CN1165293A - 用于食品工业的x射线无损检测装置 - Google Patents

用于食品工业的x射线无损检测装置 Download PDF

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CN1165293A
CN1165293A CN97103124A CN97103124A CN1165293A CN 1165293 A CN1165293 A CN 1165293A CN 97103124 A CN97103124 A CN 97103124A CN 97103124 A CN97103124 A CN 97103124A CN 1165293 A CN1165293 A CN 1165293A
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CN1168975C (zh
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里纳尔多·奥克李波
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DYLOG ITALIA Spa
Dylog Italia SpA
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/02Food
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/083Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/10Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the material being confined in a container, e.g. in a luggage X-ray scanners

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Abstract

用于食品工业玻璃容器和/或罐盒检测装置,由一静止结构组成,该结构包括两个互成90°的并与容器输送线成45°的模件;一个模件装有一半景发射器和一传感器,另一个仅装有与第一个模件装的传感器相同的一个传感器,用这种带有一个发射器和两个传感器的检测结构,可以实现100%的检测。

Description

用于食品工业的X射线无损检测装置
本发明涉及食品工业用的X射线无损检测装置,特别是用于玻璃容器和/或金属罐的检测。
已知在大多数情况下,食品业玻璃容器的X射线无损检测是由位于被检测的所述容器行列一侧的单个装置进行的;所述装置大体装有一发射器和一传感器,在它们之间被检测的所述容器行列运动经过。
还了解到,用这种单个装置,在整个装在其内的制品中有90-95%得到检测,而所述的不足是由于程度不同地在容器底中存在的凹处投射的静区(盲区)所致。
更确定地说,这涉及装果酱或类似制品的玻璃容器;造成障碍的凹处是在这些容器的底上;它的投影遮盖了污染物,将它们隐蔽起来,不可能辨认出来。
在很多情况下,检测结果被错误地认为是充分的,但因为仅是95%有效的检测产生大量问题,故曾通过一些方案试图来解决它,但是这些方案均显得相当复杂、花费大并且不是十分令人满意。
在以上的方案中,可以一提的是在竖直发射器管平面上的45°倾斜的方案,这一方案与布置在一侧面上的传统检测装置相比,仅是在另外一点上产生另一静区;虽然将此阴影减轻了,但解决不了常常由于高的容器公差而出现的问题。而且,它不能用于金属罐。
另一个在英国研究的方案是在竖直平面上设置两个互成90°的检测装置。
这后一方案从静区部分缩小来说是有利的,但它用两个检测装置,而且整个系统相当庞大,两套装置的耗资、维修等是不可忽视的重要成本因素。
本发明的目的是解决上述问题,消除检测封装容器时的静区,提供一种能够易于获得封装容器的完整检测的、改进的、简单的并实用的装置。
本发明的检测装置由一静止结构组成,该结构包括两个互成90°并与被检测的容器输送线成45°设置的模件(标准化组件);所述两个模件中的第一个装有一半景发射器和一X射线线性传感器,所述两个模件中的第二个仅装有一与第一模件装的传感器相同的传感器;带有单独一个发射器和两个传感器的所述检测结构构成一个能够100%地检测所述容器中装的制品的结构。
本发明装置优点如下:
-模件性:因此,具有相同性能的起价(对单一模件来说)比标准价低得多,故有广泛市场;
-两个传感器同时出故障在机率上是不可能的,在两个传感器中一个失效时,使用者可以继续工作(检测95%的制品);
-实际上没有关系到耗资的安装问题;
-没有机械备件的消耗,结构实质上是静止的,具有明显的维修优点;
-没有占用空间的问题,因此符合食品工业的需要,食品工业的作业线总是很满的,没有空间安装在设计时没有考虑的设备。
参考附图通过对本发明一个实施例的以下详细介绍,将使本发明的其他特点和优点显现出来,而这些附图和实施例是作为一非限定性例子提供的。附图如下:
图1是现有技术检测装置示意俯视图,该装置相对于被检测容器输送线成90°;
图2是现有技术检测装置示意俯视图,该装置与被检测容器输送线成45°;
图3是图1装置的示意截面图;
图4是根据本发明第一实施例检测装置的示意俯视图(平面图);
图5是根据本发明第二实施例检测装置的示意俯视图;
图6是带有典型底部凹陷的一玻璃容器的截面图。
从图1和3可以看到,现有技术的检测装置是由一跨越一列在下运动的被检玻璃容器3的结构1组成。
该结构包括一X射线发射器5和一传感器7,该传感器7收集发射器5发射的射线并显示被检测到的情况。
如果考虑一个玻璃容器,会清楚地了解在所述容器3底上的凹陷9是如何妨碍容器中制品的完整检测的;如果这个凹陷或内部凸起9略去了,很明显就不会有问题。
代之以用图4所示的本发明检测装置,它装有一静止结构11,该结构由两个互成90°的模件13组成,并且这两个模件13与被检测的容器3的输送线成45°角。
这两个模件13中之一装有一半景发射器15和一通常的传感器7,而另一个模件仅装有一个和第一模件中装的传感器一样的传感器7。
在图5所示的检测装置实施例中,两个模件13每一个均装有一标准的发射器5和一传感器7。
很明显,用这个方法,因为被一个传感器,未检测到的区域会被与第一传感器成90°的另一传感器检测,被检测容器的凹陷9产生的静区被消除。
很明显,在这两个传感器7中之一失效时,如果使用者认为仅用它们中一个,象现有技术那样总是获得95%的检测是足够的话,可继续工作。
虽已就优选的实施例介绍了本发明,但可以进行许多修改和重新安排,而其结果仍在本发明范围之内。

Claims (3)

1.用于食品工业中玻璃容器和/或罐检测的X射线无损检测装置,所述装置由一静止结构组成,该结构包括两个互成90°的并与被检测容器输送线成45°的模件;所述两模件中的第一个装有一半景发射器和一传感器,所述两模件中的第二个仅装有一个与所述第一模件的传感器相同的传感器;所述带有一单个发射器和两个传感器的静止结构构成一个能够检测装在所述容器中的100%的制品的结构。
2.根据权利要求1所述的检测装置,其特征是,所述两个模件中每一个装有一发射器和一传感器,
3.根据权利要求1或2所述的检测装置,其特征是,使用与被检测的容器输送线成90°(或45°)的所述模件中单独的一个,用所述发射器和仅一个传感器,该装置可被用作进行95%检测的通常的单体结构。
CNB97103124XA 1996-03-15 1997-03-13 用于食品工业的x射线无损检测装置 Expired - Fee Related CN1168975C (zh)

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IT000203A/1996 1996-03-15
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IT96TO000203A IT1285008B1 (it) 1996-03-15 1996-03-15 Macchina di ispezione non distruttiva a raggi x per l'industria alimentare

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN100557429C (zh) * 2002-11-12 2009-11-04 霍伊夫特系统技术有限公司 利用x射线检验填充容器的装置以及该装置的应用
CN104458778A (zh) * 2014-12-19 2015-03-25 山东明佳包装检测科技有限公司 用于密闭容器中食品的检测设备

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IT1320201B1 (it) * 2000-06-09 2003-11-26 Dylog Italia Spa Dispositivo di ispezione a raggi x per prodotti alimentari.
DE10062214B4 (de) 2000-12-13 2013-01-24 Smiths Heimann Gmbh Vorrichtungen zur Durchleuchtung von Objekten
US7807252B2 (en) * 2005-06-16 2010-10-05 Rohm And Haas Electronic Materials Cmp Holdings, Inc. Chemical mechanical polishing pad having secondary polishing medium capacity control grooves
JP5306682B2 (ja) * 2008-03-26 2013-10-02 パナソニック株式会社 X線異物検査装置
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CN102348970B (zh) * 2009-03-13 2014-05-07 Pony工业株式会社 X射线检查装置和x射线检查方法
CN101655466B (zh) * 2009-09-22 2011-10-26 江苏联众肠衣有限公司 一种异物在线检测仪
JP6028094B2 (ja) * 2012-06-13 2016-11-16 ヴィルコ・アーゲー 容器および/または容器の内容物の欠陥のx線検出
DE102012019851B4 (de) 2012-10-10 2018-03-22 Seidenader Maschinenbau Gmbh Inspektionssystem zum Erstellen von wenigstens zwei Aufnahmen eines Guts
CN107328798B (zh) * 2017-06-21 2020-02-11 重庆大学 一种新型icl系统及实现方法
JP2020020593A (ja) * 2018-07-30 2020-02-06 高嶋技研株式会社 放射線検査装置及び放射線検査方法

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US4392237A (en) * 1980-08-25 1983-07-05 General Electric Company Scanning x-ray inspection system
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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN100557429C (zh) * 2002-11-12 2009-11-04 霍伊夫特系统技术有限公司 利用x射线检验填充容器的装置以及该装置的应用
CN104458778A (zh) * 2014-12-19 2015-03-25 山东明佳包装检测科技有限公司 用于密闭容器中食品的检测设备

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EP1450154B1 (en) 2009-10-21
EP1450154A3 (en) 2005-05-11
ITTO960203A1 (it) 1997-09-15
EP0795746A1 (en) 1997-09-17
EP0795746B1 (en) 2004-06-16
DE69739631D1 (de) 2009-12-03
DE69729497T2 (de) 2005-06-23
JPH1010062A (ja) 1998-01-16
JP3041249B2 (ja) 2000-05-15
CN1295498C (zh) 2007-01-17
EP1450154A2 (en) 2004-08-25
CN1566932A (zh) 2005-01-19
ITTO960203A0 (zh) 1996-03-15
DE69729497D1 (de) 2004-07-22
CN1168975C (zh) 2004-09-29
IT1285008B1 (it) 1998-06-03
DE04101218T1 (de) 2005-02-10

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