CN115184652A - Slender steady-flow test probe - Google Patents
Slender steady-flow test probe Download PDFInfo
- Publication number
- CN115184652A CN115184652A CN202210800575.6A CN202210800575A CN115184652A CN 115184652 A CN115184652 A CN 115184652A CN 202210800575 A CN202210800575 A CN 202210800575A CN 115184652 A CN115184652 A CN 115184652A
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- needle
- test probe
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- flow test
- elongated
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- 238000012360 testing method Methods 0.000 title claims abstract description 55
- 239000000523 sample Substances 0.000 title claims abstract description 33
- 238000012545 processing Methods 0.000 claims description 7
- 230000006835 compression Effects 0.000 claims description 4
- 238000007906 compression Methods 0.000 claims description 4
- 230000005540 biological transmission Effects 0.000 abstract description 6
- 238000010998 test method Methods 0.000 abstract description 2
- 238000003754 machining Methods 0.000 description 5
- 238000013461 design Methods 0.000 description 4
- 238000001514 detection method Methods 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 3
- 238000000034 method Methods 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 229910000679 solder Inorganic materials 0.000 description 2
- 238000010586 diagram Methods 0.000 description 1
- 238000006073 displacement reaction Methods 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 238000003825 pressing Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
- G01R1/06733—Geometry aspects
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- Physics & Mathematics (AREA)
- Geometry (AREA)
- General Physics & Mathematics (AREA)
- Measuring Leads Or Probes (AREA)
Abstract
The invention discloses a slender steady flow test probe, which comprises a needle rod; the elastic piece is sleeved outside the needle rod; a first needle head, one end of the needle rod is telescopically assembled at the tail part of the first needle head; and the other end of the needle rod is telescopically assembled at the tail part of the second needle. This long and thin stationary flow test probe has solved current long and thin test probe and often can lead to test data misdetection rate height, test transmission unstable problem because the syringe needle swings easily in the test procedure.
Description
Technical Field
The invention belongs to the technical field of semiconductor detection, and particularly relates to a slender steady-flow test probe.
Background
During the production process of the printed circuit board, an electrical test is performed on the printed circuit board to determine whether electrical parameters (such as resistance, capacitance, or inductance) of each component of the printed circuit board meet the standard requirements.
A common test method of a printed circuit board is to set test points on the printed circuit board, print solder paste on the surfaces of the test points, and obtain related electrical parameters by using a probe to directly contact the solder paste portions of the test points through an automated test device or an online test device.
The probe head type in the present on-line test equipment is different according to the difference of test points, and has different requirements, such as single-head single-action, double-head double-action, etc., and the factors of high test data misdetection rate, unstable test transmission, etc. caused by the swinging of the probe head are often generated in the test process of a slender test probe.
Disclosure of Invention
The invention aims to provide a slender steady-flow test probe, which solves the problems that the conventional slender test probe is high in test data false detection rate and unstable in test transmission because a needle head is easy to swing in the test process.
In order to solve the technical problem, the invention discloses an elongated steady flow test probe, which comprises:
a needle bar;
the elastic piece is sleeved outside the needle rod;
a first needle head, one end of the needle rod is telescopically assembled at the tail part of the first needle head;
and the other end of the needle rod is telescopically assembled at the tail part of the second needle.
The technical scheme of the invention also has the following characteristics:
furthermore, an annular limiting groove is formed in the outer edge of one end of the needle rod, and a concave point machining position is arranged on the outer wall of the tail portion of the first needle head.
Furthermore, the number of the concave point machining stations is multiple, and the concave point machining stations are circumferentially arranged along the tail portion of the first needle head at equal angles.
Furthermore, the other end of the needle rod is provided with a limiting annular table, and a necking is formed at the tail part of the second needle head.
Further, the elastic member is a compression spring.
Furthermore, the head part of the first needle head is cylindrical, and the head part of the second needle head is plum blossom-shaped.
Compared with the prior art, the invention has the following advantages: (1) According to the elongated steady-flow test probe, the needle rod is clamped in the first needle head and the second needle head, the design mode that the first needle head and the second needle head are clamped in the needle tube is abandoned, the first needle head and the second needle head are ensured not to swing easily, and the problems of high false testing rate of test data and unstable test transmission are avoided; (2) The slender steady-flow test probe is simple in overall structure, convenient to operate, low in manufacturing cost and good in market popularization and application prospect.
Drawings
The accompanying drawings, which are included to provide a further understanding of the invention and are incorporated in and constitute a part of this specification, illustrate embodiments of the invention and together with the description serve to explain the invention and not to limit the invention. In the drawings:
FIG. 1 is a schematic diagram of an elongated ballast test probe according to the present invention;
FIG. 2 is a cross-sectional view of an elongated ballast test probe of the present invention;
fig. 3 is an exploded view of an elongated ballast test probe of the present invention.
In the figure: 1. the needle comprises a first needle head, a needle rod 2, an elastic part 3, a second needle head 4, a concave point machining position 5, an annular limiting groove 6 and an annular limiting table 7.
Detailed Description
Reference will now be made in detail to embodiments of the present invention, examples of which are illustrated in the accompanying drawings, wherein like reference numerals refer to the same or similar elements or elements having the same or similar functions throughout. The embodiments described below with reference to the accompanying drawings are illustrative only for the purpose of explaining the present invention, and are not to be construed as limiting the present invention.
In the description of the present invention, if there are first and second described only for the purpose of distinguishing technical features, it is not understood that relative importance is indicated or implied or that the number of indicated technical features or the precedence of the indicated technical features is implicitly indicated or implied.
In the description of the present invention, unless otherwise explicitly limited, terms such as arrangement, installation, connection and the like should be understood in a broad sense, and those skilled in the art can reasonably determine the specific meanings of the above terms in the present invention in combination with the specific contents of the technical solutions.
As shown in fig. 1, the present invention discloses an elongated steady flow test probe, comprising:
a needle bar 2;
the elastic piece 3, the elastic piece 3 is sleeved outside the needle bar 2;
a first needle 1, one end of a needle bar 2 is telescopically assembled at the tail part of the first needle 1;
the other end of the second needle 4 and the needle rod 2 are telescopically assembled at the tail part of the second needle 4.
Referring to fig. 2 and 3, during assembly, the elastic member 3 is sleeved on the outside of the needle rod 2, and then the two ends of the needle rod 2 are inserted into the tail holes of the first needle head 1 and the second needle head 4 respectively, and are fixed in a limiting manner, so that the two ends of the needle rod 2 are telescopically limited in the tails of the first needle head 1 and the second needle head 4. The resilient member 3 is now trapped between the first needle 1 and the second needle 4.
In operation, the first needle 1 is connected with the test equipment, and the second needle 4 is contacted with the product to be tested. Compared with the existing design mode that the first needle head and the second needle head are clamped in the needle tube (needle rod), the needle rod 2 of the elongated steady-flow test probe is clamped in the first needle head 1 and the second needle head 4, so that the first needle head 1 and the second needle head 4 are better ensured not to swing easily, and the problems of high test data false detection rate and unstable test transmission are avoided.
Referring to fig. 2 and 3, in the slender steady-flow test probe of the present invention, an annular limiting groove 6 is disposed on an outer edge of one end of the needle bar 2, and a concave point machining position 5 is disposed on an outer wall of a tail portion of the first needle head 1.
When one end of the needle rod 2 extends into the tail part of the first needle head 1, the concave point processing position 5 is located outside the annular limiting groove 6, the concave point is processed at the concave point processing position 5, the outer wall of the tail part of the first needle head 1 can be made to be sunken inwards into the annular limiting groove 6, therefore, the sliding assembly between the first needle head 1 and the needle rod 2 can be completed in a limiting mode, and the sliding displacement is determined by the width of the annular limiting groove 6.
With reference to fig. 2 and 3, in the elongated steady flow test probe of the present invention, the number of the concave point processing stations 5 is plural, and the concave point processing stations are circumferentially arranged along the tail portion of the first needle 1 at equal angles, so that the design can implement sliding position limitation by the plural concave point processing stations 5, and ensure that the first needle 1 and the needle bar 2 do not deviate from each other when moving.
Referring to fig. 2 and 3, in the slender steady-flow test probe of the present invention, the other end of the needle bar 2 is provided with a limit annular table 7, and the tail of the second needle 4 is formed with a necking.
After a limiting annular table 7 arranged at the other end of the needle rod 2 extends into a hole at the tail part of the second needle head 4, a necking hole can be processed in a riveting and pressing mode at an orifice at the tail part of the second needle head 4, so that the sliding assembly between the needle rod 2 and the second needle head 4 is completed.
Referring to fig. 2 and 3 in an elongated ballast test probe according to the present invention, the resilient member 3 is preferably a compression spring.
The compression spring can provide elastic force which is more uniform and has larger straightness for the first needle head 1 and the second needle head 4, and good contact between the second needle head 4 and a tested product is ensured.
Referring to fig. 2 and 3, in the elongated steady flow test probe of the present invention, the head of the first needle 1 is cylindrical to facilitate connection with a test device, and the head of the second needle 4 is quincunx to facilitate contact with a product to be tested.
In summary, compared with the prior art, according to the elongated steady-flow test probe, the needle rod is clamped in the first needle head and the second needle head, the design mode that the first needle head and the second needle head are clamped in the needle tube is abandoned, the first needle head and the second needle head are not prone to swinging, and the problems of high test data misdetection rate and unstable test transmission are avoided.
In addition, the slender steady flow test probe is simple in overall structure, convenient to operate, low in manufacturing cost and good in market popularization and application prospect.
While the foregoing description shows and describes several preferred embodiments of the invention, it is to be understood, as noted above, that the invention is not limited to the forms disclosed herein, but is not to be construed as excluding other embodiments and is capable of use in various other combinations, modifications, and environments and is capable of changes within the scope of the inventive concept as expressed herein, commensurate with the above teachings, or the skill or knowledge of the relevant art. And that modifications and variations may be effected by those skilled in the art without departing from the spirit and scope of the invention as defined by the appended claims.
Claims (6)
1. An elongated, steady flow test probe, comprising:
a needle bar (2);
the elastic piece (3), the said elastic piece (3) is fitted over the outside of the said needle bar (2);
a first needle (1), one end of the needle rod (2) is telescopically assembled at the tail part of the first needle (1);
and the other end of the needle rod (2) is telescopically assembled at the tail part of the second needle (4).
2. The elongated steady flow test probe according to claim 1, characterized in that an annular limiting groove (6) is arranged on the outer edge of one end of the needle rod (2), and a concave point processing station (5) is arranged on the outer wall of the tail part of the first needle head (1).
3. An elongated steady flow test probe according to claim 1, characterized in that the number of pit processing stations (5) is multiple and arranged equiangularly circumferentially along the tail of the first needle (1).
4. An elongated steady flow test probe according to claim 1, characterized in that the other end of the needle shaft (2) is provided with a stop ring-shaped platform (7), and the tail of the second needle head (4) is formed with a necking.
5. An elongated steady flow test probe according to claim 1 characterized in that the resilient member (3) is a compression spring.
6. An elongated ballast testing probe according to claim 1, wherein the head of the first needle (1) is cylindrical and the head of the second needle (4) is quincunx.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202210800575.6A CN115184652A (en) | 2022-07-06 | 2022-07-06 | Slender steady-flow test probe |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202210800575.6A CN115184652A (en) | 2022-07-06 | 2022-07-06 | Slender steady-flow test probe |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN115184652A true CN115184652A (en) | 2022-10-14 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202210800575.6A Pending CN115184652A (en) | 2022-07-06 | 2022-07-06 | Slender steady-flow test probe |
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| CN (1) | CN115184652A (en) |
Citations (17)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2000266778A (en) * | 1999-03-15 | 2000-09-29 | Oki Electric Ind Co Ltd | Measuring probe |
| KR200317295Y1 (en) * | 2003-03-14 | 2003-06-25 | 첸 텅-한 | Improved structure composite-type test fixture |
| US7626408B1 (en) * | 2005-02-03 | 2009-12-01 | KK Technologies, Inc. | Electrical spring probe |
| US20150070040A1 (en) * | 2012-04-13 | 2015-03-12 | Xcerra Corporation | Test probe assembly and related methods |
| WO2015105209A1 (en) * | 2014-01-09 | 2015-07-16 | 주식회사 아이에스시 | Probe device |
| CN205301382U (en) * | 2015-12-14 | 2016-06-08 | 上海承盛电子科技有限公司 | Do benefit to protruding ring testing probe of taking of fixture attachment |
| US20160216294A1 (en) * | 2015-01-27 | 2016-07-28 | Kurt F. Kaashoek | Electrical Spring Probe with Stabilization |
| CN206193060U (en) * | 2016-12-02 | 2017-05-24 | 平湖市日拓电子科技有限公司 | Test probe needle |
| CN206258489U (en) * | 2016-12-12 | 2017-06-16 | 平湖市日拓电子科技有限公司 | A kind of double-ended test probe |
| US20180074095A1 (en) * | 2016-09-12 | 2018-03-15 | Chunghwa Precision Test Tech. Co., Ltd. | Sliding rail type probe |
| US20180080955A1 (en) * | 2016-09-20 | 2018-03-22 | Chunghwa Precision Test Tech. Co., Ltd. | Bolt type probe |
| DE102019112991A1 (en) * | 2018-05-18 | 2019-11-21 | Tektronix, Inc. | PRÜFSONDENSPITZE |
| CN212340867U (en) * | 2020-04-22 | 2021-01-12 | 渭南高新区木王科技有限公司 | Slender bending-resistant test probe |
| CN212872575U (en) * | 2020-06-30 | 2021-04-02 | 渭南高新区木王科技有限公司 | Low-resistance slender test probe |
| CN213210235U (en) * | 2020-05-19 | 2021-05-14 | 渭南高新区木王科技有限公司 | Double-end single-rotation type test probe |
| CN214750466U (en) * | 2021-03-04 | 2021-11-16 | 渭南高新区木王科技有限公司 | Steady flow test probe |
| CN215116426U (en) * | 2021-02-04 | 2021-12-10 | 渭南高新区木王科技有限公司 | Double-end stationary flow test probe |
-
2022
- 2022-07-06 CN CN202210800575.6A patent/CN115184652A/en active Pending
Patent Citations (17)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2000266778A (en) * | 1999-03-15 | 2000-09-29 | Oki Electric Ind Co Ltd | Measuring probe |
| KR200317295Y1 (en) * | 2003-03-14 | 2003-06-25 | 첸 텅-한 | Improved structure composite-type test fixture |
| US7626408B1 (en) * | 2005-02-03 | 2009-12-01 | KK Technologies, Inc. | Electrical spring probe |
| US20150070040A1 (en) * | 2012-04-13 | 2015-03-12 | Xcerra Corporation | Test probe assembly and related methods |
| WO2015105209A1 (en) * | 2014-01-09 | 2015-07-16 | 주식회사 아이에스시 | Probe device |
| US20160216294A1 (en) * | 2015-01-27 | 2016-07-28 | Kurt F. Kaashoek | Electrical Spring Probe with Stabilization |
| CN205301382U (en) * | 2015-12-14 | 2016-06-08 | 上海承盛电子科技有限公司 | Do benefit to protruding ring testing probe of taking of fixture attachment |
| US20180074095A1 (en) * | 2016-09-12 | 2018-03-15 | Chunghwa Precision Test Tech. Co., Ltd. | Sliding rail type probe |
| US20180080955A1 (en) * | 2016-09-20 | 2018-03-22 | Chunghwa Precision Test Tech. Co., Ltd. | Bolt type probe |
| CN206193060U (en) * | 2016-12-02 | 2017-05-24 | 平湖市日拓电子科技有限公司 | Test probe needle |
| CN206258489U (en) * | 2016-12-12 | 2017-06-16 | 平湖市日拓电子科技有限公司 | A kind of double-ended test probe |
| DE102019112991A1 (en) * | 2018-05-18 | 2019-11-21 | Tektronix, Inc. | PRÜFSONDENSPITZE |
| CN212340867U (en) * | 2020-04-22 | 2021-01-12 | 渭南高新区木王科技有限公司 | Slender bending-resistant test probe |
| CN213210235U (en) * | 2020-05-19 | 2021-05-14 | 渭南高新区木王科技有限公司 | Double-end single-rotation type test probe |
| CN212872575U (en) * | 2020-06-30 | 2021-04-02 | 渭南高新区木王科技有限公司 | Low-resistance slender test probe |
| CN215116426U (en) * | 2021-02-04 | 2021-12-10 | 渭南高新区木王科技有限公司 | Double-end stationary flow test probe |
| CN214750466U (en) * | 2021-03-04 | 2021-11-16 | 渭南高新区木王科技有限公司 | Steady flow test probe |
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