CN104375004A - Method and system for measuring crystal oscillator frequency error - Google Patents
Method and system for measuring crystal oscillator frequency error Download PDFInfo
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- CN104375004A CN104375004A CN201310353130.9A CN201310353130A CN104375004A CN 104375004 A CN104375004 A CN 104375004A CN 201310353130 A CN201310353130 A CN 201310353130A CN 104375004 A CN104375004 A CN 104375004A
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Abstract
The invention provides a method for measuring the crystal oscillator frequency error. The method includes the steps of firstly, setting a reference crystal oscillator clock, and measuring the reference frequency F0 of the reference crystal oscillator clock through the satellite time service pulses per second; secondly, simultaneously counting clock signals sent by the reference crystal oscillator clock and clock signals sent by a to-be-measured crystal oscillator clock, setting a second comparison value to serve as the minimal frequency value of a to-be-measured crystal oscillator, stopping counting when the count value of the signals sent by the to-be-measured crystal oscillator clock reaches the second comparison value, stopping counting the signals sent by the reference crystal oscillator clock at the same time, recording the count value CN4 of the signals sent by the reference crystal oscillator clock, and conducting processing according to the count value CN4 and the reference frequency F0 so as to obtain the error of the to-be-measured crystal oscillator. According to the method, by using the characteristic that the satellite time service function pulses per second are free of long-term accumulated error and the characteristic that a high-accuracy crystal oscillator is stable in frequency in the short term in cooperation, a device and the method which can ensure the accuracy of measurement results in the short term and the long term are obtained, and the time drifting of an ordinary-accuracy crystal oscillator is obviously reduced after time compensation is conducted.
Description
Technical field
The present invention relates to clocking error fields of measurement, particularly a kind of method and system measuring crystal oscillation frequency error.
Background technology
Many electronic equipments all need very accurate clock, such as precise frequency measuring instrument, accurate period meter, precise frequency generator, especially for the time tag of network ID authentication.Time tag during mission life in need to keep synchronous with the time of certificate server, cause authentification failure after time error is excessive.And time tag relies on the crystal oscillator of its inside to maintain clock completely within the time reaching 3 to 5 years, even very little error also can accumulate out huge cumulative errors because of the time of several years, specialty is called time drift.The error requirements of the clock crystal oscillator of general time tag is within 5ppm, but the high cost of the crystal oscillator of 5ppm, be unacceptable for the time tag that quantity required is huge.Therefore, Crystal Oscillator Errors becomes a difficult problem of time tag promotion and application.
Solution carries out High Precision Frequency to general precision crystal oscillator, then do a certain amount of time migration compensation to reach high precision effect by token end.Carry out High Precision Frequency itself and require a more high-precision reference frequency source (or being called clock source), after reaching calibration, error reaches 5ppm, then reference frequency source needs the error reaching 1ppm or less.The approach that can produce the clock accuracy of 1ppm at present has use High Precision Crystal Oscillator, as temperature compensation type crystal oscillator or thermostatic type crystal oscillator, and utilizes the pps pulse per second signal of satellite time transfer function.Temperature compensation type crystal oscillator and thermostatic type crystal oscillator frequency stabilization in a short time, then can not ensure precision by aging action affects for a long time.
Clock signal second of satellite time transfer function is provided by satellite positioning receiver, and long-term accuracy is high, and without cumulative errors, the error of 10 years can not more than 1 second; But machine operation state can be subject in a short time, and the factor such as short-term losing lock, Satellite Experiment, electromagnetic interference (EMI) impact and can not precision be ensured.
Simple use said method can not take into account short-term and long-term measuring accuracy, also just can not reach the claimed accuracy of time bias.
Summary of the invention
The invention provides a kind of method measuring crystal oscillation frequency error, it comprises the following steps:
One benchmark crystal oscillator clock is set, records the reference frequency F0 of described benchmark crystal oscillator clock;
Start to count to the clock signal that described benchmark crystal oscillator clock and crystal oscillator clock to be measured send simultaneously, set a second fiducial value CP2, counting is stopped when the count value of described crystal oscillator clock signal to be measured reaches described second fiducial value CP2, described benchmark crystal oscillator clock signal also stops counting simultaneously, record the count value CN4 of described benchmark crystal oscillator clock signal, set up the mathematical model of the error DE of crystal oscillator to be measured and obtain the value of error DE according to described mathematical model.
Preferably, the mathematical model of the error of described crystal oscillator to be measured is DE=(CP2*F0)/(CN4*F1)-1, and wherein F1 is the nominal frequency of described crystal oscillator clock to be measured.
Preferably, the reference frequency F0 process of described benchmark crystal oscillator clock is:
Satellite time transfer function pps pulse per second signal and benchmark crystal oscillator clock are counted simultaneously, set a fiducial value CP1, counting is stopped when the count value of described satellite time transfer function pps pulse per second signal reaches CP1, stop described benchmark crystal oscillator clock count simultaneously, record the count value CN2 of now benchmark crystal oscillator clock, obtain the reference frequency F0=CN2/CP1 of described crystal oscillator to be measured.
Present invention also offers a kind of device measuring crystal oscillation frequency error, it comprises:
Described benchmark crystal oscillator, satellite time transfer function pps pulse per second signal, the first counter, the second counter, the 3rd counter, four-counter and calculation processing unit, described calculation processing unit is connected with described first counter, the second counter, the 3rd counter, four-counter respectively; Described satellite time transfer function pps pulse per second signal is connected with the first counter, and described benchmark crystal oscillator is connected with described second counter, four-counter respectively, and described crystal oscillator to be measured is connected with described four-counter;
Described satellite time transfer function pps pulse per second signal delivers to the first counter, described benchmark crystal oscillator tranmitting data register signal to the second counter, start to count after first counter and the second counter O reset simultaneously, when the first counter reaches the first default fiducial value CP1, described second counter stops counting, and calculation processing unit obtains the reference frequency F0 of benchmark crystal oscillator according to the count value CN2 of the second counter and the first fiducial value CP1 process;
Described crystal oscillator tranmitting data register signal to be measured is to the 3rd counter, described benchmark crystal oscillator tranmitting data register signal is to four-counter, start to count after described 3rd counter and four-counter reset simultaneously, when the 3rd counter reaches the second fiducial value, four-counter stops counting, second fiducial value is set as the nominal frequency of crystal oscillator to be measured, and calculation processing unit obtains the clock signal frequency error amount of crystal oscillator to be measured according to the count value CN4 of four-counter and reference frequency F0 process.
Preferably, be provided with the first comparer and the first analog switch between described first counter and described second counter, described benchmark crystal oscillator is connected with described second counter by described first analog switch;
The count results of described first counter is delivered to the first comparer and is compared with CP1, and when the first counter reaches CP1, described first comparer controls described first analog switch and disconnects, and makes described second counter stop counting.
Preferably, the described 3rd is provided with the second comparer and the second analog switch between counter and four-counter, and described benchmark crystal oscillator is connected with described four-counter by described second analog switch;
Count results is delivered to the second comparer and is compared by described 3rd counter, and when the 3rd counter reaches the second fiducial value, described second comparer controls described second analog switch and disconnects, and four-counter stops counting.
Preferably, the reference frequency F0=CN2/CP1 of benchmark crystal oscillator.
Preferably, described crystal oscillation frequency error to be measured is DE=(CP2*F0)/(CN4*F1)-1, and wherein F1 is the nominal frequency of described crystal oscillator clock to be measured.
Preferably, described 3rd counter is controlled after described calculation processing unit process obtains reference frequency F0 and four-counter starts to count.
Preferably, described calculation processing unit comprises based Quasi-crystals vibration frequency computing module, error calculating module, fiducial value setting module and counting dump block, and wherein said based Quasi-crystals vibration frequency computing module obtains the reference frequency F0 of benchmark crystal oscillator according to the count value CN2 of described second counter and the first fiducial value CP1 process;
Described error calculating module is according to count value CN4 and obtain the clock signal frequency error amount of crystal oscillator to be measured according to reference frequency F0 process;
Described fiducial value setting module is described first comparer and the second comparer setting fiducial value;
Described counting dump block is used for being carry out clearing process before described first counter, the second counter, the 3rd counter and four-counter start counting.
The present invention propose a kind of utilize the pulse per second (PPS) of satellite time transfer function without the feature of long-term accumulated error and High Precision Crystal Oscillator in a short time the feature of frequency stabilization be combined and reach short-term and measurement result apparatus and method accurately can be ensured for a long time, make the crystal oscillator of general precision by significantly reducing time drift after time bias.
Certainly, implement arbitrary product of the present invention might not need to reach above-described all advantages simultaneously.
Accompanying drawing explanation
The apparatus structure schematic diagram of the measurement crystal oscillation frequency error that Fig. 1 provides for the embodiment of the present invention;
The measurement device process schematic of the measurement crystal oscillation frequency error that Fig. 2 provides for the embodiment of the present invention.
Specific embodiment
Embodiment one
The invention provides a kind of method measuring crystal oscillation frequency error, it comprises the following steps:
First one benchmark crystal oscillator clock is set, records the reference frequency F0 of described benchmark crystal oscillator clock;
Start to count to the clock signal that described benchmark crystal oscillator clock and crystal oscillator clock to be measured send simultaneously, set a fiducial value CP2, counting is stopped when the count value of described crystal oscillator clock signal to be measured reaches described fiducial value CP2, described benchmark crystal oscillator clock signal also stops counting simultaneously, records the count value CN4 of described benchmark crystal oscillator clock signal;
The mathematical model setting up the error of crystal oscillator to be measured is DE=(CP2*F0)/(CN4*F1)-1, and wherein F1 is the nominal frequency of described crystal oscillator clock to be measured.
Each parameter in each mathematical model is substituted into the error amount DE obtaining crystal oscillator to be measured in described mathematical model.
The reference frequency F0 process of wherein said benchmark crystal oscillator clock is:
Satellite time transfer function pps pulse per second signal and benchmark crystal oscillator clock are counted simultaneously, set a fiducial value CP1, counting is stopped when the count value of described satellite time transfer function pps pulse per second signal reaches CP1, stop described benchmark crystal oscillator clock count simultaneously, record the count value CN2 of now benchmark crystal oscillator clock, obtain the reference frequency F0=CN2/CP1 of described crystal oscillator to be measured.
In the present embodiment, satellite time transfer function pps pulse per second signal can be gps satellite time service function pps pulse per second signal or big-dipper satellite time service function pps pulse per second signal, the present invention does not limit the signal source of satellite time transfer function pps pulse per second signal, and the present embodiment is only described for the example in two conventional satellite time transfer function pps pulse per second signal sources.
Embodiment two
As shown in Figure 1, the invention provides a kind of device measuring crystal oscillation frequency error, it comprises:
Benchmark crystal oscillator 201, satellite time transfer function pps pulse per second signal 101, first counter 102, second counter 105, the 3rd counter 302, four-counter 305 and calculation processing unit 400, calculation processing unit 400 is connected with the first counter 102, second counter 105, the 3rd counter 302, four-counter 305 respectively; Satellite time transfer function pps pulse per second signal 101 is connected with the first counter 102, and benchmark crystal oscillator 201 is connected with the second counter 105, four-counter 305 respectively, and crystal oscillator 301 to be measured is connected with the 3rd counter 302;
Satellite time transfer function pps pulse per second signal 101 delivers to the first counter 102, benchmark crystal oscillator 201 tranmitting data register signal to the second counter 105, start to count after first counter 102 and the second counter 105 reset simultaneously, when the first counter 102 reaches the first default fiducial value CP1, second counter 105 stops counting, and calculation processing unit 400 obtains the reference frequency F0 of benchmark crystal oscillator 201 according to the count value CN2 of the second counter and the first fiducial value CP1 process;
Crystal oscillator 301 tranmitting data register signal to be measured is to the 3rd counter 302, benchmark crystal oscillator 201 tranmitting data register signal is to four-counter 305, start to count after 3rd counter 302 and four-counter 305 reset simultaneously, when the 3rd counter 302 reaches the second fiducial value CP2, four-counter 305 stops counting, second fiducial value CP2 can be set to arbitrary value, and calculation processing unit 400 is set up has the mathematical model of the error DE of crystal oscillator 301 to be measured and the value obtaining error DE according to described mathematical model.
In the present embodiment, the reference frequency F0=CN2/CP1 of the benchmark crystal oscillator 201 that computing obtains, the mathematical model of crystal oscillator 301 frequency error to be measured is DE=(CP2*F0)/(CN4*F1)-1, and wherein F1 is the nominal frequency of described crystal oscillator clock to be measured.
In the present embodiment, can also be provided with the first comparer 103 and the first analog switch 104 between the first counter 102 and the second counter 105, benchmark crystal oscillator 201 is connected with the second counter 105 by the first analog switch 104;
The count results of the first counter 102 is delivered to the first comparer 103 and is compared with CP1, and when the first counter 102 reaches CP1, the first comparer 103 controls the first analog switch 104 disconnection makes the second counter 105 stop counting.
Certainly the second counter 105 provided by the invention also can carry out the stopping controlling counting by other means, and the present embodiment is only a preferred embodiment of the present invention.
In the present embodiment, can also be provided with the second comparer 303 and the second analog switch 304 between the 3rd counter 302 and four-counter 305, benchmark crystal oscillator 201 is connected with four-counter 305 by the second analog switch 304;
Count results is delivered to the second comparer 303 and is compared by the 3rd counter 302, and when the 3rd counter 302 reaches the second fiducial value, the second comparer 303 controls the second analog switch 304 and disconnects, and four-counter 305 stops counting.
Certainly four-counter provided by the invention also can control the stopping of its counting by other means, and the present embodiment is only a preferred embodiment of the present invention.
The present embodiment controls the 3rd counter 302 after first obtaining reference frequency F0 by calculation processing unit 400 process and four-counter 305 starts to count.
The calculation processing unit 400 that the present embodiment provides comprises based Quasi-crystals vibration frequency computing module, error calculating module, fiducial value setting module and counting dump block, and wherein based Quasi-crystals vibration frequency computing module 401 carries out processing the reference frequency F0 obtaining benchmark crystal oscillator according to the count value CN2 of the second counter 105 and the first fiducial value CP1;
Described error calculating module is according to count value CN4 and obtain the clock signal frequency error amount of crystal oscillator to be measured according to reference frequency F0 process;
Described fiducial value setting module is that the first comparer 103 and the second comparer 303 set fiducial value;
Counting dump block 404 carries out clearing process for start counting for the first counter 102, second counter 105, the 3rd counter 302 and four-counter 305 before.
The principle of the present embodiment is:
The present embodiment is by obtaining reference frequency FO by the count value CN2 of the second counter divided by the first setting value CP1, and it is larger that the first setting value CP1 sets, and the reference frequency FO recorded is more accurate.Here CN2=F0*T1, T1 is the time of the second rolling counters forward, first setting value CP1 equals the gate time of satellite time transfer pps pulse per second signal, its gate time is also T1 herein, the frequency of the present embodiment satellite time transfer pps pulse per second signal is approximately 1, so the count value CN1=CP1=T1 of the first counter 102, finally obtain the reference frequency F0=CN2/CP1 of benchmark crystal oscillator 201.
The actual frequency of crystal oscillator 301 clock signal to be measured is F2, its nominal frequency is F1, the present embodiment final purpose obtains the deviation between nominal frequency F1 and its actual frequency F2, the count value CN3=F2*T2 of the 3rd counter 302 in the present embodiment, T2 is the time that the 3rd counter 302 counts here, and the count value of four-counter 305 is CN4=F0*T2, and in the present embodiment, second fiducial value is CP2, i.e., during the count value CN3=CP2 of the 3rd counter 302, four-counter 305 stops counting; Various above comprehensive obtains CN4/F0=CP2/F2, and then obtains F2=CP2*F0/CN4, and then obtains F2/F1=CP2*F0/ (CN4*F1).Carry out differing obtain DE=F2/F1-1=CP2*F0/ (CN4*F1)-1 with 1, the present embodiment definition DE is the deviate of crystal oscillator 301 to be measured.
In the present embodiment, satellite time transfer function pps pulse per second signal can be gps satellite time service function pps pulse per second signal or big-dipper satellite time service function pps pulse per second signal, the present invention does not limit the signal source of satellite time transfer function pps pulse per second signal, and the present embodiment is only described for the example in two conventional satellite time transfer function pps pulse per second signal sources.
The present invention proposes and a kind ofly utilize the pulse per second (PPS) of satellite time transfer function without the feature of the feature of long-term accumulated error and High Precision Crystal Oscillator frequency stabilization in a short time, being combined and reaching short-term and measurement result apparatus and method accurately can be ensured for a long time, making the crystal oscillator of general precision by significantly reducing time drift after time bias.
The disclosed preferred embodiment of the present invention just sets forth the present invention for helping above.Preferred embodiment does not have all details of detailed descriptionthe, does not limit the embodiment that this invention is only described yet.Obviously, according to the content of this instructions, can make many modifications and variations.This instructions is chosen and is specifically described these embodiments, is to explain principle of the present invention and practical application better, thus makes art technician understand well and to utilize the present invention.The present invention is only subject to the restriction of claims and four corner and equivalent.
Claims (10)
1. measure a method for crystal oscillation frequency error, it is characterized in that, comprise the following steps:
One benchmark crystal oscillator clock is set, records the reference frequency F0 of described benchmark crystal oscillator clock;
Start to count to the clock signal that described benchmark crystal oscillator clock and crystal oscillator clock to be measured send simultaneously, set a second fiducial value CP2, counting is stopped when the count value of described crystal oscillator clock signal to be measured reaches described second fiducial value CP2, described benchmark crystal oscillator clock signal also stops counting simultaneously, record the count value CN4 of described benchmark crystal oscillator clock signal, set up the mathematical model of the error DE of crystal oscillator to be measured and obtain the value of error DE according to described mathematical model.
2. the method measuring Crystal Oscillator Errors as claimed in claim 1, it is characterized in that, the mathematical model of the error of described crystal oscillator to be measured is DE=(CP2*F0)/(CN4*F1)-1, and wherein F1 is the nominal frequency of described crystal oscillator clock to be measured.
3. the method measuring crystal oscillation frequency error as claimed in claim 1, it is characterized in that, the reference frequency F0 process of described benchmark crystal oscillator clock is:
Satellite time transfer function pps pulse per second signal and benchmark crystal oscillator clock are counted simultaneously, set a fiducial value CP1, counting is stopped when the count value of described satellite time transfer function pps pulse per second signal reaches CP1, stop described benchmark crystal oscillator clock count simultaneously, record the count value CN2 of now benchmark crystal oscillator clock, obtain the reference frequency F0=CN2/CP1 of described crystal oscillator to be measured.
4. measure a device for crystal oscillation frequency error, it is characterized in that, comprising:
Described benchmark crystal oscillator, satellite time transfer function pps pulse per second signal, the first counter, the second counter, the 3rd counter, four-counter and calculation processing unit, described calculation processing unit is connected with described first counter, the second counter, the 3rd counter, four-counter respectively; Described satellite time transfer function pps pulse per second signal is connected with the first counter, and described benchmark crystal oscillator is connected with described second counter, four-counter respectively, and described crystal oscillator to be measured is connected with described four-counter;
Described satellite time transfer function pps pulse per second signal delivers to the first counter, described benchmark crystal oscillator tranmitting data register signal to the second counter, start to count after first counter and the second counter O reset simultaneously, when the first counter reaches the first default fiducial value CP1, described second counter stops counting, and calculation processing unit obtains the reference frequency F0 of benchmark crystal oscillator according to the count value CN2 of the second counter and the first fiducial value CP1 process;
Described crystal oscillator tranmitting data register signal to be measured is to the 3rd counter, described benchmark crystal oscillator tranmitting data register signal is to four-counter, start to count after described 3rd counter and four-counter reset simultaneously, when the 3rd counter reaches the second fiducial value, four-counter stops counting, second fiducial value is set as the nominal frequency of crystal oscillator to be measured, and calculation processing unit obtains the clock signal frequency error amount of crystal oscillator to be measured according to the count value CN4 of four-counter and reference frequency F0 process.
5. the device measuring crystal oscillation frequency error as claimed in claim 4, it is characterized in that, be provided with the first comparer and the first analog switch between described first counter and described second counter, described benchmark crystal oscillator is connected with described second counter by described first analog switch;
The count results of described first counter is delivered to the first comparer and is compared with CP1, and when the first counter reaches CP1, described first comparer controls described first analog switch disconnection makes described second counter stop counting.
6. the device measuring crystal oscillation frequency error as claimed in claim 4, it is characterized in that, described 3rd is provided with the second comparer and the second analog switch between counter and four-counter, described benchmark crystal oscillator is connected with described four-counter by described second analog switch;
Count results is delivered to the second comparer and is compared by described 3rd counter, and when the 3rd counter reaches the second fiducial value, described second comparer controls described second analog switch and disconnects, and four-counter stops counting.
7. the device measuring crystal oscillation frequency error as claimed in claim 4, is characterized in that, the reference frequency F0=CN2/CP1 of benchmark crystal oscillator.
8. the device measuring crystal oscillation frequency error as claimed in claim 4, it is characterized in that, described crystal oscillation frequency error to be measured is DE=(CP2*F0)/(CN4*F1)-1, and wherein F1 is the nominal frequency of described crystal oscillator clock to be measured.
9. the as claimed in claim 4 device measuring crystal oscillation frequency error, is characterized in that, controls described 3rd counter and four-counter starts to count after described calculation processing unit process obtains reference frequency F0.
10. the device measuring crystal oscillation frequency error as claimed in claim 4, it is characterized in that, described calculation processing unit comprises based Quasi-crystals vibration frequency computing module, error calculating module, fiducial value setting module and counting dump block, and wherein said based Quasi-crystals vibration frequency computing module obtains the reference frequency F0 of benchmark crystal oscillator according to the count value CN2 of described second counter and the first fiducial value CP1 process;
Described error calculating module is according to count value CN4 and obtain the clock signal frequency error amount of crystal oscillator to be measured according to reference frequency F0 process;
Described fiducial value setting module is described first comparer and the second comparer setting fiducial value;
Described counting dump block is used for being carry out clearing process before described first counter, the second counter, the 3rd counter and four-counter start counting.
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| CN104993818A (en) * | 2015-05-19 | 2015-10-21 | 苏州海博智能系统有限公司 | Intelligent card wireless frequency-offset calibration method |
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| CN109407498A (en) * | 2018-01-04 | 2019-03-01 | 国网四川省电力公司电力科学研究院 | A kind of clock of power meter test method and clock of power meter test device |
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| CN116559528A (en) * | 2023-07-11 | 2023-08-08 | 北京炬玄智能科技有限公司 | Chip frequency measuring method, circuit, device, storage medium and computer equipment |
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| CN106707020B (en) * | 2016-12-22 | 2019-06-11 | 武汉盛帆电子股份有限公司 | Pulse detecting equipment and pulse detecting method |
| CN109407498A (en) * | 2018-01-04 | 2019-03-01 | 国网四川省电力公司电力科学研究院 | A kind of clock of power meter test method and clock of power meter test device |
| CN108344559A (en) * | 2018-02-07 | 2018-07-31 | 肖世涛 | A kind of measurement method of waveform frequency generator noise |
| CN109557577A (en) * | 2019-01-16 | 2019-04-02 | 合肥国为电子有限公司 | Suitable for the seismographic clock-generating device of node and method |
| CN116559528A (en) * | 2023-07-11 | 2023-08-08 | 北京炬玄智能科技有限公司 | Chip frequency measuring method, circuit, device, storage medium and computer equipment |
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Application publication date: 20150225 |