CN115047316A

CN115047316A - Detachable slender probe

Info

Publication number: CN115047316A
Application number: CN202210667710.4A
Authority: CN
Inventors: 丁崇亮; 井高飞; 付盼红
Original assignee: Weinan Muwang Intelligent Technology Co ltd
Current assignee: Weinan Muwang Intelligent Technology Co ltd
Priority date: 2022-06-14
Filing date: 2022-06-14
Publication date: 2022-09-13

Abstract

The invention discloses a detachable slender probe, which comprises a first test probe and a second test probe; the second test probe comprises a first needle tube, a first needle head is arranged at the head end of the first needle tube, a first spring is arranged in the first needle head and the first needle tube, and one end of the first spring is pressed against the tail part of the first needle head; the second test probe comprises a second needle tube, a second needle head is arranged at the head end of the second needle tube, a second spring is placed in the second needle tube, and one end of the second spring is pressed against the tail part of the second needle head; the tail part of the first needle tube is detachably assembled with the tail part of the second needle tube. The detachable slender probe solves the problems that the processing difficulty is increased, the cost is increased and the service life is short due to the fact that the existing slender probe is large and thin in length.

Description

Detachable slender probe

Technical Field

The invention belongs to the technical field of semiconductor detection, and particularly relates to a detachable slender probe.

Background

During the production of the printed circuit board, an electrical test is performed on the printed circuit board to determine whether electrical parameters (such as resistance, capacitance, or inductance) of each component of the printed circuit board meet a standard.

A common test method of a printed circuit board is to set test points on the printed circuit board, print solder paste on the surfaces of the test points, and directly contact the solder paste portions of the test points with probes through an automated test device or an online test device to obtain related electrical parameters.

The existing online test equipment has the defects that the slender probes are used more and more, the slender probes are thin and long in length, so that the processing difficulty is high, the cost is high, the assembly is not easy in the use process, the service life is short, most of the slender probes are purchased from foreign countries in use, and the cost is high.

Disclosure of Invention

The invention aims to provide a detachable slender probe, which solves the problems of increased processing difficulty, cost increase and short service life of the conventional slender probe due to larger and thin length.

In order to achieve the purpose, the invention adopts the technical scheme that: a detachable elongated probe comprising a first test probe and a second test probe; the second test probe comprises a first needle tube, a first needle head is arranged at the head end of the first needle tube, a first spring is arranged in the first needle head and the first needle tube, and one end of the first spring is propped against the tail part of the first needle head; the second test probe comprises a second needle tube, a second needle head is arranged at the head end of the second needle tube, a second spring is placed in the second needle tube, and one end of the second spring is pressed against the tail part of the second needle head; the tail part of the first needle tube is detachably assembled with the tail part of the second needle tube.

As a preferable technical solution of the present invention, the tails of the first needle and the second needle are both tapered.

As a preferable technical scheme of the present invention, the first needle and the second needle are provided with annular grooves near the tails thereof, and the outside of the first needle tube and the second needle tube is provided with concave point processing positions corresponding to the annular grooves.

As a preferable technical solution of the present invention, a plug is disposed at a tail of the first syringe, and the plug and a tail of the second syringe are inserted together.

As a preferable aspect of the present invention, the first spring and the second spring are both compression springs.

The invention has the beneficial effects that: (1) according to the detachable slender probe, the slender probe can be divided into two sections to be assembled respectively, and then two ends are assembled together, so that the assembly difficulty of a production process is greatly reduced; (2) according to the detachable slender probe, when one section of the test probe is damaged, the detachable slender probe can be detached for replacement, so that the service life is greatly prolonged; (3) the detachable slender probe is simple in integral structure, low in manufacturing cost and good in market popularization and application prospect.

Drawings

The accompanying drawings, which are included to provide a further understanding of the invention and are incorporated in and constitute a part of this specification, illustrate embodiments of the invention and together with the description serve to explain the invention and not to limit the invention. In the drawings:

FIG. 1 is a schematic view of a detachable elongated probe according to the present invention;

FIG. 2 is a schematic view of a first test probe of a detachable elongated probe according to the present invention;

FIG. 3 is an exploded view of a first test probe of a detachable elongated probe according to the present invention;

FIG. 4 is a schematic diagram of a second test probe of a detachable elongated probe according to the present invention;

fig. 5 is an exploded view of a second test probe of a detachable elongated probe of the present invention.

In the figure: 1. the needle comprises a first needle tube, 2 a first needle, 3 a first spring, 4 a plug, 5 a second needle tube, 6 a second plug, 7 a second spring, 8 a concave point processing position and 9 an annular groove.

Detailed Description

Reference will now be made in detail to embodiments of the present invention, examples of which are illustrated in the accompanying drawings, wherein like or similar reference numerals refer to the same or similar elements or elements having the same or similar function throughout. The embodiments described below with reference to the accompanying drawings are illustrative only for the purpose of explaining the present invention and are not to be construed as limiting the present invention.

In the description of the present invention, if there are first and second described only for the purpose of distinguishing technical features, it is not understood that relative importance is indicated or implied or that the number of indicated technical features or the precedence of the indicated technical features is implicitly indicated or implied.

In the description of the present invention, unless otherwise explicitly limited, terms such as arrangement, installation, connection and the like should be understood in a broad sense, and those skilled in the art can reasonably determine the specific meanings of the above terms in the present invention in combination with the specific contents of the technical solutions.

As shown in fig. 1, a detachable elongated probe of the present invention includes a first test probe and a second test probe; the first test probe is detachably assembled with the second test probe.

With reference to fig. 2 and 3, the first test probe includes a first needle tube 1, a first needle 2 is disposed at a head end of the first needle tube 1, a first spring 3 is disposed in the first needle tube 1, and one end of the first spring 3 is pressed against a tail portion of the first needle 2.

With reference to fig. 4 and 5, the second test probe includes a second needle tube 5, a second needle 6 is disposed at a head end of the second needle tube 5, a second spring 7 is disposed in the second needle tube 5, and one end of the second spring 7 is pressed against a tail portion of the second needle 6; the tail part of the first needle tube 1 and the tail part of the second needle tube 6 are detachably assembled together.

Such design, we are convenient for use current processing technology to process, divide into two test needles after, single test needle length is half of slender needle length, carries out clearance fit equipment between needle tubing and the syringe needle, and the needle tubing part is non-deformable. The two individual test pin springs are half as long as elongated, which provides greater stability during testing than long spring test probes.

Referring to fig. 2 to 5, in a detachable elongated probe according to the present invention, the end portions of the first needle 2 and the second needle 6 are tapered.

The design is convenient for the first needle 2 and the second needle 6 to form a larger contact area with the first spring 3 and the second spring 7 respectively, so as to form good contact, and better stability during testing is ensured.

Referring to fig. 2 to 5, in the detachable probe according to the present invention, the first needle 2 and the second needle 6 are provided with an annular groove 9 near the tail thereof, and the first needle 1 and the second needle 5 are provided with a concave spot processing position 8 corresponding to the annular groove 9 on the outer side.

A plurality of riveting points are processed at the position of the concave point processing position 8, and the first needle 2 and the second needle 6 can be limited in the first needle tube 1 and the second needle tube 5 so as to complete clearance assembly and enable the first needle 2 and the second needle 6 to move back and forth within a certain range.

Referring to fig. 2 to 5, in the detachable probe of the present invention, the tail of the first needle tube 1 is provided with a plug 4, and the plug 4 is inserted into the tail of the second needle tube 5.

The tail of the second needle tube 5 is provided with an insertion hole, and the plug 4 is in interference fit with the insertion hole, so that the assembly is facilitated.

Referring to fig. 2 to 5, in the detachable slender probe of the present invention, the first spring 3 and the second spring 7 are compression springs, so as to apply force to the first needle 2 and the second needle 6 by elasticity, ensuring that they can make good contact with a measured point.

Therefore, compared with the prior art, the detachable slender probe can be divided into two sections to be respectively assembled, and then two ends are assembled together, so that the assembly difficulty of the production process is greatly reduced. In addition, the detachable slender probe can be detached for replacement when one section of the test probe is damaged, so that the service life is greatly prolonged. Finally, the detachable slender probe is simple in overall structure, low in manufacturing cost and good in market popularization and application prospect.

The foregoing description shows and describes several preferred embodiments of the invention, but as aforementioned, it is to be understood that the invention is not limited to the forms disclosed herein, and is not to be construed as excluding other embodiments, and that the invention is capable of use in various other combinations, modifications, and environments and is capable of changes within the scope of the inventive concept as expressed herein, commensurate with the above teachings, or the skill or knowledge of the relevant art. And that modifications and variations may be effected by those skilled in the art without departing from the spirit and scope of the invention as defined by the appended claims.

Claims

1. A detachable elongated probe comprising a first test probe and a second test probe; the first test probe comprises a first needle tube (1), a first needle head (2) is arranged at the head end of the first needle tube (1), a first spring (3) is arranged in the first needle tube (1), and one end of the first spring (3) is pressed against the tail part of the first needle head (2); the second test probe comprises a second needle tube (5), a second needle head (6) is arranged at the head end of the second needle tube (5), a second spring (7) is placed in the second needle tube (5), and one end of the second spring (7) is pressed against the tail part of the second needle head (6); the tail part of the first needle tube (1) is detachably assembled with the tail part of the second needle tube (6).

2. A splittable elongated probe according to claim 1, wherein the tails of the first (2) and second (6) needles are tapered.

3. A splittable elongated probe according to claim 2, wherein the first (2) and second (6) needles are each provided with an annular groove (9) near their rear ends, and wherein the first (1) and second (5) needles are externally provided with pit-machining locations (8) corresponding to the annular grooves (9).

4. A detachable elongated probe according to claim 3, characterized in that the tail of said first needle cannula (1) is provided with a plug (4), said plug (4) being insertable together with the tail of said second needle cannula (5).

5. A detachable elongate probe according to claim 4, wherein said first spring (3) and said second spring (7) are both compression springs.