CN115308569B - Touch chip electrical property testing device and testing method - Google Patents
Touch chip electrical property testing device and testing method Download PDFInfo
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- CN115308569B CN115308569B CN202210812989.0A CN202210812989A CN115308569B CN 115308569 B CN115308569 B CN 115308569B CN 202210812989 A CN202210812989 A CN 202210812989A CN 115308569 B CN115308569 B CN 115308569B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
- G01R31/2889—Interfaces, e.g. between probe and tester
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0416—Connectors, terminals
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0433—Sockets for IC's or transistors
- G01R1/0441—Details
- G01R1/0466—Details concerning contact pieces or mechanical details, e.g. hinges or cams; Shielding
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
- G01R31/2887—Features relating to contacting the IC under test, e.g. probe heads; chucks involving moving the probe head or the IC under test; docking stations
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The invention discloses a touch chip electrical property testing device and a testing method in the technical field of chip testing, wherein the device comprises a conveying mechanism, a chip, two separated jigs and a fixing mechanism; the chip is arranged on the conveying mechanism, the conveying mechanism is provided with a clamping mechanism, the lower end surface of the chip is provided with a clamping groove corresponding to the clamping mechanism, and the separating jig can be assembled and molded in the process of moving along with the conveying mechanism and clamp pins of the chip; the lower end face of the chip is positioned relatively, and the lower end face of the chip is not easy to damage, so that the operation difficulty of the positioning process is reduced, the phenomenon that the working efficiency of workers is reduced due to the fear of damaging the chip is avoided, and the damage rate of the chip in the testing process is reduced.
Description
Technical Field
The invention relates to the technical field of chip testing, in particular to an electrical testing device and an electrical testing method for a touch chip.
Background
Touch refers herein to single-point or multi-point touch technology; the chip is an IC, namely a metal sheet or a nonmetal sheet, the end surface of which can be integrated with a friction lining and a friction material layer, and generally refers to all electronic components, and is a circuit module which integrates various electronic components on a silicon plate to realize a certain specific function; the electronic device is the most important part in the electronic device and bears the functions of operation and storage; the application range of the integrated circuit covers almost all electronic equipment for military and civil use; the silicon wafer, which contains the integrated circuit, is small and often part of a computer or other device.
The existing electrical test modes of the touch chip mainly comprise two modes, one mode is to directly test pins of the chip by manual work, the other mode is to insert the touch chip into a pin interface of a test fixture by manual work, and automatic test is carried out by the fixture; the former inefficiency, the latter is at the in-process of inserting the pin interface of test fixture with the touch chip, has to lead to the chip pin to receive strong extrusion by manual operation mistake, leads to the risk that the pin buckled for detection efficiency reduces, especially to the chip that partial pin easily breaks, still can make the chip pin direct fracture, and the direct condemned condition of chip produces, makes the defective rate of whole production flow increase.
Based on this, the invention designs a touch chip electrical testing device and a testing method to solve the above problems.
Disclosure of Invention
The invention aims to provide an electrical testing device and a testing method for a touch chip, which are used for solving the problems that the prior electrical testing method for the touch chip is mainly two in the background art, one is used for directly testing pins of the chip by manpower, and the other is used for automatically testing by the jig by manually inserting the touch chip into a pin interface of the testing jig; the former inefficiency, the latter is at the in-process of inserting the pin interface of test fixture with the touch chip, has to lead to the chip pin to receive strong extrusion by artifical maloperation, leads to the risk that the pin buckled for detection efficiency reduces, especially to the chip that partial pin easily breaks, still can make the chip pin direct fracture, and the direct condemned condition of chip produces, makes the problem that the defective rate of whole production flow increases.
In order to achieve the above purpose, the present invention provides the following technical solutions: the electrical property testing device for the touch chip comprises a conveying mechanism, a chip, two separated jigs and a fixing mechanism; the chip is arranged on the conveying mechanism, the conveying mechanism is provided with a clamping mechanism, the lower end face of the chip is provided with a clamping groove corresponding to the clamping mechanism, and the separating jig can be assembled and used for clamping pins of the chip in the process of moving along with the conveying mechanism.
As a further scheme of the invention, the conveying mechanism comprises two synchronous wheels, the two synchronous wheels are rotationally connected with the fixing mechanism, the driving mechanism is externally connected with the synchronous wheels, synchronous belts are connected to the front side and the rear side of the two synchronous wheels in a common transmission mode, the two separating jigs are respectively arranged on one side, far away from the middle position surface of the synchronous wheels, of the two synchronous belts, and the clamping mechanism is arranged between the two synchronous belts.
As a further scheme of the invention, the clamping mechanism comprises a rotating shaft, the rotating shaft is fixedly arranged between two synchronous belts, the rotating shaft is elastically connected with a clamping plate through a torsion spring in a rotating way, the initial position of the clamping plate can be coplanar with the belt surface of the synchronous belts, and a first triggering mechanism is arranged on the inner sides of the synchronous belts; the first trigger mechanism can enable the clamping plate to pop up the synchronous belt surface after the clamping plate moves to the upper end of the synchronous belt, a pressing plate is externally connected to the upper portion of the synchronous belt and used for limiting upward movement of the chip.
As a further scheme of the invention, the first triggering mechanism comprises a first boss, the first boss is arranged at a position between two synchronous belts at the inner sides of the synchronous belts, a first connecting rod is fixedly connected to the side wall of the first boss, and the first connecting rod is fixedly connected with the fixing mechanism.
As a further scheme of the invention, the separating jig comprises two second connecting rods, the two second connecting rods are respectively and fixedly connected with the side walls of the two synchronous belts, the second connecting rods are fixedly connected with first mounting plates, the side walls are fixedly connected with second mounting plates, the upper ends of the second mounting plates are fixedly connected with lower dies equivalent to the number of pins on one side of a chip, the upper surface contours of the lower dies are completely attached to the lower surface contours of the pins of the chip, the side walls of the second mounting plates are fixedly connected with first connecting plates, the first connecting plates are vertically and elastically connected with sliding rods, the upper ends of the sliding rods are fixedly connected with first mounting rods, the first mounting rods are fixedly connected with upper dies equivalent to the number of pins on one side of the chip, the lower surface contours of the upper dies are completely attached to the upper surface contours of the pins of the chip, and second triggering mechanisms are arranged at the first mounting rods and the first connecting plates and are used for controlling the separating jig to be folded.
As a further scheme of the invention, the second trigger mechanism comprises a first trigger rod, the first trigger rod is fixedly connected with the side wall of the first installation rod, the side wall of the first connecting plate is fixedly connected with the second trigger rod, a second boss is arranged above the synchronous belt, a third boss is arranged on the inner side of the synchronous belt, the second boss and the third boss are fixedly connected with the fixing mechanism, the second boss can downwards extrude the first trigger rod, and the third boss can upwards extrude the first installation rod.
As a further scheme of the invention, the first connecting rods are fixedly connected with third connecting rods between the upper dies, the lower ends of the third connecting rods are fixedly connected with trigger blocks, two calibration plates are arranged below the trigger blocks at the upper ends of the second mounting plates, the two calibration plates are symmetrically arranged relative to the middle position surface of the trigger blocks, the upper ends of the calibration plates are fixedly connected with plugboards, the side walls of the calibration plates are fixedly connected with wedge blocks, and the calibration plates are transversely elastically and slidably connected with the upper ends of the second mounting plates.
As a further aspect of the present invention, the calibration plate sidewall is made of a hard elastic material.
As a further scheme of the invention, the joint surfaces of the lower die and the upper die and the pins are made of hard elastic materials.
A touch chip electrical test method comprises the following steps:
s1, during working, a chip is manually placed on a conveying mechanism;
s2, the chip is clamped with a clamping mechanism on the conveying mechanism through a clamping groove, so that the chip can be fixed on the conveying mechanism;
s3, the positioned chip moves along with the conveying mechanism, and in the moving process, the pin is clamped by the separated jig so as to finish subsequent electrical testing work.
Compared with the prior art, the invention has the beneficial effects that:
1. according to the invention, the clamping groove arranged on the lower end face of the chip is matched with the clamping mechanism, the chip indirectly completes the positioning work of the relatively separated jig, pins of the chip are not needed in the whole positioning process, so that the situation that the pins are damaged due to inaccurate positioning in the positioning process is avoided, meanwhile, the lower end face of the chip is positioned relatively, the operation difficulty in the positioning process is reduced due to the fact that the lower end face of the chip is not easy to damage, the phenomenon that the working efficiency of workers is reduced due to fear of damage to the chip is avoided, and the damage rate of the chip in the testing process is reduced.
2. According to the pin clamping device, the pins are clamped through the upper die and the lower die, in the clamping process, the stress born by the pins is mainly in the form of split stress distribution, and compared with the traditional mode that the pins are inserted into the jacks, the pin stress concentration is avoided, the situation that the pins are damaged is avoided, and the pins are protected to the greatest extent; according to the invention, the phenomenon of stress concentration of the pins is avoided by actively clamping the pins, and meanwhile, in the process of clamping the pins by the upper die and the lower die, the upper die and the lower die are respectively attached to the upper end face and the lower end face of the pins, so that the pins can be supported by the upper die and the lower die in the clamping process, the pins are prevented from being excessively bent, the integrity of the pins is further protected, and the chip damage rate of a test link is reduced.
3. Along with the lower die moves upwards, the calibration plate moves between adjacent pins, then along with the lower die moves downwards, the trigger block moves downwards to extrude the wedge-shaped block, so that the wedge-shaped block moves transversely, the calibration plate moves towards the side wall of the adjacent pin and extrudes the side wall of the pin, the pin is corrected, the follow-up detection inaccuracy caused by pin deflection is avoided, and meanwhile the follow-up manual pin trimming work is avoided.
Drawings
FIG. 1 is a schematic diagram of the overall structure of the present invention;
FIG. 2 is a schematic view of the structure of the invention with one side of the fixing mechanism removed;
FIG. 3 is an enlarged schematic view of the structure shown in FIG. 2A;
FIG. 4 is a schematic elevational view in cross-section of the general structure of the present invention;
FIG. 5 is a schematic side cross-sectional view of the structure of FIG. 2;
FIG. 6 is an enlarged schematic view of the structure shown at B in FIG. 5;
FIG. 7 is a schematic diagram of a separate fixture and pins;
fig. 8 is a process flow diagram of the present invention.
In the drawings, the list of components represented by the various numbers is as follows:
chip 1, draw-in groove 11, synchronizing wheel 21, hold-in range 22, pivot 31, clamping plate 32, first boss 41, head rod 42, second connecting rod 51, first mounting plate 52, second mounting plate 53, lower mould 54, first connecting plate 55, slide bar 56, first mounting rod 57, upper mould 58, first trigger lever 61, second trigger lever 62, second boss 63, third boss 64, third connecting rod 71, trigger block 72, calibration plate 73, picture peg 74, wedge 75, fixed establishment 8.
Detailed Description
Referring to fig. 1-8, the present invention provides a technical solution: the electrical property testing device of the touch chip comprises a conveying mechanism, a chip 1, two separated jigs and a fixing mechanism 8; the conveying mechanism is connected with the fixing mechanism 8, the two separating jigs are respectively arranged on the front side and the rear side of the conveying mechanism, the chip 1 is placed on the conveying mechanism, the conveying mechanism is provided with a clamping mechanism, the lower end face of the chip 1 is provided with a clamping groove 11 corresponding to the clamping mechanism, and the separating jigs can be assembled and formed in the process of moving along with the conveying mechanism and clamp pins of the chip 1.
During operation, the chip 1 is manually placed on the conveying mechanism (referring to fig. 1, the conveying mechanism is a conveying belt type transmission piece), the chip 1 is clamped with the clamping mechanism on the conveying mechanism through the clamping groove 11, so that the chip 1 can be fixed on the conveying mechanism, and then the positioning of the chip 1 relative to the conveying mechanism is completed, meanwhile, the separating jig is arranged on the conveying mechanism, so that the separating jig can have the positioning attribute relative to the conveying mechanism, and then the clamping groove 11 arranged on the lower end face of the chip 1 is matched with the clamping mechanism, the chip 1 indirectly completes the positioning work of the separating jig, the pin participation of the chip 1 is not needed in the whole positioning process, the pin damage caused by the positioning misalignment in the positioning process is avoided, meanwhile, the lower end face of the chip 1 is positioned through the clamping mechanism, the operation difficulty of a worker is reduced, the phenomenon of reducing the working efficiency caused by damaging the chip 1 is avoided, then the chip 1 after the positioning is completed, the pins of the separating jig are moved along with the conveying mechanism, the pins of the separating jig are folded mutually, and the subsequent electrical testing is completed.
According to the invention, the clamping groove 11 arranged on the lower end face of the chip 1 is matched with the clamping mechanism, the chip 1 indirectly completes the positioning work of the relative separation type jig, pins of the chip 1 are not needed to participate in the whole positioning process, so that the situation that the pins are damaged due to inaccurate positioning in the positioning process is avoided, meanwhile, the lower end face of the chip 1 is positioned relatively, the operation difficulty in the positioning process is reduced due to the fact that the lower end face of the chip 1 is not easy to damage, the phenomenon that the working efficiency is reduced due to the fact that workers fear to damage the chip 1 is avoided, and the damage rate of the chip 1 in the testing process is reduced.
As a further scheme of the invention, the conveying mechanism comprises two synchronous wheels 21, the two synchronous wheels 21 are rotationally connected with the fixing mechanism 8, the synchronous wheels 21 are externally connected with a driving mechanism, the front side and the rear side of the two synchronous wheels 21 are jointly connected with synchronous belts 22 in a transmission manner, the two separating jigs are respectively arranged on one side, far away from the middle position surface of the synchronous wheels 21, of the two synchronous belts 22, and the clamping mechanism is arranged between the two synchronous belts 22.
During operation, the driving mechanism drives the synchronous belt 22 to rotate through the synchronous wheel 21, the chip 1 is fixed on the synchronous belt 22 through the clamping mechanism, in the rotation process of the synchronous belt 22, the separating jig arranged on the side face of the synchronous belt 22 is static relative to the chip 1 (the whole position of the separating jig is unchanged relative to the chip 1 and does not represent that the parts in the separating jig are static relative to the chip 1 in the rotation process of the synchronous belt 22), and further, the position precision between the separating jig and the chip 1 in the subsequent folding process of the separating jig is guaranteed.
As a further scheme of the invention, the clamping mechanism comprises a rotating shaft 31, the rotating shaft 31 is fixedly arranged between two synchronous belts 22, the rotating shaft 31 is elastically connected with a clamping plate 32 through a torsion spring in a rotating way, the initial position of the clamping plate 32 can be coplanar with the belt surface of the synchronous belt 22, and a first triggering mechanism is arranged on the inner side of the synchronous belt 22; the first triggering mechanism can enable the clamping plate 32 to pop up the belt surface of the synchronous belt 22 after the clamping plate 32 moves to the upper end of the synchronous belt 22, a pressing plate is externally connected above the synchronous belt 22 and used for limiting upward movement of the chip 1.
During operation, the chip 1 is placed at the upper end of the synchronous belt 22, the upper end of the chip 1 is pressed lightly by manpower to keep the chip 1 motionless, then the clamping plate 32 moves to the lower end of the chip 1 along with the synchronous belt 22, at the moment, under the action of the first trigger mechanism, the clamping plate 32 pops out of the belt surface of the synchronous belt 22 and enters the clamping groove 11 to be clamped with the chip 1 in the process of moving along with the synchronous belt 22, and then the synchronous belt 22 drives the chip 1 to move through the clamping plate 32 and enter between the synchronous belt 22 and the pressing plate, so that the chip 1 and the synchronous belt 22 keep relatively static.
As a further scheme of the invention, the first triggering mechanism comprises a first boss 41, the first boss 41 is arranged at a position between two synchronous belts 22 inside the synchronous belts 22, a first connecting rod 42 is fixedly connected to the side wall of the first boss 41, and the first connecting rod 42 is fixedly connected with the fixing mechanism 8.
When the clamping plate 32 moves to the upper side of the first boss 41, the lower end of the clamping plate 32 is extruded with the first boss 41, the first boss 41 extrudes the clamping plate 32 upwards, and the clamping plate 32 is pushed out of the synchronous belt 22 to be clamped with the clamping groove 11.
According to the invention, the lifting of the clamping plate 32 is controlled through the boss structure, so that the lifting of the clamping plate 32 can completely match the requirement of equipment, the accumulation of movement errors is avoided, and the equipment can run more stably.
As a further scheme of the invention, the split type jig comprises two second connecting rods 51, the two second connecting rods 51 are respectively and fixedly connected with side walls of the two synchronous belts 22, the second connecting rods 51 are fixedly connected with first mounting plates 52, the side walls are fixedly connected with second mounting plates 53, the upper ends of the second mounting plates 53 are fixedly connected with lower dies 54 which are equal to the pins on one side of the chip 1, the upper surface contours of the lower dies 54 are completely attached to the lower surface contours of the pins on one side of the chip 1, the side walls of the second mounting plates 53 are fixedly connected with first connecting plates 55, the first connecting plates 55 are vertically and elastically connected with sliding rods 56, the upper ends of the sliding rods 56 are fixedly connected with first mounting rods 57, the first mounting rods 57 are fixedly connected with upper dies 58 which are equal to the pins on one side of the chip 1, the lower surface contours of the upper dies 58 are completely attached to the upper surface contours of the pins on one side of the chip 1, and second triggering mechanisms are arranged at the first mounting rods 57 and the first connecting plates 55 and used for controlling the split type jig to be closed.
When the chip 1 and the synchronous belt 22 are fixed, the synchronous belt 22 carries the chip 1 to move continuously, at this time, the second trigger mechanism controls the first mounting rod 57 to move downwards, and controls the first connecting plate 55 to move upwards, so as to drive the lower die 54 to move upwards to attach the lower surface of the pin, and drive the upper die 58 to move downwards to attach the upper surface of the pin, so that the clamping of the pin is completed, and then the chip 1 can be subjected to a subsequent electrical test link.
In the invention, the pins are clamped through the upper die 58 and the lower die 54, and the stress born by the pins is mainly represented by split stress distribution in the clamping process, so that compared with the traditional mode of inserting the pins into jacks, the pins are prevented from being concentrated in stress, the pins are prevented from being damaged, and the pins are protected to the greatest extent.
The invention avoids the phenomenon of concentrated stress of the pins by actively clamping the pins, and simultaneously, in the process of clamping the pins by the upper die 58 and the lower die 54, the upper die 58 and the lower die 54 are respectively attached to the upper end surface and the lower end surface of the pins, so that the pins can be supported by the upper die 58 and the lower die 54 in the clamping process, the pins are prevented from being excessively bent, the integrity of the pins is further protected, and the damage rate of the chip 1 in the test link is reduced.
As a further scheme of the invention, the second triggering mechanism comprises a first triggering rod 61, the first triggering rod 61 is fixedly connected with the side wall of the first mounting rod 57, the side wall of the first connecting plate 55 is fixedly connected with a second triggering rod 62, a second boss 63 is arranged above the synchronous belt 22, a third boss 64 is arranged on the inner side of the synchronous belt 22, the second boss 63 and the third boss 64 are fixedly connected with the fixing mechanism 8, the second boss 63 can press the first triggering rod 61 downwards, and the third boss 64 can press the second triggering rod 62 upwards.
In operation, when the first trigger rod 61 and the second trigger rod 62 pass through the second boss 63 and the third boss 64, the upper die 58 is driven to move downwards and the lower die 54 is driven to move upwards in an extrusion manner.
As a further scheme of the invention, the first mounting rods 57 are fixedly connected with third connecting rods 71 between the upper dies 58, the lower ends of the third connecting rods 71 are fixedly connected with trigger blocks 72, two calibration plates 73 are arranged below the trigger blocks 72 at the upper ends of the second mounting plates 53, the two calibration plates 73 are symmetrically arranged relative to the middle plane of the trigger blocks 72, the upper ends of the calibration plates 73 are fixedly connected with inserting plates 74, the side walls of the calibration plates 73 are fixedly connected with wedge blocks 75, and the calibration plates 73 are transversely elastically and slidably connected with the upper ends of the second mounting plates 53.
During operation, as the lower die 54 moves upwards, the calibration plate 73 moves between adjacent pins, then as the upper die 58 moves downwards, the trigger block 72 moves downwards to squeeze the wedge block 75, so that the wedge block 75 moves transversely, the calibration plate 73 moves towards the side wall of the adjacent pin, and the side wall of the pin is squeezed, so that the pin is corrected, the follow-up detection inaccuracy caused by pin skew is avoided, and meanwhile, the follow-up manual pin trimming work is avoided.
As a further aspect of the present invention, the sidewall of the calibration plate 73 is made of a hard elastic material.
As a further aspect of the present invention, the bonding surfaces of the lower die 54 and the upper die 58 with the pins are made of hard elastic materials.
A touch chip electrical test method comprises the following steps:
s1, during working, a chip 1 is manually placed on a conveying mechanism;
s2, the chip 1 is clamped with a clamping mechanism on the conveying mechanism through a clamping groove 11, so that the chip 1 can be fixed on the conveying mechanism;
s3, the positioned chip 1 moves along with the conveying mechanism, and in the moving process, the pins are clamped by the separated jig so as to finish subsequent electrical testing work.
Claims (10)
1. The utility model provides a touch chip electrical property testing arrangement which characterized in that: comprises a conveying mechanism, a chip (1), two separated jigs and a fixing mechanism (8); the conveying mechanism is connected with the fixing mechanism (8), the two separating jigs are respectively arranged on the front side and the rear side of the conveying mechanism, the chip (1) is placed on the conveying mechanism, the conveying mechanism is provided with a clamping mechanism, the lower end face of the chip (1) is provided with a clamping groove (11) corresponding to the clamping mechanism, and the separating jigs can be assembled and formed in the process of moving along with the conveying mechanism and clamp pins of the chip (1).
2. The electrical testing device for touch chips of claim 1, wherein: the conveying mechanism comprises two synchronous wheels (21), the two synchronous wheels (21) are rotationally connected with the fixing mechanism (8), the synchronous wheels (21) are externally connected with a driving mechanism, synchronous belts (22) are connected to the front side and the rear side of the synchronous wheels (21) in a common transmission mode, the two separating jigs are respectively arranged on one side, away from the middle position surface of the synchronous wheels (21), of the two synchronous belts (22), and the clamping mechanism is arranged between the two synchronous belts (22).
3. The electrical testing device for touch chips of claim 2, wherein: the clamping mechanism comprises a rotating shaft (31), the rotating shaft (31) is fixedly arranged between two synchronous belts (22), the rotating shaft (31) is elastically connected with a clamping plate (32) through a torsion spring in a rotating mode, the initial position of the clamping plate (32) can be coplanar with the belt surface of the synchronous belts (22), and a first triggering mechanism is arranged on the inner side of each synchronous belt (22); the first trigger mechanism can enable the clamping plate (32) to pop up the belt surface of the synchronous belt (22) after the clamping plate (32) moves to the upper end of the synchronous belt (22), a pressing plate is externally connected to the upper portion of the synchronous belt (22), and the pressing plate is used for limiting upward movement of the chip (1).
4. The electrical testing device for touch chips of claim 3, wherein: the first triggering mechanism comprises a first boss (41), the first boss (41) is arranged at a position between two synchronous belts (22) on the inner sides of the synchronous belts (22), a first connecting rod (42) is fixedly connected to the side wall of the first boss (41), and the first connecting rod (42) is fixedly connected with the fixing mechanism (8).
5. The electrical testing device for touch chips of claim 4, wherein: the utility model provides a disconnect-type tool includes two second connecting rods (51), two second connecting rods (51) respectively with two hold-in range (22) lateral wall fixed connection, first mounting panel (52) of equal fixedly connected with of second connecting rods (51), lateral wall fixed connection second mounting panel (53), lower mould (54) of second mounting panel (53) upper end fixedly connected with equivalent chip (1) one side pin number, the lower surface profile of lower mould (54) laminating chip (1) pin completely, first connecting plate (55) of second mounting panel (53) lateral wall fixed connection, first connecting plate (55) vertical elastic connection slide bar (56), slide bar (56) upper end fixed connection has first installation pole (57), upper mould (58) of first installation pole (57) fixed connection equivalent chip (1) one side pin number, upper surface profile of upper mould (58) lower surface profile laminating chip (1) completely, first installation pole (57) and first connecting plate (55) are provided with second connecting plate department and are used for the first mechanism of triggering mechanism, second connecting plate department is used for triggering mechanism.
6. The electrical testing device for touch chips of claim 5, wherein: the second trigger mechanism comprises a first trigger rod (61), the first trigger rod (61) is fixedly connected with the side wall of the first mounting rod (57), the side wall of the first connecting plate (55) is fixedly connected with a second trigger rod (62), a second boss (63) is arranged above the synchronous belt (22), a third boss (64) is arranged on the inner side of the synchronous belt (22), the second boss (63) and the third boss (64) are fixedly connected with the fixing mechanism (8), the second boss (63) can downwards extrude the first trigger rod (61), and the third boss (64) can upwards extrude the second trigger rod (62).
7. The electrical testing device for touch chips of claim 6, wherein: the first mounting rods (57) are located between the upper dies (58) and are fixedly connected with third connecting rods (71), the lower ends of the third connecting rods (71) are fixedly connected with trigger blocks (72), two calibration plates (73) are arranged below the trigger blocks (72) at the upper ends of the second mounting plates (53), the two calibration plates (73) are symmetrically arranged relative to the middle surfaces of the trigger blocks (72), inserting plates (74) are fixedly connected to the upper ends of the calibration plates (73), wedge-shaped blocks (75) are fixedly connected to the side walls of the calibration plates (73), and the upper ends of the calibration plates (73) and the second mounting plates (53) are transversely elastically and slidably connected.
8. The electrical testing device for touch chips of claim 7, wherein: the side wall of the calibration plate (73) is made of hard elastic materials.
9. The electrical testing device for touch chips of claim 7, wherein: the bonding surfaces of the lower die (54) and the upper die (58) and the pins are made of hard elastic materials.
10. A touch chip electrical testing method, which is applicable to the touch chip electrical testing device of claim 7, and is characterized in that; the method comprises the following steps:
s1, during working, a chip (1) is manually placed on a conveying mechanism;
s2, the chip (1) is clamped with a clamping mechanism on the conveying mechanism through a clamping groove (11), so that the chip (1) can be fixed on the conveying mechanism;
s3, the chip (1) with the positioning completed moves along with the conveying mechanism, and in the moving process, the separated jig clamps the pins so as to complete subsequent electrical testing work.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202210812989.0A CN115308569B (en) | 2022-07-11 | 2022-07-11 | Touch chip electrical property testing device and testing method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202210812989.0A CN115308569B (en) | 2022-07-11 | 2022-07-11 | Touch chip electrical property testing device and testing method |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN115308569A CN115308569A (en) | 2022-11-08 |
| CN115308569B true CN115308569B (en) | 2023-06-16 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN202210812989.0A Active CN115308569B (en) | 2022-07-11 | 2022-07-11 | Touch chip electrical property testing device and testing method |
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Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN201434875Y (en) * | 2009-03-31 | 2010-03-31 | 深圳市微高半导体科技有限公司 | Chip testing jig |
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| CN210378974U (en) * | 2019-08-06 | 2020-04-21 | 深圳威谷微电子技术有限公司 | Chip pin correcting device |
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| CN201434875Y (en) * | 2009-03-31 | 2010-03-31 | 深圳市微高半导体科技有限公司 | Chip testing jig |
| CN113917316A (en) * | 2021-10-14 | 2022-01-11 | 池州华宇电子科技股份有限公司 | High-precision chip testing jig |
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