CN201673179U - Special testing probe for AV port - Google Patents
Special testing probe for AV port Download PDFInfo
- Publication number
- CN201673179U CN201673179U CN2010201272265U CN201020127226U CN201673179U CN 201673179 U CN201673179 U CN 201673179U CN 2010201272265 U CN2010201272265 U CN 2010201272265U CN 201020127226 U CN201020127226 U CN 201020127226U CN 201673179 U CN201673179 U CN 201673179U
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- CN
- China
- Prior art keywords
- test
- testing needle
- build
- needle
- port
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- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 238000012360 testing method Methods 0.000 claims abstract description 172
- 239000000523 sample Substances 0.000 claims abstract description 43
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 claims description 14
- 239000000463 material Substances 0.000 claims description 8
- 229910000906 Bronze Inorganic materials 0.000 claims description 7
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 claims description 7
- 239000010974 bronze Substances 0.000 claims description 7
- KUNSUQLRTQLHQQ-UHFFFAOYSA-N copper tin Chemical compound [Cu].[Sn] KUNSUQLRTQLHQQ-UHFFFAOYSA-N 0.000 claims description 7
- 229910052759 nickel Inorganic materials 0.000 claims description 7
- 238000009413 insulation Methods 0.000 claims description 5
- 239000011248 coating agent Substances 0.000 claims description 4
- 238000000576 coating method Methods 0.000 claims description 4
- DMFGNRRURHSENX-UHFFFAOYSA-N beryllium copper Chemical compound [Be].[Cu] DMFGNRRURHSENX-UHFFFAOYSA-N 0.000 claims description 3
- 230000006835 compression Effects 0.000 claims description 2
- 238000007906 compression Methods 0.000 claims description 2
- 238000000034 method Methods 0.000 abstract description 5
- 238000003466 welding Methods 0.000 abstract description 4
- 230000000694 effects Effects 0.000 description 4
- 238000007747 plating Methods 0.000 description 3
- 229910052709 silver Inorganic materials 0.000 description 3
- 239000004332 silver Substances 0.000 description 3
- 238000001514 detection method Methods 0.000 description 2
- 238000009434 installation Methods 0.000 description 2
- 150000001875 compounds Chemical group 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000004880 explosion Methods 0.000 description 1
- 238000011990 functional testing Methods 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000009527 percussion Methods 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 230000011664 signaling Effects 0.000 description 1
- 238000012353 t test Methods 0.000 description 1
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- Measuring Leads Or Probes (AREA)
Abstract
The utility model relates to a special testing probe for an AV port, comprising an inner testing needle and an outer testing needle which have common axis, wherein along the axial direction of an axle center, the inner testing needle and the outer testing needle are respectively butted along respective needle head direction by an elastic component, and the inner testing needle and the outer testing needle are plugged and positioned by a positioning piece; the outer part of the inner testing needle is provided with an inner testing needle sleeve; the outer part of the outer testing needle is provided with an outer testing needle sleeve; and an insulating sleeve is also arranged between the inner testing needle sleeve and the outer testing needle sleeve. The special testing probe is directly arranged on a plug-in port of an AV connector, thus detecting the AV connector as well as the welding quality of the AV connector and a PCB, eliminating the problem that the existing detecting method can not detect the hidden quality hazard of the AV connector and improving the stability of product quality.
Description
Technical field
The utility model relates to the detection of electrons utensil, relates in particular to a kind of test probe that is used for detecting AV (abbreviation of audio A udio and video Video) port capability and performance specially.
Background technology
Current test link in electronic product is produced for the test of traditional AV signal, is normally tested by the mode of directly obtaining signal on the AV pad on the pcb board (printed circuit board (PCB)); Finish test by this way, often can't test out the actual quality of AV port, thereby the AV port of being tested, its product quality will be buried certain hidden danger.
Because the normal use of AV port is: the AV signal is connected with AV interface unit port plug-in unit through connecting line, and the port plug-in unit is through lead-in wire and the welding of pcb board pad; And in the test link of aforementioned conventional AV signal, on the pcb board pad, just in test process, skipped the AV connector under the meeting directly of the test probe of traditional AV port, thereby can not test the good and bad of AV connector.
The utility model content
Technical problem to be solved in the utility model is to provide a kind of AV port special test probe, it is by the architecture advances to test probe, changed relevant the touch position of test process middle probe with the AV connector, and then realized test to the electricity quality performance of AV connector, when thoroughly having solved traditional AV port and on pcb board, having tested, the hidden danger of quality problem of leaving over.
Its technical matters to be solved can be implemented by the following technical programs.
A kind of AV port special test probe, comprise build-in test pin and outer testing needle with common axle center, described build-in test pin and outer testing needle along the axis direction in described axle center respectively through elastomeric element edge separately the syringe needle direction support, and described build-in test pin and described outer testing needle are pegged graft through keeper and are located; Described build-in test pin outside is provided with a build-in test needle guard, and described outer testing needle outside is provided with an outer test needle guard, also is provided with insulation sleeve between described build-in test needle guard and described outer testing needle.
As the further improvement of the technical program, described elastomeric element is respectively the build-in test pin stage clip that supports the build-in test pin and supports the outer testing needle stage clip of outer testing needle.
As one of preferred embodiment of the present utility model, described keeper is a location-plate of being located at this special test probe afterbody.
Also as the further improvement of the technical program, the base material of described build-in test pin is a beryllium copper, and the surface is gold-plated, silver-plated or nickel coating.
Also as the further improvement of the technical program, the base material of described build-in test needle guard and/or described outer testing needle is a phosphor bronze, and the surface is gold-plated, silver-plated or nickel coating.
As the further improvement of the technical program, described outer test needle guard is the phosphor bronze needle guard again.
As another preferred embodiment of the present utility model, the compression travel of described build-in test pin stage clip and/or outer testing needle stage clip is 8---10mm.
In addition, the end of described build-in test pin is preferably spherical.
As the further improvement of the technical program, the end of described outer testing needle is 60 degree inner cone limits.
Equally, the concentricity of described build-in test pin and outer testing needle preferably is not more than 0.1mm.
When adopting the AV port special test probe of this technical scheme to be used for carrying out the AV port test, by test probe is directly following on the plug-in unit port of AV connector, thereby the welding quality of AV connector, AV connector and pcb board is all detected, eliminate the hidden danger of quality that existing detection mode can't detect the AV connector, improved the stability of product quality.It is a kind of very effective testing scheme.
Description of drawings
Below in conjunction with accompanying drawing embodiment of the present utility model being done one describes in detail.
Fig. 1 is a structural representation of the present utility model;
Fig. 2 is a parts explosion of the present utility model.
---build-in test pin 111---build-in test syringe needle 12---build-in test needle guard among the figure: 11
13---build-in test pin stage clip 21---outer testing needle 22---is tested needle guard outward
221---chucking lug 23---outer testing needle stage clip 3---insulation sleeves
4---location-plate
Embodiment
AV port special test probe as depicted in figs. 1 and 2, mainly based on the improvement of Electronic Testing field test probe, on this AV special test probe structure mainly by build-in test pin 11 and build-in test needle guard 12, outer testing needle 21 with test pillowcase 22 outward and insulation sleeve 3 is formed; The design feature of each parts and composition and mutual relationship are specific as follows:
The build-in test pin and the test needle guard
1.1 build-in test pin:
Build-in test pin 11 adopts the beryllium copper material, and surface gold-plating, silver or nickel etc. are to guarantee the reliability of test contact; The end of build-in test pin 11 is spherical build-in test syringe needle.
1.2 build-in test needle guard:
Build-in test needle guard 12 adopts the phosphor bronze material, and surface gold-plating, silver or nickel etc. are to guarantee the test contact reliability.
1.3 test spring:
Build-in test pin stage clip 13 moderate pressures, build-in test pin 11 is 8-10mm at the effect down stroke of spring.
2. outer testing needle and outer test needle guard
2.1 outer testing needle
Outer testing needle 21 adopts the phosphor bronze material, and surface gold-plating, silver or nickel etc. are to guarantee the test contact reliability.The end shape of outer testing needle 21 is 60 degree inner cone limits.
2.2 test needle guard outward
Outer test needle guard 22 adopts the phosphor bronze material.
2.3 test spring
Outer testing needle stage clip 23 moderate pressures, outer testing needle 21 is 8-10mm at the effect down stroke of spring.
3. the assembling of inside and outside test needle guard
3.1 build-in test pin 11 and build-in test needle guard 12 are installed in the endoporus of insulation sleeve 3, positioning step control installation site are arranged.
3.2 inside and outside testing needle 11 is installed on the location-plate 4 of AV special test pin (its China and foreign countries' testing needle 21 is to realize and being connected of location-plate 4 by the chucking lug on the outer test needle guard 22 of its outside 221) with the form of pegging graft respectively with 21; The concentricity that will guarantee inside and outside testing needle 11 and 12 simultaneously is within 0.1mm.Inside and outside testing needle 11 and 12 respectively build-in test pin stage clip 13 and outside can realize moving up and down freely state under the effect of testing needle stage clip 23.
The AV port special test needle set that the utility model provides has following work characteristics:
1.AV the special test probe can be installed in the installation form of common probe on the test needle-bar, also can be installed on the functional tester with the functional test form.
2.AV during being connected of special test probe and AV connector, at first build-in test pin 11 enters AV connector endoporus, and contacts with signaling point, also plays simultaneously to be outer testing needle 12 positioning actions.When outer testing needle 12 contacted with the external contact of AV connector, whole connection procedure finished.
3.AV the special test probe under test mode, under the effect of spring force, and is closely contacted by the side device, because surface of contact is gold-plated, makes that contact resistance is very little, test performance is reliable.
4. when measurement jig and AV special test pin positioning error were in allowed band, because the build-in test syringe needle 111 of AV special test pin build-in test pin 11 is spherical, it can automatic guide enter tested prospect hole; When positioning error was excessive, it will be by jack-up.At this moment the afterbody guide pole of build-in test pin 11 stretches out outside the location-plate 4 of AV special test pin, and in time the warning reminding operator adjusts error.
5. this AV special test probe is longer serviceable life, and this mainly is because its processing request is very high.Each slipping plane will be reduced friction as far as possible, and the acting force of spring can not be coarse and influenced because of what process.To guarantee that AV special test probe its electric conductivity under specified elastic force is qualified.
6. this AV special test probe is through test, and voltage that it can pass through and strength of current are far longer than the test request of AV connector, can operate as normal under client's environment for use to guarantee product.
7. this AV special test probe also can operate as normal under the special state of being sidelong.
Because it is gold-plated that the surface in contact of this AV special test probe all scribbles, therefore when daily servicing, to keep away manual-free and other hard device percussions, prevent to reduce life cycle.Same this AV special test probe will regularly carry out maintaining, and maintenance period can be identical with conventional probe.The replacing of AV special test probe is an integral replacing, and this is different from the replacing of traditional test probe.
The AV port application specific probe that the utility model provides, by the inner core probe with external probe is compound forms, by two groups of pressure of surveying spring, inside and outside probe is acted on respectively on the inside and outside contact point of AV connector, test the quality of AV connector body and AV connector and pcb board welding respectively simultaneously.When thoroughly having solved traditional AV port and on pcb board, having tested, the hidden danger of quality problem of leaving over.
Claims (10)
1. AV port special test probe, it is characterized in that, comprise build-in test pin and outer testing needle with common axle center, described build-in test pin and outer testing needle along the axis direction in described axle center respectively through elastomeric element edge separately the syringe needle direction support, and described build-in test pin and described outer testing needle are pegged graft through keeper and are located; Described build-in test pin outside is provided with a build-in test needle guard, and described outer testing needle outside is provided with an outer test needle guard, also is provided with insulation sleeve between described build-in test needle guard and described outer testing needle.
2. AV port special test probe according to claim 1 is characterized in that, described elastomeric element is respectively the build-in test pin stage clip that supports the build-in test pin and supports the outer testing needle stage clip of outer testing needle.
3. AV port special test probe according to claim 1 is characterized in that described keeper is a location-plate of being located at this special test probe afterbody.
4. AV port special test probe according to claim 1 is characterized in that the base material of described build-in test pin is a beryllium copper, and the surface is gold-plated, silver-plated or nickel coating.
5. AV port special test probe according to claim 1 is characterized in that the base material of described build-in test needle guard and/or described outer testing needle is a phosphor bronze, and the surface is gold-plated, silver-plated or nickel coating.
6. AV port special test probe according to claim 1 is characterized in that, described outer test needle guard is the phosphor bronze needle guard.
7. AV port special test probe according to claim 2 is characterized in that the compression travel of described build-in test pin stage clip and/or outer testing needle stage clip is 8～10mm.
8. according to claim 1 or 4 described AV port special test probes, it is characterized in that the end of described build-in test pin is spherical.
9. AV port special test probe according to claim 1 or 5 is characterized in that, the end of described outer testing needle is 60 degree inner cone limits.
10. AV port special test probe according to claim 1 is characterized in that, the concentricity of described build-in test pin and outer testing needle is not more than 0.1mm.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2010201272265U CN201673179U (en) | 2010-03-10 | 2010-03-10 | Special testing probe for AV port |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2010201272265U CN201673179U (en) | 2010-03-10 | 2010-03-10 | Special testing probe for AV port |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN201673179U true CN201673179U (en) | 2010-12-15 |
Family
ID=43330591
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2010201272265U Expired - Fee Related CN201673179U (en) | 2010-03-10 | 2010-03-10 | Special testing probe for AV port |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN201673179U (en) |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104280678A (en) * | 2014-10-30 | 2015-01-14 | 南通富士通微电子股份有限公司 | Semiconductor testing fixture |
| CN104330593A (en) * | 2014-10-30 | 2015-02-04 | 南通富士通微电子股份有限公司 | Testing needle head and semiconductor testing fixture |
| CN106093752A (en) * | 2016-06-20 | 2016-11-09 | 东莞市联洲知识产权运营管理有限公司 | A kind of test probe card being applied to integrated circuit |
| CN108761151A (en) * | 2018-08-10 | 2018-11-06 | 浙江金连接科技有限公司 | A kind of test probe phosphor bronze sleeve |
| CN113376414A (en) * | 2020-03-10 | 2021-09-10 | 电连技术股份有限公司 | Multi-channel detector |
-
2010
- 2010-03-10 CN CN2010201272265U patent/CN201673179U/en not_active Expired - Fee Related
Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104280678A (en) * | 2014-10-30 | 2015-01-14 | 南通富士通微电子股份有限公司 | Semiconductor testing fixture |
| CN104330593A (en) * | 2014-10-30 | 2015-02-04 | 南通富士通微电子股份有限公司 | Testing needle head and semiconductor testing fixture |
| CN104330593B (en) * | 2014-10-30 | 2017-09-29 | 通富微电子股份有限公司 | Test syringe needle and semiconductor test tool |
| CN106093752A (en) * | 2016-06-20 | 2016-11-09 | 东莞市联洲知识产权运营管理有限公司 | A kind of test probe card being applied to integrated circuit |
| CN106093752B (en) * | 2016-06-20 | 2019-03-12 | 定颖电子(黄石)有限公司 | A kind of test probe card applied to integrated circuit |
| CN108761151A (en) * | 2018-08-10 | 2018-11-06 | 浙江金连接科技有限公司 | A kind of test probe phosphor bronze sleeve |
| CN108761151B (en) * | 2018-08-10 | 2023-10-31 | 浙江金连接科技股份有限公司 | Phosphor bronze sleeve for test probe |
| CN113376414A (en) * | 2020-03-10 | 2021-09-10 | 电连技术股份有限公司 | Multi-channel detector |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| C17 | Cessation of patent right | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20101215 Termination date: 20130310 |