zero-sum to infinitely-great shortcoming, also overcome the voltage-controlled shortcoming of resistance inconvenience of field effect tubular type electronic load.Decide the voltage electronic load and also have and the computer interface convenience, control realizes characteristics such as easy.
The present invention is also at the non-substantivity of deciding voltage electronic load measure battery open circuit, independently open-circuit voltage test circuit is set, realize a kind of after directly measuring open-circuit voltage the method to survey curve automatic straightening, its ultimate principle is in proportion curve to be carried out the voltage correction.
The present invention is a model of fit with the solar cell biexponential model, adopts the accurate match solar module of number theory method I-V curve, realizes by tested curve accurate Calculation resistance in series R
s, parallel resistance R
Sh, photogenerated current I
L, battery important parameter such as curve factors A.
The present invention adopts the pulse xenon lamp of long arc to make the simulator light source, has overcome the weakness of steady-state simulation device, has realized the homogeneity of illumination in 1.3 * 0.6m scope; Adopt and decide the voltage electronic load, complete I-V curve collection is finished once in repeatedly flash of light sampling, has avoided the frequency requirement of logarithmic mode converter circuit; Further, the present invention adopts simple accurately scheme to measure open-circuit voltage, and the I-V curve that error may occur is revised automatically, has guaranteed repeatability and the accuracy measured.
Below in conjunction with accompanying drawing technical scheme of the present invention is described in further detail.
Fig. 1 is a solar simulator principle schematic of the present invention.
As shown in the figure, the present invention adopts Three Degree Of Freedom pulse xenon lamp line source, parabolic diffuse reflection solar simulator, the pulsed light that line source 1 sends by filter system 3 and silk screen 4, arrives plane, solar module place 5 after parabolic diffuse device 2 reflections.
Fig. 2 is a Circuits System block scheme of the present invention.
As shown in the figure, the Three Degree Of Freedom pulse xenon lamp line source 1 that the present invention adopts, by xenon lamp power supply circuit 15 controls that link to each other with computer measurement and control device 12, line source 1 is through parabolic diffuse device 2, reflection ray projects plane, MUT module under test place 5 at last through filter system 3 and silk screen 4.Reference battery 7 and MUT module under test 6 are installed on tested surface, and the photocurrent that reference battery 7 produces converts voltage and 13 comparisons of reference level circuit to through amplifying comparator circuit 9.Amplify comparator circuit 9 and link to each other with electric current latch cicuit 10, decide the voltage of voltage electronic load 8 and determine by computer measurement and control device 12 through gate circuit 11.The signal that produces when reference battery 7 is during greater than the signal of reference level circuit 13, gate circuit 11 starting current latch cicuits 10, the photocurrent that produces under certain certain voltage that computer measurement and control device 12 is determined of MUT module under test 6 latchs through electric current latch cicuit 10 like this, by 12 samplings of computer measurement and control device, be saved in computing machine again.So finish the collection of a point on the I-V curve, repeatedly glisten, repeatedly gather the point that just can obtain on many I-V, last computer drawing curve also calculates the unit for electrical property parameters of MUT module under test, measures the PN junction temperature of current battery before calculating by semiconductor point thermometer 14.
The present invention is in order accurately to measure the open-circuit voltage of cell panel, also is provided with one and overlaps the open-circuit voltage that open-circuit voltage test circuit is independently measured battery, for computer sampling, calculating, correction.
Fig. 3 is an open-circuit voltage test circuit block diagram of the present invention.
Among the figure, the open-circuit voltage test circuit comprises voltage hold circuit 16 and voltage latch 17, MUT module under test 6 is under open circuit, its voltage is latched by voltage latch 17 behind voltage hold circuit 16 again, and voltage latch 17 is to latch under gate circuit 11 controls, is etalon optical power 100mW/cm to guarantee this open-circuit voltage
2Under open-circuit voltage, and then by computer measurement and control device 12 sampling and keep, the certain program of machine is calculated and the output correction result as calculated.
Fig. 4 adopts the I-V J curve effectJ figure of number theory method match for the present invention.
As shown in the figure, the present invention is a model of fit with the solar cell biexponential model, and accurately match solar module I-V curve has avoided some line or level and smooth slotting some I-V curve that causes unsmooth.Method of the present invention is to the accurately match of various I-V curves.
The present invention adopts pulse xenon lamp to make electric light source, make spectrum reach the standard of solar simulator easily, and commercial pulse xenon lamp ratio is easier to buy, adopt parabolic diffuse reflection and line source, can realize uniformity of light, adopt and decide the voltage electronic load, can be under the inconsistent prerequisite of light pulse repeatability, by the measuring method of pointwise flash of light, realize the accurate drafting of I-V curve and the accurate measurement of MUT module under test unit for electrical property parameters.Open-circuit voltage and temperature independent measurement realize the reliability of test result correction adopting number theory method to carry out curve fitting, guarantee the I-V curve accurately with level and smooth.Compact conformation of the present invention is convenient to make less desk-top instrument, to using site requirements not high.
Claims (2)
1, a kind of solar cell assembly testing instrument with pulse xenon lamp linear light source bench, it is characterized in that adopting pulse xenon lamp is line source (1), adopt and decide voltage electronic load (8) as the measurement load, and the open-circuit voltage test circuit is set, line source (1) is by xenon lamp power supply circuit (15) control that links to each other with computer measurement and control device (12), the pulsed light that sends is through parabolic diffuse device (2), filter system (3) and silk screen (4), arrive MUT module under test (6) plane, place (5), the photocurrent that reference battery on the tested surface (7) produces converts voltage and reference level circuit (13) comparison to through amplifying comparator circuit (9), amplifying comparator circuit (9) links to each other with electric current latch cicuit (10) through gate circuit (11), deciding the voltage of voltage electronic load (8) is determined by computer measurement and control device (12), by computer measurement and control device (12) curve plotting and calculate the unit for electrical property parameters of MUT module under test (6), measure the PN junction temperature of current battery simultaneously by semiconductor point thermometer (14).
2, as the said solar cell assembly testing instrument with pulse xenon lamp linear light source bench of claim 1, it is characterized in that the open-circuit voltage test circuit comprises voltage hold circuit (16) and voltage latch (17), MUT module under test (6) is under open circuit, its voltage is latched by voltage latch (17) behind voltage hold circuit (16) again, by computer measurement and control device (12) sampling and maintenance, voltage latch (17) is controlled by gate circuit (11).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNB011130318A CN1141597C (en) | 2001-05-31 | 2001-05-31 | Solar cell assembly testing instrument with pulse xenon lamp linear light source bench |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNB011130318A CN1141597C (en) | 2001-05-31 | 2001-05-31 | Solar cell assembly testing instrument with pulse xenon lamp linear light source bench |
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| CN1335514A true CN1335514A (en) | 2002-02-13 |
| CN1141597C CN1141597C (en) | 2004-03-10 |
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Cited By (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1314973C (en) * | 2003-10-23 | 2007-05-09 | 上海交通大学 | Single flash testing instrument of film solar battery assembly |
| CN1320304C (en) * | 2003-10-23 | 2007-06-06 | 上海交通大学 | Light path device with laterally standing box for large-area tester solar battery |
| CN100412542C (en) * | 2005-10-01 | 2008-08-20 | 中国科学院等离子体物理研究所 | Method for real-timely testing performance of multi-channel photovoltaic cell |
| CN101806814A (en) * | 2010-02-26 | 2010-08-18 | 常州亿晶光电科技有限公司 | Exposing frame for use in attenuation test of solar battery |
| CN101806862A (en) * | 2010-02-26 | 2010-08-18 | 常州亿晶光电科技有限公司 | Simulation light source device for solar battery attenuation test |
| CN101806813A (en) * | 2010-02-26 | 2010-08-18 | 常州亿晶光电科技有限公司 | Compression clamp for solar battery attenuation test |
| CN101158713B (en) * | 2007-09-01 | 2010-10-13 | 李江淮 | Compact type energy conserving lamp magnetic characteristic curve definitions and measurement method thereof |
| TWI413270B (en) * | 2008-03-12 | 2013-10-21 | Ind Tech Res Inst | Method for forming optimal characteristic curves of solar cell and system thereof |
| CN103399246A (en) * | 2013-08-29 | 2013-11-20 | 雷海平 | Automatic detection and classification control system for electric properties of battery piece |
| CN103916078B (en) * | 2013-01-04 | 2017-02-08 | 北京汉能创昱科技有限公司 | Testing method of low-light performance of solar cell assembly |
-
2001
- 2001-05-31 CN CNB011130318A patent/CN1141597C/en not_active Expired - Fee Related
Cited By (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1320304C (en) * | 2003-10-23 | 2007-06-06 | 上海交通大学 | Light path device with laterally standing box for large-area tester solar battery |
| CN1314973C (en) * | 2003-10-23 | 2007-05-09 | 上海交通大学 | Single flash testing instrument of film solar battery assembly |
| CN100412542C (en) * | 2005-10-01 | 2008-08-20 | 中国科学院等离子体物理研究所 | Method for real-timely testing performance of multi-channel photovoltaic cell |
| CN101158713B (en) * | 2007-09-01 | 2010-10-13 | 李江淮 | Compact type energy conserving lamp magnetic characteristic curve definitions and measurement method thereof |
| TWI413270B (en) * | 2008-03-12 | 2013-10-21 | Ind Tech Res Inst | Method for forming optimal characteristic curves of solar cell and system thereof |
| CN101806814A (en) * | 2010-02-26 | 2010-08-18 | 常州亿晶光电科技有限公司 | Exposing frame for use in attenuation test of solar battery |
| CN101806813A (en) * | 2010-02-26 | 2010-08-18 | 常州亿晶光电科技有限公司 | Compression clamp for solar battery attenuation test |
| CN101806862A (en) * | 2010-02-26 | 2010-08-18 | 常州亿晶光电科技有限公司 | Simulation light source device for solar battery attenuation test |
| CN101806813B (en) * | 2010-02-26 | 2014-05-21 | 常州亿晶光电科技有限公司 | Compression clamp for solar battery attenuation test |
| CN101806814B (en) * | 2010-02-26 | 2014-05-21 | 常州亿晶光电科技有限公司 | Exposing frame for use in attenuation test of solar battery |
| CN103916078B (en) * | 2013-01-04 | 2017-02-08 | 北京汉能创昱科技有限公司 | Testing method of low-light performance of solar cell assembly |
| CN103399246A (en) * | 2013-08-29 | 2013-11-20 | 雷海平 | Automatic detection and classification control system for electric properties of battery piece |
| CN103399246B (en) * | 2013-08-29 | 2015-12-23 | 烟台市牟平海联联合有限责任公司 | A kind of electrical performance of cell detects and control system of classifying automatically |
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| Publication number | Publication date |
|---|---|
| CN1141597C (en) | 2004-03-10 |
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