CN118176740A - 试验装置和试验方法 - Google Patents

试验装置和试验方法 Download PDF

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Publication number
CN118176740A
CN118176740A CN202180103944.XA CN202180103944A CN118176740A CN 118176740 A CN118176740 A CN 118176740A CN 202180103944 A CN202180103944 A CN 202180103944A CN 118176740 A CN118176740 A CN 118176740A
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CN
China
Prior art keywords
signal
test
input
output
terminal
Prior art date
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Pending
Application number
CN202180103944.XA
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English (en)
Chinese (zh)
Inventor
冨泽一生
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Mitsubishi Electric Building Solutions Corp
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Mitsubishi Electric Building Solutions Corp
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Publication date
Application filed by Mitsubishi Electric Building Solutions Corp filed Critical Mitsubishi Electric Building Solutions Corp
Publication of CN118176740A publication Critical patent/CN118176740A/zh
Pending legal-status Critical Current

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Classifications

    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04QSELECTING
    • H04Q9/00Arrangements in telecontrol or telemetry systems for selectively calling a substation from a main station, in which substation desired apparatus is selected for applying a control signal thereto or for obtaining measured values therefrom

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  • Engineering & Computer Science (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Testing And Monitoring For Control Systems (AREA)
CN202180103944.XA 2021-11-04 2021-11-04 试验装置和试验方法 Pending CN118176740A (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2021/040564 WO2023079615A1 (ja) 2021-11-04 2021-11-04 試験装置および試験方法

Publications (1)

Publication Number Publication Date
CN118176740A true CN118176740A (zh) 2024-06-11

Family

ID=86240776

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202180103944.XA Pending CN118176740A (zh) 2021-11-04 2021-11-04 试验装置和试验方法

Country Status (3)

Country Link
JP (1) JP7486679B2 (ja)
CN (1) CN118176740A (ja)
WO (1) WO2023079615A1 (ja)

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5973312B2 (ja) * 2012-10-15 2016-08-23 株式会社日立製作所 計器校正試験システム、計器校正試験装置、計器校正試験方法及びプログラム
FI128846B (fi) 2017-03-20 2021-01-29 Beamex Oy Ab Automaattinen mittauspiirin kalibrointi
JP2021149205A (ja) 2020-03-16 2021-09-27 株式会社東芝 監視制御システムの自動試験装置

Also Published As

Publication number Publication date
WO2023079615A1 (ja) 2023-05-11
JPWO2023079615A1 (ja) 2023-05-11
JP7486679B2 (ja) 2024-05-17

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