CN116097106A - 芯片及时钟检测方法 - Google Patents

芯片及时钟检测方法 Download PDF

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Publication number
CN116097106A
CN116097106A CN202080104997.9A CN202080104997A CN116097106A CN 116097106 A CN116097106 A CN 116097106A CN 202080104997 A CN202080104997 A CN 202080104997A CN 116097106 A CN116097106 A CN 116097106A
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China
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circuit
delay
output
signal
clock signal
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CN116097106A8 (zh
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商新超
童海涛
黄涛
余芳
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Huawei Technologies Co Ltd
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Huawei Technologies Co Ltd
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Publication of CN116097106A publication Critical patent/CN116097106A/zh
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Manipulation Of Pulses (AREA)
  • Pulse Circuits (AREA)

Abstract

一种芯片及时钟检测方法，涉及计算机技术领域。在芯片上配置参考时钟产生电路、毛刺检测电路和占空比检测电路中的至少一项。以便于后续基于参考时钟产生电路对芯片上的时钟信号的频率进行检测，从而避免了在对芯片上的时钟信号检测时需要额外通过模拟电路引出一个标准参考时钟，因此节省了芯片资源。此外，通过该芯片，还可以实现对同一芯片上的时钟信号包含的毛刺以及时钟信号的占空比的检测，提高了检测时钟信号的灵活性。

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PCT国内申请，说明书已公开。

Claims (25)

  1. PCT国内申请，权利要求书已公开。
CN202080104997.9A 2020-11-30 2020-11-30 芯片及时钟检测方法 Pending CN116097106A (zh)

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PCT/CN2020/132967 WO2022110235A1 (zh) 2020-11-30 2020-11-30 芯片及时钟检测方法

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CN116097106A true CN116097106A (zh) 2023-05-09
CN116097106A8 CN116097106A8 (zh) 2024-05-28

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CN115334264B (zh) * 2022-08-17 2024-04-09 中国电子科技集团公司第四十四研究所 Cmos图像传感器片上时钟产生电路、模块及方法

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US20050127965A1 (en) * 2003-12-12 2005-06-16 Micron Technology, Inc. Generating multi-phase clock signals using hierarchical delays
CN103257569A (zh) * 2013-05-23 2013-08-21 龙芯中科技术有限公司 时间测量电路、方法和系统
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WO2022110235A1 (zh) 2022-06-02
CN116097106A8 (zh) 2024-05-28

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PB01 Publication
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SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
CI02 Correction of invention patent application

Correction item: PCT international application to national stage day

Correct: 2023.03.10

False: 2023.03.09

Number: 19-01

Page: The title page

Volume: 39

Correction item: PCT international application to national stage day

Correct: 2023.03.10

False: 2023.03.09

Number: 19-01

Volume: 39

CI02 Correction of invention patent application