JP2021052122A5 - - Google Patents

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Publication number
JP2021052122A5
JP2021052122A5 JP2019175001A JP2019175001A JP2021052122A5 JP 2021052122 A5 JP2021052122 A5 JP 2021052122A5 JP 2019175001 A JP2019175001 A JP 2019175001A JP 2019175001 A JP2019175001 A JP 2019175001A JP 2021052122 A5 JP2021052122 A5 JP 2021052122A5
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JP
Japan
Prior art keywords
circuit
abnormality
internal step
down power
voltage
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JP2019175001A
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English (en)
Japanese (ja)
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JP2021052122A (ja
JP7312073B2 (ja
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Priority to JP2019175001A priority Critical patent/JP7312073B2/ja
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Publication of JP2021052122A publication Critical patent/JP2021052122A/ja
Publication of JP2021052122A5 publication Critical patent/JP2021052122A5/ja
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JP2019175001A 2019-09-26 2019-09-26 半導体集積回路装置 Active JP7312073B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2019175001A JP7312073B2 (ja) 2019-09-26 2019-09-26 半導体集積回路装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2019175001A JP7312073B2 (ja) 2019-09-26 2019-09-26 半導体集積回路装置

Publications (3)

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JP2021052122A JP2021052122A (ja) 2021-04-01
JP2021052122A5 true JP2021052122A5 (https=) 2022-02-22
JP7312073B2 JP7312073B2 (ja) 2023-07-20

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JP2019175001A Active JP7312073B2 (ja) 2019-09-26 2019-09-26 半導体集積回路装置

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JP (1) JP7312073B2 (https=)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2023240503A1 (zh) * 2022-06-15 2023-12-21 北京小米移动软件有限公司 显示驱动模块、显示设备、异常处理方法、装置及介质
CN120283168A (zh) 2022-12-06 2025-07-08 爱德万测试株式会社 引脚电子装置、测试装置及方法
CN120265997A (zh) * 2022-12-06 2025-07-04 爱德万测试株式会社 引脚电子装置、测试装置及方法

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2945508B2 (ja) * 1991-06-20 1999-09-06 三菱電機株式会社 半導体装置
JP4146930B2 (ja) * 1998-04-28 2008-09-10 株式会社 沖マイクロデザイン 半導体集積回路
JP2001035193A (ja) * 1999-07-16 2001-02-09 Mitsubishi Electric Corp 半導体記憶装置
JP3367519B2 (ja) * 1999-12-03 2003-01-14 日本電気株式会社 半導体記憶装置及びそのテスト方法
JP3863508B2 (ja) * 2003-07-03 2006-12-27 Ｎｅｃエレクトロニクス株式会社 電源電圧検出回路及び半導体集積回路装置

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