CN115754684A - Chip aging test board and key structure and test method thereof - Google Patents
Chip aging test board and key structure and test method thereof Download PDFInfo
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- CN115754684A CN115754684A CN202310018152.3A CN202310018152A CN115754684A CN 115754684 A CN115754684 A CN 115754684A CN 202310018152 A CN202310018152 A CN 202310018152A CN 115754684 A CN115754684 A CN 115754684A
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- 238000012360 testing method Methods 0.000 title claims abstract description 319
- 230000032683 aging Effects 0.000 title claims abstract description 51
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- GNFTZDOKVXKIBK-UHFFFAOYSA-N 3-(2-methoxyethoxy)benzohydrazide Chemical compound COCCOC1=CC=CC(C(=O)NN)=C1 GNFTZDOKVXKIBK-UHFFFAOYSA-N 0.000 claims description 4
- FGUUSXIOTUKUDN-IBGZPJMESA-N C1(=CC=CC=C1)N1C2=C(NC([C@H](C1)NC=1OC(=NN=1)C1=CC=CC=C1)=O)C=CC=C2 Chemical compound C1(=CC=CC=C1)N1C2=C(NC([C@H](C1)NC=1OC(=NN=1)C1=CC=CC=C1)=O)C=CC=C2 FGUUSXIOTUKUDN-IBGZPJMESA-N 0.000 claims description 4
- 230000000149 penetrating effect Effects 0.000 claims description 4
- 238000013459 approach Methods 0.000 claims description 3
- 238000005538 encapsulation Methods 0.000 claims description 2
- 238000000034 method Methods 0.000 claims description 2
- 238000004806 packaging method and process Methods 0.000 description 11
- 238000009434 installation Methods 0.000 description 10
- 238000010438 heat treatment Methods 0.000 description 6
- 238000001816 cooling Methods 0.000 description 2
- 238000013461 design Methods 0.000 description 2
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- 229910052738 indium Inorganic materials 0.000 description 2
- APFVFJFRJDLVQX-UHFFFAOYSA-N indium atom Chemical compound [In] APFVFJFRJDLVQX-UHFFFAOYSA-N 0.000 description 2
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Abstract
The invention discloses a chip aging test bench, a key structure and a test method thereof, and relates to the technical field of chip desktop-level high-temperature aging tests, wherein the test bench comprises: the test device comprises a round platform, a bearing ring, a test socket, a manipulator and a driver, wherein the bearing ring and the test ring are arranged on the upper surface of the round platform in a rotating mode, the manipulator is arranged between the bearing ring and the test ring, the test ring penetrates through the test socket arrangement which is suitable for the same or different packaged chips, the bearing ring is driven to rotate by the driver, the chips are selected, the test ring is placed after the manipulator picks, the same test ring is driven to rotate by the driver, the selected chips are sent into the test socket to carry out high-temperature aging test, after the test is completed, the driver drives the test ring to rotate, the test ring carries the chips after the detection is completed to rotate to the manipulator, the chips are placed into the bearing ring after the manipulator picks, and the desktop-level automatic test of the high-temperature aging of the chips is realized.
Description
Technical Field
The invention discloses a chip aging test board, a key structure and a test method thereof, and relates to the technical field of chip desktop-level high-temperature aging tests.
Background
The high-temperature aging test of the chip is to test the tolerance and the reliability of the chip in a state that the chip is heated to the working temperature or higher than the working temperature, thereby finding the fault of the chip at an early stage and having important significance for supervision of product quality, screening of high-quality chips and the like.
The existing aging test is mainly carried out by using an aging furnace, and the aging furnace can be used for carrying out centralized test on a plurality of large-batch chips and is suitable for industrial production. However, due to the disadvantages of high cost, large volume, complex assembly, high requirement for supporting facilities and the like, the method is not suitable for the use requirement in the experimental stage. More adopt the test socket of desktop level to carry out high temperature aging testing to the chip in laboratory environment, the test socket of desktop level has small, the intensification is fast, advantage such as with low costs, generally includes an upper cover that is used for controlled temperature and constitutes with the articulated base of being connected of upper cover, need manually place the chip when using, and manual lock upper cover and base test is carried out again after manually compressing tightly the chip.
In actual use, when a desktop-level test socket is adopted, a group of multiple chips packaged in the same type or multiple groups of chips packaged in different types need to be tested, multiple identical or different test sockets need to be configured, and the workload is huge, so that the existing test socket cannot meet the test requirement of the desktop-level chip in a laboratory environment.
Disclosure of Invention
Aiming at the technical defect that the existing test socket cannot meet the test requirement of a desktop chip in a laboratory environment, the invention provides a chip aging test bench, a key structure and a test method thereof, and the automatic test of the high-temperature aging of the desktop chip can be realized in the laboratory environment.
In order to achieve the purpose, the invention provides the following technical scheme:
chip burn-in test bench includes: the test device comprises a round platform, a bearing ring, a test socket, a manipulator and a driver, wherein the upper surface of the round platform is rotatably provided with the bearing ring and the test ring, the bearing ring is used for containing a chip, the test ring is used for sending the chip into the test socket to carry out high-temperature aging test or sending the chip after the test in the test socket is completed out, the test ring is coaxially arranged on the inner side of the bearing ring, the manipulator is arranged between the bearing ring and the test ring and used for moving the chip on the bearing ring to the test ring or moving the chip on the test ring to the bearing ring, the test ring penetrates through at least two test sockets which are adaptive to the same or different packaged chips, and the driver is used for driving the bearing ring and the test ring to rotate clockwise or anticlockwise independently or simultaneously.
Further, the test socket includes: base, upper cover, positive and negative tooth lead screw, lead screw motor, mount pad and guide bar, the base be used for bearing the chip, the upper cover be used for control chip's test temperature, just base and upper cover set up respectively at the both ends of positive and negative tooth lead screw, positive and negative tooth lead screw is connected with the lead screw motor, the mount pad on be provided with the guide bar, base and upper cover all slide and set up on the guide bar.
Further, the load ring and the test ring both include: the ring body, hold groove and breach, the ring body on be provided with the holding groove that a plurality of is used for placing the chip, the holding inslot side that holds on the carrier ring and the test ring holds the groove outside and all is provided with the breach.
Further, the robot comprises: casing, curved claw, connecting rod, fixed axle, steering wheel, support body and upset motor, the casing be a disc, the both sides of this disc all are provided with an open slot that runs through this disc, the inside of casing slides and is provided with two curved claws, the both ends of curved claw extend to the open slot of both sides respectively, the centre of casing is provided with the fixed axle, and the both ends of fixed axle are rotated and are connected on the support body, and the one end of fixed axle is connected with the fixed upset motor that sets up on the support body, the centre of curved claw and the one end fixed connection of connecting rod, the other end of connecting rod rotates to be connected inside the casing, the steering wheel setting inside the casing, the steering wheel is used for the drive the connecting rod swing.
Further, the driver includes: the device comprises a guide strip, a bracket, a driving wheel and a driving motor; the guide strip is fixedly connected with the support, the guide strip is arranged on the outer side of the bearing ring or the inner side of the testing ring in a sliding manner, and the guide strip and the support are used for supporting the bearing ring and the testing ring and enabling the bearing ring and the testing ring to rotate stably; the driving wheel is rotatably arranged on the support, the side face of the driving wheel penetrates through the guide strip and then is in contact with the bearing ring or the testing ring, and the driving wheel is connected with a driving motor fixedly arranged on the support and used for driving the bearing ring and the testing ring to rotate.
The test socket of the chip aging test bench comprises: base, upper cover, positive and negative tooth lead screw, lead screw motor, mount pad and guide bar, the base be used for bearing the chip, the upper cover be used for control chip's test temperature, just base and upper cover set up respectively at the both ends of positive and negative tooth lead screw, positive and negative tooth lead screw is connected with the lead screw motor, the mount pad on be provided with the guide bar, base and upper cover all slide and set up on the guide bar.
Manipulator of chip aging test platform includes: casing, curved claw, connecting rod, fixed axle, steering wheel, support body and upset motor, the casing be a disc, the both sides of this disc all are provided with an open slot that runs through this disc, the inside of casing slides and is provided with two curved claws, the both ends of curved claw extend to the open slot of both sides respectively, the centre of casing is provided with the fixed axle, and the both ends of fixed axle are rotated and are connected on the support body, and the one end of fixed axle is connected with the fixed upset motor that sets up on the support body, the centre of curved claw and the one end fixed connection of connecting rod, the other end of connecting rod rotates to be connected inside the casing, the steering wheel setting inside the casing, the steering wheel is used for the drive the connecting rod swing.
A driver for a chip burn-in test station, comprising: the device comprises a guide strip, a bracket, a driving wheel and a driving motor; the guide strip is fixedly connected with the support, the guide strip is arranged on the outer side of the bearing ring or the inner side of the testing ring in a sliding manner, and the guide strip and the support are used for supporting the bearing ring and the testing ring and enabling the bearing ring and the testing ring to rotate stably; the driving wheel is rotatably arranged on the support, the side face of the driving wheel penetrates through the guide strip and then is in contact with the bearing ring or the testing ring, and the driving wheel is connected with a driving motor fixedly arranged on the support and used for driving the bearing ring and the testing ring to rotate.
The test method of the chip aging test bench comprises the following steps:
step a, chip placement: placing a plurality of chips on a bearing ring, and placing a plurality of chips to be detected through a plurality of containing grooves formed in the bearing ring;
step b, chip selection: the bearing ring is driven to rotate by the driver until the corresponding chip to be detected on the bearing ring rotates to the manipulator;
step c, chip switching: clamping the chip to be detected by a manipulator, turning the manipulator after clamping is completed, and placing the chip to be detected on a test ring on the inner side of a bearing ring;
step d, chip feeding: the driver drives the test ring to rotate until the corresponding chip to be detected on the test ring rotates into the test socket;
step e, chip testing: the base and the upper cover of the test socket are driven to mutually approach through the rotation of the positive and negative screw rods of the test socket until a chip to be detected on the test ring is clamped, the chip is loaded through the base, the test temperature of the chip is controlled through the upper cover, and the chip is subjected to high-temperature aging test;
step f, sending out the chip: after the aging test is finished, the base and the upper cover of the test socket are far away from each other, and the test ring is driven to rotate through the driver until the chip on the test ring after the detection is finished rotates to the manipulator;
step g, transferring out the chip: the chip is to be detected through manipulator clamping, and after the clamping is completed, the manipulator overturns, and the chip after the detection is completed is placed on the bearing ring outside the test ring.
Further, the test platform is applied to a chip aging test platform, and the test platform comprises: round platform, load ring, test socket, manipulator and driver.
Compared with the prior art, the invention provides the chip aging test board, the test socket thereof, the manipulator and the test method, and has the following beneficial effects:
1. the chip aging test bench of the invention comprises: the test device comprises a round table, a bearing ring, a test socket, a manipulator and a driver, wherein the bearing ring and the test ring are arranged on the upper surface of the round table in a rotating mode, the manipulator is arranged between the bearing ring and the test ring, the test ring penetrates through the test socket arrangement which is suitable for the same or different packaged chips, the driver is used for driving the bearing ring and the test ring to rotate clockwise or anticlockwise independently or simultaneously, and therefore the structure can be achieved.
2. According to the chip aging test bench, the test ring 3 penetrates through the at least two test sockets 4 which are suitable for the same or different packaged chips, so that the structure can be realized, after a plurality of test sockets with the same packaging type are configured, the chips with the same packaging type can be tested at the same time, after a plurality of test sockets with different packaging types are configured, the chips are selected through the manipulator and the chips with different packaging types are placed on the test ring in sequence according to the sequence of the test sockets, and then the chips with different packaging types can be tested at the same time, and the batch test requirements of the chips with the same or different packaging types are met.
3. The invention relates to a test socket of a chip aging test bench, which comprises: base, upper cover, positive and negative tooth lead screw, lead screw motor, mount pad and guide bar, base and upper cover set up the both ends at positive and negative tooth lead screw respectively, positive and negative tooth lead screw is connected with the lead screw motor, the mount pad on be provided with the guide bar, base and upper cover all slide and set up on the guide bar, structure from this can realize, through with base and upper cover split, connect through positive and negative tooth lead screw, can rotate through the positive and negative tooth lead screw of lead screw motor control, make base and upper cover be close to each other and carry out the centre gripping to the chip, or make base and upper cover keep away from each other and release the chip, do not need manual operation to press from both sides tightly the chip, simplified operating procedure, be applicable to automated inspection.
4. The invention relates to a manipulator of a chip aging test bench, which comprises: casing, curved claw, connecting rod, fixed axle, steering wheel, support body and upset motor, the casing be a disc, the inside of casing slides and is provided with two curved claws, the both ends of curved claw extend to the open slot of both sides respectively, the centre of curved claw and the one end fixed connection of connecting rod, the steering wheel is used for the drive the connecting rod swing, structure from this can realize, when the chip is got to needs clamp, when the rocking arm of steering wheel is to the swing of one side, can drive curved claw to the swing of one side through the connecting rod to the front end that makes curved claw stretches out from the open slot side, and then stretches out from the both sides of an open slot through two steering wheel control curved claws, realizes snatching.
5. The invention relates to a test method of a chip aging test bench, which comprises the following steps: step a, placing a chip; b, chip selection; c, chip switching; step d, sending the chip; step e, testing the chip; step f, sending out the chip; step g, transferring out the chip; the steps can be realized, the chips in the storeroom are selected and sent into the test socket, and after the test is finished, the chips are placed into the bearing ring after being grabbed by the manipulator, so that the automatic test of the high-temperature aging of the chips is realized.
Drawings
FIG. 1 is a schematic diagram of the overall structure of the testing table of the present invention;
FIG. 2 is a schematic side view of the test socket of FIG. 1;
FIG. 3 is a schematic perspective view of a test socket;
FIG. 4 is a schematic top view of a testing platform according to the present invention;
FIG. 5 is a schematic perspective view of the robot of FIG. 1;
FIG. 6 is a schematic view of the internal structure of the robot;
FIG. 7 is a schematic view of a robot gripping a chip;
FIG. 8 is a schematic perspective view of the actuator of FIG. 1;
fig. 9 is a schematic diagram of the internal structure of the driver.
Wherein: 1. a circular truncated cone; 2. a load ring; 3. a test ring; 4. a test socket; 5. a manipulator; 6. a driver; 4-1, a base; 4-2, an upper cover; 4-3, a positive and negative tooth screw rod; 4-4, a screw motor; 4-5, mounting seats; 4-6, a guide rod; 5-1, a shell; 5-2, bending the claw; 5-3, connecting rod; 5-4, fixing the shaft; 5-5, a steering engine; 5-6, a frame body; 5-7, turning over a motor; 6-1, guide strips, 6-2 and a bracket; 6-3, driving wheels; 6-4, driving a motor.
Detailed Description
The following description will be made in further detail with reference to the accompanying drawings.
Detailed description of the invention
The following is a specific embodiment of the chip burn-in test station.
Referring to fig. 1, the chip burn-in test board disclosed in this embodiment includes: round platform 1, carrier ring 2, test ring 3, test socket 4, manipulator 5 and driver 6, the upper surface of round platform 1 rotates and is provided with carrier ring 2 and test ring 3, carrier ring 2 be used for holding the chip, test ring 3 be used for sending the chip into test socket 4 and carry out high temperature aging test or send out the chip after the test completion in the test socket 4, and test ring 3 coaxial setting is in the inboard of carrier ring 2, manipulator 5 set up between carrier ring 2 and test ring 3 for move the chip on the carrier ring 2 to test ring 3, or move the chip on the test ring 3 to carrier ring 2, test ring 3 passes the test socket 4 setting of two at least adaptation the same or different encapsulation chips, driver 6 be used for driving carrier ring 2 and test ring 3 along clockwise or anticlockwise rotation alone or simultaneously.
In order to meet the requirement of the automatic high-temperature aging test of the chip, the round platform 1 is used as a base, the requirement of the desktop-level use is met, the bearing ring 2 is used as a storage warehouse for the chip to be detected and the chip after the detection is finished, the chip is sent into or out of the test socket 4 through the test ring 3, the bearing ring 2 is driven to rotate through the driver 6, the chip is selected, the chip is placed into the test ring 3 after being grabbed by the manipulator 5, the test ring 3 is driven to rotate by the driver 6, the selected chip is sent into the test socket 4 to be subjected to the high-temperature aging test, after the test is finished, the driver 6 drives the test ring 3 to rotate, the test ring 3 carries the chip after the detection is rotated to the manipulator 5, the chip is placed into the bearing ring 2 after being grabbed by the manipulator 5, and the desktop-level automatic high-temperature aging test of the chip is realized.
In order to meet the requirement of batch testing of the same or different packaged chips, the test ring 3 penetrates through at least two test sockets 4 which are suitable for the same or different packaged chips, so that the test ring is easy to understand, after a plurality of test sockets 4 with the same packaging type are configured, the chips with the same packaging type can be tested at the same time, after the test sockets 4 with different packaging types are configured, the chips are selected by the manipulator 5, and after the chips with different packaging types are sequentially placed on the test ring 3 according to the sequence of the test sockets 4, the chips with different packaging types can be tested at the same time.
Specifically, as shown in fig. 2 and 3, the test socket 4 includes: the testing device comprises a base 4-1, an upper cover 4-2, a positive and negative tooth screw rod 4-3, a screw rod motor 4-4, a mounting seat 4-5 and a guide rod 4-6, wherein the base 4-1 is used for bearing a chip, the upper cover 4-2 is used for controlling the testing temperature of the chip, the base 4-1 and the upper cover 4-2 are respectively arranged at two ends of the positive and negative tooth screw rod 4-3, the positive and negative tooth screw rod 4-3 is connected with the screw rod motor 4-4, the mounting seat 4-5 is provided with the guide rod 4-6, and the base 4-1 and the upper cover 4-2 are both arranged on the guide rod 4-6 in a sliding manner.
In order to solve the heating problem of the chip, the base 4-1 and the upper cover 4-2 which are hinged in the prior art are detached and connected through the positive and negative tooth screw rods 4-3, so that the test socket 4 with the changed structure can control the positive and negative tooth screw rods 4-3 to rotate through the screw rod motor 4-4, the base 4-1 and the upper cover 4-2 are close to each other to clamp the chip, or the base 4-1 and the upper cover 4-2 are far away from each other to release the chip, the chip is not required to be clamped by manual operation, the operation steps are simplified, and the test socket is suitable for automatic detection.
When a chip is clamped, the chip is carried by the test ring 3, the base 4-1 and the upper cover 4-2 are close to the chip from the lower part of the chip and the upper part of the chip respectively, meanwhile, contact surfaces of the base 4-1 and the upper cover 4-2 and the chip adopt pockmark indium sheets with high heat transfer coefficients and soft texture, a heating rod and a temperature sensor are arranged inside the upper cover 4-2, and a cooling fan is arranged above the heating rod.
In order to solve the installation problem of the test socket 4, by arranging the installation seats 4-5, it is easy to understand that the test socket 4 is formed into a modular design by arranging the installation seats 4-5, as shown in fig. 1, by installing different test sockets 4 on the circular truncated cone 1 in a modular form, the installation of a plurality of identical test sockets 4 can realize aging test on a plurality of chips at the same time, and the installation of a plurality of different test sockets 4 can realize testing of chips packaged differently, thereby meeting different desktop test requirements and increasing the practicability.
Specifically, as shown in fig. 4, the carrier ring 2 and the test ring 3 each include: the ring body, hold groove and breach, the ring body on be provided with the groove that holds that a plurality of is used for placing the chip, the groove outside that holds on the inboard and the test ring 3 of holding of bearing ring 2 all is provided with the breach.
For manipulator 5 gets and puts the chip, all set up the groove that holds that link up from top to bottom on bearing ring 2 and the test ring 3 to setting up the breach in the side that holds the groove, easily understanding, manipulator 5 can carry out the centre gripping to the chip from the top and the bottom that hold the groove, and pass the breach, get the chip and put.
Specifically, as shown in fig. 5 to 7, the robot 5 includes: the steering mechanism comprises a shell 5-1, bent claws 5-2, connecting rods 5-3, a fixed shaft 5-4, a steering engine 5-5, a frame body 5-6 and a turnover motor 5-7, wherein the shell 5-1 is a disc, two sides of the disc are respectively provided with an open slot penetrating through the disc, two arc-shaped bent claws 5-2 are arranged inside the shell 5-1 in a sliding mode, two ends of each bent claw 5-2 respectively extend to the open slots on the two sides, the fixed shaft 5-4 is arranged in the middle of the shell 5-1, two ends of each fixed shaft 5-4 are rotatably connected onto the frame body 5-6, one end of each fixed shaft 5-4 is connected with the turnover motor 5-7 fixedly arranged on the frame body 5-6, the middle of each bent claw 5-2 is fixedly connected with one end of each connecting rod 5-3, the other end of each connecting rod 5-3 is rotatably connected into the shell 5-1, the steering engine 5-5 is arranged inside the shell 5-1, and the steering engine 5-5 is used for driving the connecting rods 5-3 to swing.
In order to clamp the chip from the upper side and the lower side of the chip, open slots are formed in two sides of a shell 5-1, and two slidably arranged bent claws 5-2 respectively extend out of the upper side and the lower side of the open slots, so that the chip can be easily clamped by moving the chip into the open slots through a bearing ring 2 or a test ring 3 and respectively extending out of the upper side and the lower side of the chip to clamp and grab the chip, wherein the bent claws 5-2 on the upper side and the lower side of the open slots are easy to understand.
In order to solve the driving problem of the two bent claws 5-2, one end of a connecting rod 5-3 is connected with the bent claw 5-2, the other end of the connecting rod is rotatably connected to a fixed shaft 5-4, a sliding groove is formed in the middle of the connecting rod 5-3, the front end of a rocker arm of a steering engine 5-5 is connected with the sliding groove in a sliding mode through a sliding block, so that the understanding is easy, when a rocker arm of the steering engine 5-5 swings to one side, the connecting rod 5-3 can drive the bent claw 5-2 to swing to one side, the front end of the bent claw 5-2 extends out of the side face of an open groove, and the two bent claws 5-2 are controlled to extend out of two sides of the open groove through the two steering engines 5-5 to realize grabbing.
Referring to fig. 6 and 7, when a chip needs to be moved from the carrier ring 2 to the test ring 3, the carrier ring 2 and the test ring 3 are respectively embedded into open slots at two sides of the manipulator 5, the two steering engines 5-5 respectively drive the two connecting rods 5-3 to swing to one side through the rocker arms to drive the two bent claws 5-2 to extend out from the upper and lower sides of the open slots to clamp the chip, after the chip is clamped, the shell 5-1 is driven to turn to one side of the test ring 3 through the turning motor 5-7, and the two bent claws 5-2 loosen the chip until the chip falls into the test ring 3.
Specifically, as shown in conjunction with fig. 8 and 9, the driver 6 includes: the device comprises a guide strip 6-1, a bracket 6-2, a driving wheel 6-3 and a driving motor 6-4; the guide strip 6-1 is fixedly connected with the support 6-2, the guide strip 6-1 is arranged on the outer side of the bearing ring 2 or the inner side of the testing ring 3 in a sliding manner, and the guide strip 6-1 and the support 6-2 are used for supporting the bearing ring 2 and the testing ring 3 and stabilizing the rotation of the bearing ring 2 and the testing ring 3; the driving wheel 6-3 is rotatably arranged on the support 6-2, the side surface of the driving wheel 6-3 penetrates through the guide strip 6-1 and then contacts with the bearing ring 2 or the testing ring 3, and the driving wheel 6-3 is connected with a driving motor 6-4 fixedly arranged on the support 6-2 and used for driving the bearing ring 2 and the testing ring 3 to rotate.
In order to ensure the stable rotation of the bearing ring 2 and the test ring 3, the guide strips 6-1 and the brackets 6-2 are arranged on the side surfaces of the bearing ring 2 and the test ring 3, so that the bearing ring 2 and the test ring 3 can be supported and guided by the guide strips 6-1 when the bearing ring 2 and the test ring 3 rotate;
in order to drive the bearing ring 2 and the testing ring 3 to rotate, a driving frame is formed by arranging a driving wheel 6-3 which is in contact with the bearing ring 2 and the testing ring 3 and a driving motor 6-4 which is in transmission connection with the driving wheel 6-3 on the guide strip 6-1 and the support 6-2, the driving wheel 6-3 is in contact with the bearing ring 2 and the testing ring 3 in a gear meshing mode including but not limited to, and as can be easily understood, the driving wheel 6-3 is driven to rotate by the driving motor 6-4, and the bearing ring 2 and the testing ring 3 are driven to rotate by the driving wheel 6-3.
Detailed description of the invention
The following is a specific embodiment of a test socket of a chip burn-in test stand, which can be implemented alone or as a critical structure of the chip burn-in test stand disclosed in the specific embodiment.
The test socket of the chip aging test bench comprises: the testing device comprises a base 4-1, an upper cover 4-2, a positive and negative tooth screw rod 4-3, a screw rod motor 4-4, a mounting seat 4-5 and a guide rod 4-6, wherein the base 4-1 is used for bearing a chip, the upper cover 4-2 is used for controlling the testing temperature of the chip, the base 4-1 and the upper cover 4-2 are respectively arranged at two ends of the positive and negative tooth screw rod 4-3, the positive and negative tooth screw rod 4-3 is connected with the screw rod motor 4-4, the mounting seat 4-5 is provided with the guide rod 4-6, and the base 4-1 and the upper cover 4-2 are both arranged on the guide rod 4-6 in a sliding manner.
In order to solve the problem of heating of the chip, the base 4-1 and the upper cover 4-2 which are hinged in the prior art are detached and connected through the positive and negative tooth lead screw 4-3, so that the test socket 4 with the changed structure can control the positive and negative tooth lead screw 4-3 to rotate through the lead screw motor 4-4, the base 4-1 and the upper cover 4-2 are close to each other to clamp the chip, or the base 4-1 and the upper cover 4-2 are far away from each other to release the chip, the chip is not required to be clamped by manual operation, the operation steps are simplified, and the test socket is suitable for automatic detection.
When a chip is clamped, the chip is carried by the test ring 3, the base 4-1 and the upper cover 4-2 are close to the chip from the lower part of the chip and the upper part of the chip respectively, meanwhile, contact surfaces of the base 4-1 and the upper cover 4-2 and the chip adopt pockmark indium sheets with high heat transfer coefficients and soft texture, a heating rod and a temperature sensor are arranged inside the upper cover 4-2, and a cooling fan is arranged above the heating rod.
In order to solve the installation problem of the test socket 4, by arranging the installation seats 4-5, it is easy to understand that the test socket 4 is formed into a modular design by arranging the installation seats 4-5, as shown in fig. 1, by installing different test sockets 4 on the circular truncated cone 1 in a modular form, the installation of a plurality of identical test sockets 4 can realize aging test on a plurality of chips at the same time, and the installation of a plurality of different test sockets 4 can realize testing of chips packaged differently, thereby meeting different desktop test requirements and increasing the practicability.
Detailed description of the invention
The following is a specific embodiment of a manipulator of a chip burn-in test stand, which can be implemented independently, or as a critical structure of the chip burn-in test stand disclosed in the first specific embodiment.
Manipulator of chip aging test platform includes: the steering mechanism comprises a shell 5-1, bent claws 5-2, connecting rods 5-3, a fixed shaft 5-4, a steering engine 5-5, a frame body 5-6 and a turnover motor 5-7, wherein the shell 5-1 is a disc, two sides of the disc are respectively provided with an open slot penetrating through the disc, two arc-shaped bent claws 5-2 are arranged inside the shell 5-1 in a sliding mode, two ends of each bent claw 5-2 respectively extend to the open slots on the two sides, the fixed shaft 5-4 is arranged in the middle of the shell 5-1, two ends of each fixed shaft 5-4 are rotatably connected onto the frame body 5-6, one end of each fixed shaft 5-4 is connected with the turnover motor 5-7 fixedly arranged on the frame body 5-6, the middle of each bent claw 5-2 is fixedly connected with one end of each connecting rod 5-3, the other end of each connecting rod 5-3 is rotatably connected into the shell 5-1, the steering engine 5-5 is arranged inside the shell 5-1, and the steering engine 5-5 is used for driving the connecting rods 5-3 to swing.
In order to clamp the chip from the upper side and the lower side of the chip, open slots are formed in two sides of a shell 5-1, and two slidably arranged bent claws 5-2 respectively extend out of the upper side and the lower side of the open slots, so that the chip can be easily clamped by moving the chip into the open slots through a bearing ring 2 or a test ring 3 and respectively extending out of the upper side and the lower side of the chip to clamp and grab the chip, wherein the bent claws 5-2 on the upper side and the lower side of the open slots are easy to understand.
In order to solve the driving problem of the two bent claws 5-2, one end of a connecting rod 5-3 is connected with the bent claw 5-2, the other end of the connecting rod is rotatably connected to a fixed shaft 5-4, a sliding groove is formed in the middle of the connecting rod 5-3, and the front end of a rocker arm of the steering engine 5-5 is connected with the sliding groove in a sliding mode through a sliding block, so that the bent claw 5-2 can be driven to swing to one side through the connecting rod 5-3 when a rocker arm of the steering engine 5-5 swings to one side, the front end of the bent claw 5-2 extends out of the side face of an open groove, and the two bent claws 5-2 are controlled to extend out of two sides of the open groove through the two steering engines 5-5 to realize grabbing.
Referring to fig. 6 and 7, when a chip needs to be moved from the carrier ring 2 to the test ring 3, the carrier ring 2 and the test ring 3 are respectively embedded into open slots at two sides of the manipulator 5, the two steering engines 5-5 respectively drive the two connecting rods 5-3 to swing to one side through the rocker arms to drive the two bent claws 5-2 to extend out from the upper and lower sides of the open slots to clamp the chip, after the chip is clamped, the shell 5-1 is driven to turn to one side of the test ring 3 through the turning motor 5-7, and the two bent claws 5-2 loosen the chip until the chip falls into the test ring 3.
Detailed description of the invention
The following is a specific embodiment of a testing method of a chip burn-in test stand, which can be implemented independently or applied to the chip burn-in test stand disclosed in the first specific embodiment.
The test method of the chip aging test bench comprises the following steps:
step a, chip placement: placing a plurality of chips on the bearing ring 2, and placing a plurality of chips to be detected through a plurality of containing grooves formed in the bearing ring 2;
step b, chip selection: the bearing ring 2 is driven to rotate by the driver 6 until the corresponding chip to be detected on the bearing ring 2 rotates to the manipulator 5;
step c, chip switching: clamping the chip to be detected by the manipulator 5, turning over the manipulator 5 after clamping is finished, and placing the chip to be detected on the test ring 3 on the inner side of the bearing ring 2;
step d, chip feeding: the driver 6 drives the test ring 3 to rotate until the corresponding chip to be detected on the test ring 3 rotates into the test socket 4;
step e, chip testing: the base 4-1 and the upper cover 4-2 of the test socket 4 are driven to mutually approach by rotating the positive and negative screw rods 4-3 of the test socket 4 until a chip to be detected on the test ring 3 is clamped, the chip is borne by the base 4-1, the test temperature of the chip is controlled by the upper cover 4-2, and the chip is subjected to high-temperature aging test;
step f, sending out the chip: after the aging test is finished, the base 4-1 and the upper cover 4-2 of the test socket 4 are far away from each other, and the driver 6 drives the test ring 3 to rotate until the chip on the test ring 3 after the detection is finished rotates to the manipulator 5;
step g, transferring out the chip: the chip to be detected is clamped by the manipulator 5, after the clamping is completed, the manipulator 5 is turned over, and the chip after the detection is completed is placed on the bearing ring 2 outside the test ring 3.
Specifically, the test platform is applied to a chip aging test platform, and the test platform comprises: the test device comprises a circular truncated cone 1, a bearing ring 2, a test ring 3, a test socket 4, a manipulator 5 and a driver 6.
Through round platform 1 as the base, satisfy the needs of desktop level use, as the repository of waiting to detect the chip and detecting the chip after accomplishing through carrier ring 2, send the chip into or send out test socket 4 through test ring 3, it is easy to understand, carrier ring 2 passes through driver 6 drive and rotates, select the chip, place test ring 3 into after snatching by manipulator 5, it is same, drive test ring 3 by driver 6 and rotate, send the chip of selection into inside test socket 4 and carry out high temperature aging test, after the test is accomplished, driver 6 drives test ring 3 and rotates, test ring 3 is carrying the chip after the completion of detection and is rotating to manipulator 5, inside carrier ring 2 is put into after snatching by manipulator 5, realize the automatic test of chip high temperature aging.
Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that changes, modifications, substitutions and alterations can be made in these embodiments without departing from the principles and spirit of the invention, the scope of which is defined in the appended claims and their equivalents.
Claims (10)
1. Chip burn-in test platform, its characterized in that includes: round platform (1), bear ring (2), test ring (3), test socket (4), manipulator (5) and driver (6), the upper surface of round platform (1) rotates and is provided with and bears ring (2) and test ring (3), bear ring (2) be used for holding the chip, test ring (3) be used for sending the chip into test socket (4) and carry out high temperature aging test or send out the chip after the test completion in testing socket (4), and test ring (3) coaxial setting is in the inboard that bears ring (2), manipulator (5) set up between bearing ring (2) and test ring (3) for move the chip on bearing ring (2) to test ring (3), or move the chip on testing ring (3) to bearing ring (2), test ring (3) pass two at least test socket (4) settings that adapt to the same or different encapsulation chips, driver (6) be used for alone or drive simultaneously bear ring (2) and test ring (3) and follow clockwise or anticlockwise rotation.
2. The chip burn-in test station according to claim 1, wherein said test socket (4) comprises: the testing device comprises a base (4-1), an upper cover (4-2), a positive and negative tooth lead screw (4-3), a lead screw motor (4-4), a mounting seat (4-5) and guide rods (4-6), wherein the base (4-1) is used for bearing a chip, the upper cover (4-2) is used for controlling the testing temperature of the chip, the base (4-1) and the upper cover (4-2) are respectively arranged at two ends of the positive and negative tooth lead screw (4-3), the positive and negative tooth lead screw (4-3) is connected with the lead screw motor (4-4), the guide rods (4-6) are arranged on the mounting seat (4-5), and the base (4-1) and the upper cover (4-2) are both arranged on the guide rods (4-6) in a sliding mode.
3. The chip burn-in test station according to any of the claims 1 or 2, wherein said carrier ring (2) and said test ring (3) each comprise: the ring body, hold groove and breach, the ring body on be provided with the groove that holds that a plurality of is used for placing the chip, the groove outside that holds on holding inslot side and the test ring (3) on bearing ring (2) all is provided with the breach.
4. The chip burn-in test station according to claim 3, wherein said robot (5) comprises: the steering gear comprises a shell (5-1), bent claws (5-2), connecting rods (5-3), a fixed shaft (5-4), a steering gear (5-5), a frame body (5-6) and a turnover motor (5-7), wherein the shell (5-1) is a disc, two open slots penetrating through the disc are formed in two sides of the disc, two arc-shaped bent claws (5-2) are arranged in the shell (5-1) in a sliding mode, two ends of each bent claw (5-2) extend to the open slots in two sides respectively, the fixed shaft (5-4) is arranged in the middle of the shell (5-1), two ends of the fixed shaft (5-4) are rotatably connected to the frame body (5-6), one end of each fixed shaft (5-4) is connected with the turnover motor (5-7) fixedly arranged on the frame body (5-6), the middle of each bent claw (5-2) is fixedly connected with one end of the connecting rod (5-3), the other end of the connecting rod (5-3) is rotatably connected to the interior of the shell (5-1), and the connecting rods (5-3) are arranged in the shell (5-1) and used for driving the steering gear (5-3).
5. The chip burn-in test station according to any of the claims 1 or 2, wherein said driver (6) comprises: the device comprises a guide strip (6-1), a bracket (6-2), a driving wheel (6-3) and a driving motor (6-4); the guide strip (6-1) is fixedly connected with the support (6-2), the guide strip (6-1) is arranged on the outer side of the bearing ring (2) or the inner side of the testing ring (3) in a sliding mode, and the guide strip (6-1) and the support (6-2) are used for supporting the bearing ring (2) and the testing ring (3) and enabling the bearing ring (2) and the testing ring (3) to rotate stably; the driving wheel (6-3) is rotatably arranged on the support (6-2), the side face of the driving wheel (6-3) penetrates through the guide strip (6-1) and then is in contact with the bearing ring (2) or the testing ring (3), and the driving wheel (6-3) is connected with a driving motor (6-4) fixedly arranged on the support (6-2) and used for driving the bearing ring (2) and the testing ring (3) to rotate.
6. Chip aging testing platform's key structure, its characterized in that for test socket, includes: the testing device comprises a base (4-1), an upper cover (4-2), a positive and negative tooth lead screw (4-3), a lead screw motor (4-4) mounting seat (4-5) and guide rods (4-6), wherein the base (4-1) is used for bearing a chip, the upper cover (4-2) is used for controlling the testing temperature of the chip, the base (4-1) and the upper cover (4-2) are respectively arranged at two ends of the positive and negative tooth lead screw (4-3), the positive and negative tooth lead screw (4-3) is connected with the lead screw motor (4-4), the guide rods (4-6) are arranged on the mounting seat (4-5), and the base (4-1) and the upper cover (4-2) are both arranged on the guide rods (4-6) in a sliding mode.
7. Chip aging test platform's key structure, its characterized in that for the manipulator, includes: the steering gear comprises a shell (5-1), bent claws (5-2), connecting rods (5-3), a fixed shaft (5-4), a steering gear (5-5), a frame body (5-6) and a turnover motor (5-7), wherein the shell (5-1) is a disc, two open slots penetrating through the disc are formed in two sides of the disc, two arc-shaped bent claws (5-2) are arranged in the shell (5-1) in a sliding mode, two ends of each bent claw (5-2) extend to the open slots in two sides respectively, the fixed shaft (5-4) is arranged in the middle of the shell (5-1), two ends of the fixed shaft (5-4) are rotatably connected to the frame body (5-6), one end of each fixed shaft (5-4) is connected with the turnover motor (5-7) fixedly arranged on the frame body (5-6), the middle of each bent claw (5-2) is fixedly connected with one end of the connecting rod (5-3), the other end of the connecting rod (5-3) is rotatably connected to the interior of the shell (5-1), and the connecting rods (5-3) are arranged in the shell (5-1) and used for driving the steering gear (5-3).
8. The key structure of the chip aging test bench is characterized in that the chip aging test bench is a driver and comprises: the device comprises a guide strip (6-1), a bracket (6-2), a driving wheel (6-3) and a driving motor (6-4); the guide strip (6-1) is fixedly connected with the support (6-2), the guide strip (6-1) is arranged on the outer side of the bearing ring (2) or the inner side of the testing ring (3) in a sliding mode, and the guide strip (6-1) and the support (6-2) are used for supporting the bearing ring (2) and the testing ring (3) and enabling the bearing ring (2) and the testing ring (3) to rotate stably; the driving wheel (6-3) is rotatably arranged on the support (6-2), the side face of the driving wheel (6-3) penetrates through the guide strip (6-1) and then is in contact with the bearing ring (2) or the testing ring (3), and the driving wheel (6-3) is connected with a driving motor (6-4) fixedly arranged on the support (6-2) and used for driving the bearing ring (2) and the testing ring (3) to rotate.
9. The test method of the chip aging test bench is characterized by comprising the following steps:
step a, chip placement: placing a plurality of chips on the bearing ring (2), and placing a plurality of chips to be detected through a plurality of containing grooves formed in the bearing ring (2);
step b, chip selection: the bearing ring (2) is driven to rotate by the driver (6) until the corresponding chip to be detected on the bearing ring (2) rotates to the manipulator (5);
step c, chip switching: clamping the chip to be detected through a manipulator (5), turning the manipulator (5) after clamping is completed, and placing the chip to be detected on a test ring (3) on the inner side of a bearing ring (2);
step d, chip feeding: the driver (6) drives the test ring (3) to rotate until the corresponding chip to be detected on the test ring (3) rotates into the test socket (4);
step e, chip testing: the base (4-1) and the upper cover (4-2) of the test socket (4) are driven to mutually approach through the rotation of the positive and negative teeth screw rod (4-3) of the test socket (4) until a chip to be detected on the test ring (3) is clamped, the chip is borne through the base (4-1), the test temperature of the chip is controlled through the upper cover (4-2), and the chip is subjected to high-temperature aging test;
step f, sending out the chip: after the aging test is finished, the base (4-1) and the upper cover (4-2) of the test socket (4) are away from each other, and the driver (6) drives the test ring (3) to rotate until the chip on the test ring (3) after the detection is finished rotates to the manipulator (5);
step g, transferring out the chip: the chip to be detected is clamped through the manipulator (5), after clamping is completed, the manipulator (5) is turned over, and the chip after detection is placed on the bearing ring (2) on the outer side of the testing ring (3).
10. The method as claimed in claim 9, applied to a chip burn-in test station, said test station comprising: the test device comprises a round table (1), a bearing ring (2), a test ring (3), a test socket (4), a manipulator (5) and a driver (6).
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| CN202310018152.3A CN115754684B (en) | 2023-01-06 | 2023-01-06 | Chip aging test bench |
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Cited By (1)
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| CN116735923A (en) * | 2023-08-08 | 2023-09-12 | 法特迪精密科技（苏州）有限公司 | High temperature aging test socket adjusts structure |
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Address after: No. 200 Xingpu Road, Industrial Park, Suzhou City, Jiangsu Province, 215000, 5 # 101, 102, 201, 202 Patentee after: Suzhou Fatedi Technology Co.,Ltd. Country or region after: China Address before: No. 200 Xingpu Road, Industrial Park, Suzhou City, Jiangsu Province, 215000, 5 # 101, 102, 201, 202 Patentee before: FTDEVICE TECHNOLOGY (SUZHOU) CO.,LTD. Country or region before: China |