CN116559528A - Chip frequency measuring method, circuit, device, storage medium and computer equipment - Google Patents
Chip frequency measuring method, circuit, device, storage medium and computer equipment Download PDFInfo
- Publication number
- CN116559528A CN116559528A CN202310840749.6A CN202310840749A CN116559528A CN 116559528 A CN116559528 A CN 116559528A CN 202310840749 A CN202310840749 A CN 202310840749A CN 116559528 A CN116559528 A CN 116559528A
- Authority
- CN
- China
- Prior art keywords
- frequency
- chip
- count value
- pulse count
- value
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000000034 method Methods 0.000 title claims abstract description 41
- 238000005259 measurement Methods 0.000 claims abstract description 91
- 238000000691 measurement method Methods 0.000 claims abstract description 20
- 238000004590 computer program Methods 0.000 claims description 8
- 238000004364 calculation method Methods 0.000 description 15
- 230000008569 process Effects 0.000 description 7
- 230000008859 change Effects 0.000 description 6
- 238000004891 communication Methods 0.000 description 6
- 230000006870 function Effects 0.000 description 5
- 239000013078 crystal Substances 0.000 description 4
- 238000004519 manufacturing process Methods 0.000 description 4
- 239000000758 substrate Substances 0.000 description 3
- 238000012937 correction Methods 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 230000010365 information processing Effects 0.000 description 2
- 230000001960 triggered effect Effects 0.000 description 2
- 230000009471 action Effects 0.000 description 1
- 239000003990 capacitor Substances 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000007667 floating Methods 0.000 description 1
- 230000002452 interceptive effect Effects 0.000 description 1
- 230000000007 visual effect Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
- G01R23/02—Arrangements for measuring frequency, e.g. pulse repetition rate; Arrangements for measuring period of current or voltage
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02D—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN INFORMATION AND COMMUNICATION TECHNOLOGIES [ICT], I.E. INFORMATION AND COMMUNICATION TECHNOLOGIES AIMING AT THE REDUCTION OF THEIR OWN ENERGY USE
- Y02D10/00—Energy efficient computing, e.g. low power processors, power management or thermal management
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Measuring Frequencies, Analyzing Spectra (AREA)
Abstract
The invention discloses a chip frequency measurement method, a circuit, a device, a storage medium and computer equipment, and relates to the technical field of electric signal measurement. The method comprises the following steps: collecting a first pulse count value of a reference signal source and a second pulse count value of an external clock source in the same time period; calculating a reference frequency value of an external clock source according to the first pulse count value, the second pulse count value and the reference frequency value of the reference signal source; collecting a third pulse count value of a chip to be tested and a fourth pulse count value of an external clock source in the same time period; and obtaining the frequency value of the chip to be tested according to the third pulse count value, the fourth pulse count value and the reference frequency value of the external clock source. The method can calibrate the measurement error caused by the fixed deviation of the external clock source, and can calibrate the tiny error caused by various factors such as circuit hardware and software program execution, thereby effectively improving the accuracy of chip frequency measurement.
Description
Technical Field
The present invention relates to the field of electrical signal measurement technologies, and in particular, to a chip frequency measurement method, a circuit, a device, a storage medium, and a computer apparatus.
Background
The frequency measurement of the signal source is a common requirement, and at present, the frequency measurement mode of the signal source is common and comprises a plurality of methods such as frequency meter measurement, programmable logic circuit measurement, measurement by adopting a frequency measurement circuit formed by a microcontroller and the like. The frequency meter or the programmable logic circuit is used for measuring the frequency, the frequency is too large, the frequency meter or the programmable logic circuit is inconvenient to carry, the cost is too high, the purchasing period is long, the operation is complex, and the debugging is inconvenient.
In the prior art, for cost and volume reasons, a frequency measuring circuit consisting of a microcontroller is generally used to measure the frequency of the signal source. However, measuring the source frequency in this manner inevitably results in varying degrees of error. For example, a crystal oscillator connected with a microcontroller and an external clock source have a certain frequency deviation, an asynchronous signal can generate an error of 1 pulse edge when measuring a pulse edge, a time difference of instruction execution when executing different instructions under a bus clock, and the like. Currently, such errors can be reduced to some extent by increasing the frequency of the reference source or extending the measurement time, but the errors are not completely eliminated. The errors have a great influence on the high-precision measurement scene of the chip frequency measurement, so that the chip frequency measurement precision is low, and the production and use requirements cannot be met.
Disclosure of Invention
In view of this, the present application provides a chip frequency measurement method, circuit, device, storage medium and computer equipment, and mainly aims to solve the technical problem of low chip frequency measurement precision.
According to a first aspect of the present invention, there is provided a chip frequency measurement method comprising:
collecting a first pulse count value of a reference signal source and a second pulse count value of an external clock source in the same time period;
calculating a reference frequency value of the external clock source according to the first pulse count value, the second pulse count value and the reference frequency value of the reference signal source;
collecting a third pulse count value of a chip to be tested and a fourth pulse count value of an external clock source in the same time period;
and obtaining the frequency value of the chip to be tested according to the third pulse count value, the fourth pulse count value and the reference frequency value of the external clock source.
Optionally, the collecting the first pulse count value of the reference signal source and the second pulse count value of the external clock source in the same time period includes: starting external trigger interruption, outputting a counting start instruction to acquire the frequency pulse count value of the reference signal source in real time, and controlling an external counter to synchronously count the frequency pulses of the external clock source; when the frequency pulse count value of the reference signal source reaches a first pulse count value, closing an external trigger interrupt, outputting a count ending instruction to stop collecting the frequency pulse count value of the reference signal source, and controlling the external counter to stop synchronously counting the frequency pulses of the external clock source; and reading a first count value of the external counter, and taking the first count value as a second pulse count value of the external clock source.
Optionally, the calculating the reference frequency value of the external clock source according to the first pulse count value, the second pulse count value and the reference frequency value of the reference signal source includes: obtaining a reference frequency value of the external clock source according to the product of the ratio of the second pulse count value to the first pulse count value and the reference frequency value of the reference signal source, wherein the reference frequency value of the reference signal source is calibrated in advance by an external instrument, and the frequency offset of the reference signal source is zero; the reference frequency value of the external clock source is stored in a non-volatile memory.
Optionally, the collecting the third pulse count value of the chip to be tested and the fourth pulse count value of the external clock source in the same time period includes: starting external trigger interruption, outputting a counting start instruction to acquire the frequency pulse count value of the chip to be tested in real time, and controlling an external counter to synchronously count the frequency pulses of an external clock source; when the frequency pulse count value of the chip to be tested reaches a third pulse count value, closing an external trigger interrupt, outputting a count ending instruction to stop collecting the frequency pulse count value of the chip to be tested, and controlling the external counter to stop synchronously counting the frequency pulses of the external clock source; and reading a second count value of the external counter, and taking the second count value as a fourth pulse count value of the external clock source.
Optionally, the obtaining the frequency value of the chip to be tested according to the third pulse count value, the fourth pulse count value and the reference frequency value of the external clock source includes: reading out a reference frequency value of the external clock source in a nonvolatile memory; and obtaining the frequency value of the chip to be tested according to the product of the ratio of the third pulse count value to the fourth pulse count value and the reference frequency value of the external clock source, wherein the frequency offset of the external clock source is an arbitrary value.
Optionally, the method further comprises: obtaining a frequency deviation value of the chip to be tested according to the quotient of the difference between the frequency value of the chip to be tested and a preset theoretical frequency value and the theoretical frequency value, and outputting the frequency deviation value.
According to a second aspect of the present invention, there is provided a chip frequency measurement circuit for measuring a frequency value of a chip to be measured, the circuit comprising a microcontroller, a standard clock source, a logic circuit, a counter and a power supply module, wherein a first input of the microcontroller is electrically connected to a frequency output of the chip to be measured or to an output of the reference signal source, a first output of the microcontroller is electrically connected to a first input of the logic circuit, a second input of the logic circuit is electrically connected to an output of the standard clock source, an output of the logic circuit is electrically connected to a control terminal of the counter, an input of the counter is electrically connected to an output of the standard clock source, an output of the counter is electrically connected to a second input of the microcontroller, and the power supply module is electrically connected to the microcontroller, the standard clock source, the logic circuit and the counter, respectively, wherein the microcontroller is adapted to perform the chip frequency measurement method as described in any of the preceding claims.
According to a third aspect of the present invention, there is provided a chip frequency measurement device comprising the chip frequency measurement circuit described above and at least one chip pad, wherein an input of the chip pad is configured to be electrically connected to a frequency output of the chip to be measured or to an output of the reference signal source, and an output of the chip pad is electrically connected to a first input of a microcontroller of the chip frequency measurement circuit.
According to a fourth aspect of the present invention, there is provided a storage medium having stored thereon a computer program which, when executed by a processor, implements the above-described chip frequency measurement method.
According to a fifth aspect of the present invention, there is provided a computer device comprising a memory, a processor and a computer program stored on the memory and executable on the processor, the processor implementing the above-mentioned chip frequency measurement method when executing the program.
The invention provides a chip frequency measuring method, a circuit, a device, a storage medium and computer equipment, which are characterized in that firstly, a first pulse count value of a reference signal source and a second pulse count value of an external clock source in the same time period are measured, then the reference frequency value of the external clock source is corrected through the first pulse count value, the second pulse count value and the reference frequency value of the reference signal source, further, when the frequency value of a chip to be measured is measured, a third pulse count value of the chip to be measured and a fourth pulse count value of the external clock source in the same time period are collected, and finally, the frequency value of the chip to be measured is obtained through the third pulse count value, the fourth pulse count value and the corrected reference frequency value of the external clock source. The method can calibrate the measurement error caused by the fixed deviation of the external clock source, and can calibrate the tiny error caused by various factors such as circuit hardware and software program execution, thereby effectively improving the accuracy of chip frequency measurement. The method can be applied to scenes with high precision requirements such as chip frequency measurement.
The foregoing description is only an overview of the technical solutions of the present application, and may be implemented according to the content of the specification in order to make the technical means of the present application more clearly understood, and in order to make the above-mentioned and other objects, features and advantages of the present application more clearly understood, the following detailed description of the present application will be given.
Drawings
The accompanying drawings, which are included to provide a further understanding of the invention and are incorporated in and constitute a part of this application, illustrate embodiments of the invention and together with the description serve to explain the invention and do not constitute a limitation on the invention. In the drawings:
fig. 1 shows a schematic flow chart of a chip frequency measurement method according to an embodiment of the present invention;
fig. 2 is a schematic flow chart of another method for measuring chip frequency according to an embodiment of the present invention;
fig. 3 is a schematic structural diagram of a chip frequency measurement circuit according to an embodiment of the present invention;
fig. 4 is a schematic diagram of another chip frequency measurement circuit according to an embodiment of the present invention.
Detailed Description
The invention will be described in detail hereinafter with reference to the drawings in conjunction with embodiments. It should be noted that, in the case of no conflict, the embodiments and features in the embodiments may be combined with each other.
Before explaining the embodiments of the present application, a brief description is first given of the frequency measurement principle of the present application. In the prior art, the frequency measurement scheme generally adopts a mode of collecting the number (N) of pulse edges of a signal source to be measured in a certain time (T) and further calculating the frequency (f=n/T) of the signal source to be measured to perform frequency measurement. The frequency measurement based on the scheme needs to ensure the precision of time measurement and the precision of pulse edge acquisition, but the scheme has higher requirements on the realization of functions such as signal acquisition, gate control time adjustment and the like, and the generated error is larger, so that the requirements of a high-precision frequency measurement scene cannot be met.
In the present application, since the signal source to be measured is a chip, and the chip to be measured is a signal source having a desired frequency or level value, the frequency measurement scheme of the chip can be simplified appropriately. Specifically, the frequency measurement principle is as follows: firstly, an external clock source is set, the frequency of the external clock source is marked as f1, the theoretical frequency of a chip to be detected is set as f2, pulse edges of the external clock source and the chip to be detected are simultaneously acquired within a certain time (T), the pulse edges are respectively marked as N1 and N2, T=N1/f 1 can be calculated due to the fact that the frequency f1 of the external clock source is known, the actual frequency f=N2/T of the chip to be detected, namely f= (N2/N1) f1, and finally, the frequency deviation value of the chip to be detected, namely Deltaf= (f-f 2)/f 2, can be calculated through the f and f2. By the method, the time is not required to be precisely measured, signals with different frequencies are not required to be processed, and the function of measuring the frequency of the chip to be measured can be realized by only using a chip frequency measuring circuit capable of collecting an external clock source and the pulse edge of the chip to be measured.
However, by measuring the frequency of the chip according to the above frequency measurement principle, a certain degree of error may still be generated, for example, a crystal oscillator connected to the microcontroller and an external clock source may have a certain degree of frequency offset, an asynchronous signal may generate an error of 1 pulse edge when measuring a pulse edge, and a time difference of instruction execution may also be generated when executing different instructions under the bus clock. Currently, such errors can be reduced to some extent by increasing the frequency of the reference source or extending the measurement time, but the errors are not completely eliminated. These errors still have a great influence on the high-precision measurement scene of the chip frequency measurement, so that the chip frequency measurement precision is lower, and the production and use requirements cannot be met.
In view of the above technical problems, based on the above chip frequency measurement principle, in one embodiment, as shown in fig. 1, a chip frequency measurement method is provided, and the method is applied to a computer device such as a microcontroller in the chip frequency measurement circuit, and the method includes the following steps:
101. and in the same time period, acquiring a first pulse count value of the reference signal source and a second pulse count value of the external clock source.
The reference signal source is a signal source with the frequency calibrated by an external instrument as a reference frequency value and the frequency offset as 0ppm, and the external clock source is a signal source with the frequency of a crystal oscillator chip and the like as a fixed frequency value and the frequency offset as unknown.
Specifically, the frequency output pin of the reference signal source is electrically connected with the signal input end of the microcontroller, so that the microcontroller can be used for directly collecting the pulse edge output by the reference signal source, and similarly, the output end of the external clock source or the output end of the counter connected with the external clock source is electrically connected with the signal input end of the microcontroller, so that the microcontroller can be used for collecting the pulse edge output by the external clock source or collecting the count value of the pulse edge output by the external clock source. Further, the microcontroller may synchronously count the pulse edges of the reference signal source and the external clock source by transmitting a count start instruction of the reference signal source and a count start instruction of the external clock source, respectively, and may stop synchronously counting the pulse edges of the reference signal source and the external clock source by transmitting a count end instruction of the reference signal source and a count end instruction of the external clock source. In this way, the first pulse count value of the reference signal source and the second pulse count value of the external clock source can be synchronously acquired within the same time period.
In this embodiment, the first pulse count value of the reference signal source and the second pulse count value of the external clock source may be counted by a counter inside the microcontroller, or may be counted by an external counter, and then the count result is input into the microcontroller. It will be appreciated that the acquisition mode of the reference signal source and the external clock source pulse edge may be determined according to various factors such as the frequency of the reference signal source, the frequency of the external clock source, and the self performance of the microcontroller, which is not specifically limited herein. In addition, when the pulse count value is acquired, the acquisition time of the pulse count value, the value of the first pulse count value and the value of the second pulse count value can be preset, so that when the microcontroller judges that a certain value reaches a preset threshold value, the acquisition can be stopped, and in this way, the frequency calculation process can be simplified, and the frequency calculation precision can be improved.
102. And calculating the reference frequency value of the external clock source according to the first pulse count value, the second pulse count value and the reference frequency value of the reference signal source.
Specifically, after the microcontroller collects the first pulse count value of the reference signal source and the second pulse count value of the external clock source in the same time period, the frequency calculation formula f= (N2/N1) ·f1 may be used to calculate the reference frequency value of the external clock source. In this scenario, f is a reference frequency value of the external clock source, N1 is a first pulse count value of the reference signal source, N2 is a second pulse count value of the external clock source, and f1 is a reference frequency value of the reference signal source. Based on the above, the reference frequency value of the external clock source can be calculated according to the first pulse count value of the reference signal source, the second pulse count value of the external clock source and the reference frequency value of the reference signal source, and then the calculated reference frequency value of the external clock source can be stored in the nonvolatile memory of the microcontroller, so that the external clock source is convenient to read.
For example, assume that the reference signal source is a signal source with a calibrated reference frequency value of 100KHz and a frequency offset of 0ppm, and the external clock source is a crystal oscillator chip with a theoretical frequency value of 10MHz and an unknown frequency offset. Then, in the same time period, the total pulse edges of the collected reference signal sources are 100K, the collection time can be regarded as 1s, at this time, the external clock source is measured to generate (10M-3) pulse edges in the 1s, and then the reference frequency value of the external clock source can be calculated to be (10M-3) Hz through the frequency calculation formula.
By the method, the measurement error caused by the fixed deviation of the external clock source can be calibrated, and under the condition that the chip to be measured subsequently uses the same chip frequency measurement circuit to carry out frequency measurement, errors caused by software execution such as acquisition errors of pulse edges, time differences issued by instructions and the like can be synchronously calibrated, namely, the reference frequency value of the external clock source can integrate errors on all hardware and software in the frequency measurement process. In this embodiment, the calculated reference frequency value of the external clock source can only be applied to the current chip frequency measurement circuit, and when any device or software execution program in the circuit is changed, recalibration needs to be performed on the reference frequency value of the external clock source to ensure that all errors are integrated to the reference frequency value of the external clock source, thereby ensuring the accuracy of frequency measurement.
103. And collecting a third pulse count value of the chip to be tested and a fourth pulse count value of the external clock source in the same time period.
Specifically, the circuit connection mode of the external clock source can be kept unchanged, based on the circuit connection mode, the microcontroller can collect the pulse edge output by the external clock source or the count value of the pulse edge output by the external clock source, at the moment, the frequency output pin of the chip to be tested can be electrically connected with the signal input end of the microcontroller, so that the microcontroller can be used for directly collecting the pulse edge output by the chip to be tested. Further, the microcontroller can synchronously count the pulse edges of the chip to be tested and the external clock source by respectively sending a count start instruction of the chip to be tested and a count start instruction of the external clock source, and can stop synchronously counting the pulse edges of the chip to be tested and the external clock source by sending a count end instruction of the chip to be tested and a count end instruction of the external clock source. In this way, the third pulse count value of the chip to be tested and the fourth pulse count value of the external clock source can be synchronously acquired in the same time period.
In this embodiment, when the chip to be tested is connected, the connection mode of the reference signal source may be kept unchanged, and then the frequency output end of the chip to be tested is connected through the other signal input end of the microcontroller so as to collect the pulse edge output by the chip to be tested. In addition, when the pulse count value is acquired, the acquisition time of the pulse count value, the value of the third pulse count value and the value of the fourth pulse count value can be preset, so that when the microcontroller judges that a certain value reaches a preset threshold value, the acquisition can be stopped, and in this way, the frequency calculation process can be simplified, and the frequency calculation precision can be improved.
104. And obtaining the frequency value of the chip to be tested according to the third pulse count value, the fourth pulse count value and the reference frequency value of the external clock source.
Specifically, after the microcontroller collects the third pulse count value of the chip to be tested and the fourth pulse count value of the external clock source in the same time period, the calculated reference frequency value of the external clock source can be read out from the nonvolatile memory of the microcontroller, and then the frequency value of the chip to be tested is calculated again by using a frequency calculation formula f= (N2/N1) f 1. In this scenario, f is the frequency value of the chip to be tested, N1 is the fourth pulse count value of the external clock source, N2 is the third pulse count value of the chip to be tested, and f1 is the reference frequency value of the external clock source. Based on the frequency value of the chip to be measured can be calculated according to the third pulse count value of the chip to be measured, the fourth pulse count value of the external clock source and the reference frequency value of the external clock source, and then the frequency deviation value of the chip to be measured can be calculated.
For example, assume that the theoretical frequency value of the chip to be tested is 32768Hz, the theoretical frequency value of the external clock source is 10MHz, and the calibrated reference frequency value of the external clock source is (10M-3) Hz. Then, in the same time period, the number of pulse edges of the chip to be detected is 32768, at this time, the external clock source is detected to generate (10M-2) pulse edges in the time period, and then the frequency deviation value of the chip to be detected is calculated to be +1ppm instead of-2 ppm according to the frequency calculation formula.
It should be noted that, the calibration of the reference frequency of the external clock source and the measurement of the frequency value of the chip to be measured are not necessarily performed according to the sequence of steps, but may be performed independently of each other, because the calibration of the external clock source is not required before each measurement of the frequency value of the chip to be measured, but is performed once before a batch of frequency values of the chip to be measured are measured, or performed once after each program change, circuit connection change, and device type selection change in the microcontroller. Based on this, step 101 and step 102 may be performed sequentially, step 103 and step 104 may be performed sequentially, and steps 101-102 and steps 103-104 are not necessarily performed sequentially. It should be understood that the step numbers in the present embodiment and the drawing numbers in the specification are only examples, and are not limiting to the present embodiment.
According to the chip frequency measuring method, first, the first pulse count value of the reference signal source and the second pulse count value of the external clock source in the same time period are measured, then the reference frequency value of the external clock source is corrected through the first pulse count value, the second pulse count value and the reference frequency value of the reference signal source, further when the frequency value of the chip to be measured is measured, the third pulse count value of the chip to be measured and the fourth pulse count value of the external clock source in the same time period are collected, and finally the frequency value of the chip to be measured is obtained through the third pulse count value, the fourth pulse count value and the corrected reference frequency value of the external clock source. The method can calibrate the measurement error caused by the fixed deviation of the external clock source, and can calibrate the tiny error caused by various factors such as circuit hardware and software program execution, thereby effectively improving the accuracy of chip frequency measurement.
Further, as a refinement and extension of the specific implementation manner of the foregoing embodiment, in order to fully describe the implementation process of this embodiment, a chip frequency measurement method is provided, as shown in fig. 2, and the method includes the following steps:
201. and in the same time period, acquiring a first pulse count value of the reference signal source and a second pulse count value of the external clock source.
In this embodiment, the frequency output pin of the reference signal source may be electrically connected to the signal input end of the microcontroller, so as to collect the pulse edge output by the reference signal source by using the microcontroller in a manner triggered by external interrupt, and at the same time, the output end of the counter connected to the external clock source may be electrically connected to the signal input end of the microcontroller, so as to collect the count value of the pulse edge output by the external clock source by using the microcontroller. According to the embodiment, the pulse edges of the external clock source are counted through the external counter, the pulse count value of the external clock source is acquired through the external counter, the accuracy of the pulse count of the external clock source can be improved, and in addition, the accuracy of the pulse count of the reference clock source can be improved through the external trigger interrupt acquisition of the pulse count value of the reference signal source, so that the accuracy of the calibration of the reference signal source is improved.
The specific implementation process of this embodiment is as follows: firstly, starting an external trigger interrupt, outputting a counting start instruction to acquire a frequency pulse count value of a reference signal source in real time, controlling an external counter to synchronously count frequency pulses of an external clock source, when the frequency pulse count value of the reference signal source reaches a first pulse count value, closing the external trigger interrupt, outputting a counting end instruction to stop acquiring the frequency pulse count value of the reference signal source, controlling the external counter to stop synchronously counting the frequency pulses of the external clock source, and finally, reading the first count value of the external counter, and taking the first count value as a second pulse count value of the external clock source.
In this embodiment, the first pulse count value may be set as the reference frequency value of the reference signal source, so when the pulse count value of the reference signal source is detected to reach the first pulse count value, the time acquisition time may be considered to be 1s, and at this time, the reference frequency value of the external clock source may be directly obtained by acquiring the second pulse count value of the external clock source in this time period.
202. And calculating the reference frequency value of the external clock source according to the first pulse count value, the second pulse count value and the reference frequency value of the reference signal source.
Specifically, the reference frequency value of the external clock source may be calculated using a frequency calculation formula f= (N2/N1) ·f1. Based on the formula, the reference frequency value of the external clock source can be obtained according to the product of the ratio of the second pulse count value to the first pulse count value and the reference frequency value of the reference signal source, and then the reference frequency value of the external clock source is stored in the nonvolatile memory so as to be convenient to read. In this embodiment, the reference frequency value of the reference signal source is a signal source that is calibrated in advance by an external instrument and has zero frequency offset, and in this way, the accuracy of reference frequency value correction of the external clock source can be ensured.
203. And collecting a third pulse count value of the chip to be tested and a fourth pulse count value of the external clock source in the same time period.
In this embodiment, the frequency output pin of the reference signal source may be disconnected from the signal input end of the microcontroller, and then the frequency output pin of the chip to be tested is electrically connected with the signal input end of the microcontroller, so as to collect the pulse edge output by the chip to be tested by using the microcontroller in a manner triggered by external interrupt, and meanwhile, the circuit connection manner of the external clock source is unchanged, so that the microcontroller can be used to collect the count value of the pulse edge output by the external clock source. According to the embodiment, the pulse edges of the external clock source are counted through the external counter, the pulse count value of the external clock source is acquired through the external counter, so that the accuracy of the pulse count of the external clock source can be improved, in addition, the reference signal source is replaced by the chip to be detected, the pulse count value of the chip to be detected is acquired through external triggering interruption, the circuit connection mode can be simplified, the accuracy of the pulse count of the chip to be detected can be improved, and the accuracy of the frequency calculation of the chip to be detected is improved.
The specific implementation process of this embodiment is as follows: firstly, starting an external trigger interrupt, outputting a counting start instruction to acquire a frequency pulse count value of a chip to be detected in real time, controlling an external counter to synchronously count frequency pulses of an external clock source, closing the external trigger interrupt when the frequency pulse count value of the chip to be detected reaches a third pulse count value, outputting a counting end instruction to stop acquiring the frequency pulse count value of the chip to be detected, controlling the external counter to stop synchronously counting the frequency pulses of the external clock source, and finally, reading a second count value of the external counter and taking the second count value as a fourth pulse count value of the external clock source.
In this embodiment, the third pulse count value may be set as the theoretical frequency value of the chip to be tested, so when it is detected that the pulse count value of the chip to be tested reaches the third pulse count value, the fourth pulse count value of the external clock source in the time period may be collected, and then the frequency value of the chip to be tested is calculated. By the method, the calculation process of the frequency value of the chip to be measured can be simplified, and calculation errors caused by complex values can be avoided.
204. And obtaining the frequency value of the chip to be tested according to the third pulse count value, the fourth pulse count value and the reference frequency value of the external clock source.
Specifically, the frequency value of the chip to be tested can be calculated by using a frequency calculation formula f= (N2/N1) ·f1. Based on the formula, the reference frequency value of the external clock source can be read from the nonvolatile memory, and then the frequency value of the chip to be tested can be obtained according to the product of the ratio of the third pulse count value to the fourth pulse count value and the reference frequency value of the external clock source, wherein the frequency offset of the external clock source can be any value, and in this way, the purchasing cost and the debugging difficulty of the external clock source can be reduced.
205. And obtaining the frequency deviation value of the chip to be tested according to the frequency value of the chip to be tested and the preset theoretical frequency value, and outputting the frequency deviation value.
Specifically, the frequency deviation value of the chip to be measured may be calculated according to the above formula Δf= (f-f 2)/f 2 of the frequency deviation value, where Δf is the frequency deviation value of the chip to be measured, f is the calculated frequency value of the chip to be measured, and f2 is the theoretical frequency value of the chip to be measured. Based on the formula, the frequency deviation value of the chip to be detected can be obtained according to the quotient of the difference between the frequency value of the chip to be detected and the preset theoretical frequency value and the theoretical frequency value, and finally, the microcontroller can output the frequency deviation value. Furthermore, the frequency deviation value of the chip to be tested can be displayed in various modes such as a display screen and a display of an upper computer, and by the mode, a user can conveniently and intuitively know the frequency deviation value of the chip to be tested, so that the efficiency of measuring the frequency of the chip is improved, and the difficulty of chip production, function demonstration and on-site debugging is reduced.
It should be noted that, the calibration of the reference frequency of the external clock source and the measurement of the frequency value of the chip to be measured are not necessarily performed according to the sequence of steps, but may be performed independently of each other, because the calibration of the external clock source is not required before each measurement of the frequency value of the chip to be measured, but is performed once before a batch of frequency values of the chip to be measured are measured, or performed once after each program change, circuit connection change, and device type selection change in the microcontroller. Based on this, step 201 and step 202 may be performed sequentially, and steps 203 to 205 may be performed sequentially, and steps 201 to 202 and steps 203 to 205 are not necessarily performed sequentially. It should be understood that the step numbers in the present embodiment and the drawing numbers in the specification are only examples, and are not limiting to the present embodiment.
The chip frequency measurement method provided by the embodiment can calibrate the measurement error caused by the fixed deviation of the external clock source, and can calibrate the tiny error caused by various factors such as circuit hardware and software program execution, thereby effectively improving the accuracy of chip frequency measurement. In addition, the method can calculate and output the frequency deviation value of the chip to be tested according to the frequency value of the chip to be tested, so that a user can know the frequency deviation of the chip to be tested in a more visual mode, the efficiency of chip frequency measurement is improved, and the difficulty of chip production, function demonstration and field debugging is reduced.
Further, as a specific implementation of the methods shown in fig. 1 and fig. 2, the present embodiment provides a chip frequency measurement circuit, as shown in fig. 3, which includes a microcontroller 301, a standard clock source 302, a logic circuit 303, a counter 304, and a power module 305. The first input terminal (the floating pin in fig. 3) of the microcontroller 301 is used to be electrically connected to the frequency output terminal (not shown in fig. 3) of the chip to be tested or to the output terminal of the reference signal source, the first output terminal of the microcontroller 301 is electrically connected to the first input terminal B of the logic circuit 303, the second input terminal a of the logic circuit 303 is electrically connected to the output terminal of the standard clock source 302, the output terminal Y of the logic circuit 303 is electrically connected to the control terminal of the counter 304, the input terminal of the counter 304 is electrically connected to the output terminal of the standard clock source 302, the output terminal of the counter 304 is electrically connected to the second input terminal of the microcontroller 301, and the power module 305 is electrically connected to the microcontroller 301, the standard clock source 302, the logic circuit 303 and the counter 304, respectively, where the microcontroller 301 can execute the chip frequency measurement method according to any one of the embodiments described above.
In the above embodiment, the standard clock source is an external clock source, and the clock source can generate a pulse signal with a certain frequency and output the pulse signal to the counter (i.e. the external counter) and the logic circuit. The logic circuit can be a logic AND gate chip, can receive the control signal output by the microcontroller and the pulse signal output by the standard clock source at the same time, and is controlled by the two signal output start signal or stop signal to control the counter to start counting or stop counting. In this embodiment, when the control signal output by the microcontroller is the same type as the level signal of the pulse signal output by the standard clock source, the logic circuit may output a start signal or output a stop signal. For example, when the microcontroller outputs a control signal of a high level and the pulse signal output by the standard clock source is also of a high level, the logic circuit may output a start signal of a high level; on the contrary, when the microcontroller outputs a control signal of low level and the pulse signal output by the standard clock source is also of low level, the logic circuit can output a stop signal of low level. Further, when the counter receives the starting signal output by the logic circuit, the pulse edge output by the standard clock source can be counted; when the counter receives the stop signal output by the logic circuit, the counting of the pulse edges output by the standard clock source can be stopped. According to the embodiment, the logic circuit is arranged to receive the control signal output by the microcontroller and the pulse signal output by the standard clock source, and the start signal and the stop signal are output according to the control signal and the pulse signal output by the standard clock source, so that the counter can be ensured to acquire a complete frequency count value, the deviation degree of the pulse count of the external clock source is reduced, and the accuracy of the pulse count of the external clock source is improved.
Specifically, when the circuit is used for measuring the frequency of the chip to be measured, the reference signal source can be firstly connected to the chip frequency measuring circuit, then the microprocessor is controlled to start micro external trigger interruption so as to collect the frequency pulse count value of the reference signal source in real time, meanwhile, a count start instruction (such as a high-level control signal) can be output to the logic circuit so as to control the external counter to synchronously count the frequency pulse of the external clock source, then, after a period of time is collected, the external trigger interruption can be closed so as to stop collecting the frequency pulse count value of the reference signal source, and meanwhile, a count end instruction (such as a low-level control signal) is output so as to control the external counter to stop counting. In this way, the first pulse count value of the reference signal source and the second pulse count value of the external clock source within the same period of time can be acquired. Further, the microcontroller may calculate the reference frequency value of the external clock source according to the first pulse count value of the reference signal source, the second pulse count value of the external clock source, and the reference frequency value of the reference signal source by using the frequency calculation formula mentioned in the above embodiment, and store the calculated reference frequency value of the external clock source in the nonvolatile memory, so as to facilitate reading.
Further, when the frequency of the chip to be measured is measured, the reference signal source can be taken down from the circuit and replaced by the chip to be measured, then the microprocessor is controlled to start external trigger interruption so as to collect the frequency pulse count value of the chip to be measured in real time, meanwhile, a count start instruction is output to the logic circuit so as to control the external counter to synchronously count the frequency pulse of the external clock source, then, after a period of time is collected, the external trigger interruption can be closed so as to stop collecting the frequency pulse count value of the chip to be measured, meanwhile, a count end instruction is output so as to control the external counter to stop synchronously counting the frequency pulse of the external clock source, and in this way, the third pulse count value of the chip to be measured and the fourth pulse count value of the external clock source in the same period of time can be collected. Furthermore, the reference frequency value of the external clock source can be read from the nonvolatile memory, and the frequency value of the chip to be detected can be calculated according to the third pulse count value of the chip to be detected, the fourth pulse count value of the external clock source and the reference frequency value of the external clock source by utilizing the frequency calculation formula. According to the embodiment, the standard clock source is counted by setting the counter, compared with the method that the standard clock source is counted by directly adopting the microcontroller, the method can avoid program execution in the microprocessor from interfering with the counting value, so that the accuracy of pulse counting of the standard clock source is improved, and the correction accuracy of the standard clock source and the accuracy of frequency measurement of the chip to be measured are improved.
According to the chip frequency measurement circuit provided by the embodiment, the standard clock source and the counter are arranged to count the frequency pulse of the reference source, and the logic circuit is arranged to integrate signals output by the microcontroller and the reference source into control signals of the counter to realize the counting function of the counter, so that the accuracy of the pulse counting of the external clock source can be improved, and the accuracy of the frequency measurement of the chip to be measured is improved. In addition, by executing the chip frequency measuring method described in the above embodiment by the microprocessor, the measuring error caused by the fixed deviation of the external clock source can be calibrated, and at the same time, the minor error caused by various factors such as circuit hardware and software program execution can be calibrated, so that the accuracy of chip frequency measurement is further improved. Through the circuit, the frequency measurement requirement of high precision can be met, the cost is saved, the circuit is convenient to carry, and the accuracy of chip frequency measurement can be improved.
In an alternative embodiment, the chip frequency measurement circuit may be implemented as shown in FIG. 4. The connection modes of the microcontroller U1, the standard clock source Y2, the logic circuit U12, and the counter U11 are described with reference to the foregoing embodiments, and are not repeated herein. It should be noted that the types of the microcontroller U1, the standard clock source Y2, the logic circuit U12, and the counter U11 may be determined according to actual situations, and the connection manner of each device may also be determined according to the specific type of the device, for example, the counter U11 may also be implemented by a 32-bit counter chip, or may be implemented by replacing four 8-bit counter chips connected in series. It should be understood that the connection shown in fig. 4 is only one possible circuit connection, and is not limited to this embodiment. Besides the microcontroller U1, the standard clock source Y2, the logic circuit U12, and the counter U11, the chip frequency measurement circuit may further include other circuit modules or devices such as a terminal P1, an external clock interface P3, and a filter circuit composed of filter capacitors C9, C10, and C14, and may further include other circuit modules or devices not shown in fig. 4 such as a display screen, a key, and an upper computer, and for other circuit modules included in the circuit, the embodiment is not limited one by one.
Further, as a specific implementation of the method and circuit shown in fig. 1 to fig. 4, the present embodiment provides a chip frequency measurement device, where the device includes the chip frequency measurement circuit described in each embodiment and at least one chip pad, where an input end of the chip pad may be used to be electrically connected to a frequency output end of a chip to be measured or to an output end of a reference signal source, and an output end of the chip pad may be electrically connected to a first input end of a microcontroller of the chip frequency measurement circuit. In this embodiment, when the frequency calibration is performed on the reference signal source or the frequency measurement is performed on the chip to be measured, the reference signal source or the chip to be measured may be placed on the chip base, so as to implement electrical connection between the reference signal source or the chip to be measured and the microcontroller, so that the pulse count value of the reference signal source or the chip to be measured may be collected by the microcontroller. In an alternative embodiment, the chip frequency measuring device may further include a circuit substrate and a housing, wherein the chip frequency measuring circuit is disposed on the circuit substrate, and the circuit substrate and the chip base are disposed on the housing.
According to the chip frequency measuring device, the reference signal source or the chip to be measured is placed through the chip base, and the electric connection between the reference signal source or the chip to be measured and the microcontroller can be conveniently achieved, so that the calibration efficiency of the reference signal source and the frequency measuring efficiency of the chip to be measured can be improved. In addition, by executing the chip frequency measurement method described in the above embodiment in the microprocessor of the chip frequency measurement circuit, measurement errors due to fixed deviation of an external clock source can be calibrated, and at the same time, minor errors due to various factors such as circuit hardware and software program execution can be calibrated, so that the accuracy of chip frequency measurement is improved. Through the circuit, the frequency measurement requirement of high precision can be met, the cost is saved, the circuit is convenient to carry, and the precision and the efficiency of chip frequency measurement can be improved.
In a specific application scenario, the chip frequency measuring circuit or the microcontroller in the chip frequency measuring device can be used for collecting a first pulse count value of the reference signal source and a second pulse count value of the external clock source in the same time period; calculating a reference frequency value of the external clock source according to the first pulse count value, the second pulse count value and the reference frequency value of the reference signal source; collecting a third pulse count value of a chip to be tested and a fourth pulse count value of an external clock source in the same time period; and obtaining the frequency value of the chip to be tested according to the third pulse count value, the fourth pulse count value and the reference frequency value of the external clock source.
In a specific application scenario, the chip frequency measurement circuit or the microcontroller in the chip frequency measurement device can be specifically used for starting external trigger interruption, outputting a counting start instruction, collecting the frequency pulse count value of the reference signal source in real time, and controlling the external counter to synchronously count the frequency pulses of the external clock source; when the frequency pulse count value of the reference signal source reaches a first pulse count value, closing an external trigger interrupt, outputting a count ending instruction to stop collecting the frequency pulse count value of the reference signal source, and controlling the external counter to stop synchronously counting the frequency pulses of the external clock source; and reading a first count value of the external counter, and taking the first count value as a second pulse count value of the external clock source.
In a specific application scenario, the chip frequency measurement circuit or the microcontroller in the chip frequency measurement device can be specifically used for obtaining the reference frequency value of the external clock source according to the product of the ratio of the second pulse count value to the first pulse count value and the reference frequency value of the reference signal source, wherein the reference frequency value of the reference signal source is calibrated in advance by an external instrument, and the frequency offset of the reference signal source is zero; the reference frequency value of the external clock source is stored in a non-volatile memory.
In a specific application scenario, the chip frequency measurement circuit or the microcontroller in the chip frequency measurement device can be specifically used for starting external trigger interruption, outputting a counting start instruction, collecting the frequency pulse count value of the chip to be measured in real time, and controlling an external counter to synchronously count the frequency pulses of an external clock source; when the frequency pulse count value of the chip to be tested reaches a third pulse count value, closing an external trigger interrupt, outputting a count ending instruction to stop collecting the frequency pulse count value of the chip to be tested, and controlling the external counter to stop synchronously counting the frequency pulses of the external clock source; and reading a second count value of the external counter, and taking the second count value as a fourth pulse count value of the external clock source.
In a specific application scenario, the chip frequency measurement circuit or the microcontroller in the chip frequency measurement device can be specifically used for reading out the reference frequency value of the external clock source in the nonvolatile memory; and obtaining the frequency value of the chip to be tested according to the product of the ratio of the third pulse count value to the fourth pulse count value and the reference frequency value of the external clock source, wherein the frequency offset of the external clock source is an arbitrary value.
In a specific application scenario, the chip frequency measurement circuit or the microcontroller in the chip frequency measurement device may be further configured to obtain a frequency deviation value of the chip to be measured according to a quotient of a difference between the frequency value of the chip to be measured and a preset theoretical frequency value and the theoretical frequency value, and output the frequency deviation value.
It should be noted that, for other corresponding descriptions of each functional unit related to the chip frequency measurement circuit or the chip frequency measurement device provided in this embodiment, reference may be made to the corresponding descriptions in the foregoing embodiments, which are not repeated herein.
Based on the above-mentioned methods shown in fig. 1 and 2, correspondingly, the present embodiment further provides a storage medium, on which a computer program is stored, which when executed by a processor, implements the above-mentioned chip frequency measurement method shown in fig. 1 and 2.
Based on such understanding, the technical solution of the present application may be embodied in the form of a software product, where the software product to be identified may be stored in a non-volatile storage medium (may be a CD-ROM, a U-disc, a mobile hard disk, etc.), and include several instructions for causing a computer device (may be a personal computer, a server, or a network device, etc.) to execute the method described in each implementation scenario of the present application.
Based on the method shown in fig. 1 and fig. 2 and the embodiments of the chip frequency measurement circuit shown in fig. 3 and fig. 4, in order to achieve the above object, the present embodiment further provides a computer device for chip frequency measurement, which may specifically be a personal computer, a server, a smart phone, a tablet computer, a smart watch, or other network devices, where the computer device includes a storage medium and a processor; a storage medium storing a computer program and an operating system; a processor for executing a computer program to implement the method as shown in fig. 1 and 2.
Optionally, the computer device may further include an internal memory, a communication interface, a network interface, a camera, a Radio Frequency (RF) circuit, a sensor, an audio circuit, a WI-FI module, a Display screen (Display), an input device such as a Keyboard (Keyboard), and the like, and optionally, the communication interface may further include a USB interface, a card reader interface, and the like. The network interface may optionally include a standard wired interface, a wireless interface (e.g., WI-FI interface), etc.
It will be appreciated by those skilled in the art that the computer device structure provided by the present embodiment for identification of an operational action is not limiting of the computer device and may include more or fewer components, or may combine certain components, or a different arrangement of components.
The storage medium may also include an operating system, a network communication module. The operating system is a program for managing the hardware of the computer device and the software resources to be identified, and supports the operation of the information processing program and other software and/or programs to be identified. The network communication module is used for realizing communication among all components in the storage medium and communication with other hardware and software in the information processing computer equipment.
From the above description of the embodiments, it will be apparent to those skilled in the art that the present application may be implemented by means of software plus necessary general hardware platforms, or may be implemented by hardware. Through applying the technical scheme of the application, first pulse count value of the reference signal source and second pulse count value of the external clock source in the same time period are measured at first, then the reference frequency value of the external clock source is corrected through the first pulse count value, the second pulse count value and the reference frequency value of the reference signal source, and then when the frequency value of the chip to be measured is measured, third pulse count value of the chip to be measured and fourth pulse count value of the external clock source in the same time period are collected, and finally the frequency value of the chip to be measured is obtained through the third pulse count value, the fourth pulse count value and the corrected reference frequency value of the external clock source. Compared with the prior art, the method can calibrate the measurement error caused by the fixed deviation of the external clock source, and can calibrate the tiny error caused by various factors such as circuit hardware and software program execution, thereby effectively improving the accuracy of chip frequency measurement.
Those skilled in the art will appreciate that the drawings are merely schematic illustrations of one preferred implementation scenario, and that the modules or flows in the drawings are not necessarily required to practice the present application. Those skilled in the art will appreciate that modules in an apparatus in an implementation scenario may be distributed in an apparatus in an implementation scenario according to an implementation scenario description, or that corresponding changes may be located in one or more apparatuses different from the implementation scenario. The modules of the implementation scenario may be combined into one module, or may be further split into a plurality of sub-modules.
The foregoing application serial numbers are merely for description, and do not represent advantages or disadvantages of the implementation scenario. The foregoing disclosure is merely a few specific implementations of the present application, but the present application is not limited thereto and any variations that can be considered by a person skilled in the art shall fall within the protection scope of the present application.
Claims (10)
1. A method for measuring chip frequency, the method comprising:
collecting a first pulse count value of a reference signal source and a second pulse count value of an external clock source in the same time period;
calculating a reference frequency value of the external clock source according to the first pulse count value, the second pulse count value and the reference frequency value of the reference signal source;
Collecting a third pulse count value of a chip to be tested and a fourth pulse count value of an external clock source in the same time period;
and obtaining the frequency value of the chip to be tested according to the third pulse count value, the fourth pulse count value and the reference frequency value of the external clock source.
2. The chip frequency measurement method according to claim 1, wherein the step of collecting the first pulse count value of the reference signal source and the second pulse count value of the external clock source during the same period of time includes:
starting external trigger interruption, outputting a counting start instruction to acquire the frequency pulse count value of the reference signal source in real time, and controlling an external counter to synchronously count the frequency pulses of the external clock source;
when the frequency pulse count value of the reference signal source reaches a first pulse count value, closing an external trigger interrupt, outputting a count ending instruction to stop collecting the frequency pulse count value of the reference signal source, and controlling the external counter to stop synchronously counting the frequency pulses of the external clock source;
and reading a first count value of the external counter, and taking the first count value as a second pulse count value of the external clock source.
3. The chip frequency measurement method according to claim 1 or 2, wherein the calculating the reference frequency value of the external clock source from the first pulse count value, the second pulse count value, and the reference frequency value of the reference signal source includes:
obtaining a reference frequency value of the external clock source according to the product of the ratio of the second pulse count value to the first pulse count value and the reference frequency value of the reference signal source, wherein the reference frequency value of the reference signal source is calibrated in advance by an external instrument, and the frequency offset of the reference signal source is zero;
the reference frequency value of the external clock source is stored in a non-volatile memory.
4. The chip frequency measurement method according to claim 1, wherein the step of collecting the third pulse count value of the chip to be measured and the fourth pulse count value of the external clock source in the same period of time includes:
starting external trigger interruption, outputting a counting start instruction to acquire the frequency pulse count value of the chip to be tested in real time, and controlling an external counter to synchronously count the frequency pulses of an external clock source;
when the frequency pulse count value of the chip to be tested reaches a third pulse count value, closing an external trigger interrupt, outputting a count ending instruction to stop collecting the frequency pulse count value of the chip to be tested, and controlling the external counter to stop synchronously counting the frequency pulses of the external clock source;
And reading a second count value of the external counter, and taking the second count value as a fourth pulse count value of the external clock source.
5. The method for measuring a chip frequency according to claim 1 or 4, wherein the obtaining the frequency value of the chip to be measured according to the third pulse count value, the fourth pulse count value, and the reference frequency value of the external clock source includes:
reading out a reference frequency value of the external clock source in a nonvolatile memory;
and obtaining the frequency value of the chip to be tested according to the product of the ratio of the third pulse count value to the fourth pulse count value and the reference frequency value of the external clock source, wherein the frequency offset of the external clock source is an arbitrary value.
6. The chip frequency measurement method according to claim 1, characterized in that the method further comprises:
obtaining a frequency deviation value of the chip to be tested according to the quotient of the difference between the frequency value of the chip to be tested and a preset theoretical frequency value and the theoretical frequency value, and outputting the frequency deviation value.
7. A chip frequency measuring circuit is used for measuring the frequency value of a chip to be measured, and is characterized by comprising a microcontroller, a standard clock source, a logic circuit, a counter and a power supply module, wherein,
The first input end of the microcontroller is used for being electrically connected with the frequency output end of the chip to be tested or the output end of the reference signal source, the first output end of the microcontroller is electrically connected with the first input end of the logic circuit, the second input end of the logic circuit is electrically connected with the output end of the standard clock source, the output end of the logic circuit is electrically connected with the control end of the counter, the input end of the counter is electrically connected with the output end of the standard clock source, the output end of the counter is electrically connected with the second input end of the microcontroller, and the power supply module is electrically connected with the microcontroller, the standard clock source, the logic circuit and the counter respectively, wherein the microcontroller is used for executing the chip frequency measuring method according to any one of claims 1 to 6.
8. A chip frequency measurement device comprising a chip frequency measurement circuit as claimed in claim 7 and at least one chip pad, wherein an input of the chip pad is adapted to be electrically connected to a frequency output of the chip to be measured or to an output of the reference signal source, and an output of the chip pad is electrically connected to a first input of a microcontroller of the chip frequency measurement circuit.
9. A storage medium having stored thereon a computer program, which when executed by a processor, implements the steps of the chip frequency measurement method of any of claims 1 to 6.
10. A computer device comprising a memory, a processor and a computer program stored on the memory and executable on the processor, characterized in that the computer program when executed by the processor implements the steps of the chip frequency measurement method according to any one of claims 1 to 6.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202310840749.6A CN116559528A (en) | 2023-07-11 | 2023-07-11 | Chip frequency measuring method, circuit, device, storage medium and computer equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202310840749.6A CN116559528A (en) | 2023-07-11 | 2023-07-11 | Chip frequency measuring method, circuit, device, storage medium and computer equipment |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN116559528A true CN116559528A (en) | 2023-08-08 |
Family
ID=87503906
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202310840749.6A Pending CN116559528A (en) | 2023-07-11 | 2023-07-11 | Chip frequency measuring method, circuit, device, storage medium and computer equipment |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN116559528A (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN117150988A (en) * | 2023-11-01 | 2023-12-01 | 成都北中网芯科技有限公司 | High-precision clock generation method, device, equipment and medium for verification environment |
| CN118033366A (en) * | 2023-12-28 | 2024-05-14 | 珠海芯试界半导体科技有限公司 | Test device, method, electronic apparatus, and computer-readable storage medium |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104375004A (en) * | 2013-08-14 | 2015-02-25 | 苏州海博智能系统有限公司 | Method and system for measuring crystal oscillator frequency error |
| CN110308762A (en) * | 2019-06-21 | 2019-10-08 | 广芯微电子（广州）股份有限公司 | A kind of clock frequency calibration method of chip interior clock source |
| US20210405099A1 (en) * | 2020-06-24 | 2021-12-30 | Seiko Epson Corporation | Frequency measurement apparatus, microcontroller, and electronic apparatus |
| CN114623939A (en) * | 2022-04-13 | 2022-06-14 | 杭州奥创光子技术有限公司 | Method, device, equipment and medium for determining pulse frequency |
| CN116169956A (en) * | 2023-01-09 | 2023-05-26 | 烟台东方威思顿电气有限公司 | Clock correction method and device based on power grid frequency and electric energy meter |
-
2023
- 2023-07-11 CN CN202310840749.6A patent/CN116559528A/en active Pending
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104375004A (en) * | 2013-08-14 | 2015-02-25 | 苏州海博智能系统有限公司 | Method and system for measuring crystal oscillator frequency error |
| CN110308762A (en) * | 2019-06-21 | 2019-10-08 | 广芯微电子（广州）股份有限公司 | A kind of clock frequency calibration method of chip interior clock source |
| US20210405099A1 (en) * | 2020-06-24 | 2021-12-30 | Seiko Epson Corporation | Frequency measurement apparatus, microcontroller, and electronic apparatus |
| CN114623939A (en) * | 2022-04-13 | 2022-06-14 | 杭州奥创光子技术有限公司 | Method, device, equipment and medium for determining pulse frequency |
| CN116169956A (en) * | 2023-01-09 | 2023-05-26 | 烟台东方威思顿电气有限公司 | Clock correction method and device based on power grid frequency and electric energy meter |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN117150988A (en) * | 2023-11-01 | 2023-12-01 | 成都北中网芯科技有限公司 | High-precision clock generation method, device, equipment and medium for verification environment |
| CN117150988B (en) * | 2023-11-01 | 2024-04-02 | 成都北中网芯科技有限公司 | High-precision clock generation method, device, equipment and medium for verification environment |
| CN118033366A (en) * | 2023-12-28 | 2024-05-14 | 珠海芯试界半导体科技有限公司 | Test device, method, electronic apparatus, and computer-readable storage medium |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN116559528A (en) | Chip frequency measuring method, circuit, device, storage medium and computer equipment | |
| US10345383B2 (en) | Useful battery capacity / state of health gauge | |
| CN107076571B (en) | For initializing the method, equipment and system of meter reading device | |
| US20140097825A1 (en) | Duty Cycle Detecting Circuit for Pulse Width Modulation | |
| CN111008239B (en) | Data synchronization method and system of asynchronous system and terminal equipment | |
| TW201303315A (en) | Method and system for measuring frequency | |
| CN113377155A (en) | Clock calibration method and device and electronic equipment | |
| CN101594133B (en) | Semiconductor integrated circuit, control method, and information processing apparatus | |
| CN114924119B (en) | Clock chip and frequency measuring method | |
| TW201403273A (en) | Clock test circuit | |
| US20170082695A1 (en) | Method and apparatus for determining battery parameters | |
| CN117761502A (en) | Method and device for verifying quality of board card, electronic equipment and storage medium | |
| CN111562543B (en) | Electric energy meter pulse per second error tester and electric energy meter pulse per second error testing method | |
| CN102457268B (en) | Implementation method for 32-bit capture register | |
| CN110456271A (en) | Detection method, device, equipment and the storage medium of motor hall signal | |
| CN112737574B (en) | Timing calibration method and related device for clock source in chip | |
| CN114093489B (en) | Method for confirming blood glucose detection time of non-intelligent blood glucose meter and related equipment | |
| US10175821B2 (en) | Touch calibration system and method thereof | |
| CN112015229B (en) | Circuit capable of realizing chip internal clock calibration by using debugger | |
| US9502956B1 (en) | Configuration of semiconductor device supply voltage | |
| CN113608574A (en) | Microsecond-level time output method and system for computer and calibration system | |
| CN107272862A (en) | Determine the method and terminal of terminal handler voltage | |
| CN107562266B (en) | Capacitive screen calibration method and device and terminal equipment | |
| US10498524B2 (en) | Timing method, clock device and terminal device | |
| CN111638750A (en) | Writer and RTC correcting method |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| RJ01 | Rejection of invention patent application after publication |
Application publication date: 20230808 |
|
| RJ01 | Rejection of invention patent application after publication |