CN115777071A - 电弧检测装置、电弧检测系统、电弧检测方法、以及程序 - Google Patents

电弧检测装置、电弧检测系统、电弧检测方法、以及程序 Download PDF

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Publication number
CN115777071A
CN115777071A CN202180046613.7A CN202180046613A CN115777071A CN 115777071 A CN115777071 A CN 115777071A CN 202180046613 A CN202180046613 A CN 202180046613A CN 115777071 A CN115777071 A CN 115777071A
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CN
China
Prior art keywords
arc detection
measurement result
arc
detection device
voltage
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Pending
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CN202180046613.7A
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English (en)
Chinese (zh)
Inventor
木寺和宪
古贺达雄
大堀贵大
金森圭太
大岛和哉
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Panasonic Intellectual Property Management Co Ltd
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Panasonic Intellectual Property Management Co Ltd
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Publication date
Application filed by Panasonic Intellectual Property Management Co Ltd filed Critical Panasonic Intellectual Property Management Co Ltd
Publication of CN115777071A publication Critical patent/CN115777071A/zh
Pending legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/08—Locating faults in cables, transmission lines, or networks
    • G01R31/081—Locating faults in cables, transmission lines, or networks according to type of conductors
    • G01R31/086—Locating faults in cables, transmission lines, or networks according to type of conductors in power transmission or distribution networks, i.e. with interconnected conductors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/001—Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing
    • G01R31/002—Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing where the device under test is an electronic circuit
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/12—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing
    • G01R31/1227—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials
    • G01R31/1263—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials of solid or fluid materials, e.g. insulation films, bulk material; of semiconductors or LV electronic components or parts; of cable, line or wire insulation
    • G01R31/1272—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials of solid or fluid materials, e.g. insulation films, bulk material; of semiconductors or LV electronic components or parts; of cable, line or wire insulation of cable, line or wire insulation, e.g. using partial discharge measurements

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Testing Relating To Insulation (AREA)
CN202180046613.7A 2020-08-26 2021-07-20 电弧检测装置、电弧检测系统、电弧检测方法、以及程序 Pending CN115777071A (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2020-142668 2020-08-26
JP2020142668 2020-08-26
PCT/JP2021/027127 WO2022044626A1 (ja) 2020-08-26 2021-07-20 アーク検出装置、アーク検出システム、アーク検出方法、及びプログラム

Publications (1)

Publication Number Publication Date
CN115777071A true CN115777071A (zh) 2023-03-10

Family

ID=80355088

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202180046613.7A Pending CN115777071A (zh) 2020-08-26 2021-07-20 电弧检测装置、电弧检测系统、电弧检测方法、以及程序

Country Status (5)

Country Link
US (1) US12235306B2 (https=)
EP (1) EP4206714B1 (https=)
JP (1) JP7417963B2 (https=)
CN (1) CN115777071A (https=)
WO (1) WO2022044626A1 (https=)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US12003237B2 (en) * 2022-01-28 2024-06-04 Texas Instruments Incorporated Methods and apparatus for arc reduction in power delivery systems
US12535538B2 (en) 2023-08-11 2026-01-27 Siemens Industry, Inc. Active detection of an arc fault
FR3159016A1 (fr) * 2024-02-07 2025-08-08 Stellantis Auto Sas Procédé de détection d’un défaut d’arc électrique pour un système de batterie

Citations (7)

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US20090284265A1 (en) * 2008-05-13 2009-11-19 Sinfonia Technology Co., Ltd. Arc detecting device and aircraft equipped therewith
JP2014134445A (ja) * 2013-01-10 2014-07-24 Mitsubishi Electric Corp アーク検出装置
US20140210485A1 (en) * 2011-10-14 2014-07-31 Sma Solar Technology Ag Method and apparatus for detecting an arc in a dc circuit
US20150381111A1 (en) * 2014-06-26 2015-12-31 Solantro Semiconductor Corp. Arc fault detection and extinguishing
US20200014189A1 (en) * 2017-02-14 2020-01-09 Panasonic Intellectual Property Management Co., Ltd. Arc detection circuit, switch system, power conditioner system and arc detection method
WO2020144734A1 (ja) * 2019-01-08 2020-07-16 三菱電機株式会社 アーク地絡検出装置
CN116458029A (zh) * 2020-10-29 2023-07-18 松下知识产权经营株式会社 电弧检测系统、电弧检测方法、以及程序

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WO1993003530A1 (de) * 1991-08-01 1993-02-18 Siemens Aktiengesellschaft Verfahren und anordnung zur fehlerefkennung in stromrichteranlagen
US6777953B2 (en) * 2001-01-24 2004-08-17 General Dynamics (Otc) Aerospace, Inc. Parallel arc fault diagnostic for aircraft wiring
US7345860B2 (en) * 2001-10-17 2008-03-18 Square D Company Load recognition and series arc detection using load current/line voltage normalization algorithms
WO2006086310A2 (en) * 2005-02-07 2006-08-17 Dehaven Jeffrey L Arc fault and ground fault circuit interrupter tester apparatus and method
US8264237B2 (en) 2008-02-14 2012-09-11 Mks Instruments, Inc. Application of wideband sampling for arc detection with a probabilistic model for quantitatively measuring arc events
US8289029B2 (en) * 2008-02-14 2012-10-16 Mks Instruments, Inc. Application of wideband sampling for arc detection with a probabilistic model for quantitatively measuring arc events
JP5419579B2 (ja) 2009-05-28 2014-02-19 京セラ株式会社 アーク検出手段とそれを用いた制御手段及び連絡手段
EP2457313B1 (en) 2009-07-23 2014-03-05 Enphase Energy, Inc. Method and apparatus for detection and control of dc arc faults
CN103548226B (zh) 2011-02-28 2015-12-02 Sma太阳能技术股份公司 用于检测电路中电弧故障的方法和系统
JP2013251981A (ja) 2012-05-31 2013-12-12 Mitsubishi Electric Corp パワーコンディショナ
JP6000193B2 (ja) 2013-06-14 2016-09-28 三菱電機株式会社 Ｄｃアーク検知装置
EP3041104B1 (en) 2013-08-26 2021-06-02 Mitsubishi Electric Corporation Dc power generation system and protection method for dc power generation system
JP2016063581A (ja) * 2014-09-16 2016-04-25 株式会社東芝 電力変換装置
EP3214453A1 (en) * 2016-03-03 2017-09-06 ABB Schweiz AG Method and apparatus for arc fault detection in electrical systems
DE102016208322B4 (de) * 2016-05-13 2020-11-26 Bender Gmbh & Co. Kg Verfahren und Vorrichtung zur Fehlerlichtbogen-Erkennung in einem ungeerdeten Stromversorgungssystem
JP2018028498A (ja) 2016-08-19 2018-02-22 富士電機機器制御株式会社 アーク故障検出システム
US11022638B2 (en) * 2018-04-04 2021-06-01 Fluke Corporation Testing shield continuity of a cable or cabling installation using common mode insertion loss
JP7130542B2 (ja) * 2018-12-12 2022-09-05 株式会社日立製作所 部分放電検出装置及び部分放電検出方法
CA3226332A1 (en) * 2023-01-23 2025-04-08 Electrical Grid Monitoring Ltd. METHOD AND SYSTEM FOR THE DYNAMIC CALCULATION OF SHORT CIRCUITS

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20090284265A1 (en) * 2008-05-13 2009-11-19 Sinfonia Technology Co., Ltd. Arc detecting device and aircraft equipped therewith
US20140210485A1 (en) * 2011-10-14 2014-07-31 Sma Solar Technology Ag Method and apparatus for detecting an arc in a dc circuit
JP2014134445A (ja) * 2013-01-10 2014-07-24 Mitsubishi Electric Corp アーク検出装置
US20150381111A1 (en) * 2014-06-26 2015-12-31 Solantro Semiconductor Corp. Arc fault detection and extinguishing
US20200014189A1 (en) * 2017-02-14 2020-01-09 Panasonic Intellectual Property Management Co., Ltd. Arc detection circuit, switch system, power conditioner system and arc detection method
WO2020144734A1 (ja) * 2019-01-08 2020-07-16 三菱電機株式会社 アーク地絡検出装置
CN116458029A (zh) * 2020-10-29 2023-07-18 松下知识产权经营株式会社 电弧检测系统、电弧检测方法、以及程序

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Publication number Publication date
EP4206714B1 (en) 2026-04-08
US12235306B2 (en) 2025-02-25
JP7417963B2 (ja) 2024-01-19
WO2022044626A1 (ja) 2022-03-03
JPWO2022044626A1 (https=) 2022-03-03
EP4206714A4 (en) 2024-03-13
EP4206714A1 (en) 2023-07-05
US20230305047A1 (en) 2023-09-28

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