CN111562543B - Electric energy meter pulse per second error tester and electric energy meter pulse per second error testing method - Google Patents

Electric energy meter pulse per second error tester and electric energy meter pulse per second error testing method Download PDF

Info

Publication number
CN111562543B
CN111562543B CN202010484418.XA CN202010484418A CN111562543B CN 111562543 B CN111562543 B CN 111562543B CN 202010484418 A CN202010484418 A CN 202010484418A CN 111562543 B CN111562543 B CN 111562543B
Authority
CN
China
Prior art keywords
pulse
rtc
chip
value
controller
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN202010484418.XA
Other languages
Chinese (zh)
Other versions
CN111562543A (en
Inventor
黄苏芳
周杨凡
朱信伟
刘晓露
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hangzhou Vango Technologies Inc
Original Assignee
Hangzhou Vango Technologies Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hangzhou Vango Technologies Inc filed Critical Hangzhou Vango Technologies Inc
Priority to CN202010484418.XA priority Critical patent/CN111562543B/en
Publication of CN111562543A publication Critical patent/CN111562543A/en
Application granted granted Critical
Publication of CN111562543B publication Critical patent/CN111562543B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00Testing or calibrating of apparatus covered by the other groups of this subclass
    • G01R35/04Testing or calibrating of apparatus covered by the other groups of this subclass of instruments for measuring time integral of power or current

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Temperature Or Quantity Of Heat (AREA)
  • Electric Clocks (AREA)

Abstract

The application discloses electric energy meter pulse per second error tester includes: an RTC chip; the voltage reduction module is used for reducing the voltage of the received direct current input and then supplying power to the controller, the display module and the RTC chip; the controller is used for determining a pulse per second period error value aiming at the target chip according to the acquired pulse per second capture value of the RTC chip and the acquired pulse per second capture value of the target chip; and the display module is used for displaying the pulse per second period error value. By the scheme, the clock error test of the electric energy meter can be conveniently carried out. The application also provides a method for testing the pulse per second error of the electric energy meter, and the method has corresponding technical effects.

Description

Electric energy meter pulse per second error tester and electric energy meter pulse per second error testing method
Technical Field
The invention relates to the technical field of electric energy meter error testing, in particular to an electric energy meter pulse per second error tester and an electric energy meter pulse per second error testing method.
Background
In order to detect the clock accuracy of the electric energy meter, a target chip inside the electric energy meter outputs a clock signal with a predetermined frequency, and the clock signal is output to an external standard meter for calibration, for example, a 1Hz clock signal is output. Although the traditional pulse detection instrument has complete functions, the traditional pulse detection instrument is not beneficial to field operation and cannot meet the requirement of carrying about of a user, so that the traditional pulse detection instrument is inconvenient to use in some occasions.
In summary, how to more conveniently test the clock error of the electric energy meter is a technical problem that those skilled in the art are in urgent need to solve.
Disclosure of Invention
The invention aims to provide a second pulse error tester and a second pulse error testing method for an electric energy meter, so as to more conveniently test the clock error of the electric energy meter.
In order to solve the technical problems, the invention provides the following technical scheme:
an electric energy meter pulse-per-second error tester, comprising:
an RTC chip;
the voltage reduction module is used for reducing the voltage of the received direct current input and supplying power to the controller, the display module and the RTC chip;
the controller is used for determining a pulse per second period error value aiming at the target chip according to the acquired pulse per second capture value of the RTC chip and the acquired pulse per second capture value of the target chip;
and the display module is used for displaying the pulse per second period error value.
Preferably, the voltage reduction module is specifically configured to:
and after the received direct current input is subjected to voltage reduction through the USB interface, the controller, the display module and the RTC chip are powered.
Preferably, the RTC controller further comprises a temperature measuring module for detecting a temperature value of the RTC chip and sending the temperature value to the controller;
the controller is further configured to: acquiring a temperature value of the target chip, and determining a difference value between the temperature value of the target chip and the temperature value of the RTC chip detected by the temperature measurement module;
the display module is further configured to display the difference value.
Preferably, the controller is further configured to:
after receiving the first correction instruction, based on the standard temperature value, the temperature value of the RTC chip detected by the temperature measurement module is self-corrected.
Preferably, the controller is further configured to:
and after receiving the second correction instruction, performing RTC self-correction on the RTC chip based on the standard second pulse.
Preferably, the controller is specifically configured to:
after receiving the second correction instruction, acquiring the second pulse capture value of the standard second pulse and the second pulse capture value of the RTC chip, and passing
Figure BDA0002518602230000021
Using the calculated delta c as a correction parameter to enable the RTC chip to be based on aT 2 Determining the vibration frequency corresponding to the pulse per second by + bT + c + delta c;
wherein f is 1 Representing the pulse-per-second capture value, f, of the RTC chip 2 Second pulse Capture value, a, representing standard second pulseB and c are fixed parameters of the RTC chip, T is an environmental temperature value, y 1 =aT 2 + bT + c, which represents the frequency response curve adopted by the RTC chip before RTC self-correction, y 2 =aT 2 + bT + c + Δ c represents the frequency response curve adopted by the RTC chip after RTC self-correction.
A second pulse error testing method for an electric energy meter comprises the following steps:
the voltage reduction module reduces the voltage of the received direct current input and supplies power to the controller, the display module and the RTC chip;
the controller determines a pulse per second period error value aiming at the target chip through the acquired pulse per second capture value of the RTC chip and the pulse per second capture value of the target chip;
the display module displays the pulse per second error value.
Preferably, after the step-down module steps down the received dc input, the step-down module supplies power to the controller, the display module and the RTC chip, and includes:
the voltage reduction module reduces the voltage of the received direct current input through the USB interface and supplies power to the controller, the display module and the RTC chip.
Preferably, the method further comprises the following steps:
the temperature measurement module detects the temperature value of the RTC chip and sends the temperature value to the controller;
the controller acquires the temperature value of the target chip and determines the difference value between the temperature value of the target chip and the temperature value of the RTC chip detected by the temperature measurement module;
the display module displays the difference value.
Preferably, the method further comprises the following steps:
and after receiving the second correction instruction, the controller performs RTC self-correction on the RTC chip based on the standard second pulse.
By applying the technical scheme provided by the embodiment of the invention, the voltage reduction module receives direct current input, and can supply power to the controller, the display module and the RTC chip after voltage reduction, and compared with the traditional scheme that voltage reduction is carried out after rectification, the size of the electric energy meter pulse per second error tester provided by the invention is favorably reduced. In addition, in the application, error detection is only realized for the pulse per second of the target chip, and other functional devices are not needed to be configured as in the conventional scheme, which is beneficial to further reducing the volume. In conclusion, the electric energy meter second pulse error tester has small volume and is convenient to carry, and the clock error test of the electric energy meter is facilitated.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to the drawings without creative efforts.
FIG. 1 is a schematic structural diagram of a pulse-per-second error tester for an electric energy meter according to the present invention;
FIG. 2 is a schematic diagram of another second pulse error tester for an electric energy meter according to the present invention;
FIG. 3 is a frequency response curve y of the RTC chip 10 in one specific case 1 A schematic diagram of (a);
FIG. 4 is a flowchart illustrating an embodiment of a method for measuring a pulse-per-second error of an electric energy meter according to the present invention.
Detailed Description
The core of the invention is to provide the second pulse error tester of the electric energy meter, which is small in size and convenient to carry, and is beneficial to conveniently testing the clock error of the electric energy meter.
In order that those skilled in the art will better understand the disclosure, the invention will be described in further detail with reference to the accompanying drawings and specific embodiments. It is to be understood that the described embodiments are merely exemplary of the invention, and not restrictive of the full scope of the invention. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
Referring to fig. 1, fig. 1 is a schematic structural diagram of a second pulse error tester of an electric energy meter according to the present invention, where the second pulse error tester of the electric energy meter may include:
an RTC chip 10;
the voltage reduction module 20 is configured to reduce a voltage of the received dc input and supply power to the controller 30, the display module 40, and the RTC chip 10;
the controller 30 is configured to determine a pulse per second period error value for the target chip according to the acquired pulse per second capture value of the RTC chip 10 and the acquired pulse per second capture value of the target chip;
and the display module 40 is used for displaying the pulse-per-second period error value.
In the scheme of the application, an RTC (Real Time Clock) chip 10 is arranged in the electric energy meter second pulse error tester, and the controller 30 can determine the second pulse period error value for a target chip, which is a Clock chip in the electric energy meter.
Moreover, it can be understood that, since the present application is based on the RTC chip 10 built in the electric energy meter second pulse error tester to implement the second pulse error test on the target chip, the RTC chip 10 built in may generally adopt the high-precision RTC chip 10, thereby being beneficial to improving the second pulse error test precision of the present application scheme on the target chip. The high-precision RTC chip 10 can output a high-precision pulse-per-second signal.
For example, the RTC chip 10 may be a DS3231 chip, which has low cost and high precision, and has an integrated temperature compensated crystal oscillator and crystal. The precision is + -2ppm within the range of 15 ℃ to 35 ℃, and the RTC adjustment difference is within 0.1 ppm.
The specific circuit configuration of the buck module 20 can also be set and adjusted according to the requirement, for example, the buck module 20 can include an LDO regulator to convert the input dc power into 3.3V output, so as to supply power to the controller 30, the display module 40 and the RTC chip 10. It should be noted that, in practical applications, the dc output of the voltage-reducing module 20 may supply power to the controller 30, and then the controller 30 outputs the electric energy to the display module 40 and/or the RTC chip 10, which does not affect the implementation of the present invention, that is, the components of the electric energy meter second pulse error tester that need to supply power may be directly or indirectly connected to the voltage-reducing module 20.
In addition, when the electric energy meter second pulse error tester also comprises other modules needing power supply, the electric energy meter second pulse error tester can also be directly or indirectly electrically connected with the voltage reduction module 20 so as to obtain electric energy. In addition, in specific implementation, an energy storage device, for example, a rechargeable battery, may be further disposed in the second pulse error tester of the electric energy meter, and is configured to supply power to the second pulse error tester of the electric energy meter when the second pulse error tester of the electric energy meter is not connected to an external power source.
Considering that PCs are widely used and USB interface is a common interface, in an embodiment of the present invention, the voltage-reducing module 20 may be specifically configured to:
after the received dc input is stepped down through the USB interface, power is supplied to the controller 30, the display module 40 and the RTC chip 10.
In the scheme of the application, the target chip in the electric energy meter is required to be able to output the pulse per second, and the controller 30 can determine the pulse per second period error value for the target chip according to the acquired pulse per second capture value of the RTC chip 10 and the pulse per second capture value of the target chip.
The pulse per second capture value refers to a count frequency read by a timer in the controller 30, for example, in practical applications, the controller 30 is usually an MCU, and the timer is built in the MCU, for example, the controller 30 with the model of LPC2148 may be specifically selected.
When the pulse-per-second period error value of the target chip is determined, the RTC chip 10 is used as a reference, and specifically, the pulse-per-second capture value of the RTC chip 10 is represented as f 1 The capture value of second pulse of the target chip is expressed as f 3 Then, then
Figure BDA0002518602230000051
The error between the second pulse period of the target chip and the second pulse period of the RTC chip 10 is shown.
For example, at 23 ℃, the crystal inside the RTC chip 10 vibrates 32768 times, and the corresponding duration is considered to be 1 second integer, based on which the RTC chip 10 outputs a second pulse with a frequency of 1 Hz. The timer detects the second pulse output by the RTC chip 10, for example, when the level rises, the timer starts counting, and when the next rising edge occurs, the timer stops counting, and if the count value of the timer reaches 200M, that is, the second pulse output by the RTC chip 10 is regarded as a standard second pulse of 1Hz at the current temperature, the crystal oscillator in the counter jumps by 200M. Accordingly, the pulse per second output from the target chip also needs to be detected, and it can be understood that if there is no error between the target chip and the RTC chip 10, i.e. the pulse per second output from the target chip is also a standard pulse per second of 1Hz, the crystal oscillator in the counter should also jump 200M. Assuming that the period of the second pulse of the target chip is 1.000040 seconds, the crystal oscillator in the counter will jump 200008000, i.e. in this example,
Figure BDA0002518602230000061
Figure BDA0002518602230000062
that is, the error value of the pulse period per second for the target chip is 40ppm, which indicates that at the current temperature, the target chip considers the actual 1.000040 seconds to be 1 second, and the target chip is slower by 0.00004 seconds.
The display module 40 may display the value of the pulse-per-second error determined by the controller 30 for the target chip, for example, in the foregoing example, the display module 40 may display 40ppm. The specific device selection of the display module 40 may also be selected according to actual needs.
Further, in an embodiment of the present invention, referring to fig. 2, a temperature measurement module 50 may be further included, configured to detect a temperature value of the RTC chip 10 and send the temperature value to the controller 30;
the controller 30 is also configured to: acquiring a temperature value of a target chip, and determining a difference value between the temperature value of the target chip and the temperature value of the RTC chip 10 detected by the temperature measurement module 50;
the display module 40 is further configured to display the difference value.
In this embodiment, in consideration of the fact that there may be a certain error between the temperature detected by the target chip and the actual temperature in addition to the clock of the target chip, the temperature measurement module 50 is disposed in the second pulse error tester of the electric energy meter, for example, the low power consumption digital output temperature sensor TMP275 can be selected as the temperature measurement module 50 of the present application, the accuracy is ± 0.5 ℃ in the range of-20 ℃ to +100 ℃, and the accuracy is within 0.0625 ℃ in the range of 15 ℃ to 35 ℃ with 12-bit programmable resolution.
For example, if the temperature value of the RTC chip 10 obtained by the temperature measurement module 50 is 25 ℃, and the temperature value of the read target chip is 24.5 ℃, the difference is 24.5 ℃ to 25 = -0.5 ℃, and the display module 40 displays the difference at-0.5 ℃.
Further, the present application also considers that although the RTC chip 10 and the temperature measurement module 50 with high precision are disposed in the second pulse error tester of the electric energy meter, certain discreteness still exists between different RTC chips 10 and temperature measurement chips, and therefore, the present application can also perform self-correction of temperature and/or self-correction of RTC for the second pulse error tester of the electric energy meter.
Specifically, in an embodiment of the present invention, the controller 30 may further be configured to:
after receiving the first correction instruction, the temperature value of the RTC chip 10 detected by the temperature measurement module 50 is self-corrected based on the standard temperature value.
For example, the standard temperature value may be provided by a standard temperature detection device, for example, the standard temperature value of the current environment provided by the standard temperature detection device is T1, and the temperature value of the RTC chip 10 detected by the temperature measurement module 50 is T2, then T1-T2 may be used as a self-calibration temperature value and stored in a corresponding register, so as to implement self-calibration of the temperature, that is, after the temperature self-calibration, the electric energy meter second pulse error tester may add the original detection value of the temperature measurement module 50 to the previously stored value T1-T2, so as to use the original detection value as the detected actual temperature value.
The trigger mode of the first correction instruction may be set according to actual needs, for example, a related button may be disposed on a housing of the electric energy meter second pulse error tester, and after the button is pressed, the temperature self-correction mode may be entered, and the standard temperature value is input into the controller 30 to implement temperature self-correction, for example, the standard temperature value is connected to the electric energy meter second pulse error tester through a PC, so that the value of the standard temperature value is transmitted to the controller 30.
In one embodiment of the present invention, the controller 30 may be further configured to:
after receiving the second correction instruction, the RTC chip 10 is RTC self-corrected based on the standard second pulse.
Similar to the first correction instruction, the trigger form of the second correction instruction may also be set according to actual needs, and in practical application, the RTC may be self-corrected as well as the temperature.
It can be understood that, to perform self-calibration of the RTC chip 10 in the electric energy meter second pulse error tester, a standard second pulse needs to be provided, and the standard second pulse can be provided by a frequency counter, a clock tester, and the like, and of course, the accuracy should be very high, at least higher than the RTC chip 10 in the electric energy meter second pulse error tester, and the self-calibration is meaningful.
In particular, the controller 30 may be specifically configured to:
after receiving the second correction instruction, acquiring the second pulse capture value of the standard second pulse and the second pulse capture value of the RTC chip 10, and passing
Figure BDA0002518602230000081
Using the calculated Δ c as a correction parameter to make the RTC chip 10 based on the aT 2 Determining the vibration frequency corresponding to the pulse per second by + bT + c + delta c;
wherein f is 1 Second pulse Capture value, f, representing RTC chip 10 2 The capture value of the standard pulse per second (a, b, c) is a fixed parameter of the RTC chip 10, T is an environmental temperature value, y 1 =aT 2 + bT + c represents the frequency response curve adopted by the RTC chip 10 before RTC self-calibration is not performed, y 2 =aT 2 + bT + c + Δ c represents the frequency response curve adopted by the RTC chip 10 after RTC self-correction.
In this embodiment, y 1 =aT 2 + bT + c is the frequency response curve given by the manufacturer of the RTC chip 10. In addition, in practical application, in order to avoid a large error of a frequency response curve given by a manufacturer, the RTC chip 10 may be tested based on a frequency counter or other devices to obtain the vibration frequency of the RTC chip 10 at different temperatures, and then y is obtained by fitting 1 . For example, FIG. 3 shows the frequency response curve y of the RTC chip 10 in one specific case 1 The fitting result is y 1 =-9.42×10 -4 T 2 +0.03849T+32766.966。
y 1 Meaning that the RTC chip 10 needs to vibrate y when the temperature is T 1 Next, it is regarded as 1 second, i.e., the vibration frequency is y 1
And it should be noted that y is given by the manufacturer 1 Or y fitted after detection 1 A and b are usually accurate, but the constant term parameter c has a certain error and changes with the aging of the crystal of the RTC chip 10, so in this embodiment, the calculated Δ c is used as a correction parameter to make the RTC chip 10 based on aT 2 And + bT + c + delta c determines the vibration frequency corresponding to the pulse per second.
For example, in one specific example,
Figure BDA0002518602230000082
that is, at the current temperature, the RTC chip 10 regards the actual 1.000040 seconds as 1 second with the standard second pulse as a reference. Then solving:
Figure BDA0002518602230000083
Δ c can be calculated to obtain the frequency response curve y after RTC self-correction 2
In addition, it can be understood that, for example, the frequency counter provides the standard second pulse, when the frequency counter provides the standard second pulse, the frequency counter should be placed in the same environment as the RTC chip 10, and after standing for a period of time, RTC self-calibration is performed on the RTC chip 10 to ensure the accuracy of the standard second pulse provided by the frequency counter.
In such an embodiment, the method comprises:
Figure BDA0002518602230000091
calculates Δ c to obtain a frequency response curve y used by the RTC chip 10 before RTC self-correction 1 The correction of constant item parameters is carried out, the scheme is simple and convenient, the self-correction of the scheme can be carried out at any temperature, and only the standard pulse per second used as a reference needs to be ensured to be accurate, namely, the RTC chip 10 and the device for providing the standard pulse per second are ensured to be in the same environmental temperature.
By applying the technical scheme provided by the embodiment of the invention, the voltage reduction module 20 receives direct current input, and can supply power to the controller 30, the display module 40 and the RTC chip 10 after voltage reduction, so that compared with the traditional scheme that voltage reduction is carried out after rectification, the size of the electric energy meter pulse per second error tester provided by the invention is favorably reduced. In addition, in the present application, error detection is only implemented for the pulse per second of the target chip, and other functional devices are not required to be configured as in the conventional scheme, which is beneficial to further reducing the volume, specifically, the controller 30 determines the pulse per second period error value for the target chip through the acquired pulse per second capture value of the RTC chip 10 and the pulse per second capture value of the target chip, and then the display module 40 may display the pulse per second period error value. In conclusion, the electric energy meter second pulse error tester has small volume and is convenient to carry, and the clock error test of the electric energy meter is facilitated.
Corresponding to the embodiment of the electric energy meter pulse per second error tester, the embodiment of the invention also provides an electric energy meter pulse per second error testing method, which can be correspondingly referred to with the embodiment.
Referring to fig. 4, a flowchart of an embodiment of a method for testing an error of a pulse per second of an electric energy meter according to the present invention includes:
step S101: the voltage reduction module is used for reducing the voltage of the received direct current input and then supplying power to the controller, the display module and the RTC chip;
step S102: the controller determines a pulse per second period error value aiming at the target chip through the acquired pulse per second capture value of the RTC chip and the pulse per second capture value of the target chip;
step S103: the display module displays the pulse per second period error value.
In one embodiment of the present invention, step S101 includes:
the voltage reduction module is used for supplying power to the controller, the display module and the RTC chip after reducing the voltage of the received direct current input through the USB interface.
In one embodiment of the present invention, the method further comprises:
the temperature measurement module detects the temperature value of the RTC chip and sends the temperature value to the controller;
the controller acquires a temperature value of the target chip and determines a difference value between the temperature value of the target chip and the temperature value of the RTC chip detected by the temperature measurement module;
the display module displays the difference value.
In one embodiment of the present invention, the method further comprises:
and after receiving the second correction instruction, the controller performs RTC self-correction on the RTC chip based on the standard second pulse.
In one embodiment of the present invention, the method further comprises:
after the controller receives the first correction instruction, the controller corrects the temperature value of the RTC chip detected by the temperature measurement module based on the standard temperature value.
In an embodiment of the present invention, after receiving the second correction instruction, the controller performs RTC self-correction on the RTC chip based on the standard second pulse, including:
the controller acquires the second pulse capture value of the standard second pulse and the second pulse capture value of the RTC chip after receiving the second correction instruction, and passes
Figure BDA0002518602230000101
Using the calculated delta c as a correction parameter to enable the RTC chip to be based on aT 2 Determining the vibration frequency corresponding to the pulse per second by + bT + c + delta c;
wherein f is 1 Second pulse capture value, f, representing the RTC chip 2 The second pulse capture value of the standard second pulse is represented, a, b and c are fixed parameters of the RTC chip, T is an environmental temperature value, y 1 =aT 2 + bT + c, which represents the frequency response curve adopted by the RTC chip before RTC self-calibration, y 2 =aT 2 + bT + c + Δ c represents the frequency response curve adopted by the RTC chip after RTC self-correction.
It is further noted that, herein, relational terms such as first and second, and the like may be used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Also, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrases "comprising a," "8230," "8230," or "comprising" does not exclude the presence of additional like elements in a process, method, article, or apparatus that comprises the element.
Those of skill would further appreciate that the various illustrative elements and algorithm steps described in connection with the embodiments disclosed herein may be implemented as electronic hardware, computer software, or combinations of both, and that the various illustrative components and steps have been described above generally in terms of their functionality in order to clearly illustrate this interchangeability of hardware and software. Whether such functionality is implemented as hardware or software depends upon the particular application and design constraints imposed on the implementation. Skilled artisans may implement the described functionality in varying ways for each particular application, but such implementation decisions should not be interpreted as causing a departure from the scope of the present invention.
The principle and the implementation of the present invention are explained in the present application by using specific examples, and the above description of the embodiments is only used to help understanding the technical solution and the core idea of the present invention. It should be noted that, for those skilled in the art, it is possible to make various improvements and modifications to the present invention without departing from the principle of the present invention, and those improvements and modifications also fall within the scope of the claims of the present invention.

Claims (7)

1. An electric energy meter pulse-per-second error tester, comprising:
an RTC chip;
the voltage reduction module is used for reducing the voltage of the received direct current input and then supplying power to the controller, the display module and the RTC chip;
the controller is used for determining a pulse per second period error value aiming at the target chip according to the acquired pulse per second capture value of the RTC chip and the acquired pulse per second capture value of the target chip;
the display module is used for displaying the pulse per second period error value;
the controller is further configured to:
after receiving a second correction instruction, performing RTC self-correction on the RTC chip based on a standard second pulse;
the controller is specifically configured to:
after receiving the second correction instruction, acquiring the second pulse capture value of the standard second pulse and the second pulse capture value of the RTC chip, and passing
Figure FDA0003829874760000011
Using the calculated delta c as a correction parameter to enable the RTC chip to be based on aT 2 Determining the vibration frequency corresponding to the pulse per second by + bT + c + delta c;
wherein, f 1 Representing the pulse-per-second capture value, f, of the RTC chip 2 The second pulse capture value of the standard second pulse is represented, a, b and c are fixed parameters of the RTC chip, T is an environmental temperature value, y 1 =aT 2 + bT + c, which represents the frequency response curve adopted by the RTC chip before RTC self-correction, y 2 =aT 2 + bT + c + Δ c represents the frequency response curve adopted by the RTC chip after RTC self-correction.
2. The electric energy meter pulse per second error tester of claim 1, wherein the voltage reduction module is specifically configured to:
and after the received direct current input is subjected to voltage reduction through the USB interface, the controller, the display module and the RTC chip are powered.
3. The electric energy meter pulse per second error tester according to claim 1, further comprising a temperature measurement module for detecting a temperature value of the RTC chip and sending the temperature value to the controller;
the controller is further configured to: acquiring a temperature value of the target chip, and determining a difference value between the temperature value of the target chip and the temperature value of the RTC chip detected by the temperature measurement module;
the display module is further configured to display the difference value.
4. The electric energy meter pulse-per-second error tester of claim 3, wherein the controller is further configured to:
after receiving the first correction instruction, based on the standard temperature value, the temperature value of the RTC chip detected by the temperature measurement module is self-corrected.
5. A method for testing the pulse per second error of an electric energy meter is characterized by comprising the following steps:
the voltage reduction module is used for reducing the voltage of the received direct current input and then supplying power to the controller, the display module and the RTC chip;
the controller determines a pulse per second period error value aiming at the target chip through the acquired pulse per second capture value of the RTC chip and the pulse per second capture value of the target chip;
the display module displays the pulse per second period error value;
further comprising:
after the controller receives a second correction instruction, RTC self-correction is carried out on the RTC chip on the basis of standard second pulse;
after receiving the second correction instruction, the controller performs RTC self-correction on the RTC chip based on the standard second pulse, specifically:
the controller acquires the second pulse capture value of the standard second pulse and the second pulse capture value of the RTC chip after receiving the second correction instruction, and passes
Figure FDA0003829874760000021
Using the calculated delta c as a correction parameter to enable the RTC chip to be based on aT 2 Determining the vibration frequency corresponding to the pulse per second by + bT + c + delta c;
wherein f is 1 Second pulse capture value, f, representing the RTC chip 2 Representing the capture value of the standard pulse per second, a, b and c are all fixed parameters of the RTC chip, T is the environmental temperature value, y 1 =aT 2 + bT + c, which represents the frequency response curve adopted by the RTC chip before RTC self-correction, y 2 =aT 2 + bT + c + Δ c represents the frequency response curve adopted by the RTC chip after RTC self-correction.
6. The method for testing the pulse-per-second error of the electric energy meter according to claim 5, wherein the step-down module steps down the received direct current input and then supplies power to the controller, the display module and the RTC chip, and the method comprises the following steps:
the voltage reduction module reduces the voltage of the received direct current input through the USB interface and supplies power to the controller, the display module and the RTC chip.
7. The electric energy meter pulse-per-second error testing method according to claim 5, further comprising:
the temperature measuring module detects the temperature value of the RTC chip and sends the temperature value to the controller;
the controller acquires the temperature value of the target chip and determines the difference value between the temperature value of the target chip and the temperature value of the RTC chip detected by the temperature measurement module;
the display module displays the difference value.
CN202010484418.XA 2020-06-01 2020-06-01 Electric energy meter pulse per second error tester and electric energy meter pulse per second error testing method Active CN111562543B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202010484418.XA CN111562543B (en) 2020-06-01 2020-06-01 Electric energy meter pulse per second error tester and electric energy meter pulse per second error testing method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202010484418.XA CN111562543B (en) 2020-06-01 2020-06-01 Electric energy meter pulse per second error tester and electric energy meter pulse per second error testing method

Publications (2)

Publication Number Publication Date
CN111562543A CN111562543A (en) 2020-08-21
CN111562543B true CN111562543B (en) 2022-10-18

Family

ID=72073732

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202010484418.XA Active CN111562543B (en) 2020-06-01 2020-06-01 Electric energy meter pulse per second error tester and electric energy meter pulse per second error testing method

Country Status (1)

Country Link
CN (1) CN111562543B (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113138362A (en) * 2021-05-11 2021-07-20 深圳市先行电气技术有限公司 Calibration method for automatically compensating electric energy metering error of electric energy meter

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8754630B2 (en) * 2009-05-08 2014-06-17 Lanids+Gyr, Inc. Apparatus and method for measuring real time clock accuracy in an electric meter
CN103529376A (en) * 2012-07-03 2014-01-22 鸿富锦精密工业(深圳)有限公司 Clock test circuit
CN103424731A (en) * 2013-01-10 2013-12-04 万高(杭州)科技有限公司 Electric energy meter real-time clock correction device and correction method
CN104101857B (en) * 2014-07-01 2017-10-27 杭州电子科技大学 Based on FlexRay bus electric energy Watch Error detecting systems and method
CN105573106B (en) * 2014-10-08 2018-10-09 无锡华润矽科微电子有限公司 To the amendment circuit and its method of RTC accuracy of timekeeping in a kind of intelligent electric meter
CN106199484A (en) * 2016-06-23 2016-12-07 潍坊五洲浩特电气有限公司 Mainboard error of time of day automatic debugging system
CN106505996B (en) * 2016-10-12 2019-02-12 河海大学 A kind of RTC chip high-precision frequency bias compensation method of combination variable capacitance
CN110837073A (en) * 2019-10-21 2020-02-25 浙江恒业电子有限公司 Intelligent ammeter clock error adjustment test system and method

Also Published As

Publication number Publication date
CN111562543A (en) 2020-08-21

Similar Documents

Publication Publication Date Title
US7200507B2 (en) Method and device for clock calibration
TWI416150B (en) Electronic device with battery capacity detecting function and battery capacity detecting method thereof
JP2007240524A (en) Remaining battery charge detection circuit
US20120265461A1 (en) Electronic device and system time setting method thereof
JP2011215130A (en) Altimeter
WO2018064865A1 (en) Method and device for acquiring battery power level and electronic device
CN111562543B (en) Electric energy meter pulse per second error tester and electric energy meter pulse per second error testing method
WO2019140956A1 (en) Electricity quantity metering accuracy detection method, device and computer storage medium
JP2019195252A (en) Battery charging system and battery charging method
EP3748319A1 (en) Aging calibration for temperature sensor
CN116559528A (en) Chip frequency measuring method, circuit, device, storage medium and computer equipment
KR20200095069A (en) Portable error corection apparatuse for Internet of Things meter
TWI636271B (en) Apparatus and method for measuring capacity of cell module
CN101995816B (en) Automatic clock calibration method and automatic clock calibration device
CN202720032U (en) Measurement and control system of electromagnetic force balanced type electronic balance
CN114281122B (en) Improved generation low temperature self-heating device suitable for intelligent terminal
CN110780121A (en) Motor winding resistance measuring device and motor winding resistance measuring instrument
JP6793513B2 (en) Electronic devices and control methods for electronic devices
CN1234119A (en) Method and apparatus for oscillator compensation in electrical eneryg meter
JP2010133911A (en) System for measuring change in physical quantity and method for specifying standard time-based data
CN208334596U (en) Battery monitoring device and battery modules
CN210015215U (en) Testing device for dynamic electrochemical impedance spectrum of battery
CN111638750A (en) Writer and RTC correcting method
CN209963976U (en) Frequency calibration system and device for drive voltage waveform of linear resonant device
CN106468743A (en) Pulse constant current diode forward pressure fall-off test instrument

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant