CN1234174C - 高压p型金属氧化物半导体管 - Google Patents
高压p型金属氧化物半导体管 Download PDFInfo
- Publication number
- CN1234174C CN1234174C CNB021383936A CN02138393A CN1234174C CN 1234174 C CN1234174 C CN 1234174C CN B021383936 A CNB021383936 A CN B021383936A CN 02138393 A CN02138393 A CN 02138393A CN 1234174 C CN1234174 C CN 1234174C
- Authority
- CN
- China
- Prior art keywords
- oxygen
- grid
- field
- electrode
- voltage
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 229910044991 metal oxide Inorganic materials 0.000 title claims abstract description 14
- 150000004706 metal oxides Chemical class 0.000 title claims abstract description 14
- 239000004065 semiconductor Substances 0.000 title abstract description 7
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 claims abstract description 44
- 229910052760 oxygen Inorganic materials 0.000 claims abstract description 39
- 239000001301 oxygen Substances 0.000 claims abstract description 39
- 239000000758 substrate Substances 0.000 claims abstract description 6
- IZJSTXINDUKPRP-UHFFFAOYSA-N aluminum lead Chemical compound [Al].[Pb] IZJSTXINDUKPRP-UHFFFAOYSA-N 0.000 claims abstract description 4
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 abstract description 2
- 230000000694 effects Effects 0.000 abstract description 2
- 229910052710 silicon Inorganic materials 0.000 abstract description 2
- 239000010703 silicon Substances 0.000 abstract description 2
- 230000001590 oxidative effect Effects 0.000 abstract 2
- 230000005684 electric field Effects 0.000 abstract 1
- 230000003313 weakening effect Effects 0.000 abstract 1
- 238000004519 manufacturing process Methods 0.000 description 4
- 230000015556 catabolic process Effects 0.000 description 3
- 230000000295 complement effect Effects 0.000 description 3
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000009792 diffusion process Methods 0.000 description 1
- 230000005685 electric field effect Effects 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000002360 preparation method Methods 0.000 description 1
- 239000002210 silicon-based material Substances 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/772—Field effect transistors
- H01L29/78—Field effect transistors with field effect produced by an insulated gate
- H01L29/7833—Field effect transistors with field effect produced by an insulated gate with lightly doped drain or source extension, e.g. LDD MOSFET's; DDD MOSFET's
- H01L29/7835—Field effect transistors with field effect produced by an insulated gate with lightly doped drain or source extension, e.g. LDD MOSFET's; DDD MOSFET's with asymmetrical source and drain regions, e.g. lateral high-voltage MISFETs with drain offset region, extended drain MISFETs
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/40—Electrodes ; Multistep manufacturing processes therefor
- H01L29/402—Field plates
- H01L29/404—Multiple field plate structures
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Ceramic Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Insulated Gate Type Field-Effect Transistor (AREA)
Abstract
Description
Claims (3)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CNB021383936A CN1234174C (zh) | 2002-09-30 | 2002-09-30 | 高压p型金属氧化物半导体管 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CNB021383936A CN1234174C (zh) | 2002-09-30 | 2002-09-30 | 高压p型金属氧化物半导体管 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN1487594A CN1487594A (zh) | 2004-04-07 |
CN1234174C true CN1234174C (zh) | 2005-12-28 |
Family
ID=34147234
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CNB021383936A Expired - Fee Related CN1234174C (zh) | 2002-09-30 | 2002-09-30 | 高压p型金属氧化物半导体管 |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN1234174C (zh) |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1324717C (zh) * | 2004-06-24 | 2007-07-04 | 东南大学 | 多电位场极板横向高压n型金属氧化物半导体管 |
PT105039A (pt) | 2010-04-06 | 2011-10-06 | Univ Nova De Lisboa | Ligas de óxidos tipo p baseados em óxidos de cobre, óxidos estanho, óxidos de ligas de estanho-cobre e respectiva liga metálica, e óxido de níquel, com os respectivos metais embebidos, respectivo processo de fabrico e utilização |
US20130020632A1 (en) * | 2011-07-18 | 2013-01-24 | Disney Donald R | Lateral transistor with capacitively depleted drift region |
CN103579313A (zh) * | 2012-08-10 | 2014-02-12 | 上海华虹Nec电子有限公司 | 提高高压ldmos器件击穿电压的结构 |
CN107680997B (zh) * | 2017-10-30 | 2020-04-14 | 济南大学 | 带有可调型场板的横向双扩散金属氧化物半导体场效应管 |
CN111180504A (zh) * | 2018-11-13 | 2020-05-19 | 无锡华润上华科技有限公司 | 横向扩散金属氧化物半导体器件及其制造方法 |
-
2002
- 2002-09-30 CN CNB021383936A patent/CN1234174C/zh not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
CN1487594A (zh) | 2004-04-07 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
ASS | Succession or assignment of patent right |
Owner name: SOWTHEAST UNIV. Effective date: 20140623 Owner name: JIANGSU KUIZE MACHINERY INDUSTRY CO., LTD. Free format text: FORMER OWNER: SOWTHEAST UNIV. Effective date: 20140623 |
|
C41 | Transfer of patent application or patent right or utility model | ||
COR | Change of bibliographic data |
Free format text: CORRECT: ADDRESS; FROM: 210096 NANJING, JIANGSU PROVINCE TO: 226600 NANTONG, JIANGSU PROVINCE |
|
TR01 | Transfer of patent right |
Effective date of registration: 20140623 Address after: 226600, Nantong County, Jiangsu Province, Haian County town of Hu Hu Village 22 groups Patentee after: Jiangsu Kuize Machinery Industrial Co., Ltd. Patentee after: Southeast University Address before: 210096 Jiangsu city Nanjing Province four pailou No. 2 Patentee before: Southeast University |
|
CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20051228 Termination date: 20190930 |
|
CF01 | Termination of patent right due to non-payment of annual fee |