CN205333754U - Connecting terminal's testing arrangement - Google Patents
Connecting terminal's testing arrangement Download PDFInfo
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- CN205333754U CN205333754U CN201521095642.0U CN201521095642U CN205333754U CN 205333754 U CN205333754 U CN 205333754U CN 201521095642 U CN201521095642 U CN 201521095642U CN 205333754 U CN205333754 U CN 205333754U
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- test
- probe
- radial direction
- connecting terminal
- hole
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Abstract
The utility model relates to a testing arrangement technical field discloses a connecting terminal's testing arrangement, including the test seat, the test seat is provided with and supplies test terminal male test chamber, the side of test seat is provided with at least a set of testing component, the testing component is provided with one or above radial pressure change probe, test chamber is provided with the confession the radial locating hole that becomes the probe and pass of pressing, the testing component is connected with an actuating mechanism, because what this device adopted radially presses the structure that becomes the probe, it mainly is that the rigidity of having utilized radial pressure to become the probe produces further pressure, simultaneously, is also recoverd by oneself by the rigidity characteristic, and life is longer, and the structure is simpler.
Description
Technical field
This utility model relates to test device technique field, particularly relates to a kind of test device connecting terminal。
Background technology
At present in terminal manufacturing process, in order to the electrical connection properties of terminal is tested, test device generally will be used to test, large-sized terminal is tested, there is comparatively ripe test device at present；And for the test of small-sized connection terminal, such as: the charging terminal of smart mobile phone, the structural design of current mobile phone is all in the size significantly reducing connector, so, corresponding terminal is also more and more less, for ios device, the smart machine such as Android device or windows, charging terminal and data transfer terminal all combine together, existing terminal is respectively provided with and more and more transmits pin, the existing test for these terminals mainly adopts tool and spring probe compound mode, but, the positioning precision of this spring probe is poor, thus affecting the accuracy of test。Again because the contact stress of spring probe is little, when 0.5MM compression travel, generation contact stress is 20gf, when contact stress is less, can cause loose contact, occur to survey by mistake, meanwhile, its service life there is also bigger deficiency, in view of this, inventor, for the problem that presently, there are, has made further improvement。
Summary of the invention
The purpose of this utility model is in that for the deficiencies in the prior art, it is provided that a kind of test device connecting terminal, the advantage that this test device has simple in construction, accurate positioning and long service life；Present invention also offers the method for testing of a kind of terminal test device, utilize this method of testing to reduce and survey by mistake, it is more accurate to test。
For achieving the above object, a kind of test device connecting terminal of the present utility model, including test bench, described test bench is provided for the test chamber that calibrating terminal inserts, described test bench is provided with least one set test suite, described test suite is provided with one or above radial direction buckling probe, and described test chamber is provided for the hole, location of described radial direction buckling probe traverse, and described test suite is connected to the first driving mechanism；Described first driving mechanism is used for driving test suite to make radially buckling probe conflict with calibrating terminal, and makes radially buckling probe that radially deformation to occur。
Further, described radial direction buckling probe includes guide pin cylinder, and described guide pin damaged surface has insulating coating, and the front end of described guide pin cylinder is extended insulating coating and formed the probe portion for contacting with calibrating terminal。
Further, described test suite includes front template, rear pattern plate and assembling post, one end of described assembling post is connected with front template, the other end of described assembling post is connected with rear pattern plate, the rear end of described radial direction buckling probe is connected fixing with rear pattern plate, the front end of described radial direction buckling probe is through front template and extends in hole, location, and described radial direction buckling probe part between front template and rear pattern plate forms buckling portion。
As preferably, described front template arranges locating piece and the recess passed through for described radial direction buckling probe, and described radial direction buckling probe sequentially passes through recess and locating piece and extends in hole, location。
As preferably, described locating piece is provided with guide part, and described test chamber is provided for the direction recess that described guide part inserts, and hole, described location is positioned at direction recess。
Further, described test bench is provided with lead, and described test suite is flexibly connected with lead。
Further, described test bench is provided with the first back-moving spring, and described first back-moving spring is connected between test bench and test suite。
Further, described test bench is provided with the lateral positioning mechanism for the side of calibrating terminal is positioned, the side of described test chamber is provided with hole, position, side, described lateral positioning mechanism includes thimble, the second driving mechanism and the second back-moving spring for the thimble that resets, and described second driving mechanism drives thimble to abut through hole, position, side with calibrating terminal。
Further, the diameter in hole, described location is between 0.2 ~ 0.3MM, and the tolerance of described diameter is ± 0.01MM。
The beneficial effects of the utility model: compared with prior art, a kind of test device connecting terminal of the present utility model, during this test device busy, first terminal is loaded test chamber, at this moment test suite is driven, make radially buckling probe elder generation and termination contact, under the effect in hole, location, radially buckling probe realizes docking accurately with terminal, further apply pressure, make radially buckling probe that radially deformation to occur, such that it is able to the front end that radially buckling probe is greatly improved is tightr with contacting of terminal, what adopt due to this device is the structure of radially buckling probe, it produces further pressure mainly by the rigidity of radially buckling probe, simultaneously, also restored voluntarily by rigidity characteristics, longer service life, and the structure of this test device is simpler；And present invention also offers a kind of terminal and test the method for testing of device, under the test condition of equal terminal, this method of testing utilizes radially buckling probe can transmit bigger electric current, simultaneously, produced contact pressure is bigger, and this method of testing can reduce to be surveyed by mistake, and it is more accurate to test。
Accompanying drawing explanation
Fig. 1 is axonometric chart of the present utility model。
Fig. 2 is the structural representation of test suite of the present utility model。
Fig. 3 is top view of the present utility model。
Fig. 4 is the structural representation of test bench of the present utility model。
Fig. 5 is the structural representation of radial direction buckling probe of the present utility model。
Fig. 6 is the buckling state diagram of radial direction buckling probe of the present utility model。
Accompanying drawing labelling includes:
Test bench--1, test chamber--11, position hole--111,
Direction recess--112, hole, position, side--113, lead--12,
First back-moving spring--13, test suite--2, front template--21,
Recess--211, rear pattern plate--22, assemble post--23,
Locating piece--24, guide part--241, radially buckling probe--3,
Guide pin cylinder--31, insulating coating--32, probe portion--33,
Buckling portion--34, lateral positioning mechanism--4, thimble--41,
Second back-moving spring--42。
Detailed description of the invention
Below in conjunction with accompanying drawing, this utility model is described in detail。
Referring to Fig. 1 to Fig. 6, a kind of test device connecting terminal, including test bench 1, described test bench 1 is provided for the test chamber 11 that calibrating terminal inserts, described test bench 1 is provided with least one set test suite 2, described test suite 2 is provided with one or above radial direction buckling probe 3, and described test chamber 11 is provided for the hole, location 111 of described radial direction buckling probe 3 traverse, and described test suite 2 is connected to the first driving mechanism；Described first driving mechanism is used for driving test suite 2 to make radially buckling probe 3 conflict with calibrating terminal, and makes radially buckling probe 3 that radially deformation to occur。The first driving mechanism in the present embodiment can adopt the structure of motor and screw mandrel, can also directly adopt air cylinder driven mode, it is not described further at this, during this test device busy, first calibrating terminal is loaded test chamber 11, at this moment test suite 2 is driven, radially buckling probe 3 is made first to contact with calibrating terminal, under the effect in hole 111, location, radially buckling probe 3 realizes docking accurately with calibrating terminal, further apply pressure, make radially buckling probe 3 that radially deformation to occur, such that it is able to the front end of radially buckling probe 3 and the contact stress of calibrating terminal are greatly improved, make radial direction buckling probe 3 tightr with contacting of calibrating terminal, what adopt due to this device is the structure of radially buckling probe 3, it produces further pressure mainly by the rigidity of radially buckling probe 3, simultaneously, also restored voluntarily by the rigidity characteristics of radial direction buckling probe 3, longer service life；And relative to spring probe, this test device has only to fix radially buckling probe 3, and structure is simpler。
Specifically, described radial direction buckling probe 3 includes guide pin cylinder 31, and described guide pin cylinder 31 surface has insulating coating 32, and insulating coating 32 is extended to form the probe portion 33 for contacting with calibrating terminal in the front end of described guide pin cylinder 31。Described guide pin cylinder 31 adopts Powder High-speed Steels SKH to make, or described insulating coating 32 can ensure that radially buckling probe 3 is when radially buckling occurs, avoid the contact that adjacent radial direction buckling probe 3 is likely to occur and the short circuit phenomenon caused, insulating coating 32 can adopt politef or perfluoroethylene-propylene, it is emphasized that the probe portion 33 for contacting with calibrating terminal is current-carrying part, not there is insulating coating 32, and, in order to improve the electric conductivity in probe portion 33 further, described probe portion 33 does gold-plated process in surface, it is ensured that the stability of contact。
In the technical program, described test suite 2 includes front template 21, rear pattern plate 22 and assembles post 23, one end of described assembling post 23 is connected with front template 21, the other end of described assembling post 23 is connected with rear pattern plate 22, the rear end of described radial direction buckling probe 3 is connected fixing with rear pattern plate 22, the front end of described radial direction buckling probe 3 is through front template 21 and extends in hole 111, location, and the described radial direction buckling probe 3 part between front template 21 and rear pattern plate 22 forms buckling portion 34。Described assembling post 23 is preferably provided three, article three, the installation position of assembling post 23 is not emphasized, whole test suite 2 all can be made to have preferably stability, when test suite 2 moves with termination contact, described radial direction buckling probe 3 realizes docking accurately with terminal under the effect in hole 111, location, when test suite 2 moves to terminal direction further, radially the two ends of buckling probe 3 are formed and compress power, so that radially there is the deformation of arc shaped in the buckling portion 34 of buckling probe 3, and the effect of power is mutual, so, radially the probe portion 33 of buckling probe 3 also necessarily has bigger abutting stress；Find through reality test, utilize this radial direction buckling probe 3 when retraction stroke 0.5MM, it is possible to produce the stress of 120gf；Meanwhile, existing spring probe stress carrying out test and finds, existing spring probe is when retraction stroke is 0.5MM, it is possible to produce the stress of about 20gf；Obviously, this radial direction buckling probe 3 is utilized in same compression travel, better contact stress can be obtained such that it is able to guarantee the effectiveness of contact。
In order to make the conduction of abutting stress much sooner, in the technical program, described front template 21 arranges locating piece 24 and the recess 211 passed through for described radial direction buckling probe 3, and described radial direction buckling probe 3 sequentially passes through recess 211 and locating piece 24 and extends in hole 111, location。So, when test suite 2 operationally, during due to radial direction buckling probe 3 by recess 211, the lower section of recess 211 also has certain gap, so, when abutting stress conduction, described recess 211 can be avoided radial direction buckling probe 3 is formed restriction, radially the deformation of buckling probe 3 is much sooner, it is to avoid syringe needle damages the contact chip of terminal
Refer to Fig. 4, in order to make the front end of radially buckling probe 3 be positioned accurately while ensureing axially free activity, described locating piece 24 is provided with guide part 241, described test chamber 11 is provided for the direction recess 112 that described guide part 241 inserts, and hole, described location 111 is positioned at direction recess 112。Utilizing this programme, described guide part 241 stretches into direction recess 112, not only plays positioning action, but also has reached the dual guiding distance reducing guide part 241, hole 111, location is formed with radial direction buckling probe 3 respectively, and the conduction making buckling stress is rapider。
Further, in order to improve the compactedness of whole test device, described test bench 1 is provided with lead 12, and described test suite 2 is flexibly connected with lead 12。Utilize this lead 12 test suite 2 can be formed guide effect, consequently facilitating be applied integrally on different equipment by this test device。
As further, described test bench 1 is provided with the first back-moving spring 13, and described first back-moving spring 13 is connected between test bench 1 and test suite 2。During test, first driving mechanism drives test suite 2 to compress the first back-moving spring 13, after test completes, during described distress resolves, first back-moving spring 13 can play the effect of auxiliary reset, by test suite 2 elastic reset, in this programme, the quantity of the first back-moving spring 13 could be arranged to two, is separately positioned on the both sides of test bench 1, form symmetry, it is obvious also possible to be arranged as required to multiple, carefully do not stating herein。
At this, alternatively, when this test device is applied to the calibrating terminal of Bidirectional contact, the such as charging terminal etc. of Iphone mobile phone, refer to Fig. 1, this test device includes two groups of test suites 2, simultaneously, each group of test suite 2 is provided with eight corresponding with calibrating terminal radially buckling probe 3, so can complete the test of double contact terminal, as making more excellent mode, the contact chip of usual calibrating terminal is all strip, when test, in order to the impedance of contact chip being tested, often group test suite 2 is provided with two row pressures change probes 3, so that two row pressures become probe 3 and form the further test to calibrating terminal, test accuracy is higher, certainly, this test device can also be configured many group test suites 2 according to other needs, at this, do not enumerate。
For assignment test terminal accurately, except the strict positioning precision controlling test suite 2, also the test chamber 11 of calibrating terminal should be carried out stricter control, owing to before terminal and the back side all can have certain gap, and the location of test suite 2 will not be impacted by this gap, it is important that be in that two sides of terminal, in the technical program, described test bench 1 is provided with the lateral positioning mechanism 4 for the side of calibrating terminal is positioned, the side of described test chamber 11 is provided with hole, position, side 113, described lateral positioning mechanism 4 includes thimble 41, second driving mechanism and the second back-moving spring 42 for the thimble 41 that resets, described second driving mechanism drives thimble 41 to abut through hole, position, side 113 with calibrating terminal；When terminal loads test chamber 11, the side of terminal is formed and abuts by the thimble 41 utilizing this programme, thus terminal is against the opposite side of test chamber 11, positioning action can be reached, and the simple in construction of this location mode, it is easy to controlling, described second driving mechanism is preferably with cylinder, low cost of manufacture, simple in construction。
In the technical program, the diameter in hole, described location 111 is between 0.2 ~ 0.3MM, and the tolerance of described diameter is ± 0.01MM。Gap between described radial direction buckling probe 3 and hole 111, location is between 0.003MM, so that it is guaranteed that radially buckling probe 3 contacts with the accurate of terminal。
Above content is only preferred embodiment of the present utility model, for those of ordinary skill in the art, according to the thought of the present invention, all will change in specific embodiments and applications, and this specification content should not be construed as restriction of the present utility model。
Claims (9)
1. the test device connecting terminal, including test bench (1), described test bench (1) is provided for the test chamber (11) that calibrating terminal inserts, it is characterized in that: described test bench (1) is provided with least one set test suite (2), described test suite (2) is provided with one or above radial direction buckling probe (3), described test chamber (11) is provided for the hole, location (111) of described radial direction buckling probe (3) traverse, and described test suite (2) is connected to the first driving mechanism；Described first driving mechanism is used for driving test suite (2) to make radially buckling probe (3) conflict with calibrating terminal, and makes radially buckling probe (3) that radially deformation to occur。
2. a kind of test device connecting terminal according to claim 1, it is characterized in that: described radial direction buckling probe (3) includes guide pin cylinder (31), described guide pin cylinder (31) surface has insulating coating (32), and insulating coating (32) is extended to form the probe portion (33) for contacting with calibrating terminal in the front end of described guide pin cylinder (31)。
3. a kind of test device connecting terminal according to claim 1, it is characterized in that: described test suite (2) includes front template (21), rear pattern plate (22) and assembling post (23), one end of described assembling post (23) is connected with front template (21), the other end of described assembling post (23) is connected with rear pattern plate (22), the rear end of described radial direction buckling probe (3) is connected fixing with rear pattern plate (22), the front end of described radial direction buckling probe (3) is through front template (21) and stretches in hole, location (111), described radial direction buckling probe (3) is positioned at the part between front template (21) and rear pattern plate (22) and forms buckling portion (34)。
4. a kind of test device connecting terminal according to claim 3, it is characterized in that: described front template (21) arranges locating piece (24) and the recess (211) passed through for described radial direction buckling probe (3), and described radial direction buckling probe (3) sequentially passes through recess (211) and locating piece (24) and stretches in hole, location (111)。
5. a kind of test device connecting terminal according to claim 4, it is characterized in that: described locating piece (24) is provided with guide part (241), described test chamber (11) is provided for the direction recess (112) that described guide part (241) inserts, and hole, described location (111) is positioned at direction recess (112)。
6. a kind of test device connecting terminal according to claim 1, it is characterised in that: described test bench (1) is provided with lead (12), and described test suite (2) is flexibly connected with lead (12)。
7. a kind of test device connecting terminal according to claim 1, it is characterised in that: described test bench (1) is provided with the first back-moving spring (13), and described first back-moving spring (13) is connected between test bench (1) and test suite (2)。
8. a kind of test device connecting terminal according to claim 1, it is characterized in that: described test bench (1) is provided with the lateral positioning mechanism (4) for the side of calibrating terminal is positioned, the side of described test chamber (11) is provided with hole, position, side (113), described lateral positioning mechanism (4) includes thimble (41), the second driving mechanism and being used for and resets second back-moving spring (42) of thimble (41), and described second driving mechanism drives thimble (41) to abut through hole, position, side (113) with calibrating terminal。
9. a kind of test device connecting terminal according to any one of claim 1 ~ 8, it is characterised in that: the diameter in hole, described location (111) is between 0.2 ~ 0.3MM, and the tolerance of described diameter is ± 0.01MM。
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201521095642.0U CN205333754U (en) | 2015-12-25 | 2015-12-25 | Connecting terminal's testing arrangement |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201521095642.0U CN205333754U (en) | 2015-12-25 | 2015-12-25 | Connecting terminal's testing arrangement |
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| Publication Number | Publication Date |
|---|---|
| CN205333754U true CN205333754U (en) | 2016-06-22 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201521095642.0U Expired - Fee Related CN205333754U (en) | 2015-12-25 | 2015-12-25 | Connecting terminal's testing arrangement |
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| Country | Link |
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| CN (1) | CN205333754U (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105353260A (en) * | 2015-12-25 | 2016-02-24 | 东莞市海轮电子科技有限公司 | Testing device and method for connecting terminal |
| CN107765107A (en) * | 2016-08-18 | 2018-03-06 | 苏州迈瑞微电子有限公司 | Fingerprint recognition module sensitivity test tool and method of testing |
| CN109655684A (en) * | 2018-12-14 | 2019-04-19 | 中山市拓电电子科技有限公司 | A kind of electric test component |
-
2015
- 2015-12-25 CN CN201521095642.0U patent/CN205333754U/en not_active Expired - Fee Related
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105353260A (en) * | 2015-12-25 | 2016-02-24 | 东莞市海轮电子科技有限公司 | Testing device and method for connecting terminal |
| CN105353260B (en) * | 2015-12-25 | 2019-01-08 | 东莞市海轮电子科技有限公司 | A kind of test device and test method of connection terminal |
| CN107765107A (en) * | 2016-08-18 | 2018-03-06 | 苏州迈瑞微电子有限公司 | Fingerprint recognition module sensitivity test tool and method of testing |
| CN107765107B (en) * | 2016-08-18 | 2023-09-15 | 苏州迈瑞微电子有限公司 | Fingerprint identification module sensitivity test fixture and test method |
| CN109655684A (en) * | 2018-12-14 | 2019-04-19 | 中山市拓电电子科技有限公司 | A kind of electric test component |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20160622 Termination date: 20191225 |
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| CF01 | Termination of patent right due to non-payment of annual fee |