CN1168212C - 频率测量电路 - Google Patents
频率测量电路 Download PDFInfo
- Publication number
- CN1168212C CN1168212C CNB00814401XA CN00814401A CN1168212C CN 1168212 C CN1168212 C CN 1168212C CN B00814401X A CNB00814401X A CN B00814401XA CN 00814401 A CN00814401 A CN 00814401A CN 1168212 C CN1168212 C CN 1168212C
- Authority
- CN
- China
- Prior art keywords
- reference clock
- input signal
- frequency
- frequency measurement
- circuit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 238000005259 measurement Methods 0.000 title claims abstract description 109
- 230000000630 rising effect Effects 0.000 claims description 62
- 230000004044 response Effects 0.000 description 10
- 230000001105 regulatory effect Effects 0.000 description 7
- 238000000034 method Methods 0.000 description 5
- 101100191136 Arabidopsis thaliana PCMP-A2 gene Proteins 0.000 description 4
- 101100048260 Saccharomyces cerevisiae (strain ATCC 204508 / S288c) UBX2 gene Proteins 0.000 description 4
- 239000004065 semiconductor Substances 0.000 description 4
- 230000001360 synchronised effect Effects 0.000 description 4
- 238000006073 displacement reaction Methods 0.000 description 3
- 101100422768 Saccharomyces cerevisiae (strain ATCC 204508 / S288c) SUL2 gene Proteins 0.000 description 2
- 230000006870 function Effects 0.000 description 2
- 239000000654 additive Substances 0.000 description 1
- 230000000996 additive effect Effects 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 239000006185 dispersion Substances 0.000 description 1
- JEIPFZHSYJVQDO-UHFFFAOYSA-N ferric oxide Chemical compound O=[Fe]O[Fe]=O JEIPFZHSYJVQDO-UHFFFAOYSA-N 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 230000010355 oscillation Effects 0.000 description 1
- 230000032696 parturition Effects 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
- G01R23/02—Arrangements for measuring frequency, e.g. pulse repetition rate; Arrangements for measuring period of current or voltage
- G01R23/10—Arrangements for measuring frequency, e.g. pulse repetition rate; Arrangements for measuring period of current or voltage by converting frequency into a train of pulses, which are then counted, i.e. converting the signal into a square wave
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measuring Frequencies, Analyzing Spectra (AREA)
Abstract
Description
Claims (12)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP299986/99 | 1999-10-21 | ||
JP299986/1999 | 1999-10-21 | ||
JP29998699A JP3691310B2 (ja) | 1999-10-21 | 1999-10-21 | 周波数測定回路 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN1379929A CN1379929A (zh) | 2002-11-13 |
CN1168212C true CN1168212C (zh) | 2004-09-22 |
Family
ID=17879378
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CNB00814401XA Expired - Fee Related CN1168212C (zh) | 1999-10-21 | 2000-08-18 | 频率测量电路 |
Country Status (7)
Country | Link |
---|---|
US (2) | US6674277B1 (zh) |
EP (1) | EP1227591B1 (zh) |
JP (1) | JP3691310B2 (zh) |
KR (1) | KR100768050B1 (zh) |
CN (1) | CN1168212C (zh) |
DE (1) | DE60025732T2 (zh) |
WO (1) | WO2001029969A1 (zh) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102033162A (zh) * | 2009-10-08 | 2011-04-27 | 精工爱普生株式会社 | 信号发生电路、包括信号发生电路的频率测量器件以及信号发生方法 |
Families Citing this family (23)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2005085882A1 (ja) * | 2004-03-09 | 2005-09-15 | Matsushita Electric Industrial Co., Ltd. | 周波数センサおよび半導体装置 |
US7085668B2 (en) * | 2004-08-20 | 2006-08-01 | Teradyne, Inc. | Time measurement method using quadrature sine waves |
WO2007119488A1 (ja) * | 2006-03-22 | 2007-10-25 | National University Corporation Gunma University | 周波数測定装置及び周波数測定方法 |
JP4838110B2 (ja) * | 2006-12-18 | 2011-12-14 | 富士通株式会社 | システムクロック供給装置及び基準発振器の周波数ずれ判定方法 |
JP2009250807A (ja) * | 2008-04-07 | 2009-10-29 | Seiko Epson Corp | 周波数測定装置及び測定方法 |
JP2010271091A (ja) * | 2009-05-20 | 2010-12-02 | Seiko Epson Corp | 周波数測定装置 |
JP5517033B2 (ja) * | 2009-05-22 | 2014-06-11 | セイコーエプソン株式会社 | 周波数測定装置 |
JP5440999B2 (ja) * | 2009-05-22 | 2014-03-12 | セイコーエプソン株式会社 | 周波数測定装置 |
JP5582447B2 (ja) * | 2009-08-27 | 2014-09-03 | セイコーエプソン株式会社 | 電気回路、同電気回路を備えたセンサーシステム、及び同電気回路を備えたセンサーデバイス |
JP5815918B2 (ja) * | 2009-10-06 | 2015-11-17 | セイコーエプソン株式会社 | 周波数測定方法、周波数測定装置及び周波数測定装置を備えた装置 |
JP5883558B2 (ja) | 2010-08-31 | 2016-03-15 | セイコーエプソン株式会社 | 周波数測定装置及び電子機器 |
DE102010046880A1 (de) * | 2010-09-29 | 2012-03-29 | Phoenix Contact Gmbh & Co. Kg | Verfahren und Anordnung zur Frequenzbestimmung |
CN102468830B (zh) * | 2010-11-16 | 2016-01-20 | 北京中电华大电子设计有限责任公司 | 一种利用多相位信号提高频率比较器精度的方法和电路 |
GB2488590B (en) * | 2011-03-03 | 2013-07-17 | Weston Aerospace Ltd | Noise reduction system and method |
TW201304418A (zh) * | 2011-07-15 | 2013-01-16 | Askey Technology Jiangsu Ltd | 頻率校正方法及系統 |
TW201303314A (zh) * | 2011-07-15 | 2013-01-16 | Askey Technology Jiangsu Ltd | 計頻器 |
TW201303315A (zh) * | 2011-07-15 | 2013-01-16 | Askey Technology Jiangsu Ltd | 頻率量測方法及系統 |
CN103023488A (zh) * | 2011-09-22 | 2013-04-03 | 亚旭电子科技(江苏)有限公司 | 频率校正方法及系统 |
CN107340426A (zh) * | 2016-05-03 | 2017-11-10 | 成都锐成芯微科技股份有限公司 | 频率检测系统及方法 |
CN109490624B (zh) * | 2018-10-19 | 2020-11-10 | 陕西长岭电子科技有限责任公司 | 脉冲信号频率测量器 |
CN110470903B (zh) * | 2019-07-31 | 2021-08-17 | 山东建筑大学 | 一种电压频率软测量装置和方法 |
CN110988463A (zh) * | 2019-11-07 | 2020-04-10 | 西安电子科技大学 | 数字化相位比对精准获取信号频率及频率稳定度的方法 |
US11811410B2 (en) | 2020-08-19 | 2023-11-07 | Microchip Technology Incorporated | Sensors, autonomous sensors and related systems, methods and devices |
Family Cites Families (19)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2831162A (en) | 1955-05-09 | 1958-04-15 | Julian E Gross | Time-interval measuring device |
US2992384A (en) * | 1959-07-06 | 1961-07-11 | Thompson Ramo Wooldridge Inc | Frequency counter |
GB1196907A (en) * | 1966-07-08 | 1970-07-01 | Rolls Royce | Frequency Measuring Apparatus |
JPS526189B2 (zh) * | 1972-08-23 | 1977-02-19 | ||
JPS57211070A (en) * | 1981-06-20 | 1982-12-24 | Nippon Seiki Co Ltd | Pulse counting device |
SU1239618A1 (ru) | 1983-07-11 | 1986-06-23 | Предприятие П/Я А-1891 | Способ измерени частоты следовани импульсов за фиксированный интеграл времени |
JPS60144044A (ja) * | 1984-01-04 | 1985-07-30 | Nec Corp | 反転間隔検出回路 |
US4541105A (en) * | 1984-03-23 | 1985-09-10 | Sundstrand Data Control, Inc. | Counting apparatus and method for frequency sampling |
SU1247772A1 (ru) | 1985-02-19 | 1986-07-30 | Московский Ордена Трудового Красного Знамени Физико-Технический Институт | Цифровой частотомер |
DE3614272A1 (de) | 1986-04-26 | 1987-10-29 | Blaupunkt Werke Gmbh | Verfahren und anordnung zur schnellen und praezisen messung der frequenz eines signals |
JPS63226115A (ja) * | 1987-03-16 | 1988-09-20 | Fujitsu Ltd | ゼロクロスカウンタ |
SU1596462A1 (ru) | 1988-02-23 | 1990-09-30 | Севастопольский Приборостроительный Институт | Способ преобразовани частота-код |
SU1636786A1 (ru) | 1988-05-04 | 1991-03-23 | Красноярский Политехнический Институт | Цифровой частотомер |
US4854105A (en) * | 1988-05-10 | 1989-08-08 | Delisle Roger L | Roofing membrane anchor |
JPH02141024A (ja) * | 1988-11-21 | 1990-05-30 | Jidosha Kiki Co Ltd | 車速パルス計数方法 |
JPH02287114A (ja) * | 1989-04-27 | 1990-11-27 | Toshiba Micro Electron Kk | パルス時間計測用データ平均処理装置 |
US5095264A (en) | 1990-09-12 | 1992-03-10 | Sundstrand Data Control, Inc. | Frequency counter and method of counting frequency of a signal to minimize effects of duty cycle modulation |
US5442278A (en) * | 1993-09-24 | 1995-08-15 | Acer Peripherals, Inc. | Apparatus for detecting the frequency of an input signal by counting pulses during an input signal cycle |
JP2793524B2 (ja) * | 1995-07-31 | 1998-09-03 | 日本電気アイシーマイコンシステム株式会社 | 時間測定システムおよびその測定方法 |
-
1999
- 1999-10-21 JP JP29998699A patent/JP3691310B2/ja not_active Expired - Fee Related
-
2000
- 2000-08-18 DE DE60025732T patent/DE60025732T2/de not_active Expired - Lifetime
- 2000-08-18 US US10/088,605 patent/US6674277B1/en not_active Expired - Lifetime
- 2000-08-18 WO PCT/JP2000/005574 patent/WO2001029969A1/ja active IP Right Grant
- 2000-08-18 KR KR1020027004893A patent/KR100768050B1/ko active IP Right Grant
- 2000-08-18 CN CNB00814401XA patent/CN1168212C/zh not_active Expired - Fee Related
- 2000-08-18 EP EP00953524A patent/EP1227591B1/en not_active Expired - Lifetime
-
2003
- 2003-11-05 US US10/700,454 patent/US6917191B2/en not_active Expired - Fee Related
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102033162A (zh) * | 2009-10-08 | 2011-04-27 | 精工爱普生株式会社 | 信号发生电路、包括信号发生电路的频率测量器件以及信号发生方法 |
CN102033162B (zh) * | 2009-10-08 | 2015-03-11 | 精工爱普生株式会社 | 信号发生电路、包括信号发生电路的频率测量器件以及信号发生方法 |
Also Published As
Publication number | Publication date |
---|---|
DE60025732D1 (de) | 2006-04-13 |
US20040100245A1 (en) | 2004-05-27 |
JP2001119291A (ja) | 2001-04-27 |
EP1227591A4 (en) | 2002-10-30 |
EP1227591B1 (en) | 2006-01-25 |
CN1379929A (zh) | 2002-11-13 |
WO2001029969A1 (fr) | 2001-04-26 |
KR100768050B1 (ko) | 2007-10-17 |
US6674277B1 (en) | 2004-01-06 |
DE60025732T2 (de) | 2006-07-20 |
JP3691310B2 (ja) | 2005-09-07 |
US6917191B2 (en) | 2005-07-12 |
EP1227591A1 (en) | 2002-07-31 |
KR20030074113A (ko) | 2003-09-19 |
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Legal Events
Date | Code | Title | Description |
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C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
C06 | Publication | ||
PB01 | Publication | ||
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
C41 | Transfer of patent application or patent right or utility model | ||
TR01 | Transfer of patent right |
Effective date of registration: 20090213 Address after: Tokyo, Japan, Japan Patentee after: Fujitsu Microelectronics Ltd. Address before: Kanagawa Patentee before: Fujitsu Ltd. |
|
ASS | Succession or assignment of patent right |
Owner name: FUJITSU MICROELECTRONICS CO., LTD. Free format text: FORMER OWNER: FUJITSU LIMITED Effective date: 20090213 |
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C56 | Change in the name or address of the patentee |
Owner name: FUJITSU SEMICONDUCTOR CO., LTD. Free format text: FORMER NAME: FUJITSU MICROELECTRON CO., LTD. |
|
CP03 | Change of name, title or address |
Address after: Japan's Kanagawa Prefecture Yokohama Patentee after: Fujitsu Semiconductor Co., Ltd. Address before: Tokyo, Japan, Japan Patentee before: Fujitsu Microelectronics Ltd. |
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ASS | Succession or assignment of patent right |
Owner name: SPANSION LLC N. D. GES D. STAATES Free format text: FORMER OWNER: FUJITSU SEMICONDUCTOR CO., LTD. Effective date: 20140106 |
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C41 | Transfer of patent application or patent right or utility model | ||
TR01 | Transfer of patent right |
Effective date of registration: 20140106 Address after: American California Patentee after: Spansion LLC N. D. Ges D. Staates Address before: Yokohama City, Kanagawa Prefecture, Japan Patentee before: Fujitsu Semiconductor Co., Ltd. |
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C41 | Transfer of patent application or patent right or utility model | ||
TR01 | Transfer of patent right |
Effective date of registration: 20160318 Address after: American California Patentee after: Cypress Semiconductor Corp. Address before: American California Patentee before: Spansion LLC N. D. Ges D. Staates |
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CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20040922 Termination date: 20180818 |
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CF01 | Termination of patent right due to non-payment of annual fee |